The Electron Microscopy Center offers access to multiple characterization and sample preparation techniques. A Scanning Electron Microscopes (SEM), a Transmission Electron Microscope (TEM), a dual beam (Focused Ion Beam/SEM), a small angle X-ray scattering (SAXS) system and a X-ray Photoelectron Spectroscopy (XPS) system are available at the EMC, in addition to specimen preparation stations (grinding/polishing, conductive coating deposition, dimpling, ion milling/polishing, etc…).

Equipment at the EMC allow for elemental analysis, crystal orientation mapping and electron diffraction. We are always working to improve our facilities and offer access to new characterization techniques. If you are interested in collaborating into the acquisition of a new equipment, please contact the EMC director.

For more details on our equipment and and their capabilities, please choose from the list below: