Richard Minnitt
Richard Minnitt
Richard Minnitt
Francis Pitard President, Francis Pitard Sampling Consultants, 14800 Tejon Street,
Broomfield, CO 80023, USA. Telephone: +1 303 451 7893. Fax: +1 303 280 1396:
Email: fpsc@aol.com www.fpscsampling@aol.com
Structure of the presentation
Systematic errors (DE, EE, PE, AE, cause bias) can be eliminated
1 3
R e la tiv e
2
c fg ' d d M AX
MS
Where g is the Granulometric Factor derived in this case for closely sieved materials
Ratio r = dMAX/dMIN for different fragment sizes
Granulometric factor g versus r
(for closely sieved materials, r = dMAX/dMIN))
1 3
R e la tiv e
2
c fg ' d d M AX (1)
MS
* M S L n d M A X L n c fg ' d
3
L n
2
(2)
R e la tiv e
K 3
d
c. f .g '
1
1 3 1 .6
dl 3 1 .0 3 8
10000
1 9 9 3 3 2 6 1 .4 0 .5 0 .6
1
d l 0 .0 0 0 0 2 2 0 0 6 7 1 .9 6 2 1 0 0 0 0
d l 0 .0 0 4 2 2 8 c m o r
d l 4 2 .3 m ic r o n s
d (cm) 0.00423007
d (m) 42.30
Structure of the presentation
2. It overcomes the need for inaccurate fragment size classification; calibration of fragment sizes using
closely spaced screens is very accurate