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X-Ray Fluorescence (XRF) Spectrometry

Using X-ray fluorescence (XRF) spectrometry, trained operators can analyze samples to determine their elemental composition. Samples are placed in the XRF spectrometer, which bombards them with X-rays to knock electrons from their atoms. As electrons fill these empty spaces, characteristic X-rays are emitted that can identify each element. The intensity of these X-rays indicates the quantity of each element present in the sample. Results are displayed on screen and can be printed or exported, providing percentages of elements above 1% or converting those below to mg/kg. This non-destructive technique determines both what elements are in a material and how much of each.

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158 views3 pages

X-Ray Fluorescence (XRF) Spectrometry

Using X-ray fluorescence (XRF) spectrometry, trained operators can analyze samples to determine their elemental composition. Samples are placed in the XRF spectrometer, which bombards them with X-rays to knock electrons from their atoms. As electrons fill these empty spaces, characteristic X-rays are emitted that can identify each element. The intensity of these X-rays indicates the quantity of each element present in the sample. Results are displayed on screen and can be printed or exported, providing percentages of elements above 1% or converting those below to mg/kg. This non-destructive technique determines both what elements are in a material and how much of each.

Uploaded by

entremonzaga
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© © All Rights Reserved
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Using X-ray fluorescence to determine elemental composition in a sample (soil, compost, etc.

Innov-X analyzers must be used by trained and authorized operators, according to proper safety
procedures. Therefore, analyses will be performed by persons who are competent to operate this
equipment.

Sample analysis

1. The pretreated samples (for example, homogenized, crushed, etc.) should be placed in special
bowl (container) of XRF spectrometer.
2. The trained person will analyse the sample. The sample analysis process will be displayed on
the computer screen.
3. The results of the analysis can be directly printed or stored in Microsoft Office Excel. These
results are in %.
4. For components, which are below 1 %, is required the conversion to mg/kg. Elements, which
are above 1 %, are left in %.
5. The result (element below 1 %) in % must be multiplied by 10,000 for conversion to mg/kg.
6. We will obtain information about representation of individual elements in the sample by this
analysis.

X-Ray Fluorescence (XRF) Spectrometry

Portable XRF analyzer Innov-X DELTA PROFESSIONAL measure 25+ elements per test, from
Mg (12) to U (92), PPM levels to 100%.

XRF Spectrometry determines the elemental composition of a material. This method


identifies elements in a substance and quantifies the amount present of those elements.

An element is defined by its characteristic X-ray emission wavelength () or energy (E). The
amount of an element present is determined by measuring the intensity of its characteristic
line.

All atoms have a fixed number of electrons (negatively charged particles) arranged in orbitals
around their nucleus. The number of electrons in a given atom is equal to the number of
protons (positively charged particles) in the nucleus.
XRF Spectrometry typically utilizes activity in the first three electron orbitals, the K, L, and M
lines, where K is closest to the nucleus.

Each electron orbital corresponds to a specific and different energy level for a given
element. In XRF Spectrometry, high-energy primary X-ray photons are emitted from a source
(X-ray tube or radioisotope) and strike the sample.

The primary photons from the X-ray source have enough energy to knock electrons out of
the innermost, K or L, orbitals. When this occurs, the atoms become unstable ions. Electrons
seek stability; therefore, an electron from an outer orbital, L or M, moves into the newly
vacant space at the inner orbital.

As the electron from the outer orbital moves into the inner orbital space, it emits an energy
known as a secondary X-ray photon. This phenomenon is called fluorescence.

The secondary X-ray produced is characteristic of a specific element. The energy (E) of the
emitted fluorescent X-ray photon is determined by the difference in energies between the
initial and final orbitals of the individual transitions. This is described by the formula E=hc/
where h is Planck's constant; c is the velocity of light; and is the characteristic wavelength
of the photon.

Creating a Secondary X-ray - Photon Fluorescence

Wavelengths are inversely proportional to the energies; they are characteristic for each element. For example,
the Ka energy for Iron (Fe) is about 6.4keV. The number of element-specific characteristic X-rays produced in a
sample over a given period of time, or the intensity, is measured. This determines the quantity of a given
element in that sample. Typical spectra for EDXRF Spectrometry appear as a plot of Energy (E) versus the
Intensity (I).
Typical Spectrum Plot: Energy vs. Intensity

Three Subsystems of EDXRF Analyzer

EDXRF analyzers are mechanically very simple; there are no moving parts in the excitation
and detection subsystems. However, a bench-top analyzer can have moving parts.

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