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Analytical Technique Used Particulate Radiation

This document discusses several analytical techniques used for ion beam modification and analysis, including particulate radiations. It describes Neutron Activation Analysis which uses neutron bombardment to induce radioactivity for elemental analysis. Particle-induced X-ray emission uses proton beams to excite samples and analyze emitted X-rays to determine elemental composition. Secondary ion mass spectrometry uses a focused ion beam to sputter a sample's surface and analyze ejected ions to characterize the top 1-2 nm. Rutherford Backscattering directs ion beams at samples and analyzes backscattered ions to determine elemental depth profiles.

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محمد الملطاوي
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31 views8 pages

Analytical Technique Used Particulate Radiation

This document discusses several analytical techniques used for ion beam modification and analysis, including particulate radiations. It describes Neutron Activation Analysis which uses neutron bombardment to induce radioactivity for elemental analysis. Particle-induced X-ray emission uses proton beams to excite samples and analyze emitted X-rays to determine elemental composition. Secondary ion mass spectrometry uses a focused ion beam to sputter a sample's surface and analyze ejected ions to characterize the top 1-2 nm. Rutherford Backscattering directs ion beams at samples and analyzes backscattered ions to determine elemental depth profiles.

Uploaded by

محمد الملطاوي
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Analytical technique used

Particulate Radiation

presented by:
Mohamed Kamal

Under supervision of:


Dr. Mohamed A. Kassem
prof. at NILES ,Cairo University
introduction
in this report we use several high energy ion beams for ion
beam modification and analysis in a research environment
and analytical technique using Particulate Radiation
Types of ionizing radiations
• Electromagnetic radiations
(x-rays & γ-rays & infrared radiation & visible light & micro
waves & radio waves)
• Particulate radiations
(electron & Alpha-particle & Beta-particle & Neutrons)

Types of analytical technique


• Neutron Activation Analysis
• Particle-induced X-ray emission
• PIXE Secondary ion mass spectrometry
• Rutherford Backscattering
Neutron Activation Analysis
• Neutron activation analysis (NAA) is a nuclear process
used for determining the concentrations of elements in a
vast amount of materials
mechanism
• The sample is bombarded with neutrons, emits
gamma-rays causing the elements to form
radioactive isotopes. The radioactive emissions and
radioactive decay paths for each element are well
known.
• Using this information, it is possible to study spectra
of the emissions of the radioactive sample, and
determine the concentrations of the elements within
it.
• advantages
• A particular advantage of this technique is that it does not
destroy the sample, and thus has been used for analysis of
works of art and historical artifacts
• The method is especially useful for trace element analysis,
e.g. in high-purity substances, and is therefore important in
semiconductor techniques. It can also be used to detect
trace element in water, biological material and minerals. In
archaeology, NAA can give useful information about the
origin of the findings according to the so-called “fingerprint”
of the individual element composition in their raw materials

PIXE Secondary ion mass spectrometry


By the method of PIXE we determine elemental
concentrations in the sample
mechanism
• the sample which is excited by a proton beam with a
typical 1-3 MeV energy. In collisions with the protons, the
atoms in the sample become ionized and excited. The
inner electron holes are subsequently relaxed by the
emission of X-rays whose energy is characteristic of a
given atom
uses of PIXE
• In the laboratory PIXE is routinely applied for several
interdisciplinary problems:
- environmental studies (aerosol particulate matter)
- analysis of materials
- archaeometry
- biomedicine and geology
• advantages
• The characteristics of the method are the following:
- non-destructiveness
- rapidity (± 15 minutes)
- easy preparation of the samples
- determination of most of the elements with Z > 13 with
a good sensibility

Secondary ion mass spectrometry


• is a technique used to analyze the composition of solid
surfaces and thin films
mechanism
• sputtering the surfa ce of the specimen with a focused
primary ion beam and collecting and analyzing ejected
secondary ions. The mass/charge ratios of these
secondary ions are measured with a mass
spectrometer to determine the elemental, isotopic, or
molecular composition of the surface to a depth of 1 to
2 nm
• Due to the large variation in ionization probabilities
among different materials, SIMS is generally
considered to be a qualitative technique, although
quantitation is possible with the use of standards.
advantage
• SIMS is the most sensitive surface analysis
technique, with elemental detection limits ranging
from parts per million to parts per billion

Rutherford Backscattering
• RBS primarily provides information on the profile of
concentration versus depth for heavy elements in a
light material, e.g. titanium in alumina
mechanism
• Typically, a beam of 2-3 MeV He+ ions is directed
perpendicularly on the sample’s surface. As energetic
ion penetrates the material, it loses energy mainly in
collisions with electrons and only occasionally with
nuclei.
• When the positively charged He+ ion comes close to
the nucleus of an atom, it will be repelled by positively
charged nucleus. The repulsion force is increasing
with the mass of the target atom. For very heavy
atoms such as lead or gold, the He+ ion can be
repelled backwards with nearly the same energy as it
had before the collision. By measuring the energy
spectrum of the recoiled ions, information on the
composition of the elements and their depth within the
sample can be obtained

Figure 5:
Energy spectrum of ions scattered from surface atoms (full curve) and from atoms in a thin layer
(dashed curve).

• In RBS, only backscattered ions are detected, and


backscattering can only occur if the target atom’s
mass is heavier than that of the incident ion.
Conventional RBS is done with 4He ions. There are,
however, several advantages using heavier ions such
as 12C, 16O, 28Si or 35Cl, where, for example, better
mass resolution is required for heavy elements, or to
eliminate large amounts of backscatters from oxygen
when studying ceramic oxides

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