Analytical Services Available at NCP: Annex-A

Analytical Services Available at NCP
Equipment used for

Sr. No Type of analytical services
analysis
Nano Science & Technology
Precise studies of surface

1 chemical composition, XPS
elemental quantification
Electrical and photovoltaics

Keithly, Xe-1000W
2 measurements with and
source
without solar simulator
Atomic and Laser Physics

1 LIBS Laser+Spectrometer+PC
Laser+Power supplies +
Time of flight mass
2 Oscilloscope+Vacuum
spectrometer (TOF-MS)
pump +TOF+ PC
Note: This cost will cover only the recording of spectra but not the analysis of spectra.
Experimental High Energy Physics
PCB designing
1 PC, CAD software
(single and multilayer)
Reverse Engineering of PC, CAD software,
2 sophisticated scientific Oscilloscope, function
equipment’s generator…etc
Repair and maintenance of
Oscilloscope, Multi-
3 scientific electronics
meter, ..etc
equipment’s
Development of Gases
4 As per requirement
detectors
Design and develop detector
5 PC, WinCC-OA software
control system
Design and develop
6 microcontroller based smart Chip Programmer, software
projects
Electrical measurement with

7 Keithley, lab view setup
and without cosmic muons
Vacuum Science & Technology
Electron Beam Evaporation For deposition of

System nanostructured
1
Specs: thin film coating of oxides,
4 crucibles for target material, elements compounds etc.
High Vacuum, Thickness
monitor, Automatic control
Thermal Coating Unit For deposition of thin

2 Specs: film/coating
Two boats for target material, of elements, metals etc.
High Vacuum, Manual
Control
For Phase transformation,

Low Pressure Chemical Vapor
production
Deposition (LPCVD)
of CNT’s, Annealing,
3 Specs:
sintering and calcination of
Temp 1400⁰C, Low Vacuum,
samples under vacuum &
Different gases
different environments.
Vacuum Oven For drying, annealing,

4 Specs: Temp 200 0C, Low sintering and calcination of
Vacuum, For Different samples
environment
LCR meter For measurement of

5 Specs: Frequency 100 Hz to Inductance, capacitance and
10 KHz, Accuracy 0.25% resistive of samples
Spin Coater For solution based thin film

6 Specs: coating
RPM 5000
7 Spray Coating For coating of PTFE only
Raman Spectroscopy Raman Spectrum of

8 Specs: powder/liquid sample
Wavelength 785 nm, software
for spectrum, scanning up to
2400 cm-1 Raman Shift
Primary / secondary
9
Calibration of vacuum gauges vacuum standards
10 Helium leak detector

Leak detection & rectification
Pumping speed measurement Vacuum pump measuring
11
of rotary/roots/diffusion system
vacuum pumps
Permeability measurement of Permeability measurement
12
Helium gas system
13 Vacuum system designing &

development
14
Vacuum system up gradation Depending upon user requirements & complexity of the v
Problem identification &
15 rectification of industrial
vacuum system
16 Repair / maintenance of all Depending upon fault / troubleshooting of the vacuu

types of vacuum pumps
Experimental Physics & Accelerator Facility
RBS, EBS, PIXE, PIGE,
1 Ion Beam Accelerator
NRA, ERD
2 Total - IBA Ion Beam Accelerator
3 RBS Channeling Ion Beam Accelerator
Ion Beam Irradiation /

4 Ion Beam Accelerator
Implantation , Bio Irradiation
5 Gamma Ray spectroscopy Gamma Ray spectroscopy
*Sample test prices may change anytime due to change in prices of chemicals in the market.
Glossary:
Bio-Irradiation:
· Ion sources available= Proton, Helium, Carbon, Copper, Gold, Silicon, Boron, Nickle
· Ion energy range available = 0.8 MeV-15 MeV
· Exposure area= 8 mm diameter
· Ion Influence range = 1011 – 5 x 1015 ions/cm2
EBS: Elastic non-Rutherford Backscattering

· Resonance scattering for low concentration of Nitrogen, Oxygen, Carbon, Boron etc.
ERD: Elastic Recoil Detection

· Non-destructive quantitative compositional analysis
· Detection of Hydrogen or deuterium in thin films
· Hydrogen detection in metals
Gamma Ray Spectroscopy: Detection of radionuclides (radioactive contaminants) in soil, water, food and air sampl
IBA: Ion Beam Analysis
Ion Beam Irradiation / Implantation:

· Ion sources available= Proton, Helium, Carbon, Copper, Gold, Silicon, Boron, Nickle
· Ion energy range available = 0.8 MeV-15 MeV
· Exposure area= 8 mm diameter
· Ion Influence range = 1011 – 5 x 1015 ions/cm2
LCR An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (
Meter: electronic component.
NRA: Nuclear Reaction Analysis

· Measurement of low levels of B,C,N,O and F
· Depth Profiling of light element in heavy matrix (Z<15)
· Non-Destructive compositional analysis
· Quantitative measurement by calibration standards
· Measurement of depth profiling by stepping the of accelerator to produce reactions with narrow resonance
PIXE: Particle Induced X-ray Emission

· A non-destructive technique for quantitative as well as qualitative elemental analysis of different materials (FromA1-U
· Trace element Analysis of different materials (1-100 ppm)
· Probe depth up to tens of microns
· Higher signal to background ratio
· PIXE is 100 times more sensitive than EDX
PIGE: Particle Induced Gamma ray Emission

· Measurement of low levels of B,C,N,O and F
· Depth Profiling of light element in complex matrix (Z<15)
· Non-Destructive compositional analysis
· Quantitative measurement by calibration standards
RBS : Rutherford Backscattering Spectroscopy

· A non-destructive technique for multi-element composition (B-U)
· Measurement of thin film composition and thickness (~1nm) to a depth of ~3 micron
· Depth profiles
RBS Channeling:
· Crystallographic analysis and crystalline quality of thin film
· Crystal damage/defect profiling; change of crystallinity with depth
· Impurity location in crystals
· Lattice location of dopants and point defects; XRD cannot detect point defects but only the extended defects
· Determination of percent amorphization and thickness of amorphized layers
Total-IBA: Data of different techniques collected simultaneously
XPS: X-ray Photoelectron Spectroscopy

Annex-A
tical Services Available at NCP
Approximate time required
*Cost of sample analysis (PKR) for analysis after receipt of
sample(s)
XPS survey and detailed Scan =10000

XPS with Imaging = 10000
Auger Spectroscopy= 10000
One week
Auger spectroscopy with Auger Imaging = 12000
EDX = 2000
ARPES = 5000
Electrical measurements = 3000

-do-
Electrical measurement with solar simulator =5000
1000/spectra 10 days
5000/spectra 15 days
the analysis of spectra.
As per nature of project As per nature of project
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Rs. 3000 //
15000/- per sample Three week
10000/- per sample One week
10000/- per day Three week
8000/- per day One week
1000/- per sample Two week
5000/- per sample Three week
a. Rough / medium (10,000/- per sample) a. One week

b. High / ultra-high (20,000/ per sample b. Two week
Min Rs. 30,000/- to max (depending upon system
One week to two week
complexity)
Rs. 50,000/- to 150,000/- max One month to three months
Rs. 50,000/- per sample Three months
Depending upon user requirements & complexity of the vacuum system
Depending upon fault / troubleshooting of the vacuum pump
Rs. 1000 for Researchers & Rs. 500 for Students One month
es of chemicals in the market.
, Gold, Silicon, Boron, Nickle
n, Oxygen, Carbon, Boron etc.
radioactive contaminants) in soil, water, food and air samples

, Gold, Silicon, Boron, Nickle
quipment used to measure the inductance (L), capacitance (C), and resistance (R) of an
elerator to produce reactions with narrow resonance
s qualitative elemental analysis of different materials (FromA1-U)
~1nm) to a depth of ~3 micron
with depth
not detect point defects but only the extended defects

s of amorphized layers

Analytical Services Available at NCP: Annex-A

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Analytical Services Available at NCP: Annex-A

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Analytical Services Available at NCP

Equipment used for

Nano Science & Technology

Precise studies of surface

Electrical and photovoltaics

Atomic and Laser Physics

Electrical measurement with

Electron Beam Evaporation For deposition of

Thermal Coating Unit For deposition of thin

For Phase transformation,

Vacuum Oven For drying, annealing,

LCR meter For measurement of

Spin Coater For solution based thin film

Raman Spectroscopy Raman Spectrum of

10 Helium leak detector

13 Vacuum system designing &

16 Repair / maintenance of all Depending upon fault / troubleshooting of the vacuu

Ion Beam Irradiation /

5 Gamma Ray spectroscopy Gamma Ray spectroscopy

EBS: Elastic non-Rutherford Backscattering

ERD: Elastic Recoil Detection

Ion Beam Irradiation / Implantation:

NRA: Nuclear Reaction Analysis

PIXE: Particle Induced X-ray Emission

PIGE: Particle Induced Gamma ray Emission

RBS : Rutherford Backscattering Spectroscopy

XPS: X-ray Photoelectron Spectroscopy

XPS survey and detailed Scan =10000

Electrical measurements = 3000

the analysis of spectra.

As per nature of project As per nature of project

10000/- per sample One week

10000/- per day Three week

8000/- per day One week

1000/- per sample One week

1000/- per sample One week

1000/- per sample Two week

5000/- per sample Three week

a. Rough / medium (10,000/- per sample) a. One week

Rs. 50,000/- per sample Three months

Depending upon user requirements & complexity of the vacuum system

Depending upon fault / troubleshooting of the vacuum pump

es of chemicals in the market.

, Gold, Silicon, Boron, Nickle

n, Oxygen, Carbon, Boron etc.

radioactive contaminants) in soil, water, food and air samples

elerator to produce reactions with narrow resonance

s qualitative elemental analysis of different materials (FromA1-U)

~1nm) to a depth of ~3 micron

not detect point defects but only the extended defects

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