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    Y14.45 Draft 07-Dec-2020 Revisions Only

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    Mani Rathinam Rajamani
    This document defines terms and requirements for reporting measurement data, including: 1) Definitions for location-constrained and orientation-constrained measured mating and minimum material envelopes. 2) A mathematically fitted reference frame is a coordinate system constrained by measurement data through mathematical fitting. 3) Requirements for Method B size tolerance data reporting, which must include two measured values to address both MMC and LMC size limits. 4) For profile of a line tolerances, Method C reports surface deviation values for each cross section to determine measured profile. Positive values indicate more material, negative less material.

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    Y14.45 Draft 07-Dec-2020 Revisions Only

    Uploaded by

    Mani Rathinam Rajamani
    250 views3 pages
    This document defines terms and requirements for reporting measurement data, including: 1) Definitions for location-constrained and orientation-constrained measured mating and minimum material envelopes. 2) A mathematically fitted reference frame is a coordinate system constrained by measurement data through mathematical fitting. 3) Requirements for Method B size tolerance data reporting, which must include two measured values to address both MMC and LMC size limits. 4) For profile of a line tolerances, Method C reports surface deviation values for each cross section to determine measured profile. Positive values indicate more material, negative less material.

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    This document defines terms and requirements for reporting measurement data, including: 1) Definitions for location-constrained and orientation-constrained measured mating and minimum material envelopes. 2) A mathematically fitted reference frame is a coordinate system constrained by measurement data through mathematical fitting. 3) Requirements for Method B size tolerance data reporting, which must include two measured values to address both MMC and LMC size limits. 4) For profile of a line tolerances, Method C reports surface deviation values for each cross section to determine measured profile. Positive values indicate more material, negative less material.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    250 views3 pages

    Y14.45 Draft 07-Dec-2020 Revisions Only

    Uploaded by

    Mani Rathinam Rajamani
    This document defines terms and requirements for reporting measurement data, including: 1) Definitions for location-constrained and orientation-constrained measured mating and minimum material envelopes. 2) A mathematically fitted reference frame is a coordinate system constrained by measurement data through mathematical fitting. 3) Requirements for Method B size tolerance data reporting, which must include two measured values to address both MMC and LMC size limits. 4) For profile of a line tolerances, Method C reports surface deviation values for each cross section to determine measured profile. Positive values indicate more material, negative less material.

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    At a glance
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    The document discusses measurement data reporting practices and definitions related to dimensional measurements and tolerancing.

    Location-constrained measured mating envelope refers to the highest points of a measured surface that coincides with a similar perfect feature while constrained in location. Location-constrained measured minimum material envelope refers to the lowest points of a measured surface that coincides with a similar perfect feature while constrained in location.

    The resolved geometry method determines conformance by comparing the resolved geometry to the tolerance zone, while the surface method determines conformance by comparing the surface to the virtual condition.

    Y14.

    45 DRAFT 7 DEC 2020

    Y14.45 – 20XX

    Y14.45
    Measurement Data Reporting

    ENGINEERING PRODUCT DEFINITION AND RELATED DOCUMENTATION PRACTICES

    DRAFT
    TENTATIVE
    SUBJECT TO REVISION OR WITHDRAWAL
    Specific Authorization Required for Reproduction or Quotation
    ASME Standards Certification

    THE AMERICAN SOCIETY OF MECHANICAL ENGINEERS


    Two Park Avenue
    New York, New York 10016-5990
    Y14.45 DRAFT 7 DEC 2020

    3.11 LOCATION-CONSTRAINED MEASURED MATING ENVELOPE

    location-constrained measured mating envelope: a similar perfect feature(s) counterpart expanded within an
    internal feature(s) or contracted about an external feature(s), until it coincides with the measured surface(s)
    at the highest points, while constrained in location to the applicable datum reference frame or reporting
    coordinate system and subject to measurement uncertainty. This envelope is on or outside the material.

    3.12 LOCATION-CONSTRAINED MEASURED MINIMUM MATERIAL ENVELOPE

    location-constrained measured minimum material envelope: a similar perfect feature(s) counterpart


    expanded within an external feature(s) or contracted about an internal feature(s), until it coincides with the
    measured surface(s) at the lowest points, while constrained in location to the applicable datum reference
    frame or reporting coordinate system and subject to measurement uncertainty. This envelope is on or within
    the material.

    3.13 MATHEMATICALLY FITTED REFERENCE FRAME

    T
    mathematically fitted reference frame: a coordinate reference frame, usually a right-hand rectangular
    coordinate system, that is constrained relative to measurement data by a mathematical fitting process,
    observing simultaneous requirements when applicable. A mathematically fitted reference frame is also
    generally a reporting coordinate system.

    NOTE: This type of coordinate system is used for cases such as an unconstrained profile of a surface, when
    AF
    no datum features are specified. For these cases, a mathematically fitted reference frame may be
    established and data can be reported relative to it.

    3.289 ORIENTATION-CONSTRAINED MEASURED MATING ENVELOPE

    orientation-constrained measured mating envelope: a similar perfect feature(s) counterpart expanded within
    an internal feature(s) or contracted about an external feature(s), until it coincides with the measured
    surface(s) at the highest points, while constrained in orientation to the applicable datum reference frame or
    reporting coordinate system and subject to measurement uncertainty. This envelope is on or outside the
    material.
    R
    3.2930 ORIENTATION-CONSTRAINED MEASURED MINIMUM MATERIAL ENVELOPE

    orientation-constrained measured minimum material envelope: a similar perfect feature(s) counterpart


    expanded within an external feature(s) or contracted about an internal feature(s), until it coincides with the
    measured surface(s) at the lowest points, while constrained in orientation to the applicable datum reference
    frame or reporting coordinate system and subject to measurement uncertainty. This envelope is on or within
    the material.
    D

    3.34 RESOLVED GEOMETRY METHOD

    resolved geometry method: a method of determining conformance where the resolved geometry is compared
    to the tolerance zone.
    NOTE: ASME Y14.5 uses the less inclusive term “axis method” instead of resolved geometry method.

    3.36 SURFACE METHOD

    surface method: a method of determining conformance where the surface is compared to the virtual
    condition.
    Y14.45 DRAFT 7 DEC 2020

    5.1 GENERAL

    This Section establishes requirements for method B data reporting for size tolerances. A size specification
    for a regular feature of size defines two requirements: the MMC size limit and LMC size limit. Method B
    reporting for size tolerances shall include two reported values to address both limits of size.

    5.5 SIZE WHEN PERFECT FORM IS NOT REQUIRED AT EITHER MMC OR LMC

    When the requirement for perfect form at MMC or LMC does not apply, a size specification for a regular
    feature of size defines two requirements, (a) the LMC size limit and (b) the MMC size limit as follows:a size
    specification for a regular feature of size defines only the requirement that the actual local sizes of the
    feature shall be within the specified limits of size. To address this requirement, method B data shall include
    two method B reported values with each separately identified:

    (a) The actual local sizes of the feature shall not violate the LMC limit of size smallest measured local size
    value.

    T
    (b) The actual local sizes of the feature shall not violate the MMC limit of size largest measured local size
    value.

    To address these requirements, method B data shall include two measured values as defined in paras. 5.3.2
    and 5.4.2, with each value separately identified in the report. See Figures 5-5 and 5-6.
    AF
    9.2.2 Method C Surface Deviations for Profile of a Line Tolerances

    Method C surface deviations for profile of a line tolerances are gathered for each measured cross section of
    the measured feature. The surface deviation values are used to determine the measured profile value for
    each cross section, based on the high or low extreme surface deviation value that will yield the largest
    measured profile value. These surface deviation values will be closest to a tolerance zone boundary for a
    conforming cross section or farthest from a tolerance zone boundary for a nonconforming cross section.
    When more material than true profile exists at a measured location the surface deviation is a positive value.
    When less material than true profile exists at a measured location the surface deviation is a negative value.
    R
    D

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