ANSI ® C37.

57-1990

American National Standard for Switchgear—

Metal-Enclosed Interrupter Switchgear

Assemblies—Conformance Testing

Co-Secretariat

Institute of Electrical and Electronics Engineers

National Electrical Manufacturers Association (Administrative)

Approved July 5, 1990

American National Standards Institute, Inc

i
American National Standard

Approval of an American National Standard requires verification by ANSI that the requirements for due process,
consensus, and other criteria for approval have been met by the standards developer.

Consensus is established when, in the judgment of the ANSI Board of Standards Review, substantial agreement has
been reached by directly and materially affected interests. Substantial agreement means much more than a simple
majority, but not necessarily unanimity. Consensus requires that all views and objections be considered, and that a
concerted effort be made toward their resolution.

The use of American National Standards is completely voluntary; their existence does not in any respect preclude
anyone, whether he has approved the standards or not, from manufacturing, marketing, purchasing, or using products,
processes, or procedures not conforming to the standards.

The American National Standards Institute does not develop standards and will in no circumstances give an
interpretation of any American National Standard. Moreover, no person shall have the right or authority to issue an
interpretation of an American National Standard in the name of the American National Standards Institute. Requests
for interpretations should be addressed to the secretariat or sponsor whose name appears on the title page of this
standard.

CAUTION NOTICE: This American National Standard may be revised or withdrawn at any time. The procedures of
the American National Standards Institute require that action be taken periodically to reaffirm, revise, or withdraw this
standard. Purchasers of American National Standards may receive current information on all standards by calling or
writing the American National Standards Institute.

Published by

American National Standards Institute

1430 Broadway, New York, New York 10018

Copyright © 1990 by American National Standards Institute All rights reserved.

No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without prior
written permission of the publisher.

Printed in the United States of America

A6C1290/32

ii
Foreword

(This Foreword is not part of American National Standard C37.57-1990.)

This standard has been developed to describe selected tests and procedures to demonstrate conformance in accordance
with Section 5., Tests, of American National Standard for Metal-Enclosed Interrupter Switchgear, ANSI/IEEE
C37.20.3-1987. To facilitate its use and to permit timely revisions based on experience, a separate document has been
provided.

This standard has been prepared by a Working Group sponsored by the Power Switchgear Assemblies Technical
Committee of the Switchgear Section of the National Electrical Manufacturers Association (NEMA 8SGV). During
the course of its preparation, coordination has been maintatined with the Power Switching Equipment Technical
Committee of the Switchgear Section of the National Electrical Manufacturers Association (NEMA 8SGVI). Reports
of progress have also been made at regular intervals to the High-Voltage Apparatus Coordinating Committee of the
Electrical and Electronics Standards Management Board of the American National Standards Institute, and the
Switchgear Committee of the Power Engineering Society of the Institute of Electrical and Electronics Engineers.

Through this joint effort over many years, the switchgear assemblies standards have been of extreme value to the
industry and further suggestions for improvement gained in the use of this standard will be welcomed.

Suggestions for the improvement of this standard will be welcome. They should be sent to the National Electrical
Manufacturers Association, 2101 L Street, NW, Washington, DC 20037.

This standard was processed and approved for submittal to ANSI by the Accredited Standards Committee on Power
Switchgear, C37. Committee approval of the standard does not necessarily imply that all members voted for its
approval. At the time it approved this standard, the C37 Committee had the following members:

T. C. Burtnett, Chair
A. K. McCabe (Executive Vice-Chairman, High-Voltage Switchgear Standards)
S. H. Telander (Executive Vice-Chairman, Low-Voltage Switchgear Standards)
D. L. Swindler (Executive Vice-Chairman, IEC Activities)
C. H. White, Secretary
M. B. Williams (Program Administrator)

iii
 Organization Represented Name of Representative

Association of Iron and Steel Engineers J. M. Tillman

Electric Light and Power Group R. L. Capra (Chairman)

D. A. Ditzler
K. D. Hendrix
J. H. Provanzana
T. D. Weston
G. R. Brandenberger (Alt)
T. E. Bruck (Alt)
David E. Soffrin (Alt)

Institute of Electrical and Electronics Engineers H. W. Mikulecky

(Chairman)
W. F. Hoenigmann
D. M. Larson
E. W. Schmunk
C. A. Schwalbe
S. C. Atkinson (Alt)
D. G. Kumberg (Alt)

National Electrical Manufacturers Association R. O. D. Whitt (Chairman)

T. C. Burtnett
R. A. McMaster
R. H. Miller
H. L. Miller (Alt)

Tennessee Valley Authority Robert C. St. Clair

Testing Laboratory Group L. Frier

W. T. O’Grady
R. W. Seelbach (Alt)

U. S. Department of Agriculture H. L. Bowles

U. S. Department of the Army W. M. Jones

U. S. Department of the Interior, Bureau of Reclamation J. W. Reif

U. S. Department of the Navy, Naval Construction Battalion Center R. L. Clark

Western Area Power Authority G. D. Birney

The members of the HVACC/NEMA 8SGV Working Group at the time of development were:

S. Telander, Chair
C. H. White, Secretary
M. Williams, (Program Administrator)

J. Boerger A. J. Kalvaitis D. Swindler

This standard was reviewed and recommended for submittal to the American National Standards Committee on Power
Switchgear (C37) by Subcommittee II (High-Voltage Switchgear) of the High-Voltage Apparatus Coordinating
Committee. The members of Subcommittee II at the time of review in 1981 were:

R. B. Shores, Chair
E. J. Huber, Secretary

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 R. H. Arndt R. A. Few E. Rapske
R. Bennett J. D. Finley R. W. Seelbach
J. H. Boerger J. Fox M. J. Shepnew
B. Bridger A. J. G. Kalvaitis D. L. Swindler
F. L. Cameron W. E. Laubach S. H. Telander
D. B. Cole P. C. Lyons
P. W. Dwyer G. O. Perkins

The members of the NEMA 8SGV Technical Committee at the time of adoption were:

S. Telander, Chair
C. H. White, Secretary

P. Clickner S. Roberts A. Tomeo

H. Keating G. Sakats C. L. Welter
D. Swindler

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CLAUSE PAGE
1. Scope1

1.1 General ....................................................................................................................................................... 1

1.2 Definitions.................................................................................................................................................. 1

2. Referenced Standards..........................................................................................................................................2

2.1 Referenced American National Standards ................................................................................................. 2

2.2 Other Referenced Standard ........................................................................................................................ 2

3. General Test Conditions......................................................................................................................................3

3.1 Ambient Conditions ................................................................................................................................... 3

3.2 Protection Conditions for Control and Instrumentation............................................................................. 3

4. Conformance Test Requirements........................................................................................................................3

4.1 General ....................................................................................................................................................... 3

4.2 Test Requirements...................................................................................................................................... 3
4.3 Test Arrangements ..................................................................................................................................... 4
4.4 Commonalities of Designs and Tests......................................................................................................... 5
4.5 Dielectric Tests .......................................................................................................................................... 5
4.6 Mechanical Performance Tests .................................................................................................................. 7
4.7 Continuous Current Test ............................................................................................................................ 9
4.8 Short-Circuit Current-Carrying Test ........................................................................................................ 12
4.9 Momentary Current Withstand Test ........................................................................................................ 13

5. MEI Switchgear Components ...........................................................................................................................15

5.1 Accessory Devices ................................................................................................................................... 15

5.2 Bus Bar Structures ................................................................................................................................... 16

6. Enclosure Conformance Tests ..........................................................................................................................16

6.1 Category A Test Requirements ................................................................................................................ 16

6.2 Category C Test Requirements ................................................................................................................ 19

7. Treatment of Failures ........................................................................................................................................19

8. Production Tests................................................................................................................................................19

8.1 Low-Frequency Withstand Voltage Tests................................................................................................ 19

8.2 Mechanical Operation Tests..................................................................................................................... 19
8.3 Grounding of Instrument Transformer Cases Test .................................................................................. 20
8.4 Electrical Operation and Wiring Tests..................................................................................................... 20

9. Retesting............................................................................................................................................................20

Annex A (Informative) Conformance Guide for Evaluation of Changes Made in Insulating

Materials and Systems ...................................................................................................................................24

Annex B (Informative) Guide for Methods of Power-Factor Measurement for Low-Voltage

Inductive Test Currents ................................................................................................................................36

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American National Standard for Switchgear—

Metal-Enclosed Interrupter Switchgear

Assemblies—Conformance Testing

1. Scope

This standard is a conformance testing standard optionally applicable to all metal-enclosed interrupter switchgear
assemblies designed, tested, and manufactured in accordance with American National Standard for Metal-Enclosed
Interrupter Switchgear, ANSI/IEEE C37.20.3-1987. The requirement of ANSI/IEEE C37.20.3-1987 is sufficient for
application of metal-enclosed interrupter switchgear assemblies, and conformance testing is not necessary to satisfy
the basic requirements of that standard. Conformance testing is performed to show compliance with the basic
requirements when required to satisfy special agreements of regulatory agency requirements. Conformance testing
may be performed associated with the basic design testing if agreeable to those concerned; however, conformance
testing is more likely to be performed some time after original development to satisfy a special need. Conformance
testing need not be performed if not required.

Metal-enclosed interrupter (MEI) switchgear may include control and instrumentation components unique for the
application, which are not individually evaluated under this standard. However, these components must be suitably
protected as specified in 3.2.

NOTE — In this standard, the use of the term “MEI switchgear” shall be considered to mean “metal-enclosed interrupter
switchgear.”

This standard does not cover equipment intended for use in installations under the exclusive control of electric utilities
for the purpose of communication or metering, or for the generation, control, transformation, transmission, and
distribution of electric energy located in buildings used exclusively by utilities for such purposes or located outdoors
on property owned or leased by the utility or on public highways, streets, or roads, or outdoors by established rights on
private property.

1.1 General

This standard specifies the tests that shall be required to demonstrate that the MEI switchgear being tested conforms
with the ratings assigned to it and meets the electrical and mechanical performance requirements specified in ANSI/
IEEE C37.20.3-1987.

1.2 Definitions

1.2.1 Design Tests: Design tests are tests made by the manufacturer to determine the adequacy of the design of a
particular type, style, or model of equipment or its component parts to meet its assigned ratings and to operate
satisfactorily under normal service conditions or under special conditions if specified. Design tests may be used to
demonstrate compliance with applicable standards of the industry.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

NOTES:
1 — Design tests are made on representative apparatus or prototypes to verify the validity of design analysis and calculation
methods and to substantiate the ratings assigned to all other apparatus of basically the same design. These tests are not
intended to be made on every design or to be used as part of normal production. The applicable portion of these design tests
may also be used to evaluate modifications of a previous design and to assure that performance has not been adversely
affected. These data from previous similar designs may also be used for current designs, where appropriate. Once made, the
tests need not be repeated unless the design is changed so as to modify performance.
2 — Design tests are sometimes called “type tests.”
1.2.2 Production Tests: Production tests are tests made for quality control by the manufacturer on every device or
representative samples, or on parts or materials as required to verify during production that the product meets the
design specifications and applicable standards.
NOTES:
1 — Certain quality assurance tests on identified critical parts of repetitive high-production devices may be tested on a planned
statistical sampling basis.
2 — Production tests are sometimes called “routine tests.”
1.2.3 Conformance Tests: Conformance Tests demonstrate compliance with the applicable standards. The test
specimen is normally subjected to all planned production tests prior to initiation of the conformance test program.
NOTE — The conformance tests may, or may not, be similar to certain design tests. Demonstration of margin (capabilities) beyond
the standards is not required.

2. Referenced Standards

2.1 Referenced American National Standards

This standard is intended to be used in conjunction with the following American National Standards. When these
standards are superseded by a revision approved by the American National Standards Institute, Inc, the revision shall
apply.

ANSI C37.55-1989, Conformance Test Procedure for Metal-Clad Switchgear

ANSI C37.58-1990, Indoor AC Medium-Voltage Switches for Use in Metal-Enclosed Switchgear—Conformance Test
Procedures

ANSI/IEEE C37.09-1979 (R1989), Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical
Current Basis

ANSI/IEEE C37.20.3-1987, Metal-Enclosed Interrupter Switchgear

ANSI/IEEE C37.26-1972 (R1978), Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test
Circuits (see Appendix B)

ANSI/IEEE 4-1978, Techniques for High-Voltage Testing

2.2 Other Referenced Standard

This standard is also intended for use in conjunction with IEEE Standard for Indoor AC Medium-Voltage Switches for
Use in Metal-Enclosed Switchgear, IEEE C37.20.4. 1

1
At the time of publication of this standard, IEEE C37.20.4 was under development. Contact the secretariat for more recent information.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

3. General Test Conditions

3.1 Ambient Conditions

The conditions prevailing at the test site during tests on MEI switchgear shall be those usual service conditions in
Section 3. of ANSI/IEEE C37.20.3-1987, except that the temperature of the air surrounding the assembly (ambient)
for the continuous current test shall be within the range of 10°C to 40°C.

3.2 Protection Conditions for Control and Instrumentation

All voltage circuits used for control, relaying, or metering shall be protected within the MEI switchgear as follows:

1) All circuits supplied from external sources (ac or dc) shall have short-circuit protection within the control
source incoming section. This may be provided by a single set of short-circuit protective devices.
2) All circuits supplied from internal sources (ac or dc) shall have short-circuit protection within the same
section as the supply source. If these circuits are supplied by a control power transformer, this protection may
be in the primary circuit only.

Overcurrent protection of voltage circuits may be provided in addition to the required short-circuit protection.

Voltage transformers or potential devices and current transformers shall be used for all instruments, meters, and relays
connected to alternating-current circuits over 240 volts in order to reduce the voltage on instrument wiring which must
necessarily be closely grouped.

Other circuits supplying loads such as heaters, lights, or receptacles shall have overload and short-circuit protection.

Overcurrent protection is not permitted in current transformer secondary circuits.

4. Conformance Test Requirements

4.1 General

Test are made on representative test arrangements of MEI switchgear as described in 4.3 to demonstrate the capability
of the MEI switchgear design to meet its assigned ratings and to operate under normal service conditions as outlined
in Section 3. of ANSI/IEEE C37.20.3-1987. The interrupter switch design utilized shall have been previously qualified
in accordance with or tested simultaneously with the requirements of ANSI C37.58-1990.

4.2 Test Requirements

Representative test arrangements shall be subjected to the following tests, as described in the paragraphs indicated in
parentheses, to prove the adequacy of the design:

1) Dielectric test (4.5)

2) Mechanical performance test (4.6)
3) Continuous current test (4.7)
4) Short-circuit current carrying test (4.8)
5) Momentary current withstand test (4.9)

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Table 1— Test Arrangements

MEI Switchgear Interrupter Switch

Test Rated Fault Closing

Arrangement Maximum Rated Continuous Short-Time Current Capability (Rms Asv)
Number Voltage (kV) Current (Amps) Capability (Rms Sym) kA kA

1–3 4.76 600 12.5, 25, and 38 20, 40, and 61

4–7 4.76 1200 12.5, 25, 38, and 50 20, 40, 61, and 80

8–10 8.25 600 12.5, 25, and 38 20, 40, and 61

11–14 8.25 1200 12.5, 25, 38, and 50 20, 40, 61, and 80

15–17 15.0 600 12.5, 25, and 38 20, 40, and 61

18–21 15.0 1200 12.5, 25, 38, and 50 20, 40, 61, and 80

22–24 25.8 600 12.5 and 25 20 and 40

25–28 38.0 600 12.5 and 25 20 and 40

4.3 Test Arrangements

Where power fuses are utilized, fuses of the maximum rating shall be included in the test. Two test arrangements are
required to verify conformance of units provided with power fuses and similar units without power fuses. When
current-limiting fuses are used, an overall rating may be assigned to the combination.

4.3.1 Stationary Switch Arrangement

The test arrangement shall contain a three-phrase interrupter switch (and three power fuses if applicable) with
necessary bus and bus supports located in a metal-enclosed structure.

The interrupter switch will be connected to a main bus of the following ratings:

Interrupter Switch Rating

(amperes) Main Bus Rating

200 600

600 600

1200 1200

The main bus will extend through an insulating plate on the side of the vertical section approximately 12 inches (300
mm) for test connection in accordance with Table 2.

Test connection shall be brought to the interrupter switch terminals (or load side of the fuse terminal) in accordance
with Table 2. The connections shall either be brought through the bottom of the vertical section or through a cut-out,
insulated and closed on one side near the floor line.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

4.3.2 Drawout Switch Arrangement

If the design of the drawout interrupter switch structure is physically equivalent to the structure for metal-clad
switchgear, the requirements of ANSI C37.55-1989 apply.

If the design of the drawout interrupter switch structure is not physically equivalent to the structure for metal-clad
switchgear, the test arrangement requirements for the stationary arrangement shall be utilized.

4.4 Commonalities of Designs and Tests

Due to similarities in design and construction of functional elements used on several different types, styles, models,
sizes, or ratings of MEI switchgear, a test conducted on one test arrangement shall be properly extended to qualify
other test arrangements using similarly designed elements within the intent of this standard. In each case,
consideration must be given to the nature of the specific test, its influence on the MEI switchgear performance, and the
elements of the MEI switchgear that will be affected. Listed in Table 1 are the various voltage and continuous current
ratings of MEI switchgear and the associated interrupter switch fault closing and short-circuit current capabilities.
Representative test arrangements are to be selected from them. The criteria below are intended for information and
guidance in the selection of the representative test arrangement for each test and shall not limit its applicability.

1) Dielectric tests. One test arrangement for each voltage class or the combination of voltage classes that has the
most highly electrically stressed insulation; for example, minimum air clearance or shortest creepage path.
2) Mechanical performance tests. The highest continuous current rating of interrupter switch used with each
type of interlocking arrangement.
3) Continuous current test. The most compact design for each continuous current rating and having the highest
current density.
4) Short-circuit current carrying test. The highest short-circuit current densities.
5) Momentary current withstand test. For comparable bus and bus bracing and spacings, the smallest conductor
size; or for comparable bus design, the highest short-circuit current rating.

Representative test arrangements shall be determined prior to testing.

4.5 Dielectric Tests

Low-frequency withstand voltage tests (4.5.2) and impulse withstand tests (4.5.3) shall be made on MEI switchgear
assemblies to determine the ability of the insulation system to withstand overvoltages.

4.5.1 General

The tests on the insulation system shall be made as follows:

1) With the stationary interrupter switch in position or with the drawout switch in the connected position, apply
the test voltage between primary circuits and ground:
a) With the interrupter switch contacts closed; between each phase of the test arrangement individually
with the frame and the other phases grounded.
b) With the interrupter switch contacts open; between each terminal of the test arrangement individually
with the frame and all other terminals grounded.
2) If drawout, with the interrupter switch in the test position and closed, apply the test voltage to primary circuits
simultaneously to the terminals on the incoming side of the test arrangement with the frame outgoing
terminals grounded. Repeat tests by applying the test voltage to the outgoing side with the frame and
incoming side terminals grounded.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

4.5.2 Low Frequency Withstand Voltage Tests

4.5.2.1 Purpose of Tests

When these tests are applied to a new MEI switchgear, they demonstrate the low-frequency withstand voltage rating
assigned to the MEI switchgear in accordance with ANSI/IEEE C37.20.3-1987.

4.5.2.2 Description of Tests

1) Low-frequency withstand tests shall be made in accordance with ANSI/IEEE 4-1978, unless otherwise
specified.
2) The voltage to be applied for one minute shall be the rated low-frequency withstand voltage. (See ANSI/IEEE
C37.20.3-1987.)
3) The frequency of the test voltage shall be the rated frequency of the interrupter switch ± 20%.
4) The voltage shall be an alternating single-phase voltage.
5) In making the test, the initial voltage applied shall be permitted to be not more than 50% of the appropriate
test level. The voltage shall be raised uniformly at a rate not greater than 750 volts per second to the test level.
The voltage shall be held at the test level for not less than one minute. The voltage shall be reduced uniformly
to 50% of test level or less before it is switched off.
6) The test shall be made at the atmospheric temperature, pressure, and humidity prevailing at the test site.
Suitable correction factors shall be permitted to be applied to the actual measured values of low-frequency
withstand voltage to convert them to the standard atmospheric conditions in accordance with 1.3.4 of ANSI/
IEEE 4-1978. Humidity correction factors shall be based on Figure 14 of ANSI/IEEE 4-1978.

4.5.2.3 Performance

The MEI switchgear shall be judged to have passed the test if it has withstood the required level of test voltage for one
minute in accordance with the tests specified in 4.5.1. (Audible noises or discharges associated with corona which are
frequently encountered in high-voltage testing are not necessarily indicative of failure.)

If the MEI switchgear did not pass, the provisions of Section 7. shall apply.

4.5.3 Impulse Withstand Test

These tests demonstrate conformance with the full wave impulse withstand voltage rating assigned to an MEI
switchgear in accordance with ANSI/IEEE C37.20.3-1987. The MEI switchgear to be tested shall be new and clean
and shall not have been subjected to prior tests, except as specified in Section 8., Production Tests and in 4.9.4(b),
Momentary Current Withstand Test.

NOTE — Some insulating materials retain a charge after an impulse test, and for these cases care should be taken when reversing
polarity. To allow the discharge of insulating materials, the use of appropriate methods, such as the application of
impulses of the reverse polarity at lower voltages before tests, is recommended.

4.5.3.1 Description of Tests

The impulse withstand test shall be:

1) Conducted in accordance with ANSI/IEEE 4-1978, unless otherwise specified.

2) The standard 1.2/50 impulse voltage wave with crest value equal to the rated impulse withstand voltage of the
MEI switchgear being tested shall be applied in accordance with 2.4 of ANSI/IEEE 4-1978. In these tests,
three positive and three negative impulse voltages shall be applied to each point without causing damage or
flashover; except, where prior testing shows that tests of one polarity are more severe, tests using the opposite
polarity shall be omitted.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

3) Tests shall be made under dry conditions at the atmospheric temperature, pressure, and humidity prevailing in
the test laboratory. Suitable correction factors shall be applied to the actual measured values of impulse
voltages to convert them to standard atmospheric conditions in accordance with 1.3.4 of ANSI/IEEE 4-1978.
Humidity correction factors shall be based on curves derived for rod gaps in accordance with Figure 14 of
ANSI/IEEE 4-1978.

4.5.3.2 Performance

Based upon tests conducted with each test sequence being comprised of three consecutive applications of impulse
voltage, the evaluation of the performance of the MEI switchgear shall be made on the basis of each of these
sequences. If no disruptive discharge or flashover occurs during a particular sequence, the MEI switchgear shall be
judged to have passed that sequence. If a single disruptive discharge or flashover has occurred during a particular
sequence, that sequence shall be repeated for the same terminal or terminal grouping. During the repeated sequence if
there is no disruptive discharge or flashover, the MEI switchgear shall be judged to have passed the repeaated sequence
with the single disruptive discharge or flashover occurring in the first sequence being considered to have been a
random occurrence. If a disruptive discharge or flashover occurs during the repeated sequence, the MEI switchgear
shall be judged to have failed that sequence only and the provisions of Section 7. shall be applied.

For an MEI switchgear to be judged to have demonstrated the assigned rated impulse withstand test voltage, it shall
have passed all of the required tests in accordance with 4.5.1.

4.6 Mechanical Performance Tests

4.6.1 Removable Interrupter Switch

Mechanical endurance tests shall be performed to demonstrate proper operation of the following elements with all
external primary connections removed.

1) Separable primary contacts

2) Separable control contacts (if provided)
3) Interrupter switch removable element position interlocks
4) Stored energy mechanism interlocks, as applicable
5) Auxiliary switches
6) Housing switches

The tests shall be performed with an interrupter switch incorporating a mechanism with fault-closing capability. Tests
are not required on interrupter switches having other types of mechanisms if the interlocks are the same for both. If
they are not, the other designs shall be tested.

The test shall consist of 10 complete cycles of operation as described without repair or replacement of any functional
parts.

The interrupter switch shall be open and in the disconnected position with the stored energy mechanism discharged.
Separable contacts shall be lubricated according to the manufacturer’s recommendations.

Each complete cycle of operation shall consist of the following steps:

Step 1. Move the interrupter switch to the test position.

NOTE — The test position may correspond to the disconnect position.

a) Close the interrupter switch.

b) Check to assure that the interrupter switch cannot be moved to the connected position while closed.
c) Open the interrupter switch.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Step 2. Move the interrupter switch to a position approximately midway between the test and connection positions.

a) Check to assure that the interrupter switch cannot be closed, either electrically or mechanically.

Step 3. Move the interrupter switch to the connected position.

a) Close the interrupter switch.

b) Check to assure that the interrupter switch cannot be moved out of the connected position while closed.
c) Open the interrupter switch.

Step 4. Move the interrupter switch to a position approximately midway between the test and connected positions.

a) Check to assure that the interrupter switch cannot be closed, either electrically or mechanically.

Step 5. Move the interrupter switch to the test position.

a) Close the interrupter switch.

b) Check to assure that the interrupter switch cannot be moved to the connected position while closed.
c) Open the interrupter switch.

Step 6. Move the interrupter switch to the disconnect position.

NOTE — The disconnect positions may correspond to the test position.

After completion of 10 cycles, check to assure that if the mechanism can be left in the fully-charged condition, either
the closing or racking function is blocked.

4.6.2 Stationary Interrupter Switch

Mechanical endurance tests shall be performed to demonstrate proper operation of the following interlocks:

1) Interlock to prevent access to the fuses with the interrupter switch closed.
2) Interlock to prevent closing of the interrupter switch if the access door to fuses is open.
3) Interlock to prevent access to the fuses unless the interrupter switch is in open position and the closing
mechanism is in the discharged or blocked position.

The tests shall be performed with an interrupter switch incorporating a mechanism with fault-closing capability. Tests
are not required on interrupter switches having other types of mechanisms if the interlocks are the same for both. If
they are not, the other designs shall be tested.

The test shall consist of 10 complete cycles of operation as described without repair or replacement of any functional
parts.

The interrupter switch shall be open with the stored energy mechanism discharged.

Each complete cycle of operation shall consist of the following steps:

Step 1.

a) Close the interrupter switch.

b) Check to assure that the access door to the fuses cannot be opened.

Step 2.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

a) Open the interrupter switch.

b) Open the access door to the fuses.
c) Check to assure that the interrupter switch cannot be closed with the door open.
d) Close door.

In addition, for mechanisms that prevent access to fuses when the closing mechanism is in the charged position:

Step 3.

a) Charge the fault-closing mechanism.

b) Check to assure that the access door to the fuses cannot be opened with the switch charged.

4.6.3 Performance

At the completion of these tests, the mechanism parts and interlocks shall be in essentially the same condition as before
the test. There shall be no galling of the separable primary or control contacts of drawout interrupter switches. If the
MEI switchgear is judged to have failed, the provisions of Section 7. shall apply.

4.7 Continuous Current Test

The continuous current test is made to ensure that the MEI switchgear test arrangement can carry the interrupter switch
rated continuous current at rated frequency without exceeding the allowable temperature limits specified in Tables 2
and 3 of ANSI/IEEE C37.20.3-1987, and in IEEE C37.20.4.

The MEI switchgear test arrangement shall be tested using a three-phase source of power at a frequency of no less than
rated frequency. The MEI switchgear to be tested shall be clean and dry. If the test arrangement selected for continuous
current tests has been subjected to prior tests, it shall be permitted to be maintained. The average of the three-phase
currents is to be maintained at no less than the rated continuous current of the interrupter switch. A single-phase source
of power (all phases in series with flow of current reversed with adjacent phases) may be used at the option of the
manufacturer. Any convenient voltage shall be used.

NOTE — Usual practice is to supply the current by using transformers whose output voltages are less than 10 volts in order to
avoid interference with temperature-measuring equipment.

The current source may be connected to either the main bus or the switch (fuse) terminals.

4.7.1 Duration of Tests

4.7.1.1

The continuous current test shall be made for such a period of time that the temperature rise of any monitored point in
the test arrangement has not increased by more than 1.0°C during each of two successive 30-minute intervals as
indicated by three successive readings. If the temperature rise at the end of the second interval is equal to the
established limits and if the temperature rise has increased since the previous reading, the test shall be continued until
the temperature rise is constant.

4.7.1.2

At the same time as three successive temperature measurements are being made for the purpose of determining the
stability of temperature rise, the currents in each of the three phases of the MEI switchgear shall also be measured. The
average of these nine current measurements shall not be less than the rated continuous current of the MEI switchgear.
No individual current measurement shall be less than 90% or more than 110% of the rated continuous current. When
the temperature is being monitored on only one phase of the MEI switchgear as specified in 4.7.2.5, the average of

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

three currents shall be used andnone of the current measurements on the monitored phase shall be less than the rated
continuous current.

4.7.2 Method of Measuring Temperatures

The temperatures of various parts of the test arrangement shall be monitored with thermocouples connected to a
suitable temperature-measuring device.

4.7.2.1

Thermocouples shall be held in intimate contact with the metallic parts whose temperature is being monitored by such
methods as welding, drilling and peening, or cementing. Whenever possible, unless otherwise specified,
thermocouples shall be located on or near the uppermost side of the part being monitored.

4.7.2.2

Thermocouples shall be used to monitor the temperature rise of insulating members that are in intimate contact with
continuous current-carrying parts. These thermocouples shall be located in the current-carrying part as close as
practical to the accessible junction of the insulation and the metallic part. Normally thermocouples shall be located
near both incoming and outgoing ends of each insulating component where a continuous current-carrying part passes
through more than 3 inches (77 mm) of insulation as measured along the principal axis of the conductor. For cable
terminations, the thermocouples shall be located at the junction of the conductor and its insulation.

4.7.2.3

Thermocouples used to monitor the temperature rise of separable primary contacts (if drawout), of interrupter switch
main contacts, and of hinged contacts in the continuous current path shall be located within approximately 0.5 inch
(13 mm) of the actual contact area unless otherwise specified in this standard. It is recognized that thermocouples
cannot be located directly in the actual contact area without destroying the functional effectiveness of the contact.
Thermocouples shall be located on both incoming and outgoing sides of each single-contact area. Where a contact
assembly is comprised of multiple segments cooperating in a parallel combination to perform a single-contact
function, the multiple contact assembly shall be treated as a single contact for purposes of this section. Where a
contact assembly is comprised of one or more bridging members, each functioning in a series combination with actual
contact areas at both ends of the individual bridging element so that the multiple contact assembly performs a single-
contact function, the contact assembly shall be treated as a single contact for purposes of this section if the distance
between actual contact areas is less than 3 inches (77 mm). For bridging-type contact assemblies having actual contact
areas further apart than 3 inches (77 mm), a single thermocouple shall be located in at least one bridging member
approximately midway between actual contact areas in addition to the thermocouple required at both incoming and
outgoing sides of the contact assembly.

4.7.2.4

Where insulation is disposed along the primary conductor adjacent to the near side of a contact area such that two
thermocouples would be located within 3 inches (77 mm) of each other under provisions stated in 4.7.2.2 and 4.7.2.3,
the thermocouple adjacent to the near side of the contact area shall be omitted.

4.7.2.5

Where prior tests indicate that stabilized temperature readings for corresponding locations on each of the phase-
conducting components are not different from each by more than 5°C, it shall be permitted to monitor only the interior
phase members of the test arrangement. If prior tests indicate that a particular location on any phase had a temperature
rise within 5°C or less of the maximum allowed temperature rise for that location, all similar locations on each phase
of the test arrangement shall be monitored.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

4.7.2.6

The temperature of parts of the MEI switchgear accessible to an operator during the normal course of operation shall
be monitored. A single thermocouple shall be permitted to be located at a position that shall reasonably reflect the
average temperature of the several accessible parts.

If prior tests or experience indicates that the temperature rise of a given accessible part would be within 5 °C or less of
the maximum allowable temperature rise, the thermocouple shall be located at a midposition on that particular part.

4.7.2.7

The temperature rise of primary conducting parts and contact areas that are provided for functions other than the
carrying of continuous current and that are not directly in the continuous current path shall not be monitored even
though such parts or contact areas may be in intimate contact with primary current-carrying conductors. Typical
examples of such parts include, but are not limited to, auxiliary conductors and contacts for transferring current into
interrupter assemblies during interrupter-switch-opening operations, and metallic supporting parts.

4.7.3 Measurement of Ambient Air Temperature

Indoor ambient air temperatures shall be determined by taking the average of the readings of three temperature-
measuring devices such as thermometers or thermocouples, placed as follows:

1) One level with the top of the structure.

2) One 12 inches (305 mm) above the bottom of the structure.
3) One midway between the two above positions.

All temperature-measuring devices shall be placed 12 inches (305 mm) from the structure, not in front of ventilators,
and in locations unaffected by drafts caused by the structure or appreciable radiation from the equipment When the
ambient air temperature is subject to variations that might result in errors in measuring the temperature rise, the
temperature-measuring devices should be immersed in suitable liquid such as oil in a suitable container or reliably
attached to a suitable mass of metal.

NOTE — A convenient form for such a container consists of a metal cylinder with a hole drilled partly through it. This is filled with
liquid and the temperature-measuring device placed inside it. A glass bottle may also be used as a container. The size of
the container should be at least 1 inch (25.4 mm) in diameter and 2 inches (50.8 mm) high.

4.7.4 Copper Conductors for Use in Continuous Current Tests

Bus bars or cables as specified in Table 2 shall be utilized for connection to the bottom interrupter switch or fuse
terminals and the main bus. Conductors shall extend for a minimum length of 4 feet from the main bus and terminals.

If test arrangement internal bus sizes are different than shown, external bus sizes equal to internal sizes may be
substituted at the option of the manufacturer.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Table 2— Copper Conductor Size for Use in Continuous Current Tests

Copper Bars Per Terminal
Interrupter Switch Rating Size Alternate Cable Size

Rating Quantity Inch (mm) Circular Mil

200 amperes One 1/8” × 1” 3.17 × 25.4 One #2/0 maximum

600 amperes One 1/4” × 2” 6.35 × 50.8 Two 350 M.C.M.

1200 amperes One 1/4” × 4” 6.35 × 101.6 Four 500 M.C.M.

NOTE — Where multiple bars are used, they are to be spaced 3/8 inch (9.52 mm) apart.
Configurations shall be vertical unless the design of the test arrangement requires them
to be horizontal. The determination of the configuration shall be at the option of the
manufacturer.

4.7.5 Performance

The MEI switchgear test arrangement shall be judged to have passed the test if the limits of observable temperature
rise specified in Tables 2 and 3 of ANSI/IEEE C37.20.3-1987 and in IEEE C37.20.4 are not exceeded. If the MEI
switchgear is judged to have failed, the provisions of Section 7. shall apply.

4.8 Short-Circuit Current-Carrying Test

A short-circuit current-carrying test shall be made to demonstrate the ability of the MEI switchgear test arrangement
to carry current equal to the interrupter switch short-time current rating for a period of time equal to 2 seconds, unless
limited to a shorter time by the protective device within the assembly. See 4.4, Table 1, for required values.

The interrupter switch designs shall have previously met the conformance test requirements for short-time capability
as required by ANSI C37.58-1990. If the interrupter switch connections are physically equivalent to the interrupter
switch test enclosure connections, only the main bus and ground bus require testing. If the MEI switchgear selected for
test has been subjected to prior tests, it shall be permitted to be maintained.

The MEI switchgear shall be grounded with a minimum of 4/0 copper conductor.

4.8.1 Description of Tests

4.8.1.1

The main bus incoming terminals shall be connected to the test circuit power source. Three-phase tests shall be made
with shorting bar(s) connected as follows:

1) For test of main bus only. At the opposite end of the main bus from the incoming terminals, to cause the
current flow through the main bus and splice. The test shall be for a period of 2 seconds.
2) For test of main bus and interrupter switch connections. At the interrupter switch/fuse outgoing terminals.
The test shall be for a period of 2 seconds unless limited to a shorter time by the protective device within the
assembly.

The test shall be permitted to be either a three-phase test or a single-phase test. In case of a three-phase test, the level
of current specified in 4.9.1.4 shall be required in only one of the phases. In case of a single-phase test, the current shall
be permitted to be conducted through any two adjacent poles connected in series so that the current flows in opposite
directions in each of the selected poles.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

4.8.1.2

A single-phase test shall be made to prove the adequacy of the ground bus to also carry current equal to the interrupter
switch short-time current rating for a 2-second period. For this test, a short-circuit connection shall be made between
the ends of the ground bus and the nearest phase main bus at the end opposite the test arrangement main bus incoming
terminals.

4.8.1.3

The short-circuit connections shall be made with bolted bars of cross-section equal to the bus being tested.

4.8.2 Test Circuit Conditions

4.8.2.1

The current shall be monitored throughout the duration of the test. The rms (root-mean-square) value of current shall
be determined using the method described in 7.1.6 of ANSI/IEEE C37.09-1979. This value squared times the duration
of the test shall be no less than (KI)2Y. The rms value of current for the three-phase test shall be no less than KI. (The
value of Y is 2. See 4.8.1.1.)

To assure that the single-phase test is not required to be more severe mechanically than the three-phase test, its rms
current level may be reduced to no less than 0.93 KI, and the time is to be extended to provide an equivalent I2t.

4.8.2.2

The test voltage may be any convenient level. (A test voltage of 600 volts or less is commonly used.)

4.8.2.3

The circuit power factor (X/R ratio) may be any convenient value since the amount of current asymmetry will have a
negligible effect on heating during the required periods.

4.8.2.4

If the test circuit meets the requirements of 4.9.3, this test may be combined with the momentary current withstand test
(4.9).

4.8.3 Performance

The MEI switchgear shall be judged to have passed the test if it has carried the required rms level of current for the
required time and has suffered no significant damage such as welding of drawout primary contacts or part breakage as
a consequence of the test. If the MEI switchgear is judged to have failed the test, the provisions of Section 7. shall
apply.

4.9 Momentary Current Withstand Test

A momentary current withstand test shall be made to demonstrate the mechanical adequacy of the structure, buses, and
connections to withstand the maximum short-circuit stresses that could occur when properly applied on systems where
the rms asymmetrical value of short-circuit current is equal to the fault-closing rating of the interrupter switches in
MEI switchgear. See Table 1.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

The interrupter switch designs shall have previously met the conformance test requirements for fault-closing
performance as required by ANSI C37.58-1990. If the interrupter switch connections are physically equivalent to the
interrupter switch test enclosure connections, only the main bus and ground bus require testing.

The MEI switchgear shall be grounded with a minimum of 4/0 copper conductor.

If the MEI switchgear selected for test has been subjected to prior tests, it shall be permitted to be maintained.

The incoming bus structure used in a switchgear assembly shall be considered as meeting the short-circuit
requirements if its construction is equivalent to that of the main bus structure which was tested and found to meet the
short-circuit requirements.

4.9.1 Description of Tests

4.9.1.1

The main bus incoming terminals shall be connected to the test circuit power source. Three-phase tests 2 shall be made
with shorting bar(s) connected as follows:

1) For test of main bus only. At the opposite end of the main bus from the incoming terminals, to cause current
to flow through the main bus and splice. The test shall be for a period of 10 cycles on a 60-Hertz basis.
2) For test of main bus and interrupter switch connections. At the switch/fuse outgoing terminals. The test shall
be for a period of 10 cycles on a 60-Hertz basis unless limited to a shorter time by the protective device within
the assembly.

4.9.1.2

A single-phase test shall be made to demonstrate the mechanical adequacy of the ground bus with respect to the nearest
phase bus, to withstand the short-circuit stresses caused by carrying current having an asymmetrical value equal to the
fault-closing rating of the interrupter switch. See Table 1. The short-circuit connection shall be made between the ends
of the ground bus and the nearest phase main bus at the end opposite the test arrangement main bus incoming
terminals.

4.9.1.3

Insofar as possible the test connections shall not add intentional bracing nor impose additional loading to the bus
structure being tested.

4.9.2 Test Duration

The duration of current flow during the momentary current withstand test shall be for 10 cycles on a 60-Hertz basis
(0.167 second) unless limited to a shorter time by the protective device within the assembly. (See 4.9.1.1.)

4.9.3 Test Circuit Conditions

4.9.3.1

The three-phase rms asymmetrical current that verifies the momentary current withstandrating shall be measured at the
major peak of the maximum cycle as determined from the envelope of the current wave and calculated in accordance
with ANSI/IEEE C37.09-1979.

2
Single-phase tests are permissible if it can be determined that they are at least as severe as the three-phase test.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

4.9.3.2

The power factor of the test circuit shall be 15 percent lagging or less (X/R ratio of 6.6 or greater) with X and R in series
connection. See Table 2 of ANSI/IEEE C37.26-1972. 3

4.9.3.3

The frequency of the test circuit shall be 60 Hertz ± 20 percent.

4.9.3.4

The test voltage may be any convenient level. (A test voltage of 600 volts or less is commonly used.)

4.9.4 Performance

The MEI switchgear test arrangement shall be judged to have passed the test if it has carried the required current for
the required time and there is no breakage of the bus supports and either:

1) No permanent deformation of bus bars, or

2) Deformation of bus bars up to 10% of design spacing is permitted. Deformation above this allowance requires
repeat of impulse withstand tests (4.5.3) to verify conformance.

Permanent deformation of bus bars and supports shall not impair mechanical performance as specified in 4.6.

If the MEI switchgear is judged to have failed the test, the provisions of Section 7. shall apply.

5. MEI Switchgear Components

5.1 Accessory Devices

5.1.1

General accessory devices, as contrasted with functional components, are those devices that are not basically required
for proper operation of the MEI switchgear, but perform a secondary or minor function as an adjunct or refinement to
the primary function of the MEI switchgear. No conformance testing shall be required.

5.1.2

Cell-mounted functional components (e.g., mechanism-operated auxiliary switches) and accessories (e.g., interrupter
switch position switches) shall conform to the requirements of their applicable device standards and shall not be tested
electrically or mechanically other than to demonstrate performance as specified in this standard.

5.1.3

When accessory devices are mechanical only (e.g., key interlocks) and are operated rather infrequently, normal
production tests shall be the criteria for demonstrating the operational performance of these devices.

3ANSI/IEEE C37.26-1972 has been withdrawn as an American National Standard (pending review or reaffirmation), but is reproduced in
Appendix B to aid in the completion of the requirements of ANSI C37.57-1990.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

5.2 Bus Bar Structures

Conformance testing of MEI switchgear test arrangements shall provide assurance that other bus bar structures (e.g.,
incoming bus, transfer bus, bus tie bus) are in conformance with this standard if it can be determined that the design
criteria specified in 5.2.1 through 5.2.4 have been provided.

5.2.1 Dielectric Criteria

1) Equal or greater bus bar insulation dielectric strength

2) Equal or greater air clearance distances
3) Equal or greater creepage distances phase-to-phase and phase-to-ground

5.2.2 Continuous Current Criteria

1) Equal or greater conductor cross-sectional area

2) Equal or greater ventilation
3) Equal or greater conductor spacing

5.2.3 Short-Circuit Current-Carrying Criteria

1) Equal or greater conductor cross-sectional area

5.2.4 Momentary Current Withstand Criteria

1) Equal or greater conductor section modulus

2) Equal or less bus support spacing
3) Equal or greater bus support mechanical strength
4) Equal or greater conductor spacing

6. Enclosure Conformance Tests

Enclosure conformance tests are only required if the manufacturer declares a specific category type in accordance with
Appendix A of ANSI/IEEE C37.20.3-1987.

The conformance test requirements for Category B equipment are included in Appendix A of ANSI/IEEE C37.20.3-
1987. Appendix A.

The conformance test requirements for Category A equipment are as specified in 6.1 of this standard. These tests shall
be conducted to complete the provisions of this standard as applicable to the specified Category Type A, B, or C.

6.1 Category A Test Requirements

6.1.1 Test Terms

6.1.1.1 Enclosure Security

The completely assembled apparatus will resist unauthorized entry when tested according to the procedure of this
standard.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

6.1.1.2 Axial Force

Axial force is a force applied along the axis of the pry bar from its handle to its pry tip.

6.1.1.3 Prying Leverage

Prying leverage is a force at right angles to the handle times the distance from this force to the point of insertion of the
pry tip into a joint or crevice of the enclosure.

6.1.2 Test Equipment

The tests for enclosure security shall be conducted with the following equipment, or equivalent, as specified in 6.1.2.1
through 6.1.2.4.

6.1.2.1 Pry Bar

The pry bar, constructed according to Figure 1, is to be used for the pry tests. The force described below shall be
applied to the handle.

1) When an axial force is applied to the handle, the stack of Belleville washers is compressed. The amount of
compression is a measure of the magnitude of the axial force applied. Using a scale or other force-measuring
device, the pry bar shall be calibrated to measure the axial force used to force the tip into the joint under test.
2) The prying leverage applied can be measured indirectly by measuring the deflection of the pry bar. The
indicator is mounted on the pry bar and set to measure deflection of a certain length of the bar. A calibration
can be made that will result in a table or curve showing prying leverage versus reading of the indicator.

6.1.2.2 Pull Tool

The device shown in Figure 2 shall be used in the pull tests.

6.1.2.3 Push Tool

A device that has a square face measuring 0.5 inch × 0.5 inch, as shown in Figure 3, with associated indicator to
measure axial force shall be used to perform the deflection test.

6.1.2.4 Probe Wire

The probing wire shall be bare number 14 AWG softdrawn solid copper wire 10 feet long.

6.1.3 Tests

6.1.3.1 General

The enclosure shall be mounted on a flat surface according to the manufacturer’s specification. With the access doors
closed and locked, the following sequence of tests shall be performed:

1) Pry tests (6.1.3.2)

2) Wire probe tests (6.1.3.4)
3) Pull tests (6.1.3.3)
4) Wire probe tests (6.1.3.4)
5) Deflection tests (6.1.3.5)
6) Operation test (6.1.3.6)

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

6.1.3.2 Pry Tests

The pry bar shall be used on all joints, crevices, hinges, locking means, and the like, that exist between the enclosure
components, including the enclosure/pad interface. The pry bar shall be permitted to be placed at any angle to the
enclosure surface. The tip of the bar shall first be inserted in the opening being tested using the value of axial force
specified in Table 3. Then, with the axial force being maintained, the prying force specified in Table 3 shall be applied.
This force shall be applied alternately, first in one direction and then in the opposite direction (i.e., once in each
direction). Applications of either or both axial and prying force shall be maintained so long as relaxation is occurring.
When relaxation ceases, or if no relaxation occurs after the second test, the pry bar shall be removed and applied at an
untested location.

Table 3— Test Values

Inward axial force 50 pounds

Prying leverage tests 900 inch-pounds

Pull test 150 pounds

Deflection test 100 pounds

6.1.3.3 Pull Tests

A pulling force shall be applied to the critical points of all enclosure parts that can be engaged by the pulling hook. A
pulling force not exceeding the values in Table 3 shall be permitted to be exerted at any angle to the enclosure surface.
This force is to be maintained during any relaxation. When relaxation ceases, or if no relaxation occurs, the pull test
shall be terminated. The hook shall then be inserted into any other part that it can engage, and the test shall be repeated
at the new location. All parts that can be engaged by the pull hook shall be tested once.

6.1.3.4 Wire Probe Tests

Following the pry tests and pull tests described in 6.1.3.2 and 6.1.3.3, an attempt to penetrate the enclosure with the
probe wire shall be made. This penetration shall be attempted at all crevices and joints. The wire shall be straight with
no prebands and shall be gripped by the tester with his bare hands. If the wire enters the joint, the wire shall be
continually pushed until either it can no longer be pushed or it has entered the enclosure completely. This test is passed
if an inspection determines either that the probing wire has not entered the enclosure, or if visible, that the probing wire
is restricted by a barrier intrusion into the interior.

6.1.3.5 Deflection Tests

The deflection test shall be applied to all sides and walls of the enclosure. This test is passed if the specified force (see
Table 3) applied perpendicularly to the surface of the enclosure does not impair the dielectric, mechanical, or corrosion
performance of the equipment.

6.1.3.6 Operation Test

Following all of the tests set forth in 6.1.3.2 through 6.1.3.5, the enclosure shall be easily unlocked and opened and
shall also be easily closed and locked.

6.1.4 Test Values

The minimum test values for which entry shall be prevented are provided in Table 3.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

6.2 Category C Test Requirements

No enclosure security tests are required for Category C equipment.

7. Treatment of Failures

When failures occur during testing, the failures shall be evaluated, corrected, and the equipment shall be retested. A
design change made to the MEI switchgear to correct a failure in a test shall be evaluated for its effect on preceding
tests.

When analysis indicates that a particular corrective action would not have affected results obtained in previous tests, it
shall be permitted to take the corrective action without repeating the previously completed tests.

When analysis indicates that a particular corrective action may have caused a failure in tests previously completed,
only those tests that may have failed shall be repeated on the MEI switchgear to which the corrective action has been
applied. In deciding whether or not to repeat a previous test, it is important that the decision be based on the corrective
action taken and not on the failure which actually occurred.

8. Production Tests

Unless otherwise specified, all production tests shall be made by the manufacturer at the factory on the complete MEI
switchgear or its component for the purpose of checking the correctness of manufacturing operations and materials.
(See ANSI/IEEE C37.20.3-1987.)

Production tests shall include the following:

1) Low-frequency withstand voltage tests (8.1)

2) Mechanical operation tests (8.2)
3) Grounding of instrument transformer cases test (8.3)
4) Electrical operation and wiring tests (8.4)

8.1 Low-Frequency Withstand Voltage Tests

Low-frequency withstand tests shall be made at the factory on each switchgear assembly in the same manner as
described in 4.5.2 with the exception that tests across the open gap(s) (see 4.5.1(2)) are not required. Tests shall be
made in accordance with 4.5.1(1) and 4.5.2.2. Drawout interrupter switch removable elements need not be tested in the
assembly if they are tested separately. Control devices, potential transformers, and control power transformers, which
are connected to the primary circuit, may be disconnected during the test.

8.2 Mechanical Operation Tests

Mechanical operation tests shall be performed to ensure the proper functioning of removable element operating
mechanisms, shutter, mechanical interlocks, and the like. These tests shall ensure the interchangeability of removable
elements designed to be interchangeable.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

8.3 Grounding of Instrument Transformer Cases Test

The effectiveness of grounding of each instrument transformer case or frame shall be checked with a low-potential
source, such as 10 volts or less, using bells, buzzers, or lights. This test is required only when instrument transformers
are of metal case design.

8.4 Electrical Operation and Wiring Tests

8.4.1 Control Wiring Continuity

The correctness of the control wiring of MEI switchgear shall be verified by (1) actual electrical operation of the
component control devices, or (2) individual circuit continuity checks by electrical circuit testers, or by both (1) and
(2).

8.4.2 Control Wiring Insulation Test

A 60-Hz test voltage, 1500 volts to ground, shall be applied for 1 minute after all circuit grounds have been
disconnected and all circuits wired together with small bare wire to short-circuit coil windings. The duration of the test
shall be 1 second if a voltage of 1800 volts is applied. At the option of the manufacturer, switchgear-mounted devices
that have been individually tested may be disconnected during this test.

8.4.3 Polarity Verification

Tests or inspections shall be made to ensure that connections between instrument transformers and meters or relays or
similar devices are connected with proper polarities. Instruments shall be checked to ensure that pointers move in the
proper direction. This does not require tests using primary voltage and current.

8.4.4 Sequence Tests

MEI switchgear involving the sequential operation of devices shall be tested to ensure that the devices in the sequence
function properly and in the order intended. This sequence test need not include remote equipment controlled by the
MEI switchgear; however, this equipment may be simulated where necessary.

9. Retesting

Retesting is not required if the design has not changed. A design change made to the MEI switchgear shall be evaluated
for its effect on rated performance. If it is determined that performance may be affected by the change, the relevant
conformance tests shall be repeated.

See the Appendix for guidance in the evaluation of changes made in insulating materials and systems.

20 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES—CONFORMANCE TESTING C37.57-1990
Figure 1— Pry Test Bar
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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Figure 1.A— Pry Test Bar (continued)

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

Figure 2— Pull Hook

Figure 3— Face Detail for Deflection Tool

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Annex A Conformance Guide for Evaluation of Changes Made in Insulating

Materials and Systems

(Informative)

(These Appendixes are not part of American National Standard C37.57-1990, but are included for information only.)

The procedures of this guide are recommendations and not mandatory requirements of American National Standard
C37.57-1990.

A.1 Scope and Purpose

A.1.1 Scope

This guide covers the conformance tests and requirements for evaluation of changes made in materials and insulation
systems for metal-enclosed interrupter switchgear assemblies rated over 1000 volts through 38 kV ac.

The original design of the insulation system of the switchgear assembly should be in conformance with the
requirements of American National Standard for Metal-Enclosed Interrupter Switchgear, ANSI/IEEE C37.20.3-1987.

A.1.2 Purpose

The purpose of this guide is to provide a method for evaluating substitute insulating materials and systems so that
changes made in these materials and systems may be evaluated without performing a complete series of conformance
tests on the switchgear equipment.

A.2 Related Standards

The following standards are intended for information or clarification only and are not essential to completing the
requirements of this standard:

ANSI/IEEE C37.20.2-1987, Metal-Clad and Station-Type Cubicle Switchgear

ANSI/IEEE C37.20.3-1987, Metal-Enclosed Interrupter Switchgear

ANSI/IEEE C37.100-1981 (R1989), Definitions for Power Switchgear

ANSI/UL 94-1985, Tests for Flammability of Plastic Materials for Parts in Devices and Appliances

ANSI/UL 746B-1986, Polymeric Materials — Long-Term Property Evaluations

ASTM D 149-1990, Test Methods for Dielectric Breakdown Voltage and Dielectric Strength of Solid Electrical
Insulating Materials at Commercial Power Frequencies4

ASTM D 150-1987, Test Methods for A-C Loss Characteristics and Permittivity (Dielectric Constant) of Solid
Electrical Insulating Materials

ASTM D 229-1986, Method of Testing Rigid Sheet and Plate Materials Used for Electrical Insulation

4
Available from ASTM, 1916 Race Street, Philadelphia, PA 19103.

24 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

ASTM D 256-1990, Test Methods for Impact Resistance of Plastics and Electrical Insulating Materials

ASTM D 257-1990, Test Methods for D-C Resistance or Conductance of Insulating Materials

ASTM D 648-1982 (1988), Test Method for Deflection Temperature of Plastics Under Flexural Load

ASTM D 790-1990, Test Methods for Flexural Properties of Unreinforced and Reinforced Plastics and Electrical
Insulating Materials

ASTM D 2303-1990, Test Method for Liquid-Contaminant, Inclined-Plane Tracking and Erosion of Insulating
Materials

ASTM D 3029-1984, Test Method for Impact Resistance of Rigid Plastic Sheeting or Parts by Means of a Tup (Falling
Weight)

NEMA LI 1-1983, Industrial Laminated Thermosetting Products5

NEMA LI 6-1983, Relative Temperatures Indices of Industrial Thermosetting Laminates

NEMA SG 6-1974, Power Switching Equipment

A.3 Definitions

The definitions of terms contained in this document, or in other standards referred to in this document, are not intended
to embrace all legitimate meanings of the terms. They are applicable only to the subject treated in this guide. Refer to
ANSI/IEEE C37.100-1990 and ANSI/IEEE C37.20.3-1987 for definitions not given in this document.

A.3.1 Ceramic Insulation: Insulation made of a vitrified ceramic material, such as porcelain or glass.
A.3.2 Nonceramic Insulation: Nonceramic insulation is insulation made of a material other than ceramic. This
category includes all organic insulating materials.
A.3.3 Bus Insulation: Bus insulation is insulating material optionally used to cover primary voltage conductors except
where that conductor is a cable or wire. (Bus joint insulation is excluded from this category and is treated separately.)
The primary functions of bus insulation are to prevent arc motoring and to allow closer spacing of conductors than
would be possible with bare conductors. Bus insulation may also, as a secondary function, be part of the bus support
insulation system.
A.3.4 Bus Joint Insulation: Bus joint insulation is insulating material optionally used to cover joints or connections
in the primary voltage conductors. Bus joint insulation is otherwise similar to bus insulation.
A.3.5 Bus Tap Insulation: Bus tap insulation is insulating material optionally used to cover low-current taps to the
main primary voltage conductors. These taps include potential and control power transformer primary leads,
connections to surge arresters and surge capacitors, and other similar connections. Bus taps may be in the form of a
wire, rod, or bar especially insulated for this service, or in the form of an insulated wire or cable. Bus tap insulation is
otherwise similar to bus insulation.
A.3.6 Bus Support Insulation: Bus support insulation is insulation used primarily to physically support a conductor
and prevent or limit its movement under specified operating conditions. Bus support insulation includes both
conductor-to-conductor and conductor-to-structure supports.
A.3.7 Barrier Insulation: Barrier insulation is insulation material used primarily to separate one item or area from
another item or area within equipment. Examples are: (a) interphase barriers between poles of an interrupter switch;
(b) bus barriers separating the bus compartment of one vertical section of switchgear from another; and (c) barriers

5
Available from the National Electrical Manufacturers Association, 2101 L Street, NW, Washington, DC 20037.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

used to shield grounded metal from electrical or thermal effects of circuit interruption within the equipment. Barrier
insulation may be subdivided into two general types: Type 1 — barriers that are not in contact with and are not
penetrated by energized parts; and Type 2 — barriers that are in contact with or are penetrated by energized parts.
A.3.8 Drawout Switch Primary Disconnects: Drawout switch primary disconnects are penetration insulators that
support bus stabs. Their primary function is to insulate the primary bus as it passes through the ground barrier and to
support the bus so that it can properly engage the interrupter switch.
A.3.9 Entrance Bushings: Entrance bushings are insulating structures including a through conductor, or providing a
passageway for such a conductor, with provision for mounting on a barrier, insulating or otherwise, for the purpose of
insulating the conductor from the barrier so that current may be conducted from one side of the barrier to the other.
Entrance bushings can be vertically mounted (roof bushings) or horizontally mounted (wall bushings).
A.3.10 Relative Thermal Index: The relative thermal index is an indication of a material’s ability to retain a particular
property when exposed to elevated use temperatures for an extended period of time. The relative thermal index (RTI)
is determined by the procedures outlined in ANSI/UL 746B-1986. As used in this document, the electrical thermal
index includes such properties as dielectric strength, arc resistance, and volume resistivity. The mechanical-without-
impact RTI includes such properties as tensile, flexural, and shear strength. The mechanical-with-impact RTI includes
the properties of the mechanical-without-impact RTI plus impact properties intended to stress the material under
sudden shock loading conditions.

A.4 Requirements

This section defines the requirements that must be met by various types of insulating materials for materials
substitution.

A.4.1 Nonceramic Insulation

A.4.1.1 Resistance to Long-Term-Aging

Resistance to long-term aging should be demonstrated byone or more of the methods specified in A.4.1.1.1 through
A.4.1.1.4.

A.4.1.1.1

The relative thermal indexes of the material should be determined in accordance with ANSI/UL 746B-1986 for each
thickness of material used. Under normal operating conditions, a material used for an insulation function should not be
exposed to temperatures in excess of its relative thermal indexes for the thickness used. Table A.1 specifies which
relative thermal indexes are to be considered for each insulating function.

Table A.1—Relative Thermal Indexes and Insulating Functions

Relative Thermal Index
Electrical Mechanical without Mechanical with
impact impact
Bus X X
Bus joint X
Bus tap X X
Bus support X X
Barriers Type 1 X X
Type 2 X X
Entrance bushings X X
Drawout switch primary
discounts X X

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

A.4.1.1.2

Resistance to long-term aging may be demonstrated by a history of satisfactory field service. This history must be of
sufficient duration to satisfactorily demonstrate the material’s long-term capabilities.

A.4.1.1.3

Resistance to long-term aging may be demonstrated by testing of samples aged in service or artificially aged to
adequately demonstrate retention of required properties.

A.4.1.1.4

If it is desired to substitute a material for a previously qualified material, the substitute material will be considered to
have satisfactorily long-term aging characteristics if it has relative thermal indexes equal to or greater than the relative
thermal indexes of the previously qualified material. The relative thermal indexes to be compared are those required
for the insulation function under consideration, as listed in Table A.1.

A.4.1.2 Thermal Cycling Withstand

Drawout switch primary disconnects, entrance bushings, and bus and bus tap insulation applied to conductors by
dipping, molding, fluidized bed coating, or other processes that cause the insulation to adhere to the conductor, must
not be damaged by variations in temperature. This capability should be evaluated by the thermal cycling withstand test,
A.5.1.

A.4.1.3 Dielectric Withstand

A.4.1.3.1 Substitute Bus Insulation, Bus Joint Insulation, and Bus Tap Insulation

Substitute bus insulation, bus joint insulation, and bus tap insulation should pass the test for bus bar insulation in
accordance with 5.2.1.3 of ANSI/IEEE C37.20.2-1987 (foil test).

A.4.1.3.2 Bus Support Insulation and Barrier Insulation

If it is desired to substitute another insulating material for the one used in the impulse withstand tests, the substitute
material will be considered to have adequate dielectric strength if its perpendicular electric strength equals or exceeds
the perpendicular electric strength of the original material. Measurement of perpendicular electric strength should be
as described in the test method in ASTM D 149-1990 using the short-term method in air. (The use of the short-term
method under oil should be permitted if the two insulating materials being compared are of the same generic type.)

A.4.1.4 Flammability

A.4.1.4.1

Substitute flame-resistant sheet or cast insulating materials used in any application other than Type-1 barriers should
meet the requirements for class 94 V-O as set forth in ANSI/UL 94-1985 or those set forth in Method II of ASTM D
229-1986.

A.4.1.4.2

Substitute flame-resistant sheet or cast insulating materials used as Type-1 barrier should meet the requirements for
class 94-HB as set forth in ANSI/UL 94-1985 or those set forth in Method II of ASTM D 229-1986.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

A.4.1.4.3

Substitute flame-resistant applied insulation (such as fluidized bed systems, tape systems, or shrinkable-type tubing)
should pass the tests specified in 5.2.7, Flame-Resistance Tests for Applied Insulation, in ANSI/IEEE C37.20.2-1987.

A.4.1.5 Tracking Resistance

Substitute bus support insulation, Type-2 barrier insulation, entrance bushings, and circuit breaker primary disconnects
should pass the inclined plane tracking test in accordance with ASTM D 2303-1990 using one time-to-track method
with an applied voltage of 2.5 kV. The minimum acceptable time to failure should be 20 minutes for equipment rated
at 5 kV or less and 300 minutes for equipment rated greater than 5 kV.

A.4.1.6 Volume Resistivity or Loss Index

For drawout switch primary disconnects, the electrical losses of a substitute material will be judged acceptable,
provided either the volume resistivity (ASTM D 257-1990) is greater than (or the loss index [ASTM D 150-1987] is
less than) or equal to that of the previously acceptable material.

A.4.1.7 Deflection Capability or Flexural Strength

A.4.1.7.1 Bus Insulation

If it is desired to substitute another insulating material for the one used in the momentary current test, the substitute
material will be considered to have adequate deflection capability if it provides equivalent or greater performance as
shown by testing in accordance with the deflection test of A.5.2.

A.4.1.7.2 Entrance Bushings

A substitute bushing for the one used in the momentary current test is considered to have adequate deflection
capability if the substitute has equivalent strength as shown by testing in accordance with the deflection test of A.5.3.

A.4.1.7.3 Drawout Switch Primary Disconnects

A substitute material for use in the same design will be considered to have adequate flexural strength if its flexural
strength (ASTM D 790-1990) equals or exceeds the value of the original material.

A.4.1.8 Impact Strength

A.4.1.8.1 Bus Insulation

If it is desired to substitute another insulating material for the one used in the momentary current test, the substitute
material will be considered to have adequate impact strength if its impact strength as measured by the falling ball
impact test (ASTM D 3029-1984) equals or exceeds the impact strength of the original material.

A.4.1.8.2 Bus Support Insulation, Type-2 Barriers, and Drawout Switch Primary Disconnects

If it is desired to substitute another insulating material for the one used in the momentary current test, the substitute
material will be considered to have adequate impact strength if its notched Izod impact strength as measured by the test
method in ASTM D 256-1990 equals or exceeds the impact strength of the original material.

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INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

A.4.1.9 Creep Resistance

A.4.1.9.1 Bus and Bus Tap Insulation

If this property is judged to represent a potential problem in a specific design, it should be given special consideration
when evaluating a substitute material.

A.4.1.9.2 Drawout Switch Primary Disconnects

A substitute material will be judged to have acceptable creep resistance, provided a bar with a 4-inch span loaded to
1000 psi maximum stress and tested at 105°C for 24 hours has equal or less creep than the original material. The
specimen supports, deflection measuring device, and the weight necessary to obtain a maximum fiber stress of 1000
psi are adequately described in ASTM D 648-1982 (1988).

A.4.1.10 Recognized Materials

Substitute materials recognized as NEMA Grade GPO-3, as described in NEMA LI 1-1983, paragraph LI 1-5.07
through LI 1-15.15, and having thermal index in accordance with NEMA LI 6-1983 should be considered to be
suitable for replacement of GPO-3 Type-1 or Type-2 barriers or bus support insulation without further testing.
Materials recognized as NEMA grade GPO-2 should also be considered to be suitable for replacement of GPO-2 Type-
1 or Type-2 or bus support insulation without further testing.

A.4.2 Ceramic Insulation Deflection Capability, Impact Strength, and Compressive Strength

A substitute bushing or disconnect for the one used in the momentary current test is considered to have adequate
capabilities if the substitute has equivalent cantilever strength as shown by testing in accordance with the deflection
test of A.5.3.

A.4.3 Indoor Apparatus Insulators

A special class of bus support insulators, indoor apparatus insulators, is available in both ceramic and nonceramic
varieties. These insulators are defined and described in paragraph SG6-31.3 of NEMA SG 6-1974.

If an indoor apparatus insulator of a particular voltage and strength class (e.g., 15 kV, A20) has been qualified by
testing, another insulator recognized as being of the same voltage and strength class may be substituted without further
dielectric or mechanical testing. If the substitute insulator is not ceramic, it must meet the requirements stated in 5.1.1,
5.1.4, and 5.1.5 for flammability, resistance to long-term aging, and tracking resistance.

Insulators having the same height, electrical properties, and strength as indoor apparatus insulators described in
NEMA SG 6-1974 but differing in such properties as size, number, and location of bolt holes or diameter of insulating
column, may be substituted for each other in accordance with the above rules.

A.4.4 Composite Insulating Systems

It is recognized that a single insulating function may be performed by a composite insulating system consisting of
several insulating materials. When it is desired to substitute a different material for one or more of the materials in a
composite insulating system, it should be determined which properties are required of each material in the composite
system. Only those properties required of the material being replaced should be required to be evaluated in accordance
with this guide.

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ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Figure A.1—Bus Insulation Deflection Test Apparatus

A.5 Tests

Most of the tests required under this guide are detailed in other standards, which are referenced under the requirements
for each type and function of insulation in Section A.4 of this guide. Tests that are not described elsewhere are
described in A.5.1 through A.5.3 and are referenced in the appropriate portions of Section A.4.

A.5.1 Thermal Cycling Withstand

Substitute insulation applied to conductors by dipping, moulding, fluidized bed coating, or other processes that cause
the insulation to adhere to the conductor, must not be damaged by variations in temperature. Test bars with insulation
applied of both original and substitute material should be subjected to a thermal cycling test consisting of ten cycles of
alternate heat and cold. Each cycle should consist of four parts, as follows:

1) Soak in a cold chamber at -30°C or lower for a minimum of 8 hours.

2) Remove from cold chamber and allow to stand at room temperature for 2 hours.
3) Place in oven at 105°C or above for 4 hours.
4) Remove from oven and allow to stand at room temperature for 2 hours.

After the tenth cycle is completed, the substitute insulation should be as free of cracking or other physical damage as
the original material.

A.5.2 Deflection Capability—Bus Insulation

Copper bars with a minimum length of 1/4 inch × 4 inches × 5 feet 6 inches, or aluminum bars with a minimum length
of 3/8 inch × 4 inches × 5 feet 6 inches, should be covered with the insulating material to be investigated and the
original material. The tests should be made on the conductor material being used in the equipment. If both conductor
materials are used, both must be tested. The test bars should be supported on two cylindrical supports having a
minimum radius of 1/8 inch and a maximum radius of 3/8 inch and spaced 5 feet 0 inches apart. A cylindrical loading
nose having a radius of 1 inch should be applied at the center of the 5-foot 0-inch span (see Figure A.1) with sufficient
force to deflect the test specimen 2 inches at the rate of 2 to 4 inches per minute.6 The force should then be removed
at the same rate and the test specimen allowed to return to its normal position. The test specimen should then be turned

6If2 inches is too great a deflection for the original qualified material to withstand, the maximum deflection should be reduced accordingly to
provide a comparative test. The substitute material should provide equivalent or greater performance.

30 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

over and similarly deflected in the opposite direction. It should be thus deflected five times in each direction, following
which the center 1 foot of the specimen should pass a test for bus bar insulation in accordance with 5.2.1.3 of ANSI/
IEEE C37.20.2-1987 (foil test).

A.5.3 Deflection Capability—Bushings

The bushing should be rigidly mounted with load applied normal to the longitudinal axis of the bushing and at the
midpoint of the thread or threaded teminals and at the terminal plate on bushings so equipped. Tests should be applied
to the inner and outer terminals of the bushing but not simultaneously.

The specified load should be applied for a period of 1 minute. After the load has been removed for 1 minute, the
permanent deformation, measured at the inner end, should not be greater than the deformation of the bushing used in
the momentary test.

Copyright © 1998 IEEE All Rights Reserved 31

ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Annex B Guide for Methods of Power-Factor Measurement for Low-Voltage

Inductive Test Circuits

(Informative)

ANSI/IEEE C37.26-1972 has been withdrawn as an American National Standard (pending review or reaffirmation),
but is reproduced in this Appendix to aid in the completion of the requirements of ANSI C37.57-1990.

1. Scope

This standard describes three methods used to measure the power factor in 60 Hz inductive low-voltage (1000 volts
and below) test circuits. Similar methods may apply at other frequencies. These methods are:

1) Ratio method
2) dc decrement method
3) Phase relationship method

These preferred methods are shown in Table 1.

2. Purpose

The purpose of this standard is to recommend methods of measuring power factor for inductive test circuits by such
means as oscillographic records, so that the preferred method, giving the greatest accuracy, is recommended for any
particular circuit.

Table 1 —Preferred Methods of Power Factor Measurement for Low-Voltage Inductive Test Circuits
(See Note 1)
Circuit Power Factor
Test Circuit Current Range Interrupting Time on Test
(rms symmetrical) Device (Cycles) 0–30 Percent Above 30 Percent

0.5 or less Ratio Method

20 kA and below Phase relationship method
Above 0.5 dc Decrement Method

Above 20 kA to 130 kA, 0.5 or less Ratio Method

inclusive —
Above 0.5 dc Decrement Method

Above 130 kA Any Ratio Method (Note 2) —

NOTES:
1 — Table 1 applies to single-phase or three-phase test circuit, 60 Hz.
2 — For circuits above 130 kA, where asymmetrical closing conditions may jeopardize equipment or instrumentation, the
phase relationship may be used.

3. Definitions

The definitions and terms contained in this document or in other American National Standards referred to in this
document, are not intended to embrace all legitimate meanings of the terms. They are applicable only to the subject
treated in this standard.

32 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

For additional definitions of terms used in this standard, refer to American National Standard Definitions for Power
Switchgear, C37.100-1972.

4. Ratio Method

4.1 General

Devices such as current-limiting fuses, fused circuit breakers, and similar fast clearing devices may have total
interrupting times of 0.5 cycle or less. The ratio method permits measurement to be made within the operating time of
these devices and generally is not suitable on circuits with power factors above 30 percent.

Since this method requires closing the circuit to produce maximum current asymmetry, the resulting high mechanical
forces on bus supports and circuit components may jeopardize the test equipment or instrumentation. When there is a
question of jeopardy, the phase relationship method may be used.

4.2 Procedure for Determining Power Factor

The power factor is determined at an instant one-half cycle (based on the fundamental frequency timing wave) after the
initiation of current flow by determining the asymmetrical and symmetrical currents at this point. (See Figs. 1 and 2,
and Table 2.) Both total rms asymmetrical current and rms symmetrical current are to be measured and the ratio MA or
MM calculated as follows: Construct the envelope of the wave as shown in Fig. 1. The rms symmetrical and rms
asymmetrical currents shall be determined as indicated in the equations of Fig. 1. Having determined these values, the
MA for three-phase circuits and MM for single-phase circuits are determined from the following:

Copyright © 1998 IEEE All Rights Reserved 33

ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Figure 1 —Ratio Method

Refer to Fig. 2 or Table 2 to determine the power factor of the test circuit.

5. DC Decrement Method

5.1 General

This method is recommended for circuits of 30 percent power factor or less where the device to be tested interrupts at
a point in time more than one-half cycle from the initiation of the current. This method relates power factor to the rate
of decay of the dc component. The current measuring method used should not introduce distortion into the dc
component. Use noninductive shunts since current transformers may introduce significant error.

5.2 Procedure for Determining Power Factor

The power factor may be determined from the curve of the dc component of the asymmetrical current wave. See Fig. 3.

34 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

5.2.1

The equation for the dc component is:

id = Id0 e−(Rt/L)

where

id = value of the dc component at time t

Id0 = initial value of the dc component
L/R = time constant of the circuit in seconds
t= time interval, in seconds, between id and Id0
e= base of Napierian logarithms (2.7183)

Figure 2 —Multiplying Factor vs Power Factor

Copyright © 1998 IEEE All Rights Reserved 35

ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

Table 2 —Multiplying Factors

Multiplying Factor Multiplying Factor
Maximum Maximum
Single Average Single
Phase rms Three Phase rms Average
Current at Phase rms Current at Three Phase
Power 1/ Cycle Current at Power 1/ Cycle rms Current
2 2
Factor (Curve 1/ Cycle Factor (Curve at 1/2 Cycle
2
Percent X/R Ratio MM ) (Curve MA) Percent X/R Ratio MM ) (Curve MA)
0 ∞ 1.732 1.394 29 3.3001 1.139 1.070
1 100.00 1.696 1.374 30 3.1798 1.130 1.066
2 49.993 1.665 1.355 31 3.0669 1.121 1.062
3 33.322 1.630 1.336 32 2.9608 1.113 1.057
4 24.979 1.598 1.318 33 2.8606 1.105 1.053
5 19.974 1.568 1.301 34 2.7660 1.098 1.049
6 16.623 1.540 1.285 35 2.6764 1.091 1.046
7 14.251 1.511 1.270 36 2.5916 1.084 1.043
8 12.460 1.485 1.256 37 2.5109 1.078 1.039
8.5 11.723 1.473 1.248 38 2.4341 1.073 1.036
9 11.066 1.460 1.241 39 2.3611 1.068 1.033
10 9.9501 1.436 1.229 40 2.2913 1.062 1.031
11 9.0354 1.413 1.216 41 2.2246 1.057 1.028
12 8.2733 1.391 1.204 42 2.1608 1.053 1.026
13 7.6271 1.372 1.193 43 2.0996 1.049 1.024
14 7.0721 1.350 1.182 44 2.0409 1.045 1.022
15 6.5912 1.330 1.171 45 1.9845 1.041 1.020
16 6.1695 1.312 1.161 46 1.9303 1.038 1.019
17 5.7967 1.294 1.152 47 1.8780 1.034 1.017
18 5.4649 1.277 1.143 48 1.8277 1.031 1.016
19 5.1672 1.262 1.135 49 1.7791 1.029 1.014
20 4.8990 1.247 1.127 50 1.7321 1.026 1.013
21 4.6557 1.232 1.119 55 1.5185 1.015 1.008
22 4.4341 1.218 1.112 60 1.3333 1.009 1.004
23 4.2313 1.205 1.105 65 1.1691 1.004 1.002
24 4.0450 1.192 1.099 70 1.0202 1.002 1.001
25 3.8730 1.181 1.093 75 0.8819 1.0008 1.0004
26 3.7138 1.170 1.087 80 0.7500 1.0002 1.00005
27 3.5661 1.159 1.081 85 0.6128 1.00004 1.00002
28 3.4286 1.149 1.075 10 0.0000 1.00000 1.00000

36 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

The time constant L/R can be ascertained from the above formula as follows:

1) Measure the value of Id0 at the time of current initiation and the value of id at any other time t
2) Determine the value of e−Rt/L by dividing id by Id0
3) From a table of values of e−x determine the value of −x corresponding to the ratio id/Id0
4) The value x then represents Rt/L, from which L/R is determined

5.2.2

Determine the angle φ from:

φ = arctan (ωL/R)

where

ω= 2 π times the actual frequency

5.2.3 Power Factor = cos φ

6. Phase Relationship Method

6.1 General

Methods dependent upon asymmetrical values of current or the decay of the dc component generally are not suitable
for the measurement of power factor circuits above 30 percent where the dc component is severely reduced. Therefore,
the phase relationship method, using current and voltage waves, is the recommended method on circuits having power
factors over 30 percent.

Figure 3 —DC Decrement Method

Copyright © 1998 IEEE All Rights Reserved 37

ANSI C37.57-1990 AMERICAN NATIONAL STANDARD FOR SWITCHGEAR —METAL-ENCLOSED

6.2 Procedure for Determining Power Factor

This method involves controlled closing and determines the power factor of the test circuit under essentially
symmetrical closing conditions. Construct suitable straight, parallel wave envelope lines and a line midway between
them to determine the “zero point” of the “true” axis of the current wave at the end of the first major half cycle. By
relating this point to the open circuit voltage wave “zero point.” the power factor can be determined from the difference
in electrical degrees between the “zero point” of the current at the end of the first major half cycle and the
corresponding “zero point” position of the circuit voltage wave. For three-phase circuits, each phase current must be
related to its own phase-to-neutral voltage. Greater accuracy will result if each power factor is determined when the
circuit is closed so that the phase under consideration has symmetrical characteristics. The average of the phase power
factors is considered as the circuit power factor. If the voltage wave is subject to measurable phase shift upon closure
of the test circuit (as shown in Fig. 4), it is necessary to determine and use the voltage zero (0) point which would have
existed (indicated dash line) if the phase shift in the voltage wave had not occurred.

Figure 4 —Phase Relationship Method

7. References

[1] NEMA Standard for Molded Case Circuit Breakers, Publication AB 1-1969.

[2] IEC Specification for Alternating-Current Circuit Breakers, IEC Publication 56-1-1971.

[3] Underwriters’ Laboratories, Inc. High-Interrupting-Capacity Fuses; Current-Limiting Types, UL198.2-1970.

[4] Harder, J. E. A method of power factor measurement for circuit interrupter testing. IEEE Transactions on Power
Apparatus and Systems, vol PAS-87, no 10. Oct 1968. TP21 PWR.

[5] Farquhar, W. A.; Schall. G. E.: Plate, G. H. Comparison of Power Factor Measurement Methods. Presented at IEEE
Winter Power Meeting, New York, N.Y., Jan 29, 1968, 68CP168-PWR.

38 Copyright © 1998 IEEE All Rights Reserved

INTERRUPTER SWITCHGEAR ASSEMBLIES —CONFORMANCE TESTING ANSI C37.57-1990

[6] Brandt, T. F., Jr, Test Procedure for Determining Short-Circuit Power Factor. Presented at IEEE Winter Power
Meeting New York, N. Y., Jan 29, 1968, 68CP20-PWR.

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