XG2128 E1 BER Tester User's Manual

XG2128 E1 BER Tester
USER’S MANUAL
Shenzhen Xiaguang XP Co., Ltd.

Addr: 6/F, M-10 Building, Hi-Tech Industrial Park Middle Section,
Shennan Road, Shenzhen, P. R. China
Tel: +86-755-26711014/15/16/17
Fax: +86-755-26012275
Email: support@xgxc.com
Website: www.xgxc.com
©All rights reserved 2005.
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Release 1.x
E1 BER Tester 1 Overview
Contents
1. Overview ...................................................................................................................2
1.1 Symbol Descriptions ..........................................................................................2
1.2 Product Overview...............................................................................................3
1.3 Ordering Information ..........................................................................................4
1.4 Product Compositions ........................................................................................5
1.5 Functional Keyboard ..........................................................................................6
1.6 LED Indicators ...................................................................................................7
1.7 LCD icon indications ..........................................................................................9
2. Getting Started .......................................................................................................11
2.1 Unpacking Check ............................................................................................. 11
2.2 Power Supply................................................................................................... 11
2.3 Switch-On ........................................................................................................13
2.4 Communication with PC...................................................................................14
2.5 Safety Precautions...........................................................................................15
3. Navigating the Displays.........................................................................................19
3.1 Menu Overview ................................................................................................19
3.2 “Settings” Menu................................................................................................20
3.3 “Results” Menu.................................................................................................30
3.4 “Storages” Menu ..............................................................................................45
3.5 “Others” Menu..................................................................................................50
4. Performing Measurements ....................................................................................58
4.1 Overview ..........................................................................................................58
4.2 Perform the Measurements..............................................................................58
5. Technical Specifications........................................................................................64
5.1 “E1” Specifications ...........................................................................................64
5.2 Other Specifications .........................................................................................66
6. Working with TestManagerPro ..............................................................................67
6.1 Software Functions ..........................................................................................67
6.2 System Configuration and Running Environment ............................................67
6.3 Install and Uninstall the Software on the PC ....................................................68
6.4 How to Use TestManagerPro ...........................................................................69
7. Troubleshooting .....................................................................................................72
Appendix A: E1 Frame Structure...............................................................................74
I. PCM30/PCM31 Frame Format (ITU-T G.704/G.706) .......................................74
II. PCM30CRC/PCM31CRC Frame Format (ITU-T G.704) ..................................76
Appendix B: Glossary ................................................................................................78
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1. Overview
This chapter briefly describes the symbols in the manual, product overview, ordering
information, product compositions, functional keyboard, LED alarm and status indications,
LCD icon indications for the instrument.
1.1 Symbol descriptions
1.2 Product overview
1.3 Ordering information
1.4 Product compositions
1.5 Functional keyboard
1.6 LED indicators
1.7 LCD icon indications
1.1 Symbol Descriptions

The following symbols in the manual indicate precautions or information which must be
taken to maintain safe and right operation of the instrument.
“Caution” symbol denotes attention to the operation of the

instrument, which if not correctly performed or adhered to could
result in failure to the test or damage to the instrument. Do not
proceed beyond a caution until the indicated conditions are fully
understood and met.
“Note” symbol denotes some help information to the operation of

the instrument, which if fully understood and met could help the
operator in performing the test.
“Warning” symbol denotes a hazard. It calls attention to a

procedure, which if not correctly performed or adhered to could
result in injury or loss of life, or serious damage or destruction to
the instrument. Do not proceed beyond a warning until the
indicated conditions are fully understood and met.
Before operation, the instructions following above symbols in the manual must be fully
understood and met to ensure the right and safe operation of this instrument.
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1.2 Product Overview

The E1 BER Tester is a compact and practical handheld 2M digital transmission
instrument, providing a scalable, future-proof solution for the testing needs of technicians
involved in the installation and maintenance of E1 digital networks. It offers all the error
and alarm measurements you will need to verify quality-of-service in your networks. Plus,
signal quality measurements including frequency, level and other functions to ensure your
costly, time-consuming work performed quickly and efficiently.
The E1 BER Tester mainly provides the following functions:
• HDB3 and AMI line codes
• 75Ω (Unbalanced), 120Ω (Balanced) and high impedance>2kΩ（option）
• Out-of-service framed/unframed testing (“TX/RX” mode):
9 2Mb/s, N×64kb/s BER testing
9 Monitoring: Signal Loss, AIS, Frame Loss, Remote Alarm, Remote MF Alarm,
CRC MF Loss, CAS MF Loss, Pattern Loss Alarms and BIT, Code, FAS, CRC-4,
E-BIT errors, etc.
9 Clock slips measurement
• In-service framed/unframed testing (“RX HI-Z” and “Through” mode) （option）:
9 Rx Hi-Z and through mode testing
9 Bit, Code, FAS, CRC-4 and E-BIT BER testing
9 FAS/NFAS, MFAS/NMFAS, timeslot activity monitoring and display
9 Timeslot monitoring, 8-bit data monitoring in any selected timeslot
9 CAS and CCS signalling monitoring
• Tx clock: Internal, Interface
• Level, Frequency and Offset measurements
• Real-time transmit circuit open/short indication
• Autoconfigure function: E1 frame format, BERT pattern, the timeslots carried BERT
pattern automatically detection and setting for E1 testing
• Real-time clock
• BERT pattern: PRBS, Fixed Code and 16-BIT User Word
• Error injection: Single and Fixed Rate
• Auto, Manual and Timer testing
• Results named and saved automatically after testing
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• Self-check, keyboard and LED testing
• Historical alarm indication
• Extensive beep and LED alarm indications
• ITU-T G.821, G.826 and M.2100 performance analysis
• Histograms analysis of error and alarm events
• Upgradeable software via an USB interface
• Up to 99 days continuance test performance
• More than 6 hours measurement operation from a single battery charge
• Save/Recall of up to 7 user-defined setups and 10 results, Power outage function
• Test results could be uploaded, filed, conserved and printed by TestManagerPro on

PC via USB port
1.3 Ordering Information

After getting fully understanding of this E1 BER tester, the user can place the order on the
tester with certain functions as per their testing requirement. This tester provides not only
the standard configurations supporting the basic testing, but also provides in-service test
option to meet some other client’s needs. The user can choose the option or not based on
their needs. When user receives the instrument, please check the tester and its
accessories item by item carefully to make sure whether the received one meeting the
purchasing requirements or not. If user finds any optional test function lacked or wants to
add the option after a period of the operation, please contact with the vendor in time. We
will service the instrument as soon as possible.
Standard configuration list of the E1 BER Tester:
Item Qty Item Qty

TestManagerPro Setup CD
E1 BER Tester 1 1
（Including User's Manual）
E1 75Ω Unbalanced Test Cable 2 User Guide 1
E1 120Ω Balanced Test Cable 1 Waterproof Package 1
USB Communication Cable 1 Quality Certificate Card 1

AC Power Adapter 1 Maintenance Card 1
Li-ion Rechargeable Battery (Built-in) 1 Packing List 1
Table 1: Standard configuration list
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Caution:
The vendor would add the in-service test option if necessary after getting
confirmation from the users about the test functions of the instrument. With
the option, the test provides not only the RX/TX test mode but also RX HI-Z
and THROUGH test mode. Users can purchase these options according to
their requirements.
1.4 Product Compositions

The E1 BER Tester is consists of following modules:
• Hardware: Main board and Display board.
• Software: the Embedded software, surveillance and management PC software

“TestManagerPro”.
• Accessories: Waterproof Package, Test Cables, AC Power Adapter, Rechargeable
Batteries and so on.
1.4.1 Compositions of Instrument
• Front panel: LCD display, LED alarm and status indicators, keyboard.
• Back panel: four disassembly-proof label, serial number label, back cover.
• Front end: Rx, Tx input/output interface (BNC coaxial, RJ45), 12VDC input jack and
USB port.
1.4.2 Appearance of Instrument
The appearance of the instrument is as shown in Fig 1.
120Ω
E1 75Ω (Tx) Interface
12VDC input jack
E1 75Ω (Rx)
LED Alarm USB port

Indicators
LCD Display
Functional Keyboard
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Fig 1: Appearance of E1 BER Tester
1.5 Functional Keyboard

The E1 BER Tester has 16 functional keys at the front panel, including main functional
keys, softkeys, cursor keys, page keys, a backlight key, a power switch key, a start/stop
key, and a single-error-add key. The arrangement of functional keys and names of keys
from left to right are as shown in Fig 2.
These functional keys are described as in Table 2.
` F1 F2 F3 F4 Softkeys：”F1”, “F2”, “F3”, “F4”
“Setting”, “Result”, “PgUp”, “Cursor

SETTING RESULT
moveable left and up” key
STORAGE OTHER
“Storage”, “Other”, “PgDn”, “Cursor
moveable right and down” key
SINGLE START “Single Error Add”, “Start/ Stop”,

ERR ADD STOP “Backlight”, “Power” key
Fig 2: Functional keyboard
Caution:
The key-stroke beep can be set as “ON” or “OFF” in “Others” menu. When
the key-stroke beep is set as “ON” and then pressing the right key leads to
one beep while pressing the wrong or invalid key leads to two beeps. As
prompt, there will be sound alarm as well as relevant hint information in LCD
display at the same time.
Key Name Description

Identified as “F1” to “F4”, used to select the parameter or activity in
Softkeys corresponding highlight place at the bottom of LCD. Each LCD display
defines one or more functions of these softkeys.
Matched with the “Settings” menu. When this key is pressed, LCD
“Setting”
display switches to the “Settings” menu.
Matched with the “Results” menu. When this key is pressed, LCD
“Result”
display switches to the “Results” menu.
Matched with the “Storages” menu. When this key is pressed, LCD
“Storage”
display switches to the “Storages” menu.
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Matched with the “Others” menu. When this key is pressed, LCD
“Other”
display switches to the “Others” menu.
When the instrument is set as single error insertion mode, every time
“Single Err this key is pressed, one error of the set type will be inserted in the
Add”
transmit direction.
Manually control the start or stop activity of the test. Press it to start the
“Start/Stop”
test and press it again to stop the test.
When page number appears in the display menu (Like “P: 2/4”,
“Page Up” indicates that display menu has 4 pages in all and is on page 2
currently), press this key to go page up.
When page number appears in the display menu (Like “P: 2/4”,
“Page Down” indicates that display menu has 4 pages in all and is on page 2
currently), press this key to go page down.
“Cursor Move the cursor upward and leftward and the cursor can reach the
Moveable Left
and Up” position with symbol “[ ]”.
“Cursor Move the cursor downward and rightward and the cursor can reach the
Moveable Right
and Down” position with symbol “[ ]”.
Turn on or off the LCD backlight according to the environment

“Backlight”
condition.
“Power” Switch on or off the instrument.
Table 2: Functional keys descriptions
1.6 LED Indicators

The E1 BER Tester has 10 LED status and alarm indicators in all, including 2 status
indicators and 8 alarm indicators, mainly indicating the current operating status of
instrument and if any alarm is detected during the test process. The arrangement of the
LED tatus and alarm indicators is as shown in Fig 3.
SIGNAL LOSS FRAME LOSS

AIS MFRAME LOSS
PATTERN LOSS REMOTE ALARM
ERRORS LOW BATTERY
START/STOP CHARGE
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Fig 3: LED Status and Alarm Indicators
LED Status and alarm indicators will reflect the current testing status in real time. Through
the indication of LED, we can make a judgement of the testing status intuitively. And this
will help the operator in understanding and resolving the problems during a test.
LED Status and alarm indicators are described as in Table 3.
LED Name Description

As “Start/Stop” key keeps changing status, this indicator turns
START/ on (green) when the test is started and turns off when the test is
STOP
stopped.
Status
Indicators The instrument embeds rechargeable batteries and a
rapid-charging circuit. This indicator turns on (orange) when the
CHARGE instrument is under charging and turns off when it is fully
charged.
Effectively indicates a loss of signal. When the receiver detects
255 consecutive 0s, an alarm is generated and this indicator
SIGNAL turns on (red). Alarm cleans on detecting at least 32 1s in
LOSS
consecutive 255 bits and LED turns off. (Comply with ITU-T
G.775 / G.962)
Alarm happens on receiving less than 3 0s in 512 bits and cleans
AIS on detecting more than 2 0s in 512 bits and the LED will be
turned off. (Comply with ITU-T O.162)
Alarm happens on receiving 3 or more consecutive FAS words in
FRAME error and LED turns on (red). Otherwise the alarm is cleaned and
LOSS
LED turns off. (Comply with ITU-T G.706)
Alarm happens on synchronization loss of CAS or CRC-4
Multiframe and the LED turns on (red). Alarm cleans on both of
these two alarms recovering and the LED turns off.
CAS Multiframe Loss: Alarm on receiving 2 consecutive MFAS
MFRAME words in error and the LED turns on. Otherwise the alarm is
Alarm LOSS
Indicators cleaned.
CRC-4 Multiframe Loss: Alarm on receiving 915 or more CRC4
code words out of 1000 received in error and LED turns on.
Alarm cleans on receiving 2 valid MF alignment words in 8ms.
Alarm happens on receiving 6 or more bits in error in consecutive
PATTERN 64 bits and the LED turns on (red). Otherwise the alarm is
LOSS
cleaned and the LED turns off.
Alarm happens on detecting at least 1 error and the LED turns on
ERRORS (red). The error may be sourced from BIT, FAS, CODE, CRC4
and E-BIT.
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Alarm happens on detecting Remote Alarm or Remote

Multiframe Alarm and the LED turns on (red). Alarm cleans on
both of two disappear and the LED turns off.
Remote Alarm: Alarm happens on receiving 1 at Bit3 in 3
consecutive NFAS words and the LED turns on (red). Alarm
REMOTE
cleans on receiving 0 at Bit3 in 3 consecutive NFAS words.
ALARM
(Comply with ITU-T O.162)
Remote Multiframe Alarm: Alarm happens on receiving 1 at Bit6
of timeslot 16 in frame zero in consecutive multiframes and the
LED turn on. Otherwise the alarm is cleaned.
Alarms happens on the built-in NiMH battery’s voltage has

dropped to a low level without external power supply. And the
LOW LED turns on (red) to prompt the user that an external power is
BATTERY
needed. In case the instrument is powered by external power, the
LED turns off soon.
Table 3: Descriptions of status and alarm indicators
1.7 LCD icon indications

E1 BER Tester has 4 LCD icons displayed at the upper right corner of the LCD and with
different indications respectively. Various LCD icons are described in Table 4.
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Icon type Descriptions
Historical When there have been historical errors or alarms happened during the
Errors or
Alarms
7 elapsed time of one test, the icon flashes once every other second to
prompt the user.
Icon flashes on detecting open status of E1 transmit circuit. Real time

indicates to prompt the user the transmitter is not connected with the
E1 % cable or the cable is open circuit or broken. This icon can be used to
Transmit judge if the cable is properly connected or damaged.
Circuit
Status Icon flashes on detecting short status of E1 transmit circuit. Real time
indicates to prompt the user the cable is in short status. This icon can be
used to judge if the cable is properly connected or damaged.
Icon flashes on that the automatic test timer has been set and indicates
Timer the tester will start the automatic test function at the specified future
Testing
Mode
£ time. This icon displays in real time to prompt the user that the
pre-determined timer has been set.
Icon flashes on that the configuration items in the “Settings” menu have
been locked, or the storage capacity is full, or stored settings and results
have been locked, to prompt the user that one test has been started and
configuration items can not be modified any more, or the storage
capacity is full, existing records have to be deleted firstly to save the new
records, or that stored record has been locked and has to be unlocked
firstly before it can be overwritten.
Status
Lock This icon will be replaced by “±” in the text part of the manual.
Icon flashes on that the configuration items can be modified, the storage
capacity is not full, stored records have been unlocked, to prompt the
user that no test is running yet and all the configuration items can be
modified; or storage capacity is not full and new records can be saved,
or that stored record is under the unlocked status and can be deleted.
This icon will be replaced by “² ” in the text part of the manual.
Table 4: Descriptions of LCD icon indications
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E1 BER Tester 2 Getting Started
2. Getting Started
This chapter briefly introduces the unpacking check, power supply, switch-on,
communication with PC for the instrument and safety precautions for the operators.
2.1 Unpacking check
2.2 Power supply
2.3 Switch-on
2.4 Communication with PC
2.5 Safety precautions
2.1 Unpacking Check

In order to safely transport, the E1 BER Tester is packaged with a paper carton, and with
all accessories placed in a waterproof package.
Please check when receiving the product:
• If the packing carton is impaired and if the appearance of the product is impaired.
• If the instrument and all its accessories are available.
The standard configuration list of E1 BER Tester is shown in Table 1.
Caution:
Please check the configurations of instrument item by item according to the

provided packing list. Please contact your vendor if anything is unavailable.
Please fill in the product maintenance card carefully and take good care of it.
If necessary, keep the package materials in case they will be needed some
time later.
2.2 Power Supply

This instrument can be powered by external power supply or built-in rechargeable
batteries.
2.2.1 External Power Supply

The external power supply requires a power source of 100V to 240V AC at a frequency
between 50Hz to 60Hz (nominal). And the instrument requires a nominal DC supply of
12V. Plug the AC power cord into an appropriate AC wall outlet and connect the
instrument with the supplied adapter cable. And the instrument can be powered by the
external power supply via the AC adapter.
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2.2.2 Rechargeable Batteries

The rechargeable batteries will typically power the instrument for more than 8 hours with
the backlight and testing mode selected. The instrument uses 1 high-performance
Lithium (Li-ion) rechargeable batteries (1000mAh) placed in the battery case that may
not be fully charged when the user receives the instrument. Whatever the state of
charge, use the instrument until the battery is completely exhausted before giving it its
first charge. This will ensure better accuracy from the battery charge indicator.
Warning:
Do not change the battery model!
Do not use non-rechargeable battery, in case of causing the battery

explosion or other danger!
Caution:
When the battery supplied for this instrument has been used expiring the
charging life or are impaired, they should be dealt with control. If dealt with
general waste processing system detained in the instrument, they will harm
the instrument. The waste batteries contain Lithium and must be recycled or
disposed of properly at special recycling station or hazardous waste
collection center.
Replacement of Rechargeable Battery:
A new rechargeable battery can be charged and discharged for about 500~800 times
before it can not be used any more. Normally the fully charged batteries could support the
instrument continuous working for 8 hours depending upon the test settings. When the
operating duration of the battery is apparently reduced, the batteries should be replaced.
It is strong recommended that the rechargeable batteries should be replaced

every one or two years!
The Lithium recharge battery may become invalid after not being used for a
long time. It can only be reused after reactivation.
Warning：When installing the battery compartment back to the battery case

frame, please ensure not to push overexerted, which if not will result in
impairing the battery case frame or making the battery shrapnel damaged!
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2.2.3 Charging the Battery

After connecting to the outer power supply with supplied AC adapter, with the help of
smart rapid charging module inside the tester, the instrument can be used while the
battery is charging. During rapid charging, the “Charge” LED indicator turns on. When
the rapid charging is completed, charging turns into a trickle charge automatically. At this
time, the “Charge” indicator turns off. The instrument can be charged as well when it is
powered off. The charging indicator can give the right indication.
2.2.4 “Low Battery” Indication

When being powered by the battery, this instrument can give the early alarm to low
battery voltage and the “Low Battery” indicator turns on. After being used for a couple
of minutes, the battery voltage continues to drop to a low level, and the instrument will
automatically perform protective shutdown. When the “Low Battery” indicator turns on,
the external power supply is needed to support the instrument’s working while the
battery is charging.
2.2.5 Power Manage

This instrument provides automatic power-off function. When the instrument is not under
test-started status and there is no keystroke in 5 minutes, this instrument will be turned
off automatically. This function can effectively prevent the instrument from being
accidentally turned on and the battery from being exhausted during the transport. This
function can be set to ON or OFF in “Others” menu.
The LCD backlight can be turned on by pressing the “Backlight” key, and be
automatically turned off in 30 seconds. This function can be set to ON or OFF in
“Others” menu. When set as OFF, press the “Backlight” key to turn on the backlight,
and press the “Backlight” key again to turn off the backlight.
2.3 Switch-On
2.3.1 Switch-on Inspection Steps
• Plug in AC adapter with the power cord, the “Charge” indicator of this instrument will
turn on;
• This instrument can be switched on after “Power” key has been pressed for about 1
second. After switch-on, the LCD will display the name and the embedded software
version of the instrument. About 1 second later comes with one beep, indicating that
the switch-on process is completed and the LCD displays the settings menu.
• This instrument can be switched off by pressing the “Power” key again for about 1
second. When the battery has been fully charged, remove the AC power adapter.
Under power supply by battery, this instrument can be switched on or off by pressing
the “Power” key.
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• Loopback the E1 input and output interface of the instrument with E1 75Ω unbalanced
test cable.
• Switch on the instrument and check if LCD display and LED indicators are normal.
• Select error insertion type as “Single”, and press the “Single Err Add” key to check if
the instrument detects errors and operates properly.
• When the user receives the instrument at the first time, please use the instrument
until the battery is completely exhausted before giving its first charge.
2.3.2 Setting the Time and Date

At the top line of the screen, LCD displays the current time in the format of “Hour:
Minute: Second”, with 24-hour system. Since the test result is time-stamped, it is
necessary to set the right time and date before using the instrument.
Time and date can be set in TIME&DATE in the “Others” menu, by following
operational steps:
• Press the “Other” key to switch to the “Others” menu, select TIME&DATE by the
softkeys.
• Select SETUP, and then the date and time of the instrument can be modified.
• Choose the RUN status after date or time has been set, and then the instrument can
work according to the new setting time.
2.3.3 Self-test
Before making measurements, run a self-test to check that the instrument is operating
correctly. The user may find self-test function in the “Others” menu. Please refer to the
“Others” menu descriptions for details.
2.4 Communication with PC

This instrument supports communication with PC via USB port by TestManagerPro
software. And TestManagerPro can do two jobs: one is to upload the test results stored in
the instrument to PC for further processing including filing, printing and analyzing, and the
other is to upgrade the embedded software of the tester via PC.
2.4.1 Communication Steps

• Switch off the instrument firstly.
• Connect USB port of the instrument to PC USB port with supplied USB
communication cable.
• Switch on the instrument.
• Set PC Communication to ON in “Others” menu of the instrument.
• Run the TestManagerPro software on PC, click “Select” button to choose the model
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of the tester and click “Connect” button. After the successful connection, the user can
upload, view, analyze, delete, print test results in the format of Excel or TXT and do
other operations.
• Switch off the instrument after communication with PC.
• Pull out the USB communication cable.
Warning:
Please don’t plug and unplug the communication cable alive when
connecting PC USB port to the instrument using the USB communication
cable, and be sure to ground or use ESD wrist strip. Pluging and unpluging
the communication cable alive may result in damage to PC or the USB port
of the instrument.
2.4.2 Upgrading the Embedded Software

The Supplier will launch the latest version of embedded software and host software
TestManagerPro in the website for the users to download. Make sure to visit the website
frequently to ensure you will always get the latest version of the software.
For the software upgrading method, please refer to the relevant part of
“Communication with PC” and follow the instructions of the TestManagerPro.
Caution:
When performing the upgrading of the embedded software, in order to prevent

the instrument powered off caused by the exhausted battery suddenly, it is
strongly recommended to use external AC power supply to power on the
instrument.
2.5 Safety Precautions

The following general safety precautions must be observed during all phases of operation,
packing, transportation, and repair of this instrument. Failure to comply with these
precautions or with specific warnings elsewhere in this manual leading to the damage of
the instrument or tested equipment, the vendor assumes no liability for the customers.
Warning:
Do not operate damaged equipment: Whatever the inner safety protection

circuit has been impaired or it is physical damage. If it is the damage caused
by excessive moisture, or any other reason, remove power supply and do
not use the product until safe operation can be verified by service-trained
personnel. If necessary, return the product to your vendor or service office
for service and repair to ensure the safety features are maintained.
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2.5.1 External Power Requirements

Please use the supplied AC power adapter when operating with the instrument or
charging the battery. The supplied AC power adapter should meet the requirements as
below:
AC Input: 100V ~ 240V, 50/60 Hz, Max 0.45A.
The AC adapter will output a DC power of 12V to the instrument.
DC Output: 12V, Max 1500mA.
Warning:
Do not use other AC power adapter to provide power supply.
Please ensure the input voltage is within the specified range before
connecting the AC power adapter to the outer power supply.
The supplied standard AC power adapter should be used indoor only.
DC Connector Polarity:
-VE
+VE
Fig 4: DC connector polarity
2.5.2 Operating Environment

This instrument is specially designed for Indoor use only, with the operations under the
environment conditions as below:
Temperature: 0℃ ~ +50℃
Altitude: Upto 3050m (10,000 feet)
Humidity: 5% ~ 95%, non-condensing
Warning:
This instrument is designed for Indoor use only.
Do not operate the product in the presence of flammable gasses or fumes.
2.5.3 Operation Requirements

The test connectors are located at the top of the instrument. Before connecting, note the
given Warning and Caution information. The instrument contains components sensitive
to electrostatic discharge. To prevent component damage, carefully follow the handling
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precautions presented as below.
The smallest static voltage most people can feel is around 3500 volts. It takes less than
one tenth of that (about 300 volts) to destroy or severely damage static sensitive circuits.
Often, static damage does not immediately cause a malfunction but significantly reduce
the component’s life. Adhering to the following precautions will reduce the risk of static
discharge damage.
• Before handling the instrument, select a working area where potential static sources
are minimized. Avoid working in carpeted areas and non-conductive chairs. Keep
body movement to minimum. We recommend that you use the instrument in a
controlled static workstation.
• Handing the instrument by its cover. Avoid touching any components or edge
connectors.
Warning:
When connecting or disconnecting, ensure that you are grounded to bring

you and the instrument to the same static potential.
Do not connect this instrument to any signal cable carrying a hazardous

voltage.
2.5.4 Storage and Shipment Requirements

The instrument may be stored or shipped under the environment conditions as below:
Temperature: -30℃ ~ +70℃
Altitude: Upto 15,200 meters (50,000 feet)
The instrument should also be protected from temperature extremes which could cause
condensation within the instrument.
2.5.5 Repacking Requirements

• If the instrument is being returned to the factory for repair, please fill the
maintenance card with the faulty information and send back along with the
instrument.
• Wrap the instrument in heavy paper or plastic material. If the instrument is being
shipped to the factory, attach a tag indicating the required type of service, return
address, model number, and full serial number. Mark the container FRAGILE to
ensure careful handling during the shipment. In any correspondence, refer to the
instrument by model number and full serial number.
• Use a strong shipping container. A double wall carton made of 250 pound test
material is adequate and recommended.
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• If the external package is very large, please provide firm cushioning around all sides
of the instrument and prevent movement inside the container, especially to protect
the Face End LCD, Panel and Front End Connectors.
• Ensure the shipping container secure and suitable for transportation.
2.5.6 Maintenance Requirements:

Maintenance appropriate for the user is:
Cabinet Cleaning: Clean the panel by using a damp neat cloth only.
Battery Replacement: See Section 2.2.2.
Warning:
No adjustable components or operator-serviceable parts inside. Refer

service to qualified personnel to prevent electrical shock.
Do not remove covers.
72-0096-20 18
E1 BER Tester 3 Navigating the Displays
3. Navigating the Displays

This chapter firstly briefly gives an overview of the four main operating menus, and then
explains the relative operations of these four main operating menus in details.
3.1 Menu overview
3.2 “Settings” menu
3.3 “Results” menu
3.4 “Storages” menu
3.5 “Others” menu
3.1 Menu Overview

The operating menus of the E1 BER Tester includes “Settings”, “Results”, “Storages”
and “Others” menu, matched with the “Setting”, “Result”, “Storage” and “Other”
functional keys respectively. These four menus can be switched from one to another at
any time by pressing these four functional keys.
“PgUp” and “PgDn” keys provide page up and down functions, “Cursor Moveable Right
and Down” and “Cursor Moveable left and Up” keys provide cursor movement functions,
“F1”, “F2”, “F3”, “F4” softkeys are used to select the parameter or actions at the bottom of
LCD matched with the place highlighted by the cursor.
In each of display areas the field currently able to be changed is marked by a “Highlight
Cursor”. The menu of selection available for the active field is displayed on softkeys on
the bottom of the display. The choice from the menu is made using the keys situated
immediately below the display. The highlighted cursor is moved around the display using
page and cursor keys. When a highlighted field has more than 5 choices a softkey labeled
>> is provided. When >> is chosen the remainder of the menu is revealed.
“Settings” Menu
Press the “Setting” key to enter into the “Settings” menu. All the information that related
to the choice of the testing function and the setting of the parameters are provided in the
“Settings” menu. Press the “Cursor Moveable Right and Down” and “Cursor Moveable
left and Up” keys to move the cursor, press the “F1”, “F2”, “F3” and “F4” softkeys to select
the corresponding parameters. In case page number appears in the LCD menu, turn page
by pressing the “PgUp” or “PgDn” key. Press the “Start/Stop” key to start the test after all
the settings have already been configured completely.
“Results” menu
Press the “Result” key to switch to the “Results” menu. All the information that related to
the result statistics, performance analysis, signal monitoring and measurement are
72-0096-20 19
provided in the “Results” menu. “F1”, “F2”, “F3”, “F4” softkeys are used to select various
types of result analysis and statistics. In case page number appears in the menu, the page
can be turned up or down by pressing the “PgUp” or “PgDn” key.
“Storages” menu
Press the “Storage” key to switch to the “Storages” menu. In the menu, it provides 7
groups settings and 10 groups results storage. Press the “Cursor Moveable Right and
Down” and “Cursor Moveable left and Up” keys to select storage’s name, press the “F1”,
“F2”, “F3”, “F4” softkeys to view, delete, lock, unlock, rename and do other actions to the
settings and results of the stored record. In the stored results, the settings, results and
time information of a test are both available.
“Others” menu
Press the “Other” key to switch to the “Others” menus. In “Others” menu, it provides the
auxiliary settings and viewing functions of the instrument. Auxiliary information menus can
be accessed by pressing the “F1”, “F2”, “F3” and “F4” softkeys, including Autoconfigure,
Miscellaneous, Power Manage, Time & Date, PC Communication, Keyboard Test,
Self-test, Tester Information, etc.
According to the working circumstances, there will be some prompt

information in the status above the highlighted field, providing operating
status of the instrument.
In the upper right corner of LCD, “² ” indicates that the parameters can be
modified, while “±” indicates that the instrument is currently under test with
softkeys under the lock status and the highlighted settings not capable of
being modified.
“² ” in the “Storages” menu indicates that there is still storage space to

save more records in the instrument. “±” indicates that no saving space is
available, and some records must be deleted firstly in order to save the new
records. “² ” and “±” following each saved record respectively indicate that
the record is under unlocked and locked status.
3.2 “Settings” Menu

“Settings” menu mainly performs the selection of the test function and the settings of
relative parameters, which are associated with the situation of the system under test. Only
after setting relative parameters and performing the correct test connections, can the test
process be accomplished properly.
Every time the instrument is switched on, the instrument automatically loads the settings
menu of last valid test as the default setting menu. Only the start-stop processing test can
72-0096-20 20
become one valid test.
Press the “Setting” key to switch to the “Settings” menu, the operator can select TX/RX,
RX HI-Z, THROUGH to set the test functions in “Test Mode”, as shown in Fig 5. The
parameters of settings may vary from function to function. And below will explain the
settings respectively.
3.2.1 “TX/RX” Mode

“TX/RX” mode mainly performs out-of-service framed or unframed Bit Error Rate Test to
E1 transmission networks. The settings may be changed by E1 framing selection. The
settings of E1 framing parameters are described in Table 5.
E1 framing (PCM30, PCM30CRC, PCM31 and PCM31CRC) information can be

observed in Appendix A: E1 Frame Structure.
Settings P1 19:38:20
Mode [ TX/RX]
Interface [ U N B A L 75Ω] [ H D B 3 ]
Framing [ PCM30]
1 5
BERT pattern [2 -1]
Polarity [ INVERTED] ITU-T
L Te s t e r is ready for use
通过
TX/RX RX HI-Z THROUGH
Fig 5: Page 1 of “Settings” menu
Framing Description
UNFRAMED The “unframed” data is a 2.048Mb/s serial binary data stream without framing.
PCM30 Framed E1 with Channel Associated Signalling (CAS) multiframe.
PCM30CRC Framed E1 with Channel Associated Signalling (CAS) and CRC4 multiframe.
PCM31CRC Framed E1 with CRC4 multiframe.
PCM31 Framed E1 with no CRC4 multiframe.
Table 5: “Framing” parameter settings
a. “TX/RX” Mode Unframed Settings
An unframed test pattern of PRBS or fixed binary code which is generated internally is
transmitted by the transmitter of the instrument and is sent into the network under test.
And this test pattern will be looped back to the receiver. The instrument makes bit
error rate test and analysis based on the comparison of the transmitted and received
data.
72-0096-20 21
• Page 1 of “Settings” menu in “TX/RX” mode (Unframed)
TX/RX unframed testing mode has 2 pages, with the page 1 as shown in Fig 6.
Mode [ TX/RX]
Framing [ UNFRAMED]
1 5
BERT pattern [2 -1]
Polarity [ INVERTED] ITU-T
通过
Fig 6: Page 1 of “Settings” menu in “TX/RX” (Unframed)
Under UNFRAMED mode, in page 1 of the settings menu, move the cursor to the
parameter’s positions corresponding to “Interface”, “Framing”, “BERT pattern”,
“Polarity” and select the parameters by pressing “F1”, “F2”, “F3”, “F4” softkeys
accordingly.
The setting parameters of “Interface” and “Code” are described in Table 6.
Item Option Descriptions

The line impedance is unbalanced 75Ω, connected with coaxial cable.
UNBAL
The physical connector is BNC.
Interface The line impedance is balanced 120Ω, connected with twisted pair
BAL wires, the red cable transmits and the yellow cable receives the
signals. The physical connector is crocodile clamp.
The line code is a High Density Bipolar 3 which is one of the

commonly used line code to perform the base-band signal
transmission in the digital networks. HDB3 coding was adopted to
HDB3
eliminate the synchronization problems occurring with AMI. In HDB3
format, a string of four consecutive zeros is replaced with a substitute
Code string containing an intentional BPV (Bi-Polar Violation).
The line code is an Alternate Mask Inversion. AMI coding is used to

represent successive 1s in a bit stream with alternating positive and
AMI negative pulses. A zero bit will not generate any pulse. AMI coding is
not used in most E1 transmissions because of synchronization loss
during long strings of data zeros.
Table 6: “Line Interface” and “Line Code” parameter settings
72-0096-20 22
Caution:
“Signal Loss” alarm will be generated when transmitting continuely too

many unframed “0”s under AMI code.
The setting parameters of “Framing” are described in Table 5.
The setting parameters of “BERT pattern” and “Polarity” are described in Table 7.
223-1 215-1 Pseudorandom Binary Sequence (PRBS) is suitable for bit

error rate measurement. PRBS simulates the random data
211-1 29-1 running in the transmission network under test.
BERT
pattern Fixed code or static binary code can simulate AIS (1111)
1111 0000 1010
and etc.
16BIT 16-BIT is a user programmable word.
The instrument transmits and receives PRBS code

NORMAL according to the normal “1” or “0” polarity. Code “1” is
transmitted as “1”, and code “0” is transmitted as “0”.
Polarity
The instrument transmits and receives PRBS code
INVERTED according to the reverse polarity. Code “1” is transmitted
as “0”, and code “0” is transmitted as “1”.
Table 7: “BERT Pattern” and “Polarity” parameter settings
When performing a BERT test with the other instrument at far-end, the
BERT pattern or polarity received may be undetermined, the operator could
choose autoconfigure function in “Others” menu. Please refer to the
introduction of autoconfigure hereinafter.
When the BERT pattern polarity transmitted is undetermined, the operator

could switch to the reverse pattern polarity for matchment.
The setting parameters of “Tx clock” are described in Table 8. The setting parameters
of “Error add type” and “Error add mode” are described in Table 9 and Table 10. The
setting parameters of “Resolution” are described in Table 11.
Item Option Description

INTERNAL The E1 transmit clock is sourced from the internal crystal.
Tx
clk The E1 transmit clock is derived from the received signals at the
INTERFACE
receiver.
Table 8: “Transmit clock” parameter settings
72-0096-20 23

BIT Insert bit errors. (Valid under unframed and framed testing)
FAS Insert Frame Alignment Signal errors. (Valid only under the framed testing)
Error CODE Insert CODE errors. (Valid only under the AMI line code)
add
Insert CRC4 errors. (Valid only under framed testing with CRC4 frame
type CRC4
structure)
Insert E-BIT errors. (Valid only under the framed testing with CRC4 frame
E-BIT
structure)
Table 9: “Error add type” parameter settings

Press the “Single Err Add” key on the keyboard to inject one error per
time. Every time this key is pressed, one error such as BIT, FAS, CODE,
SINGLE E-BIT, CRC4 will be inserted to the transmit data stream by the
transmitter. “ERRORS” indicator turns on for one time if the error inserted
Error by the transmitter is looped back to the receiver.
add
Errors are injected at the constant fixed rate such as 1E-2, 1E-3, 1E-4,
mode
RATE 1E-5, 1E-6, 1E-7. In the mean time, the “ERRORS” indicator turns on with
if the error inserted by the transmitter is looped back to the receiver.
Error insertion is forbidden and pressing the “Single Err Add” key is
OFF
invalid.
Table 10: “Error add mode” parameter settings

The error and alarm events will be recorded with the resolution of 1
minute. The histogram of event records can be zoomed in as 1
1MIN
minute accuracy after the result is uploaded into the
TestManagerPro.
The error and alarm events will be recorded with the resolution of
Resolution 15 minutes. The histogram of event records can be zoomed in as
15MINS
15 minutes accuracy after the result is uploaded into the
TestManagerPro.
The error and alarm events will be recorded with the resolution of 1
1HOUR hour. The histogram of event records can be zoomed in as 1 hour
accuracy after the result is uploaded into the TestManagerPro.
Table 11: “Resolution” parameter settings
• Page 2 of “Setting” menu in “TX/RX” mode (Unframed)
Press the “PgDn” key to enter into the page 2, as shown in Fig 7. Move the cursor to
the positions to set “Storage” and “Resolution” parameters, and select the
parameters by pressing “F1”, “F2”, “F3”, “F4” softkeys.
72-0096-20 24
Tx clk [ INTERN]
Error add [ BIT] [ R AT E ] [ 1 E - 2 ]
Resolution [ 1MIN] St o r a g e [ N O ]
Duration [ TIMER] [01][MINS]
Star t [2006/10/28] [10:25:36]
INTERN RX CLK
Fig 7: Page 2 of “Settings” menu in “TX/RX” (Unframed)
The setting parameters of “Storage” are described in Table 12.
The setting parameters of “Duration” are described in Table 13.
Save the test result. The menu to save the result will pop out when
YES
the test is completed.
Storage
The test result is not saved directly, and the user can save it later in
NO
the “CURRENT” item of “Storages” menu.
Table 12: “Storage” parameter settings

MANUAL The test period is controlled by the “Start/Stop” key manually.
User-defined duration. Test period is initiated by pressing the

“Start/Stop” key and normally terminates at the end of the
AUTO period but this can be overridden by the “Start/Stop” key.
According to actual needs, the time range can be set from 1
second to 99 days.
Run a timed test by programming both the start and stop time of
Duration this test. The test will automatically start and stop at the
pre-determined time. And the test time range can also be set
from 1 second to 99 days, and the start time can be set in the
format of Y/M/D and H/M/S. In case that the pre-determined
TIMER
time is earlier than the real-time clock of the instrument, the test
of pre-determined time does not work, this can be overridden by
the “Start/Stop” key; If later than the current time, the
pre-determined time works, user is not able to manually start
the test, but can stop the test in advance manually.
Table 13: “Duration” parameter settings
72-0096-20 25
b. “TX/RX” Mode Framed Settings
The framed testing is intended to perform the bit error rate test of N×64kb/s (N=1～31)
in E1 channels. This testing can make the accurate assessment of transmission
performance like connectivity, errors in the selected one or more timeslots.
Select the framed structure such as PCM30, PCM30CRC, PCM31, PCM31CRC.

There are 3 setting pages in “TX/RX” mode, among which the setting contents of page
1 and page 3 are as same as ones in the unframed testing setting menus page 1 and
page 2.
• Page 1 of settings menu in “TX/RX” mode (Framed)
Refer to the relative setting descriptions in “TX/RX” mode (Unframed testing) for the
same basic setting parameters.
• Page 2 of settings menu in “TX/RX” mode (framed)
Press the “PgDn” key to enter into page 2, move the cursor to the positions to set
“Tx/Rx timeslots”, “Tx TS”, “Rx TS”, “Bandwidth”, “Idle pattern” parameters.
The setting parameters of “Tx/Rx timeslots” are described in Table 14, as shown in
Fig 8.
Tx/Rx timeslots [DIVERSE]
Tx TS [F * ·············· ]
···············
Rx TS [F * ·············· ]
···············
Bandwidth Tx 01∗64K Rx 01∗64K
Idle pattern [10101010]
TX
DIVERSE T X AS R X
Fig 8: Page 2 in “TX/RX” mode (Framed)

The selected timeslots in the transmit direction are different
DIVERSE
Tx/Rx to the ones in the receive direction.
timeslots The selected timeslots in the transmit direction are same as
TX AS RX
the ones in the receive direction.
DE- To select or de-select a timeslot. The selected timeslot is

SELECT
SELECT marked with “*” and unselected one is marked with “. ”.
Tx
Move leftward or rightward to the timeslot that needs to be
← →
selected or de-selected.
72-0096-20 26
DE- To select or de-select a timeslot. The selected timeslot is

SELECT
SELECT marked with “*” and unselected one is marked with “. ”.
Rx
Move leftward or rightward to the timeslot that needs to be
← →
selected or de-selected.
Displays the BERT data bandwidth of the transmit direction

Band-
No option and the receive direction according to amount of the
width
timeslots selected respectively.
Except the timeslot 0 in all frame structure and timeslot 16
in PCM30/30CRC framing, timeslot data will be replaced by
1 0 idle codes on a per-channel basis on the transmit direction
Idle
pattern in those unselected timeslots. This can be effectively used
to detect the busy or idle activity of the timeslots.
← → Move leftward or rightward to the bit that needs to be edited.
Table 14: “Tx/Rx timeslots” parameter settings
Caution:
Be sure not to set idle codes as all zeros when setting AMI as the line code.
It may result in generations of signal loss, frame synchronization and other
alarms at E1 receiver when too many unselected timeslots carry the all
zeros idle code in the transmit direction of the instrument, which will affect
the instrument to work normally.
3.2.2 “RX HI-Z” Mode (option)

“RX HI-Z” mode is one in-service testing mode commonly used in the case that the
network under test can not be out-of-serviced. In this mode, the E1 BER Tester will be
connected into the E1 signals with very high impedance, through which would not affect
the normal transmission of user’s data. “RX HI-Z” mode is always used in those E1 lines,
which is still transmitting the user’s data and can not be stopped but requires the long
term on-line monitoring and measurements.
In “RX HI-Z” mode, the E1 BER Tester can perform statistic analysis of various E1
alarms and errors in framed and unframed circuit, as well as performing monitoring of
E1 frame data. In “RX HI-Z” mode, the E1 BER Tester only uses its receiver, and the
transmitter will be shut off to save the power.
a. “RX HI-Z” Unframed Settings
• Page 1 of Settings menu in “RX HI-Z” mode (Unframed):
In E1 “RX HI-Z” mode, move the cursor to the positions to set “Interface”, “Framing”,
“Resolution”, “Storage” and “Duration”parameters, and select relevant parameters
72-0096-20 27
by pressing “F1”, “F2”, “F3”, “F4” softkeys. Press the “PgDn” key to select E1 framing
as UNFRAMED. The settings menu is as shown in Fig 9.
Settings 19:38:20
Mode [ RX HI-Z]
Framing [UNFRAMED]
Resolution [1MIN] St o r a g e [ N O ]
Duration [MANUAL]
通过
Fig 9: Settings menu in “RX HI-Z” mode (Unframed)
The parameters of “Line interface” and “Code” are described in Table 7.
The parameters of “Framing” are described in Table 6.
The parameters of “Resolution”, “Storage”, “Duration” are described in Table

12,13, 14.
b. “RX HI-Z” Framed Settings
• Page 1 of settings menu in “RX HI-Z” mode (Framed)
As shown in Fig 10, press the “PgDn” key to select E1 framing as the framed structure
like PCM30. There are 2 setting pages in “RX HI-Z” mode framed testing as prompted
on LCD. In page 1, move the cursor to the positions to set “Interface”, “Framing”,
“Idle pattern”, “Resolution” and “Storage” parameters, and select relevant
parameters by pressing “F1”, “F2”, “F3”, “F4” softkeys. Above relevant parameters of
are described in Table 6, 7, 12.
Mode [ RX HI-Z]
Framing [ PCM30]
Idle pattern [10101010]
Resolution [ 1MIN] St orage[ NO]
通0 过
PCM3
UNFRAM PCM30 CRC >>
Fig 10: Page 1 of settings menu in “RX HI-Z” mode (Framed)
72-0096-20 28
• Page 2 of settings menu in “RX HI-Z” mode (Framed)
Press the “PgDn” key to enter into the page 2, as shown in Fig 11. Move the cursor to
the positions to set “Duration ” parameters, and select the parameters by pressing
“F1”, “F2”, “F3”, “F4” softkeys.
Duration [ M AN U AL ]
通过
M AN U AL AU TO TIMER
Fig 11: Page 2 of settings menu in “RX HI-Z” mode (Framed)
3.2.3 “Through” Mode (Option)

“Through” mode testing supports the instrument bridged as a “resistor” into an E1 path.
In another word, E1 signal transmits through the instrument receiver transparently and
to be relayed through the transmitter of the instruments. In this mode the transmitter and
the receiver of the instrument must be connected into the E1 path, and the transmit
clock of the instrument is always extracted from the received E1 signal to guarantee the
synchronization of the signal. Because of the transparent transmission through the
instrument, it can make the measurements of error counting, signal and timeslot
analysis.
Go back to page 1 of “Settings” menu, select THROUGH in “Mode” item to set relevant
parameters. All these parameter configurations are same as those in RX HI-Z mode.
In “Through” mode, the instrument will not make any change or damage to E1 framing,
data, signalling and etc, but transmit them transparently and directly. This will not affect
the normal transmission of E1 signal. In this mode, the instrument can on-line perform
measurements of E1 signal frequency and level, make analysis of E1 synchronization
framing data and signalling, and detect E1 on-line alarm and monitor any timeslot data.
Therefore, “Through” mode is normally recognized as an effective tool for a long-term
on-line monitoring.
72-0096-20 29
3.3 “Results” Menu

After setting up the measurement parameters, the user can start a test with the instrument
by pressing the “Start/Stop” key. When performing the measurements, the “Start/Stop”
LED indicator turns on, then press the “Result” key to display all the results. The
“Results” menu has different displays under various test modes. And we will describe
them respectively according to different test settings.
3.3.1 “Results” Menus in E1 “TX/RX” Mode

The “Results” menus in E1 “TX/RX” mode provide full measurement analysis including
“Basic Analysis”, “G.821 Analysis”, “G.826 Analysis”, “M.2100 Analysis”, “Alarm
Seconds”, “Signal Analysis”, “Event Records” and so on. Press “F1”, “F2”, “F3” and
“F4” softkeys to select the analysis displays accordingly in the menu.
As the specific framing has been chosen, the results displays in E1 “TX/RX” mode are
different according to different framing. Please refer to the effects of framings on results,
as shown in Table 15.
Seconds
Analysis
Analysis
Analysis
Analysis
Analysis
Analysis
Timeslot
Records
M.2100
Results
Basic
G.821
G.826
Signal
Alarm
Event
Framing
Unframed • • • • • •
PCM30 • • • • • • •
PCM30CRC • • • • • • •
PCM31 • • • • • • •
PCM31CRC • • • • • • •
Table 15: Effects of framings on results in E1 “TX/RX” mode
The results menu of “Basic Analysis”, “G.821 Analysis”, “G.826 Analysis”, “M.2100
Analysis”, “Alarm Seconds”, “Signal Analysis”, “Event Records” in E1 “TX/RX”
mode can be switched by pressing “F1”, “F2”, “F3”, “F4”, which will be described
respectively below in detail.
a. Basic Analysis
“Basic Analysis” performs result statistics of errors, error free seconds, current error
rate, average error rate for BIT, FAS, CODE, CRC4 and E-BIT errors and errored
block count and background errored blocks (only appears under unframed testing) for
BIT errors.
“Basic Analysis” results menu is as shown in Fig 12.
The relevant result analysis items are described in Table 16.
72-0096-20 30
0Result
Item Description
Analysis
Errors are counted for all sources over total elapsed time. Counting
Errors may be inhibited under certain alarm conditions, see Effects of
Alarms on Basic Errors below.
Error Free Seconds are counted for all sources over total elapsed
time. Counting may be inhibited under certain alarm conditions, see
EFS
Effects of Alarms on Basic Errors below. % Error Free Seconds is
(%EFS)
the number of error free seconds during a test period expressed as
a percentage of the elapsed seconds.
Basic
Analysis Current Current Error Ratio is the error ratio measured over the last second.
err ratio
Average Average Error Ratio is the error ratio measured over total elapsed
err ratio time.
Errored Blocks are counted for the BIT source over total elapsed
EB
time.
Background Errored Blocks are counted for BIT source over total
BBE
elapsed time.
BIT Received bit violations in BERT pattern set in the instrument.
FAS Word errors in the FAS in timeslot 0.
Bipolar violations in AMI code or code violations in HDB3 code.

Bipolar violations are defined as consecutive marks of the same
Error CODE
polarity. Code violations are defined as consecutive bipolar
type
violations of the same polarity.
CRC4 Received CRC4 errors in CRC4 Multi- frames.
Far-end Block Errors (FEBE) reported in the first bit of frames 13

E-BIT
and 15 on E1 lines running with CRC4 multiframe.
Table 16: “Basic Analysis” in E1 “TX/RX” mode
Results 00D00H15M25S
[ B AS I C AN ALY S I S ] [ BIT]
Errors 2
EFS 923
Current error ratio 0
Av e r a g e e r r o r r a t i o 1.056E-09
L Running. P l e a s e wa i t …
BASIC G.821 通过
G.826
AN ALYSI AN ALYSI AN ALYSI >>
Fig 12: “Basic Analysis” result menu in E1 “TX/ RX” mode
72-0096-20 31
The effects of framings on “Basic Analysis” are as shown in Table 17.
Basic Analysis Unframed PCM30 PCM30CRC PCM31 PCM31CRC
Bit error • • • • •
EFS • • • • •
Current error ratio • • • • •
Average error ratio • • • • •
EB •
BBE •
FAS error • • • •
Code error • • • • •
CRC4 error • •
E-BIT error • •
Table 17: Effects of framings on “Basic Analysis”
Caution:
The instrument will disable the counting of errors in the presence of “*”
alarms which are in context for the current settings of the instrument. These
alarms will affect the counts of the error (EC), the error seconds (ES) and
the error free seconds (EFS). This is why the error and its relevant counting
value (such as EB, BBE) are so small when such kind of alarm appears in
the testing result of the instrument. The grade of alarm is higher than that of
error.
The effects of alarms on error counts in “Basic Analysis” results of the framed and
unframed E1 testing are as shown in Table 18 and 19.
EC/EFS
Signal Loss AIS Pattern Loss
EB/BBE
BIT * * *
CODE * * *
Table 18: Effects of alarms on error counts in the unframed E1

CAS CRC
Signal Frame Pattern
EC/EFS AIS Frame Frame
Loss Loss Loss
Loss Loss
BIT * * * *
CODE *
FAS * * * * *
CRC4 * * * *
E-BIT * * * *
Table 19: Effects of alarms on error counts in the framed E1
72-0096-20 32
b. G.821 Analysis
“G.821 Analysis” performs result statistics and ratio of errored seconds (ES and
%ES), severely errored seconds (SES and % SES), degraded minutes (DM and
%DM), unavailable time (UAS and %UAS). The displays of unframed and framed E1
testing in “G.821 Analysis” are same, as shown in Fig 13.
[ G. 8 2 1 AN A LY S I S ]
ES 0 0%
SES 0 0%
DM 0 0%
UAS 0 0%
BASIC G.821 通过
M.2100
Fig 13: “G.821 Analysis” result menu in E1 “TX/ RX” mode
The effects of alarms on error counts in “G.821 Analysis” results of the framed and
unframed E1 testing are as shown in Table 20 and 21.
ES/SES * * *
Table 20: Effects of alarms on ES/SES in the unframed E1

CAS CRC
Signal Frame Pattern
AIS MFrame MFrame
Loss Loss Loss
Loss Loss
ES/SES * * * *
Table 21: Effects of alarms on ES/SES in the framed E1
The relevant result analysis items of “G.821 Analysis” are described in Table 22.
Result Item Description

G.821 Asynchronous errored seconds (ES) are counted over the available
ES
Analysis time.
Asynchronous errored seconds counted over the available time
%ES expressed as a percentage of the available time in seconds.
The number of severely errors seconds (SES) is counted over the
SES available time. A severely-errored second is a second which has an
error ratio worse than the threshold 10-3.
The number of severely errored seconds (SES) expressed as a
%SES percentage of the available time in seconds.
72-0096-20 33
The number of degraded minutes (DM) during the test period. A

degraded minute is a 60 second (1 minute) composite interval during
DM the available time (excluding severely errored seconds) over which the
error ratio is worse than 10-6.
The number of degraded minutes expressed as a percentage of the
%DM total number of elapsed minutes of available time.
Unavailable Seconds (UAS) is the number of unavailable seconds
during a test period. A system becomes “available” when the error ratio
measured in 1 second intervals is better than the severely errored
UAS second threshold for 10 or more consecutive seconds. A system
becomes “unavailable” when the error ratio measured in 1 second
intervals is greater than the severely errored second threshold for 10 or
more consecutive seconds.
The number of unavailable seconds during a test period expressed as a
%UAS percentage of the total number of elapsed seconds.
Table 22: “G.821 Analysis” in E1 “TX/RX” mode
c. G.826 Analysis
“G.826 Analysis” performs result statistics and ratio of errored block seconds (EBS
and %EBS), severely errored block seconds (SEBS and % SEBS), background blocks
errors (BBE and %BBE), unavailable time (UAS and %UAS). Since “G.826 Analysis”
counts the errors based on the continuous serial data blocks over the rate of 2048kb/s,
“G.826 Analysis” is not provided in E1 framed testing. There is only one page in this
analysis, as shown in Fig 14.
The effects of alarms on errored block counts in “G.826 Analysis” are as shown in
Table 23.
EBS/SEBS * * *
Table 23: Effects of alarms on ES/SES in the unframed E1
[ G. 8 2 6 AN A LY S I S ]
EBS 0 0%
SEBS 0 0%
BBE 0 0%
UAS 0 0%
BASIC G.821 通过
G.826
Fig 14: “G.826 Analysis” result menu in E1 “TX/ RX” mode
72-0096-20 34
The relevant result analysis items of “G.826 Analysis” are described in Table 24.
Errored Block Seconds (EBS) are counted for all sources over total
EBS
elapsed time.
The number of errored block seconds counted over the available time
%EBS expressed as a percentage of total elapsed time of a test period in
seconds.
The number of severely errored block seconds (SEBS) is counted over

SEBS the available time. A severely-errored block second is a second which
has an errored block ratio worse than 30%.
The number of severely errored block seconds (SEBS) expressed as a

%SEBS
percentage of the available time in seconds during the total elapsed time.
G.826 Background Block Errors are counted for the errored blocks not
BBE
Analysis occurring as a part of an SES.
The ratio of errored blocks to total blocks during a fixed measurement

%BBE
interval, excluding all blocks during SES and unavailable time.
The number of unavailable seconds during a test period. A system

becomes “available” when the errored block ratio measured in 1 second
intervals is better than the severely errored block second threshold for 10
UAS or more consecutive seconds. A system becomes “unavailable” when the
errored block ratio measured in 1 second intervals is greater than the
severely errored block second threshold for 10 or more consecutive
seconds.
The number of unavailable seconds during a test period expressed as a

%UAS
percentage of the total number of elapsed seconds.
Table 24: “G.826 Analysis” in E1 “TX/RX” mode
d. M.2100 Analysis
ITU-T M.2100 recommendation is used to evaluate the connection quality of E1 path

so as to perform a long-term test and analysis. It can only be available under option
mode. “M.2100 Analysis” provides statistics counts of errored seconds (ES), severely
errored seconds (SES) and unavailable time (UAS) in both transmit (Tx) and receive
(Rx) directions for in-service and out-of-service testing. Since it counts errors based
on frame data, “M.2100 Analysis” is only provided in E1 framed testing, as shown in
Fig 15.
“Receive direction” stands for the E1 transmit direction of the equipment under test,
is also called as “Near end”. “Transmit direction” stands for the E1 receive direction
of the equipment under test, is also called as “Far end”.
The relevant result analysis items of “M.2100 Analysis” are described in Table 25.
72-0096-20 35
A second containing 1 or more errors from 1 or more

Non-CRC4
sources: ≥ 1 Signal loss, ≥ 1 Frame loss, ≥ 1 AIS, ≥ 1
Framing
errored FAS, ≥ 28 frame bit errors.
ES
CRC4
Framing
CRC4 errors, ≥ 805 CRC4 errors.
M.2100
Analysis A second containing 1 or more errors from 1 or more
Non-CRC4
(Rx sources: ≥ 1 Signal loss, ≥ 1 Frame loss, ≥ 1 AIS, ≥ 28
Direction) Framing
frame bit errors.
SES
CRC4
Framing
CRC4 errors.
UAS Same with “UAS” description in Table 24.
Non-CRC4 A second containing 1 or more errors from RDI source: ≥

Framing 1 Remote alarm.
ES
CRC4 A second containing 1 or more errors from 1 or more
Framing sources: ≥ 1 Remote alarm, ≥ 1 E-BIT errors.
M.2100
Analysis Non-CRC4 A second containing 1 or more errors from 1 or more
(Tx sources: ≥ 1 Remote alarm.
Direction) Framing
SES
CRC4 A second containing 1 or more errors from 1 or more
Framing sources: ≥ 1 Remote alarm, ≥ 805 E-BIT errors.
UAS Same with “UAS” description in Table 24.
Table 25: “M.2100 Analysis” in E1 “TX/RX” mode
[ M . 2 1 0 0 AN ALY S I S ]
TX RX
ES 0 0
SES 0 0
UAS 0 0
L Running. P l e a s e wa i t . . .
BASIC G.821 通过
M.2100
Fig 15: “M.2100 Analysis” result menu in E1 “TX/ RX” mode
72-0096-20 36
Caution:
M.2100 Analysis, based on monitoring frame data of framed E1, performs

the evaluation of the transmission quality on the E1 path between the far
end and near end equipment. Therefore, M.2100 Analysis will only be used
in unframed E1 path. When performing unframed E1 testing, this result
analysis will not be provided.
e. Alarm Seconds
“Alarm Seconds” give counts in seconds of signal loss, AIS, pattern loss, clock slip,
remote alarm, remote multiframe alarm, frame loss, CAS multiframe loss, CRC4
multiframe loss and so on. “Alarm Seconds” result menu is as shown in Fig 16, and
the relevant result analysis items are described in Table 26.
[ AL AR M S E C O N D S ]
Signal loss 0
AIS 0
Patten loss 0
Remote alarm 0
AL ARM S I G N AL TS 通过
SECONDS AN ALYSI AN ALYSI >>
Fig 16: “Alarm Seconds” result menu in E1 “TX/RX” mode

Alarm The number of seconds during which signal loss was
Signal loss
Seconds detected, counted over the elapsed test period.
The number of seconds during which AIS was detected,

AIS
counted over the elapsed test period.
The number of seconds during which pattern loss was

Pattern loss
detected, counted over the elapsed test period.
The number of seconds during which clock slips were

Clock slip detected, counted over the elapsed test period. Only
provided in PRBS test patterns.
The number of seconds during which remote alarm was

Remote alarm
detected, counted over the elapsed test period.
Remote MF The number of seconds during which remote multiframe

alarm alarm was detected, counted over the elapsed test period.
The number of seconds during which frame loss was

Frame loss detected, counted over the elapsed test period.
72-0096-20 37
The number of seconds during which CAS multiframe loss

CAS MF loss was detected, counted over the elapsed test period.
The number of seconds during which CRC multiframe loss

CRC MF loss was detected, counted over the elapsed test period.
Table 26: “Alarm Seconds” in E1 “TX/RX” mode
The effects of framings on alarm seconds counts in “Alarm Seconds” are as shown in
Table 27.
PCM30CR PCM31CR
Alarm Seconds Unframed PCM30 PCM31
C C
Signal Loss • • • • •
AIS • • • • •
Pattern Loss • • • • •
Clock Slip •
Remote Alarm • • • •
Remote MF Alarm • •
Frame loss • • • •
CAS MF loss • •
CRC MF loss • •
Table 27: Effects of framings on alarm seconds counts
f. Signal Analysis
“Signal Analysis” provides the real-time measurement of received E1 signal,

including Rx line rate, frequency offset and signals level. There is only 1 page in
“Signal Analysis” menu, as shown in Fig 17. The displays of “Signal Analysis” in E1
unframed and framed testing are same.
The relevant results are described in Table 28.
[ S I G N AL A N ALY S I S ]
Rx frequency 2048000Hz
R x f r e q u e n c y o ff s e t 0PPM
R x signal level >-2.5dB
AL ARM S I G N AL 通过
EVENT
SECONDS AN ALYSI RECORDS >>
Fig 17: “Signal Analysis” result menu
72-0096-20 38
The frequency of received 2048kb/s signal relative to the

internal reference clock. The frequency needs to comply with
Rx Frequency
the limits specified in 2048000Hz±50ppm according to ITU-T
recommendations.
Signal
Frequency offset of received 2 Mb/s signal relative to the
Analysis Rx Frequency
internal reference clock. The offset needs to comply with the
Offset
limits specified in ITU-T G.703 ≤ ±50ppm.
Rx Signal The level is measured of received 2 Mb/s signal in the range

Level -2.5dB～-43dB with the step of 2.5dB
Table 28: “Signal Analysis” result menu description
g. Event Records
During the test, if an error or an alarm occurs in the resolution time set in the settings
menu, then one event will be generated by the instrument accordingly. And the event
records number is added by 1 every resolution time. The event records sum will be
updated in accumulation with the storage interval (for example, 1 minute, 15 minutes,
1 hour). Event records can be uploaded and further analyzed by TestManagerPro
software.
The event records menu is as shown in Fig 18. The displays of “Event Records” in E1
unframed and framed testing are the same.
[EVENT RECORDS]
Event records sum 0
AL ARM S I G N AL 通过
EVENT
SECONDS AN ALYSI RECORDS >>
Fig 18: “Event Records” result menu
h. TS Analysis
“TS Analysis” provides the timeslot analysis under E1 framed testing. The specific
contents of “TS Analysis” are shown in the displays under E1 “RX HI-Z” mode below,
refer to Section 3.3.2 for details.
72-0096-20 39
3.3.2 “Results” Menu in E1 “RX HI-Z” Mode

“RX HI-Z” mode is normally used in in-service measurement of E1 path. The “Results”
menus under E1 “RX HI-Z” mode provide full measurement analysis including “Errors
Count”, “M.2100 Analysis”, “Alarm Seconds”, “Signal Analysis”, “Event Records”,
“TS Analysis” and so on. Press “F1”, “F2”, “F3”, “F4” softkeys to select the analysis
interface accordingly in the menu.
As the specific framing has been chosen, the results displays in E1 “RX HI-Z” mode are
different according to different framing. Please refer to the effects of framings on results
as shown in Table 29.
Result Unframed PCM30 PCM30CRC PCM31 PCM31CRC
Errors Count • • • • •
M.2100 Analysis • • • •
Alarm Seconds • • • • •
Signal Analysis • • • • •
Event Records • • • • •
TS Analysis • • • •
Table 29: Effects of framings on results in E1 “RX HI-Z” mode
a. Errors Count
“Errors Count” provides errors statistics for CODE, FAS, CRC4 and E-BIT, as shown
in Fig 19. The relevant descriptions are shown in Table 30.
[E R R O R S C O U N T ]
FA S e r r o r s 0
CODE errors 0
CRC4 errors 0
E-BIT errors 0
ERRORS M.2100 AL AR通

M过
COUNT AN ALYSI SECONDS >>
Fig 19: “Errors Count” result menu
The effects of framing on errors count are shown in Table 31.
72-0096-20 40
Unframed
PCM30
PCM30
PCM31
PCM31
CRC
CRC
Errors
Counter is disabled by
Count
CODE • • • • • Loss of signal.
The framer searching for FAS alignment and/or

FAS • • • • synchronization at either the CAS or CRC4
multiframe level.
Loss of frame synchronization at either the FAS or

CRC4 • •
CRC4 level.
Loss of frame synchronization at either the FAS or

E-BIT • •
CRC4 level.
Table 30: Effects of framings on “Errors Count”
b. M.2100 Analysis
“M.2100 Analysis” menu is as shown in Fig 15. And the relevant analysis results are
described in Table 25. “M.2100 Analysis” is not provided in unframed testing.
c. Alarm Seconds
“Alarm Seconds” menu is as shown in Fig 16. And the relevant analysis results are
described in Table 26.
The effects of framings on “Alarm Seconds” are as shown in Table 27.
d. Signal Analysis
“Signal Analysis” menu is as shown in Fig 17. And the relevant analysis results are
e. Event Records
“Event Records” result menu is as shown in Fig 18.
f. TS Analysis
“TS Analysis” provides in-service test of framed E1 signal. The full frame data can be
monitored in this analysis including frame alignment (FAS and NFAS), TS16 data,
Mframe, timeslot monitor and timeslot activities, as shown in Fig 20.
Since the timeslot 16 is used to transmit multiframe alignment signal and CAS
signalling data in PCM30/CRC framing and common 64kb/s data or CCS messages in
PCM31/CRC framing, its results will be displayed differently on framing configured in
the settings menu. The effects of framings on analysis items are shown in Table 31.
FAS and NFAS displays also are affected by CRC4 framing or non-CRC4 framing
chosen.
72-0096-20 41
[ T S AN ALY S I S ] [ FA S / N FA S ]
Si FAS
FA S 0 0 0 1 1 0 1 1
Si A Sa4–Sa8
N FA S 0 0 0 1 1 0 1 1
SIGN AL TS 通过
EVENT
AN ALYSI AN ALYSI RECORDS >>
Fig 20: “TS Analysis” result menu
Framing
TS Analysis
result item
PCM30 PCM30CRC PCM31 PCM31CRC
FAS/NFAS • • • •
Mframe • •
TS16
• •
Analysis
TS Monitor • • • •
Activity • • • •
Table 31: Effects of framings on “TS Analysis”

• “FAS/NFAS”
“FAS/NFAS” analysis result menu displays specific contents according to the CRC4
and non-CRC4 framing. Before the measurement, the user should know the framing
used by the equipment under test, so as to understand the “FAS/NFAS” analysis
result menu in specific framing. The frame structure of PCM30, PCM30CRC, PCM31
and PCM31CRC are described in Appendix A: E1 Frame Structure.
“FAS/NFAS” analysis displays of PCM30 or PCM31 framing is as shown in Fig 21.
[ T S A N S LY S I S ] [ FAS / N FAS ]
Si FAS
FA S 0 0 0 1 1 0 1 1
Si A Sa4–Sa8
N FA S 0 0 0 1 1 0 1 1
FAS TS通过
/NFAS MFR AME MONITOR ACTIVIT
Fig 21: “FAS/NFAS” result menu in PCM30/31 framing
72-0096-20 42
“FAS/NFAS” analysis displays of PCM30CRC or PCM31CRC framing is as shown in

Fig 22 (3 pages in all).
[ T S A N A LY S I S ] [ FAS / N FAS ] P:1/3
SMF1 SMF2
0 FA S 0 0 11 0 111 0 0 11 0 111
1 N FA S 0 0 11 0 111 0 0 11 0 111
2 FA S 0 0 11 0 111 0 0 11 0 111
FAS TS通过
Fig 22: “FAS/NFAS” result menu in PCM30CRC/31CRC framing
In the test of PCM30CRC or PCM31CRC, as shown in Fig 34, Si bits in FAS,

that is C1, C2, C3, C4 bits, will vary with CRC data, and Si bits in NFAS will
be fixed as “001011”.
• “MFRAME”
“MFRAME” is only valid for PCM30 or PCM30CRC framing. In this menu, the user can
monitor MFAS and NMFAS word and 4-bit ABCD signalling words (TS01～TS15,
TS17～TS31), as shown in Fig 23 (4 pages in all).
[ T S A N A LY S I S ] [ M F R AM E ] P:1/4
M FA S 0000 N M FA S 1 0 11
ABCD ABCD ABCD
TS01 0000 TS02 0000 TS03 0000
TS04 0000 TS05 0000 TS06 0000
FAS TS通过
Fig 23: “MFRAME” in PCM30/CRC framing
• “TS16”
“TS16” is only valid for PCM31 or PCM31CRC framing. In this menu, the user can
monitor the data of timeslot 16 in F01～F16 multiframes, as shown in Fig 24 (3 pages
in all).
72-0096-20 43
[ T S A N A LY S I S ] [ T S 1 6 ] P:1/3
MSB LSB MSB LSB
F01 11111111 F 0 2 11111111
F03 11111111 F 0 4 11111111
F05 11111111 F 0 6 11111111
L Running. P l e a s e WA I T. . .
FAS TS通过
/NFAS TS16 MONITOR ACTIVIT
Fig 24: “TS16” in PCM31/CRC framing
• “TS Monitor”
“TS Monitor” is valid for all framings. It provides 64kb/s data channel monitoring
updated every one second and timeslot monitoring capability. The 8-bit binary word
and hex word of the selected timeslot will be displayed in real time, as shown in Fig
25.
[ T S A N A LY S I S ] [ T S M O N I TO R ]
Ts s e l e c t [01]
Data 10101010 AAH
FAS TS通过
Fig 25: “TS Monitor” in “TS Analysis”
When performing “TS Analysis”, all data that displayed in the result menu
will be upgraded in every one second, so is timeslot data.
• “ACTIVITY”
“Activity” is valid for all framings and provides the activity monitoring for all 64kb/s
data channel. In PCM30 or PCM30CRC, timeslot 16 contains the frame alignment of
multiframe necessary for switching and routing all 30 telephone channels. So it is not
valid for timeslot activity monitoring. All timeslot activities are displayed with “Busy”
and “Idle”.
72-0096-20 44
Caution:
The busy or idle status of timeslot is achieved by monitoring the 8-bit data of
every timeslot in real time. If the 8-bit data of certain timeslot is changing
with time, then the timeslot status is “busy”, otherwise it is “idle”, as shown in
Fig 26.
64kb/s data channel are more frequently used than the traditional speech channels in
E1 signals. So the method to make estimation of channel activities is transmitted from
traditional 4-bit signaling ABCD word monitoring to timeslot data monitoring. In the
instrument, the status of timeslot “idle” can be defined by programming the idle pattern
in “Settings” menu.
[ T S A N A LY S I S ] [ AC T I V I T Y ] P:1/3
TS01 B TS02 I TS03 B
TS10 B T S 11 I TS12 B
FAS TS通过
Fig 26: “Activity” in “TS Analysis”
3.3.3 “Results” Menu in E1 “Through” Mode

The result menus in E1 “Through” mode are same with that in E1 “RX HI-Z” mode.
Please refer to Section 3.3.2 for details.
3.4 “Storages” Menu

“Storages” menus provide following functions:
• Recall the stored settings to make the settings of a test automatically.
• Edit/Modify settings parameters and save/recall user’s settings.
• After making the settings, choose “Storage” item in “Settings” menu as YES to save
the results of this test and start the test. When the test is completed, the LCD displays
will auto-switch to the storage menu. The user can input the record’s name of this
result and choose whether or not to save this test record. If the user choose not to
save this result, press “F4” to select EXIT to exit from the storage menu. If the user
72-0096-20 45
choose “Storage” item as NO in “Settings” menu, this test result will not be saved
automatically, the storage interface will not appear when the test is completed. In
case of that, the user can also save the current result in the “Storages” menu later.
• View, lock, unlock, rename and delete the stored settings or results.
Press the “Storage” key to switch to “Storages” menu, and choose SETTINGS,
RESULTS to enter into the menus. We will describe them respectively below.
3.4.1 “Settings” in “Storages” Menu

The instrument can save the settings of the test. The user can directly recall those
stored settings to set up the test. The instrument provides several groups of default
settings when manufactured in factory. The user can recall these settings directly, thus
simplify the setting process. The instrument contains 7 sets of saved records in all.
The settings in storages menu are as shown in Fig 27. In this menu, the user can store
the current settings of the instrument and check, recall, rename and delete stored
setting information.
St o r a g e s
[SETTINGS] P:1/1
[ CURRENT] Mode: TX/RX
<01>[Setting1] Mode: TX/RX
<02>[Setting2] Mode: RX HI-Z
<03>[Setting3] M o d e : THROUGH
L 04 vacant setting storages
SETTINGS R E S U LT S
Fig 27: “Settings” in ”storage” menu
Every stored setting can be recalled. The user could recall the stored
settings and modify the settings, then keep it for use in the future.
a. “Current” Setting
As shown in Fig 28, the current setting only appears in the first page. When STORE is
chosen, interface as shown in Fig 29 will appear. After the current setting is named
and saved, the instrument will put the setting with “±” (lock) followed.
72-0096-20 46
St o r a g e s
[S E T T I N G S ] P:1/1
[ CURRENT] M o d e : T X/ R X
<01>[Setting1] Mode: TX/RX
S TO R E
Fig 28: “Current” setting
E d i t r e c o r d ’s n a m e
Name： 19094303
0 1 2 3 4 5 6 7 8 ：
9 A B C D E F G H ：
I J K L M N O P Q ：
R S T U V W X Y Z ：
LI n p u t 1-8 characters’ name
通过
SELECT DELETE OK EXIT
Fig 29: Edit the record’s name
Caution:
If the stored setting is marked with “±”, user can only view, recall and unlock
the record. If the stored setting is marked with “² ”, user can view, recall,
lock, rename and delete the record.
The capacity of settings storage is limited. The maximum number of stored

settings is 7, among which 6 groups are available as system default settings
and 1 group left to the user to define. If the user wants to save more settings,
it is necessary to delete existing stored ones firstly, then directly save the
“Current” setting. The default name of the stored setting given by the
instrument is identified as the current time in the string format of “Date Hour
Minute Second”, such as “18154947”.
b. Stored Settings
The stored settings are as shown in Fig 30. The user can view, recall, lock (or unlock)
stored setting records. When in unlock status, the user can rename and delete the
stored settings. The relevant description are as described in Table 32.
72-0096-20 47
St o r a g e s
[ SETTINGS] P:1/1
< 0 1 > [ Setting1 ] Mode: TX/RX
通过
VIEW R E C AL L UNLOCK
Fig 30: Stored settings
Item Description
View View the settings information of the stored setting record.
Recall Recall the stored setting as the current to set up a new test.
Lock the selected stored setting in order to prevent it from being accidentally
Lock
renamed and delete.
Unlock Unlock the selected stored setting in order to rename and overwrite it.
Rename Modify the name of selected stored setting.
Delete Delete the selected stored setting.
Table 32: Activities to the stored settings
3.4.2 “Results” in “Storages” Menu

The result storage menu allows the test results to be saved, or the relevant information
of the test result to be viewed according to the name of the result. The result storage
menu is as shown in Fig 31. In the menu, user can save current test result, view, rename
and delete stored results. The instrument can save up to 10 groups of results.
St o r a g e s
[ R E S U LT S ] P:1/1
<01>[ ABCDEFGI] Mode: TX/RX
<02>[ BCDEFGKI] Mode: RX HI-Z
<03>[ CDEFGHIK] M o d e : THROUGH
L 07 vacant result storages
SETTINGS R E S U LT S
Fig 31: “Results” in “storage” menu
72-0096-20 48
a. “Current” Result
As shown in Fig 32, the current result only appears in the first page. When STORE is
chosen, the interface shown in Fig 44 will appear. After the current result is named and
saved, the instrument will put the setting with “±” (lock) followed.
St o r a g e s
[ R E S U LT S ] P:1/1
<01>[ ABCDEFGI] Mode: TX/RX
<02>[ BCDEFGKI] Mode: RX HI-Z
<03>[ CDEFGHIK] M o d e : THROUGH
S TO R E
Fig 32: “Current” results
Caution：
When the result is chosen to be saved after the test is completed but there is
not more saving capacity, user can exit the “Edit record’s name” menu first.
At this time, the result information will be saved in the “Current” result. Then
delete the unvalued results to release the capacity and save the “Current”.
b. Stored Results
The stored results are as shown in Fig 33. User can view (as shown in Fig 34), lock or
unlock, rename and delete the stored results. The relevant functions description is as
St o r a g e s
[ R E S U LT S ] P:1/1
<01>[ABCDEFGI] Mode: TX/RX
<02>[BCDEFGKI] Mode: RX HI-Z
<03>[CDEFGHIK] M o d e : THROUGH
通过
VIEW LOCK R E N AM E DELETE
Fig 33: Stored results
72-0096-20 49
[ A B C D E F G I ] [ SETTING] P1
Mode TX/RX
Interface U N B A L 75Ω HDB3
Framing UNFRAMED
BERT pattern 215-1
Polarity INVERTED ITU-T
L 07 v a c a n t s e t t i n g s t o r a g e s
通过
SETTING RESULT TIME
Fig 34: Setting information of stored results
Item Description
View relevant information of “Test setting”, “Test result” and “Test time”, as
View
shown in Fig 34.
Lock the selected result in order to prevent it from being accidentally

Lock renamed and overwritten. Unlock the selected result in order to rename and
Unlock delete it.
Rename Modify the name of selected result.
Delete Delete the selected result.
Table 33: Activities to the stored settings
3.5 “Others” Menu

“Others” menu mainly performs the settings of other relevant parameters of the
instrument. User can take configurations according to the practical needs.
Press the “Other” key and switch to “Others” menu. “Others” menu provides the
accessorial functions of AUTOCONFIGURE, MISCELLANEOUS, POWER MANAGE,
TIME&DATE, PC COMMUNICATION, KEYBOARD TEST, SELF TEST, TESTER INFO.
These functions will be described respectively below.
3.5.1 “Autoconfigure”
When performing the measurements for the first time with the instrument, some
operators may not be familiar with the setting parameters or may have no idea of how to
set the testing parameters correctly. The autoconfigure function is an intelligent setting
tool provided by the instrument. It can help the operator in the circumstances when the
operator is not familiar with the application of the instrument or the relevant parameters
of the system under test are undetermined. The autoconfigure function will simplify the
settings of the instrument.
72-0096-20 50
The autoconfigure function is only provided in some of test modes in the instrument.
Furthermore, it can’t fully replace the user in setting all the setting parameters. In Table
34, it definitely indicates the test mode, condition and configuration range of the
autoconfigure application. In the test mode, switch to the “Autoconfigure” menu, press
“F1” directly to perform the autoconfigure application, as shown in Fig 35.
Test
Interface Test Mode Autoconfigure Range
Pattern
Framing, BERT
Framed All PRBS 3 pattern, Tx/Rx
TX/RX timeslots
E1 Unframed All PRBS 3 Framing, BERT pattern
RX HI-Z － 3 Framing
THROUGH － 3 Framing
Table 34: Autoconfigure function descriptions
Others
[ AU TO C O N F I G U R E ]
Perform autoconfigure [ NO]
L Accessorial s ys t e m f u n c t i o n s
AUTO MISCEL- 通R过

POWE
CONFIGU LANEOUS MANAGE >>
Fig 35: Autoconfigure function is provided
Caution:
In the test mode that supports autoconfigure function, the parameters

relelated to the test, such as “Interface”, “Code”, “Resolution”, “Storage”,
“Duration”, can not be auto configured with autoconfigure function. These
parameters can only be set manually by the operator. After the
autoconfigure function is performed, please check other settings and set the
parameters related to the test manually if needed.
Caution:
When performing the autoconfigure function, the instrument needs to detect

and analyze the received data and clock signals. So before performing the
autoconfigure function, be sure the right signals are present on the receiver
of the instrument.
72-0096-20 51
3.5.2 “Miscellaneous”
“Miscellaneous” menu is as shown in Fig 36 and Fig 37. Move the cursor to the position
of “Beep on alarm”, “Keyboard lock”, “Display EFS or %EFS”, “Adjust LCD
contrast”, “Language” and “Load default settings” parameters to perform the
selection. The relevant parameters description is described in Table 35.
Others
[ MISCELL ANEOUS] P:1/2

Beep on alarm [OFF]
Keyboard lock [OFF]
Display EFS or %EFS [ EFS]
Adjust LCD contrast [650]

POWE
Fig 36: Page 1 of “Miscellaneous” menu
ON Beep on alarm and error.

Beep on alarm
OFF No beep on alarm and error.
To lock the “START/STOP” key, can not be used when the

test has not been started yet (the “START/ STOP” indicator
ON
turns off). Only valid after the test is started (the
Keyboard lock “START/STOP” indicator turns on).
Release the keyboard lock, allow to press “START/ STOP” to

OFF
stop the test.
EFS Error free second displays as the number of count.

Display EFS or
%EFS Error free second displays as a percentage of the elapsed
％EFS
seconds.
简体中文 To select simplified Chinese displays.

Language
ENGLISH To select English displays.
Load default YES Restore the instrument with the default factory settings.
settings
Adjust LCD +1, -1, To adjust the contrast of LCD with a step value of 1 or 5. The
contrast +5, -5 default value is 650.
Table 35: “Miscellaneous” configurations
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Others
[ MISCELL ANEOUS] P:2/2

Language [ ENGLISH]
Load default settings [ NO]

POWE
Fig 37: Page 2 of “Miscellaneous” menu
3.5.3 “Power Manage”

As shown in Fig 38, the instrument provides the functions to save the power. “Power
Manage” menu allows the user to set “Auto power off”, “Auto backlight off”
parameters by pressing “F1” and “F2” softkeys. The relevant parameters are described
in Table 36.
When the instrument is not under the test-started status and

ON there is no keystroke for 5 minutes running, the instrument will
Auto power off be automatically shut off.
OFF The automatic shutdown function is disabled.
ON Press the “Backlight” key to open the backlight, the

Auto backlight backlight will be automatically turned off in 30 seconds.
off
OFF The automatic backlight shutdown function is disabled.
Table 36: “Power Manage” configurations
Caution:
When a test is controlled by timer set in “Settings” menu but it still takes
more than 5 fives to start test, this “Auto power off” is not valid even though
it is set as ON. In this case, the instrument cannot be shut off without
keypress in five minutes. The test will start normally automatically in
accordance with the timer settings.
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Others
[ POWER M ANAGE]
Auto power off [ ON]
Auto backlight off [ ON]

POWE
Fig 38: “Power Manage” menu
3.5.4 “PC COMMUNICATION”

As shown in Fig 39, before uploading the stored results in the instrument or upgrading
the embedded software of the instrument by TestManagerPro, user should configure the
PC COMMUNICATION firstly as described in Table 37.
Others
[ PC COMMUNIC ATION]
USB Port [ ON]
TIME 通A-
KEYBO 过
PC COMM & DATE RD TEST >>
Fig 39: “PC Communication” menu
PC
Option Description
COMMUNICATION
ON The instrument can communicate with PC via the USB port.

Port State
OFF The communication with PC via USB port will be prohibited.
Table 37: “PC Communication” configurations
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Caution:
Before communicating with PC, make sure to set the PC Communication

as ON. When the PC Communication state is configured as ON, other
operations of the instrument will be disabled. The displays will be locked
temporarily before the port state becomes OFF. Please disable the port
state as OFF when the communication with PC is completed, so as to
perform other operations.
3.5.5 “Time & Date”

When recording the results, it is necessary to time-stamp the certain events. The user
can set the time and date in the menu, as shown in Fig 40. And the time and date setting
parameters are described in Table 38.
Others
[ TIME & DATE]

Clock mode [RUN]
Date [2005/12/20]
Tim e [ 11 : 4 0 : 4 0 ]
TIME 通A-
KEYBO 过
Fig 40: “Time & Date” menu
Time &
Option Description
Date
To run the new real-time clock after the modification of the date
RUN
Clock and time.
Mode
SETUP To modify the date and time of the instrument.
Year To select between 2000~2099.
Date Month To select elect between 01~12.
Day To select elect between 01~31.
Hour To select elect between 00~23.
Time Minute To select elect between 00~59.
Second To select elect between 00~59.
Table 38: “Time & Date” configurations
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3.5.6 “Keyboard Test”

“Keyboard Test” function can detect whether the keyboard functions of the instrument
properly or not. Except for the “Power” key, all other functional keys can be tested.
As shown in Fig 41, the keyboard test can be performed one by one in the direction of
left to right and up to down according to the prompt information on LCD. In the process
of keyboard test, all the functional keys including the “Power” key are locked and only
valid for use after the test.
Others
[ KEYBO ARD TEST]

Perform the test [ NO]
TIME 通A-
KEYBO 过
Fig 41: “Keyboard Test” menu
Caution:
In the keyboard test, if no key pressed by user, the instrument will keep
waiting. When the correct key is pressed, the keys prompted under test will
display “√”, while the wrong keys will display “×”. The display will disappear
in 1 second and prompt next keypress until all the process is completed.
Please follow the prompt information to press the corresponding key until
the test is completed. Under the process, other operations are valid. Until
the keyboard test is completed, user can not exit.
3.5.7 “Self Test”

Before making measurements, user can run self test to ensure the integrity and normal
functions of the instrument. As shown in Fig 42, the instrument self test is performed one
by one according to CPU control, external I/O control, Memorizer control, FPGA logic
control, DSP arithmetic control, LED light control, XPLD program version and etc. User
can exit the test when the test has completed.
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Others
[ SELF TEST]
Perform the test [ NO]
YES NO
Fig 42: “Self Test” configurations
During the self test, the instrument will self-detect the LED indicators, with the steps of
turning on all CPU controlled LEDs, then turning off all of them, and finally turning on
and off “SIGNAL LOSS”, “FRAME LOSS”, “AIS”, “MFRAME LOSS”, “PATTERN LOSS”,
“REMOTE ALARM”, “ERRORS”, “START/STOP” and “LOW BATTERY” indicators in
sequence. User can check if the LED indicator is functioning properly according to the
above procedures. If user finds one LED indicator can not be turned on or off, the LED
indicator may be damaged or out of CPU control. In this case, please contact the
instrument supplier as soon as possible. Since the “CHARGE” LED indicator is not
controlled by CPU, this LED can not be checked by self test.
Caution:
It will display “√” followed with the test item if the function is ok and display
“×” if the function fails.
User can not exit from the self test until the self test has completed.
3.5.8 “Tester Info”

“Tester Info” menu displays the serial number code, software version, hardware version
and etc.
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E1 BER Tester 4 Performing Measurements
4. Performing Measurements
This chapter is intended to help the operator in performing measurements with E1 BER
Tester. Full details of the measurements and how to perform will be described below.
4.1. Overview
4.2. Perform the measurements
4.1 Overview
The E1 BER Tester is a handheld communication instrument suitable for the field
deployment, operation and maintenance of communication equipment. It can perform
error testing, alarm generation and detection, fault finding and locating, frame data
analysis, signaling analysis, signal analysis, and other measurements to 2Mb/s channels.
In addition, the E1 BER Tester can conveniently help user complete in-service and
out-of-service, framed and unframed N×64Kb/s(N=1~32) bit error testing, timeslot
analysis, and other measurements. It is a very effective communication test tool for the
maintenance, repair, deployment and development of communication equipment.
The basic procedure of making measurements with the instrument is:
a) Select the test interface.
b) Set up the measurement parameters.
c) Perform the measurement.
d) Display or store the results.
e) Upload and analyze the stored results.
f) Print the record form of the results.
4.2 Perform the Measurements

Based on different test modes and functions, the detailed testing will be described
respectively as below.
4.2.1 Out-of-service Bit Error Rate Testing

The out-of-service error testing is mainly performed in R&D, manufacturing, field
installation, engineering acceptance and daily maintenance of equipment. It can
accurately perform measurements of the transmission quality of the system under test.
In addition, the instrument will give full analysis on the error, signal, alarm seconds and
event records, and etc. The out-of-service testing can be performed by far-end loopback
and far-end mutual test, as shown in Fig 43 and Fig 44.
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Go
E1 Tx
Telecom E1
E1 Rx Network Loopback
E1
BER Tester Return LTE
LTE
Fig 43: Out-of-service BER Testing (Far-end Loopback)
Go
E1 Tx E1 Rx
Telecom
E1 Rx Network E1 Tx
E1
BER Tester E1
LTE Return LTE BER Tester
Fig 44: Out-of-service BER Testing (Far-end Mutual Test)
LTE = Line Terminal Equipment of transmission system (PDH, SDH)
Test Description:
• When E1 “TX/RX” mode is chosen, configure the settings according to the specific
configurations of the system under test. Please refer to relevant description of
Section 3.2.1.
• After completing the settings, press the “Start/Stop” key and the “Result” key to
enter into relevant result menu. The test result is described in Section 3.3.1. The
results may be different according to the different settings.
• When making loopback test, the loop can be made by loopback cable directly at
the interface of the equipment under test, or the far-end loopback which can be
configured via the maintenance software of the system under test. In
out-of-service framed BER testing, if there is no 64K timeslot DXC equipment in
the loopback path, the transmit and the receive timeslots need to be set as “TX
AS RX”. If the DXC equipment is used in the loopback path and the transmit
timeslots have been cross-connected, then the receive timeslots need to be
determined according to the cross-connected timeslots. At this time, the Tx and
Rx timeslots should be set as “DIVERSE”.
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• Pay attention to ensure that the test pattern and pattern polarity of the local and
far-end instrument should be set identically in the far-end mutual test.
• When making the measurements, error can be inserted into the path to verify the
operating status of the instrument and the condition of Tx and Rx signal in the
path.
When making out-of-service BER testing with far-end mutual mode, if the
test pattern or polarity of the far-end instrument is undetermined, the
operator can use the autoconfigure function in the “Others” menu to make
settings automatically.
4.2.2 In-service Testing

In applications when the service can not be interrupted, such as the transmission of the
real-time accounting information, mobile base connection, user should make the
measurements under the in-service testing mode. In-service testing provides monitoring
error performance on FAS, CRC4 and E-BIT. There are two in-service testing mode
including “RX HI-Z” mode and “Through” mode for user to choose based on practical
needs. “RX HI-Z” mode testing connection is as shown in Fig 45. “Through” mode
testing connection is as shown in Fig 46.
MUX = Multiplexer / Demultiplexer
Rx
Telecom
Tx Network
High
impedance MUX MUX
E1
BER Tester
Fig 45: “RX HI-Z” mode in-service testing
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Rx
Telecom
Tx Network
MUX MUX
E1
BER Tester
Fig 46: “Through” mode in-service testing
Test Description:
• When E1 “RX HI-Z” mode is chosen, the input impedance of the receiver of the
instrument is set under high impedance (>2KΩ). User can directly connect the
receiver of the instrument to 2 Mb/s transmission channel of the transmitter or
receiver on DDF (Digital Distribution Fame). According to framings of the 2 Mb/s
signal under test, select the corresponding frame structure such as Unframed,
PCM30, PCM30CRC, PCM31 and PCM31CRC. Please refer to relevant parts of
Section 3.2.2 for details.
• When completing all the settings, press the “Start/Stop” key and the “Result” key
to enter into relevant result menu. All the test results in this mode are described in
Section 3.3.2.
• When E1 “Through” mode is chosen, the 2 Mb/s signal under test will be
transmitted transparently through the instrument. Select Unframed, PCM30,
PCM30CRC, PCM31, PCM31CRC frame structure according to the framing of 2
Mb/s signal under test. Please refer to the relevant parts of Section 3.2.3 for
details. When completing all the settings, press the “Start/Stop” key and the
“Result” key to enter into relevant result menu. All the test results in this mode are
described in Section 3.3.3.
When making in-service testing under “RX HI-Z” and “Through” mode, if the
frame structure of the E1 signal under test is undetermined, the operator can
use the autoconfigure function in the “Others” menu to make settings
automatically.
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4.2.3 N×64Kb/s Bit Error Rate Testing

The E1 BER Tester is capable of testing one or several 64kb/s channels in the E1
transmission channel. Nx64kb/s BER testing is used to check timeslot integrity through
the digital cross-connection equipment in R&D and engineering. A test pattern is
transmitted over a group of timeslots from the near end. At the far end, the expected
receive timeslots are selected and bit error rate is calculated.
The E1 digital cross-connection equipment can switch one received timeslot to any
timeslot of the other E1. In E1 “TX/RX” mode framed testing, select a group of timeslots
in the transmit direction and expected timeslots in the receive direction to make the BER
testing. Fig 48 shows one N×64Kb/s BER testing connection.
Test Description:
• As shown in Fig 47, the E1 DXC equipment cross connects the 2nd and the 3rd
timeslots of one E1 signal to the 29 th and the 30 th timeslots of another E1 signal.
Thus, user should select the 2nd and the 3rd timeslots in “Tx timeslots” and the
29th and the 30th timeslots in “Rx timeslots”. Then the BER testing can be
performed in these two timeslots path.
• When making BER measurements in Nx64kb/s mode, “TX/RX” framed testing

mode should be configured with “Diverse” as the timeslot settings. Please refer to
the relevant parts of the Section 3.2.1.
• When completing all the settings, press the “Start/Stop” key and the “Result” key
to enter into relevant result menu. All the test results in this mode are described in
Section 3.3.1.
1 2 3 … 29 30 31 1 2 3 … 29 30 31
Tx
E1 DXC
Rx
E1
BER Tester
Fig 47: N×64Kb/s BER testing
When making Nx64kb/s BER testing, if the timeslots carrying the BERT
pattern in the received E1 signal which may be cross-connected by DXC
equipment are undetermined, the operator can use the autoconfigure
function in the “Others” menu to make settings automatically.
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4.2.4 Timeslot Analysis

When performing in-service testing (“RX HI-Z” or “Through” mode), not only the error
measurement can be tested, but also the data and activities of all 64kb/s timeslot and
signaling words in E1 signal can be monitored. It is mainly used in the testings of
Exchanger, PCM DXC equipment, E1 multiplexer in R&D and engineering.
Test Description:
• The settings are described in relevant parts of “RX HI-Z” mode (framed testing) in
Section 3.2.2.
• In the result menu, user can select the timeslot that needs to be monitored and
review the test content. Please refer to Section 3.3.2 for details.
• The frame structure of PCM30, PCM30CRC, PCM31 and PCM31CRC are

described in Appendix A.
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E1 BER Tester 5 Technical Specifications
5. Technical Specifications
This chapter introduces the technical specifications of all the interfaces in the E1 BER
Tester.
5.1 “E1” Specifications
5.2 Other Specifications
5.1 “E1” Specifications

5.1.1 General
Measuring interface E1 (2048Kb/s)
Alarm LEDs Signal Loss AIS
Frame Loss MFrame Loss (CAS and CRC)
Remote Alarm (RDI and Remote MF)
Pattern Loss Errors
Alarm Hierarch The more important alarm will suppress a lesser alarm, as
shown below.
Hierarch Alarm and Error
1 Signal Loss
2 AIS Errors
3 Frame Loss CAS MF Loss CRC MF Loss
4 Pattern Loss Remote Alarm Remote MF Alarm
Table 39: E1 Alarm Hierarch
E1 standards
• Comply with G.703, G.706, G.732
• PCM30: G.704 with CAS multiframe
• PCM31: G.704 without CAS multiframe
• PCM30CRC: G.704 with CAS and CRC4 multiframe
• PCM31CRC: G.704 with CRC4 multiframe
Test Pattern
• PRBS: 223-1 (O.151), 215-1 (O.151)
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• 211-1(O.153), 29-1
• Fixed Code: 1111, 0000, 1010
• 16BIT: Fully programmable 16-bit word
• PRBS Polarity: “Normal” or “Inverted”
Test Period Manual, Auto, Timer
Result Analysis G.821, G.826, M.2100 Analysis
5.1.2 Transmitter (Generator)

Line Code HDB3, AMI
Impedance 75Ω unbalanced, 120Ω balanced
Wave Form Comply with G.703
Tx Clock Source Internal, Interface
Internal Tx Clock
• Frequency: 2.048 MHz
• Stability: ±10 ppm (0~50℃)
• Ageing: ±2 ppm per year (typical)
• Deviation: ±999 ppm
Internal oscillator Stability ±20ppm （0~50℃）

Error Insertion
• Single Error Add: BIT, CODE, FAS, CRC4, E-BIT
• Error Add Rate: Single, 1E-N, N=2~7
5.1.3 Receiver
Rate 2.048Mbit/s ± 999 ppm (G.703 specs ±50 ppm)
Line Code HDB3, AMI
Impedance
• “TX/RX”: 75Ω unbalanced, 120Ω balanced
• “RX HI-Z”: >2KΩ unbalanced, balanced
• “Through”: 75Ω unbalanced, 120Ω balanced
Receive Sensitivity > -43dB
Timeslot Analysis
• FAS / NFAS
• MF0TS16
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• Timeslot data
• ABCD code
Clock Slip In the received PRBS, if it gets 1 or several more/less

bits than the original PRBS, it is measured as 1 clock
slip. This is only effective with PRBS and not valid for
fixed code or 16Bit code.
5.2 Other Specifications

USB Port USB 2.0
Baud Rate: 19.2 Kb/s
Character Length: 8 bit
Parity Check Bits: None
Stop Bits: 1 bit
Battery 3.7×2V Lithium rechargeable battery, 1000 mAh
AC Power Adapter Input: AC 100V~240V ±10% 50/60 Hz 0.45A
Output: DC12V/1.5A
Dimension 228mm×117/72mm×53mm (L×W×H)
Weight 500g
Operating Temperature 0~50℃
Storage Temperature -30~+70℃
Humidity 5%~95% non-condensing
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E1 BER Tester 6 Working with TestManagerPro
6. Working with TestManagerPro

This chapter briefly describes the software functions, system configurations and running
environment, install and uninstall the software on the PC and how to use TestManagerPro
software.
6.1 Software Functions
6.2 System Configuration and Running Environment
6.3 Install and Uninstall the Software on the PC
6.4 How to Use TestManagerPro
6.1 Software Functions

TestManagerPro communicates with series instruments via the USB port in PC. It can
support uploading the stored data from the instrument, viewing and printing the stored
results. You can easily check, manage and analyze every test result on your PC. It can
also describe all the error and alarm events happened in the test period in details by
histogram and help you in classification, viewing, filing, report outputting and deletion of
the test results. Another very important function of TestManagerPro is that you can on-line
upgrade the embedded software in the instrument with this PC software. The upgrade will
be finished automatically and safely.
Basic functions of TestManagerPro:
• Select the type of the instrument.
• Connect the instrument.
• Upload the test results which stored in the instrument.
• View the stored results.
• Analyze the stored results.
• Clean up the records uploaded.
• Plot out the test results with the graphics, table or text mode.
• Upgrade the embedded software.
• Help.
6.2 System Configuration and Running Environment

6.2.1 Firmware
Basic configurations required:
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• PC: 586/133MHz or better
• Memory: 16MB or above
• Hard disk: 50MB or above
• CD-ROM driver for installation
• Standard mouse and keyboard
• USB port
• Windows-compatible printer or plotter
6.2.2 Operating System

• Windows 98/ME/2000/NT/XP
6.2.3 System Configuration Recommendation

• System display mode: 800x600 Pixels
• Install the printer or plotter before setup
6.3 Install and Uninstall the Software on the PC

6.3.1 Installation Process
• Close all programs and turn off virus protection software to prevent installation
confliction.
• Open the package and take out the CD disk with the mark of “TestManagerPro”;
• Insert the CD into the CD-ROM driver;
• View the contents of the CD from “My Computer”;
• Double-click “Setup.exe”;
• Complete the installation according the setup promted information;;
• After completing installation of the software, one short-cut icon “TestManagerPro”

will be placed on the desktop automatically;
• Double-click the icon “TestManagerPro” to run the program.
6.3.2 Uninstall TestManagerPro

• In the “Start” menu, click “Settings”;
• Open “Control Panel”;
• Click “Add/Remove Programs”;
• Select “TestManagerPro” in the list;
• Click “Add/Remove” button to remove the software automatically.
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6.4 How to Use TestManagerPro

6.4.1 Connect the Instrument
See Section 2.4, and confirm connection successfully and settings correctly.
6.4.2 TestManagerPro Software Operation

Graphic windows help the user operate TestManagerPro software simply and easily.
User can work with TestManagerPro as follows. Figure 48 shows the whole operation
procedures with TestManagerPro.
• Double-click the icon of “TestManagerPro” to run the software.
• Switch off the instrument.
• Connect USB communication cable between the integrated PC Communication with

the USB port of your PC.
• Switch on the instrument and set PC “PC Communication” as “ON”.
• Click “Select” icon in the short-cut bar or in the “Manipulation” menu to choose the
type of instrument which you are working with.
• Click “Connect” icon in the short-cut bar or in the “System” menu to make the
connection with the instrument.
• After connecting successfully, user can do the operations as below.
9 Upload the stored results:
Click “Upload” icon in the short-cut bar or in the “Manipulation” menu to upload
the stored results from the instrument.
9 View the uploaded results:
Click “View” icon in the short-cut bar or in the “Manipulation” menu to check the
detailed information of every uploaded results in the software. If there has a
graph result, user can also view the histogram analysis of the error and alarm
events. In addition, user can delete and print any result.
9 Clean up all uploaded results in software:
Click “Clean Up the Records” the “System” menu to delete all the uploaded
results of one instrument in the list.
9 Upgrade the embedded software:
Click “Upgrade embedded software” the “System” menu to update the

embedded software of the selected instrument.
First step: Click “Read” button to read out the type and software version of the
selected instrument.
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Second step: Click “Load File” button to load the target hex file into the
program.
Third step: Click “Next” button to enter into the upgrading window and then click
“Upgrade” button to start upgrading.
Fourth step: The program will automatically complete the upgrading process.
After being upgraded, the instrument will reset itself.
Fifth step: Switch off the instrument and uninstall the USB communication cable.
Close “TestManagerPro” program.
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Start
Double-click the icon of “TestManagerPro” to

run the software. Enter into the main window of
the program.
Select the type of instrument
Connect instrument
Check if the connection is

No well done or if the USB port
Successfully?
of PC is damaged.
Yes
Select functions
Clean up records Upload records View records Upgrade embedded

software
View Select records Read data from

Clean up the instrument
uploaded
records of specific records
selected instrument
View the settings Load in hex file
and results of record
Start upgrading
Print in form Save the form

as other format
file
Exit from TestManagerPro
End
Fig 48: TestManagerPro operation flow chart
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E1 BER Tester 7 Troubleshooting
7. Troubleshooting
This chapter is intended to provide prompt help to operator on some frequently asked
questions and with the resolutions.
1) The instrument can not be powered on or has no displays.

When “Low Battery” alarms, the tester will be shut down soon automatically. When
the voltage of battery drops to a low level, the power circuit of the tester will be locked
and cannot be opened until:
Plug the AC power adapter into an appropriate AC wall outlet and switch on the
tester with external power supply.
When the battery is fully charged, unplug the AC power adapter and press the
“Power” key to switch on the tester. And the tester will work normally.
2) When the battery charged fully, “Charge” LED will be turned off. And
LED will be lit as soon as plugging AC adapter again.
This is normal. The battery will be charged automatically when connected with AC
power adapter because the power consumption in working process. The battery will
be fully charged at a very short time. And “Charge” LED indicator will be turned off
then automatically.
3) The instrument shuts off.

Check if the battery is low.
Check if “Auto power off” in “Other” menu is set to ON or not.
4) The instrument can not work with battery.

Switch off the instrument. Open the end cover of instrument, check if the battery case
is locked tightly or not. If not, re-clip the case and slide it back on emphatically. When
hearing “Click”, the battery case has been installed into the provided slot successfully.
Then install the end cover back. If this is still not working, it might be the issue of over
discharge state of battery, in which case the Li-ion circurt is under shut-down
protection. Use the AC power adapter to charge the battery and it will return to normal.
5) Duration of battery is getting shorter.

The usage life time of new rechargeable battery is about 500~800 cycles of charge
and discharge. When you find the working duration is reduced severely in evidence,
you should replace the rechargeable batteries. Do not put the old and new batteries
into use together or use some bad or unconfirmed rechargeable batteries.
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E1 BER Tester 7 Troubleshooting
6) Get more help

If you have any other questions, please contact with your local vendor by phone or by
emails as soon as possible.
Warning:
If you find that the instrument works abnormally, please contact your vendor
as soon as possible. Do not open the instrument by yourself.
If the frangible pastes around the instrument are damaged or have been
removed, user would lose the 1-year warranty service.
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E1 BER Tester Appendix A: E1 Frame Structure
Appendix A: E1 Frame Structure

I. PCM30 Frame Format (ITU-T G.704/G.706)
F0 F1 F2 F3 F4 F5 F6 F7 F8 F9 F10 F11 F12 F13 F14 F15
1 frame = 32 timeslots =125µs
TS TS TS …… TS TS TS …… TS TS TS
0 1 2 15 16 17 29 30 31
Channels Channels
1 to 15 17 to 31
FAS/NFAS Network 8-bit word
Si 0 0 1 1 0 1 1 F0 0 0 0 0 x y x x 1 2 3 4 5 6 7 8
MFAS NMFAS
FAS Word
NFAS Word F1 a b c d a b c d
CH1 CH16
Si 1 A Sa Sa Sa Sa Sa
F2 a b c d a b c d
Sa4~Sa8
CH2 CH17
F15 a b c d a b c d
CH15 CH30
FAS word structure:
Bit 1 (Si) is reserved for international use.
The remaining bits are used for frame sync and are always set to 0011011.
NFAS word structure:
Bit 1 (Si) is reserved for international use.
Bit 2 is always set to 1.
Bit 3 of the NFAS contains the A-bit which indicates a remote (or distant) alarm (for
example, far-end multiplexer out of synchronization).
Bit 3 = 0 indicates normal operation; no alarm.
Bit 3 = 1 indicates that one of the following fault conditions has occurred:
• Power supply failure
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• Codec failure
• Failure of incoming 2Mb/s signal
• Frame alignment error
• Frame alignment signal error ratio > 10-3.
Bit 4 ~ Bit 8:
ITU-T recommendations allow the S-bits (Sa4 to Sa8) to be used in specific point to point
applications. Bit Sa4 may be used as a message-based data link for operations,
maintenance and performance monitoring. The signal originates at the point where the
frame is generated and ends where the frame is split up. Bits Sa5 to Sa8 are all intended
for national use and when unused are set to logic 1.
Channel associated signalling (CAS):
Once the multiplexer has gained frame alignment, it searches in timeslot 16 for the
multiframe alignment signal (MFAS) (0000) in bits 1 to 4. A multiframe consists of 16
frames, and 0000 in bits 1 to 4 signifies the first of these frames. The multiframe is only
necessary when CAS is used (that is, PCM30). Timeslot 16 contains the information
necessary for switching and routing all 30 telephone channels. The signaling between the
near-end and far-end multiplexer takes place using pulse signals comprising 4 bits
(ABCD). These are generated by the signaling multiplex equipment. The 64 kb/s signaling
capacity of timeslot 16 is divided between the 30 telephone channels and two auxiliary
channels (synchronization and alarm message), using pairs of 4-bit ABCD signaling words.
Over a complete multiframe, all 30 channels are serviced. Timeslot 16 can accommodate
a pair of 4-bit ABCD signaling words. This ensures that all 30 channels are serviced over a
complete multiframe.
Common channel signalling (CCS):
If CCS is used, multiframe alignment is unnecessary. Timeslot 16 is simply used as a 64

kb/s data channel for CCS message, or it can be turned over to revenue-earning traffic,
giving a total of 31 channels for the payload (PCM31).
Limitations of the standard framing format:
When the 2 Mb/s frame is used exclusively for PCM voice transmission, the frame
alignment criteria is very reliable. However, it has some limitations, particularly for data
transmission and on-line performance monitoring. With data transmission, the traffic can
inadvertently simulate the frame alignment and non-frame alignment words and false
framing is possible. This can have a serious effect on the data. Performance monitoring of
received signal is limited to checking for errors in the frame alignment signals. This gives a
poor indication of errors in the payload as only seven bits in 256 are being checked.
There is no way for the remote end to send back this rudimentary error performance data,
so only one direction of transmission can be monitored at each location. In an age of
increasingly competitive digital leased line service, this is inadequate.
72-0096-20 75
II. PCM30CRC Frame Format (ITU-T G.704)

Sub- TS1
TS17~
SMF frame TS0 ~ TS16
TS31
Number TS15
FAS 8-bit MFAS NMFAS 8-bit
0
C1 0 0 1 1 0 1 1 Data 0000 XYXX Data
NFAS 8-bit TS01 TS17 8-bit
1
0 1 A Sa Sa Sa Sa Sa Data abcd abcd Data
FAS 8-bit TS02 TS18 8-bit
2
C2 0 0 1 1 0 1 1 Data abcd abcd Data
3
Ⅰ
4
5
6
7
8

9

10

11
Ⅱ
12

13
E1 1 A Sa Sa Sa Sa Sa Data abcd abcd Data

14

15
E2 1 A Sa Sa Sa Sa Sa Data abcd abcd Data
72-0096-20 76
CRC-4 framing:
To overcome the limitations of the standard framing format issued above, ITU-T
recommendation G.704 specifies that the use of a CRC-4 cyclic redundancy check for 2
Mb/s systems. CRC-4 framing provides reliable protection against incorrect
synchronization and a means of monitoring bit error ratio (BER) during normal operation.
In other words, CRC-4 framing algorithm is extremely unlikely to be fooled by payload
data patterns.
The CRC-4 remainder is calculated on complete blocks of data, and the 4-bit remainder is
transmitted to the far-end, using the first bit in the FAS of each even numbered frame
(C1-C4). At the receiving end, the receiver makes the same calculation and compares its
results with those in the received signal. If the two 4-bit words differ, the receiving
equipment knows that one or more errors are present in the payload. Every bit of the block
is checked so an accurate estimate of block error rate (or errored seconds) is made while
the link is in service.
To enable the receiver to locate the four bits C1, C2, C3, C4 forming the remainder, an
additional frame called the CRC multiframe is formed. The CRC-4 multiframe comprises
sub-multiframes Ⅰand Ⅱ, both of which comprise eight normal frames. A CRC multiframe
alignment signal is used to synchronize the receiver to this frame. The signal is inserted
bit by bit into the first bit position of the NFAS in frames 1, 3, 5, 7, 9 and 11.
The CRC-4 multiframe alignment signal is 001011 and is transmitted in the first bit of the
NFAS word. The first bits of frame 13 and 15, are called as E-bits which are used to
indicate a negative comparison (that is, data blocks with bits errors) back from the far end
to the transmitter. If the E-bit in frame 13 is 0 then there is an error in sub-multiframe
(SMF)Ⅰ. The E-bit in frame 15 indicates error status from sub-multiframe Ⅱ in the same
way.
Each sub-multiframe in the CRC multiframe consists of eight standard PCM frames, and is
1 ms (8 x 125 µs) long. That means there are one thousand CRC-4 error checks made
every second. CRC-4 error checking is very reliable, because at least 94%of errored
blocks are detected.
Another powerful feature CRC-4 framing provides is the local indication of alarms and
errors detected at the remote end. When an errored SMF is detected, E-bits are changed
from 1 to 0 in the return path multiframe. The local end, therefore, has exactly the same
block error information as the far-end CRC-4 checker. Counting E-bit changes is
equivalent to counting CRC- block errors. Consequently, the local end can monitor the
performance of both go and return path. This can be carried out by the network equipment
itself, or by suitable test equipment, monitoring the received 2 Mb/s stream.
In the same way, the A-bits return error alarm signals for loss of frame, loss of
synchronization, or loss of signal from the remote end. The CRC-4 frame structure is
preferred format because of its error detection capability and immunity to false frame
alignment (refer to ITU-T G.706). For systems without CRC framing, in-service testing is
limited to checking for errors in the frame alignment word, which provides a poor indication
of errors in the payload.
72-0096-20 77
E1 BER Tester Appendix B: Glossary
Appendix B: Glossary
Glossary of terms and mnemonics used in this manual:
AIS Alarm Indication Signal
AMI Alternate Mark Inversion
BBE Background Block Error
CAS Channel Associated Signalling
CCS Common Channel Signalling
CODE Line Code
CRC Cyclical Redundancy Check used in 2Mbit/s data frames
DM Degraded Minutes
EB Errored Block
EFS Error Free Seconds
ERR Error
ES Errored Seconds
FAS Frame Alignment Signal (timeslot 0 of alternate 2Mbit/s frames)
G.821 ITU-T Rec. that specifies performance criteria for ISDN circuits
HDB3 High Density Bipolar 3
MF Multiframe
MFAS Bits 1 to 4 (0000) in frame 0 of CAS Multiframe
MF0TS16 TS16 data in frame 0 of CAS Multiframe
NFAS Not Frame Alignment Signal (timeslot 0 of intervening 2Mbit/s frames)
NMFAS Bits 5 to 8 (XYXX) in frame 0 of CAS Multiframe
PCM Pulse Code Modulation
REBE Remote End Block Errors
USB EIA interface specification equivalent to a combination of V.24 and V.28
Rx, RX Receiver or Received
SES Severely Errored Seconds
SMF CRC Sub-Multiframe, including 8 frames
Tx, TX Transmitter or Transmitted
UNAVA Unavailability
72-0096-20 78

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XG2128 E1 BER Tester

Shenzhen Xiaguang XP Co., Ltd.

1.1 Symbol descriptions

1.2 Product overview

1.3 Ordering information

1.4 Product compositions

1.5 Functional keyboard

1.6 LED indicators

1.7 LCD icon indications

1.1 Symbol Descriptions

“Caution” symbol denotes attention to the operation of the

“Note” symbol denotes some help information to the operation of

“Warning” symbol denotes a hazard. It calls attention to a

1.2 Product Overview

The E1 BER Tester mainly provides the following functions:

• HDB3 and AMI line codes

• 75Ω (Unbalanced), 120Ω (Balanced) and high impedance>2kΩ（option）

• Out-of-service framed/unframed testing (“TX/RX” mode):

9 2Mb/s, N×64kb/s BER testing

9 Clock slips measurement

• In-service framed/unframed testing (“RX HI-Z” and “Through” mode) （option）:

9 Rx Hi-Z and through mode testing

9 Bit, Code, FAS, CRC-4 and E-BIT BER testing

9 FAS/NFAS, MFAS/NMFAS, timeslot activity monitoring and display

9 Timeslot monitoring, 8-bit data monitoring in any selected timeslot

9 CAS and CCS signalling monitoring

• Tx clock: Internal, Interface

• Level, Frequency and Offset measurements

• Real-time transmit circuit open/short indication

• BERT pattern: PRBS, Fixed Code and 16-BIT User Word

• Error injection: Single and Fixed Rate

• Auto, Manual and Timer testing

• Results named and saved automatically after testing

• Self-check, keyboard and LED testing

• Historical alarm indication

• Extensive beep and LED alarm indications

• ITU-T G.821, G.826 and M.2100 performance analysis

• Histograms analysis of error and alarm events

• Upgradeable software via an USB interface

• Up to 99 days continuance test performance

• More than 6 hours measurement operation from a single battery charge

• Save/Recall of up to 7 user-defined setups and 10 results, Power outage function

• Test results could be uploaded, filed, conserved and printed by TestManagerPro on

1.3 Ordering Information

 Standard configuration list of the E1 BER Tester:

Item Qty Item Qty

E1 120Ω Balanced Test Cable 1 Waterproof Package 1

USB Communication Cable 1 Quality Certificate Card 1

Table 1: Standard configuration list

1.4 Product Compositions

• Hardware: Main board and Display board.

• Software: the Embedded software, surveillance and management PC software

LED Alarm USB port

Fig 1: Appearance of E1 BER Tester

1.5 Functional Keyboard

These functional keys are described as in Table 2.

` F1 F2 F3 F4 Softkeys：”F1”, “F2”, “F3”, “F4”

“Setting”, “Result”, “PgUp”, “Cursor

SINGLE START “Single Error Add”, “Start/ Stop”,

Fig 2: Functional keyboard

Standard configuration list of the E1 BER Tester: