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OPTIKA
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Inspection & Industrial

M I C R O S C O P E S
I T A L Y

MET SERIES

Metallurgical Microscopes
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Metallurgical Microscopy
Metallography is the study of the physical structure and components of metals, by using microscopy.
Inspection & Industrial

Many different microscopy techniques are used in metallographic analysis.

Prepared specimens should be examined with the unaided eye after etching to detect any visible areas that have responded to the etchant
differently from the norm as a guide to where microscopical examination should be employed. Light optical microscopy (LOM) examination
should always be performed prior to any electron metallographic (EM) technique, as these are more time-consuming to perform and the
instruments are much more expensive.

Further, certain features can be best observed with the LOM, e.g., the natural color of a constituent can be seen with the LOM but not with EM
systems. Also, image contrast of microstructures at relatively low magnifications, e.g., <500X, is far better with the LOM than with the scanning
electron microscope (SEM), while transmission electron microscopes (TEM) generally cannot be utilized at magnifications below about 2000
to 3000X. LOM examination is fast and can cover a large area. Thus, the analysis can determine if the more expensive, more time-consuming
examination techniques using the SEM or the TEM are required and where on the specimen the work should be concentrated.

Brightfield and darkfield microscopy

Most LOM observations are conducted using bright-field (BF) illumination, where the image of any flat feature perpendicular to the incident
light path is bright, or appears to be white. But, other illumination methods can be used and, in some cases, may provide superior images
with greater detail. Dark-field microscopy (DF), is an alternative method of observation that provides high-contrast images and actually greater
resolution than bright-field. In dark-field illumination, the light from features perpendicular to the optical axis is blocked and appears dark while
the light from features inclined to the surface, which look dark in BF, appear bright, or “self-luminous” in DF. Grain boundaries, for example, are
more vivid in DF than BF.

Polarized light microscopy

Polarized light (PL) is very useful when studying the structure of metals with non-cubic crystal structures (mainly metals with hexagonal
close-packed (hcp) crystal structures). If the specimen is prepared with minimal damage to the surface, the structure can be seen vividly in
cross-polarized light (the optic axis of the polarizer and analyzer are 90 degrees to each other, i.e., crossed). In some cases, an hcp metal
can be chemically etched and then examined more effectively with PL. Tint etched surfaces, where a thin film (such as a sulfide, molybdate,
chromate or elemental selenium film) is grown epitaxially on the surface to a depth where interference effects are created when examined with
BF producing color images, can be improved with PL. If it is difficult to get a good interference film with good coloration, the colors can be
improved by examination in PL using a sensitive tint (ST) filter.

Differential interference contrast microscopy

Another useful imaging mode is differential interference contrast (DIC), which is usually obtained with a system designed by the Polish physicist
Georges Nomarski. This system gives the best detail. DIC converts minor height differences on the plane-of-polish, invisible in BF, into visible
detail. The detail in some cases can be quite striking and very useful. If an ST filter is used along with a Wollaston prism, color is introduced.
The colors are controlled by the adjustment of the Wollaston prism, and have no specific physical meaning, per se. But, visibility may be better.

Oblique illumination
DIC has largely replaced the older oblique illumination (OI) technique,
which was available on reflected light microscopes prior to about 1975.
In OI, the vertical illuminator is offset from perpendicular, producing
shading effects that reveal height differences. This procedure reduces
resolution and yields uneven illumination across the field of view.
Nevertheless, OI was useful when people needed to know if a second
phase particle was standing above or was recessed below the plane-
of-polish, and is still available on a few microscopes. OI can be created
on any microscope by placing a piece of paper under one corner of
the mount so that the plane-of-polish is no longer perpendicular to the
optical axis.

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B-383MET - Metallurgical Microscope 3

Brightfield upright microscope with IOS W-PLAN MET objectives and metallurgical attachment combining the exclusive X-LED3 lighting source both for incident

Inspection & Industrial

and transmitted illumination. The NCG (no cover glass) objectives are especially designed for microscopy use without a cover slip ideal for metallographic
samples and other opaque specimens.

20

X-LED3
5x

IOS
∞
W-PLAN

MET
10x
POL
AB020

20x

50x

Part Description Part Description

Observation mode: Brightfield, incident polarized light. Objectives IOS W-PLAN MET 5x/0.12 IOS W-PLAN MET 10x/0.25
Epi-illumination and X-LED3 with white 3.6 W LED (6.300 K) with brightness (strain-free): IOS W-PLAN MET 20x/0.40 IOS W-PLAN MET 50x/0.75
polarizing filters: control. Field and aperture diaphragms, polarizer & All with anti-fungus treatment.
analyzer filters. Specimen stage: Double layer rackless mechanical stage, 233x147 mm,
Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating. 78x54 mm X-Y range. With tempered glass plate.
Interpupillary Adjustable between 48 and 75 mm. Focusing: Coaxial coarse (adjustable tension) and fine focusing
distance: mechanism with limit stop to prevent the contact
between objective and specimen.
Dioptric adjustment: On the left eyepiece tube.
Condenser: Abbe N.A. 1.25, with objective-coded iris diaphragm,
Eyepieces: WF10x/20 mm, high eye-point and secured by screw. focusable and centerable.
Nosepiece: Quintuple revolving nosepiece, rotation on ball Transmitted illumination X-LED3 with white 3.6 W LED (6.300 K) with brightness
bearings. (Fixed Koehler type): control. Multi-plug 100-240Vac/6Vdc external power supply.

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B-510MET - Metallurgical Microscope
Advanced routine laboratory microscope with IOS W-PLAN MET objectives and metallurgical attachment with the exclusive X-LED3 lighting source for incident
Inspection & Industrial

illumination only. The NCG (no cover glass) objectives are especially designed for microscopy use without a cover slip ideal for metallographic samples and other
opaque specimens.

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X-LED8

IOS
∞
W-PLAN

MET

POL
AB020

Part Description Part Description

Observation mode: Brightfield, simple polarized light, oblique illumination Objectives IOS W-PLAN MET 5x/0.12
on incident light. (strain-free): IOS W-PLAN MET 10x/0.25
Epi-illumination and X-LED8 with white 8 W LED (6.300 K) with brightness IOS W-PLAN MET 20x/0.40
polarizing filters: control. With aperture and field diaphragms, and IOS W-PLAN MET 50x/0.75
oblique illumination system. With polarizer and analyzer. All with anti-fungus treatment.
Multi-plug 100-240Vac/6Vdc external power supply. Specimen stage: Double layer rackless mechanical stage, 233x147 mm,
Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating. 78x54 mm X-Y range.
Interpupillary distance: Adjustable between 50 and 75 mm. Focusing: Coaxial coarse (adjustable tension) and fine focusing
Dioptric adjustment: On the left eyepiece tube. mechanism with limit stop to prevent the contact
between objective and specimen.
Eyepieces: WF10x/22 mm, high eye-point and with rubber cups.
Nosepiece: Quintuple revolving nosepiece, rotation on ball bearings.

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B-510METR - Metallurgical Microscope 3

Advanced routine laboratory microscope with IOS W-PLAN MET objectives and metallurgical attachment with the exclusive X-LED3 lighting source for both

Inspection & Industrial

transmitted and incident illumination. The NCG (no cover glass) objectives are especially designed for microscopy use without a cover slip ideal for metallographic
samples and other opaque specimens.

22

X-LED3

X-LED8

IOS
∞
W-PLAN

MET

POL
AB020

Part Description Part Description

Observation mode: Brightfield on transmitted light. Objectives IOS W-PLAN MET 5x/0.12
Brightfield, simple polarized light, oblique illumination (strain-free): IOS W-PLAN MET 10x/0.25
on incident light. IOS W-PLAN MET 20x/0.40
IOS W-PLAN MET 50x/0.75
Epi-illumination and X-LED8 with white 8 W LED (6.300 K) with brightness All with anti-fungus treatment.
polarizing filters: control. With aperture and field diaphragms, and
oblique illumination system. With polarizer and analyzer. Specimen stage: Double layer rackless mechanical stage, 233x147 mm,
78x54 mm X-Y range. With tempered glass plate.
Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating.
Focusing: Coaxial coarse (adjustable tension) and fine focusing
Interpupillary distance: Adjustable between 50 and 75 mm. mechanism with limit stop to prevent the contact
Dioptric adjustment: On the left eyepiece tube. between objective and specimen.
Eyepieces: WF10x/22 mm, high eye-point and with rubber cups. Condenser: Swing-out N.A. 0.2/0.9, with iris diaphragm, focusable and centerable.
Nosepiece: Quintuple revolving nosepiece, rotation on ball Transmitted illumination X-LED3 with white 3.6 W LED (6.300 K) with brightness
bearings. (Full Koehler type): control. Multi-plug 100-240Vac/6Vdc external power supply.

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B-1000METBF - Brightfield Metallurgical Microscope
The modular OPTIKA B-1000METBF offers superior quality brightfield incident light, helping you working in a comfortable way during extended periods
Inspection & Industrial

of use and performing reliable, accurate and rapid diagnosis benefiting from modularity, which gives the chance to create customized configurations tailored
on customer needs. Versatile, robust, durable and sturdy, B-1000 offers premium quality optics, the state-of-the-art, exclusive X-LED8 (8 W) transmitted
illumination (Koehler system). The incident light relies on an incredibly bright 18 W LED illumination, designed by OPTIKA.
B-1000 gives multiple options as manual or motorized configuration.

22

X-LED8

IOS
∞
W-PLAN

U-PLAN

MET

POL
AB030

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B-1000METBF - Configuration Chart 3

Build the microscope that suites your needs by choosing among the components

Inspection & Industrial

M-781 M-1001 M-1003
PL10x/22 eyepiece, high eyepoint, PL10x/22 eyepieces (pair), PL15x/16 eyepieces (pair),
with micrometric scale (10mm/100um) high eyepoint, with rubber cup high eyepoint
& rubber cup (retractable) (retractable)

M-1011 M-1012
Trinocular head, three positions Binocular ERGO head
(100/0, 50/50, 0/100)

M-1039
Metallurgical attachment, 18 W LED

M-1021M M-1021M+M-1156*+M-1149 M-1022M M-1022M+M-1156*+M-1149

Main body with focus system Main body with motorized focus system Main body with focus system, Main body with motorized focus
and X-LED8 illumination, and X-LED8 illumination, for metallurgical model with system, for metallurgical model with
for metallurgical model for metallurgical model incident light only incident light only

M-1042 M-1043+M-1156*
Sextuple reversed nosepiece, Sextuple motorized reversed nosepiece,
for RMS objectives with DIC slot for RMS objectives with DIC slot

IOS LWD W-PLAN MET IOS LWD U-PLAN MET IOS LWD U-PLAN F MET

LWD LWD M-1100 5x LWD M-1171 5x

W-PLAN U-PLAN M-1101 10x U-PLAN F M-1172 10x
MET M-1099 2.5x MET M-1102 20x MET M-1173 20x
∞ ∞
∞ M-1103 50x M-1174 50x
M-1104 100x M-1175 100x

M-1148 M-1147+M-1156*
Mechanical stage with glass, Motorized mechanical stage
for metallurgical model

M-1154
0.70 N.A. swing-out MET condenser

* Code M-1156 must be added only once for any motorized configuration

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B-1000METDK - Darkfield Metallurgical Microscope
The modular OPTIKA B-1000METDK offers superior quality brightfield and darkfield incident light, helping you working in a comfortable way during
Inspection & Industrial

extended periods of use and performing reliable, accurate and rapid diagnosis benefiting from modularity, which gives the chance to create customized
configurations tailored on customer needs. Versatile, robust, durable and sturdy, B-1000 offers premium quality optics, the state-of-the-art, exclusive X-LED8
(8 W) transmitted illumination (Koehler system). The incident light relies on an incredibly bright 18 W LED illumination, designed by OPTIKA.
B-1000 gives multiple options as manual or motorized configuration.

22

X-LED8

IOS
∞
W-PLAN

U-PLAN

MET

POL

DF
AB030

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B-1000METDK - Configuration Chart 3

Build the microscope that suites your needs by choosing among the components

Inspection & Industrial

M-781 M-1001 M-1003
PL10x/22 eyepiece, high eyepoint, PL10x/22 eyepieces (pair), PL15x/16 eyepieces (pair),
with micrometric scale (10mm/100um) high eyepoint, with rubber cup high eyepoint
& rubber cup (retractable) (retractable)

M-1011 M-1012
Trinocular head, three positions Binocular ERGO head
(100/0, 50/50, 0/100)

M-1039MD
Metallurgical attachment 18 W LED
(Built-in MET nosepiece with 6-positions)

M-1021MD M-1021MD+M-1156*+M-1149 M-1022MD M-1022MD+M-1156*+M-1149

Main body with focus system Main body with motorized focus system Main body with focus system Main body with motorized focus system
and X-LED8 illumination, for and X-LED8 illumination, for (incident light only), for (incident light only), for
brightfield/darkfield metallurgical B-1000 brightfield/darkfield metallurgical B-1000 brightfield/darkfield metallurgical B-1000 brightfield/darkfield metallurgical B-1000

IOS LWD W-PLAN MET IOS LWD U-PLAN MET IOS LWD U-PLAN F MET IOS LWD U-PLAN MET BD IOS LWD U-PLAN F MET BD

LWD LWD M-1100 5x LWD M-1171 5x LWD M-1094 5x LWD M-1180 5x

W-PLAN U-PLAN M-1101 10x U-PLAN F M-1172 10x U-PLAN M-1095 10x U-PLAN F M-1181 10x
MET M-1099 2.5x MET M-1102 20x MET M-1173 20x MET BD M-1096 20x MET BD M-1182 20x
∞ ∞ ∞ ∞
∞ M-1103 50x M-1174 50x M-1097 50x M-1183 50x
M-1104 100x M-1175 100x M-1098 100x M-1184 100x

M-1148 M-1147+M-1156*
Mechanical stage with glass, Motorized mechanical stage
for metallurgical model

M-1154
0.70 N.A. swing-out MET condenser

* Code M-1156 must be added only once for any motorized configuration

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IM-3MET- Metallurgical Microscope
Routine inverted microscope with IOS LWD U-PLAN MET objectives for material science and metallographic applications, combining a sturdy yet compact structure
Inspection & Industrial

with dedicated components required in this field, like the NCG (no cover glass) objectives working without cover slide ideal for metallographic samples and other
opaque specimens. A particularly simple and ingenious optical design allows stable alignments and smooth and accurate movements.

22

IOS
∞
U-PLAN

MET

POL
AB030

CAST IRON
BRIGHTFIELD

CAST IRON
POLARIZED LIGHT

Part Description Part Description

Observation mode: Brightfield, simple polarized light on incident light. Objectives: IOS LWD U-PLAN MET 5x/0.15
Epi-illumination and Halogen 12 V/50 W with brightness control. IOS LWD U-PLAN MET 10x/0.30
polarizing filters: With aperture and field (centrable) diaphragms. IOS LWD U-PLAN MET 20x/0.45
With polarizer and analyzer. IOS LWD U-PLAN MET 50x/0.55
All with anti-fungus treatment.
Head: Trinocular (2-position 100/0, 50/50), 45° inclined. Specimen stage: Fixed stage, 250x160 mm, with metal stage insert.
Interpupillary Adjustable between 50 and 75 mm.
Focusing: Coaxial coarse (adjustable tension) and fine focusing
distance:
mechanism with limit stop to prevent the contact
Dioptric adjustment: On the left eyepiece tube. between objective and specimen.
Eyepieces: WF10x/22 mm, high eye-point and with rubber cups.
Nosepiece: Quintuple revolving nosepiece, rotation on ball bearings.

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IM-3METLD- Metallurgical Microscope 3

LED routine inverted microscope with IOS LWD U-PLAN MET objectives for material science and metallographic applications, combining a sturdy yet compact

Inspection & Industrial

structure with dedicated components required in this field, like the NCG (no cover glass) objectives working without cover slide ideal for metallographic samples and
other opaque specimens. A particularly simple and ingenious optical design allows stable alignments and smooth and accurate movements.
This model is equipped with an 18W LED lighting system.

22

IOS
∞
U-PLAN

MET

POL
X-LED8 AB030

CAST IRON
BRIGHTFIELD

CAST IRON
POLARIZED LIGHT

Part Description Part Description

Observation mode: Brightfield, simple polarized light on incident light. Objectives: IOS LWD U-PLAN MET 5x/0.15
Epi-illumination and LED 18 W with brightness control. IOS LWD U-PLAN MET 10x/0.30
polarizing filters: With aperture and field (centrable) diaphragms. IOS LWD U-PLAN MET 20x/0.45
With polarizer and analyzer. IOS LWD U-PLAN MET 50x/0.55
All with anti-fungus treatment.
Head: Trinocular (2-position 100/0, 50/50), 45° inclined. Specimen stage: Fixed stage, 250x160 mm, with metal stage insert.
Interpupillary Adjustable between 50 and 75 mm.
Focusing: Coaxial coarse (adjustable tension) and fine focusing
distance:
mechanism with limit stop to prevent the contact
Dioptric adjustment: On the left eyepiece tube. between objective and specimen.
Eyepieces: WF10x/22 mm, high eye-point and with rubber cups.
Nosepiece: Quintuple revolving nosepiece, rotation on ball bearings.

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IM-5MET - Metallurgical Microscope
Industrial and materials science inverted microscope especially designed for opaque specimens (including metals microstructure
Inspection & Industrial

investigation and studies such as grain size, grain boundaries, phases, transformation, inclusions, and non-metals, as well as
sample preparation and treatment) in metallography labs. Freely configurable lenses according to customer’s preferences ,
FN 24 high eyepoint, infinity corrected optical system, coaxial focusing, mechanical stage, and epi-illumination attachment
powered by halogen 12 V/100 W with brightness control. Sturdy and incredibly reliable, it is equipped with all the main controls
in ergonomic position and with long lasting, efficient LED illumination to provide over 20 years of use.

24

IOS
∞
U-PLAN

MET

POL WAFER, POLARIZED

LIGHT
DF WAFER, DIC

DIC
AB030

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 IM-5MET - Specifications 3

Inspection & Industrial

Part Description
Head: Trinocular (split ratio: 100/0, 50/50), 45° inclined.
Dioptric adjustment: Both eyepieces.
Eyepieces: WF10x/24 mm, high eyepoint, secured by screw and with retractable rubber cups.
Epi-illumination & filters: Halogen 12 V/100 W with brightness control. With field and aperture diaphragms, polarizer and analyzer filters.
Nosepiece: Quintuple ball bearings revolving nosepiece, reversed.
Objectives: Selectable according to customer’s preferences. All with anti-fungus treatment.
Specimen stage: Mechanical stage, 240x250 mm.
Focusing: Coaxial coarse and fine focusing mechanism with limit stop to prevent the contact between objective and specimen.
Adjustable tension of coarse focusing knob.

IM-5MET is freely configurable in terms of objectives, by choosing among: Included n Optional ¨

MET Infinity-corrected Plan-Achromatic, Long Working Distance MET Infinity-corrected Semi-Apochromatic, Long Working Distance
objectives, field flatness up to F.N. 25: objectives, field flatness up to F.N. 25:

M-1100 IOS LWD U-PLAN MET objective 5x/0.15 ¨ M-1171 IOS LWD U-PLAN F MET objective 5x/0.15 ¨
M-1101 IOS LWD U-PLAN MET objective 10x/0.30 ¨ M-1172 IOS LWD U-PLAN F MET objective 10x/0.30 ¨
M-1102 IOS LWD U-PLAN MET objective 20x/0.45 ¨ M-1173 IOS LWD U-PLAN F MET objective 20x/0.50 ¨
M-1103 IOS LWD U-PLAN MET objective 50x/0.55 ¨ M-1174 IOS LWD U-PLAN F MET objective 50x/0.80 ¨
M-1104 IOS LWD U-PLAN MET objective 100x/0.80 (dry) ¨ M-1175 IOS LWD U-PLAN F MET objective 100x/0.90 (dry) ¨

MET Infinity-corrected Plan-Achromatic, Long Working Distance MET Infinity-corrected Semi-Apochromatic, Long Working Distance
objectives, for brightfield and darkfield, field flatness up to F.N. 25: objectives, for brightfield and darkfield, field flatness up to F.N. 25:

M-1094 IOS LWD U-PLAN MET BD objective 5x/0.15 ¨ M-1180 IOS LWD U-PLAN F MET BD objective 5x/0.15 ¨
M-1095 IOS LWD U-PLAN MET BD objective 10x/0.30 ¨ M-1181 IOS LWD U-PLAN F MET BD objective 10x/0.30 ¨
M-1096 IOS LWD U-PLAN MET BD objective 20x/0.45 ¨ M-1182 IOS LWD U-PLAN F MET BD objective 20x/0.50 ¨
M-1097 IOS LWD U-PLAN MET BD objective 50x/0.55 ¨ M-1183 IOS LWD U-PLAN F MET BD objective 50x/0.80 ¨
M-1098 IOS LWD U-PLAN MET BD objective 100x/0.80 (dry) ¨ M-1184 IOS LWD U-PLAN F MET BD objective 100x/0.90 (dry) ¨

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Inspection & Industrial

v 6.8.0 - OPTIKA reserves the right to make corrections, modifications, enhancements, improvements and other changes to its products at any time without notice.

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