Fdp050an06a0 241446
Fdp050an06a0 241446
Fdp050an06a0 241446
October 2013
FDP050AN06A0 / FDB050AN06A0
N-Channel PowerTrench® MOSFET
60 V, 80 A, 5 mΩ
Features Applications
• RDS(on) = 4.3 mΩ ( Typ.) @ VGS = 10 V, ID = 80 A • Synchronous Rectification for ATX / Server / Telecom PSU
• QG(tot) = 61 nC ( Typ.) @ VGS = 10 V • Battery Protection Circuit
• Low Miller Charge • Motor drives and Uninterruptible Power Supplies
• Low Qrr Body Diode
• UIS Capability (Single Pulse and Repetitive Pulse)
G
GD G
S TO-220 S D2-PAK
Thermal Characteristics
RθJC oC/W
Thermal Resistance Junction to Case, Max. TO-220, D2-PAK 0.61
62 o
RθJA Thermal Resistance Junction to Ambient, Max. TO-220, D2-PAK (Note 2) C/W
o
RθJA Thermal Resistance Junction to Ambient D2-PAK, Max. 1in2 copper pad area 43 C/W
Off Characteristics
B VDSS Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 60 - - V
V DS = 50V - - 1
IDSS Zero Gate Voltage Drain Current µA
VGS = 0V TC = 150oC - - 250
IGSS Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
VGS(TH) Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 2 - 4 V
ID = 80A, VGS = 10V - 0.0043 0.005
ID = 40A, VGS = 6V - 0.007 0.011
rDS(ON) Drain to Source On Resistance Ω
ID = 80A, VGS = 10V,
- 0.0085 0.010
TJ = 175oC
Dynamic Characteristics
CISS Input Capacitance - 3900 - pF
V DS = 25V, VGS = 0V,
COSS Output Capacitance - 750 - pF
f = 1MHz
CRSS Reverse Transfer Capacitance - 270 - pF
Qg(TOT) Total Gate Charge at 10V VGS = 0V to 10V 61 80 nC
Qg(TH) Threshold Gate Charge VGS = 0V to 2V VDD = 30V - 8 11 nC
Qgs Gate to Source Gate Charge ID = 80A - 24 - nC
Qgs2 Gate Charge Threshold to Plateau Ig = 1.0mA - 16 - nC
Qgd Gate to Drain “Miller” Charge - 15 - nC
0.6 80
0.4
40
0.2
0 0
0 25 50 75 100 125 150 175 25 50 75 100 125 150 175
2
DUTY CYCLE - DESCENDING ORDER
1 0.5
0.2
0.1
0.05
THERMAL IMPEDANCE
ZθJC, NORMALIZED
0.02
0.01
PDM
0.1
t1
t2
NOTES:
DUTY FACTOR: D = t1/t2
SINGLE PULSE PEAK TJ = PDM x ZθJC x RθJC + TC
0.01
10-5 10-4 10-3 10-2 10-1 100 101
t , RECTANGULAR PULSE DURATION (s)
2000
TC = 25oC
FOR TEMPERATURES
1000 ABOVE 25oC DERATE PEAK
IDM, PEAK CURRENT (A)
CURRENT AS FOLLOWS:
I = I25 175 - TC
VGS = 10V
150
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
100
50
10-5 10-4 10-3 10-2 10-1 100 101
t, PULSE WIDTH (s)
1ms
OPERATION IN THIS STARTING TJ = 25oC
AREA MAY BE 10ms
10
LIMITED BY rDS(ON)
10
DC
1
SINGLE PULSE STARTING TJ = 150 oC
TJ = MAX RATED
TC = 25oC
0.1 1
1 10 100 0.01 0.1 1 10 100
VDS, DRAIN TO SOURCE VOLTAGE (V) tAV, TIME IN AVALANCHE (ms)
Figure 5. Forward Bias Safe Operating Area NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
160 160
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX VGS = 7V
VDD = 15V VGS = 10V VGS = 6V
120 120
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
80 80
TJ = 175oC
TJ = 25o C VGS = 5V
40 40
TC = 25oC
TJ = -55oC PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0 0
0 0.5 1.0 1.5
4.0 4.5 5.0 5.5 6.0
VGS , GATE TO SOURCE VOLTAGE (V) VDS , DRAIN TO SOURCE VOLTAGE (V)
8 2.0
PULSE DURATION = 80µs
DRAIN TO SOURCE ON RESISTANCE(mΩ)
7
ON RESISTANCE
1.5
1.0
5
VGS = 10V
Figure 9. Drain to Source On Resistance vs Drain Figure 10. Normalized Drain to Source On
Current Resistance vs Junction Temperature
BREAKDOWN VOLTAGE
NORMALIZED GATE
1.0 1.05
0.8 1.00
0.6 0.95
0.4
0.90
-80 -40 0 40 80 120 160 200
-80 -40 0 40 80 120 160 200
TJ, JUNCTION TEMPERATURE (oC) TJ , JUNCTION TEMPERATURE (oC)
Figure 11. Normalized Gate Threshold Voltage vs Figure 12. Normalized Drain to Source
Junction Temperature Breakdown Voltage vs Junction Temperature
10000 10
VDD = 30V
CISS = CGS + CGD
VGS , GATE TO SOURCE VOLTAGE (V)
8
C, CAPACITANCE (pF)
1000
CRSS = CGD
4
WAVEFORMS IN
2 DESCENDING ORDER:
ID = 80A
VGS = 0V, f = 1MHz ID = 18A
100 0
0.1 1 10 60 0 10 20 30 40 50 60 70
VDS , DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC)
Figure 13. Capacitance vs Drain to Source Figure 14. Gate Charge Waveforms for Constant
Voltage Gate Current
VDS
BVDSS
L tP
VDS
tP
0V IAS
0.01Ω 0
tAV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
VDS
VDD Qg(TOT)
L VDS
VGS
VGS = 10V
VGS +
VDD Qgs2
-
DUT
VGS = 2V
Ig(REF)
0
Qg(TH)
Qgs Qgd
Ig(REF)
0
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
td(ON) td(OFF)
RL tr tf
VDS
90% 90%
+
VGS
VDD
10% 10%
- 0
DUT 90%
RGS
VGS 50% 50%
PULSE WIDTH
VGS 10%
0
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
RθJA (o C/W)
Equation 1 mathematically represents the relationship and
serves as the basis for establishing the rating of the part.
(T –T )
JM A (EQ. 1) 40
P D M = -----------------------------
R θ JA
R
19.84
= 26.51 + -------------------------------------
θ JA (EQ. 2)
( 0.262 + Area )
Area in Inches Squared
R
128
= 26.51 + ----------------------------------
θ JA (EQ. 3)
( 1.69 + Area )
Area in Centimeters Squared
Vbat 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*250),10))}
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank
Wheatley.
50 DBREAK
dp.dbody n7 n5 = model=dbodymod -
6 RDRAIN
dp.dbreak n5 n11 = model=dbreakmod ESG 11
8 DBODY
dp.dplcap n10 n5 = model=dplcapmod + EVTHRES 16
+ 19 - 21
LGATE EVTEMP MWEAK
spe.ebreak n11 n7 n17 n18 = 64.8 8
GATE RGATE + 18 - 6
spe.eds n14 n8 n5 n8 = 1 1 MMED EBREAK
9 22 +
spe.egs n13 n8 n6 n8 = 1 20
MSTRO
RLGATE 17
spe.esg n6 n10 n6 n8 = 1 18 LSOURCE
spe.evthres n6 n21 n19 n8 = 1 CIN - SOURCE
8 7
spe.evtemp n20 n6 n18 n22 = 1 3
RSOURCE
RLSOURCE
i.it n8 n17 = 1
S1A S2A
12 RBREAK
13 14 15
l.lgate n1 n9 = 4.7e-9 17 18
8 13
l.ldrain n2 n5 = 1.0e-9
l.lsource n3 n7 = 4.03e-9 S1B S2B RVTEMP
13 CB 19
CA
14 IT -
res.rlgate n1 n9 = 47 + +
res.rldrain n2 n5 = 10 6 5 VBAT
EGS 8 EDS 8 +
res.rlsource n3 n7 = 40
- - 8
22
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u RVTHRES
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u
m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
FDB050AN06A0T
CTHERM1 TH 6 5e-3
CTHERM2 6 5 1.3e-2
CTHERM3 5 4 1.4e-2 RTHERM1 CTHERM1
CTHERM4 4 3 1.9e-2
CTHERM5 3 2 4.7e-2
CTHERM6 2 TL 9e-2
6
RTHERM1 TH 6 1e-2
RTHERM2 6 5 3.1e-2
RTHERM3 5 4 4.5e-2
RTHERM2 CTHERM2
RTHERM4 4 3 1.2e-1
RTHERM5 3 2 1.3e-1
RTHERM6 2 TL 1.52e-1
5
SABER Thermal Model
SABER thermal model FDB050AN06A0T
template thermal_model th tl RTHERM3 CTHERM3
thermal_c th, tl
{
ctherm.ctherm1 th 6 =5e-3
4
ctherm.ctherm2 6 5 =1.3e-2
ctherm.ctherm3 5 4 =1.4e-2
ctherm.ctherm4 4 3 =1.9e-2
ctherm.ctherm5 3 2 =4.7e-2 RTHERM4 CTHERM4
ctherm.ctherm6 2 tl =9e-2
rtherm.rtherm1 th 6 =1e-2
rtherm.rtherm2 6 5 =3.1e-2 3
rtherm.rtherm3 5 4 =4.5e-2
rtherm.rtherm4 4 3 =1.2e-1
rtherm.rtherm5 3 2 =1.3e-1
RTHERM5 CTHERM5
rtherm.rtherm6 2 tl =1.52e-1
}
RTHERM6 CTHERM6
tl CASE
TO-220 3L
TO-263 2L (D2PAK)
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
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FDP050AN06A0