stm32l062 Datasheet

STM32L062K8 STM32L062T8
STM32L062C8
Ultra-low-power 32-bit MCU Arm®-based Cortex®-M0+, 64 KB Flash,
8 KB SRAM, 2 KB EEPROM, USB, ADC, DAC, AES
Datasheet - production data
Features
• Ultra-low-power platform
– 1.65 V to 3.6 V power supply
– -40 to 125 °C temperature range
LQFP32 UFQFPN32 Standard and thin
– 0.27 µA Standby mode (2 wakeup pins) (7x7 mm) (5x5 mm) WLCSP36
UFQFPN48 (2.61x2.88 mm)
– 0.4 µA Stop mode (16 wakeup lines) (7x7 mm)
– 0.8 µA Stop mode + RTC + 8-Kbyte RAM – USART, SPI supported
retention • Development support
– 88 µA/MHz in Run mode – Serial wire debug supported
– 3.5 µs wakeup time (from RAM)
• Rich Analog peripherals
– 5 µs wakeup time (from Flash memory)
– 12-bit ADC 1.14 Msps with 10 channels
• Core: Arm® 32-bit Cortex®-M0+ with MPU (down to 1.65 V)
– From 32 kHz up to 32 MHz max. – 12-bit 1 channel DAC with output buffers
– 0.95 DMIPS/MHz (down to 1.8 V)
• Memories – 2x ultra-low-power comparators (window
– 64-Kbyte Flash memory with ECC mode and wake up capability, down to
– 8-Kbyte RAM 1.65 V)
– 2 Kbytes of data EEPROM with ECC • Up to 14 capacitive sensing channels
supporting touchkey, linear and rotary touch
– 20-byte backup register
sensors
– Sector protection against R/W operation
• 7-channel DMA controller, supporting ADC,
• Up to 29 fast I/Os (25 I/Os 5V tolerant)
SPI, I2C, USART, DAC, Timers, AES
• Reset and supply management
• 8x peripheral communication interfaces
– Ultra-safe, low-power BOR (brownout
– 1x USB 2.0 crystal-less, battery charging
reset) with 5 selectable thresholds
detection and LPM
– Ultra-low-power POR/PDR
– 2x USART (ISO 7816, IrDA), 1x UART (low
– Programmable voltage detector (PVD) power)
• Clock sources – 3x SPI 16 Mbits/s
– 32 kHz oscillator for RTC with calibration – Up to 2x I2C (SMBus/PMBus)
– High speed internal 16 MHz factory-
• 9x timers: 1x 16-bit with up to 4 channels, 2x
trimmed RC (+/- 1%)
16-bit with up to 2 channels, 1x 16-bit ultra-low-
– Internal low-power 37 kHz RC power timer, 1x SysTick, 1x RTC, 1x 16-bit
– Internal multispeed low-power 65 kHz to basic for DAC, and 2x watchdogs
4.2 MHz RC (independent/window)
– Internal self calibration of 48 MHz RC for • CRC calculation unit, 96-bit unique ID
USB
• True RNG and firewall protection
– PLL for CPU clock
• Hardware Encryption Engine AES 128-bit
• Pre-programmed bootloader
• All packages are ECOPACK2
August 2020 DS10183 Rev 11 1/124

This is information on a product in full production. www.st.com
Contents STM32L062x8
Contents
1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.1 Device overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
2.2 Ultra-low-power device continuum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3 Functional overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.1 Low-power modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.2 Interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.3 Arm® Cortex®-M0+ core with MPU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.4 Reset and supply management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.4.1 Power supply schemes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.4.2 Power supply supervisor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.4.3 Voltage regulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.5 Clock management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.6 Low-power real-time clock and backup registers . . . . . . . . . . . . . . . . . . . 25
3.7 General-purpose inputs/outputs (GPIOs) . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.8 Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.9 Boot modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.10 Direct memory access (DMA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
3.11 Analog-to-digital converter (ADC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
3.12 Temperature sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
3.12.1 Internal voltage reference (VREFINT) . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
3.13 Digital-to-analog converter (DAC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
3.14 Ultra-low-power comparators and reference voltage . . . . . . . . . . . . . . . . 29
3.15 System configuration controller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.16 Touch sensing controller (TSC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.17 AES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
3.18 Timers and watchdogs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
3.18.1 General-purpose timers (TIM2, TIM21 and TIM22) . . . . . . . . . . . . . . . . 31
3.18.2 Low-power Timer (LPTIM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
3.18.3 Basic timer (TIM6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
2/124 DS10183 Rev 11

STM32L062x8 Contents
3.18.4 SysTick timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

3.18.5 Independent watchdog (IWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
3.18.6 Window watchdog (WWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
3.19 Communication interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.19.1 I2C bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
3.19.2 Universal synchronous/asynchronous receiver transmitter (USART) . . 34
3.19.3 Low-power universal asynchronous receiver transmitter (LPUART) . . . 34
3.19.4 Serial peripheral interface (SPI)/Inter-integrated sound (I2S) . . . . . . . . 35
3.19.5 Universal serial bus (USB) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
3.20 Clock recovery system (CRS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
3.21 Cyclic redundancy check (CRC) calculation unit . . . . . . . . . . . . . . . . . . . 36
3.22 Serial wire debug port (SW-DP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
4 Pin descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
5 Memory mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
6 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1 Parameter conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.1 Minimum and maximum values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.2 Typical values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.3 Typical curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.4 Loading capacitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.5 Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.6 Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
6.1.7 Current consumption measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
6.2 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
6.3 Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
6.3.1 General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
6.3.2 Embedded reset and power control block characteristics . . . . . . . . . . . 53
6.3.3 Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . 54
6.3.4 Supply current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
6.3.5 Wakeup time from low-power mode . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
6.3.6 External clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
6.3.7 Internal clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
6.3.8 PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
6.3.9 Memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
DS10183 Rev 11 3/124

4
Contents STM32L062x8
6.3.10 EMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73

6.3.11 Electrical sensitivity characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
6.3.12 I/O current injection characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
6.3.13 I/O port characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
6.3.14 NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
6.3.15 12-bit ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
6.3.16 DAC electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
6.3.17 Temperature sensor characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
6.3.18 Comparators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
6.3.19 Timer characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
6.3.20 Communications interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
7 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102

7.1 UFQFPN48 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
7.2 Standard WLCSP36 package information . . . . . . . . . . . . . . . . . . . . . . . 105
7.3 Thin WLCSP36 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
7.4 LQFP32 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
7.5 UFQFPN32 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112
7.6 Thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115
7.6.1 Reference document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
8 Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
4/124 DS10183 Rev 11

STM32L062x8 List of tables
List of tables
Table 1. Ultra-low-power STM32L062x8 device features and peripheral counts . . . . . . . . . . . . . . . 11

Table 2. Functionalities depending on the operating power supply range . . . . . . . . . . . . . . . . . . . . 16
Table 3. CPU frequency range depending on dynamic voltage scaling . . . . . . . . . . . . . . . . . . . . . . 16
Table 4. Functionalities depending on the working mode
(from Run/active down to standby) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Table 5. STM32L062x8 peripherals interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Table 6. Temperature sensor calibration values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Table 7. Internal voltage reference measured values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Table 8. Capacitive sensing GPIOs available on STM32L062x8 devices . . . . . . . . . . . . . . . . . . . . 30
Table 9. Timer feature comparison . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Table 10. Comparison of I2C analog and digital filters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Table 11. STM32L062x8 I2C implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Table 12. USART implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Table 13. SPI/I2S implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Table 14. Legend/abbreviations used in the pinout table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 15. STM32L062x8 pin definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 16. Alternate functions for port A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 17. Alternate functions for port B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 18. Voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Table 19. Current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Table 20. Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Table 21. General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Table 22. Embedded reset and power control block characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 23. Embedded internal reference voltage calibration values . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Table 24. Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Table 25. Current consumption in Run mode, code with data processing running from Flash. . . . . . 56
Table 26. Current consumption in Run mode, code with data processing running from RAM . . . . . . 57
Table 27. Current consumption in Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Table 28. Current consumption in Low-power run mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Table 29. Current consumption in Low-power sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Table 30. Typical and maximum current consumptions in Stop mode . . . . . . . . . . . . . . . . . . . . . . . . 60
Table 31. Typical and maximum current consumptions in Standby mode . . . . . . . . . . . . . . . . . . . . . 61
Table 32. Average current consumption during Wakeup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Table 33. Peripheral current consumption in Run or Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Table 34. Peripheral current consumption in Stop and Standby mode . . . . . . . . . . . . . . . . . . . . . . . 63
Table 35. Low-power mode wakeup timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
Table 36. Low-speed external user clock characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
Table 37. LSE oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Table 38. 16 MHz HSI16 oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
Table 39. HSI48 oscillator characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 40. LSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 41. MSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 42. PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Table 43. RAM and hardware registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 44. Flash memory and data EEPROM characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 45. Flash memory and data EEPROM endurance and retention . . . . . . . . . . . . . . . . . . . . . . . 72
Table 46. EMS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
Table 47. EMI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
DS10183 Rev 11 5/124

6
List of tables STM32L062x8
Table 48. ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

Table 49. Electrical sensitivities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Table 50. I/O current injection susceptibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
Table 51. I/O static characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Table 52. Output voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Table 53. I/O AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Table 54. NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Table 55. ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Table 56. RAIN max for fADC = 16 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Table 57. ADC accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Table 58. DAC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Table 59. Temperature sensor calibration values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
Table 60. Temperature sensor characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
Table 61. Comparator 1 characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
Table 62. Comparator 2 characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
Table 63. TIMx characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
Table 64. I2C analog filter characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
Table 65. SPI characteristics in voltage Range 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
Table 68. USB startup time. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Table 69. USB DC electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Table 70. USB: full speed electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
Table 71. UFQFPN48 - 48 leads, 7x7 mm, 0.5 mm pitch, ultra thin fine pitch quad flat
package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Table 72. Standard WLCSP36 - 2.61 x 2.88 mm, 0.4 mm pitch wafer level chip scale
mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
Table 73. Standard WLCSP36 recommended PCB design rules. . . . . . . . . . . . . . . . . . . . . . . . . . . 106
Table 74. Thin WLCSP36 - 2.61 x 2.88 mm, 0.4 mm pitch wafer level chip scale
Table 75. WLCSP36 recommended PCB design rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109
Table 76. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package mechanical data. . . . . . . . . . . 110
Table 77. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat
Table 78. Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
Table 79. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
6/124 DS10183 Rev 11

STM32L062x8 List of figures
List of figures
Figure 1. STM32L062x8 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Figure 2. Clock tree . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Figure 3. STM32L062x8 UFQFPN48 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 4. STM32L062x8 WLCSP36 ballout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 5. STM32L062x8 LQFP32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 6. STM32L062x8 UFQFPN32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Figure 7. Pin loading conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Figure 8. Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Figure 9. Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Figure 10. Current consumption measurement scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Figure 11. IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from
Flash memory, Range 2, HSE, 1WS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Flash memory, Range 2, HSI16, 1WS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Figure 13. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running
from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Figure 14. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled
and running on LSE Low drive . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Figure 15. IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with RTC disabled,
all clocks OFF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Figure 16. Low-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Figure 17. Typical application with a 32.768 kHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Figure 18. HSI16 minimum and maximum value versus temperature . . . . . . . . . . . . . . . . . . . . . . . . . 68
Figure 19. VIH/VIL versus VDD (CMOS I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Figure 20. VIH/VIL versus VDD (TTL I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Figure 21. I/O AC characteristics definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Figure 22. Recommended NRST pin protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Figure 23. ADC accuracy characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Figure 24. Typical connection diagram using the ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
Figure 25. Power supply and reference decoupling (VREF+ not connected to VDDA). . . . . . . . . . . . . . 86
Figure 26. Power supply and reference decoupling (VREF+ connected to VDDA). . . . . . . . . . . . . . . . . 87
Figure 27. 12-bit buffered/non-buffered DAC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Figure 28. SPI timing diagram - slave mode and CPHA = 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Figure 29. SPI timing diagram - slave mode and CPHA = 1(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Figure 30. SPI timing diagram - master mode(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
Figure 31. USB timings: definition of data signal rise and fall time . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Figure 32. UFQFPN48 - 48 leads, 7x7 mm, 0.5 mm pitch, ultra thin fine pitch quad flat
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
package recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Figure 34. UFQFPN48 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
Figure 35. Standard WLCSP36 - 2.61 x 2.88 mm, 0.4 mm pitch wafer level chip scale
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
Figure 37. Thin WLCSP36 - 2.61 x 2.88 mm, 0.4 mm pitch wafer level chip scale
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
DS10183 Rev 11 7/124

8
List of figures STM32L062x8
package recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

Figure 39. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package outline . . . . . . . . . . . . . . . . . . 109
Figure 40. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat recommended footprint . . . . . . . . . . . . 110
Figure 41. LQFP32 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
Figure 42. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112
recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113
Figure 44. UFQFPN32 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 114
Figure 45. Thermal resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
8/124 DS10183 Rev 11

STM32L062x8 Introduction
1 Introduction
The ultra-low-power STM32L062x8 is offered in 5 different packages. Depending on the

device chosen, different sets of peripherals are included, the description below gives an
overview of the complete range of peripherals proposed in this family.
These features make the ultra-low-power STM32L062x8 microcontroller suitable for a wide
range of applications:
• Gas/water meters and industrial sensors
• Healthcare and fitness equipment
• Remote control and user interface
• PC peripherals, gaming, GPS equipment
• Alarm system, wired and wireless sensors, video intercom
This STM32L062x8 datasheet should be read in conjunction with the STM32L0x2xx
reference manual (RM0376).
For information on the Arm®(a) Cortex®-M0+ core please refer to the Cortex®-M0+ Technical
Reference Manual, available from the www.arm.com website.
Figure 1 shows the general block diagram of the device family.
a. Arm is a registered trademark of Arm Limited (or its subsidiaries) in the US and/or elsewhere.
DS10183 Rev 11 9/124

36
Description STM32L062x8
2 Description
The ultra-low-power STM32L062x8 microcontrollers incorporate the connectivity power of

the universal serial bus (USB 2.0 crystal-less) with the high-performance Arm Cortex-M0+
32-bit RISC core operating at a 32 MHz frequency, a memory protection unit (MPU), high-
speed embedded memories (64 Kbytes of Flash program memory, 2 Kbytes of data
EEPROM and 8 Kbytes of RAM) plus an extensive range of enhanced I/Os and peripherals.
The STM32L062x8 devices provide high power efficiency for a wide range of performance.
It is achieved with a large choice of internal and external clock sources, an internal voltage
adaptation and several low-power modes.
The STM32L062x8 devices offer several analog features, one 12-bit ADC with hardware
oversampling, one DAC, two ultra-low-power comparators, AES, several timers, one low-
power timer (LPTIM), three general-purpose 16-bit timers and one basic timer, one RTC and
one SysTick which can be used as timebases. They also feature two watchdogs, one
watchdog with independent clock and window capability and one window watchdog based
on bus clock.
Moreover, the STM32L062x8 devices embed standard and advanced communication
interfaces: up to two I2Cs, one SPI, two USARTs, a low-power UART (LPUART), and a
crystal-less USB. The devices offer up to 14 capacitive sensing channels to simply add
touch sensing functionality to any application.
The STM32L062x8 also include a real-time clock and a set of backup registers that remain
powered in Standby mode.
The ultra-low-power STM32L062x8 devices operate from a 1.8 to 3.6 V power supply (down
to 1.65 V at power down) with BOR and from a 1.65 to 3.6 V power supply without BOR
option. They are available in the -40 to +125 °C temperature range. A comprehensive set of
power-saving modes allows the design of low-power applications.
10/124 DS10183 Rev 11

STM32L062x8 Description
2.1 Device overview
Table 1. Ultra-low-power STM32L062x8 device features and peripheral counts

Peripheral STM32L062K8 STM32L062T8 STM32L062C8
Flash (Kbytes) 64
Data EEPROM (Kbytes) 2
RAM (Kbytes) 8
AES 1
General-purpose 3
Timers Basic 1
LPTIMER 1
RTC/SYSTICK/IWDG/WWDG 1/1/1/1
SPI/I2S 4(2)(1)/1 4(2)(1)/1
I2C 1 2
Communication
USART 2
interfaces
LPUART 0 1
USB/(VDD_USB) 1/(0)
GPIOs 27(2) 29 37
Clocks: HSE/LSE/HSI/MSI/LSI 1/1/1/1/1 1/1/1/1/1
12-bit synchronized ADC 1

Number of channels 10
12-bit DAC 1
Number of channels 1
Comparators 2
Capacitive sensing channels 14
Max. CPU frequency 32 MHz
1.8 V to 3.6 V (down to 1.65 V at power-down) with BOR option

Operating voltage
1.65 V to 3.6 V without BOR option
Ambient temperature: –40 to +125 °C
Operating temperatures
Junction temperature: –40 to +130 °C
Packages UFQFPN32, LQFP32 WLCSP36 UFQFPN48
1. 2 SPI interfaces are USARTs operating in SPI master mode.

2. LQFP32 has two GPIOs, less than UFQFPN32.
DS10183 Rev 11 11/124

36
Description STM32L062x8
Figure 1. STM32L062x8 block diagram
Temp
SWD SWD sensor
FLASH
EEPROM ADC1 AINx
BOOT
MISO, MOSI,
FIREWALL SPI1 SCK, NSS
CORTEX M0+ CPU
Fmax:32MHz RAM
USART1 RX, TX, RTS,
MPU DBG A CTS, CK
P
DMA1 TIM21 2ch
NVIC B
2
EXTI
TIM22 2ch
BRIDGE
COMP1 INP, INM, OUT
TSC
COMP2 INP, INM, OUT
CRC
IN1, IN2,
BRIDGE LPTIM1 ETR, OUT
PA[0:15] GPIO PORT A RNG

RAM 1K USB 2.0 FS DP, DM, OE,
CRS_SYNC
PB[0:8]
AHB: Fmax 32MHz
GPIO PORT B AES TIM6 DAC1

[10:11] OUT1
SCL, SDA,
WWDG I2C1
SMBA
PC[14:15] GPIO PORT C
I2C2 SCL, SDA

A
P
B RX, TX, RTS,
USART2
1 CTS, CK
HSI 48M CRS

HSI 16M
LSI IWDG
TIM2 4ch
PLL
MSI RTC
BCKP REG
WKUPx RESET & CLK
OSC32_IN, LSE
OSC32_OUT
PVD_IN
VREF_OUT
PMU
NRST
VDDA
VDD REGULATOR
MSv33387V5
12/124 DS10183 Rev 11

STM32L062x8 Description
2.2 Ultra-low-power device continuum

The ultra-low-power family offers a large choice of core and features, from 8-bit proprietary
core up to Arm® Cortex®-M4, including Arm® Cortex®-M3 and Arm® Cortex®-M0+. The
STM32Lx series are the best choice to answer your needs in terms of ultra-low-power
features. The STM32 ultra-low-power series are the best solution for applications such as
gaz/water meter, keyboard/mouse or fitness and healthcare application. Several built-in
features like LCD drivers, dual-bank memory, low-power run mode, operational amplifiers,
128-bit AES, DAC, crystal-less USB and many other definitely help you building a highly
cost optimized application by reducing BOM cost. STMicroelectronics, as a reliable and
long-term manufacturer, ensures as much as possible pin-to-pin compatibility between all
STM8Lx and STM32Lx on one hand, and between all STM32Lx and STM32Fx on the other
hand. Thanks to this unprecedented scalability, your legacy application can be upgraded to
respond to the latest market feature and efficiency requirements.
DS10183 Rev 11 13/124

36
Functional overview STM32L062x8
3 Functional overview
3.1 Low-power modes

The ultra-low-power STM32L062x8 support dynamic voltage scaling to optimize its power
consumption in Run mode. The voltage from the internal low-drop regulator that supplies
the logic can be adjusted according to the system’s maximum operating frequency and the
external voltage supply.
There are three power consumption ranges:
• Range 1 (VDD range limited to 1.71-3.6 V), with the CPU running at up to 32 MHz
• Range 2 (full VDD range), with a maximum CPU frequency of 16 MHz
• Range 3 (full VDD range), with a maximum CPU frequency limited to 4.2 MHz
Seven low-power modes are provided to achieve the best compromise between low-power
consumption, short startup time and available wakeup sources:
• Sleep mode
In Sleep mode, only the CPU is stopped. All peripherals continue to operate and can
wake up the CPU when an interrupt/event occurs. Sleep mode power consumption at
16 MHz is about 1 mA with all peripherals off.
• Low-power run mode
This mode is achieved with the multispeed internal (MSI) RC oscillator set to the low-
speed clock (max 131 kHz), execution from SRAM or Flash memory, and internal
regulator in low-power mode to minimize the regulator's operating current. In Low-
power run mode, the clock frequency and the number of enabled peripherals are both
limited.
• Low-power sleep mode
This mode is achieved by entering Sleep mode with the internal voltage regulator in
low-power mode to minimize the regulator’s operating current. In Low-power sleep
mode, both the clock frequency and the number of enabled peripherals are limited; a
typical example would be to have a timer running at 32 kHz.
When wakeup is triggered by an event or an interrupt, the system reverts to the Run
mode with the regulator on.
Stop mode with RTC
The Stop mode achieves the lowest power consumption while retaining the RAM and
register contents and real time clock. All clocks in the VCORE domain are stopped, the
PLL, MSI RC and HSI RC oscillators are disabled. The LSE or LSI is still running. The
voltage regulator is in the low-power mode.
Some peripherals featuring wakeup capability can enable the HSI RC during Stop
mode to detect their wakeup condition.
The device can be woken up from Stop mode by any of the EXTI line, in 3.5 µs, the
processor can serve the interrupt or resume the code. The EXTI line source can be any
GPIO. It can be the PVD output, the comparator 1 event or comparator 2 event
(if internal reference voltage is on), it can be the RTC alarm/tamper/timestamp/wakeup
events, the USB/USART/I2C/LPUART/LPTIMER wakeup events.
14/124 DS10183 Rev 11

STM32L062x8 Functional overview
• Stop mode without RTC

The Stop mode achieves the lowest power consumption while retaining the RAM and
register contents. All clocks are stopped, the PLL, MSI RC, HSI and LSI RC and LSE
crystal oscillators are disabled.
Some peripherals featuring wakeup capability can enable the HSI RC during Stop
mode to detect their wakeup condition.
The voltage regulator is in the low-power mode. The device can be woken up from Stop
mode by any of the EXTI line, in 3.5 µs, the processor can serve the interrupt or
resume the code. The EXTI line source can be any GPIO. It can be the PVD output, the
comparator 1 event or comparator 2 event (if internal reference voltage is on). It can
also be wakened by the USB/USART/I2C/LPUART/LPTIMER wakeup events.
• Standby mode with RTC
The Standby mode is used to achieve the lowest power consumption and real time
clock. The internal voltage regulator is switched off so that the entire VCORE domain is
powered off. The PLL, MSI RC and HSI RC oscillators are also switched off. The LSE
or LSI is still running. After entering Standby mode, the RAM and register contents are
lost except for registers in the Standby circuitry (wakeup logic, IWDG, RTC, LSI, LSE
Crystal 32 KHz oscillator, RCC_CSR register).
The device exits Standby mode in 60 µs when an external reset (NRST pin), an IWDG
reset, a rising edge on one of the three WKUP pins, RTC alarm (Alarm A or Alarm B),
RTC tamper event, RTC timestamp event or RTC Wakeup event occurs.
• Standby mode without RTC
The Standby mode is used to achieve the lowest power consumption. The internal
voltage regulator is switched off so that the entire VCORE domain is powered off. The
PLL, MSI RC, HSI and LSI RC and LSE crystal oscillators are also switched off. After
entering Standby mode, the RAM and register contents are lost except for registers in
the Standby circuitry (wakeup logic, IWDG, RTC, LSI, LSE Crystal 32 KHz oscillator,
RCC_CSR register).
The device exits Standby mode in 60 µs when an external reset (NRST pin) or a rising
edge on one of the three WKUP pin occurs.
Note: The RTC, the IWDG, and the corresponding clock sources are not stopped automatically by
entering Stop or Standby mode.
DS10183 Rev 11 15/124

36
Table 2. Functionalities depending on the operating power supply range

Functionalities depending on the operating power supply
range
Operating power supply
range(1)
DAC and ADC Dynamic voltage
USB
operation scaling range
ADC only, conversion Range 2 or

VDD = 1.65 to 1.71 V Not functional
time up to 570 ksps range 3
ADC only, conversion Range 1, range 2 or
VDD = 1.71 to 1.8 V(2) Functional
time up to 1.14 Msps range 3
Conversion time up to Range1, range 2 or
VDD = 1.8 to 2.0 V(2) Functional
1.14 Msps range 3
Conversion time up to Range 1, range 2 or
VDD = 2.0 to 2.4 V Functional
1.14 Msps range 3
Conversion time up to Range 1, range 2 or
VDD = 2.4 to 3.6 V Functional
1.14 Msps range 3
1. GPIO speed depends on VDD voltage range. Refer to Table 53: I/O AC characteristics for more information
about I/O speed.
2. CPU frequency changes from initial to final must respect "fcpu initial <4*fcpu final". It must also respect 5
μs delay between two changes. For example to switch from 4.2 MHz to 32 MHz, you can switch from 4.2
MHz to 16 MHz, wait 5 μs, then switch from 16 MHz to 32 MHz.
Table 3. CPU frequency range depending on dynamic voltage scaling
CPU frequency range Dynamic voltage scaling range
16 MHz to 32 MHz (1ws)

Range 1
32 kHz to 16 MHz (0ws)
8 MHz to 16 MHz (1ws)
Range 2
32 kHz to 8 MHz (0ws)
32 kHz to 4.2 MHz (0ws) Range 3

(from Run/active down to standby) (1)
Stop Standby
Low- Low-
IPs Run/Active Sleep power power
Wakeup Wakeup
run sleep
capability capability
CPU Y -- Y -- -- --
Flash memory O O O O -- --
RAM Y Y Y Y Y --
Backup registers Y Y Y Y Y Y
EEPROM O O O O -- --
16/124 DS10183 Rev 11


(from Run/active down to standby) (continued)(1)
Stop Standby
Low- Low-
Wakeup Wakeup
run sleep
Brown-out reset
O O O O O O O O
(BOR)
DMA O O O O -- --
Programmable
Voltage Detector O O O O O O -
(PVD)
Power-on/down
Y Y Y Y Y Y Y Y
reset (POR/PDR)
High Speed (2)
O O -- -- --
Internal (HSI)
Low Speed Internal
O O O O O O
(LSI)
Low Speed
O O O O O O
External (LSE)
Multi-Speed
O O Y Y -- --
Internal (MSI)
Inter-Connect
Y Y Y Y Y --
Controller
RTC O O O O O O O
RTC Tamper O O O O O O O O
Auto WakeUp
O O O O O O O O
(AWU)
USB O O -- -- -- O --
(3)
USART O O O O O O --
(3)
LPUART O O O O O O --
SPI O O O O -- --
(4)
I2C O O -- -- O O --
ADC O O -- -- -- --
DAC O O O O O --
Temperature
O O O O O --
sensor
Comparators O O O O O O --
16-bit timers O O O O -- --
LPTIMER O O O O O O
IWDG O O O O O O O O
WWDG O O O O -- --
DS10183 Rev 11 17/124

36

(from Run/active down to standby) (continued)(1)
Stop Standby
Low- Low-
Wakeup Wakeup
run sleep
Touch sensing
O O -- -- -- --
controller (TSC)
SysTick Timer O O O O --
GPIOs O O O O O O 2 pins
Wakeup time to
0 µs 0.36 µs 3 µs 32 µs 3.5 µs 50 µs
Run mode
0.4 µA (No 0.28 µA (No
RTC) VDD=1.8 V RTC) VDD=1.8 V
Down to Down to 0.8 µA (with 0.65 µA (with

Consumption
140 µA/MHz 37 µA/MHz Down to Down to RTC) VDD=1.8 V RTC) VDD=1.8 V
VDD=1.8 to 3.6 V
(from Flash (from Flash 8 µA 4.5 µA 0.4 µA (No 0.29 µA (No
(Typ)
memory) memory) RTC) VDD=3.0 V RTC) VDD=3.0 V
1 µA (with RTC) 0.85 µA (with
VDD=3.0 V RTC) VDD=3.0 V
1. Legend:
“Y” = Yes (enable).
“O” = Optional can be enabled/disabled by software)
“-” = Not available
2. Some peripherals with wakeup from Stop capability can request HSI to be enabled. In this case, HSI is woken up by the
peripheral, and only feeds the peripheral which requested it. HSI is automatically put off when the peripheral does not need
it anymore.
3. UART and LPUART reception is functional in Stop mode. It generates a wakeup interrupt on Start. To generate a wakeup
on address match or received frame event, the LPUART can run on LSE clock while the UART has to wake up or keep
running the HSI clock.To generate a wakeup on address match or received frame event, the UART has to wake up or keep
running the HSI clock.
4. I2C address detection is functional in Stop mode. It generates a wakeup interrupt in case of address match. It will wake up
the HSI during reception.
18/124 DS10183 Rev 11

3.2 Interconnect matrix

Several peripherals are directly interconnected. This allows autonomous communication
between peripherals, thus saving CPU resources and power consumption. In addition,
these hardware connections allow fast and predictable latency.
Depending on peripherals, these interconnections can operate in Run, Sleep, Low-power

run, Low-power sleep and Stop modes.
Table 5. STM32L062x8 peripherals interconnect matrix

Low- Low-
Interconnect Interconnect
Interconnect action Run Sleep power power Stop
source destination
run sleep
Timer input channel,

TIM2,TIM21,
trigger from analog Y Y Y Y -
TIM22
signals comparison
COMPx
Timer input channel,
LPTIM trigger from analog Y Y Y Y Y
signals comparison
Timer triggered by other
TIMx TIMx Y Y Y Y -
timer
Timer triggered by Auto
TIM21 Y Y Y Y -
wake-up
RTC
Timer triggered by RTC
LPTIM Y Y Y Y Y
event
Clock source used as
All clock input channel for RC
TIMx Y Y Y Y -
source measurement and
trimming
the clock recovery
USB CRS/HSI48 system trims the HSI48 Y Y - - -
based on USB SOF
Timer input channel and
TIMx Y Y Y Y -
trigger
GPIO Timer input channel and
LPTIM Y Y Y Y Y
trigger
ADC,DAC Conversion trigger Y Y Y Y -
DS10183 Rev 11 19/124

36
3.3 Arm® Cortex®-M0+ core with MPU

The Cortex-M0+ processor is an entry-level 32-bit Arm Cortex processor designed for a
broad range of embedded applications. It offers significant benefits to developers, including:
• a simple architecture that is easy to learn and program
• ultra-low power, energy-efficient operation
• excellent code density
• deterministic, high-performance interrupt handling
• upward compatibility with Cortex-M processor family
• platform security robustness, with integrated Memory Protection Unit (MPU).
The Cortex-M0+ processor is built on a highly area and power optimized 32-bit processor
core, with a 2-stage pipeline Von Neumann architecture. The processor delivers exceptional
energy efficiency through a small but powerful instruction set and extensively optimized
design, providing high-end processing hardware including a single-cycle multiplier.
The Cortex-M0+ processor provides the exceptional performance expected of a modern 32-
bit architecture, with a higher code density than other 8-bit and 16-bit microcontrollers.
Owing to its embedded Arm core, the STM32L062x8 are compatible with all Arm tools and
software.
Nested vectored interrupt controller (NVIC)

The ultra-low-power STM32L062x8 embeds a nested vectored interrupt controller able to
handle up to 32 maskable interrupt channels and 4 priority levels.
The Cortex-M0+ processor closely integrates a configurable Nested Vectored Interrupt
Controller (NVIC), to deliver industry-leading interrupt performance. The NVIC:
• includes a Non-Maskable Interrupt (NMI)
• provides zero jitter interrupt option
• provides four interrupt priority levels
The tight integration of the processor core and NVIC provides fast execution of Interrupt
Service Routines (ISRs), dramatically reducing the interrupt latency. This is achieved
through the hardware stacking of registers, and the ability to abandon and restart load-
multiple and store-multiple operations. Interrupt handlers do not require any assembler
wrapper code, removing any code overhead from the ISRs. Tail-chaining optimization also
significantly reduces the overhead when switching from one ISR to another.
To optimize low-power designs, the NVIC integrates with the sleep modes, that include a
deep sleep function that enables the entire device to enter rapidly stop or standby mode.
This hardware block provides flexible interrupt management features with minimal interrupt
latency.
20/124 DS10183 Rev 11

3.4 Reset and supply management
3.4.1 Power supply schemes

• VDD = 1.65 to 3.6 V: external power supply for I/Os and the internal regulator. Provided
externally through VDD pins.
• VSSA, VDDA = 1.65 to 3.6 V: external analog power supplies for ADC, DAC, reset
blocks, RCs and PLL (minimum voltage to be applied to VDDA is 1.8 V when the DAC is
used). VDDA and VSSA must be connected to VDD and VSS, respectively.
3.4.2 Power supply supervisor

The devices have an integrated ZEROPOWER power-on reset (POR)/power-down reset
(PDR) that can be coupled with a brownout reset (BOR) circuitry.
Two versions are available:
• The version with BOR activated at power-on operates between 1.8 V and 3.6 V.
• The other version without BOR operates between 1.65 V and 3.6 V.
After the VDD threshold is reached (1.65 V or 1.8 V depending on the BOR which is active or
not at power-on), the option byte loading process starts, either to confirm or modify default
thresholds, or to disable the BOR permanently: in this case, the VDD min value becomes
1.65 V (whatever the version, BOR active or not, at power-on).
When BOR is active at power-on, it ensures proper operation starting from 1.8 V whatever
the power ramp-up phase before it reaches 1.8 V. When BOR is not active at power-up, the
power ramp-up should guarantee that 1.65 V is reached on VDD at least 1 ms after it exits
the POR area.
Five BOR thresholds are available through option bytes, starting from 1.8 V to 3 V. To
reduce the power consumption in Stop mode, it is possible to automatically switch off the
internal reference voltage (VREFINT) in Stop mode. The device remains in reset mode when
VDD is below a specified threshold, VPOR/PDR or VBOR, without the need for any external
reset circuit.
Note: The start-up time at power-on is typically 3.3 ms when BOR is active at power-up, the start-
up time at power-on can be decreased down to 1 ms typically for devices with BOR inactive
at power-up.
The devices feature an embedded programmable voltage detector (PVD) that monitors the
VDD/VDDA power supply and compares it to the VPVD threshold. This PVD offers 7 different
levels between 1.85 V and 3.05 V, chosen by software, with a step around 200 mV. An
interrupt can be generated when VDD/VDDA drops below the VPVD threshold and/or when
VDD/VDDA is higher than the VPVD threshold. The interrupt service routine can then generate
a warning message and/or put the MCU into a safe state. The PVD is enabled by software.
DS10183 Rev 11 21/124

36
3.4.3 Voltage regulator

The regulator has three operation modes: main (MR), low power (LPR) and power down.
• MR is used in Run mode (nominal regulation)
• LPR is used in the Low-power run, Low-power sleep and Stop modes
• Power down is used in Standby mode. The regulator output is high impedance, the
kernel circuitry is powered down, inducing zero consumption but the contents of the
registers and RAM are lost except for the standby circuitry (wakeup logic, IWDG, RTC,
LSI, LSE crystal 32 KHz oscillator, RCC_CSR).
3.5 Clock management

The clock controller distributes the clocks coming from different oscillators to the core and
the peripherals. It also manages clock gating for low-power modes and ensures clock
robustness. It features:
• Clock prescaler
To get the best trade-off between speed and current consumption, the clock frequency
to the CPU and peripherals can be adjusted by a programmable prescaler.
• Safe clock switching
Clock sources can be changed safely on the fly in Run mode through a configuration
register.
• Clock management
To reduce power consumption, the clock controller can stop the clock to the core,
individual peripherals or memory.
• System clock source
Three different clock sources can be used to drive the master clock SYSCLK:
– 16 MHz high-speed internal RC oscillator (HSI), trimmable by software, that can
supply a PLLMultispeed internal RC oscillator (MSI), trimmable by software, able
to generate 7 frequencies (65 kHz, 131 kHz, 262 kHz, 524 kHz, 1.05 MHz, 2.1
MHz, 4.2 MHz). When a 32.768 kHz clock source is available in the system (LSE),
the MSI frequency can be trimmed by software down to a ±0.5% accuracy.
• Auxiliary clock source
Two ultra-low-power clock sources that can be used to drive the real-time clock:
– 32.768 kHz low-speed external crystal (LSE)
– 37 kHz low-speed internal RC (LSI), also used to drive the independent watchdog.
The LSI clock can be measured using the high-speed internal RC oscillator for
greater precision.
• RTC clock source
The LSI, LSE sources can be chosen to clock the RTC, whatever the system clock.
• USB clock source
A 48 MHz clock trimmed through the USB SOF supplies the USB interface.
• Startup clock
After reset, the microcontroller restarts by default with an internal 2 MHz clock (MSI).
The prescaler ratio and clock source can be changed by the application program as
soon as the code execution starts.
22/124 DS10183 Rev 11

• Clock security system (CSS)

This feature can be enabled by software.
Another clock security system can be enabled, in case of failure of the LSE it provides
an interrupt or wakeup event which is generated if enabled.
• Clock-out capability (MCO: microcontroller clock output)
It outputs one of the internal clocks for external use by the application.
Several prescalers allow the configuration of the AHB frequency, each APB (APB1 and
APB2) domains. The maximum frequency of the AHB and the APB domains is 32 MHz. See
Figure 2 for details on the clock tree.
DS10183 Rev 11 23/124

36
Figure 2. Clock tree

@V33 Enable Watchdog
Watchdog LS Legend:
LSI RC LSI tempo HSE = High-speed external clock signal
RTCSEL HSI = High-speed internal clock signal
LSI = Low-speed internal clock signal
RTC2 enable LSE = Low-speed external clock signal
MSI = Multispeed internal clock signal
RTC
LSE OSC LSE tempo
LSD LSD
@V18 1 MHz
@V33 MCOSEL ADC enable

LSI
MSI RC ADCCLK
MSI LSE
Level shifters
@V18 / 1,2,4,8,16 MCO
not deepsleep
@V33 CK_PWR
not deepsleep
HSI16 RC
ck_rchs HSI16
Level shifters / 1,4 not (sleep or FCLK
@V18 deepsleep)
System
Clock not (sleep or HCLK
deepsleep)
/8
MSI SysTick
Timer
HSI16 AHB
PRESC PCLK1 to APB1
/ 1,2,…, 512 32 MHz peripherals
PLLSRC
@V33
PLLCLK APB1 max.
PRESC
ck_pllin PLL / 1,2,4,8,16
X Peripheral
3,4,6,8,12,16, clock enable
24,32,48 to TIMx
If (APB1 presc=1) x1
/ 2,3,4 else x2)
Level shifters
Peripheral
@VDDCORE
clock enable
PCLK2 to APB2
32 MHz peripherals
Dedicated 48MHz PLL output APB2 max.
PRESC
HSI48MSEL
/ 1,2,4,8,16
Peripheral
@V33 clock enable
to TIMx
If (APB2 presc=1) x1
RC 48MHz HSI48 else x2)
Level shifters
@V18 Peripheral
LSI clock enable
Clock
Recovery
LPTIMCLK
System Peripheral
LSE
clock enable
HSI16
SYSCLK
PCLK Peripheral LPUART/
clock enable UARTCLK
I2C1CLK
usb_en 48MHz
USBCLK
rng_en 48MHz RNG
MSv34799V1
24/124 DS10183 Rev 11

3.6 Low-power real-time clock and backup registers

The real time clock (RTC) and the 5 backup registers are supplied in all modes including
standby mode. The backup registers are five 32-bit registers used to store 20 bytes of user
application data. They are not reset by a system reset, or when the device wakes up from
Standby mode.
The RTC is an independent BCD timer/counter. Its main features are the following:
• Calendar with subsecond, seconds, minutes, hours (12 or 24 format), week day, date,
month, year, in BCD (binary-coded decimal) format
• Automatically correction for 28, 29 (leap year), 30, and 31 day of the month
• Two programmable alarms with wake up from Stop and Standby mode capability
• Periodic wakeup from Stop and Standby with programmable resolution and period
• On-the-fly correction from 1 to 32767 RTC clock pulses. This can be used to
synchronize it with a master clock.
• Reference clock detection: a more precise second source clock (50 or 60 Hz) can be
used to enhance the calendar precision.
• Digital calibration circuit with 1 ppm resolution, to compensate for quartz crystal
inaccuracy
• 2 anti-tamper detection pins with programmable filter. The MCU can be woken up from
Stop and Standby modes on tamper event detection.
• Timestamp feature which can be used to save the calendar content. This function can
be triggered by an event on the timestamp pin, or by a tamper event. The MCU can be
woken up from Stop and Standby modes on timestamp event detection.
The RTC clock sources can be:
• A 32.768 kHz external crystal
• A resonator or oscillator
• The internal low-power RC oscillator (typical frequency of 37 kHz)
• The high-speed external clock
3.7 General-purpose inputs/outputs (GPIOs)

Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIO pins are shared with digital or analog alternate functions, and can be individually
remapped using dedicated alternate function registers. All GPIOs are high current capable.
Each GPIO output, speed can be slowed (40 MHz, 10 MHz, 2 MHz, 400 kHz). The alternate
function configuration of I/Os can be locked if needed following a specific sequence in order
to avoid spurious writing to the I/O registers. The I/O controller is connected to a dedicated
IO bus with a toggling speed of up to 32 MHz.
Extended interrupt/event controller (EXTI)

The extended interrupt/event controller consists of 28 edge detector lines used to generate
interrupt/event requests. Each line can be individually configured to select the trigger event
(rising edge, falling edge, both) and can be masked independently. A pending register
maintains the status of the interrupt requests. The EXTI can detect an external line with a
pulse width shorter than the Internal APB2 clock period. Up to 29 GPIOs can be connected
to the 16 configurable interrupt/event lines. The 12 other lines are connected to PVD, RTC,
USB, USARTs, LPUART, LPTIMER or comparator events.
DS10183 Rev 11 25/124

36
3.8 Memories
The STM32L062x8 devices have the following features:
• 8 Kbytes of embedded SRAM accessed (read/write) at CPU clock speed with 0 wait
states. With the enhanced bus matrix, operating the RAM does not lead to any
performance penalty during accesses to the system bus (AHB and APB buses).
• The non-volatile memory is divided into three arrays:
– 32 or 64 Kbytes of embedded Flash program memory
– 2 Kbytes of data EEPROM
– Information block containing 32 user and factory options bytes plus 4 Kbytes of
system memory
The user options bytes are used to write-protect or read-out protect the memory (with
4 Kbyte granularity) and/or readout-protect the whole memory with the following options:
• Level 0: no protection
• Level 1: memory readout protected.
The Flash memory cannot be read from or written to if either debug features are
connected or boot in RAM is selected
• Level 2: chip readout protected, debug features (Cortex-M0+ serial wire) and boot in
RAM selection disabled (debugline fuse)
The firewall protects parts of code/data from access by the rest of the code that is executed
outside of the protected area. The granularity of the protected code segment or the non-
volatile data segment is 256 bytes (Flash memory or EEPROM) against 64 bytes for the
volatile data segment (RAM).
The whole non-volatile memory embeds the error correction code (ECC) feature.
3.9 Boot modes

At startup, BOOT0 pin and nBOOT1 option bit are used to select one of three boot options:
• Boot from Flash memory
• Boot from System memory
• Boot from embedded RAM
The boot loader is located in System memory. It is used to reprogram the Flash memory by
using SPI1(PA4, PA5, PA6, PA7), USART1(PA9, PA10) or USART2(PA2, PA3). See
STM32 microcontroller system memory boot mode AN2606 for details.
26/124 DS10183 Rev 11

3.10 Direct memory access (DMA)

The flexible 7-channel, general-purpose DMA is able to manage memory-to-memory,
peripheral-to-memory and memory-to-peripheral transfers. The DMA controller supports
circular buffer management, avoiding the generation of interrupts when the controller
reaches the end of the buffer.
Each channel is connected to dedicated hardware DMA requests, with software trigger
support for each channel. Configuration is done by software and transfer sizes between
source and destination are independent.
The DMA can be used with the main peripherals: AES, SPI, I2C, USART, LPUART,
general-purpose timers, DAC, and ADC.
3.11 Analog-to-digital converter (ADC)

A native 12-bit, extended to 16-bit through hardware oversampling, analog-to-digital
converter is embedded into STM32L062x8 devices. It has up to 10 external channels and 3
internal channels (temperature sensor, voltage reference). Three channels, PA0, PA4 and
PA5, are fast channels, while the others are standard channels.
The ADC performs conversions in single-shot or scan mode. In scan mode, automatic
conversion is performed on a selected group of analog inputs.
The ADC frequency is independent from the CPU frequency, allowing maximum sampling
rate of 1.14 MSPS even with a low CPU speed. The ADC consumption is low at all
frequencies (~25 µA at 10 kSPS, ~200 µA at 1MSPS). An auto-shutdown function
guarantees that the ADC is powered off except during the active conversion phase.
The ADC can be served by the DMA controller. It can operate from a supply voltage down to
1.65 V.
The ADC features a hardware oversampler up to 256 samples, this improves the resolution
to 16 bits (see AN2668).
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all scanned channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start triggers, to allow the application to synchronize A/D conversions and timers.
3.12 Temperature sensor

The temperature sensor (TSENSE) generates a voltage VSENSE that varies linearly with
temperature.
The temperature sensor is internally connected to the ADC_IN18 input channel which is
used to convert the sensor output voltage into a digital value.
The sensor provides good linearity but it has to be calibrated to obtain good overall
accuracy of the temperature measurement. As the offset of the temperature sensor varies
from chip to chip due to process variation, the uncalibrated internal temperature sensor is
suitable for applications that detect temperature changes only.
DS10183 Rev 11 27/124

36
To improve the accuracy of the temperature sensor measurement, each device is

individually factory-calibrated by ST. The temperature sensor factory calibration data are
stored by ST in the system memory area, accessible in read-only mode.
Table 6. Temperature sensor calibration values

Calibration value name Description Memory address
TS ADC raw data acquired at

TSENSE_CAL1 temperature of 30 °C, 0x1FF8 007A - 0x1FF8 007B
VDDA= 3 V
TSENSE_CAL2 temperature of 130 °C 0x1FF8 007E - 0x1FF8 007F
VDDA= 3 V
3.12.1 Internal voltage reference (VREFINT)

The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for the
ADC and Comparators. VREFINT is internally connected to the ADC_IN17 input channel. It
enables accurate monitoring of the VDD value (when no external voltage, VREF+, is available
for ADC). The precise voltage of VREFINT is individually measured for each part by ST during
production test and stored in the system memory area. It is accessible in read-only mode.
Table 7. Internal voltage reference measured values

Raw data acquired at

VREFINT_CAL temperature of 25 °C 0x1FF8 0078 - 0x1FF8 0079
VDDA = 3 V
3.13 Digital-to-analog converter (DAC)

One 12-bit buffered DAC can be used to convert digital signal into analog voltage signal
output. An optional amplifier can be used to reduce the output signal impedance.
This digital Interface supports the following features:
• One data holding register
• Left or right data alignment in 12-bit mode
• Synchronized update capability
• Noise-wave generation
• Triangular-wave generation
• DMA capability (including the underrun interrupt)
• External triggers for conversion
• Input reference voltage VREF+
Four DAC trigger inputs are used in the STM32L062x8. The DAC channel is triggered
through the timer update outputs that are also connected to different DMA channels.
28/124 DS10183 Rev 11

3.14 Ultra-low-power comparators and reference voltage

The STM32L062x8 embed two comparators sharing the same current bias and reference
voltage. The reference voltage can be internal or external (coming from an I/O).
• One comparator with ultra low consumption
• One comparator with rail-to-rail inputs, fast or slow mode.
• The threshold can be one of the following:
– DAC output
– External I/O pins
– Internal reference voltage (VREFINT)
– submultiple of Internal reference voltage(1/4, 1/2, 3/4) for the rail to rail
comparator.
Both comparators can wake up the devices from Stop mode, and be combined into a
window comparator.
The internal reference voltage is available externally via a low-power / low-current output
buffer (driving current capability of 1 µA typical).
3.15 System configuration controller

The system configuration controller provides the capability to remap some alternate
functions on different I/O ports.
The highly flexible routing interface allows the application firmware to control the routing of
different I/Os to the TIM2, TIM21, TIM22 and LPTIM timer input captures. It also controls the
routing of internal analog signals to the USB internal oscillator, ADC, COMP1 and COMP2
and the internal reference voltage VREFINT.
3.16 Touch sensing controller (TSC)

The STM32L062x8 provide a simple solution for adding capacitive sensing functionality to
any application. These devices offer up to 14 capacitive sensing channels distributed over 5
analog I/O groups.
Capacitive sensing technology is able to detect the presence of a finger near a sensor which
is protected from direct touch by a dielectric (such as glass, plastic). The capacitive variation
introduced by the finger (or any conductive object) is measured using a proven
implementation based on a surface charge transfer acquisition principle. It consists of
charging the sensor capacitance and then transferring a part of the accumulated charges
into a sampling capacitor until the voltage across this capacitor has reached a specific
threshold. To limit the CPU bandwidth usage, this acquisition is directly managed by the
hardware touch sensing controller and only requires few external components to operate.
The touch sensing controller is fully supported by the STMTouch touch sensing firmware
library, which is free to use and allows touch sensing functionality to be implemented reliably
in the end application.
DS10183 Rev 11 29/124

36
Table 8. Capacitive sensing GPIOs available on STM32L062x8 devices

Capacitive sensing Pin Capacitive sensing Pin
Group Group
signal name name signal name name
TSC_G1_IO1 PA0 TSC_G5_IO1 PB3

1 5
TSC_G2_IO1 PA4
TSC_G2_IO2 PA5
2
TSC_G2_IO3 PA6
TSC_G2_IO4 PA7
TSC_G3_IO2 PB0
3 TSC_G3_IO3 PB1
TSC_G3_IO4 PB2
TSC_G4_IO1 PA9
TSC_G4_IO2 PA10
4
TSC_G4_IO3 PA11
TSC_G4_IO4 PA12
3.17 AES
The AES Hardware Accelerator can be used to encrypt and decrypt data using the AES
algorithm (compatible with FIPS PUB 197, 2001 Nov 26).
• Key scheduler
• Key derivation for decryption
• 128-bit data block processed
• 128-bit key length
• 213 clock cycles to encrypt/decrypt one 128-bit block
• Electronic codebook (ECB), cypher block chaining (CBC), and counter mode (CTR)
supported by hardware.
The AES can be served by the DMA controller.
30/124 DS10183 Rev 11

3.18 Timers and watchdogs

The ultra-low-power STM32L062x8 devices include three general-purpose timers, one low-
power timer (LPTIM), one basic timer, two watchdog timers and the SysTick timer.
Table 9 compares the features of the general-purpose and basic timers.
Table 9. Timer feature comparison

DMA
Counter Capture/compare Complementary
Timer Counter type Prescaler factor request
resolution channels outputs
generation
Up, down, Any integer between

TIM2 16-bit Yes 4 No
up/down 1 and 65536
TIM21, Up, down, Any integer between
16-bit No 2 No
TIM22 up/down 1 and 65536
Any integer between
TIM6 16-bit Up Yes 0 No
1 and 65536
3.18.1 General-purpose timers (TIM2, TIM21 and TIM22)

There are three synchronizable general-purpose timers embedded in the STM32L062x8
device (see Table 9 for differences).
TIM2
TIM2 is based on 16-bit auto-reload up/down counter. It includes a 16-bit prescaler. It
features four independent channels each for input capture/output compare, PWM or one-
pulse mode output.
The TIM2 general-purpose timers can work together or with the TIM21 and TIM22 general-
purpose timers via the Timer Link feature for synchronization or event chaining. Their
counter can be frozen in debug mode. Any of the general-purpose timers can be used to
generate PWM outputs.
TIM2 has independent DMA request generation.
This timer is capable of handling quadrature (incremental) encoder signals and the digital
outputs from 1 to 3 hall-effect sensors.
TIM21 and TIM22

TIM21 and TIM22 are based on a 16-bit auto-reload up/down counter. They include a 16-bit
prescaler. They have two independent channels for input capture/output compare, PWM or
one-pulse mode output. They can work together and be synchronized with the TIM2, full-
featured general-purpose timers.
They can also be used as simple time bases and be clocked by the LSE clock source
(32.768 kHz) to provide time bases independent from the main CPU clock.
DS10183 Rev 11 31/124

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3.18.2 Low-power Timer (LPTIM)

The low-power timer has an independent clock and is running also in Stop mode if it is
clocked by LSE, LSI or an external clock. It is able to wakeup the devices from Stop mode.
This low-power timer supports the following features:
• 16-bit up counter with 16-bit autoreload register
• 16-bit compare register
• Configurable output: pulse, PWM
• Continuous / one shot mode
• Selectable software / hardware input trigger
• Selectable clock source
– Internal clock source: LSE, LSI, HSI or APB clock
– External clock source over LPTIM input (working even with no internal clock
source running, used by the Pulse Counter Application)
• Programmable digital glitch filter
• Encoder mode
3.18.3 Basic timer (TIM6)

This timer can be used as a generic 16-bit timebase. It is mainly used for DAC trigger
generation.
3.18.4 SysTick timer

This timer is dedicated to the OS, but could also be used as a standard downcounter. It is
based on a 24-bit downcounter with autoreload capability and a programmable clock
source. It features a maskable system interrupt generation when the counter reaches ‘0’.
3.18.5 Independent watchdog (IWDG)

The independent watchdog is based on a 12-bit downcounter and 8-bit prescaler. It is
clocked from an independent 37 kHz internal RC and, as it operates independently of the
main clock, it can operate in Stop and Standby modes. It can be used either as a watchdog
to reset the device when a problem occurs, or as a free-running timer for application timeout
management. It is hardware- or software-configurable through the option bytes. The counter
can be frozen in debug mode.
3.18.6 Window watchdog (WWDG)

The window watchdog is based on a 7-bit downcounter that can be set as free-running. It
can be used as a watchdog to reset the device when a problem occurs. It is clocked from
the main clock. It has an early warning interrupt capability and the counter can be frozen in
debug mode.
32/124 DS10183 Rev 11

3.19 Communication interfaces
3.19.1 I2C bus

Up to two I2C interfaces (I2C1, I2C2) can operate in multimaster or slave modes.
Each I2C interface can support Standard mode (Sm, up to 100 kbit/s), Fast mode (Fm, up to
400 kbit/s) and Fast Mode Plus (Fm+, up to 1 Mbit/s) with 20 mA output drive on some I/Os.
7-bit and 10-bit addressing modes, multiple 7-bit slave addresses (2 addresses, 1 with
configurable mask) are also supported as well as programmable analog and digital noise
filters.
Table 10. Comparison of I2C analog and digital filters

Analog filter Digital filter
Pulse width of Programmable length from 1 to 15

≥ 50 ns
suppressed spikes I2C peripheral clocks
1. Extra filtering capability vs.
Benefits Available in Stop mode standard requirements.
2. Stable length
Wakeup from Stop on address
Variations depending on
Drawbacks match is not available when digital
temperature, voltage, process
filter is enabled.
In addition, I2C1 provides hardware support for SMBus 2.0 and PMBus 1.1: ARP capability,
Host notify protocol, hardware CRC (PEC) generation/verification, timeouts verifications and
ALERT protocol management. I2C1 also has a clock domain independent from the CPU
clock, allowing the I2C1 to wake up the MCU from Stop mode on address match.
Each I2C interface can be served by the DMA controller.
Refer to Table 11 for an overview of I2C interface features.
Table 11. STM32L062x8 I2C implementation

I2C features(1) I2C1 I2C2
7-bit addressing mode X X

10-bit addressing mode X X
Standard mode (up to 100 kbit/s) X X
Fast mode (up to 400 kbit/s) X X
Fast Mode Plus with 20 mA output drive I/Os (up to 1 Mbit/s) X X(2)
Independent clock X -
SMBus X -
Wakeup from STOP X -
1. X = supported.
2. See Table 15: STM32L062x8 pin definitions on page 39 for the list of I/Os that feature Fast Mode Plus
capability
DS10183 Rev 11 33/124

36
3.19.2 Universal synchronous/asynchronous receiver transmitter (USART)

The two USART interfaces (USART1, USART2) are able to communicate at speeds of up to
4 Mbit/s.
They provide hardware management of the CTS, RTS and RS485 driver enable (DE)
signals, multiprocessor communication mode, master synchronous communication and
single-wire half-duplex communication mode. They also support SmartCard communication
(ISO 7816), IrDA SIR ENDEC, LIN Master/Slave capability, auto baud rate feature and has
a clock domain independent from the CPU clock, allowing to wake up the MCU from Stop
mode using baudrates up to 42 Kbaud.
All USART interfaces can be served by the DMA controller.
Table 12 for the supported modes and features of USART interfaces.
Table 12. USART implementation

USART modes/features(1) USART1 and USART2
Hardware flow control for modem X

Continuous communication using DMA X
Multiprocessor communication X
Synchronous mode(2) X
Smartcard mode X
Single-wire half-duplex communication X
IrDA SIR ENDEC block X
LIN mode X
Dual clock domain and wakeup from Stop mode X
Receiver timeout interrupt X
Modbus communication X
Auto baud rate detection (4 modes) X
Driver Enable X
1. X = supported.
2. This mode allows using the USART as an SPI master.
3.19.3 Low-power universal asynchronous receiver transmitter (LPUART)

The devices embed one Low-power UART. The LPUART supports asynchronous serial
communication with minimum power consumption. It supports half duplex single wire
communication and modem operations (CTS/RTS). It allows multiprocessor
communication.
The LPUART has a clock domain independent from the CPU clock. It can wake up the
system from Stop mode using baudrates up to 46 Kbaud. The Wakeup events from Stop
mode are programmable and can be:
• Start bit detection
• Or any received data frame
• Or a specific programmed data frame
34/124 DS10183 Rev 11

Only a 32.768 kHz clock (LSE) is needed to allow LPUART communication up to 9600
baud. Therefore, even in Stop mode, the LPUART can wait for an incoming frame while
having an extremely low energy consumption. Higher speed clock can be used to reach
higher baudrates.
LPUART interface can be served by the DMA controller.
3.19.4 Serial peripheral interface (SPI)/Inter-integrated sound (I2S)

One SPI is able to communicate at up to 16 Mbits/s in slave and master modes in full-duplex
and half-duplex communication modes. The 3-bit prescaler gives 8 master mode
frequencies and the frame is configurable to 8 bits or 16 bits. The hardware CRC
generation/verification supports basic SD Card/MMC modes.
The USARTs with synchronous capability can also be used as SPI master.
The SPI can be served by the DMA controller.
Refer to Table 13 for a summary pf SPI features.
Table 13. SPI/I2S implementation

SPI features(1) SPI1
Hardware CRC calculation X

I2S mode -
TI mode X
1. X = supported.
3.19.5 Universal serial bus (USB)

The STM32L062x8 embed a full-speed USB device peripheral compliant with the USB
specification version 2.0. The internal USB PHY supports USB FS signaling, embedded DP
pull-up and also battery charging detection according to Battery Charging Specification
Revision 1.2. The USB interface implements a full-speed (12 Mbit/s) function interface with
added support for USB 2.0 Link Power Management. It has software-configurable endpoint
setting with packet memory up to 1 Kbyte and suspend/resume support. It requires a
precise 48 MHz clock which can be generated by the internal 48 MHz oscillator in automatic
trimming mode. The synchronization for this oscillator can be taken from the USB data
stream itself (SOF signalization) which allows crystal-less operation.
3.20 Clock recovery system (CRS)

The STM32L062x8 embed a special block which allows automatic trimming of the internal
48 MHz oscillator to guarantee its optimal accuracy over the whole device operational
range. This automatic trimming is based on the external synchronization signal, which could
be either derived from USB SOF signalization, from LSE oscillator, from an external signal
on CRS_SYNC pin or generated by user software. For faster lock-in during startup it is also
possible to combine automatic trimming with manual trimming action.
DS10183 Rev 11 35/124

36
3.21 Cyclic redundancy check (CRC) calculation unit

The CRC (cyclic redundancy check) calculation unit is used to get a CRC code using a
configurable generator polynomial value and size.
Among other applications, CRC-based techniques are used to verify data transmission or
storage integrity. In the scope of the EN/IEC 60335-1 standard, they offer a means of
verifying the Flash memory integrity. The CRC calculation unit helps compute a signature of
the software during runtime, to be compared with a reference signature generated at
linktime and stored at a given memory location.
3.22 Serial wire debug port (SW-DP)

An Arm SW-DP interface is provided to allow a serial wire debugging tool to be connected to
the MCU.
36/124 DS10183 Rev 11

STM32L062x8 Pin descriptions
4 Pin descriptions
Figure 3. STM32L062x8 UFQFPN48
BOOT0
PA15
PA14
VDD
VSS
PB9
PB8
PB7
PB6
PB5
PB4
PB3
48
47
46
45
44
43
42
41
40
39
38
37
VDD 1 36 VDD_USB
PC13 2 35 VSS
PC14-OSC32_IN 3 34 PA13
PC15-OSC32_OUT 4 33 PA12
PH0-OSC_IN 5 32 PA11
PH1-OSC_OUT 6 31 PA10
NRST 7
UFQFPN48 30 PA9
VSSA 8 29 PA8
VDDA 9 28 PB15
PA0 10 27 PB14
PA1 11 26 PB13
PA2 12 25 PB12
13
14
15
16
17
18
19
20
21
22
23
24
PB0
PB1
PB2
VSS
PB10
VDD
PA3
PA4
PA5
PA6
PA7
PB11
MSv62417V1
1. The above figure shows the package top view.

2. The I/O pins supplied by VDD_USB are shown in grey.
Figure 4. STM32L062x8 WLCSP36 ballout

1 2 3 4 5 6
A PC14-
PA13 PA15 PB4 PB7 VDD OSC32
_IN
B PA12 PA14 PB3 PB6 PB8

PC15-
OSC32
_OUT
C PA10 PA11 PB1 PB5 BOO NRST

T0
D PA9 PB11 PB0 PA0 VDDA VSS
E PA8 PB10 PA6 PA4 PA2 VREF

+
F VDD PB2 PA7 PA5 PA3 PA1
MSv37853V1
DS10183 Rev 11 37/124

45
Pin descriptions STM32L062x8
Figure 5. STM32L062x8 LQFP32 pinout
BOOT0
PA15
VSS
PB7
PB6
PB5
PB4
PB3
32 31 30 29 28 27 26 25
VDD 1 24 PA14
PC14-OSC32_IN 2 23 PA13
NRST 4 LQFP32 21 PA11
VDDA 5 20 PA10
PA0 6 19 PA9
PA1 7 18 PA8
PA2 8 9 10 11 12 1 3 14 15 1617 VDD
PB0
PB1
VSS
PA3
PA4
PA5
PA6
PA7
MSv35429V3
Figure 6. STM32L062x8 UFQFPN32 pinout

BOOT0
PA15
PB8
PB7
PB6
PB5
PB4
PB3
32 31 30 29 28 27 26 25
VDD 1 24 PA14
PC14-OSC32_IN 2 23 PA13
NRST 4 VSS 21 PA11
VDDA 5 20 PA10
PA0 6 19 PA9
PA1 7 18 PA8
PA2 8 9 10 11 12 13 14 15 1617 VDD
PB0
PB1
PB2
PA3
PA4
PA5
PA6
PA7
MSv31930V5
38/124 DS10183 Rev 11

Table 14. Legend/abbreviations used in the pinout table

Name Abbreviation Definition
Unless otherwise specified in brackets below the pin name, the pin function during and
Pin name
after reset is the same as the actual pin name
S Supply pin
Pin type I Input only pin
I/O Input / output pin
FT 5 V tolerant I/O
FTf 5 V tolerant I/O, FM+ capable
I/O structure TC Standard 3.3V I/O
B Dedicated BOOT0 pin
RST Bidirectional reset pin with embedded weak pull-up resistor
Unless otherwise specified by a note, all I/Os are set as floating inputs during and after
Notes
reset.
Alternate
Functions selected through GPIOx_AFR registers
functions
Pin functions
Additional
Functions directly selected/enabled through peripheral registers
functions
Table 15. STM32L062x8 pin definitions

Pin Number
I/O structure
Pin type
Pin name
UFQFPN32
UFQFPN48
Notes
WLCSP36
LQFP32
(function after Alternate functions Additional functions

reset)
- - - 1 VDD S - - - -
RTC_TAMP1/
- - - 2 PC13 I/O FT - - RTC_TS/RTC
_OUT/WKUP2
PC14-
2 2 A6 3 I/O FT - - OSC32_IN
OSC32_IN
PC15-
3 3 B6 4 I/O TC - - OSC32_OUT
OSC32_OUT
PH0-OSC_IN
- - - 5 I/O TC - USB_CRS_SYNC OSC_IN
(PH0)
DS10183 Rev 11 39/124

45
Table 15. STM32L062x8 pin definitions (continued)

Pin Number
I/O structure
Pin type
Pin name
UFQFPN32
UFQFPN48
Notes
WLCSP36
LQFP32

reset)
PH1-
- - - 6 OSC_OUT I/O TC - - OSC_OUT
(PH1)
4 4 C6 7 NRST I/O RST - - -
- - E6 - VREF+ S - - - -
- - - 8 VSSA S - - - -
5 5 D5 9 VDDA S - - - -
TIM2_CH1,
COMP1_INM6,
TSC_G1_IO1,
ADC_IN0,
6 6 D4 10 PA0 I/O TC - USART2_CTS,
RTC_TAMP2/WKUP
TIM2_ETR,
1
COMP1_OUT
EVENTOUT,
TIM2_CH2,
TSC_G1_IO2, COMP1_INP,
7 7 F6 11 PA1 I/O FT -
USART2_RTS/ ADC_IN1
USART2_DE,
TIM21_ETR
TIM21_CH1,
TIM2_CH3,
COMP2_INM6,
8 8 E5 12 PA2 I/O FT - TSC_G1_IO3,
ADC_IN2
USART2_TX,
COMP2_OUT
TIM21_CH2,
TIM2_CH4, COMP2_INP,
9 9 F5 13 PA3 I/O FT -
TSC_G1_IO4, ADC_IN3
USART2_RX
SPI1_NSS,
COMP1_INM4,
(1) TSC_G2_IO1,
10 10 E4 14 PA4 I/O TC COMP2_INM4,
USART2_CK,
ADC_IN4, DAC_OUT
TIM22_ETR
SPI1_SCK, TIM2_ETR, COMP1_INM5,
11 11 F4 15 PA5 I/O TC - TSC_G2_IO2, COMP2_INM5,
TIM2_CH1 ADC_IN5
40/124 DS10183 Rev 11


Pin Number
I/O structure
Pin type
Pin name
UFQFPN32
UFQFPN48
Notes
WLCSP36
LQFP32

reset)
SPI1_MISO,
TSC_G2_IO3,
LPUART1_CTS,
12 12 E3 16 PA6 I/O FT - ADC_IN6
TIM22_CH1,
EVENTOUT,
COMP1_OUT
SPI1_MOSI,
TSC_G2_IO4,
13 13 F3 17 PA7 I/O FT - TIM22_CH2, ADC_IN7
EVENTOUT,
COMP2_OUT
EVENTOUT, ADC_IN8,
14 14 D3 18 PB0 I/O FT -
TSC_G3_IO2 VREF_OUT
TSC_G3_IO3,
ADC_IN9,
15 15 C3 19 PB1 I/O FT - LPUART1_RTS/
VREF_OUT
LPUART1_DE
LPTIM1_OUT,
- 16 F2 20 PB2 I/O FT - -
TSC_G3_IO4
TIM2_CH3,
TSC_SYNC,
- - E2 21 PB10 I/O FT - -
LPUART1_TX,
I2C2_SCL
EVENTOUT,
TIM2_CH4,
- - D2 22 PB11 I/O FT - -
LPUART1_RX,
I2C2_SDA
16 - - 23 VSS S - - - -
17 17 F1 24 VDD S - - - -
SPI2_NSS/I2S2_WS,
LPUART1_RTS/
LPUART1_DE,
- - - 25 PB12 I/O FT - -
TSC_G6_IO2,
I2C2_SMBA,
EVENTOUT
DS10183 Rev 11 41/124

45

Pin Number
I/O structure
Pin type
Pin name
UFQFPN32
UFQFPN48
Notes
WLCSP36
LQFP32

reset)
SPI2_SCK/I2S2_CK,
TSC_G6_IO3,
- - - 26 PB13 I/O FTf - -
LPUART1_CTS,
I2C2_SCL, TIM21_CH1
SPI2_MISO/I
2S2_MCK, RTC_OUT,
TSC_G6_IO4,
- - - 27 PB14 I/O FTf - LPUART1_RTS/ -
LPUART1_DE,
I2C2_SDA,
TIM21_CH2
SPI2_MOSI/I2S2_SD,
- - - 28 PB15 I/O FT - -
RTC_REFIN
MCO,
USB_CRS_SYNC,
18 18 E1 29 PA8 I/O FT - -
EVENTOUT,
USART1_CK
MCO, TSC_G4_IO1,
19 19 D1 30 PA9 I/O FT - -
USART1_TX
TSC_G4_IO2,
20 20 C1 31 PA10 I/O FT - -
USART1_RX
SPI1_MISO,
EVENTOUT,
21 21 C2 32 PA11 I/O FT - TSC_G4_IO3, USB_DM
USART1_CTS,
COMP1_OUT
SPI1_MOSI,
EVENTOUT,
TSC_G4_IO4,
22 22 B1 33 PA12 I/O FT - USB_DP
USART1_RTS/
USART1_DE,
COMP2_OUT
23 23 A1 34 PA13 I/O FT - SWDIO, USB_NOE -
- - - 35 VSS S - - - -
- - - 36 VDD_USB S - - - -
24 24 B2 37 PA14 I/O FT - SWCLK, USART2_TX -
42/124 DS10183 Rev 11


Pin Number
I/O structure
Pin type
Pin name
UFQFPN32
UFQFPN48
Notes
WLCSP36
LQFP32

reset)
SPI1_NSS, TIM2_ETR,
EVENTOUT,
25 25 A2 38 PA15 I/O FT - -
USART2_RX,
TIM2_CH1
SPI1_SCK, TIM2_CH2,
26 26 B3 39 PB3 I/O FT - TSC_G5I_O1, COMP2_INN
EVENTOUT
SPI1_MISO,
EVENTOUT,
27 27 A3 40 PB4 I/O FT - COMP2_INP
TSC_G5_IO2,
TIM22_CH1
SPI1_MOSI,
LPTIM1_IN1,
28 28 C4 41 PB5 I/O FT - COMP2_INP
I2C1_SMBA,
TIM22_CH2
USART1_TX,
I2C1_SCL,
29 29 B4 42 PB6 I/O FTf - COMP2_INP
LPTIM1_ETR,
TSC_G5_IO3
USART1_RX,
I2C1_SDA, COMP2_INP,
30 30 A4 43 PB7 I/O FTf -
LPTIM1_IN2, PVD_IN
TSC_G5_IO4
31 31 C5 44 BOOT0 I B - - -
- 32 B5 45 PB8 I/O FTf - TSC_SYNC, I2C1_SCL -
32 - D6 47 VSS S - - -
1 1 A5 48 VDD S - - -
1. PA4 offers a reduced touch sensing sensitivity. It is thus recommended to use it as sampling capacitor I/O.
DS10183 Rev 11 43/124

45
Pin descriptions
44/124
Table 16. Alternate functions for port A
AF0 AF1 AF2 AF3 AF4 AF5 AF6 AF7
SPI1/USART1/2/3
USB/ I2C1/USART1/2
Port /USB/LPTIM/
SPI1/I2C1 LPTIM/TIM2/ I2C1/TSC/ /3/TIM22/ TIM21/
TSC/TIM2/21/22/ TIM2/21/22 COMP1/2
/TIM2/21 EVENTOUT/ EVENTOUT LPUART1 EVENTOUT
EVENTOUT/
SYS_AF EVENTOUT
SYS_AF
PA0 - - TIM2_CH1 TSC_G1_IO1 USART2_CTS TIM2_ETR - COMP1_OUT

USART2_RTS/
PA1 EVENTOUT - TIM2_CH2 TSC_G1_IO2 TIM21_ETR - -
USART2_DE
PA2 TIM21_CH1 - TIM2_CH3 TSC_G1_IO3 USART2_TX - - COMP2_OUT
PA3 TIM21_CH2 - TIM2_CH4 TSC_G1_IO4 USART2_RX - - -
PA4 SPI1_NSS - - TSC_G2_IO1 USART2_CK TIM22_ETR - -
DS10183 Rev 11
PA5 SPI1_SCK - TIM2_ETR TSC_G2_IO2 - TIM2_CH1 - -

PA6 SPI1_MISO - - TSC_G2_IO3 LPUART1_CTS TIM22_CH1 EVENTOUT COMP1_OUT
PA7 SPI1_MOSI - - TSC_G2_IO4 - TIM22_CH2 EVENTOUT COMP2_OUT
Port A
USB_CRS_
PA8 MCO - EVENTOUT USART1_CK - - -
SYNC
PA9 MCO - - TSC_G4_IO1 USART1_TX - - -
PA10 - - - TSC_G4_IO2 USART1_RX - - -
PA11 SPI1_MISO - EVENTOUT TSC_G4_IO3 USART1_CTS - - COMP1_OUT
USART1_RTS/
PA12 SPI1_MOSI - EVENTOUT TSC_G4_IO4 - - COMP2_OUT
USART1_DE
PA13 SWDIO - USB_NOE - - - - -
PA14 SWCLK - - - USART2_TX - - -
STM32L062x8
PA15 SPI1_NSS - TIM2_ETR EVENTOUT USART2_RX TIM2_CH1 - -
STM32L062x8
Table 17. Alternate functions for port B
AF0 AF1 AF2 AF3 AF4 AF5 AF6
SPI1/USART1/2/3
/ USB/LPUART1
Port I2C1/USART1/2/3/
USB/LPTIM/ SPI1/ LPTIM/TIM2/ I2C1/TSC/
TIM22/LPUART1/ I2C2
TSC/TIM2/21/22/ /I2C1/TIM2/21 EVENTOUT/ EVENTOUT
EVENTOUT
EVENTOUT/SYS_ SYS_AF
AF
PB0 EVENTOUT - - TSC_G3_IO2 - - -

LPUART1_RTS/
PB1 - - - TSC_G3_IO3 - -
LPUART1_DE
PB2 - - LPTIM1_OUT TSC_G3_IO4 - - -
PB3 SPI1_SCK - TIM2_CH2 TSC_G5I_O1 EVENTOUT - -
DS10183 Rev 11
PB4 SPI1_MISO - EVENTOUT TSC_G5_IO2 TIM22_CH1 - -

Port B
PB5 SPI1_MOSI - LPTIM1_IN1 I2C1_SMBA TIM22_CH2 - -

PB6 USART1_TX I2C1_SCL LPTIM1_ETR TSC_G5_IO3 - - -
PB7 USART1_RX I2C1_SDA LPTIM1_IN2 TSC_G5_IO4 - - -
PB8 - - - TSC_SYNC I2C1_SCL - -
PB10 TIM2_CH3 TSC_SYNC LPUART1_TX - I2C2_SCL
PB11 EVENTOUT - TIM2_CH4 - LPUART1_RX - I2C2_SDA
Pin descriptions
45/124
Memory mapping STM32L062x8
5 Memory mapping
Refer to the product line reference manual for details on the memory mapping as well as the
boundary addresses for all peripherals.
46/124 DS10183 Rev 11

STM32L062x8 Electrical characteristics
6 Electrical characteristics
6.1 Parameter conditions

Unless otherwise specified, all voltages are referenced to VSS.
6.1.1 Minimum and maximum values

Unless otherwise specified the minimum and maximum values are guaranteed in the worst
conditions of ambient temperature, supply voltage and frequencies by tests in production on
100% of the devices with an ambient temperature at TA = 25 °C and TA = TAmax (given by
the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics
are indicated in the table footnotes and are not tested in production. Based on
characterization, the minimum and maximum values refer to sample tests and represent the
mean value plus or minus three times the standard deviation (mean±3σ).
6.1.2 Typical values

Unless otherwise specified, typical data are based on TA = 25 °C, VDD = 3.6 V (for the
1.65 V ≤ VDD ≤ 3.6 V voltage range). They are given only as design guidelines and are not
tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from
a standard diffusion lot over the full temperature range, where 95% of the devices have an
error less than or equal to the value indicated (mean±2σ).
6.1.3 Typical curves

Unless otherwise specified, all typical curves are given only as design guidelines and are
not tested.
6.1.4 Loading capacitor

The loading conditions used for pin parameter measurement are shown in Figure 7.
6.1.5 Pin input voltage

The input voltage measurement on a pin of the device is described in Figure 8.
Figure 7. Pin loading conditions Figure 8. Pin input voltage
MCU pin MCU pin

C = 50 pF
VIN
ai17851c ai17852c
DS10183 Rev 11 47/124

101
Electrical characteristics STM32L062x8
6.1.6 Power supply scheme
Figure 9. Power supply scheme
Standby-power circuitry
(OSC32,RTC,Wake-up
logic, RTC backup
registers)
Level shifter
OUT
IO
GP I/Os Logic Kernel logic
IN
(CPU,
Digital &
VDD Memories)
VDD
Regulator
N × 100 nF
+ 1 × 10 μF
VSS
VDDA
VDDA
VREF
VREF+
100 nF Analog:
+ 1 μF 100 nF ADC/ RC,PLL,COMP,
+ 1 μF DAC ….
VSSA
VSS
USB
transceiver
VDD_USB
MSv34739V2
6.1.7 Current consumption measurement
Figure 10. Current consumption measurement scheme

VDDA
IDD
NxVDD
N × 100 nF
+ 1 × 10 μF
NxVSS
MSv34711V1
48/124 DS10183 Rev 11

6.2 Absolute maximum ratings

Stresses above the absolute maximum ratings listed in Table 18: Voltage characteristics,
Table 19: Current characteristics, and Table 20: Thermal characteristics may cause
permanent damage to the device. These are stress ratings only and functional operation of
the device at these conditions is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability. Device mission profile (application conditions)
is compliant with JEDEC JESD47 Qualification Standard. Extended mission profiles are
available on demand.
Table 18. Voltage characteristics

Symbol Definition Min Max Unit
External main supply voltage

VDD–VSS –0.3 4.0
(including VDDA, VDD_USB, VDD)(1)
Input voltage on FT and FTf pins VSS − 0.3 VDD+4.0
V
Input voltage on TC pins VSS − 0.3 4.0
VIN(2)
Input voltage on BOOT0 VSS VDD + 4.0
Input voltage on any other pin VSS − 0.3 4.0
|ΔVDD| Variations between different VDDx power pins - 50
Variations between any VDDx and VDDA power
|VDDA-VDDx| - 300 mV
pins(3)
|ΔVSS| Variations between all different ground pins - 50
VREF+ –VDDA Allowed voltage difference for VREF+ > VDDA - 0.4 V
Electrostatic discharge voltage
VESD(HBM) see Section 6.3.11
(human body model)
1. All main power (VDD,VDD_USB, VDDA) and ground (VSS, VSSA) pins must always be connected to the
external power supply, in the permitted range.
2. VIN maximum must always be respected. Refer to Table 19 for maximum allowed injected current values.
3. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV
between VDD and VDDA can be tolerated during power-up and device operation. VDD_USB is independent
from VDD and VDDA: its value does not need to respect this rule.
DS10183 Rev 11 49/124

101
Table 19. Current characteristics

Symbol Ratings Max. Unit
ΣIVDD(2) Total current into sum of all VDD power lines (source)(1) 105
ΣIVSS(2) Total current out of sum of all VSS ground lines (sink) (1)
105
ΣIVDD_USB Total current into VDD_USB power lines (source) 25
IVDD(PIN) Maximum current into each VDD power pin (source)(1) 100
(1)
IVSS(PIN) Maximum current out of each VSS ground pin (sink) 100
Output current sunk by any I/O and control pin except FTf
16
pins
IIO
Output current sunk by FTf pins 22
Output current sourced by any I/O and control pin -16
mA
Total output current sunk by sum of all IOs and control pins
90
except PA11 and PA12(2)
ΣIIO(PIN) Total output current sunk by PA11 and PA12 25
Total output current sourced by sum of all IOs and control
-90
pins(2)
Injected current on FT, FTf, RST and B pins -5/+0(3)
IINJ(PIN)
Injected current on TC pin ± 5(4)
ΣIINJ(PIN) Total injected current (sum of all I/O and control pins)(5) ± 25
1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power
supply, in the permitted range.
2. This current consumption must be correctly distributed over all I/Os and control pins. The total output
current must not be sunk/sourced between two consecutive power supply pins referring to high pin count
LQFP packages.
3. Positive current injection is not possible on these I/Os. A negative injection is induced by VIN<VSS. IINJ(PIN)
must never be exceeded. Refer to Table 18 for maximum allowed input voltage values.
4. A positive injection is induced by VIN > VDD while a negative injection is induced by VIN < VSS. IINJ(PIN)
must never be exceeded. Refer to Table 18: Voltage characteristics for the maximum allowed input voltage
values.
5. When several inputs are submitted to a current injection, the maximum ΣIINJ(PIN) is the absolute sum of the
positive and negative injected currents (instantaneous values).
Table 20. Thermal characteristics

Symbol Ratings Value Unit
TSTG Storage temperature range –65 to +150 °C

TJ Maximum junction temperature 150 °C
50/124 DS10183 Rev 11

6.3 Operating conditions
6.3.1 General operating conditions
Table 21. General operating conditions

Symbol Parameter Conditions Min Max Unit
fHCLK Internal AHB clock frequency - 0 32

fPCLK1 Internal APB1 clock frequency - 0 32 MHz
fPCLK2 Internal APB2 clock frequency - 0 32
BOR detector disabled 1.65 3.6
VDD Standard operating voltage BOR detector enabled, at power-on 1.8 3.6 V
BOR detector disabled, after power-on 1.65 3.6
Analog operating voltage (DAC not
VDDA Must be the same voltage as VDD(1) 1.65 3.6 V
used)
Analog operating voltage (all
VDDA Must be the same voltage as VDD(1) 1.8 3.6 V
features)
VDD_ Standard operating voltage, USB USB peripheral used 3.0 3.6
V
USB domain(2) USB peripheral not used 0 3.6
Input voltage on FT, FTf and RST 2.0 V ≤ VDD ≤ 3.6 V -0.3 5.5
pins(3) 1.65 V ≤ VDD ≤ 2.0 V -0.3 5.2
VIN V
Input voltage on BOOT0 pin - 0 5.5
Input voltage on TC pin - -0.3 VDD+0.3
Standard WLCSP36 - 318
Thin WLCSP36 - 338
Power dissipation at TA = 85 °C
LQFP32 - 351
(range 6) or TA =105 °C (rage 7) (4)
UFQFPN32 - 526
UFQFPN48 - 654
PD mW
StandardWLCSP36 - 79
Thin WLCSP36 - 84
Power dissipation at TA = 125 °C
LQFP32 - 88
(range 3) (4)
UFQFPN32 - 132
UFQFPN48 - 163
Maximum power dissipation (range 6) –40 85
TA Temperature range Maximum power dissipation (range 7) –40 105
Maximum power dissipation (range 3) –40 125
°C
Junction temperature range (range 6) -40 °C ≤ TA ≤ 85 ° –40 105
TJ Junction temperature range (range 7) -40 °C ≤ TA ≤ 105 °C –40 125
Junction temperature range (range 3) -40 °C ≤ TA ≤ 125 °C –40 130
DS10183 Rev 11 51/124

101
1. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV between VDD and VDDA
can be tolerated during power-up and normal operation.
2. VDD_USB must respect the following conditions:
- When VDD is powered-on (VDD < VDD_min), VDD_USB should be always lower than VDD.
- When VDD is powered-down (VDD < VDD_min), VDD_USB should be always lower than VDD.
- In operating mode, VDD_USB could be lower or higher VDD.
- If the USB is not used, VDD_USB must range from VDD_min to VDD_max to be able to use PA11 and PA12 as standard I/Os.
- If the USB is not used and PA11/PA12 are not used as standard I/Os, VDD_USB must be connected to a VSS or VDD power
supply voltage (VDD_USB must not be left floating).
3. To sustain a voltage higher than VDD+0.3V, the internal pull-up/pull-down resistors must be disabled.
4. If TA is lower, higher PD values are allowed as long as TJ does not exceed TJ max (see Table 78: Thermal characteristics on
page 115).
52/124 DS10183 Rev 11

6.3.2 Embedded reset and power control block characteristics

The parameters given in the following table are derived from the tests performed under the
ambient temperature condition summarized in Table 21.
Table 22. Embedded reset and power control block characteristics

Symbol Parameter Conditions Min Typ Max Unit
BOR detector enabled 0 - ∞

VDD rise time rate
BOR detector disabled 0 - 1000
tVDD(1) µs/V
BOR detector enabled 20 - ∞
VDD fall time rate
BOR detector disabled 0 - 1000
VDD rising, BOR enabled - 2 3.3
TRSTTEMPO(1) Reset temporization ms
VDD rising, BOR disabled(2) 0.4 0.7 1.6
Power-on/power down reset Falling edge 1 1.5 1.65

VPOR/PDR
threshold Rising edge 1.3 1.5 1.65
Falling edge 1.67 1.7 1.74
VBOR0 Brown-out reset threshold 0
Rising edge 1.69 1.76 1.8
Rising edge 1.96 2.03 2.07
Rising edge 2.31 2.41 2.44
V
Programmable voltage detector Falling edge 1.8 1.85 1.88
VPVD0
threshold 0 Rising edge 1.88 1.94 1.99
VPVD1 PVD threshold 1
Rising edge 2.08 2.14 2.18
Rising edge 2.28 2.34 2.38
Rising edge 2.47 2.54 2.58
Rising edge 2.68 2.74 2.79
Rising edge 2.87 2.94 2.99
DS10183 Rev 11 53/124

101
Table 22. Embedded reset and power control block characteristics (continued)

VPVD6 PVD threshold 6 V
Rising edge 3.08 3.15 3.20
BOR0 threshold - 40 -
Vhyst Hysteresis voltage All BOR and PVD thresholds mV
- 100 -
excepting BOR0
1. Guaranteed by characterization results.
2. Valid for device version without BOR at power up. Please see option "D" in Ordering information scheme for more details.
6.3.3 Embedded internal reference voltage

The parameters given in Table 24 are based on characterization results, unless otherwise
specified.
Table 23. Embedded internal reference voltage calibration values

Raw data acquired at

VREFINT_CAL temperature of 25 °C 0x1FF8 0078 - 0x1FF8 0079
VDDA= 3 V
Table 24. Embedded internal reference voltage(1)

VREFINT out(2) Internal reference voltage – 40 °C < TJ < +125 °C 1.202 1.224 1.242 V
TVREFINT Internal reference startup time - - 2 3 ms
VDDA and VREF+ voltage during
VVREF_MEAS - 2.99 3 3.01 V
VREFINT factory measure
Including uncertainties
Accuracy of factory-measured
AVREF_MEAS due to ADC and - - ±5 mV
VREFINT value(3)
VDDA/VREF+ values
TCoeff(4) Temperature coefficient –40 °C < TJ < +125 °C - 25 100 ppm/°C
ACoeff(4) Long-term stability 1000 hours, T= 25 °C - - 1000 ppm
VDDCoeff(4) Voltage coefficient 3.0 V < VDDA < 3.6 V - - 2000 ppm/V
ADC sampling time when
TS_vrefint(4)(5) reading the internal reference - 5 10 - µs
voltage
Startup time of reference
TADC_BUF(4) - - - 10 µs
voltage buffer for ADC
Consumption of reference
IBUF_ADC(4) - - 13.5 25 µA
voltage buffer for ADC
IVREF_OUT(4) VREF_OUT output current(6) - - - 1 µA
CVREF_OUT(4) VREF_OUT output load - - - 50 pF
54/124 DS10183 Rev 11

Table 24. Embedded internal reference voltage(1) (continued)

Consumption of reference
ILPBUF(4) voltage buffer for VREF_OUT - - 730 1200 nA
and COMP
VREFINT_DIV1(4) 1/4 reference voltage - 24 25 26
%
VREFINT
1. Refer to Table 34: Peripheral current consumption in Stop and Standby mode for the value of the internal reference current
consumption (IREFINT).
2. Guaranteed by test in production.
3. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes.
4. Guaranteed by design.
5. Shortest sampling time can be determined in the application by multiple iterations.
6. To guarantee less than 1% VREF_OUT deviation.
6.3.4 Supply current characteristics

The current consumption is a function of several parameters and factors such as the
operating voltage, temperature, I/O pin loading, device software configuration, operating
frequencies, I/O pin switching rate, program location in memory and executed binary code.
The current consumption is measured as described in Figure 10: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to Dhrystone 2.1 code if not specified
otherwise.
The current consumption values are derived from the tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 21: General operating
conditions unless otherwise specified.
The MCU is placed under the following conditions:
• All I/O pins are configured in analog input mode
• All peripherals are disabled except when explicitly mentioned
• The Flash memory access time and prefetch is adjusted depending on fHCLK
frequency and voltage range to provide the best CPU performance unless otherwise
specified.
• When the peripherals are enabled fAPB1 = fAPB2 = fAPB
• When PLL is ON, the PLL inputs are equal to HSI = 16 MHz (if internal clock is used)
• For maximum current consumption VDD = VDDA = 3.6 V is applied to all supply pins
• For typical current consumption VDD = VDDA = 3.0 V is applied to all supply pins if not
specified otherwise
The parameters given in Table 42, Table 21 and Table 22 are derived from tests performed
under ambient temperature and VDD supply voltage conditions summarized in Table 21.
DS10183 Rev 11 55/124

101
Table 25. Current consumption in Run mode, code with data processing running from Flash
Symbol Parameter Conditions fHCLK Typ Max(1) Unit
65 kHz 36.5 110

Range 3, VCORE=1.2 V,
Supply MSI clock 524 kHz 99.5 190 µA
VOS[1:0]=11
IDD current in
4.2 MHz 620 700
(Run Run mode,
from code Range 2, VCORE=1.5 V,
16 MHz 2.6 2.9
Flash) executed VOS[1:0]=10,
from Flash HSI clock mA
Range 1, VCORE=1.8 V,
32 MHz 6.25 7
VOS[1:0]=01
1. Guaranteed by characterization results at 125 °C, unless otherwise specified.
Flash memory, Range 2, HSE, 1WS
IDD (mA)
3.00
2.50
2.00
1.50
1.00
0.50
0 VDD (V)
1.80E+00 2.00E+00 2.20E+00 2.40E+00 2.60E+00 2.80E+00 3.00E+00 3.20E+00 3.40E+00 3.60E+00
Dhrystone 2.1 - 1 WS - 55°C
Dhrystone 2.1- 1 WS - 85°C

Dhrystone 2.1- 1 WS – 25°C
MSv34792V1
Flash memory, Range 2, HSI16, 1WS
IDD (mA)
3.00
2.50
2.00
1.50
1.00
0.50
0 VDD (V)
1.80E+00 2.00E+00 2.20E+00 2.40E+00 2.60E+00 2.80E+00 3.00E+00 3.20E+00 3.40E+00 3.60E+00
Dhrystone 2.1 - 1 WS - 55°C

Dhrystone 2.1- 1 WS – 25°C
MSv34793V1
56/124 DS10183 Rev 11

Table 26. Current consumption in Run mode, code with data processing running from RAM
65 kHz 34.5 75
Range 3,
MSI clock VCORE=1.2 V, 524 kHz 83 120 µA
VOS[1:0]=11
Supply current in 4.2 MHz 485 540
IDD (Run Run mode, code
Range 2,
from executed from
VCORE=1.5 V, 16 MHz 2.1 2.3
RAM) RAM, Flash
HSI16 clock source VOS[1:0]=10
switched off mA
(16 MHz) Range 1,
VCORE=1.8 V, 32 MHz 5.1 5.6
VOS[1:0]=01
Table 27. Current consumption in Sleep mode

65 kHz 18 65
Range 3,
MSI clock VCORE=1.2 V, 524 kHz 31.5 75
VOS[1:0]=11
4.2 MHz 140 210
Supply current
in Sleep Range 2,
mode, Flash VCORE=1.5 V, 16 MHz 665 830
OFF HSI16 clock source VOS[1:0]=10
(16 MHz) Range 1,
VCORE=1.8 V, 32 MHz 1750 2100
VOS[1:0]=01
IDD (Sleep) µA
65 kHz 29.5 110
Range 3,
MSI clock VCORE=1.2 V, 524 kHz 44.5 130
VOS[1:0]=11
4.2 MHz 150 270
Supply current
in Sleep Range 2,
mode, Flash VCORE=1.5 V, 16 MHz 680 950
ON HSI16 clock source VOS[1:0]=10
(16 MHz) Range 1,
VCORE=1.8 V, 32 MHz 1750 2100
VOS[1:0]=01
DS10183 Rev 11 57/124

101
Table 28. Current consumption in Low-power run mode

Symbol Parameter Conditions Typ Max(1) Unit
TA = − 40 to 25°C 8.5 10
MSI clock = 65 kHz, TA = 85 °C 11.5 48

fHCLK = 32 kHz TA = 105 °C 15.5 53
TA = 125 °C 27.5 130
All peripherals TA =-40 °C to 25 °C 10 15

OFF, code
MSI clock= 65 kHz, TA = 85 °C 15.5 50
executed from
RAM, Flash fHCLK = 65 kHz TA = 105 °C 19.5 54
switched off,
TA = 125 °C 31.5 130
VDD from 1.65
to 3.6 V TA = − 40 to 25°C 20 25
TA = 55 °C 23 50
MSI clock= 131 kHz,
TA = 85 °C 25.5 55
fHCLK = 131 kHz
TA = 105 °C 29.5 64
Supply
IDD current in TA = 125 °C 40 140
µA
(LP Run) Low-power TA = − 40 to 25°C 22 28
run mode
MSI clock= 65 kHz, TA = 85 °C 26 68
fHCLK = 32 kHz TA = 105 °C 31 75
TA = 125 °C 44 95
TA = − 40 to 25°C 27.5 33
All peripherals
OFF, code MSI clock = 65 kHz, TA = 85 °C 31.5 73
executed from fHCLK = 65 kHz TA = 105 °C 36.5 80
Flash, VDD
from 1.65 V to TA = 125 °C 49 100
3.6 V
TA = − 40 to 25°C 39 46
TA = 55 °C 41 80
MSI clock =
131 kHz, TA = 85 °C 44 86
fHCLK = 131 kHz
TA = 105 °C 49.5 100
TA = 125 °C 60 120
58/124 DS10183 Rev 11

Figure 13. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running
from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS
IDD (mA)
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0 VDD (V)
1.80 2.00 2.20 2.40 2.60 2.80 3.00 3.20 3.40 3.60
0 WS - 55°C
0 WS - 85°C
0 WS – 25°C
0 WS - 105°C
0 WS - 125°C MSv34794V3
Table 29. Current consumption in Low-power sleep mode

MSI clock = 65 kHz,

fHCLK = 32 kHz, TA = − 40 to 25°C 4.7(2) -
Flash OFF
TA = − 40 to 25°C 17 23
MSI clock = 65 kHz, TA = 85 °C 19.5 63
fHCLK = 32 kHz,
Flash ON TA = 105 °C 23 69
TA = 125 °C 32.5 90
Supply TA = − 40 to 25°C 17 23
All peripherals
IDD current in
OFF, VDD from MSI clock =65 kHz, TA = 85 °C 20 63 µA
(LP Sleep) Low-power
1.65 to 3.6 V fHCLK = 65 kHz,
sleep mode TA = 105 °C 23.5 69
Flash ON
TA = 125 °C 32.5 90
TA = − 40 to 25°C 19.5 36
TA = 55 °C 20.5 64
MSI clock = 131 kHz,
fHCLK = 131 kHz, TA = 85 °C 22.5 66
Flash ON
TA = 105 °C 26 72
TA = 125 °C 35 95
2. As the CPU is in Sleep mode, the difference between the current consumption with Flash ON and OFF (nearly 12 µA) is
the same whatever the clock frequency.
DS10183 Rev 11 59/124

101
Table 30. Typical and maximum current consumptions in Stop mode

TA = − 40 to 25°C 0.41 1
TA = 55°C 0.63 2.1
IDD (Stop) Supply current in Stop mode TA= 85°C 1.7 4.5 µA
TA = 105°C 4 9.6
TA = 125°C 11 24(2)
Figure 14. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled
and running on LSE Low drive
IDD (mA)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0
1.80 2.00 2.20 2.40 2.60 2.80 3.00 3.20 3.40 3.60
VDD (V)
55°C
85°C
25°C
105°C
125°C MSv34795V3
Figure 15. IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with RTC disabled,
all clocks OFF
IDD (mA)
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0 VDD (V)
1.80 2.00 2.20 2.40 2.60 2.80 3.00 3.20 3.40 3.60
55 °C
85 °C
25 °C
105 °C
125 °C
MSv34796V3
60/124 DS10183 Rev 11

Table 31. Typical and maximum current consumptions in Standby mode

TA = − 40 to 25°C 1.3 1.7

TA = 55 °C - 2.9
Independent watchdog
TA= 85 °C - 3.3
and LSI enabled
TA = 105 °C - 4.1
IDD Supply current in Standby TA = 125 °C - 8.5

µA
(Standby) mode TA = − 40 to 25°C 0.29 0.6
TA = 55 °C 0.32 0.9
Independent watchdog
TA = 85 °C 0.5 2.3
and LSI OFF
TA = 105 °C 0.94 3
TA = 125 °C 2.6 7
1. Guaranteed by characterization results at 125 °C, unless otherwise specified
Table 32. Average current consumption during Wakeup

Current
Symbol parameter System frequency consumption Unit
during wakeup
HSI 1
HSI/4 0,7
IDD (Wakeup from Supply current during Wakeup from
MSI clock = 4,2 MHz 0,7
Stop) Stop mode
MSI clock = 1,05 MHz 0,4
MSI clock = 65 KHz 0,1
mA
IDD (Reset) Reset pin pulled down - 0,21
IDD (Power-up) BOR ON - 0,23
IDD (Wakeup from With Fast wakeup set MSI clock = 2,1 MHz 0,5
StandBy) With Fast wakeup disabled MSI clock = 2,1 MHz 0,12
DS10183 Rev 11 61/124

101
On-chip peripheral current consumption

The current consumption of the on-chip peripherals is given in the following tables. The
MCU is placed under the following conditions:
• all I/O pins are in input mode with a static value at VDD or VSS (no load)
• all peripherals are disabled unless otherwise mentioned
• the given value is calculated by measuring the current consumption
– with all peripherals clocked OFF
– with only one peripheral clocked on
Table 33. Peripheral current consumption in Run or Sleep mode(1)

Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral Range 1, Range 2, Range 3, Low-power Unit

VCORE=1.8 V VCORE=1.5 V VCORE=1.2 V sleep and
VOS[1:0] = 01 VOS[1:0] = 10 VOS[1:0] = 11 run
CRS 2.5 2 2 2
DAC1 4 3.5 3 2.5
I2C1 11 9.5 7.5 9
I2C2 4 3.5 3 2.5
LPTIM1 10 8.5 6.5 8
µA/MHz
APB1 LPUART1 8 6.5 5.5 6
(fHCLK)
USB 8.5 4.5 4 4.5
USART2 14.5 12 9.5 11
TIM2 10.5 8.5 7 9
TIM6 3.5 3 2.5 2
WWDG 3 2 2 2
ADC1(2) 5.5 5 3.5 4
SPI1 4 3 3 2.5
USART1 14.5 11.5 9.5 12
TIM21 7.5 6 5 5.5 µA/MHz
APB2
TIM22 7 6 5 6 (fHCLK)
FIREWALL 1.5 1 1 0.5

DBGMCU 1.5 1 1 0.5
SYSCFG 2.5 2 2 1.5
GPIOA 3.5 3 2.5 2.5
Cortex-
µA/MHz
M0+ core GPIOB 3.5 2.5 2 2.5
(fHCLK)
I/O port
GPIOC 8.5 6.5 5.5 7
62/124 DS10183 Rev 11

Table 33. Peripheral current consumption in Run or Sleep mode(1) (continued)

Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral Range 1, Range 2, Range 3, Low-power Unit

VCORE=1.8 V VCORE=1.5 V VCORE=1.2 V sleep and
VOS[1:0] = 01 VOS[1:0] = 10 VOS[1:0] = 11 run
CRC 1.5 1 1 1
(3) (3) (3)
FLASH 0 0 0 0(3)
µA/MHz
AHB DMA1 10 8 6.5 8.5
(fHCLK)
RNG 5.5 1 0.5 0.5
TSC 3 2.5 2 3
µA/MHz
All enabled 283 225 222.5 212.5
(fHCLK)
µA/MHz
PWR 2.5 2 2 1
(fHCLK)
1. Data based on differential IDD measurement between all peripherals OFF an one peripheral with clock
enabled, in the following conditions: fHCLK = 32 MHz (range 1), fHCLK = 16 MHz (range 2), fHCLK = 4 MHz
(range 3), fHCLK = 64kHz (Low-power run/sleep), fAPB1 = fHCLK, fAPB2 = fHCLK, default prescaler value for
each peripheral. The CPU is in Sleep mode in both cases. No I/O pins toggling. Not tested in production.
2. HSI oscillator is OFF for this measure.
3. Current consumption is negligible and close to 0 µA.
Table 34. Peripheral current consumption in Stop and Standby mode(1)

Typical consumption, TA = 25 °C
Symbol Peripheral Unit
VDD=1.8 V VDD=3.0 V
IDD(PVD / BOR) - 0.7 1.2

IREFINT - - 1.4
- LSE Low drive(2) 0,1 0,1
- LPTIM1, Input 100 Hz 0,01 0,01
µA
- LPTIM1, Input 1 MHz 6 6
- LPUART1 0,2 0,2
- RTC 0,3 0,48

1. LPTIM peripheral cannot operate in Standby mode.
2. LSE Low drive consumption is the difference between an external clock on OSC32_IN and a quartz between OSC32_IN
and OSC32_OUT.-
DS10183 Rev 11 63/124

101
6.3.5 Wakeup time from low-power mode

The wakeup times given in the following table are measured with the MSI or HSI16 RC
oscillator. The clock source used to wake up the device depends on the current operating
mode:
• Sleep mode: the clock source is the clock that was set before entering Sleep mode
• Stop mode: the clock source is either the MSI oscillator in the range configured before
entering Stop mode, the HSI16 or HSI16/4.
• Standby mode: the clock source is the MSI oscillator running at 2.1 MHz
All timings are derived from tests performed under ambient temperature and VDD supply
voltage conditions summarized in Table 21.
Table 35. Low-power mode wakeup timings

Symbol Parameter Conditions Typ Max Unit
tWUSLEEP Wakeup from Sleep mode fHCLK = 32 MHz 7 8

fHCLK = 262 kHz Number
7 8
Wakeup from Low-power sleep mode, Flash memory enabled of clock
tWUSLEEP_LP cycles
fHCLK = 262 kHz fHCLK = 262 kHz
9 10
Flash memory switched OFF
fHCLK = fMSI = 4.2 MHz 5.0 8
Wakeup from Stop mode, regulator in Run
fHCLK = fHSI = 16 MHz 4.9 7
mode
fHCLK = fHSI/4 = 4 MHz 8.0 11
fHCLK = fMSI = 4.2 MHz
5.0 8
Voltage range 1
5.0 8
Voltage range 2
5.0 8
Voltage range 3
Wakeup from Stop mode, regulator in low-
tWUSTOP fHCLK = fMSI = 1.05 MHz 13 23 µs
power mode
fHCLK = fMSI = 524 kHz 28 38
fHCLK = MSI = 65 kHz 190 260
Wakeup from Stop mode, regulator in low-
power mode, code running from RAM
64/124 DS10183 Rev 11

Table 35. Low-power mode wakeup timings (continued)

Symbol Parameter Conditions Typ Max Unit
Wakeup from Standby mode, FWU bit = 1 fHCLK = MSI = 2.1 MHz 65 130 µs
tWUSTDBY
Wakeup from Standby mode, FWU bit = 0 fHCLK = MSI = 2.1 MHz 2.2 3 ms
Wakeup time required to calculate the
tWUUSART maximum USART/LPUART baudrate Stop mode, regulator in Run
tWUSTOP µs
tWULPUART while waking up from Stop mode using the mode
USART/LPUART
6.3.6 External clock source characteristics

Low-speed external user clock generated from an external source
The characteristics given in the following table result from tests performed using a low-
speed external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 21.
Table 36. Low-speed external user clock characteristics(1)

User external clock source

fLSE_ext 1 32.768 1000 kHz
frequency
OSC32_IN input pin high level
VLSEH 0.7VDD - VDD
voltage
V
OSC32_IN input pin low level
VLSEL - VSS - 0.3VDD
voltage
tw(LSE)
OSC32_IN high or low time 465 - -
tw(LSE)
ns
tr(LSE)
OSC32_IN rise or fall time - - 10
tf(LSE)
CIN(LSE) OSC32_IN input capacitance - - 0.6 - pF
DuCy(LSE) Duty cycle - 45 - 55 %
IL OSC32_IN Input leakage current VSS ≤ VIN ≤ VDD - - ±1 µA
1. Guaranteed by design, not tested in production
DS10183 Rev 11 65/124

101
Figure 16. Low-speed external clock source AC timing diagram
VLSEH
90%
10%
VLSEL
tr(LSE) tW(LSE) t
tf(LSE) tW(LSE)
TLSE
EXTER NAL fLSE_ext

OSC32_IN IL
CLOCK SOURC E
STM32Lxx
ai18233c
Low-speed external clock generated from a crystal/ceramic resonator

The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in Table 37. In
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
Table 37. LSE oscillator characteristics(1)

Symbol Parameter Conditions(2) Min(2) Typ Max Unit
fLSE LSE oscillator frequency - 32.768 - kHz

LSEDRV[1:0]=00
- - 0.5
lower driving capability
LSEDRV[1:0]= 01
- - 0.75
Maximum critical crystal medium low driving capability
Gm µA/V
transconductance LSEDRV[1:0] = 10
- - 1.7
medium high driving capability
LSEDRV[1:0]=11
- - 2.7
higher driving capability
tSU(LSE)(3) Startup time VDD is stabilized - 2 - s
2. Refer to the note and caution paragraphs below the table, and to the application note AN2867 “Oscillator design guide for
ST microcontrollers”.
3. Guaranteed by characterization results. tSU(LSE) is the startup time measured from the moment it is enabled (by software)
to a stabilized 32.768 kHz oscillation is reached. This value is measured for a standard crystal resonator and it can vary
significantly with the crystal manufacturer. To increase speed, address a lower-drive quartz with a high- driver mode.
Note: For information on selecting the crystal, refer to the application note AN2867 “Oscillator
design guide for ST microcontrollers” available from the ST website www.st.com.
66/124 DS10183 Rev 11

Figure 17. Typical application with a 32.768 kHz crystal
Resonator with integrated

capacitors
CL1
OSC32_IN fLSE
32.768 kHz Drive

resonator programmable
amplifier
OSC32_OUT
CL2
MS30253V2
Note: An external resistor is not required between OSC32_IN and OSC32_OUT and it is forbidden
to add one.
DS10183 Rev 11 67/124

101
6.3.7 Internal clock source characteristics

The parameters given in Table 38 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 21.
High-speed internal 16 MHz (HSI16) RC oscillator
Table 38. 16 MHz HSI16 oscillator characteristics

fHSI16 Frequency VDD = 3.0 V - 16 - MHz
HSI16 user- Trimming code is not a multiple of 16 - ± 0.4 0.7 %

(1)(2)
TRIM trimmed resolution Trimming code is a multiple of 16 - - ± 1.5 %
VDDA = 3.0 V, TA = 25 °C -1(3) - 1(3) %
VDDA = 3.0 V, TA = 0 to 55 °C -1.5 - 1.5 %
Accuracy of the VDDA = 3.0 V, TA = -10 to 70 °C -2 - 2 %

ACCHSI16
(2) factory-calibrated VDDA = 3.0 V, TA = -10 to 85 °C -2.5 - 2 %
HSI16 oscillator
VDDA = 3.0 V, TA = -10 to 105 °C -4 - 2 %
VDDA = 1.65 V to 3.6 V
-5.45 - 3.25 %
TA = − 40 to 125 °C
HSI16 oscillator
tSU(HSI16)(2) - - 3.7 6 µs
startup time
HSI16 oscillator
IDD(HSI16)(2) - - 100 140 µA
power consumption
1. The trimming step differs depending on the trimming code. It is usually negative on the codes which are
multiples of 16 (0x00, 0x10, 0x20, 0x30...0xE0).
Figure 18. HSI16 minimum and maximum value versus temperature
4.00%
3.00%
2.00%
1.00%
1.65V min
0.00%
3V typ
-60 -40 -20 0 20 40 60 80 100 120 140
-1.00% 3.6V max
1.65V max
-2.00%
3.6V min
-3.00%
-4.00%
-5.00%
-6.00%
MSv34791V1
68/124 DS10183 Rev 11

High-speed internal 48 MHz (HSI48) RC oscillator
Table 39. HSI48 oscillator characteristics(1)

fHSI48 Frequency - 48 - MHz

(2) (2)
TRIM HSI48 user-trimming step 0.09 0.14 0.2 %
DuCy(HSI48) Duty cycle (2) (2)
45 - 55 %
Accuracy of the HSI48
ACCHSI48 oscillator (factory calibrated TA = 25 °C -4(3) - 4(3) %
before CRS calibration)
tsu(HSI48) HSI48 oscillator startup time - - 6(2) µs
HSI48 oscillator power
IDDA(HSI48) - 330 380(2) µA
consumption
1. VDDA = 3.3 V, TA = –40 to 125 °C unless otherwise specified.
Low-speed internal (LSI) RC oscillator
Table 40. LSI oscillator characteristics

Symbol Parameter Min Typ Max Unit
fLSI(1) LSI frequency 26 38 56 kHz

LSI oscillator frequency drift
DLSI(2) -10 - 4 %
0°C ≤ TA ≤ 85°C
tsu(LSI)(3) LSI oscillator startup time - - 200 µs
(3)
IDD(LSI) LSI oscillator power consumption - 400 510 nA
2. This is a deviation for an individual part, once the initial frequency has been measured.
Multi-speed internal (MSI) RC oscillator
Table 41. MSI oscillator characteristics

Symbol Parameter Condition Typ Max Unit
MSI range 0 65.5 -

MSI range 1 131 -
kHz
MSI range 2 262 -
Frequency after factory calibration, done at
fMSI MSI range 3 524 -
VDD= 3.3 V and TA = 25 °C
MSI range 4 1.05 -
MSI range 5 2.1 - MHz
MSI range 6 4.2 -
DS10183 Rev 11 69/124

101
Table 41. MSI oscillator characteristics (continued)

ACCMSI Frequency error after factory calibration - ±0.5 - %

MSI oscillator frequency drift
- ±3 -
0 °C ≤ TA ≤ 85 °C
MSI range 0 − 8.9 +7.0
MSI range 1 − 7.1 +5.0
DTEMP(MSI)(1) MSI range 2 − 6.4 +4.0 %

MSI range 3 − 6.2 +3.0
VDD = 3.3 V, − 40 °C ≤ TA ≤ 110 °C
MSI range 4 − 5.2 +3.0
MSI range 5 − 4.8 +2.0
MSI range 6 − 4.7 +2.0
DVOLT(MSI)(1) - - 2.5 %/V
1.65 V ≤ VDD ≤ 3.6 V, TA = 25 °C
MSI range 0 0.75 -
MSI range 1 1 -
MSI range 2 1.5 -
IDD(MSI)(2) MSI oscillator power consumption MSI range 3 2.5 - µA
MSI range 4 4.5 -
MSI range 5 8 -
MSI range 6 15 -
MSI range 0 30 -
MSI range 1 20 -
MSI range 2 15 -
MSI range 3 10 -
MSI range 4 6 -
tSU(MSI) MSI oscillator startup time µs
MSI range 5 5 -
MSI range 6,
Voltage range 1 3.5 -
and 2
MSI range 6,
5 -
Voltage range 3
70/124 DS10183 Rev 11

Table 41. MSI oscillator characteristics (continued)

MSI range 0 - 40
MSI range 1 - 20
MSI range 2 - 10
MSI range 3 - 4
MSI range 4 - 2.5
tSTAB(MSI)(2) MSI oscillator stabilization time µs
MSI range 5 - 2
MSI range 6,
Voltage range 1 - 2
and 2
MSI range 3,
- 3
Voltage range 3
Any range to
- 4
range 5
fOVER(MSI) MSI oscillator frequency overshoot MHz
Any range to
- 6
range 6
1. This is a deviation for an individual part, once the initial frequency has been measured.
6.3.8 PLL characteristics

The parameters given in Table 42 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 21.
Table 42. PLL characteristics

Value
Symbol Parameter Unit
Min Typ Max(1)
PLL input clock(2) 2 - 24 MHz

fPLL_IN
PLL input clock duty cycle 45 - 55 %
fPLL_OUT PLL output clock 2 - 32 MHz
PLL input = 16 MHz
tLOCK - 115 160 µs
PLL VCO = 96 MHz
Jitter Cycle-to-cycle jitter - ± 600 ps
IDDA(PLL) Current consumption on VDDA - 220 450
µA
IDD(PLL) Current consumption on VDD - 120 150
2. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with
the range defined by fPLL_OUT.
DS10183 Rev 11 71/124

101
6.3.9 Memory characteristics

RAM memory
Table 43. RAM and hardware registers

VRM Data retention mode(1) STOP mode (or RESET) 1.65 - - V

1. Minimum supply voltage without losing data stored in RAM (in Stop mode or under Reset) or in hardware
registers (only in Stop mode).
Flash memory and data EEPROM
Table 44. Flash memory and data EEPROM characteristics

Symbol Parameter Conditions Min Typ Max(1) Unit
Operating voltage
VDD - 1.65 - 3.6 V
Read / Write / Erase
Programming time for Erasing - 3.28 3.94

tprog ms
word or half-page Programming - 3.28 3.94
Average current during
the whole programming / - 500 700 µA
erase operation
IDD Maximum current (peak) TA = 25 °C, VDD = 3.6 V
during the whole
- 1.5 2.5 mA
programming / erase
operation
Table 45. Flash memory and data EEPROM endurance and retention
Value
Symbol Parameter Conditions Unit
Min(1)
Cycling (erase / write)

10
Program memory
TA = -40°C to 105 °C
100
EEPROM data memory
NCYC(2) kcycles
0.2
Program memory
TA = -40°C to 125 °C
2
EEPROM data memory
72/124 DS10183 Rev 11

Table 45. Flash memory and data EEPROM endurance and retention (continued)
Value
Min(1)
Data retention (program memory) after

30
10 kcycles at TA = 85 °C
TRET = +85 °C
Data retention (EEPROM data memory)
30
after 100 kcycles at TA = 85 °C
10 kcycles at TA = 105 °C
tRET(2) TRET = +105 °C years
10
200 cycles at TA = 125 °C
TRET = +125 °C
2. Characterization is done according to JEDEC JESD22-A117.
6.3.10 EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
• Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
• FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 46. They are based on the EMS levels and classes
defined in application note AN1709.
Table 46. EMS characteristics

Level/
Symbol Parameter Conditions
Class
VDD = 3.3 V, TA = +25 °C,

Voltage limits to be applied on any I/O pin to
VFESD fHCLK = 32 MHz 3B
induce a functional disturbance
conforms to IEC 61000-4-2
Fast transient voltage burst limits to be VDD = 3.3 V, TA = +25 °C,
VEFTB applied through 100 pF on VDD and VSS fHCLK = 32 MHz 4A
pins to induce a functional disturbance conforms to IEC 61000-4-4
DS10183 Rev 11 73/124

101
Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
• Corrupted program counter
• Unexpected reset
• Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 47. EMI characteristics

Max vs. fosc/fCPU
Monitored
frequency band 8 MHz/ 8 MHz/ 8 MHz/
4 MHz 16 MHz 32 MHz
0.1 to 30 MHz -21 -15 -12

VDD = 3.6 V,
30 to 130 MHz -14 -12 -1 dBµV
Peak level A = 25 °C,
T
SEMI
compliant with IEC 130 MHz to 1GHz -10 -11 -7
61967-2
EMI Level 1 1 1 -
74/124 DS10183 Rev 11

6.3.11 Electrical sensitivity characteristics

Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Table 48. ESD absolute maximum ratings

Maximum
Symbol Ratings Conditions Class Unit
value(1)
TA = +25 °C,
Electrostatic discharge
VESD(HBM) conforming to 2 2000
voltage (human body model)
ANSI/JEDEC JS-001
V
Electrostatic discharge TA = +25 °C,
VESD(CDM) voltage (charge device conforming to C4 500
model) ANSI/ESD STM5.3.1.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
• A supply overvoltage is applied to each power supply pin
• A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 49. Electrical sensitivities

Symbol Parameter Conditions Class
LU Static latch-up class TA = +125 °C conforming to JESD78A II level A
DS10183 Rev 11 75/124

101
6.3.12 I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator
frequency deviation).
The test results are given in the Table 50.
Table 50. I/O current injection susceptibility

Functional susceptibility
Symbol Description Unit
Negative Positive
injection injection
Injected current on BOOT0 -0 NA(1)

Injected current on PA0, PA4, PA5, PA11,
-5 0
IINJ PA12, PC15, PH0 and PH1 mA
Injected current on any other FT, FTf pins -5 (2) NA(1)
Injected current on any other pins -5 (2) +5
1. Current injection is not possible.
2. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject
negative currents.
76/124 DS10183 Rev 11

6.3.13 I/O port characteristics

General input/output characteristics
Unless otherwise specified, the parameters given in Table 51 are derived from tests
performed under the conditions summarized in Table 21. All I/Os are CMOS and TTL
compliant.
Note: For information on GPIO configuration, refer to application note AN4899 “STM32 GPIO
configuration for hardware settings and low-power consumption” available from the ST
website www.st.com.
Table 51. I/O static characteristics
TC, FT, FTf, RST

- - 0.3VDD
VIL Input low level voltage I/Os
BOOT0 pin - - 0.14VDD(1)
V
VIH Input high level voltage All I/Os 0.7 VDD - -
I/O Schmitt trigger voltage hysteresis Standard I/Os - 10% VDD(3) -

Vhys (2)
BOOT0 pin - 0.01 -
VSS ≤ VIN ≤ VDD
All I/Os except for
- - ±50
PA11, PA12, BOOT0
and FTf I/Os
nA
VSS ≤ VIN ≤ VDD,
- - -50/+250
PA11 and PA12 I/Os
VSS ≤ VIN ≤ VDD
- - ±100
FTf I/Os
Ilkg Input leakage current (4) VDD≤ VIN ≤ 5 V
All I/Os except for - - 200
PA11, PA12, BOOT0
and FTf I/Os nA
VDD≤ VIN ≤ 5 V
- - 500
FTf I/Os
VDD≤ VIN ≤ 5 V
PA11, PA12 and - - 10 µA
BOOT0
RPU Weak pull-up equivalent resistor(5) VIN = VSS 25 45 65 kΩ
RPD Weak pull-down equivalent resistor(5) VIN = VDD 25 45 65 kΩ
CIO I/O pin capacitance - - 5 - pF
1. Guaranteed by characterization.
2. Hysteresis voltage between Schmitt trigger switching levels. Guaranteed by characterization results.
3. With a minimum of 200 mV. Guaranteed by characterization results.
4. The max. value may be exceeded if negative current is injected on adjacent pins.
5. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This
MOS/NMOS contribution to the series resistance is minimum (~10% order).
DS10183 Rev 11 77/124

101
Figure 19. VIH/VIL versus VDD (CMOS I/Os)
VIL/VIH (V) V DD (all p

ins
= 0.7 0.59 /1
ts V IHmin
9 V DD+ 15, PH0
iremen =0 .3 , PC
requ V IHmin t BOOT0 0.38 for
ard p +
Ss tand exce 5V DD H0/1
CMO = 0.4 ,P
VIHmin 2.0 V IHmin 0, PC15
T
BOO
V DD
= 0.3
1.3 V ILmax
Input range not
guaranteed
CMOS standard requirements VILmax = 0.3VDD
VILmax 0.7
0.6
VDD (V)
2.0 2.7 3.0 3.3 3.6
MSv34789V1
Figure 20. VIH/VIL versus VDD (TTL I/Os)
VIL/VIH (V) pins

9 (all
V D+0.5 , PH0/1
9 D
15
= 0.3 , PC
V IHmin t BOOT0 0.38 for
p +
TTL standard requirements VIHmin = 2 V exce = 0.45V DD PH0/1
,
VIHmin 2.0 V IHmin 0, PC15
T
BOO
V DD
= 0.3
1.3 V ILmax
Input range not
guaranteed
VILmax 0.8
0.7 TTL standard requirements VILmax = 0.8 V
VDD (V)
2.0 2.7 3.0 3.3 3.6
MSv34790V1
Output driving current

The GPIOs (general purpose input/outputs) can sink or source up to ±8 mA, and sink or
source up to ±15 mA with the non-standard VOL/VOH specifications given in Table 52.
In the user application, the number of I/O pins which can drive current must be limited to
respect the absolute maximum rating specified in Section 6.2:
• The sum of the currents sourced by all the I/Os on VDD, plus the maximum Run
consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating
IVDD(Σ) (see Table 19).
• The sum of the currents sunk by all the I/Os on VSS plus the maximum Run
consumption of the MCU sunk on VSS cannot exceed the absolute maximum rating
IVSS(Σ) (see Table 19).
78/124 DS10183 Rev 11

Output voltage levels

performed under ambient temperature and VDD supply voltage conditions summarized in
Table 21. All I/Os are CMOS and TTL compliant.
Table 52. Output voltage characteristics

Output low level voltage for an I/O

VOL(1) CMOS port(2), - 0.4
pin
IIO = +8 mA
Output high level voltage for an I/O 2.7 V ≤ VDD ≤ 3.6 V
VOH(3) VDD-0.4 -
pin
TTL port(2),
(1) Output low level voltage for an I/O
VOL IIO =+ 8 mA - 0.4
pin
2.7 V ≤ VDD ≤ 3.6 V
TTL port(2),
(3)(4) Output high level voltage for an I/O
VOH IIO = -6 mA 2.4 -
pin
2.7 V ≤ VDD ≤ 3.6 V
Output low level voltage for an I/O IIO = +15 mA
VOL(1)(4) - 1.3 V
pin 2.7 V ≤ VDD ≤ 3.6 V
Output high level voltage for an I/O IIO = -15 mA
VOH(3)(4) VDD-1.3 -
pin 2.7 V ≤ VDD ≤ 3.6 V
Output low level voltage for an I/O IIO = +4 mA
VOL(1)(4) - 0.45
pin 1.65 V ≤ VDD < 3.6 V
Output high level voltage for an I/O IIO = -4 mA
VOH(3)(4) V -0.45 -
pin 1.65 V ≤ VDD ≤ 3.6 V DD
IIO = 20 mA
- 0.4
Output low level voltage for an FTf 2.7 V ≤ VDD ≤ 3.6 V
VOLFM+(1)(4)
I/O pin in Fm+ mode IIO = 10 mA
- 0.4
1.65 V ≤ VDD ≤ 3.6 V
1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 19.
The sum of the currents sunk by all the I/Os (I/O ports and control pins) must always be respected and
must not exceed ΣIIO(PIN).
2. TTL and CMOS outputs are compatible with JEDEC standards JESD36 and JESD52.
3. The IIO current sourced by the device must always respect the absolute maximum rating specified in
Table 19. The sum of the currents sourced by all the I/Os (I/O ports and control pins) must always be
respected and must not exceed ΣIIO(PIN).
DS10183 Rev 11 79/124

101
Input/output AC characteristics
The definition and values of input/output AC characteristics are given in Figure 21 and
Table 53, respectively.
Table 21.
Table 53. I/O AC characteristics(1)

OSPEEDRx[1:0]
Symbol Parameter Conditions Min Max(2) Unit
bit value(1)
CL = 50 pF, VDD = 2.7 V to 3.6 V - 400

fmax(IO)out Maximum frequency(3) kHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 100
00
tf(IO)out CL = 50 pF, VDD = 2.7 V to 3.6 V - 125
Output rise and fall time ns
tr(IO)out CL = 50 pF, VDD = 1.65 V to 2.7 V - 320
CL = 50 pF, VDD = 2.7 V to 3.6 V - 2
fmax(IO)out Maximum frequency(3) MHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 0.6
01
CL = 50 pF, VDD = 2.7 V to 3.6 V - 10
Fmax(IO)out Maximum frequency(3) MHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 2
10
CL = 30 pF, VDD = 2.7 V to 3.6 V - 35
Fmax(IO)out Maximum frequency(3) MHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 10
11
fmax(IO)out Maximum frequency(3) - 1 MHz
tf(IO)out Output fall time CL = 50 pF, VDD = 2.5 V to 3.6 V - 10
ns
Fm+ tr(IO)out Output rise time - 30
configuration(4) fmax(IO)out Maximum frequency(3) - 350 KHz
tf(IO)out Output fall time CL = 50 pF, VDD = 1.65 V to 3.6 V - 15
ns
tr(IO)out Output rise time - 60
Pulse width of external
- tEXTIpw signals detected by the - 8 - ns
EXTI controller
1. The I/O speed is configured using the OSPEEDRx[1:0] bits. Refer to the line reference manual for a description of GPIO Port
configuration register.
3. The maximum frequency is defined in Figure 21.
4. When Fm+ configuration is set, the I/O speed control is bypassed. Refer to the line reference manual for a detailed
description of Fm+ I/O configuration.
80/124 DS10183 Rev 11

Figure 21. I/O AC characteristics definition

90% 10%
50% 50%
10% 90%
EXTERNAL tr(IO)out tf(IO)out

OUTPUT
ON CL T
Maximum frequency is achieved if (tr + tf) ≤ (2/3)T and if the duty cycle is (45-55%)
when loaded by CL specified in the table “ I/O AC characteristics”.
ai14131d
6.3.14 NRST pin characteristics

The NRST pin input driver uses CMOS technology. It is connected to a permanent pull-up
resistor, RPU , except when it is internally driven low (see Table 54).
Table 21.
Table 54. NRST pin characteristics

VIL(NRST) (1) NRST input low level voltage - VSS - 0.8

VIH(NRST)(1) NRST input high level voltage - 1.4 - VDD
IOL = 2 mA V
- -
NRST output low level 2.7 V < VDD < 3.6 V
VOL(NRST)(1) 0.4
voltage IOL = 1.5 mA
- -
1.65 V < VDD < 2.7 V
NRST Schmitt trigger voltage
Vhys(NRST)(1) - - 10%VDD(2) - mV
hysteresis
Weak pull-up equivalent
RPU VIN = VSS 25 45 65 kΩ
resistor(3)
VF(NRST)(1) NRST input filtered pulse - - - 50 ns
VNF(NRST) (1) NRST input not filtered pulse - 350 - - ns
2. 200 mV minimum value
3. The pull-up is designed with a true resistance in series with a switchable PMOS. This PMOS contribution to
the series resistance is around 10%.
DS10183 Rev 11 81/124

101
Figure 22. Recommended NRST pin protection
([WHUQDO
UHVHWFLUFXLW 9''
538
1567 ,QWHUQDOUHVHW
)LOWHU
)
069
1. The reset network protects the device against parasitic resets.

2. The external capacitor must be placed as close as possible to the device.
3. The user must ensure that the level on the NRST pin can go below the VIL(NRST) max level specified in
Table 54. Otherwise the reset will not be taken into account by the device.
6.3.15 12-bit ADC characteristics

performed under ambient temperature, fPCLK frequency and VDDA supply voltage conditions
summarized in Table 21: General operating conditions.
Note: It is recommended to perform a calibration after each power-up.
Table 55. ADC characteristics

Analog supply voltage for Fast channel 1.65 - 3.6

VDDA V
ADC ON Standard channel 1.75(1) - 3.6
VREF+ Positive reference voltage - 1.65 VDDA V
Current consumption of the 1.14 Msps - 200 -

ADC on VDDA and VREF+ 10 ksps - 40 -
IDDA (ADC) µA
Current consumption of the 1.14 Msps - 70 -
ADC on VDD(2) 10 ksps - 1 -
Voltage scaling Range 1 0.14 - 16
fADC ADC clock frequency Voltage scaling Range 2 0.14 - 8 MHz
Voltage scaling Range 3 0.14 - 4
fS(3) Sampling rate 12-bit resolution 0.01 - 1.14 MHz
fADC = 16 MHz,
- - 941 kHz
fTRIG(3) External trigger frequency 12-bit resolution
- - - 17 1/fADC
VAIN Conversion voltage range - 0 - VDDAVREF+ V
82/124 DS10183 Rev 11

Table 55. ADC characteristics (continued)

See Equation 1 and

RAIN(3) External input impedance - - 50 kΩ
Table 56 for details
RADC(3)(4) Sampling switch resistance - - - 1 kΩ
Internal sample and hold

CADC(3) - - - 8 pF
capacitor
fADC = 16 MHz 5.2 µs
tCAL(3)(5) Calibration time
- 83 1/fADC
1.5 ADC 1.5 ADC
ADC clock = HSI16 cycles + 2 - cycles + 3 -
fPCLK cycles fPCLK cycles
ADC_DR register write
WLATENCY(6) fPCLK
latency ADC clock = PCLK/2 - 4.5 -
cycle
fPCLK
ADC clock = PCLK/4 - 8.5 -
cycle
fADC = fPCLK/2 = 16 MHz 0.266 µs
fADC = fPCLK/2 8.5 1/fPCLK
tlatr(3) Trigger conversion latency fADC = fPCLK/4 = 8 MHz 0.516 µs
fADC = fPCLK/4 16.5 1/fPCLK
fADC = fHSI16 = 16 MHz 0.252 - 0.260 µs
ADC jitter on trigger
JitterADC fADC = fHSI16 - 1 - 1/fHSI16
conversion
fADC = 16 MHz 0.093 - 10.03 µs
tS(3) Sampling time
- 1.5 - 160.5 1/fADC
tUP_LDO(3)(5) Internal LDO power-up time - - - 10 µs
tSTAB(3)(5) ADC stabilization time - 14 1/fADC
fADC = 16 MHz,
0.875 - 10.81 µs
Total conversion time 12-bit resolution
tConV (3)
(including sampling time) 14 to 173 (tS for sampling +12.5
12-bit resolution 1/fADC
for successive approximation)
1. VDDA minimum value can be decreased in specific temperature conditions. Refer to Table 56: RAIN max for fADC = 16 MHz.
2. A current consumption proportional to the APB clock frequency has to be added (see Table 33: Peripheral current
consumption in Run or Sleep mode).
4. Standard channels have an extra protection resistance which depends on supply voltage. Refer to Table 56: RAIN max for
fADC = 16 MHz.
5. This parameter only includes the ADC timing. It does not take into account register access latency.
6. This parameter specifies the latency to transfer the conversion result into the ADC_DR register. EOC bit is set to indicate the
conversion is complete and has the same latency.
DS10183 Rev 11 83/124

101
Equation 1: RAIN max formula
TS
R AIN < -------------------------------------------------------------
- – R ADC
N+2
f ADC × C ADC × ln ( 2 )
The simplified formula above (Equation 1) is used to determine the maximum external
impedance allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 56. RAIN max for fADC = 16 MHz(1)

RAIN max for standard channels (kΩ)
RAIN max for
Ts tS
fast channels VDD > 1.65 V VDD > 1.65 V
(cycles) (µs) VDD > VDD > VDD > VDD > VDD >
(kΩ) and and
2.7 V 2.4 V 2.0 V 1.8 V 1.75 V
TA > −10 °C TA > 25 °C
1.5 0.09 0.5 < 0.1 NA NA NA NA NA NA

3.5 0.22 1 0.2 < 0.1 NA NA NA NA NA
7.5 0.47 2.5 1.7 1.5 < 0.1 NA NA NA NA
12.5 0.78 4 3.2 3 1 NA NA NA NA
19.5 1.22 6.5 5.7 5.5 3.5 NA NA NA < 0.1
39.5 2.47 13 12.2 12 10 NA NA NA 5
79.5 4.97 27 26.2 26 24 < 0.1 NA NA 19
160.5 10.03 50 49.2 49 47 32 < 0.1 < 0.1 42
Table 57. ADC accuracy(1)(2)(3)

ET Total unadjusted error - 2 4

EO Offset error - 1 2.5
EG Gain error - 1 2 LSB
EL Integral linearity error - 1.5 2.5
ED Differential linearity error - 1 1.5
Effective number of bits 10.2 11
1.65 V < VDDA = VREF+ < 3.6 V,
ENOB Effective number of bits (16-bit mode range 1/2/3 bits
11.3 12.1 -
oversampling with ratio =256)(4)
SINAD Signal-to-noise distortion 63 69 -
Signal-to-noise ratio 63 69 -
SNR Signal-to-noise ratio (16-bit mode dB
70 76 -
oversampling with ratio =256)(4)
THD Total harmonic distortion - -85 -73
84/124 DS10183 Rev 11

Table 57. ADC accuracy(1)(2)(3) (continued)

ET Total unadjusted error - 2 5

EO Offset error - 1 2.5
EG Gain error - 1 2 LSB
EL Integral linearity error - 1.5 3
1.65 V < VREF+ <VDDA < 3.6 V,
ED Differential linearity error - 1 2
range 1/2/3
ENOB Effective number of bits 10.0 11.0 - bits
SINAD Signal-to-noise distortion 62 69 -
SNR Signal-to-noise ratio 61 69 - dB
THD Total harmonic distortion - -85 -65
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-robust) analog input
pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog
input. It is recommended to add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.12 does not affect the ADC
accuracy.
3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges.
4. This number is obtained by the test board without additional noise, resulting in non-optimized value for oversampling mode.
Figure 23. ADC accuracy characteristics
VSSA EG (1) Example of an actual transfer curve

4095
(2) The ideal transfer curve
4094 (3) End point correlation line
4093
(2)
ET = total unajusted error: maximum deviation
between the actual and ideal transfer curves.
ET EO = offset error: maximum deviation
(3)
7 between the first actual transition and
(1)
6 the first ideal one.
EG = gain error: deviation between the last
5
EO EL
ideal transition and the last actual one.
4 ED = differential linearity error: maximum
3 deviation between actual steps and the ideal ones.
ED
EL = integral linearity error: maximum deviation
2
between any actual transition and the end point
1 LSB IDEAL
1 correlation line.
0
1 2 3 4 5 6 7 4093 4094 4095 4096 VDDA
MS19880V2
DS10183 Rev 11 85/124

101
Figure 24. Typical connection diagram using the ADC
VDDA
VT Sample and hold ADC

converter
RAIN(1) RADC
AINx 12-bit
IL±50nA converter
Cparasitic VT
VAIN
CADC
MSv34712V1
1. Refer to Table 55: ADC characteristics for the values of RAIN, RADC and CADC.
2. Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 7 pF). A high Cparasitic value will downgrade conversion accuracy. To remedy
this, fADC should be reduced.
General PCB design guidelines

Power supply decoupling should be performed as shown in Figure 25 or Figure 26,
depending on whether VREF+ is connected to VDDA or not. The 10 nF capacitors should be
ceramic (good quality). They should be placed as close as possible to the chip.
Figure 25. Power supply and reference decoupling (VREF+ not connected to VDDA)
STM32Lxx
VREF+
1 μF // 100 nF VDDA
1 μF // 100 nF
VSSA
MS41913V1
86/124 DS10183 Rev 11

Figure 26. Power supply and reference decoupling (VREF+ connected to VDDA)
STM32Lxx
VREF+/VDDA
1 μF // 100 nF
VSSA
MS41914V1
DS10183 Rev 11 87/124

101
6.3.16 DAC electrical characteristics

Data guaranteed by design, not tested in production, unless otherwise specified.
Table 58. DAC characteristics

VDDA Analog supply voltage - 1.8 - 3.6 V
VREF+ must always be

VREF+ Reference supply voltage 1.8 - 3.6 V
below VDDA
No load, middle code
Current consumption on VREF+ (0x800) - 130 220
IDDVREF+(1) supply µA
VREF+ = 3.3 V No load, worst code
- 220 350
(0x000)
No load, middle code
Current consumption on VDDA - 340 340
(0x800)
IDDA (2) supply, µA
VDDA = 3.3 V No load, worst code
- 340 340
(0xF1C)
RL
connected 5 - -
DAC output to VSSA
RL(3) Resistive load kΩ
ON R L
connected 25 - -
to VDDA
CL(3) Capacitive load DAC output buffer ON - - 50 pF
RO Output impedance DAC output buffer OFF 12 16 20 kΩ
DAC output buffer ON 0.2 - VDDA – 0.2 V
VDAC_OUT Voltage on DAC_OUT output

VREF+ –
DAC output buffer OFF 0.5 - mV
1LSB
88/124 DS10183 Rev 11

Table 58. DAC characteristics (continued)

CL ≤ 50 pF, RL ≥ 5 kΩ
- 1.5 3
DAC output buffer ON
DNL(2) Differential non linearity(4)
No RLOAD, CL ≤ 50 pF
- 1.5 3
DAC output buffer OFF
CL ≤ 50 pF, RL ≥ 5 kΩ
- 2 4
INL(2) Integral non linearity(5)
No RLOAD, CL ≤ 50 pF LSB
- 2 4
CL ≤ 50 pF, RL ≥ 5 kΩ
- ±10 ±25
Offset(2) Offset error at code 0x800 (6)
- ±5 ±8
Offset1(2) Offset error at code 0x001(7) - ±1.5 ±5
VDDA = 3.3V
VREF+= 3.0 V
-20 -10 0
TA = 0 to 50 °C
Offset error temperature DAC output buffer OFF
dOffset/dT(2) µV/°C
coefficient (code 0x800) VDDA = 3.3V
VREF+= 3.0 V
0 20 50
TA = 0 to 50 °C
CL ≤ 50 pF, RL ≥ 5 kΩ
- +0.1 / -0.2% +0.2 / -0.5%
Gain(2) Gain error(8) %
- +0 / -0.2% +0 / -0.4%
VDDA = 3.3V
VREF+= 3.0 V
-10 -2 0
TA = 0 to 50 °C
Gain error temperature DAC output buffer OFF
dGain/dT(2) µV/°C
coefficient VDDA = 3.3V
VREF+= 3.0 V
-40 -8 0
TA = 0 to 50 °C
CL ≤ 50 pF, RL ≥ 5 kΩ
- 12 30
TUE(2) Total unadjusted error LSB
- 8 12
DS10183 Rev 11 89/124

101
Table 58. DAC characteristics (continued)

Settling time (full scale: for a

12-bit code transition between
tSETTLING the lowest and the highest CL ≤ 50 pF, RL ≥ 5 kΩ - 7 12 µs
input codes till DAC_OUT
reaches final value ±1LSB
Max frequency for a correct
DAC_OUT change (95% of
Update rate CL ≤ 50 pF, RL ≥ 5 kΩ - - 1 Msps
final value) with 1 LSB
variation in the input code
Wakeup time from off state
tWAKEUP (setting the ENx bit in the DAC CL ≤ 50 pF, RL ≥ 5 kΩ - 9 15 µs
Control register)(9)
VDDA supply rejection ratio
PSRR+ CL ≤ 50 pF, RL ≥ 5 kΩ - -60 -35 dB
(static DC measurement)
2. Guaranteed by design, not tested in production.
3. Connected between DAC_OUT and VSSA.
4. Difference between two consecutive codes - 1 LSB.
5. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code 4095.
6. Difference between the value measured at Code (0x800) and the ideal value = VREF+/2.
7. Difference between the value measured at Code (0x001) and the ideal value.
8. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and 0xFFF when
buffer is OFF, and from code giving 0.2 V and (VDDA – 0.2) V when buffer is ON.
9. In buffered mode, the output can overshoot above the final value for low input code (starting from min value).
Figure 27. 12-bit buffered/non-buffered DAC

Buffered/Non-buffered DAC
Buffer(1)
RL
12-bit
digital to DAC_OUTx
analog
converter
CL
MSv45341V1
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external
loads directly without the use of an external operational amplifier. The buffer can be bypassed by
configuring the BOFFx bit in the DAC_CR register.
90/124 DS10183 Rev 11

6.3.17 Temperature sensor characteristics
Table 59. Temperature sensor calibration values


TS_CAL1 0x1FF8 007A - 0x1FF8 007B
temperature of 30 °C, VDDA= 3 V
TS_CAL2 0x1FF8 007E - 0x1FF8 007F
temperature of 130 °C, VDDA= 3 V
Table 60. Temperature sensor characteristics

Symbol Parameter Min Typ Max Unit
TL(1) VSENSE linearity with temperature - ±1 ±2 °C

(1)
Avg_Slope Average slope 1.48 1.61 1.75 mV/°C
V130 Voltage at 130°C ±5°C(2) 640 670 700 mV
IDDA(TEMP)(3) Current consumption - 3.4 6 µA
tSTART(3) Startup time - - 10
µs
TS_temp(4)(3) ADC sampling time when reading the temperature 10 - -
2. Measured at VDD = 3 V ±10 mV. V130 ADC conversion result is stored in the TS_CAL2 byte.
4. Shortest sampling time can be determined in the application by multiple iterations.
6.3.18 Comparators
Table 61. Comparator 1 characteristics

Symbol Parameter Conditions Min(1) Typ Max(1) Unit
VDDA Analog supply voltage - 1.65 3.6 V

Comparator 1 input voltage
VIN - 0.6 - VDDA V
range
tSTART Comparator startup time - - 7 10
(2)
µs
td Propagation delay - - 3 10
Voffset Comparator offset - - ±3 ±10 mV
Comparator offset variation in VDDA = 3.6 V, VIN+ = 0 V,
dVoffset/dt 0 1.5 10 mV/1000 h
worst voltage stress conditions VIN- = VREFINT, TA = 25 °C
ICOMP1 Current consumption(3) - - 160 260 nA
1. Guaranteed by characterization.
2. The delay is characterized for 100 mV input step with 10 mV overdrive on the inverting input, the non-inverting input set to
the reference.
3. Comparator consumption only. Internal reference voltage not included.
DS10183 Rev 11 91/124

101
Table 62. Comparator 2 characteristics

Symbol Parameter Conditions Min Typ Max(1) Unit
VDDA Analog supply voltage - 1.65 - 3.6 V

VIN Comparator 2 input voltage range - 0 - VDDA V
Fast mode - 15 20
tSTART Comparator startup time
Slow mode - 20 25
1.65 V ≤ VDDA ≤ 2.7 V - 1.8 3.5
td slow Propagation delay(2) in slow mode µs
2.7 V ≤ VDDA ≤ 3.6 V - 2.5 6
1.65 V ≤ VDDA ≤ 2.7 V - 0.8 2
td fast Propagation delay(2) in fast mode
2.7 V ≤ VDDA ≤ 3.6 V - 1.2 4
Voffset Comparator offset error - ±4 ±20 mV
VDDA = 3.3V, TA = 0 to 50 °C,
V- = VREFINT,
dThreshold/ Threshold voltage temperature ppm
3/4 VREFINT, - 15 30
dt coefficient /°C
1/2 VREFINT,
1/4 VREFINT.
Fast mode - 3.5 5
ICOMP2 Current consumption(3) µA
Slow mode - 0.5 2
2. The delay is characterized for 100 mV input step with 10 mV overdrive on the inverting input, the non-inverting input set to
the reference.
3. Comparator consumption only. Internal reference voltage (required for comparator operation) is not included.
92/124 DS10183 Rev 11

6.3.19 Timer characteristics

TIM timer characteristics
The parameters given in the Table 63 are guaranteed by design.
Refer to Section 6.3.13: I/O port characteristics for details on the input/output alternate
function characteristics (output compare, input capture, external clock, PWM output).
Table 63. TIMx characteristics(1)

1 - tTIMxCLK
tres(TIM) Timer resolution time
fTIMxCLK = 32 MHz 31.25 - ns
Timer external clock frequency on CH1 0 fTIMxCLK/2 MHz

fEXT
to CH4 fTIMxCLK = 32 MHz 0 16 MHz
ResTIM Timer resolution - 16 bit
16-bit counter clock period when - 1 65536 tTIMxCLK
tCOUNTER internal clock is selected (timer’s
prescaler disabled) fTIMxCLK = 32 MHz 0.0312 2048 µs
- - 65536 × 65536 tTIMxCLK

tMAX_COUNT Maximum possible count
fTIMxCLK = 32 MHz - 134.2 s
1. TIMx is used as a general term to refer to the TIM2, TIM6, TIM21, and TIM22 timers.
6.3.20 Communications interfaces

I2C interface characteristics
The I2C interface meets the timings requirements of the I2C-bus specification and user
manual rev. 03 for:
• Standard-mode (Sm) : with a bit rate up to 100 kbit/s
• Fast-mode (Fm) : with a bit rate up to 400 kbit/s
• Fast-mode Plus (Fm+) : with a bit rate up to 1 Mbit/s.
The I2C timing requirements are guaranteed by design when the I2C peripheral is properly
configured (refer to the reference manual for details). The SDA and SCL I/O requirements
are met with the following restrictions: the SDA and SCL I/O pins are not "true" open-drain.
When configured as open-drain, the PMOS connected between the I/O pin and VDDIOx is
disabled, but is still present. Only FTf I/O pins support Fm+ low level output current
maximum requirement (refer to Section 6.3.13: I/O port characteristics for the I2C I/Os
characteristics).
All I2C SDA and SCL I/Os embed an analog filter (see Table 64 for the analog filter
characteristics).
DS10183 Rev 11 93/124

101
The analog spike filter is compliant with I2C timings requirements only for the following
voltage ranges:
• Fast mode Plus: 2.7 V ≤ VDD ≤ 3.6 V and voltage scaling Range 1
• Fast mode:
– 2 V ≤ VDD ≤ 3.6 V and voltage scaling Range 1 or Range 2.
– VDD < 2 V, voltage scaling Range 1 or Range 2, Cload < 200 pF.
In other ranges, the analog filter should be disabled. The digital filter can be used instead.
Note: In Standard mode, no spike filter is required.
Table 64. I2C analog filter characteristics(1)

Range 1 100(3)
Maximum pulse width of spikes that
tAF Range 2 50(2) - ns
are suppressed by the analog filter
Range 3 -
2. Spikes with widths below tAF(min) are filtered.
3. Spikes with widths above tAF(max) are not filtered
SPI characteristics
Unless otherwise specified, the parameters given in the following tables are derived from
tests performed under ambient temperature, fPCLKx frequency and VDD supply voltage
conditions summarized in Table 21.
Refer to Section 6.3.12: I/O current injection characteristics for more details on the
input/output alternate function characteristics (NSS, SCK, MOSI, MISO).
Table 65. SPI characteristics in voltage Range 1 (1)

Master mode 16
Slave mode - -
16
receiver
fSCK Slave mode

SPI clock frequency Transmitter - - 12(2) MHz
1/tc(SCK)
1.71<VDD<3.6V
Slave mode
Transmitter - - 16(2)
2.7<VDD<3.6V
Duty cycle of SPI clock
Duty(SCK) Slave mode 30 50 70 %
frequency
94/124 DS10183 Rev 11

Table 65. SPI characteristics in voltage Range 1 (1) (continued)

Slave mode, SPI

tsu(NSS) NSS setup time 4*Tpclk - -
presc = 2
Slave mode, SPI
th(NSS) NSS hold time 2*Tpclk - -
presc = 2
tw(SCKH) Tpclk+
SCK high and low time Master mode Tpclk-2 Tpclk
tw(SCKL) 2
tsu(MI) Master mode 0 - -

Data input setup time
tsu(SI) Slave mode 3 - -
th(MI) Master mode 7 - -
Data input hold time
th(SI) Slave mode 3.5 - - ns
ta(SO Data output access time Slave mode 15 - 36
tdis(SO) Data output disable time Slave mode 10 - 30
Slave mode
- 18 41
1.65 V<VDD<3.6 V
tv(SO)
Data output valid time Slave mode
- 18 25
2.7 V<VDD<3.6 V
tv(MO) Master mode - 4 7
th(SO) Slave mode 10 - -
Data output hold time
th(MO) Master mode 0 - -
2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI)
which has to fit into SCK low or high phase preceding the SCK sampling edge. This value can be
achieved when the SPI communicates with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
DS10183 Rev 11 95/124

101

Master mode 8
Slave mode Transmitter
fSCK 8
SPI clock frequency 1.65<VDD<3.6V - - MHz
1/tc(SCK)
Slave mode Transmitter
8(2)
2.7<VDD<3.6V
frequency
tsu(NSS) NSS setup time Slave mode, SPI presc = 2 4*Tpclk - -
th(NSS) NSS hold time Slave mode, SPI presc = 2 2*Tpclk - -
tw(SCKH)
SCK high and low time Master mode Tpclk-2 Tpclk Tpclk+2
tw(SCKL)
tsu(MI) Master mode 0 - -
th(MI) Master mode 11 - -
Data input hold time ns
th(SI) Slave mode 4.5 - -
tv(SO) Slave mode - 20 56.5

Data output valid time
2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI) which has to fit
into SCK low or high phase preceding the SCK sampling edge. This value can be achieved when the SPI communicates
with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
96/124 DS10183 Rev 11


fSCK Master mode 2

SPI clock frequency - - MHz
1/tc(SCK) Slave mode 2(2)
frequency
tsu(NSS) NSS setup time Slave mode, SPI presc = 2 4*Tpclk - -
th(NSS) NSS hold time Slave mode, SPI presc = 2 2*Tpclk - -
tw(SCKH)
SCK high and low time Master mode Tpclk-2 Tpclk Tpclk+2
tw(SCKL)
tsu(MI) Master mode 1.5 - -
th(MI) Master mode 13.5 - -
Data input hold time ns
th(SI) Slave mode 16 - -
tv(SO) Slave mode - 30 70

Data output valid time
2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI) which has to fit
into SCK low or high phase preceding the SCK sampling edge. This value can be achieved when the SPI communicates
with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
DS10183 Rev 11 97/124

101
Figure 28. SPI timing diagram - slave mode and CPHA = 0
NSS input
tc(SCK) th(NSS)
tsu(NSS) tw(SCKH) tr(SCK)

CPHA=0
SCK input
CPOL=0
CPHA=0
CPOL=1
ta(SO) tw(SCKL) tv(SO) th(SO) tf(SCK) tdis(SO)
MISO output First bit OUT Next bits OUT Last bit OUT
th(SI)
tsu(SI)
MOSI input First bit IN Next bits IN Last bit IN
MSv41658V1
Figure 29. SPI timing diagram - slave mode and CPHA = 1(1)
NSS input
tc(SCK)
tsu(NSS) tw(SCKH) tf(SCK) th(NSS)

CPHA=1
SCK input
CPOL=0
CPHA=1
CPOL=1
ta(SO) tw(SCKL) tv(SO) th(SO) tr(SCK) tdis(SO)
MISO output First bit OUT Next bits OUT Last bit OUT
tsu(SI) th(SI)
MOSI input First bit IN Next bits IN Last bit IN
MSv41659V1
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
98/124 DS10183 Rev 11

Figure 30. SPI timing diagram - master mode(1)
High
NSS input
tc(SCK)
SCK Output
CPHA= 0
CPOL=0
CPHA= 0
CPOL=1
SCK Output
CPHA=1
CPOL=0
CPHA=1
CPOL=1
tw(SCKH) tr(SCK)
tsu(MI) tw(SCKL) tf(SCK)
MISO
INP UT MSB IN BIT6 IN LSB IN
th(MI)
MOSI
MSB OUT B I T1 OUT LSB OUT
OUTPUT
tv(MO) th(MO)
ai14136d
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
DS10183 Rev 11 99/124

101
USB characteristics
The USB interface is USB-IF certified (full speed).
Table 68. USB startup time

Symbol Parameter Max Unit
tSTARTUP(1) USB transceiver startup time 1 µs

Table 69. USB DC electrical characteristics

Symbol Parameter Conditions Min.(1) Max.(1) Unit
Input levels
VDD USB operating voltage - 3.0 3.6 V

VDI(2) Differential input sensitivity I(USB_DP, USB_DM) 0.2 -
VCM(2) Differential common mode range Includes VDI range 0.8 2.5 V
VSE(2) Single ended receiver threshold - 1.3 2.0
Output levels
VOL(3) Static output level low RL of 1.5 kΩ to 3.6 V(4) - 0.3

V
(3)
VOH Static output level high RL of 15 kΩ to VSS(4) 2.8 3.6
1. All the voltages are measured from the local ground potential.
4. RL is the load connected on the USB drivers.
Figure 31. USB timings: definition of data signal rise and fall time
Cross over
points
Differential
data lines
VCRS
VSS
tf tr
ai14137b
100/124 DS10183 Rev 11

Table 70. USB: full speed electrical characteristics

Driver characteristics(1)
tr Rise time(2) CL = 50 pF 4 20 ns
(2)
tf Fall Time CL = 50 pF 4 20 ns
trfm Rise/ fall time matching tr/tf 90 110 %
VCRS Output signal crossover voltage 1.3 2.0 V
2. Measured from 10% to 90% of the data signal. For more detailed informations, please refer to USB
Specification - Chapter 7 (version 2.0).
DS10183 Rev 11 101/124

101
Package information STM32L062x8
7 Package information
In order to meet environmental requirements, ST offers these devices in different grades of

ECOPACK packages, depending on their level of environmental compliance. ECOPACK
specifications, grade definitions and product status are available at www.st.com. ECOPACK
is an ST trademark.
7.1 UFQFPN48 package information

package outline
Pin 1 identifier
laser marking area
D
A
E E
T Seating
plane
ddd A1
e b
Detail Y
D
Y
Exposed pad
area D2
1
L
48
C 0.500x45°
pin1 corner R 0.125 typ.
E2 Detail Z
48
Z
A0B9_ME_V3
1. Drawing is not to scale.

2. All leads/pads should also be soldered to the PCB to improve the lead/pad solder joint life.
3. There is an exposed die pad on the underside of the UFQFPN package. It is recommended to connect and
solder this back-side pad to PCB ground.
102/124 DS10183 Rev 11

STM32L062x8 Package information
Table 71. UFQFPN48 - 48 leads, 7x7 mm, 0.5 mm pitch, ultra thin fine pitch quad flat
package mechanical data
millimeters inches(1)
Symbol
Min Typ Max Min Typ Max
A 0.500 0.550 0.600 0.0197 0.0217 0.0236

A1 0.000 0.020 0.050 0.0000 0.0008 0.0020
D 6.900 7.000 7.100 0.2717 0.2756 0.2795
E 6.900 7.000 7.100 0.2717 0.2756 0.2795
D2 5.500 5.600 5.700 0.2165 0.2205 0.2244
E2 5.500 5.600 5.700 0.2165 0.2205 0.2244
L 0.300 0.400 0.500 0.0118 0.0157 0.0197
T - 0.152 - - 0.0060 -
b 0.200 0.250 0.300 0.0079 0.0098 0.0118
e - 0.500 - - 0.0197 -
ddd - - 0.080 - - 0.0031
1. Values in inches are converted from mm and rounded to 4 decimal digits.
package recommended footprint
7.30
6.20
48 37
1 36
0.20 5.60
7.30
5.80
6.20
5.60
0.30
12 25
13 24
0.50 0.75
0.55
5.80
A0B9_FP_V2
1. Dimensions are expressed in millimeters.
DS10183 Rev 11 103/124

117
Device marking for UFQFPN48

The following figure gives an example of topside marking versus pin 1 position identifier
location.
The printed markings may differ depending on the supply chain.
Other optional marking or inset/upset marks, which depend on supply chain operations, are
not indicated below.
Figure 34. UFQFPN48 marking example (package top view)
Product identification(1)
STM32L062
C8U6
Date code
Y WW
Revision code
Pin 1
indentifier
R
MSv63963V1
1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet
qualified and therefore not approved for use in production. ST is not responsible for any consequences
resulting from such use. In no event will ST be liable for the customer using any of these engineering
samples in production. ST’s Quality department must be contacted prior to any decision to use these
engineering samples to run a qualification activity.
104/124 DS10183 Rev 11

7.2 Standard WLCSP36 package information

package outline
e1 A1 ball location bbb Z
e F
A G
Detail A
e2
e
F
6 1 A3
A2
A
Bump side Side view
Bump
A1
orientation E eee Z A1
reference
aaa Z
Øb (36 balls) b
4x Seating plane
ccc Z X Y
ddd Z
Wafer back side Detail A
(rotated 90 °)
A01Y_ME_V2

2. b dimensions is measured at the maximum bump diameter parallel to primary datum Z
mechanical data
Symbol
A - - 0.59 - - 0.023
A1 - 0.18 - - 0.007 -
A2 - 0.38 - - 0.015 -
A3 - 0.025(2) - - 0.001 -
b 0.22 0.25 0.28 0.009 0.010 0.011
D 2.59 2.61 2.63 0.102 0.103 0.104
E 2.86 2.88 2.90 0.112 0.113 0.114
e - 0.40 - - 0.016 -
e1 - 2.00 - - 0.079 -
e2 - 2.00 - - 0.079 -
DS10183 Rev 11 105/124

117
mechanical data (continued)
Symbol
F - 0.305(3) - - 0.012 -
G - 0.440(3) - - 0.017 -
aaa - - 0.100 - - 0.004
bbb - - 0.100 - - 0.004
ccc - - 0.100 - - 0.004
ddd - - 0.050 - - 0.002
eee - - 0.050 - - 0.002
1. Values in inches are converted from mm and rounded to the 3rd decimal place.
2. Nominal dimension rounded to the 3rd decimal place results from process capability.
3. Calculated dimensions are rounded to the 3rd decimal place.
recommended footprint
Dpad
Dsm MS18965V2
Table 73. Standard WLCSP36 recommended PCB design rules

Dimension Recommended values
Pitch 0.4 mm
260 µm max. (circular)
Dpad
220 µm recommended
Dsm 300 µm min. (for 260 µm diameter pad)
PCB pad design Non-solder mask defined via underbump allowed
106/124 DS10183 Rev 11

7.3 Thin WLCSP36 package information

package outline
F A1 Ball location bbb Z

e1
G A1
DETAIL A
e2
e
b
e
A
A3
BOTTOM VIEW A2
SIDE VIEW
BUMP
E
A1
A1 ORIENTATION
REFERENCE eee Z
aaa
D b (36x)
ccc Z X Y
TOP VIEW ddd Z
SEATING PLANE
DETAIL A
ROTATED 90
A097_ME_V2

2. b dimensions is measured at the maximum bump diameter parallel to primary datum Z.
3. Primary datum Z and seating plane are defined by the spherical crowns of the bump.
4. Bump position designation per JESD 95-1, SPP-010.
DS10183 Rev 11 107/124

117
Table 74. Thin WLCSP36 - 2.61 x 2.88 mm, 0.4 mm pitch wafer level chip scale
Symbol
A - - 0.33 - - 0.013
A1 - 0.10 - - 0.004 -
A2 - 0.20 - - 0.008 -
(2)
A3 - 0.025 - - 0.001 -
b 0.16 0.19 0.22 0.006 0.007 0.009
D 2.59 2.61 2.63 0.102 0.103 0.104
E 2.86 2.88 2.90 0.112 0.113 0.114
e - 0.40 - - 0.016 -
e1 - 2.00 - - 0.079 -
e2 - 2.00 - - 0.079 -
F - 0.305(3) - - 0.012 -
G - 0.440(3) - - 0.017 -
aaa - - 0.10 - - 0.004
bbb - - 0.10 - - 0.004
ccc - - 0.10 - - 0.004
ddd - - 0.05 - - 0.002
eee - - 0.05 - - 0.002
1. Values in inches are converted from mm and rounded to the 3rd decimal place.
2. Back side coating. Nominal dimension rounded to the 3rd decimal place results from process capability.
3. Calculated dimensions are rounded to 3rd decimal place.
package recommended footprint
Dpad
Dsm MS18965V2
108/124 DS10183 Rev 11

Table 75. WLCSP36 recommended PCB design rules

Dimension Recommended values
Pitch 0.4 mm
260 µm max. (circular)
Dpad
220 µm recommended
Dsm 300 µm min. (for 260 µm diameter pad)
PCB pad design Non-solder mask defined via underbump allowed
7.4 LQFP32 package information

Figure 39. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package outline
SEATING
PLANE
C
A2
A
c
A1
0.25 mm
GAUGE PLANE
ccc C
K
D
L
A1
D1
L1
D3
24 17
25 16
b
E1
E3
32 9
PIN 1
IDENTIFICATION 1 8
e 5V_ME_V2
DS10183 Rev 11 109/124

117
Table 76. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package mechanical data
Symbol
A - - 1.600 - - 0.0630
A1 0.050 - 0.150 0.0020 - 0.0059
A2 1.350 1.400 1.450 0.0531 0.0551 0.0571
b 0.300 0.370 0.450 0.0118 0.0146 0.0177
c 0.090 - 0.200 0.0035 - 0.0079
D 8.800 9.000 9.200 0.3465 0.3543 0.3622
D1 6.800 7.000 7.200 0.2677 0.2756 0.2835
D3 - 5.600 - - 0.2205 -
E 8.800 9.000 9.200 0.3465 0.3543 0.3622
E1 6.800 7.000 7.200 0.2677 0.2756 0.2835
E3 - 5.600 - - 0.2205 -
e - 0.800 - - 0.0315 -
L 0.450 0.600 0.750 0.0177 0.0236 0.0295
L1 - 1.000 - - 0.0394 -
k 0° 3.5° 7° 0° 3.5° 7°
ccc - - 0.100 - - 0.0039
Figure 40. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat recommended footprint

0.80
1.20
24 17
25 16 0.50
0.30
7.30
6.10
9.70
7.30
32 9
1 8
1.20
6.10
9.70
5V_FP_V2
110/124 DS10183 Rev 11

Device marking for LQFP32

location.
Figure 41. LQFP32 marking example (package top view)
STM32L
(1)
Product identification
062K8T6
Date code
Y WW
Revision code
Pin 1 indentifier
MSv37839V1
DS10183 Rev 11 111/124

117
7.5 UFQFPN32 package information

package outline
ddd C
e A1
C
A3
SEATINGPLANE
D1
b
E2 b
E1 E
1
L
32
D2 L
PIN 1 Identifier
A0B8_ME_V3

2. There is an exposed die pad on the underside of the UFQFPN package. It is recommended to connect and
solder this backside pad to PCB ground.
112/124 DS10183 Rev 11

Table 77. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat
Symbol
A 0.500 0.550 0.600 0.0197 0.0217 0.0236

A1 - - 0.050 - - 0.0020
A3 - 0.152 - - 0.0060 -
b 0.180 0.230 0.280 0.0071 0.0091 0.0110
D 4.900 5.000 5.100 0.1929 0.1969 0.2008
D1 3.400 3.500 3.600 0.1339 0.1378 0.1417
D2 3.400 3.500 3.600 0.1339 0.1378 0.1417
E 4.900 5.000 5.100 0.1929 0.1969 0.2008
E1 3.400 3.500 3.600 0.1339 0.1378 0.1417
E2 3.400 3.500 3.600 0.1339 0.1378 0.1417
e - 0.500 - - 0.0197 -
L 0.300 0.400 0.500 0.0118 0.0157 0.0197
ddd - - 0.080 - - 0.0031
recommended footprint
5.30
3.80
0.60
32 25
1 24
3.45
5.30 3.80
3.45
0.50
0.30 8 17
9 16 0.75
3.80
A0B8_FP_V2
DS10183 Rev 11 113/124

117
Device marking for UFQFPN32

location.
Figure 44. UFQFPN32 marking example (package top view)
Product identification(1)
L062K86
Date code = Year + week
Y WW
Revision code
R
Pin 1
MSv37855V1
114/124 DS10183 Rev 11

7.6 Thermal characteristics

The maximum chip-junction temperature, TJ max, in degrees Celsius, may be calculated
using the following equation:
TJ max = TA max + (PD max × ΘJA)
Where:
• TA max is the maximum ambient temperature in °C,
• ΘJA is the package junction-to-ambient thermal resistance, in °C/W,
• PD max is the sum of PINT max and PI/O max (PD max = PINT max + PI/Omax),
• PINT max is the product of IDD and VDD, expressed in Watts. This is the maximum chip
internal power.
PI/O max represents the maximum power dissipation on output pins where:
PI/O max = Σ (VOL × IOL) + Σ((VDD – VOH) × IOH),
taking into account the actual VOL / IOL and VOH / IOH of the I/Os at low and high level in the
application.
Table 78. Thermal characteristics

Symbol Parameter Value Unit
Thermal resistance junction-ambient
63
Standard WLCSP36 - 0.4 mm pitch
59
Thin WLCSP36 - 0.4 mm pitch
ΘJA 57 °C/W
LQFP32 - 7 x 7 mm / 0.8 mm pitch
38
UFQFPN32 - 5 x 5 mm / 0.5 mm pitch
31
UFQFPN48 - 7 x 7 mm / 0.5 mm pitch
DS10183 Rev 11 115/124

117
Figure 45. Thermal resistance
4000
3500
3000
UQFN32
2500 LQFP32
PD (mW)
UFQFPN48
2000 Standard
WLCSP36
Thin
1500 WLCSP36
1000
500
0
125 100 75 50 25 0
Temperature (°C)
MSv34780V7
7.6.1 Reference document

JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions - Natural
Convection (Still Air). Available from www.jedec.org.
116/124 DS10183 Rev 11

STM32L062x8 Ordering information
8 Ordering information
Example: STM32 L 062 K 8 U 6 D TR
Device family
STM32 = Arm-based 32-bit microcontroller
Product type
L = Low power
Device subfamily
062 = USB + AES
Pin count
K = 32 pins
T = 36 pins
C = 48/49 pins
Flash memory size

8 = 64 Kbytes
Package
T = LQFP
U = UFQFPN
Y = Standard WLCSP
F = Thin WLCSP pins
Temperature range
6 = Industrial temperature range, –40 to 85 °C
Options
No character = VDD range: 1.8 to 3.6 V and BOR enabled
D = VDD range: 1.65 to 3.6 V and BOR disabled
Packing
TR = tape and reel
No character = tray or tube
For a list of available options (speed, package, etc.) or for further information on any aspect
of this device, please contact your nearest ST sales office.
DS10183 Rev 11 117/124

117
Revision history STM32L062x8
9 Revision history
Table 79. Document revision history

Date Revision Changes
19-
Feb- 1 Initial release.
2014
HSE clock removed in the whole document.
Updated Table 2: Functionalities depending on the operating power supply
range. Added Section 3.2: Interconnect matrix.
Replaced TTa I/O structure by TC, updated PA0/4/5, PC14, BOOT0 and NRST
I/O structure, and added note 2 in Table 15: STM32L062x8 pin definitions.
Updated Table 18: Voltage characteristics and Table 19: Current
characteristics.
Updated Table 25: Current consumption in Run mode, code with data
processing running from Flash and Table 26: Current consumption in Run
mode, code with data processing running from RAM, Table 27: Current
consumption in Sleep mode, Table 28: Current consumption in Low-power run
mode, Table 29: Current consumption in Low-power sleep mode, Table 30:
Typical and maximum current consumptions in Stop mode and Table 31:
Typical and maximum current consumptions in Standby mode. Added
Figure 11: IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from
Flash memory, Range 2, HSE, 1WS, Figure 12: IDD vs VDD, at TA=
29-Apr-
2 25/55/85/105 °C, Run mode, code running from Flash memory, Range 2,
2014
HSI16, 1WS, Figure 13: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power
run mode, code running from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS
and Figure 14: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC
enabled and running on LSE Low drive.
Updated Table 37: LSE oscillator characteristics. Added Figure 18: HSI16
minimum and maximum value versus temperature.
Updated Table 48: ESD absolute maximum ratings, Table 50: I/O current
injection susceptibility and Table 51: I/O static characteristics, and added
Figure 19: VIH/VIL versus VDD (CMOS I/Os) and Figure 20: VIH/VIL versus
VDD (TTL I/Os). Updated Table 52: Output voltage characteristics, Table 53:
I/O AC characteristics and Figure 21: I/O AC characteristics definition.
Updated Table 55: ADC characteristics, Table 57: ADC accuracy, and
Figure 24: Typical connection diagram using the ADC. Updated Table 60:
Temperature sensor characteristics.
Updated Table 66: SPI characteristics and Table 69: I2S characteristics.
Added Figure 45: Thermal resistance.
118/124 DS10183 Rev 11

STM32L062x8 Revision history
Table 79. Document revision history (continued)

Changed datasheet status to Production Data.

ADC now guaranteed down to 1.65 V.
Cover page: updated core speed, added minimum supply voltage for ADC,
DAC and comparators.
Updated RTC/TIM21 in Table 5: STM32L062x8 peripherals interconnect
matrix.
Updated Table 2: Functionalities depending on the operating power supply
range.
Updated list of applications in Section 1: Introduction. Changed number of I2S
interfaces to one in Section 2: Description.
Updated Section 3.4.1: Power supply schemes.
Updated Figure 5: STM32L062x8 LQFP32 pinout.
Updated VDDA in Table 21: General operating conditions.
Updated Table 25: Current consumption in Run mode, code with data
25-Jun- processing running from Flash and Table 26: Current consumption in Run
3
2014 mode, code with data processing running from RAM. Updated Table 27:
Current consumption in Sleep mode, Table 28: Current consumption in Low-
power run mode, Table 29: Current consumption in Low-power sleep mode,
Table 30: Typical and maximum current consumptions in Stop mode, Table 31:
Typical and maximum current consumptions in Standby mode, and added
Table 32: Average current consumption during Wakeup.
Updated Table 33: Peripheral current consumption in Run or Sleep mode and
added Table 34: Peripheral current consumption in Stop and Standby mode.
Updated Table 39: HSI48 oscillator characteristics.
Updated tLOCK in Table 42: PLL characteristics.
Updated Table 44: Flash memory and data EEPROM characteristics and
Table 45: Flash memory and data EEPROM endurance and retention.
Updated Table 53: I/O AC characteristics.
Updated Table 55: ADC characteristics.
Updated Figure 45: Thermal resistance and added note 1.
DS10183 Rev 11 119/124

123

Extended operating temperature range to 125 °C.

Updated minimum ADC operating voltage to 1.65 V.
Replaced USART3 by LPUART1 in Table 15: STM32L062x8 pin definitions,
Table 16: Alternate functions for port A, and Table 17: Alternate functions for
port B.
Updated temperature range in Section 2: Description, Table 1: Ultra-low-power
STM32L062x8 device features and peripheral counts.
Updated PD, TA and TJ to add range 3 in Table 21: General operating conditions.
Added range 3 in Table 45: Flash memory and data EEPROM endurance and
retention and Table : . Update note 1 in Table 25: Current consumption in Run
mode, code with data processing running from Flash, Table 26: Current
consumption in Run mode, code with data processing running from RAM,
Table 27: Current consumption in Sleep mode, Table 28: Current consumption
in Low-power run mode, Table 29: Current consumption in Low-power sleep
mode, Table 30: Typical and maximum current consumptions in Stop mode,
Table 31: Typical and maximum current consumptions in Standby mode and
05- Table 35: Low-power mode wakeup timings. Updated Figure 45: Thermal
Sep- 4 resistance and removed note 1. Updated Figure 12: IDD vs VDD, at TA=
2014 25/55/85/105 °C, Run mode, code running from Flash memory, Range 2,
HSI16, 1WS, Figure 13: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power
run mode, code running from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS,
Figure 14: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC
enabled and running on LSE Low drive.
Updated Table 31: Typical and maximum current consumptions in Standby
mode.
Updated SYSCFG in Table 33: Peripheral current consumption in Run or Sleep
mode.
Updated Table 34: Peripheral current consumption in Stop and Standby mode
and Table 35: Low-power mode wakeup timings.
Updated ACCHSI16 temperature conditions in Table 38: 16 MHz HSI16
oscillator characteristics. Changed ambient temperature range in note 1 below
Table 39: HSI48 oscillator characteristics.
Updated VF(NRST) and VNF(NRST) in Table 54: NRST pin characteristics.
Updated Table 55: ADC characteristics and Table 57: ADC accuracy.
Added range 3 in Table : .
120/124 DS10183 Rev 11


Added LQFP32 package.

Removed SPI2, I2S, I2C2, LPUART and VDD_USB in the whole document.
Changed number of ADC channels to 10.
Corrected number of GPIOs in Table 1: Ultra-low-power STM32L062x8 device
features and peripheral counts.
Updated current consumption in Run mode in Section : Features.
Removed GPIOD and H from Figure 1: STM32L062x8 block diagram.
Updated Table 8: Capacitive sensing GPIOs available on STM32L062x8
devices.
Updated Figure 6: STM32L062x8 UFQFPN32 pinout.
Renamed BOOT1 into nBOOT1.
Changed USARTx_RTS into USARTx_RTS_DE.
ADC no more available in Low-power run and Low-power Sleep modes in
Table 4: Functionalities depending on the working mode (from Run/active
down to standby).
Added I2C alternate functions on PB6/7 in Table 17: Alternate functions for port
B.
In whole Section 6: Electrical characteristics, modified notes related to
characteristics guaranteed by design and by tests during characterization.
Updated Table 18: Voltage characteristics.
Updated ΣIIO(PIN) in Table 19: Current characteristics.
26-Oct- UpdatedFigure 13: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run
5
2015 mode, code running from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS ,
Figure 14: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC
enabled and running on LSE Low drive and Figure 15: IDD vs VDD, at TA=
25/55/85/105/125 °C, Stop mode with RTC disabled, all clocks OFF.
Changed temperature condition in Table 7: Internal voltage reference
measured values and Table 23: Embedded internal reference voltage
calibration values.
Updated TCoeff in Table 24: Embedded internal reference voltage.
Added note 1 in Table 34: Peripheral current consumption in Stop and Standby
mode.
Updated Table 35: Low-power mode wakeup timings.
Added MSI oscillator temperature frequency drift in Table 41: MSI oscillator
characteristics.
Updated Table 46: EMS characteristics and Table 47: EMI characteristics.
Updated Table 55: ADC characteristics.
Section : I2C interface characteristics: updated introduction, Table 64: I2C
analog filter characteristics.
Updated Figure 28: SPI timing diagram - slave mode and CPHA = 0.
Updated note below Figure 41: LQFP32 marking example (package top view)
and Figure 44: UFQFPN32 marking example (package top view).
Updated Ilkg in Table 50: I/O current injection susceptibility and Table 51: I/O
static characteristics.
DS10183 Rev 11 121/124

123

Updated number of SPIs on cover page and in Table 1: Ultra-low-power

STM32L062x8 device features and peripheral counts.
Changed minimum comparator supply voltage to 1.65 V on cover page.
Added number of fast and standard channels in Section 3.11: Analog-to-digital
converter (ADC). Updated Section 3.19.2: Universal
synchronous/asynchronous receiver transmitter (USART) and Section 3.19.4:
Serial peripheral interface (SPI)/Inter-integrated sound (I2S) to mention the fact
that USARTs with synchronous mode feature can be used as SPI master
interfaces.
Added baudrate allowing to wake up the MCU from Stop mode in
Section 3.19.2: Universal synchronous/asynchronous receiver transmitter
11-
(USART).
Mar- 6
2016 Section 6.3.15: 12-bit ADC characteristics:
– Table 55: ADC characteristics:
Distinction made between VDDA for fast and standard channels; added note
1.
Added note 4. related to RADC.
Updated tS and tCONV.
– Updated equation 1 description.
– Updated Table 56: RAIN max for fADC = 16 MHz for fADC = 16 MHz and
distinction made between fast and standard channels.
Updated RO and added Note 1. in Table 58: DAC characteristics.
Added Table 65: USART/LPUART characteristics.
09-Jun- Added WLCSP36 package, STM32L062T8 part number and corresponding
7
2016 features.
Added thin WLCSP36 package.
In Section 4: Pin descriptions, renamed USB_OE into USB_NOE.
Added mission profile compliance with JEDEC JESD47 in Section 6.2:
Absolute maximum ratings.
Added note 2. related to the position of the external capacitor below Figure 22:
Recommended NRST pin protection.
Updated RL in Table 55: ADC characteristics. Updated Figure 27: 12-bit
buffered/non-buffered DAC and added note below figure.
Updated tAF maximum value for range 1 in Table 64: I2C analog filter
08-
characteristics.
Mar- 8
2017 Updated tWUUSART description in Table 65: USART/LPUART characteristics.
NSS timing waveforms updated in Figure 28: SPI timing diagram - slave mode
and CPHA = 0 and Figure 29: SPI timing diagram - slave mode and CPHA =
1(1).
Added reference to optional marking or inset/upset marks in all package device
marking sections.
Previous WLCSP36 package renamed “Standard” WLCSP36; added Note 2.
below Figure 35: Standard WLCSP36 - 2.61 x 2.88 mm, 0.4 mm pitch wafer
level chip scale package outline and updated Table 72: Standard WLCSP36 -
2.61 x 2.88 mm, 0.4 mm pitch wafer level chip scale mechanical data.
122/124 DS10183 Rev 11


Memories and I/Os moved after Core in Features.

Removed column "I/O operation" from Table 2: Functionalities depending on
the operating power supply range and added note related to GPIO speed.
Updated VDD_USB in Section 3.4.1: Power supply schemes.
In Section 5: Memory mapping, replaced memory mapping schematic by
11- reference to the reference manual.
Sep- 9 Updated minimum and maximum values of I/O weak pull-up equivalent resistor
2017 (RPU) and weak pull-down equivalent resistor (RPD) in Table 51: I/O static
characteristics.
Updated minimum and maximum values of NRST weak pull-up equivalent
resistor (RPU) in Table 54: NRST pin characteristics.
Removed Table 90: USART/LPUART characteristics.
Updated note below marking schematics.
Added UFQFPN48 as well as STM32L062C8 par number.
Updated Arm logo and added Arm word mark notice in Section 1: Introduction.
Removed Cortex and USB logos.
Updated Table 4: Functionalities depending on the working mode (from
Run/active down to standby) to change I2C functionality to disabled in Low-
power Run and Low-power Sleep modes.
Changed PC14-OSC_IN into PC14-OSC32_IN in Figure 6: STM32L062x8
UFQFPN32 pinout.
Updated VDD_USB description in Section 3.4.1: Power supply schemes.
Changed USARTx_RTS, USARTx_RTS_DE into USARTx_RTS/USARTx_DE,
and LPUART1_RTS, LPUART1_RTS_DE into LPUART1_RTS/LPUART1_DE
19- in Section 4: Pin descriptions and in all alternate function tables.
Nov- 10 In Table 18: Voltage characteristics, added VDD_USB in the list of External main
2019 supply voltage, and in note 1. and 3. Added ΣIVDD_USB In Table 18: Voltage
characteristics.
Updated VDD_USB and note 2. in Table 21: General operating conditions.
Removed R10K and R400K from Table 61: Comparator 1 characteristics.
Updated tAF maximum value for range 1 in Table 64: I2C analog filter
characteristics.
Updated Figure 42: UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine
pitch quad flat package outline and added note related to exposed pad;
updated Table 77: UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine
pitch quad flat package mechanical data.
Updated paragraph introducing all package marking schematics to add the new
sentence “The printed markings may differ depending on the supply chain.”
Updated SPI/I2S interfaces and HSE/LSE/HSI/MSI/LSI clocks for
19- STM32L062K8 and STM32L062T8 in Table 1: Ultra-low-power STM32L062x8
Aug- 11 device features and peripheral counts.
2020 Added tWUUSART and tWULPUART in Table 35: Low-power mode wakeup timings.
Added reference to AN4899 in Section 6.3.13: I/O port characteristics.
DS10183 Rev 11 123/124

123
STM32L062x8
IMPORTANT NOTICE – PLEASE READ CAREFULLY
STMicroelectronics NV and its subsidiaries (“ST”) reserve the right to make changes, corrections, enhancements, modifications, and
improvements to ST products and/or to this document at any time without notice. Purchasers should obtain the latest relevant information on
ST products before placing orders. ST products are sold pursuant to ST’s terms and conditions of sale in place at the time of order
acknowledgement.
Purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or
the design of Purchasers’ products.
No license, express or implied, to any intellectual property right is granted by ST herein.
Resale of ST products with provisions different from the information set forth herein shall void any warranty granted by ST for such product.
ST and the ST logo are trademarks of ST. For additional information about ST trademarks, please refer to www.st.com/trademarks. All other
product or service names are the property of their respective owners.
Information in this document supersedes and replaces information previously supplied in any prior versions of this document.
© 2020 STMicroelectronics – All rights reserved
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STM32L062K8 STM32L062T8

August 2020 DS10183 Rev 11 1/124

2/124 DS10183 Rev 11

3.18.4 SysTick timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

DS10183 Rev 11 3/124

6.3.10 EMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73

7 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102

8 Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117

9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118

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Table 1. Ultra-low-power STM32L062x8 device features and peripheral counts . . . . . . . . . . . . . . . 11

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Table 48. ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

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Figure 1. STM32L062x8 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

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package recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

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The ultra-low-power STM32L062x8 is offered in 5 different packages. Depending on the

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The ultra-low-power STM32L062x8 microcontrollers incorporate the connectivity power of

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2.1 Device overview

Table 1. Ultra-low-power STM32L062x8 device features and peripheral counts

Data EEPROM (Kbytes) 2

SPI/I2S 4(2)(1)/1 4(2)(1)/1

Clocks: HSE/LSE/HSI/MSI/LSI 1/1/1/1/1 1/1/1/1/1

12-bit synchronized ADC 1

Capacitive sensing channels 14

Max. CPU frequency 32 MHz

1.8 V to 3.6 V (down to 1.65 V at power-down) with BOR option

Packages UFQFPN32, LQFP32 WLCSP36 UFQFPN48

1. 2 SPI interfaces are USARTs operating in SPI master mode.

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Figure 1. STM32L062x8 block diagram

PA[0:15] GPIO PORT A RNG

GPIO PORT B AES TIM6 DAC1

I2C2 SCL, SDA

HSI 48M CRS

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2.2 Ultra-low-power device continuum

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3.1 Low-power modes

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• Stop mode without RTC

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Table 2. Functionalities depending on the operating power supply range

ADC only, conversion Range 2 or

Table 3. CPU frequency range depending on dynamic voltage scaling

CPU frequency range Dynamic voltage scaling range

16 MHz to 32 MHz (1ws)

Table 4. Functionalities depending on the working mode

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Table 4. Functionalities depending on the working mode

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Table 4. Functionalities depending on the working mode

Down to Down to 0.8 µA (with 0.65 µA (with

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3.2 Interconnect matrix

Depending on peripherals, these interconnections can operate in Run, Sleep, Low-power