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    Be Winter 2022

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    kaushal.21beect008
    The document is an exam for a VLSI design course. It contains 5 questions testing various topics related to VLSI design including MOSFET operation, CMOS logic gates, dynamic logic, and FinFET devices. The questions cover concepts such as reliability, design styles, fabrication processes, circuit analysis, and testing techniques.

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    Be Winter 2022

    Uploaded by

    kaushal.21beect008
    18 views2 pages
    The document is an exam for a VLSI design course. It contains 5 questions testing various topics related to VLSI design including MOSFET operation, CMOS logic gates, dynamic logic, and FinFET devices. The questions cover concepts such as reliability, design styles, fabrication processes, circuit analysis, and testing techniques.

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    3151105-BE-WINTER-2022

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    The document is an exam for a VLSI design course. It contains 5 questions testing various topics related to VLSI design including MOSFET operation, CMOS logic gates, dynamic logic, and FinFET devices. The questions cover concepts such as reliability, design styles, fabrication processes, circuit analysis, and testing techniques.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    18 views2 pages

    Be Winter 2022

    Uploaded by

    kaushal.21beect008
    The document is an exam for a VLSI design course. It contains 5 questions testing various topics related to VLSI design including MOSFET operation, CMOS logic gates, dynamic logic, and FinFET devices. The questions cover concepts such as reliability, design styles, fabrication processes, circuit analysis, and testing techniques.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    of 2

    Seat No.: ________ Enrolment No.

    ___________

    GUJARAT TECHNOLOGICAL UNIVERSITY


    BE - SEMESTER–V (NEW) EXAMINATION – WINTER 2022
    Subject Code:3151105 Date:13-01-2023
    Subject Name:VLSI Design
    Time:10:30 AM TO 01:00 PM Total Marks:70
    Instructions:
    1. Attempt all questions.
    2. Make suitable assumptions wherever necessary.
    3. Figures to the right indicate full marks.
    4. Simple and non-programmable scientific calculators are allowed.

    Q.1 (a) What is reliability of the chip? List the 4 major causes for chip reliability 03
    problems.
    (b) Explain the impact of full-custom and semi-custom VLSI design style on 04
    design cycle time and circuit performance.
    (c) Explain the process steps for fabrication of n-type MOSFET. 07

    Q.2 (a) Draw the VTC of resistive load inverter circuit and show the 3 different 03
    operating regions of MOSFET of the circuit on it.
    (b) What is channel length modulation effect? 04
    (c) Explain the MOS system under external bias for accumulation and inversion 07
    region.
    OR
    (c) Derive the drain current ID equation for n-type MOSFET using gradual 07
    channel approximation.

    Q.3 (a) Elaborate different clock distribution network. 03


    (b) Draw and explain the operation of two input multiplexer using CMOS 04
    transmission gates.
    (c) Derive the equation of VIL and VIH for CMOS inverter. 07
    OR
    Q.3 (a) What is Latch-up in CMOS chip? 03
    (b) For the function Z = ⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑⃑
    𝐴(𝐷 + 𝐸) + 𝐵𝐶 . Construct dual pull up graph from 04
    pull down graph using Dual Graph Concept.
    (c) Consider a CMOS Inverter circuit with the following parameters: 07
    VDD= 3.3V, VTO,n = 0.6V, VTO,p = - 0.7V, kn = 400 μA/V2, kp =160 μA/V2 .
    Find the value of VIL.

    Q.4 (a) Explain constant field scaling for MOSFET. 03


    (b) Illustrate the RC delay models for calculation of interconnect delay. 04
    (c) Derive the equation for propagation delay of output signal during high to low 07
    transition of output of CMOS inverter circuit with Cload as load capacitance.
    OR
    Q.4 (a) Draw the circuit of dynamic D-latch. 03
    (b) What are controllability and observability? Discuss in brief. 04
    (c) Explain the working of clocked NOR based SR latch with gate level circuit 07
    and waveform. Draw the AOI based implementation of this circuit.

    Q.5 (a) What are the advantages of FinFET over planner MOSFET? 03
    (b) What is substrate bias effect? For two input depletion load NAND gate, how 04
    many MOSFET have this effect?

    1
    (c) How pre-charge and evaluate logic works for dynamic CMOS circuit? 07
    Explain with example.
    OR
    Q.5 (a) How partition and Mux technique is used to increase the testability of 03
    circuits?
    (b) Draw and explain the basic structure of FinFET device. 04
    (c) Explain NORA CMOS logic and its advantages. 07

    ***********

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