Analysis of The Development History Key Technologi
Analysis of The Development History Key Technologi
Volume 81 (2024)
1. Introduction
Integrated circuits are widely distributed in various aspects of life. Covering industry, military,
communications, aerospace, consumer electronics, automotive, medical equipment, household
appliances, and bioelectronics [1]. It is the cornerstone of modern information society, playing an
essential role in promoting the development of a new era for humanity and bringing huge benefits to
people worldwide. In the development of integrated circuits, many key technologies have emerged,
such as protection technology, design technology, and testing technology, which have solved
problems in integrated circuits and laid a foundation for future larger, more efficient, safe, and reliable
integrated circuits. These key technologies are worth analyzing and understanding. In addition, with
the continuous advancement of integrated circuit manufacturing technology and equipment, chip's
extreme technology continues to make breakthroughs. The continuous reduction of process size leads
to the continuous expansion of chip circuit scale. The challenges faced by integrated circuits are
increasingly big. More and more people are paying attention to the development prospect of this
industry [2].
Therefore, this article will describe the definition of integrated circuits in detail, describe the
development process of integrated circuits, and analyze some of the key technologies involved. For
example, EDR technology, VLSI testing technology, and High-Speed signal integrity testing
assurance technology. In addition, this article also analyzes the challenges faced by integrated circuits
and their future development, such as the challenges faced by the integrated circuit industry in China,
as well as intellectual property and protection of integrated circuits and development and challenge
prospects of integrated circuits in the world. Integrated circuits are a bright pearl of human industry,
contributing to the advancement and development of society, and setting the direction for future
technological advancement.
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addition, during the occurrence of ESD, each device of the protection circuit should be turned off to
avoid device failure and damage to the core of the integrated circuit [3].
The devices in the ESD protection circuit are very diverse, among which diodes, resistors, and
bipolar transistors are the main ones. As one of the most critical components in integrated circuits,
diodes are widely used in various protection circuits. In ESD, since diodes have no hysteresis
characteristics, the detection method of diodes is mainly rail-to-rail. The resistors are mostly N-type
well capacitors. The bipolar transistor plays the role of amplifying the current. It is a crystal triode
composed of two back-to-back PN structures.
Most ESD protection circuits use SCR protection technology, which mainly uses thyristors. The
application process of SCR protection technology includes two kinds of resistors and two parasitic
triodes. When performing ESD protection, the thyristor is connected to the integrated circuit as a two-
terminal device, its anode is connected to the N-well and its cathode is connected to the P-well. By
connecting the thyristor to PN in the bipolar transistor in the integrated circuit, the effective ESD
protection function can be played by triggering the thyristor.
3.2. VLSI Testing Status and Key Technologies
Integrated circuits mainly include four significant sectors: design, manufacturing, packaging, and
testing. Among them, the test section is very important. Regarding the ATE testing technology of
integrated circuits, Luo Hongwei and his team conducted a detailed analysis. The integrated circuit
ATE test system is a collection of various electronic circuits, mainly including the following modules
[4].
Firstly, about the Time Test Unit. The purpose of the timing test unit is to measure timing
parameters, including period, pulse width, pulse duty cycle, signal rise/fall time, and transmission
delay. The hardware circuit of the time measurement unit generally includes a logic control FPGA, a
signal conditioning circuit, and a time measurement circuit.
Secondly, about the Arbitrary Waveform Generator. The purpose of the arbitrary waveform
generator is to synthesize the test vector waveform, by synthesizing the driving front and back edges
of the test vector graphics and measuring the front and back edges, to realize different test waveforms
and timing information of the test vector.
Thirdly, about Digital instrument. The digital instrument which is used to collect the output
measurement value of the chip pin and compare the collected output high-impedance state, output
high level, and output low level with the expected output value of the test vector.
Fourthly, about the Precision Measuring Unit. The precision measurement unit is used to measure
current and voltage. By applying a certain current or voltage to the pins of the chip under test, the
voltage or current of the corresponding pins is measured to realize the open circuit/short circuit test
and leakage test of the pins.
3.3. High-Speed Signal Integrity Testing Assurance Technology
In addition, they also analyzed the guaranteed technology of high-speed signal integrity testing [4].
They analyzed that high-speed signal integrity testing is a huge challenge in the current development
of high-speed, high-frequency, and high-bandwidth integrated circuit technology. Among them, high-
speed signals can cause problems such as reflection, crosstalk, and radiation during transmission,
leading to false digital circuit triggering, output signal waveform distortion, and system instability.
This will affect the testing of integrated circuits.
Yuan Weiqun and their research on signal integrity-based high-speed PCB optimization design
sine waves are commonly used to obtain time-domain responses through testing software, and the
technical means are to analyze the key properties of high-speed transmission channels using vector
network analyzers with wide coverage frequency and fast testing speed [5]. Therefore, in practical
applications, quality issues of cables, connectors, and PCBs can be inspected in the early stages of
design to reduce subsequent impacts.
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5. Conclusion
Integrated circuits (ICs) continue to advance steadily, with ongoing efforts aimed at enhancing
process technology and minimizing energy consumption still undergoing refinement. As we look to
the future, the integrated circuit industry is poised to place greater emphasis on safeguarding its
innovations and fostering practical applications, all the while surmounting persisting technical
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challenges. The quest to optimize process technology remains a focal point in the IC industry's
ongoing journey. The intricacies of improving IC manufacturing processes are multifaceted and ever
evolving. Researchers and engineers are tirelessly working to unlock more efficient and sustainable
production methods that can further propel the capabilities of ICs.
Moreover, the relentless pursuit of energy efficiency remains an essential objective. As the world
grapples with environmental concerns, reducing the energy footprint of ICs is of paramount
importance. Innovations in power management, heat dissipation, and energy-efficient designs are at
the forefront of these endeavors. In the coming years, the integrated circuit industry's dedication to
safeguarding its innovations and fostering practical applications will continue to shape its trajectory.
This commitment involves not only protecting intellectual property but also ensuring that the benefits
of IC technology are accessible to a broader spectrum of individuals.
Ultimately, the vision is to democratize the advantages of integrated circuits, making them more
affordable, accessible, and applicable to a wide range of industries and everyday life. This
commitment to progress, efficiency, and accessibility will be the driving force behind the continued
evolution of integrated circuits in our technologically advancing world.
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[4] Luo Hongwei, Liu Jingsheng, Yu Yongtao&Luo Jun. Current Status and Key Technologies of Very
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