14 JMMM FeV
14 JMMM FeV
art ic l e i nf o a b s t r a c t
Article history: The value and sign of V/Fe interface anisotropy are investigated. Epitaxial V/Fe/V/Au layers with different
Received 20 May 2014 iron thicknesses were grown on single-crystalline (001) MgO substrate by ultra-high vacuum molecular
Received in revised form beam epitaxy. Magnetometry was used to measure magnetization and out-of-plane anisotropy field.
27 June 2014
From these values, we quantify the number of dead layers due to V/Fe or Fe/V interfaces, and compare it
Available online 2 August 2014
with the literature. We deduce that dead layers occur mostly at the bottom V/Fe interface. An average
Keywords: value for V/Fe and Fe/V interface anisotropy around 0 7 0.1 erg/cm2 (mJ/m2) was thus deduced.
Nanomagnetism & 2014 Elsevier B.V. All rights reserved.
Interface anisotropy
Epitaxial films
Single crystal Iron
Magnetization
1. Introduction temperature are presented both for in-plane and out-of-plane field
orientation relative to the V/Fe/V interfaces. The magnetization at
Research on spintronic devices such as magnetic random access saturation and anisotropy field are plotted as a function of the Fe
memories (MRAM) and magnetic sensors have generated a per- thickness t from which we extract an average value for Fe/V and
petual need in original magnetic materials. As the thickness of the V/Fe interface anisotropy constant.
magnetic thin films (e.g. electrodes for giant or tunnel magne-
toresistance multilayer) have shrunk, the influence of interfaces
has become crucial. The control of the magnetic configuration 2. Experiments
using interfacial effect is still heavily studied, e.g. exchange bias
with ferromagnetic/anti-ferromagnetic interfaces [1], coercivity The samples were grown on single-crystalline MgO (100)
control with hard/soft bilayer in recording media [2], multiferro- substrate using MBE with a base-pressure lower than 10 10 Torr.
ism with ferromagnetic/ferroelectric interface [3], magnetization The V (20 nm) buffer layer was deposited at room temperature
induction at oxide/oxide interface [4], Dzyaloshinskii–Moriya and annealed at 600 1C. Fe layers of thickness t ranging from
interaction [5], etc. One of the most studied features is the 0.7 nm (5 atomic layers) to 5 nm (35 atomic layers) were grown at
interface-induced anisotropy that originates from the hybridiza- room temperature, annealed at 350 1C and capped with V (5 nm)/
tion between two layers composed of different chemical elements Au (5 nm) with no further annealing.
like Co/Pt, Co/Ni, etc. (see Ref. [6] for a review). Recently, we Fluxes were calibrated by quartz or reflection high energy
investigated V/Fe/MgO as a model system to characterize electrical electron diffraction (RHEED) oscillations in-situ during growth
control of the magnetic anisotropy by a bias voltage [7,8]. and with ex-situ X-ray small angle reflectivity. The epitaxial
Although the interface magnetization and in-plane bulk aniso- relationship, growth mode, number of deposited MLs, and surface
tropy in [Fe/V] multilayers have been widely studied in the past flatness were controlled in situ using RHEED. Fig. 1 shows RHEED
[9–12], we could not find in the literature a clear thickness pattern for annealed V and Fe layers along the (001) direction and
dependence allowing to precisely determine the interface aniso- confirms good crystalline quality of the films. Later, magnetization
tropy for V/Fe interface. curves were measured using commercial rotating sample vibrating
In the present report, we show magnetometry data obtained on sample magnetometer (VSM) and commercial SQUID-VSM.
epitaxial V/Fe (t)/V trilayer grown by ultra-high vaccum molecular
beam epitaxy (MBE). Magnetization versus field loops at room
3. Results and discussions
n
Corresponding author. Fig. 2(a) shows normalized magnetization versus field loops
E-mail address: thomas.hauet@univ-lorraine.fr (T. Hauet). measured both for in-plane magnetic field and out-of-plane
http://dx.doi.org/10.1016/j.jmmm.2014.07.018
0304-8853/& 2014 Elsevier B.V. All rights reserved.
234 D. Louis et al. / Journal of Magnetism and Magnetic Materials 372 (2014) 233–235
Fig. 1. RHEED patterns along the (001) BCC axis for (a) annealed V (20 nm) buffer layers deposited on MgO and (b) MgO/V/Fe (1 nm) along (001) direction.
Acknowledgment