2008 Hansen Bode and Fano Impedance Matching
2008 Hansen Bode and Fano Impedance Matching
CONCLUSIONS
The second-order accurate FDTD equations at dielectric interface
in 3D case are presented based on the 2nd order accurate FDTD
technique in 2D. The numerical experiments have demonstrated
the flexibility and efficiency of this technique in the application in
3D case.
ACKNOWLEDGMENTS
This work is supported by the Science Fund of China
(No.60171011) and (No.60571056).
REFERENCES
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Figure 9 The comparison of S21 of the microstrip dual band filter 3. K.P. Hwang and A.C. Cangellaris, Effective permittivities for second-
order accurate FDTD equations at dielectric interface, IEEE Micro-
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uniform grids of 41 ⫻ 51 ⫻ 10, and the mesh sizes ⌬x ⫽ 0.82 mm, 6. Q.X. Chu and H. Ding, Second-order accurate FDTD equations at
⌬y ⫽ 0.85 mm, ⌬z ⫽ 0.40 mm and time step ⌬t ⫽ 0.22 ps, dielectric interface for TE modes, IEEE Antenna Propag Symp Dig 1
10,000 time steps are used and time cost 115 s. Furthermore, the (2005), 205–208.
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adopted, and its result can be considered as the reference to analysis of cylindrical dielectric resonators, IEEE Antenna Propag
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magnetic media interfaces, IEEE Trans Magn 27 (2006), 3141–
cost is 445 s [11].
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grids, and the comparison of the numerical solutions is shown in Trans EMC, 23 (1981), 1073–1077.
Figure 7. It is clearly seen that the curve of S21 obtained with 10. X.L. Zhang, J.Y. Fang, K.K. Mei, and Y.W. Liu, Calculation of the
nonuniform grids is very close with the reference curve. There is dispersive characteristics of microstrips by the time-domain finite
significant deviation from the reference in the numerical solution difference method, IEEE Trans Microwave Theory Tech 36 (1988),
calculated by the normal FDTD method. It is noted that the method 263–267.
proposed in this article has the better accuracy than the standard 11. D.M. Sheen, S.M. Ali, M.D. Abouzahra, and J.A. Kong, Application
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grids are employed to analyze the model targeted, and the distance
parameters d ⫽ 0.5, l ⫽ 0.5, g ⫽ 0.16; Cell lengths, ⌬x ⫽ 0.59 © 2008 Wiley Periodicals, Inc.
mm, ⌬y ⫽ 0.45 mm, ⌬zc ⫽ 1.00 mm in the air region, and
⌬zf ⫽ 0.32 mm in the dielectric substrate, and ⌬t ⫽ 1.00 ps,
10,000 time steps, time cost 203 s. In the normal FDTD method
with coarse uniform grid, there are the same number of grids, and BODE AND FANO IMPEDANCE
the cell lengths and time step, ⌬x ⫽ 0.59 mm, ⌬y ⫽ 0.45 mm, MATCHING
⌬z ⫽ 0.64 mm, ⌬t ⫽ 1.00 ps, 10,000 time steps, total time cost
R. C. Hansen
205 s. In the normal FDTD method with finer grid, 100 ⫻ 200 ⫻ R. C. Hansen, Inc., P.O. Box 570215, Tarzana, CA 91357;
10 grids are employed and the cell lengths and time step are as Corresponding author: www.rchansen.com
below, ⌬x ⫽ ⌬y ⫽ 0.33 mm, ⌬z ⫽ 0.32 mm, ⌬t ⫽ 0.63 ps,
15,000 time steps and time cost is 1128 s [12]. Received 8 September 2007
The curves of S21 of the microstrip band pass filter are plotted
in Figure 9. Compared with the reference results with finer grids, ABSTRACT: The Bode limit on bandwidth enhancement through use of
the numerical solutions calculated by the second-order FDTD an ideal impedance matching network does not allow changes in an-
equations are more accurate than the standard FDTD method in the tenna reflection coefficient over the bandwidth. An exact correction fac-
same number of grids. tor is derived from the Fano limitations, yielding a simple modification
DOI 10.1002/mop MICROWAVE AND OPTICAL TECHNOLOGY LETTERS / Vol. 50, No. 4, April 2008 875
to the Bode limit. © 2008 Wiley Periodicals, Inc. Microwave Opt bandwidth improvement that can be provided by an ideal lossless
Technol Lett 50: 875– 877, 2008; Published online in Wiley InterScience impedance matching network of many sections, which is Q1 /Q⬁ .
(www.interscience.wiley.com). DOI 10.1002/mop.23244 To obtain Q1 , Eqs. (2) and (3) are solved for n ⫽ 1, giving
Key words: impedance matching; Bode limit; Fano limit
sinh a1 ⫽ 1/⌫, sinh b1 ⫽ ⌫ (5)
1. BODE LIMIT
Thus:
Improvement of antenna performance via an ideal lossless imped-
ance matching network was studied by Bode [1]. Bode’s band-
2⌫
width improvement factor is: Q1 ⫽
1 ⫺ ⌫2 (6)
BWIF ⫽ /兩n共1/⌫兲 (1)
Next Q⬁ is obtained. As n increases, an and bn decrease, but nan
where ⌫ is the magnitude of the antenna reflection coefficient. This and nbn are not small. From (4) for large n,
factor is often used [2, 3], but the limitations are not always
included. Bode assumed that ⌫ was constant over the bandwidth of
n共a n ⫺ b n兲; (7)
interest, thus restricting its validity to modest values of VSWR. Qn
The Bode result can be modified to allow ⌫ to vary over the
bandwidth. Fortunately, the exact results of Fano allow a simple From (2) for large n,
but exact modification.
1
; exp关n共an ⫺ bn 兲兴 (8)
2. FANO LIMIT ⌫
Fano [4, 5] derived exact simultaneous transcendental equations
relating parameters in each matching section, for equal ripple in Combining these gives Q⬁ :
the passband. These equations are:
⌫ cosh nan ⫽ cosh nbn (2) Q ⬁; (9)
兩n1/⌫
tanh nan tanh nbn Note that the individual an , bn satisfy (3). The bandwidth improve-
⫽ (3)
cosh an cosh bn ment factor is:
2 Q1 1 ⫺ ⌫2
sinh an ⫽ sinh bn ⫹ sin (4) BWIF ⫽ ⫽ • (10)
Qn 2n Q⬁ 2⌫ 兩n1/⌫
Each matching section has coefficients a and b, and Qn is the or in terms of VSWR:
resulting Q using n sections. The matching network is lossless; of
course loss would decrease efficiency and increase bandwidth.
Graphical results were presented by Matthaei et al. [6], and
computer solutions were given in [7]. Of interest here is the
Figure 1 Bandwidth improvement versus VSWR Figure 2 Bandwidth improvement versus 兩r兩
876 MICROWAVE AND OPTICAL TECHNOLOGY LETTERS / Vol. 50, No. 4, April 2008 DOI 10.1002/mop
2V monitoring a wide range of products. Small boxes in supermarket,
BWIF ⫽ • (11) inventory of factories, people entrance, and even vehicle traffic can
V ⫺ 1 兩n共共V ⫹ 1兲/共V ⫺ 1兲兲
2
1. INTRODUCTION
Nowadays, where the information traffic is very high, radio-fre-
quency identification (RFID) systems play an important role in Figure 1 The reading range versus the tag antenna gain
DOI 10.1002/mop MICROWAVE AND OPTICAL TECHNOLOGY LETTERS / Vol. 50, No. 4, April 2008 877