XRF (1)

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XRF (X-ray fluorescence

spectroscopy)
Presented by:
Sitara Farooq MS-11F23
Presented to:
DR. Athar Javed
INTRODUCTION TO XRF

 X-ray Fluorescence (XRF) is an analytical technique that uses the


interaction of X-rays with a material to determine its elemental
composition.
 XRF is suitable for solids, liquids and powders, and in most circumstances
is non-destructive.
 Each of the elements present in a sample produces a set of characteristic
fluorescent X-rays (“a fingerprint”) that is unique for that specific
element, which is why XRF spectroscopy is an excellent technology for
qualitative and quantitative analysis of material composition.
PRINCIPLE

• It relies on the interaction between X-rays and the atoms


within a sample to produce characteristic fluorescent X-
rays
• These fluorescent X-rays have energies and wavelengths
that are characteristic of the specific elements present in
the sample
• Which are then detected and analyzed to determine the
elements present.
INSTRUMENTATION AND PROCESS

• All XRF instruments are designed around two major


components
• an X-ray source, commonly an X-ray tube, and a
detector.
• Primary X-rays are generated by the source and
directed at the sample’s surface, sometimes passing
through a filter to modify the X-ray beam.
• When the beam hits the atoms in the sample, they Fig. Instrumentation of
react by generating secondary X-rays that are XRF
collected and processed by a detector.
PROCESS

• The basic mechanism of XRF involves the


ejection of an inner shell electron from an
atom, creating a vacancy.
• This vacancy is then filled by an electron from
an outer shell, releasing the excess energy in
the form of a fluorescent X-ray.
• The energy of the emitted X-ray is unique to
each element, allowing for the identification
and quantification of the elements present in
the sample.
XRF ANALYSIS

• Emitted X-rays processed in the analyzer to


generate a spectrum showing the X-ray's
intensity peaks versus their energy.
• As we have seen, the peak energy identifies
the element. Its peak area or intensity gives
an indication of its amount in the sample.
• The analyzer then uses this information to
calculate the sample's elemental
composition
METHODS

• In general, the energy of the emitted X-rays for a particular element is


independent of the chemistry of the material.
• For example, a calcium peak obtained from CaCO3, CaO and CaCl2 will
be in exactly the same spectral position for all three materials.
• There are two different methods of XRF spectroscopy
• Energy dispersive XRF (EDXRF)
• Wave dispersive XRF (WDXRF)
DIFFERENCE BETWEEN EDXRF &
WDXRF

EDXRF WDXRF
• Allows for quick and easy analysis of • Elemental quantification and defect
even irregular samples analysis
• With little to no sample preparation • Uses extra components such as
collimator and analyzing crystal etc.
• Fewer components used
• Can achieve lower detection limits,
• Generally has higher detection limits,
making it better for trace element
making it more suitable for major and
analysis.
minor element analysis.
BASIC DESIGN OF EDXRF AND
WDXRF

Fig. Shows the basic designs of EDXRF and WDXRF


spectrometers
ADVANTAGES OF XRF

• Non-Destructive Analysis
XRF is a highly versatile technique that allows for the analysis of a wide range of
materials without causing damage or altering the sample.
• Rapid and Accurate
XRF provides fast, accurate, and quantitative elemental analysis
• Broad Applicability
XRF has a wide range of applications across various industries, including metallurgy,
geology, environmental science, art and archaeology.
THANK YOU

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