ICP-MS Book Manual

Agilent 7500 Inductively Coupled Plasma Mass Spectrometry
Course Number H8974A ChemStation Revision 01.XX NT Operating System Student Manual Revision 1
Mass Spectrometry
Data Systems Liquid Chromatography
Capillary Electrophoresis
Gas Chromatography
Agilent 7500 Inductively Coupled Plasma Mass Spectrometry

Course Number H8974A ChemStation Revision 01.XX NT Operating System Student Manual Revision 1
Manual Part Number H8974-90000 Printed in the USA January, 2001
Notice
The information contained in this document is subject to change without notice. Agilent Technologies makes no warranty of any kind with regard to this material, including but not limited to the implied warranties of merchantability and fitness for a particular purpose. Agilent Technologies shall not be liable for errors contained herein or for incidental, or consequential damages in connection with the furnishing, performance, or use of this material. No part of this document may be photocopied or reproduced, or translated to another program language without the prior written consent of Agilent Technologies, Inc. Agilent Technologies, Inc 11575 Great Oaks Way Suite 100, MS 304B Alpharetta, GA 30319
2000 by Agilent Technologies, Inc. All rights reserved Printed in the United States of America
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Table Of Contents
INTRODUCTION: ELEMENTAL ANALYSIS ..........................................................................1 ATOMIC SPECTROMETRY ..............................................................................................................2 ATOMIC MASS AND WEIGHT .........................................................................................................3 ISOTOPES AND ISOBARS ................................................................................................................4 ANALYTICAL TECHNIQUES FOR ELEMENTAL ANALYSIS ...............................................................5 ELEMENTAL ANALYSIS: FAAS.....................................................................................................6 ELEMENTAL ANALYSIS: GFAAS ..................................................................................................7 ELEMENTAL ANALYSIS: ICP-OES ................................................................................................8 ELEMENTAL ANALYSIS: ICP-MS..................................................................................................9 COMPARISON OF ELEMENTAL TECHNIQUES ................................................................................10 GRAPHICAL COMPARISON OF ELEMENTAL TECHNIQUES ............................................................11 COMPARISON OF THE COMPLEXITY OF MULTI-ELEMENTAL TECHNIQUES ...................................12 USERS/APPLICATIONS OF ICP-MS ..............................................................................................13 MULTI-ELEMENTAL ANALYSIS OF METALS ................................................................................14 INTRODUCTION: INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY .....15 WHAT IS ICP-MS? ......................................................................................................................16 ADVANTAGES OF ICP-MS ..........................................................................................................17 AGILENT TECHNOLOGIES AND ICP-MS ......................................................................................18 PROCESSES IN ICP-MS................................................................................................................19 OVERVIEW OF AGILENT 7500 FEATURES ....................................................................................20 SCHEMATIC DIAGRAM OF AGILENT 7500A .................................................................................21 SCHEMATIC DIAGRAM OF AGILENT 7500S ..................................................................................23 ISIS FOR APPLICATION FLEXIBILITY ...........................................................................................24 SAMPLE INTRODUCTION ..............................................................................................................25 AGILENT 7500 SAMPLE INTRODUCTION......................................................................................26 AUTOSAMPLERS ..........................................................................................................................27 TYPICAL NEBULIZER ...................................................................................................................28 SPECIALIZED SAMPLE INTRODUCTION SYSTEMS .........................................................................29 TYPICAL SPRAY CHAMBER DOUBLE PASS ...............................................................................30 DROPLET DISTRIBUTION WITH AND WITHOUT SPRAY CHAMBER ...............................................31 NEW DESIGN AGILENT ICP TORCH BOX ....................................................................................32 INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY ...........................................................33 INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (CONTINUED) .....................................34 WHY ARGON?.............................................................................................................................35 DISTRIBUTION OF IONS IN THE PLASMA ......................................................................................36 SAMPLE IONIZATION IN THE PLASMA ..........................................................................................37 FULL MASS CONTROL OF ALL GAS FLOWS .................................................................................38 INTERFACE ..................................................................................................................................39 AGILENT 7500 ION LENS SYSTEM...............................................................................................40 DISTRIBUTION OF IONS AND ELECTRONS AROUND THE INTERFACE ............................................41 ION ENERGY DISTRIBUTION IN THE INTERFACE ..........................................................................42 THE ELECTROSTATIC LENSES .....................................................................................................43 WHY OFF-AXIS?......................................................................................................................44 LOW TRANSMISSION PHOTON STOP SYSTEM ..............................................................................45 AGILENT HIGH TRANSMISSION OFF-AXIS SYSTEM .....................................................................46 ION FOCUSING NEW OMEGA II LENS .......................................................................................47 FLAT RESPONSE CURVE HIGH SENSITIVITY AT ALL MASSES...................................................48 AGILENT 7500 QUADRUPOLE .....................................................................................................49
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RESOLUTION AND ABUNDANCE SENSITIVITY..............................................................................50 NEW SIMULTANEOUS DUAL MODE DETECTOR & HIGH SPEED LOG AMPLIFIER TRUE 9 ORDER DYNAMIC RANGE ........................................................................................................................51 THE DETECTOR ...........................................................................................................................52 INTERFERENCES IN ICP-MS ..................................................................................................53 INTERFERENCES IN ICP-MS ........................................................................................................54 MASS SPECTROSCOPIC INTERFERENCES ......................................................................................55 ISOBARIC INTERFERENCES ..........................................................................................................56 POLYATOMIC INTERFERENCES ....................................................................................................57 MASS SPECTROSCOPIC INTERFERENCES ......................................................................................58 OPTIMIZING TO MINIMIZE INTERFERENCE FORMATION IN THE PLASMA [1]................................59 OPTIMIZING TO MINIMIZE INTERFERENCE FORMATION IN THE PLASMA [2]................................60 OPTIMIZING TO MINIMIZE INTERFERENCE FORMATION IN THE PLASMA [3]................................61 EFFECT OF PLASMA TEMPERATURE ON DEGREE OF IONIZATION .................................................62 EFFICIENT AEROSOL DECOMPOSITION ........................................................................................63 OXIDES AND DOUBLY CHARGED IONS ........................................................................................64 DEALING WITH MASS SPECTROSCOPIC INTERFERENCES .............................................................65 INTERFERENCE EQUATIONS ........................................................................................................66 AS INTERFERENCE CORRECTION .................................................................................................67 INTERFERENCE CORRECTION EQUATIONS - AGILENT 7500.........................................................68 NON-SPECTROSCOPIC INTERFERENCES .......................................................................................69 EFFECT OF HIGH DISSOLVED SOLIDS ..........................................................................................70 FIRST IONIZATION POTENTIAL ....................................................................................................71 IONIZATION EFFICIENCY .............................................................................................................72 SIGNAL SUPPRESSION .................................................................................................................73 MATRIX EFFECTS ON LOW MASS ANALYTE ............................................................................74 MATRIX EFFECTS ON MEDIUM MASS ANALYTE ......................................................................75 MATRIX EFFECTS ON HIGH MASS ANALYTE ...........................................................................76 SPACE CHARGE INTERFACE AND LENS REGION ..........................................................................77 IONIZATION SUPPRESSION PLASMA REGION ...............................................................................78 WHAT CAN BE DONE ABOUT MATRIX EFFECTS .........................................................................79 TUNING THE AGILENT 7500...................................................................................................81 WHY TUNE THE ICP-MS?...........................................................................................................82 TUNING PROCEDURE OVERVIEW.................................................................................................83 AGILENT 7500 ICP-MS MANUAL TUNE CHECKLIST [1].............................................................84 AGILENT 7500 ICP-MS MANUAL TUNE CHECKLIST [2].............................................................85 AUTOTUNE SCREEN ....................................................................................................................86 AUTOTUNING OF ICP TORCH POSITION AND NEW TARGET TUNE ..............................................87 FEATURES OF AUTOTUNE (1) ......................................................................................................88 FEATURES OF AUTOTUNE (2) ......................................................................................................89 CHOOSING THE AUTOTUNE MODE ..............................................................................................90 BASICS OF THE SOFT EXTRACTION MODE ...................................................................................91 COMPARISON OF EXTRACTION MODES SETTINGS .......................................................................92 AUTOTUNE - TARGET SETTING ...................................................................................................93 TARGET SETTING - RANGE SETTING ...........................................................................................94 SENSITIVITY TUNING ..................................................................................................................95 PEAK SHAPE AND RESOLUTION ...................................................................................................96 ABUNDANCE SENSITIVITY ..........................................................................................................97 QUADRUPOLE MASS FILTER - SCAN LINE ...................................................................................98 DETECTION LIMITS IN NORMAL MODE .......................................................................................99 DETECTION LIMITS IN SOFT EXTRACTION MODE ......................................................................100 LOW BECS IN SOFT EXTRACTION MODE ..................................................................................101 PULSE/ANALOG (P/A) TUNING .................................................................................................102
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MAINTENANCE OF THE AGILENT 7500............................................................................103 MAINTENANCE SCHEDULE ........................................................................................................104 RUNNING TIME MAINTENANCE SCREEN ...................................................................................105 EARLY MAINTENANCE FEEDBACK (EMF) ................................................................................106 NORMAL MAINTENANCE OF THE SAMPLE INTRODUCTION SYSTEM ..........................................107 OVERNIGHT CLEANING OF THE SAMPLE INTRODUCTION SYSTEM.............................................108 SAMPLE INTRODUCTION MAINTENANCE ...................................................................................109 NEBULIZER CONNECTIONS ........................................................................................................110 MAINTENANCE OF A BABINGTON NEBULIZER ...........................................................................111 TORCH MAINTENANCE..............................................................................................................112 INTERFACE MAINTENANCE .......................................................................................................113 MAINTENANCE OF THE CONES ..................................................................................................114 EXTRACTION LENSES MAINTENANCE .......................................................................................115 EXTRACTION LENSES ................................................................................................................116 CLEANING OF THE EINZEL LENS AND OMEGA LENS ASSEMBLY ...............................................117 INSTRUMENT SHUTDOWN .........................................................................................................118 REMOVAL OF THE EINZEL LENS - OMEGA LENS ASSEMBLY .....................................................119 EXPANDED VIEW OF EINZEL LENS - OMEGA LENS ASSEMBLY .................................................120 PLATE BIAS LENS......................................................................................................................121 PENNING GAUGE .......................................................................................................................122 ROTARY PUMP MAINTENANCE .................................................................................................123 CHANGING ROTARY PUMP OIL .................................................................................................124 MAINTENANCE LOGBOOK SETTING ..........................................................................................125 MAINTENANCE LOGBOOK .........................................................................................................126 SAMPLE INTRODUCTION MAINTENANCE ...................................................................................127 AIR FILTERS MAINTENANCE .....................................................................................................128 INSTRUMENT START-UP ............................................................................................................129 INTERNAL STANDARDIZATION IN ICP-MS.....................................................................131 THE ROLE OF INTERNAL STANDARDS .......................................................................................132 HOW THE INTERNAL STANDARDS WORK - 1 .............................................................................133 HOW THE INTERNAL STANDARDS WORK - 2 .............................................................................134 CHOICE OF THE INTERNAL STANDARD ......................................................................................135 CONCENTRATION OF INTERNAL STANDARDS ............................................................................136 ON-LINE ADDITION OF INTERNAL STANDARDS .........................................................................137 SAMPLE PREPARATION TECHNIQUES FOR ICP-MS....................................................139 CONTAMINATION ......................................................................................................................140 TYPES OF CONTAMINATION ......................................................................................................141 CHALLENGES OF TRACE ANALYSIS ...........................................................................................142 WHEN A CONTAMINATION CAN OCCUR....................................................................................143 REAGENTS.................................................................................................................................144 WATER - MILLIPORE .................................................................................................................145 NITRIC ACID .............................................................................................................................146 SELECTED METHODS OF SAMPLE PREPARATION .......................................................................147 COMMONLY USED REAGENTS (1) .............................................................................................148 COMMONLY USED REAGENTS (2) .............................................................................................149 COMMONLY USED REAGENTS (3) .............................................................................................150 SEMI-QUANTITATIVE ANALYSIS OF SAMPLES.............................................................151 SEMI-QUANTITATIVE ANALYSIS................................................................................................152 WHAT IS SEMI-QUANTITATIVE ANALYSIS? ...............................................................................153 DATA ACQUISITION ..................................................................................................................154 METHOD SET-UP FOR SEMI-QUANTITATIVE ANALYSIS .............................................................155 PARAMETERS SELECTION - SPECTRUM ACQUISITION................................................................156
PARAMETERS SELECTION - SELECTION OF MASSES ..................................................................157 MORE ACQUISITION PARAMETERS ............................................................................................158 REPORT GENERATION ...............................................................................................................159 SEMI-QUANT PARAMETERS .......................................................................................................160 SEMI-QUANTITATIVE DATA ANALYSIS .....................................................................................161 EDITING PARAMETERS ..............................................................................................................162 DAILY UPDATE OF THE SEMI-QUANT PARAMETERS .................................................................163 INTERNAL STANDARD CORRECTION FOR OFF-LINE INTERNAL STANDARD ADDITION ..............164 INTERNAL STANDARD CORRECTION FOR ON-LINE INTERNAL STANDARD ADDITION................165 EXAMPLE OF SEMI-QUANT REPORT [1].....................................................................................166 EXAMPLE OF SEMI-QUANT REPORT [2].....................................................................................167 GENERATING A SEMI-QUANT REPORT .......................................................................................168 MANUAL VERIFICATION OF THE DATA .....................................................................................169 QUANTITATIVE ANALYSIS OF SAMPLES ........................................................................171 WHAT IS QUANTITATIVE ANALYSIS? ........................................................................................172 METHOD SET-UP FOR QUANTITATIVE ANALYSIS ......................................................................173 STEP ONE: EDITING THE AMU SELECT FILE ............................................................................174 EDITING A METHOD FOR QUANTITATIVE ANALYSIS .................................................................175 METHOD INFORMATION ............................................................................................................176 ACQUISITION MODES ................................................................................................................177 ACQUISITION PARAMETERS - MULTITUNE METHOD .................................................................179 PERIODIC TABLE .......................................................................................................................180 MASS TABLE .............................................................................................................................181 PERISTALTIC PUMP PROGRAM ..................................................................................................182 RAW DATA CORRECTIONS ........................................................................................................183 CONFIGURE REPORTS ................................................................................................................184 CALIBRATION............................................................................................................................185 CALIBRATION TABLE ................................................................................................................186 SAVE THE CALIBRATION AND THE METHOD .............................................................................187 QUANTITATIVE DATA ANALYSIS ..............................................................................................188 STANDARD DATA FILES ............................................................................................................189 CALIBRATION CURVES ..............................................................................................................190 EXAMPLES OF THE CALIBRATION CURVES FOR EXCLUDED ...................................................191 SIMPLE SEQUENCING (INTELLIGENT SEQUENCING DISABLED) ...........................193 SEQUENCING .............................................................................................................................194 ASX-500 VIAL POSITION NOMENCLATURE ..............................................................................195 SEQUENCING .............................................................................................................................196 SAMPLE LOG TABLE - SEQUENCE FLOW AND PERIODIC BLOCK ...............................................197 SAMPLE LOG TABLE .................................................................................................................198 SPECIAL FEATURES - KEYWORDS .............................................................................................199 RUNNING A SEQUENCE..............................................................................................................200 CHAINED SEQUENCE .................................................................................................................201 CHAINED SEQUENCE .................................................................................................................202 METHOD OF STANDARD ADDITIONS (MSA)...................................................................203 EXTERNAL CALIBRATION..........................................................................................................204 PROS AND CONS OF EXTERNAL CALIBRATION ..........................................................................205 METHOD OF STANDARD ADDITION (MSA) ...............................................................................206 PROS AND CONS OF METHOD OF STANDARD ADDITIONS ..........................................................207 DETERMINATION OF URANIUM IN URINE BY MSA....................................................................208 CONVERTING FROM MSA TO EXTERNAL CALIBRATION ...........................................................209 MATRIX-MATCHED URANIUM IN URINE EXTERNAL CALIBRATION ...........................................210 OFF-LINE DATA ANALYSIS AND SEQUENCE REPROCESSING .................................211
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OFF-LINE DATA ANALYSIS .......................................................................................................212 PROCEDURE FOR OFF-LINE DATA ANALYSIS ............................................................................213 OFF-LINE CALIBRATION REVIEW OF CURRENTLY RUNNING METHOD ......................................214 USING DOLIST FOR OFF-LINE DATA REPROCESSING.................................................................215 HOW TO USE DOLIST ................................................................................................................216 SELECTING FILES USING DOLIST ..............................................................................................217 SEQUENCE - REPROCESSING DATA BATCH ...............................................................................218 SEQUENCE REPROCESSING ........................................................................................................219 CUSTOM REPORTS AND DATABASES...............................................................................221 WHAT YOU WILL LEARN ..........................................................................................................222 CUSTOM REPORTS AND DATABASES .........................................................................................223 CREATING AND EDITING A REPORT TEMPLATE .........................................................................224 CUSTOM REPORTS - REPORT WIZARD.......................................................................................225 CUSTOM REPORTS - DRAG AND DROP (1) .................................................................................227 CUSTOM REPORTS - DRAG AND DROP (2) .................................................................................228 FORMATTING CUSTOM REPORTS...............................................................................................229 CUSTOM REPORTS - PRINTING SET-UP ......................................................................................230 CUSTOM REPORTS - SAVING THE TEMPLATE ............................................................................231 PRINTING CUSTOM REPORTS - INTERACTIVELY ........................................................................232 PRINTING CUSTOM REPORTS - PRINTING MULTIPLE FILES [1]..................................................233 PRINTING CUSTOM REPORTS - PRINTING MULTIPLE FILES [2]..................................................234 DATABASES ..............................................................................................................................235 DATABASE WIZARD ..................................................................................................................236 DATABASE - DRAG AND DROP ..................................................................................................237 DATABASE - FORMATTING ........................................................................................................238 DATABASE - CHARTS ................................................................................................................239 GLOBAL CHART OPTIONS .........................................................................................................240 DATABASE - SAVING.................................................................................................................242 UPDATING THE DATABASE - INTERACTIVELY ...........................................................................243 UPDATE THE DATABASE - MULTIPLE FILES [1].........................................................................244 UPDATE THE DATABASE - MULTIPLE FILES [2].........................................................................245 ISOTOPE RATIO MEASUREMENTS....................................................................................247 EDITING A METHOD FOR QUANTITATIVE ANALYSIS .................................................................248 ACQUISITION MODES ................................................................................................................249 ACQUISITION PARAMETERS FOR ISOTOPIC RATIO MEASUREMENTS..........................................251 REPORT SELECTION ..................................................................................................................252 SETTING PARAMETERS FOR ISOTOPIC RATIOS ...........................................................................253 EXAMPLE OF THE ISOTOPIC RATIO REPORT ..............................................................................254 AGILENT ICP-MS CHEMSTATION AND WINDOWS OVERVIEW ...............................255 THE WINDOWS INTERFACE .......................................................................................................256 WINDOWS MENUS.....................................................................................................................257 USEFUL WINDOWS TIPS ............................................................................................................258 MAINTAINING THE COMPUTER SYSTEM ....................................................................................259 WINDOWS NT EXPLORER - ENHANCED FILE MANAGEMENT ....................................................260 DIRECTORY STRUCTURE OF THE AGILENT CHEMSTATION ........................................................261 FILE NAMING ............................................................................................................................262 CHEMSTATION FILE EXTENSIONS .............................................................................................263 AN OVERVIEW OF ICP-MS ENVIRONMENTAL APPLICATIONS ...............................265 OPTIMIZING AGILENT 7500 FOR ENVIRONMENTAL SAMPLES ANALYSIS ..................................266 ENVIRONMENTAL TUNING ........................................................................................................267 THREE GOALS OF ENVIRONMENTAL TUNING ............................................................................269 TUNING FLOW CHART ...............................................................................................................271
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RECOMMENDATIONS ON INTERFERENCE EQUATIONS ...............................................................272 MORE INTERFERENCE CORRECTIONS ........................................................................................274 CALIBRATION STANDARDS .......................................................................................................276 LINEAR RANGE DETERMINATION..............................................................................................277 INTERFERENCE CHECK SAMPLES ..............................................................................................278 TROUBLESHOOTING ENVIRONMENTAL APPLICATIONS [1] ........................................................279 TROUBLESHOOTING ENVIRONMENTAL APPLICATIONS [2] ........................................................281 TROUBLESHOOTING ENVIRONMENTAL APPLICATIONS [3] ........................................................283 TROUBLESHOOTING ENVIRONMENTAL APPLICATIONS [4] ........................................................285 SEMICONDUCTOR APPLICATIONS OF ICP-MS AND ADVANTAGES OF AGILENT 7500S SYSTEM ...........................................................................................................................287 CHEMICALS AND MATERIALS USED IN SEMICONDUCTOR INDUSTRY ........................................288 METALS ANALYSIS IN THE SEMICONDUCTOR INDUSTRY - CUSTOMER GROUPS AND REQUIREMENTS.........................................................................................................................289 SHIELDTORCH INTERFACE ........................................................................................................290 SHIELDTORCH INTERFACE ........................................................................................................291 NORMAL AND COOL PLASMAS ..............................................................................................292 SHIELD TORCH COOL PLASMA ..............................................................................................293 SHIELD TORCH INSTALLATION ..................................................................................................294 COOL PLASMA TUNING .............................................................................................................295 ADVANTAGES OF COOL PLASMA AT HIGHER POWER (900 - 1100 W) ......................................296 ADVANTAGES OF COOL PLASMA AT LOWER POWER (700-800 W) ...........................................297 DETECTION LIMITS STUDY [1] ..................................................................................................298 DETECTION LIMITS STUDY [2] ..................................................................................................299 AUTOMATIC SWITCHING BETWEEN NORMAL AND COOL PLASMA............................................300 INTELLIGENT SEQUENCE TRAINING TEXT...................................................................301 WHAT IS INTELLIGENT SEQUENCE? ..........................................................................................302 TYPICAL ANALYTICAL FLOW ....................................................................................................303 USING INTELLIGENT SEQUENCING ............................................................................................304 SETTING UP A QC CONFIGURATION..........................................................................................319 LABORATORY 1: AGILENT 7500 CONFIGURATION, STARTUP AND TUNING.......327 CONFIGURATION .......................................................................................................................328 STARTUP AND TUNING ..............................................................................................................329 AGILENT 7500 STARTUP CHECKLIST ........................................................................................330 SHUTDOWN CHECKLIST ............................................................................................................331 LABORATORY 2: AGILENT 7500 ROUTINE MAINTENANCE ......................................333 GENERAL ..................................................................................................................................334 SAMPLE INTRODUCTION ............................................................................................................335 INTERFACE ................................................................................................................................336 NEBULIZER, SPRAY CHAMBER AND TORCH...............................................................................337 RE-IGNITE THE PLASMA AND CHECK THE TUNE .........................................................................338 LABORATORY 3: SEMI-QUANTITATIVE ANALYSIS .....................................................339 SEMI-QUANTITATIVE ANALYSIS ...............................................................................................340 LABORATORY 4: QUANTITATIVE ANALYSIS OF UNKNOWN SAMPLE..................341 QUANTITATIVE ANALYSIS ........................................................................................................342 APPENDIX 1 GENERAL INFORMATION.........................................................................343 PROFESSIONAL ORGANIZATIONS...............................................................................................344 JOURNALS .................................................................................................................................345 SELECTED WEB SITES (1)..........................................................................................................346
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SELECTED WEB SITES (2)..........................................................................................................347 APPENDIX 2 FLOW CHATS ................................................................................................349 MANUAL TUNE TROUBLESHOOTING FLOWCHART [1]...............................................................350 MANUAL TUNE TROUBLESHOOTING FLOWCHART [2]...............................................................351 APPENDIX 3 DEALING WITH POLYATOMICS .............................................................353 THE PROBLEM ...........................................................................................................................354 STRATEGY #1: (HIGH POWER) COOL PLASMA ANALYSIS .........................................................355 COMMERCIALIZATION OF COOL PLASMA ANALYSIS .................................................................356 SCHEMATIC OF AGILENT SHIELDTORCH ...................................................................................357 NOT ALL COOL PLASMAS* ARE THE SAME! [1] .......................................................................358 NOT ALL COOL PLASMAS* ARE THE SAME! [2] .......................................................................359 FE IN 31% H2O2 - 5 PPT SPIKE RECOVERY...............................................................................360 SHIELDTORCH TECHNOLOGY ELIMINATES INTERFERENCES BEFORE THEY FORM! ..................361 CAN HEAVY MATRICES BE ANALYZED? ...................................................................................362 CR IN UNDILUTED METHANOL ..................................................................................................363 EXAMPLE OF HEAVY MATRIX ANALYSIS ..................................................................................364 CALIBRATION FOR 56FE IN 1000 PPM PT ...................................................................................365 CALIBRATION FOR 66ZN IN 1000 PPM PT ..................................................................................366 DETERMINATION OF SE BY HIGH POWER COOL PLASMA ..........................................................367 SPECTRUM OF 10 PPB SE AND BLANK .......................................................................................368 CALIBRATION FOR 80SE ............................................................................................................369 DETECTION LIMITS FOR SE BY COOL PLASMA ..........................................................................370 CURRENT RESEARCH DEVELOPMENTS USING THE SHIELDTORCH ............................................371 AS CALIBRATION IN 10% HCL .................................................................................................372 LOW LEVEL P CALIBRATION.....................................................................................................373 LOW LEVEL S CALIBRATION.....................................................................................................374 LOW LEVEL SI CALIBRATION ....................................................................................................375 STRATEGY #2: RESOLVE THE INTERFERENCES ..........................................................................376 LIMITATIONS OF HR-ICP-MS ...................................................................................................377 RESOLUTION VS. SENSITIVITY ..................................................................................................378 OTHER FACTS ABOUT HR-ICP-MS [1].....................................................................................379 OTHER FACTS ABOUT HR-ICP-MS [2].....................................................................................380 OTHER FACTS ABOUT HR-ICP-MS [3].....................................................................................381 STRATEGY #3: DISSOCIATE INTERFERENCES WITHIN THE SPECTROMETER .............................382 PRINCIPLE OF COLLISION TECHNOLOGY ...................................................................................383 SELECTING A GAS PHASE REAGENT ..........................................................................................384 OPTIMIZING THE GAS PHASE REAGENT ....................................................................................385 SIDE REACTIONS ARE INEVITABLE!!.........................................................................................386 SIDE REACTIONS CREATE NEW INTERFERENCES ......................................................................387 HYDROCARBONS ARE PARTICULARLY PRONE TO COMPLEX CHEMISTRIES EVEN AT TRACE LEVELS .....................................................................................................................................388 EFFECTS OF SAMPLE MATRIX ...................................................................................................389 STRATEGIES TO OVERCOME THE PROBLEM OF SIDE REACTIONS ..............................................390 LIMITATION OF SCANNING THE ANALYZER QUAD ....................................................................391 COLLISION CELLS CAN CREATE INTERFERENCES .....................................................................392 IN SUMMARY ............................................................................................................................393
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Introduction: Elemental Analysis
Atomic Spectrometry
Atomic Spectrometry
Atomic Spectrometry
Atomic Absorption
Light of specific wavelength from Hollow Cathode Lamp (HCL)
Excited State
-
Ground State
Light of specific characteristic wavelength is absorbed by promoting an electron to a higher energy level (excitation) Light absorption is proportional to elemental concentration
Atomic Emission
Light and heat energy from high intensity source (flame or plasma)
-
High energy (light and heat) promotes an electron to a higher energy level (excitation). Electron falls back and emits light at characteristic wavelength Light emission is proportional to elemental concentration High energy (light and heat) ejects electron from shell (ionization). Result is free electron and atom with positive charge (Ion) Ions are extracted and measured directly in mass spectrometer
Mass Spectrometry
Light and heat energy from high intensity source (plasma)
-
Figure 1
Atomic Mass and Weight

Nucleus Electron shell or cloud Electron

+ + -
1 Proton
+
1 Neutron
Proton Atomic number of an element is the number of Protons in its nucleus 1 Proton
+
1840 Electrons
- - - - - - - - - - - - - - - - - - - - - -
Neutron
An atom has an equal number of Protons (1 +ve charge) and electrons (1 -ve charge) and so is electrically neutral.
Figure 2
Isotopes and Isobars

protons) protons)is isthe thesame, same,but butnumber numberof of neutrons neutronsis isdifferent different(e.g. (e.g.Pb204 Pb204& &Pb Pb208) 208) Chemical Chemicalcharacteristics characteristicsare aresame, same,but but physical physicalproperties propertiesare aredifferent. different.
Isotopes: Atomicnumber number(number (numberof of Isotopes:Atomic
atomic atomicweight weightis isalmost almostidentical identicalso sospecies species appear appearat atsame samemass mass(e.g. (e.g.Pb204 Pb204& &Hg204) Hg204) Chemical Chemicalcharacteristics characteristicsare aredifferent, different,but but physical properties are similar .. physical properties are similar
Isobars: Atomicnumber numberis isdifferent, different,but but Isobars:Atomic
Isotopes Isotopes
Isobars Isobars
Figure 3
Analytical Techniques for Elemental Analysis

FAAS - Flame Atomic Absorption Spectrometry GFAAS - Graphite Furnace Atomic Absorption Spectrometry ICP-OES - Inductively Coupled Plasma Optical Emission Spectrometry = Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES) ICP-MS - Inductively Coupled Plasma Mass Spectrometry
Figure 4
Elemental Analysis: FAAS

Advantages: Inexpensive Rapid for few selected elements Limited use for organic solvents Disadvantages Poor sensitivity (high detection limits) Single element determination at-the-time Requires large amount of sample Narrow linear range
Figure 5
Elemental Analysis: GFAAS

Advantages: Relatively inexpensive Requires small sample volume Excellent sensitivity (low detection limits) Disadvantages Single element determination at-the-time High operating costs (consumables) Very narrow linear range Cumbersome and time-consuming technique Not suited for organic solvents Requires matrix modifiers
Figure 6
Elemental Analysis: ICP-OES

Advantages: Good general-purpose technique Good dynamic range Accommodates organic solvents Multi-elemental technique Disadvantages Cost of the instrument Limits of detection Sample volume requirements Spectral interferences for unknown/complicated matrices
Figure 7
Elemental Analysis: ICP-MS

Advantages: Requires small amount of sample Excellent dynamic range Accommodates organic solvents Multi-elemental technique Isotope differentiation and determination Scanning (semi-quant) capabilities Superior limits of detection Limited and well defined interferences Disadvantages Cost of the instrument
Figure 8
Comparison of Elemental Techniques

Sequential Criteria1 Detection Limits Linear Range Interferences Speed GFAAS ppt 2-3 Moderate Slow ICP-OES ppb 4-6 Many Slow Good Yes No mL $ $$ Simultaneous ICP-OES ppb 4-6 Many Fast Good Yes Yes mL $$ $$ ICP-MS ppq-ppt 9* Few Fast Excellent Yes Yes uL or mL $$ $
Elemental Coverage Poor Multi-element Simultaneous Sample Size Capital Cost Operating Cost No No uL $ $$$
Figure 9
10
Graphical Comparison of Elemental Techniques

high
ICP-MS
GFAA ICP OES Flame AA low ICP-OES
low sensitivity
number of analyses
high
Figure 10
11
Comparison of the Complexity of Multi-elemental Techniques
Comparison of the Complexity of Multi-elemental Techniques

Comparison of the Complexity of Multielemental Techniques
# emission lines alkali metals lithium cesium alkali earths magnesium calcium transition metals chromium iron cerium 30 645 173 662 2277 4757 5755 # (natural) isotopes 2 1 3 6 4 4 4
Figure 11
12
Users/Applications of ICP-MS

Environmental Semiconductor Nuclear Clinical/Pharmaceutical Petrochemical Geological Forensic Academia
Figure 12
13
Multi-elemental Analysis of Metals

GFAAS, ICP-OES & CVAA

Sample Digestion Sample Logging Hg Preparation
ICP-OES Analysis
GFAAS Analysis
Data Compilation & Review
Data Reporting
Archival
CVAAS Analysis
ICP-MS
Sample Logging Sample Digestion ICP-MS Analysis Data Review & Reporting
Archival
Figure 13
14
Introduction: Inductively Coupled Plasma Mass Spectrometry
What is ICP-MS?
What is ICP-MS?
What is ICP-MS?
Inorganic (elemental) analysis technique. ICP - Inductively Coupled Plasma

high temperature ion source
MS - Mass Spectrometer

quadrupole scanning spectrometer mass range from 7 to 250 amu (Li to U...) separates all elements in rapid sequential scan ions measured using dual mode detector

ppt to ppm levels isotopic information available
Figure 14
16
Advantages of ICP-MS
Trace and ultratrace measurement of >70 elements - from Li to U Agilent 7500 can measure from <1ppt to >500ppm (9 orders linear range) Spectral simplicity Every element (except In) has an isotope which is free from direct overlap Speed of multi-element analysis Typical multi-element acquisition in 1-2 min (~4 min including rinse) Flexibility to optimize for specific applications Automated set-up and autotuning give improved ease of use Fast semi-quantitative analysis - accurate data without calibration measurement is based on comparison of relative isotope sensitivity Isotope ratio measurements nuclear, geological, environmental and nutrition studies
Figure 15
17
Agilent Technologies and ICP-MS

1987 - PMS 100 - first computer controlled ICP-MS 1988 - PMS 200 - 2nd generation ICP-MS 1990 - PMS 2000 - featuring Omega lens system - lowest random background in ICP-QMS 1992 - ShieldTorch interface developed - interferences fundamentally reduced for the first time in ICP-QMS enables analysis of K, Ca, Fe by ICP-QMS 1994 - HP 4500 introduced - World's first benchtop system 1998 - Over 500 systems installed 1999 - HP 4500 Series 100, 200, 300 introduced 2000 - Agilent 7500 series. 7500a, 7500i and 7500s - the next generation in ICP-MS instrumentation
Figure 16
18
Processes in ICP-MS
Processes in ICP-MS
Processes in ICP-MS
Nebulization Desolvation
Aerosol liquid sample Nebulization Desolvation Particle Atomization Molecule Atom Ionization Ion
Vaporization Atomization
Absorption process
Ionization
Vaporization solid sample
Emission process
Mass analyzer
Figure 17
19
Overview of Agilent 7500 Features

Exclusive ShieldTorch technology for unrivaled sensitivity and elimination of Ar -based interferences Omega II off axis lens system providing superior ion transmission and exceptionally low backgrounds True hyperbolic profile solid molybdenum quadrupole operating at 3.0MHz, providing excellent peak shape and abundance sensitivty
Open architecture sample introduction system for ease of access and connectivity
Peltier cooled spray chamber for superior stability, low oxide interferences and analysis of organics Low pulsation peristaltic pump located close to the nebulizer for rapid sample introduction & washout Durable stainless steel chassis. Benchtop design minimizes the need for laboratory space
Simultaneous dual mode detector with high speed amplifier providing 9 orders of dynamic range 4 (or 5) mass flow controllers for improved signal stability and analysis of organics Computer controlled torch positioning in 3 planes with Autotune for effortless, consistent torch alignment after maintenance Maintenance-free solid state RF generator. 27.12MHz frequency generates highest temperature plasma for reduced matrix effects
Figure 18
20
Schematic Diagram of Agilent 7500a

Robust Interface Omega II Off Axis Lens Hyperbolic Rod Quadrupole Fast Simultaneous Dual Mode Detector
Peltier Cooled Spray Chamber Peri Pump Sample Turbo pump Turbo pump Novel High Capacity Vacuum System Design
Figure 19
Sample solution is pumped into the nebulizer. The sample stream is nebulized with argon gas and forms an aerosol of fine droplets. The argon gas carries the finest droplets through the turns of the spray chamber and into the plasma where the sample is atomized and ionized. Ions are extracted from the atmospheric pressure plasma into the high vacuum region of the mass analyzer via the interface. The interface consists of two water-cooled orifices called cones. A three-stage vacuum system provides pressures of 1 Torr between the cones, 10-4 Torr in the lens chamber and 10-6 Torr in the analyzer chamber. The ion lens system focuses ions into the analyzer. Light is excluded from the analyzer and detector regions by the Omega lens, which reduces background noise. The quadrupole mass filter allows only ions of a specific mass to charge ratio to pass through to the detector at any point in time.
21

The EM detector measures the ion signal at each mass and stores it in the
MCA. Data is expressed as counts per second, which is directly proportional to the concentration of the element at that mass.
22
Schematic Diagram of Agilent 7500s

Robust Interface Omega II Off Axis Lens
Hyperbolic Rod Fast Quadrupole Simultaneous Dual Mode Detector
Peltier Cooled Spray Chamber Peri Pump Sample Valves Turbo pump Turbo pump Novel High Capacity Vacuum System Design
Figure 20
23
ISIS for Application Flexibility

Figure 21
24
Sample Introduction
Sample Introduction
Sample Introduction
Plasma Gas Auxiliary Gas Peltier Cooled Spray Chamber
ICP Torch Plasma
RF Coil Blend Gas Carrier Gas Nebulizer Peristaltic Pumps Internal Standard/ Diluent
Sample
Figure 22
The ease of removal of our torch is a big point: 1 minute with Agilent 5 minutes with VG 10 15 minutes with PE Especially with gloved hands, as in a cleanroom. We are the only company to offer Pt injector torches. This is in response to demand from Japanese semiconductor users. All other vendors use Al2O3 or sapphire, which give high Al background. Also, we are the only ones to use a polypropylene spray chamber: VG use Teflon (poor wetting - bad stability and washout) PE use Ryton, which is impure - high Ba, etc. from filler, and also it is not resistant to H2O4
25
Agilent 7500 Sample Introduction

Externally mounted spray chamber with new Peltier cooling system New, low-pulsation 3-channel sample introduction pump close-coupled to spray chamber to reduce uptake time and dead volume Open sample area protected with sealed polymer tray - easy access to sample intro components and connection of external devices laser ablation LC GC CE

Figure 23
26
Autosamplers
Autosamplers
Autosamplers
ASX -100
ASX -500
Figure 24
27
Typical Nebulizer
Typical Nebulizer
Typical Nebulizer
Concentric ConcentricNebulizer Nebulizer
Sample in
Cross-flow Cross-flowNebulizer Nebulizer

Fi ne capi l l ar y -pr one t o bl ockages Ar gon i n
Argon in
High Highsolids solidsNebulizer Nebulizer (Babbington (Babbingtondesign) design)

Sample in Argon in
Sample out Pt / Rh capi l l ary Sam pl ei n Ar gas outlet
Figure 25
28
Specialized Sample Introduction Systems

Organic analysis kit including exclusive oxygen inlet connector for safe addition of oxygen for organics analysis
Inert sample kit with unique polypropylene spray chamber Exclusive Agilent Micro Flow Nebulizer for trouble-free analysis of microvolume samples Widest range of ICP torches including exclusive platinum injector torch for HF and unique photoresist torch for photoresist matrices
Figure 26
29
Typical Spray Chamber Double Pass
Typical Spray Chamber Double Pass

Typical Spray Chamber - Double Pass Scott-Type
Small Droplets to ICP Sample solution Nebulizer (High solids type) Aerosol Ar carrier gas
Sample drain Large Droplets to Waste
Figure 27
30
Droplet Distribution With and Without Spray Chamber

(%)
No Spray Chamber
(%)
With Spray Chamber
50 40 30 20
30 25 20 15 10
10 0
5
8 14 20 26 32 38 44 50 56 62 68 74 80
9 10 11
Particle Size ( um )
Particle Size ( um)
Figure 28
31
New Design Agilent ICP Torch Box

New torchbox position control stepper motors (x-, y- and zadjustment) are fast and precise. Quick release torch mounting allows for easy torch removal and replacement for cleaning. Plasma compartment is separated from the main cabinet, and plasma gases vented separately direct to the exhaust duct.
Figure 29
32
Inductively Coupled Plasma Mass Spectrometry

RF Load Coil Quartz "torch" made of concentric tubes
Radio Frequency voltage induces rapid oscillation of Ar ions and electrons -> HEAT (~10,000 K)
Auxiliary Gas Carrier or Injector or Nebulizer Gas

Sample aerosol is carried through center of plasma -> dried, dissociated, atomized, ionized ~6500 K.
Coolant or Plasma Gas
Figure 30
33
Inductively Coupled Plasma Mass Spectrometry (continued)
Inductively Coupled Plasma Mass Spectrometry (continued)

Plasma is electrical discharge, not chemical flame
Ar gas used plasma at atmospheric pressure -> very high temperature (a low pressure plasma is a fluorescent lamp) plasma is generated through inductive coupling of free electrons with rapidly oscillating magnetic field (27 MHz) Energy is transferred collisionally to argon molecules plasma is contained in gas flow in a quartz tube (torch) sample aerosol is carried through the center of the plasma proximity to 10,000 C plasma causes dissociation, atomization and ionization ions are extracted into the spectrometer
Figure 31
34
Why Argon?
Why Argon?
Why Argon?
q q q
Ar is inert Ar is relatively inexpensive! Ar is easily obtained at very high purity Most importantly -
Ar has a 1st ionization potential of 15.75 electron volts (eV) higher than the 1st ionization potential of most other elements (except He, F, Ne) and lower than the 2nd ionization potential of most other elements (except Ca, Sr, Ba,etc)
Since the plasma ionization environment is defined by the Ar, most analyte elements are efficiently singly charged
Figure 32
35
Distribution of Ions in the Plasma

(%)
100
Ar Relative Ion intensity
80 60 40 20 0 -8 -6 -4 -2 0
Co
Distance from the work coil

mm
5 10 15 20 25 30
9 6 3 0 3 6 9
mm
Cool Plasma Sampling Depth

Load coil
Normal Plasma Sampling Depth
Distance from the center (mm)
Figure 33
36
Sample Ionization in the Plasma

Hottest part of plasma ~ 8000K
Residence time is a few milliseconds By sample cone, analytes present as M+ ions
Highest M+ population should correspond to lowest polyatomic population
Aerosol is Dried Particles are decomposed and dissociated
Atoms are formed and then ionized
Figure 34
37
Full Mass Control of All Gas Flows

Nebulizer gas flow is an important parameter to tune for optimizing signal - separate control of nebulizer gas and total injector flow (by varying make-up gas) is essential for optimum performance Mass flow control (MFC) has the benefits of superior stability - better short and long term signal precision more reproducible set-up and optimization electronic control via the PC
4500 Series - 2 MFCs - nebulizer and blend (make-up) 7500a, 7500i - 4 MFCs - plasma, auxiliary, nebulizer, blend - 5 MFCs - plasma, auxiliary, nebulizer, blend, option 7500s
blend gas is required for optimum ShieldTorch analysis, or for organics analysis
Figure 35
38
Interface
Interface
Interface
s
s
Sampling cone Skimmer cone Allows introduction of ions into the vacuum chamber Material : Nickel Platinum
Interface 1.0 E-02 torr
Plasma 1 torr
Mass Spectrometer 1.0 E-05 torr
Sampler Cone 1 mm orifice Skimmer Cone 0.4 mm orifice
To pumps
Figure 36
39
Agilent 7500 Ion Lens System

Serves to focus ions coming from the skimmer into the mass filter. Rejects neutral atoms and minimizes the passage of any photons from ICP. Extraction - Extract and accelerate ions from the plasma s Einzel - Collimate and focus ion beam Omega - Bend ion beam to eliminate photons and neutrals QP focus - Refocus ion beam
s s s
10
-2
Torr
10 -5 Torr QP- Focus (+) (-)
(-) (+)
Figure 37
40
Distribution of Ions and Electrons Around the Interface

Neutral Plasma equal numbers of electrons and positive ions at high temp Cooler Interface does not support ion stability neutral Ar sheath forms acting as a condensor preventing the plasma from grounding on the cones
Sheath
Ar Ar Ar Ar Ar+ + + e Ar e Ar Ar e + e Ar+ Ar Ar Ar
Figure 38
41
Ion Energy Distribution in the Interface

Ion lenses are optimized for a particular range of ion energies (potential + kinetic). Low mass ions have lower kinetic energy. Cooling the plasma increases the thickness of the sheath, increasing the plasma potential and the energy of the ions. Shifts the energy distribution profile to the right increasing low mass sensitivity.
Ion lens setting

Y Li Tl
Sensitivity
Low Ion energy
High
Figure 39
42
The Electrostatic Lenses

Ions, photons and neutrals all enter the spectrometer through the interface
the detector is sensitive to photons/neutrals, as well as ions can be deflected using electric fields
Ions are charged particles
q q
Photons travel in straight lines If ions can be deflected off-axis, they will be separated from noncharged species (photons/neutrals)
must ensure that mass bias is not introduced when ions are deflected
Figure 40
43
Why Off-Axis?
Why Off-Axis?
Why Off-Axis?
Detector must be screened from Plasma Plasma is an intense source of photons and neutrals Electron Multiplier is photon/neutral sensitive Common approach is to place a metal disc in the light path "Photon Stop" "Shadow Stop" BUT -With the "Photon Stop" or "Shadow Stop" ions must be defocused around the disc and then re-focused on the other side This is very inefficient and will introduce mass bias
Figure 41
44
Low Transmission Photon Stop System

Higher sample uptake rate (0.7-1.0mL/min), small injector tube (2mm), lower temp plasma (40MHz), fixed sample depth & large cone orifices (1.1/0.9mm) - inefficient matrix deposition Ions re-focused after photon stop, causing mass bias - loss of low mass ions
Ions must be defocused around photon stop - loss of ion transmission. Matrix deposition on photon stop and lens, causing drift
Simple ion lens - inefficient focusing - must use voltage scan on lens to reduce loss of low mass ions
Low transmission - higher sample uptake, large interface orifices and small torch injector must be used to compensate. Higher matrix loading on the system - more frequent ion lens cleaning, and faster degradation of interface rotary pump oil
Figure 42
45
Agilent High Transmission Off-Axis System

Lower sample uptake rate (0.3mL/min), larger injector tube (2.5mm), higher temp plasma (27MHz), variable sample depth & small cone orifices (1.0/0.4mm) - efficient matrix deposition Compound ion lens efficient focusing, high transmission across the mass range
Dual extraction lenses prevent loss of low mass ion on exit from interface. Also serve to protect main ion lenses by trapping sample matrix.
Photons and neutrals removed ions are deflected off axis into quadrupole with minimal mass bias
High transmission - sensitivity maintained with less sample loading on system lower sample uptake, small interface orifices and larger diameter torch injector. Results in much less frequent ion lens cleaning and extended interface rotary pump oil lifetime.
Figure 43
46
Ion Focusing New Omega II Lens
Ion Focusing New Omega II Lens

Ion Focusing - New Omega II lens
Integrated 1 piece design for easy cleaning (when required) No wires to attach, makes replacement fast and easy Gives very high sensitivity and low background performance
Ions enter here

The second part is the Omega II. This is where the ions are sent off axis
First 3 lenses are called an Einzel lens. These focus the ions
Figure 44
47
Flat Response Curve High Sensitivity at All Masses
Flat Response Curve High Sensitivity at All Masses

Flat Response Curve - High Sensitivity at All Masses
70 60 50 40
Mcps/ppm
30 20 10 0 0 50 100 150 200 250
Mass
Figure 45
Photon stop systems suffer from significant mass bias against low masses due to space charge effects.
48
Agilent 7500 Quadrupole

TRUE hyperbolic rods - precision ground from solid Molybdenum. Novel digitally synthesized 3.0MHz RF generator - produce excellent transmission, peak shape and abundance sensitivity
[1] Spectrum No.1 1.0E7 [ 70.409 sec]:YCS8.D# [CPS] [Log]
1.0E6
1.0E5
1.0E4
Log scale plot of 1ppm Y solution showing excellent peak shape and abundance sensitivity - note no tailing at low or high mass
1000
Very low contributions to adjacent masses
100
10
m/z->
82
84
86
88
90
92
94
96
98
100
Figure 46
49
Resolution and Abundance Sensitivity

Resolution
Peak Heigh t Peak Width (amu) at 50% Peak Height (typically 0.5 - 0.6)
Abundance Sensitivity
Abundance Sensitivity is ratio of peak height M to M-1 & M+1
10% Peak Height
Poor Abundance Sensitivity. Peak tails into Peak Width (amu) neighboring peaks at 10% Peak Height typically 0.65 - 0.75) M+1 M-1
Good Abundance Sensitivity. No contribution to neighboring peaks M
M-1
Figure 47
50
NEW Simultaneous Dual Mode Detector & High Speed Log Amplifier True 9 Order Dynamic Range
NEW Simultaneous Dual Mode Detector & High Speed Log Amplifier True 9 Order Dynamic Range
NEW Simultaneous Dual Mode Detector & High Speed Log Amplifier - True 9 Order Dynamic Range
New true simultaneous detector - with extended 9 order dynamic range - largest in ICP-MS! Agilents unique new detection circuit means acquisition speed is not compromised when analyzing in analog mode Pulse counting mode - min dwell time - 100usec Analog mode - min dwell time - 100usec! Transient signals such as those from a laser ablation pulse or chromatography can be measured over a wide dynamic range
Figure 48
51
The Detector
The Detector
The Detector
Electron multiplier discrete dynode detector (ETP) s each dynode gives "cascade" of electrons s -> signal is multiplied
Amp
M+ M+
Ion
Electrons
e
-
Dynode
Figure 49
52
Interferences in ICP-MS
Interferences in ICPMS
Interferences in ICP-MS y Mass Spectroscopic Interferences
O
Inability to resolve same nominal masses
y Non-spectroscopic Interferences
y Result from sample matrix
Figure 50
54
Mass Spectroscopic Interferences

z z
Isobaric Polyatomic z Argides z Oxides z Other (i.e. Chlorides, Hydrides, etc.) Doubly-charged
Figure 51
55
Isobaric Interferences
Isotopes AMU % Abundance 50 0.25 V 50 5.4 Ti 50 4.35 Cr Zr Ru Mo Ba La Ce 96 96 96 138 138 138 2.8 16.68 5.52 71.7 0.09 0.25
Figure 52
56
Polyatomic Interferences
Interferent m/z Overlaps with + 28 Si N2 + 30 Si NO + 32 S O2 34 S + 40 Ca Ar + 56 Fe Ar0 + 80 Se Ar2 78 Se 76 Se
Figure 53
57

y Choose an isotope free of interferences y y
137Ba instead of 138 Ba Optimize instrument to minimize interference Oxides, Doubly-charged ions ShieldTorch Reduces polyatomic ions with high ionization potential Removes ArO Removes ArH
Figure 54
58
Optimizing to Minimize Interference Formation in the Plasma [1]

Minimize matrix loading low sample uptake rate reduce water loading cooled spray chamber desolvation Maximize residence time in plasma maximum sampling depth large diameter torch injector for lower aerosol velocity
Figure 55
59

Maximize available energy for ionization high forward power reduce sample and carrier flow eliminate/reduce matrix easily ionizable elements where practical dilute if necessary
Figure 56
60

Residence time is on the order of milliseconds. It is essential to optimize plasma energy input ensure sample matrix breakdown!
By sample cone, analytes present as M+ ions
+
Aerosol is Dried Atoms are formed and then ionized Particles are decomposed and dissociated
Figure 57
61
Effect of Plasma Temperature on Degree of Ionization

100% 90% 80% 70% 60% 50% 40% 30% 20% 10% 0% 0 5 10 Ionization potential 15
degree of ioniztaion
5000 K 6000 K 7000 K 8000 K
Figure 58
62
Efficient Aerosol Decomposition

Wide bore torch injector results in a diffuse aerosol to minimize localized cooling as the aerosol droplets are dried and minimizes potential sample deposition on the inner surface
Figure 59
63
Oxides and Doubly Charged Ions

6 5 Ratio (%) 4 3 2 1 0 -5 0 5 10 15 20 Temp. (degreeC) Ce2+ Ba2+ CeO BaO
Figure 60
64
Dealing with Mass Spectroscopic Interferences

y Matrix Elimination y Chelation y Chromatography y ETV y Desolvation
O O
membrane thermal
y Interference correction equations
Figure 61
65
Interference Equations
Mathematical equations used to minimize the effect of elemental, doubly-charged and polyatomic isobaric interferences in ICP-MS analysis.
Isobaric
204
Hg on
204
Pb
Polyatomic
75ArCl
on
75As
Doubly charged ions

88Sr++
on
44
Ca
Figure 62
66
As Interference Correction
As Interference Correction
As interference Correction
75As 75As
= =
75M 75M
- { 77ArCl (35Cl abundance / 37Cl abundance) } - { 77ArCl ( 3.127 ) } (1)
But there is Se at m/z 77...

77ArCl
1.2
77ArCl
= 77M - { 82Se ( 77Se abundance / 82Se abundance) } = 77M - { 82Se ( 0.874 ) } (2)
Relative signal
1 0.8 0.6 0.4 0.2 75 76 77 78 79 80 81 82 83 0
So equation 1 and 2 becomes: Kr Se 75As = 75M - {[77M - { 82Se (0.874)}] (3.127)} ArCl As 75 75 77 82
As = M - M(3.127) + Se(2.733)
82M 82M
(3)
m/z
But, there is Krypton at 82

82Se 82Se
= =
- { 83Kr ( 82Kr abundance / abundance 83Kr ) } - { 83Kr ( 1.009 ) }
(4)
So equation 3 and 4 becomes:

75 As
= 75M - 77M(3.127) + {[82M - {83Kr (1.009)}](2.733)}
75As
= 75M - 77M(3.127) + 82M(2.733) - 83M(2.757)
Figure 63
67
Interference Correction Equations - Agilent 7500

Figure 64
Interference equations are edited from Top >> Methods >> Edit Interference Equation or from Edit Entire Method. Equations must be simplified and terms combined before entering them into the Edit Interference Equation dialog box. The actual values are stored within the method folder as correct.icp, a text file which can be directly edited if desired.
68
Non-Spectroscopic Interferences
s s
Total Dissolved Solids High Mass Elements

y High mass elements affect the signal of low mass element. (Space Charge)
Easily Ionized Elements

y Limited ionization energy is consumed by easily ionized elements such as Na and K.
Result from sample matrix
Figure 65
69
Effect of High Dissolved Solids

y Signal suppression y Deposits on sampler and skimmer cones y Deposits on ion optics
Figure 66
70
First Ionization Potential

(eV)
First ionization potential

He Ne
He 24.58eV
25 20
Ionisation potential
Ar Kr Cl Xe
Ar 15.75eV
15 10 5 0
N C Be B Li O Br
Au Rn Ir Hg Fe Zn As Cd Ru Po S Mo Os Pd Sb Mg Mn Co Se Ta Te Ac Zr Ti Pt Pb Lanthanides Ge Y Si Ca W Ag Sn Cu Rh Ni Hf Bi Cr Nb Re Ga Al Tl Sc Sr Tc In Ba Ra Na K V Rb Cs P I
10
20
30
40
50
60
70
80
90
Atomic number
Figure 67
71
Ionization Efficiency
100
Li
Na Al Mg Si
K ScV MnCo Ga Cu Ca Ti Fe Cr Ni Zn
Ru Rb Y Nb Pd In Ge Sr Zr Tc Mo RhAg Cd Te
Lanthanides Cs Sn Ba Sb Hf Ta W Re Os Pt Tl Pb Ra Bi Po Ac
80 Ionization efficiency (%)
Be B As
60
Au
40
P Se I Ir Ar 20 30 Br Kr 40 50 Xe 60 70 80 90 Hg Rn
20
S C O N 10 F Ne Cl
0 He
Figure 68
72
Signal Suppression
Signal Suppression
Signal Suppression
10ppb Co in NaCl Matrix

1.2 1
Sensitivity
0.8 0.6 0.4 0.2 0 0.00
0.05
0.10
0.50
1.00
2.00
5.00
% NaCl
Figure 69
73
Matrix Effects On Low Mass Analyte
Matrix Effects On Low Mass Analyte

Matrix Effects - on Low Mass Analyte
Lithium 7
Zn Na
Signal
1 0.5 0 Rb
Cd
Au
Low eV
Cs Tl
High eV
U
50
100
150
200
250
Mass of Matrix Element

Molar Ratio of Matrix Element to Analyte = 1000:1
Figure 70
74
Matrix Effects On Medium Mass Analyte
Matrix Effects On Medium Mass Analyte

Matrix Effects - on Medium Mass Analyte
Rhodium 103
Zn Na Rb
Cd Au Cs Tl U
Signal
1 0.5 0
Low eV High eV
50
100
150
200
250

Figure 71
75
Matrix Effects On High Mass Analyte
Matrix Effects On High Mass Analyte

Matrix Effects - on High Mass Analyte
Thorium 232
B 1
Zn Na Rb
Cd Cs
Au Tl U
Signal
Low eV High eV
0.5 0
50
100
150
200
250

Figure 72
76
Space Charge Interface and Lens Region

+ + + + + + + + + + + + + + + + + + + + + + + + + +
Figure 73
After Extraction Lenses, Ion beam is predominantly positive charged. Strong repulsive forces exist within the ion beam which affect low mass ions much more than high mass ions tending to disperse the low mass portion of the ion beam. Uncontrolled, space charge results in loss of low mass sensitivity, especially in the presence of high mass matrix. Complex, multi-element ion optics can compensate for this effect.
77
Ionization Suppression Plasma Region

Na+ Na+ Na+ Na+ - - Na+Na+ Na+ - - Na+ Na+
Zn
Na+
Na+ Zn
Zn
Zn
Na Na+ + eZn+ + eZn

Figure 74
78
What Can Be Done About Matrix Effects

y Dilution of Sample y Internal Standardization y Standard Additions y Matrix Elimination

O
y y
Chromatography ETV Membrane desolvation
Figure 75
79
80
Tuning the Agilent 7500
Why Tune the ICP-MS?
Why Tune the ICPMS?

Why Tune the ICP-MS?
s s s
Optimize Sensitivity y Maximize Signal y Minimize Noise Verify Correct Mass Calibration Verify Correct Ion Ratio Response Minimize Interferences y Oxides y Doubly-Charged Ions y Argides
Figure 76
82
Tuning Procedure Overview

s
s s
Tune Plasma Parameters RF Power Gas Flows Peristaltic Pump Flow Torch Position Tune Ion Optics Extraction and Ion focusing lenses Omega Lenses Tune Quadrupole Mass Analyzer Optimum Mass Resolution and Response Correct Mass Assignments Tune Detector Optimum Sensitivity Optimum Dual Mode (Pulse and Analog) linearity Save Tune Conditions Generate Tune Report
Figure 77
83
Agilent 7500 ICP-MS Manual Tune Checklist [1]

See Manually Tuning the HP-4500 ICP-MS for detailed instructions I.
s s
Verify Hardware vacuum, gas pressures and flows, peri-pump tubes and connections, error log examine cones with magnifier
II. Verify Plasma Parameters Aspirate tune solution #1, Warm up for 15-30 min s Check sensitivity, and precision s Fine tune carrier and/or blend gas flows for maximum signal, minimum RSDs (high s Li RSDs are usually related to worn or damaged cones) s Verify torch position and run torch position autotune if in doubt Check oxides (<0.8% is fine). If high: 1. Decrease carrier and/or blend gas flow. 2. s Decrease peri-pump flow. 3. Increase sampling depth. 4. Increase RF power III. Ion Lenses Adjust Ion lenses for maximum (or desired) signal and minimum noise and RSDs in this s order : Extract 1 and Extract 2 simultaneously (maintain ~ 50 V difference) Einzel 2 Omega Bias, Omega + and Omega - in that order QP focus if necessary
Figure 78
84

IV. Quadrupole Parameters Select Resolution/Axis s Observe peak shapes, optimize by increasing Plate Bias and Pole Bias together if s necessary s Adjust peak widths (0.7-0.75 AMU at 10%) if necessary with AMU offset for low mass and AMU gain for mid- and high-mass Adjust mass calibration (nominal mass +/- 0.05 AMU) with Mass Offset for low mass and s Mass Gain for mid and high mass V.
s s
Detector Parameters Automatically: Select SetEM from Tune menu Run P/A factor Autotune from Tune while aspirating 100 ppb standard
VI. Save Tune and Print Tune Report
Figure 79
85
Autotune Screen
Autotune Screen
Autotune Screen
Figure 80
Full Autotune should normally only be used when manually tuning the instrument is unsuccessful. Most adjustments can be made more easily and quickly manually. Exceptions are Torch Position, SetEM, Axis and Resolution, and PA factor setting. Setting realistic tune targets will increase the probability of a successful autotune and speed up the process. Setting appropriate and relatively narrow parameter ranges will result in faster and more consistent autotunes
86
Autotuning of ICP Torch Position and New Target Tune

Autotuning is used for consistent optimization, against a predefined set of tuning criteria (sensitivity, background, oxides, etc.) ICP torch position is critical for obtaining best sensitivity and lowest molecular interferences - manual ICP torch adjustment is imprecise and highly dependent on operator skill and experience. Can also be VERY time consuming. Target tune - user can specify the required sensitivity - even at different parts of the mass range. Target tune gives the novice user the expertise of an ICP-MS expert! Not limited to pre-defined suite of tune elements.
Figure 81
87
Features of Autotune (1)

z Customizing
Tune mass selection Target tune set up for sensitivities, etc.(*) Tune parameter range set up, fixed tune parameter set up, etc. (*) Quick Mode Option Fix parameter set up (*) Quick measurement Real time display of the Indicator
z Speed
z Visualizing
(*) These items were realized in the Agilent 4500, but enforced in the Agilent 7500
Figure 82
88

Multiple Functions and Abilities
4 tuning modes
Target Tune RSD Option Saving function of Autotunes target set up file Skip function Intelligence of Autotune sequence
Extraction, Soft Extraction, Cool Plasma Hot ShieldTorch
Figure 83
89
Choosing the Autotune Mode

Figure 84
90
Basics of the Soft Extraction Mode
Basics of the Soft Extraction Mode

Basics of the Soft Extraction Mode Extraction
Plasma
Soft Extraction
Plasma
Skimmer 2nd Extraction Lens 1st Extraction Lens
Skimmer
2nd Extraction Lens 1st Extraction Lens
Extraction: Charge Separation between the skimmer and the 1st extraction lens Soft Extraction: Charge Separation between the 1st extraction lens and the 2nd extraction lens
Figure 85
91
Comparison of Extraction Modes Settings

Extraction Mode
Shield Torch Cool Li: 20000 (Co: 1000) Y : --Tl: 300
BKG: < 1cps CeO: >>>
Soft Extraction Mode

Cool ------Hot Li: 6 Y : 300 Tl: 200
BKG: < 1cps CeO: 8%
Hot
Li: 200 Y : 700 Tl: 300
BKG: <20cps
CeO: 30%
Non-Shield Torch
Li: 15 ---------Y : 30 Tl: 15

BKG: < 5cps CeO: 0.5 %
--------
----------
Typical Sensitivity for Each Mode By Agilent 7500s (Mcps/ppm)
Figure 86
92
Autotune - Target Setting

Figure 87
93
Target Setting - Range Setting

Figure 88
94
Sensitivity Tuning
Sensitivity Tuning
Sensitivity Tuning
Figure 89
95
Peak Shape and Resolution

Quadrupole peaks tail slightly to the low mass side
Increasing the Resolution (narrower peaks) affects the low mass side more. Peak height is reduced and peak center shifts to high mass side.
Figure 90
96
Spectrum.1 [10.409 sec]:YCS8.D#[CPS][Log] 1.0E7 1.0E7
Spectrum.2 [10.409 sec]:YCS9.D#[CPS][Log]
1.0E6
1.0E5
1.0E4
9
84 86 88 90 92
1.0E6
1.0E5
good
1.0E4
8
84 86 88 90 92
bad
1000
1000
100
100
10
10
m/z->
m/z-> 82
m/z-> 82
Figure 91
97
Quadrupole Mass Filter - Scan Line

Mass Resolution dependent on:

RF frequency Length of quadrupole Ion speed
Tl 513 V Y
Resolution f2 L2 / V
f : Frequency L: Length of Q-pole v: Speed of ion
Li
V 3056 V
Figure 92
98
Detection Limits in Normal Mode

Unit : ng/L(ppt) Li Be 5 2.8 51 0.9 Na Mg 100 40 730 110 K Ca 3000 1300 34000 14000 Rb Sr 0.8 1 3.4 2 Cs Ba 0.5 2.5 2.7 3.5 Ra 3 sigma Integration Time :3sec. Upper Value : Detection Limit Lower Value : BEC Sc 10 120 Y 0.2 0.2 * Ti 2 9 Zr 0.3 0.3 Hf 30 4 V 3 8 Nb 0.2 0.2 Ta 0.08 0.1 Cr 15 65 Mo 0.5 0.5 W 0.3 0.5 Mn 2 30 Tc Fe 900 19000 Ru 0.8 0.8 Os Co 1 3.2 Rh 7 100 Ir 0.2 0.2 Ni 4 19 Pd 1 2 Pt 18 310 Cu 3 15 Ag 0.7 1.4 Au 0.8 2.3 Zn 22 260 Cd 0.7 1.7 Hg 1.6 1.2 B 11 93 Al 10 64 Ga 3 6.2 In 0.1 0.2 Tl 1 1.8 C 5000 82000 Si 700 16000 Ge 1 6 Sn 0.6 2 Pb 1 6 N O F Ne
Re 0.3 0.3
P 500 5200 As 8 35 Sb 0.7 1 Bi 0.2 0.3
S Cl 3000 6000 44000 38000 Se Br 80 600 460 2300 Te I 7 70 7 230 Po At
Ar
Kr
Xe
Rn
**
**
La 0.1 0.1 Ac
Ce 0.1 0.1 Th 0.2 0.2
Pr 0.08 0.09 Pa
Nd 1 0.6 U 0.6 0.8
Pm
Np
Sm 0.7 0.7 Pu
Eu 0.1 0.1 Am
Gd 0.4 0.5 Cm
Tb 0.3 0.9 Bk
Dy 0.3 0.4 Cf
Ho 0.08 0.09 Es
Er 0.3 0.2 Fm
Tm 0.07 0.09 Md
Yb 0.2 0.3 No
Lu 9 1 Lr
Figure 93
99
Detection Limits in Soft Extraction Mode

Unit : ng/L(ppt) Li 66 800 Na 200 2200 K 2000 14000 Rb 0.05 0.8 Cs 0.8 23 Be 0.5 1.1 Mg 0.7 10 Ca 90 2700 Sr 0.02 0.03 Ba 0.1 0.2 Ra 3 sigma Integration Time :3sec. Upper Value : Detection Limit Lower Value : BEC Sc 0.9 23 Y 0.01 0.02 * Ti 0.5 3.5 Zr 0.01 0.02 Hf 0.1 0.1 V 0.1 1.2 Nb 0.02 0.1 Ta 0.1 0.3 Cr 4.2 74 Mo 0.1 0.8 W 0.3 1.7 Mn 0.3 8 Tc Fe 200 7500 Ru 0.04 0.08 Os Co 0.2 3.1 Rh 0.04 0.8 Ir 0.05 0.07 Ni 0.1 0.8 Pd 0.05 0.1 Pt 0.08 0.4 Cu 0.2 1.7 Ag 0.1 0.2 Au 0.3 1.4 Zn 0.6 2.5 Cd 0.04 0.1 Hg 0.8 8.4 B 6 56 Al 2 17 Ga 0.08 0.8 In 0.01 0.02 Tl 0.2 0.8 C N O F Ne
Re 0.05 0.07
Si P S Cl 800 1000 10000 3000 19000 13000 100000 120000 Ge As Se Br 5 0.4 8 20 47 5.2 160 830 Sn Sb Te I 0.1 0.04 0.3 1 0.9 0.2 0.7 40 Pb Bi Po At 0.1 0.03 0.4 0.07
Ar
Kr
Xe
Rn
**
**
La 0.01 0.02 Ac
Ce 0.01 0.02 Th 0.07 0.1
Pr 0.008 0.01 Pa
Nd 0.03 0.08 U 0.05 0.08
Pm
Np
Sm 0.07 0.1 Pu
Eu 0.02 0.03 Am
Gd 0.03 0.06 Cm
Tb 0.01 0.05 Bk
Dy 0.09 0.07 Cf
Ho 0.02 0.02 Es
Er 0.08 0.06 Fm
Tm 0.01 0.02 Md
Yb 0.06 0.08 No
Lu 0.02 0.02 Lr
Figure 94
100
Low BECs in Soft Extraction Mode

Background Equivalent Concentration (ppt) Elements Li Na Y Ce Th Soft-extraction Extraction

4 190 0.005 0.004 0.005 800 2200 0.01 0.02 0.1
Figure 95
101
Pulse/Analog (P/A) Tuning

Figure 96
102
Maintenance of the Agilent 7500
Maintenance Schedule
Daily When Needed Weekly
Lab conditions, Argon, drain, peristaltic pump tubing, cones Cones, nebulizer, peristaltic pump tubing, torch, water filter, electron multiplier tuning solution preparation, torch, spray chamber, nebulizer, carrier gas line, cooling system check rotary pump, oil mist filter, check extraction lens clean lenses, change rotary pump oil, replace gas tubing replace o-rings, clean penning gauge, check/replace mist filter
Monthly
6 months Yearly
Figure 97
104
Running Time Maintenance Screen

Figure 98
105
Early Maintenance Feedback (EMF)

EMF monitors the operating hours of all major system components and proactively informs the user when: maintenance is required consumable items should be replaced Users can define their own maintenance schedule
Figure 99
106
Normal Maintenance of the Sample Introduction System

Non-Glassware Components
- Sample tubing - Peristaltic pump tubing - Babington nebulizer - Crossflow nebulizer - Nebulizer end caps - O-rings 1. Soak in 1% to 5% nitric acid (5 min.) 2. Clean in ultrasonic bath (5 min.) 3. Rinse with DI water
Glassware
-Concentric nebulizer - Spray chamber - Ball joint connector - Torch 1. Soak in 1% to 5% nitric acid (5 min.) or sonicate in 10% Citranox 2. Rinse with DI water
Figure 100
107
Overnight Cleaning of the Sample Introduction System

For severely contaminated glassware and non-glassware components Procedure 1. Soak in 5% nitric acid overnight or boil in 10% Citranox for 1 hour, rinse in 5% nitric acid 2. Rinse with DI water
Figure 101
108
Sample Introduction Maintenance

Top Cover Sample Transfer Line Spray Chamber Ball Joint Clamp Nebulizer and End Cap
Spray Chamber Chiller
Figure 102
109
Nebulizer Connections
Blend Gas Carrier Gas
Concentric Nebulizer
Blend Gas
Sample Uptake
Sample Uptake Carrier Gas
Babington Nebulizer
Blend Gas
Crossflow Nebulizer
Carrier Gas Sample Uptake
Figure 103
110
Maintenance of a Babington Nebulizer

Thumb Screws
Teflon Tubing Tube Connector Attachment Tool
Removal Tool Babington Nebulizer
Sample Tubing
Plate
Disconnecting the tubing connector using the attachment tool
Babington Nebulizer
End Cap Connection Port for Make-up Gas Wide Groove Narrow Grove
Figure 104
111
Torch Maintenance
Torch Maintenance
Torch Maintenance
Auxiliary Gas Torch
Plasma Gas
Torch Mounting Assembly
Figure 105
112
Interface Maintenance
Routine Maintenance
Components - Sampling cone - Skimmer cone Procedure 1. Soak in 1-5% nitric acid (<10 min.) 2. Rinse with DI water
Removing Severe Deposits

Components - Sampling cone - Skimmer cone Procedure 1. Polish with waterproof abrasive paper - be careful not to damage the orifice 2. Rinse with DI water
Figure 106
113
Maintenance of the Cones

Removal of the Skimmer Cone
Removal of the Sampling Cone
Figure 107
114
Extraction Lenses Maintenance

q q q q q q q q
Remove skimmer base from vacuum manifold Disassemble extraction lenses, screws and spacers Polish extraction lenses with waterproof abrasive paper Wash extraction lenses in DI water Sonicate lenses, spacers and screws in DI water for 5 minutes Sonicate lenses, spacers and screws in acetone for 5 minutes Reassemble lenses, spacers and screws on skimmer base Install skimmer base on vacuum manifold
Figure 108
115
Extraction Lenses
Extraction Lenses
Extraction Lenses
Screw 1
Skimmer Base Extraction Lens 1 Extraction Lens 2

Spacer 2 Screw 2 Spacer 1
Spacer 1
Figure 109
116
Cleaning of the Einzel Lens and Omega Lens Assembly

Disassemble lenses, remove screws and spacers Polish each lens, lens orifice and the curved surfaces of the Omega lenses using waterproof abrasive paper Wash lenses in DI water Sonicate lenses, spacers and screws in DI water for 5 minutes Sonicate lenses, spacers and screws in acetone or alcohol for 5 minutes Reassemble and install the lens assemblies and install them in the vacuum manifold Replace top cover and vent nut and restart system.
q q q q q q q
Figure 110
117
Instrument Shutdown
Instrument Shutdown
Instrument Shutdown
Shutdown
Standby
Figure 111
118
Removal of the Einzel Lens - Omega Lens Assembly

Screw 1
Einzel Lenses - Omega Lens Assembly
Screw 2
Figure 112
119
Expanded View of Einzel Lens - Omega Lens Assembly

Screw 2
Spacer 1
Spacer 1
Omega (-)
Spacer 1
Shaft
Spacer 1
Spacer 1 Spacer 1 Spacer 1 Screw 1 Spacer 3
QP Focus (back) QP Focus (front) Omega Bias (back) Omega (+)

Spacer 1
Spacer 2 Omega Contact
Omega Bias (front) Base Plate
Screw 3
Einzel 3 Einzel 2 Einzel 1
Figure 113
120
Plate Bias Lens
Plate Bias Lens

Plate Bias Lens
Plate Bias Lens
QP Focus Guide
Screw 1
Figure 114
121
Penning Gauge
Penning Gauge
Penning Gauge
1. Magnet Housing 2. Collar 3. Anode Assembly 4. O-ring 5. Body Tube 6. Cathode Plate 7. Cathode Tube 8. Circlip
Figure 115
122
Rotary Pump Maintenance

q q q q
Put system in Shutdown mode (Turn vacuum off) Turn off pump circuit breakers on front panel Remove oil inlet cap on top of pump Remove oil drain plug using a flat blade screwdriver and allow oil to drain into a waste container Replace oil drain plug and add new oil through the oil inlet until the oil level window is 80% full Replace oil inlet cap, turn on pump breakers on front panel, and start system (Turn vacuum on)
Figure 116
123
Changing Rotary Pump Oil

Figure 117
124
Maintenance Logbook Setting

Figure 118
125
Maintenance Logbook
Maintenance Logbook
Maintenance Logbook
Figure 119
126

Figure 120
127
Air Filters Maintenance

Remove air filters from the instrument Remove dust from the filters using a vacuum cleaner Wash filters with water if necessary and allow to dry Return filters to the instrument
Figure 121
128
Instrument Start-up
Instrument Startup
Instrument Start-up
Shutdown Analysis
Standby
Figure 122
129
Instrument Start-up
130
Internal Standardization in ICP-MS
The Role of Internal Standards

Correct for variations in response due to: Matrix Effects Transport effects Nebulization effects Ionization effects Space-charge effects Instrument Drift
Figure 123
132
How the Internal Standards Work - 1
How the Internal Standards Work 1

Added to each sample, standard and blank at identical concentration System therefore expects identical response from ISTDs in each solution Ratio of measured ISTD response to expected ISTD response is used to correct the response of the non-internal standard elements accordingly.
Figure 124
133
How the Internal Standards Work 2

In all cases where potential matrix suppression exists, the use of internal standards is necessary. s The calibration curve is plotted using the ratio of the analyte signal to IS signal (i.e. ax/isx), thereby canceling the effect of matrix suppression. s Each analyte in the sample will then be quantitated using the ratio of the IS and the analyte in the sample.
s
Figure 125
134
Choice of the Internal Standard

It is assumed that the IS elements behave in the same way that the analytes do in the plasma when using this correction. Therefore, selecting the appropriate IS element is very important. These are the things to take into consideration: s The element is not contained in the sample solution. s The mass number is close to that of the analyte. s The ionization potential is similar to that of the analyte. s Chemical characteristics The ionization potential matching is extremely important for analytes with high ionization potentials.
Elements that are commonly used as IS are: 6Li, Sc, Ge, Y, Rh, In, Tb, Ho, Bi
Figure 126
135
Concentration of Internal Standards

The IS elements can be added to the sample in 2 ways:

s s
On-line addition by peristaltic pump Spike in each standard and sample
In either case, it is recommended to add IS in concentration levels around mid-calibration range (exact concentration is application-specific)
For environmental applications 50 ppb concentration is usually applied. For on-line IS addition use 1 ppm IS stock solution, and use the peristaltic pumps as recommended.
Figure 127
136
On-line Addition of Internal Standards

On-line Addition
The IS solution is introduced by a narrow tubing (f = 0.19 mm), and is mixed with the sample at the Y connector. The dilution factor of the IS by the sample is about 1/20. Therefore, a 1 ppm solution in 5 % HNO3 would yield approximately 50 ppb in the sample. At least 5 % HNO3 is needed to avoid absorption of elements to the tubing, as absorption is more severe using narrow tubing.
Figure 128
137
138
Sample Preparation Techniques for ICPMS
Sample Preparation Techniques for ICP-MS
Contamination
Contamination
Contamination
"Contamination is the introduction of any component which affects the numerical value finally attributed to a constituent relative to the amount present prior to sampling" s Types of contamination: positive negative pseudocontamination
s
D.E. Robertson "Ultrapurity, Methods and Techniques", M. Zeif and R. Speights, Eds., Marcel Dekker, NY, 1972
Figure 129
140
Types of Contamination
Positive contamination - results in additive errors. Caused by impurities in reagents lab environment desorption from container walls Negative contamination - results in subtractive errors. Caused by losses in handling adsorption to container walls Pseudocontamination - results in either positive or negative errors. Caused by irreproducibility of experimental conditions
Figure 130
141
Challenges of Trace Analysis

Environment Sample Methodology
Analyst
Reagents
Standards
Figure 131
142
When a Contamination Can Occur

Sample collection

collection techniques collection devices prevention of positive contamination prevention of negative contamination reagents lab environment apparatus instrument sample introduction system standards
Sample storage

Sample preparation

Sample measurement

Figure 132
143
Reagents
Reagents
Reagents
Water Nitric acid Hydrochloric acid Sulfuric acid Hydrofluoric acid Other inorganic acids Hydrogen peroxide Alkaline solutions Organic solvents
s s s s s s s s s
Figure 133
144
Water - Millipore
Water Millipore
Water - Millipore
Millipore Corporation 80 Ashby Road P.O. Box 9125 Bedford, MA 01730-9903 Tel 1-800-MILLIPORE (1-800-645-5476) fax 781-533-8873 Internet: http://www.millipore.com/H2O
Figure 134
145
Nitric Acid
Nitric Acid
Nitric Acid
From Fisher Scientific (1-800-766-7000)
TraceMetal - for environmental analysis 500 mL in glass, catalog # A509-500, Certificate of Lot Analysis included with each shipment
Optima - for semiconductor and clinical applications catalog # A467-250, 250 mL in Teflon, catalog # A467-500, 500 mL in Teflon, Certificate of Lot Analysis included with each bottle from Mallinkrodt-Baker (1-800-444-0880)
INSTRA-ANALYZED (equivalent of TraceMetal),

500 mL in poly coated glass, catalog # 9598-00
ULTREX II (equivalent of Optima)

500 mL in Teflon, catalog # 6901-05
Figure 135
146
Selected Methods of Sample Preparation

Dilution Preconcentration Filtration Acidification Digestion

Open vessel digestion Closed vessel digestion Microwave digestion
Fusion Matrix separation

Chromatography Electrothermal Vaporization
Figure 136
147
Commonly Used Reagents (1)

Commonly Used Reagents (1) Nitric Acid (HNO3)
Used to dissolve a variety of materials such as metals, alloys, biological samples. Available in very high purity form. Most preferable acid for ICP-MS work, as polyatomic ions are not increased.
Hydrochloric Acid (HCl)

Used commonly for sample digestion. Generates Cl derived polyatomic ions. Can be evaporated to dryness and reconstituted in HNO3.
Hydrofluoric Acid (HF)

Used to dissolve silica-based materials and geological samples. HF attacks glass, therefore the inert sample introduction system must be used. Teflon containers are often used. Extreme health hazard.
Figure 137
148

Commonly Used Reagents (2) Hydrogen Peroxide (H2O2)
Strong oxidizing agent used with other acids for digestion. Useful for ICP-MS work, as backgrounds are similar to water (H2O).
Sulfuric Acid (H2SO4)

Oxidizing agent used with other acids for digestion. Causes numerous polyatomic ion interferences. Difficult to decompose in plasma due to high boiling point and viscosity. Deteriorates Ni and Cu interface material. Not recommended for use if it can be avoided.
Phosphoric Acid (H3PO4)

Used to buffer other acids. Causes numerous polyatomic ion interferences. Difficult to decompose in plasma due to high boiling point and viscosity. Deteriorates Ni interface material. Should be avoided.
Figure 138
149

Perchloric Acid (HClO4)

Strong oxidizing agent used with other acids for digestion of organic materials. Generates Cl derived polyatomic ions. More difficult to evaporate than HCl. Not recommended for use if it can be avoided. Handle with care as many solid perchlorates are explosive.
Aqua Regia (1 part conc. HNO3 + 3 parts conc. HCl)

Used for metal digestion, especially precious metals. Generates Cl derived polyatomic ions. Cl matrix can be removed by evaporation.
Figure 139
150
Semi-quantitative Analysis of Samples
Semi-quantitative Analysis
What is Semi-quantitative Analysis Setting Semi-quantitative acquisition parameters Analyzing the samples Semi-quantitative data analysis
Figure 140
152
What is Semi-quantitative Analysis?

y Is an analytical procedure used to calculate concentrations of all elements present in an unknown sample y Is useful as a screen prior to Quantitative Analysis y Does not require an external calibration y Is generally accurate to +/- 30% or better on completely unknown samples
O concentration ranges of analytes O selection of internal standards
Figure 141
153
Data Acquisition
Data Acquisition
Data Acquisition
Figure 142
154
Method Set-up for Semi-quantitative Analysis

To write comments & record updates Do not check
Figure 143
155
Parameters Selection - Spectrum Acquisition

[2] Select Mass Scale [1] Select Semi-Quant peak pattern, 0.1 s/point, 1 repetition
Figure 144
156
Parameters Selection - Selection of Masses

[2] Exclude unlike, impossible, and interfered with masses
[1]Select mass ranges
Figure 145
157
More Acquisition Parameters
More Acquisition Parameters

More Acquisition parameters
If checked, use the browse button to select the appropriate file
Do not check When background is subtracted, and the internal standards are used, exclude up to 4 masses from subtraction (IS masses)
Figure 146
158
Report Generation
Report Generation
Report Generation
Select a report
Figure 147
159
Semi-quant Parameters
Threshold value (tune-dependent) Select ppb as the units (or ppm)
Not to be reported (output = OFF)
Figure 148
Set the Minimum Peak threshold to reject results based on noise. The default is 50, but remember, typical response in tuning is 20 million cps/ppm which is 20K cps/ppb. Therefore at least 200 cps represents a reporting threshold of approximately tens of ppt, a reasonable value. Output Mode is either ON, OFF or AUTO. ON - this element will always be reported; OFF - this element will never be reported; AUTO - this element will be reported IF no significant interference is detected. The acceptable level of interference is stored in WIN.INI and can be edited there. Concentration Units is either user selectable or when set to AUTO, the ChemStation will select the appropriate units based on the estimated concentration. Enter the concentration in ppb (or ug/L) of the elements in the cal standard. Leave the other concentration fields blank.
160
Semi-quantitative Data Analysis
Figure 149
Semiquant analysis can be used to estimate the concentration of any element for which a precise measurement can be made by ICP-MS (> 70 elements). Typically, semiquantitation is accurate to within +/- 30 percent on completely unknown samples. However, semiquantitation is subject to the same interferences as quantitation. Possible interferences due to oxides, hydrides, argides, dimers and doubly-charged ions are checked and flagged on the report. Interference correction equations can be used to minimize these effects where applicable. The use of internal standards can help correct for matrix differences. Blank subtraction can be used to eliminate contributions from laboratory reagents and sample preparation. The ChemStation comes configured with default SemiQuant response factors. These factors are based on relative ionization potentials and numbers of isotopes for each element. These factors can be updated to reflect the tune state of the HP4500 by analyzing a calibration mix. At least 3 elements should be used, though more is better. The ChemStation will then interpolate between analyzed masses to update all SemiQuant response factors.
161
Editing Parameters
Editing Parameters
Editing Parameters
Holding <ctrl> select elements to be reported
Change default mass for Cu from 63 to 65 Enter the concentration of calibration standard
Figure 150
162
Daily Update of the Semi-Quant Parameters

Load a previously acquired file and select Correct by Current Data
Figure 151
Correct by Current Data recalculates all semi-quant response factors by first dividing the supplied concentrations by the responses for those elements. Other, non-calibrated element response factors are estimated by interpolation.
163
Internal Standard Correction for Off-line Internal Standard Addition

Activating internal standard correction
Off-line addition
IS concentration
Selecting internal standard
Figure 152
Internal Standardization is recommended since it corrects for changes in instrument sensitivity due to matrix and other effects. To configure internal standard correction: Data Analysis >> SemiQuant >> Internal Standard Correction Internal standard correction can be applied in two modes: Normal Mode assumes that internal standards are added to the samples only and no ISTD reference data file is required. This can be used for analyses such as Laser Ablation, where a matrix element is used as the internal standard. The ISTD factor is calculated from the supplied ISTD concentration and the ISTD response. Up to four internal standard elements can be selected.
164
Internal Standard Correction for On-line Internal Standard Addition

Activating internal standard correction On-line addition
Selecting internal standard
Figure 153
Auto Add Mode assumes that the online internal standard addition configuration is used. In this case, the exact concentration of the ISTD elements need not be known since an ISTD reference file used. Only the internal standard masses need be selected. In this case, the only requirement is that the ISTD concentration in all samples be identical to the ISTD reference file. The ISTD reference file can be either a blank or a calibration standard containing online added internal standards.
165
Example of Semi-Quant Report [1]

For signal <200 cps (threshold), a threshold concentration (corresponding to 200 cps) is report
For signal >200 cps (threshold), the concentration of the analyte is reported
Figure 154
166

Software indicates possible interferences
Figure 155
167
Generating a Semi-quant Report

Automatically as part of Run Method or Run Sequence Manually from Data Analysis SemiQuant also allows Custom Reports and Custom Databases Use of DoList for multiple reports
Figure 156
168
Manual Verification of the Data

Figure 157
169
170
Quantitative Analysis of Samples
What is Quantitative Analysis?

Quantitative Analysis:
s An analytical procedure used to calculate concentrations of specific elements in unknown samples
s Uses calibration curves based on the response of one or more levels of standards to calculate unknown concentrations
s Allows the use of internal standards to correct for instrument drift and matrix differences between standards and samples
Figure 158
172
Method Set-up for Quantitative Analysis

Steps in Setting up a Quantitative Analysis:

s s s s s s s
Editing the AMU Select file, if necessary Interference correction equations Spectrum acquisition parameters Peripump program Calibration table Acquiring calibration standards and updating the calibration table Analyzing unknown samples
Figure 159
173
Step One: Editing the AMU Select File

From Top >> AcquireData >> Edit AMU Select File (amu)...
Figure 160
The AMU select file is the database from which default isotopes are selected when elements are selected from the Periodic Table in Edit Entire Method. Multiple AMU select files can be created for different applications. For example AMU select files can be created which automatically select the EPA specified isotopes when running EPA methods. AMU select files can also be created for specific matrices in order to avoid known isobaric or polyatomic interferences. The element needs to have at least one isotope selected, in order to be accessible in the method setting. If needed, select isotopes for P, and Si.
174
Editing a Method for Quantitative Analysis

Select Edit Entire Method
QC Parameters will only be available if Intelligent Sequencing is enabled
Figure 161
175
Method Information
Method Information
Method Information
Figure 162
176
Acquisition Modes
Acquisition Modes
Acquisition Modes
Figure 163
Spectrum mode is the most common acquisition mode for standard applications: Quant Semiquant
Time Resolved Analysis (TRA) and Time Program (more sophisticated than TRA) are used when a transient signal is measured: Electrothermal Vaporization (ETV) Laser Ablation (LA) Discrete Sampling Analysis (using ISIS) Chromatographic analysis (LC, GC, IC, CE)
Isotope Analysis mode is used when additional precision is needed for isotope ratio measurements. It is similar to spectrum mode, but with 10X higher sampling frequency.
177
Acquisition Modes Multitune mode is used when during a single acquisition more than one tuning parameters are needed to accomplish the optimum performance.
178
Acquisition Parameters - Multitune Method

Figure 164
179
Periodic Table
Periodic Table
Periodic Table
Figure 165
180
Mass Table
Mass Table
Mass Table
Figure 166
181
Peristaltic Pump Program

Maximum Speed should not exceed 0.30 rps with online ISTDs addition Typical Stabilization Time is 50-60 sec Probe Rinse should be very short (~1 sec) Rinse time is sample/matrix dependent (30-90 sec)
Figure 167
182
Raw Data Corrections

Subtracts Background spectrum (counts from counts) before Quantitation
Enables Interference Correction Equations
Figure 168
183
Configure Reports
Configure Reports
Configure Reports
Enabled with Intelligent Sequencing
Figure 169
184
Calibration
Calibration
Calibration
Now independent of the method Multiple methods can share the same calibration Current calibration is displayed on the TOP and Data Analysis title bar
Link between calibration and method is established when method is saved
Figure 170
185
Calibration Table
Calibration Table
Calibration Table
Figure 171
Shortcuts: Double click any column selects entire column. Fill Across is useful for copying Internal Standard Concentrations to all levels. Multiple entries can be selected using <Ctrl> plus left click or Shift plus left click. Min. Conc. is the lower reporting limit, to disable it replace it with ---, often the reporting limits are entered here.
186
Save the Calibration and the Method

Figure 172
187
Quantitative Data Analysis
Figure 173
188
Standard Data Files
Standard Data Files

Standard Data Files
Figure 174
189
Calibration Curves
Calibration Curves
Calibration Curves
All measurements in Pulse counting mode Some measurements in Pulse counting mode, some in Analog mode
Figure 175
190
Examples of the Calibration Curves for Excluded

Mass used for correction - real element Internal Standard Mass used for correction
Figure 176
191
192
Simple Sequencing (Intelligent Sequencing Disabled)
Sequencing
Sequencing
Sequencing
Associates a list of samples with ALS positions and

analytical methods Allows unattended analysis of multiple samples using multiple acquisition and reporting methods including all calibration updates. Designed to be used with an Autosampler (ASX-500 or ASX-100), can be used in a manual mode Allows automatic shutdown upon completion of the sequence
Figure 177
194
ASX-500 Vial Position Nomenclature

Large bottles (tuning solution, rinse solutions, blank)
Example of 21-40-40-40 configuration

Figure 178
Vial 1304 = rack 1, column 3, raw 04 (two digits)
195
Sequencing
Sequencing
Sequencing
NT ChemStation Sequencing is Spreadsheet based Allows shortcuts such as
Allows sample list to be inserted from other applications by
cut, copy, paste, repeat, fill down
importing .csv file copy and paste from other application
Figure 179
196
Sample Log Table - Sequence Flow and Periodic Block

Figure 180
Sequencing is Modular, each functional part of the sequence is created as a separate block such as calibration block, sample block etc. This is used more fully by Intelligent Sequencing.
197
Sample Log Table
Sample Log Table

Sample Log Table
Sequence block selection menu Shortcut options box
Figure 181
Right Click selects shortcut options box. Left Click or Double Click selects options for Type, Method, Dil/Lvl, Action on Failure (Intelligent Sequencing Only), and Skip. Vial positions increment correctly by reading ALS rack configuration when using fill down. Any numeric characters in Sample Name, Data File Name, or Comment Fields will be incremented by using fill down. To avoid auto-incrementation, use copy and paste instead of fill down. List Method-Cal displays the complete path for the method on each sequence line with its associated calibration file.
198
Special Features - Keywords
Special Features Keywords

Special Features - Keywords
Command - a macro program Methpath - specifies a method path (different than the normal ICPCHEM pathway) Overwrit - overwrites a data file without asking for confirmation Pause - pauses a sequence Lotsep - separates sample batches (used mostly in intelligent sequencing StdToExt - converts MSA calibration to external calibration Standby - puts the instrument in Standby mode
Figure 182
Keywords are enabled by selecting Keyword Under Type and then selecting the desired keyword in the Method Column. If Keyword Command is selected, the Command or Runstring is entered in the Sample Column. For Example to incorporate the shutdown macro into a Sample Log Table: Keyword Command Tune Macro `shutdown, go
199
Running a Sequence
Running a Sequence
Running a Sequence
Data batch directory
Figure 183
Upon selecting Run Sequence, a data batch directory is automatically created in the form YYMDDHHx.b, where: YY is 2 digit year M is month, A=Jan, B=Feb etc DD is day HH is hour (24 hour clock) x is a letter from a to z for the sequence number within a given hour.
This can be appended, deleted, or modified as needed.
200
Chained Sequence
Chained Sequence
Chained Sequence
Allows Multiple Sequences to be Run in Series
Allows Different Tune Conditions to be Used for Each Sequence for example Hot and Cool Plasma high and low sensitivity etc.
Tunes to be used in a chained sequence must be created (verified) prior to running the sequence
Figure 184
201
Chained Sequence
Chained Sequence
Chained Sequence
Figure 185
202
Method of Standard Additions (MSA)
External Calibration
q q
All Standards are prepared in one matrix A calibration curve is generated by plotting the intensity vs. concentration Sample concentration is calculated using the slope of the calibration curve Internal standards are used to correct for matrix-related signal changes IS can be added on-line
Figure 186
204
Pros and Cons of External Calibration

Pros Minimal sample preparation Good accuracy for simple matrices Cons IS additions increases contamination potential Limited with difficult matrices (Photoresist) It doesn't work well with cool plasma
Figure 187
205
Method of Standard Addition (MSA)

q q
Standards are prepared in the sample matrix A calibration curve is generated by plotting the intensity vs. spiked concentration Sample concentration is calculated by extrapolating to the Y intercept Calibration can be converted into an external to run subsequent samples of the same matrix.
Figure 188
206
Pros and Cons of Method of Standard Additions

Pros Method of choice for ultra-trace levels Good accuracy for all matrices No need for internal standards Compensate for differences in sample nebulization and transport efficiency Cons Different calibrations for each matrix All signal is accounted for can't distinguish between true signal or background BEC for Ca, Fe and K can be affected
Figure 189
207
Determination of Uranium in Urine by MSA

Reported concentration
Figure 190
208
Converting from MSA to External Calibration

Figure 191
209
Matrix-matched Uranium in Urine External Calibration

Note corrected concentrations
Figure 192
210
Off-line Data Analysis and Sequence Reprocessing
Off-line Data Analysis

Reviews calibration and data for currently running

sequence Edits currently running data analysis method Saves modifications to currently running data analysis method (if needed) Reprocesses data for currently running sequence Reviews/Reprocesses previously acquired data
Figure 193
212
Procedure for Off-line Data Analysis

Start Off-line Data Analysis Load appropriate method Verify calibration data files Make corrections/modifications (if needed) Reprocess data
Figure 194
213
Off-line Calibration Review of Currently Running Method

Review calibration graphs: examine linearity, RSDs, intercepts, internal standard reproducibility etc. make any corrections or changes Select Method >> Save to Online This procedure updates currently running method
Figure 195
214
Using DoList for Off-line Data Reprocessing

Dolist automatically reprocesses a batch or list of data files according to the options selected using to the currently loaded method and calibration. DoList does NOT update the method or calibration
Figure 196
Dolist always uses the currently loaded method, not necessarily the method originally used to acquire the data. Dolist does not load the method from disk or resave the method to disk when finished. Therefore, it is possible to make temporary changes to the method for reprocessing only (such as different report destination etc.) and not save the changes permanently to the disk.
215
How to Use DoList
How to Use DoList

How to Use DoList
Data Analysis >> Tools >> Configure DoList Data Analysis >> Tools >> DoList
Figure 197
216
Selecting Files Using DoList

Figure 198
217
Sequence - Reprocessing Data Batch

Used to reprocess entire (or partial) sequence Does Load methods from disk as specified Update calibrations in order acquired Recalculate (Requant) data and regenerate reports Save updated calibrations to disk
Figure 199
218
Sequence Reprocessing
Top Menu>> Sequence >> Reprocess Data Batch Select Data Batch Reprocess Data Batch (click OK)
Figure 200
Reprocess Data Batch uses the sequence stored within the data batch directory for reprocessing. This sequence is created at the time of analysis and is named according to the date and time of acquisition. It is possible to modify the sequence before reprocessing by removing undesired data files. However, care must be taken not o remove necessary files such as calibration files or reference files for sample types such as spikes or duplicates.
219
220
Custom Reports and Databases
What You Will Learn
What You Will Learn

What You Will Learn
How to create a template and generate reports how to create a database and update it
Figure 201
This section will introduce you to the Custom Reports package included in the Agilent 7500 Series ChemStation Software. Custom Reports is a windows application with three basic functions:
Y Y Y
spreadsheet database charts
Spreadsheet functions allow to easily design a report template and produce a report for a single sample. Custom databases contain information from many samples. Charting of the database is useful for trend analysis and/or monitoring QA/QC samples. A ChemStation method can have one report template and/or one database assigned for FullQuant analysis and one report template and/or one database assigned for SemiQuant analysis. 222

Based on Visual Basic runtime program When installed, creates \icpchem\custrpt directory Also creates \icpchem\1\rpttmp Accessible through FullQuant and SemiQuant menus Custom report templates are *.fqt or *.sqt files Custom report databases are *.fqd or *.sqd files
Figure 202
The objective of Custom reports is to provide an interface between the quantitative features of the Agilent 7500 Series ChemStation and the Visual Basic Custom Reports. The link between the two programs is provided through a feature of the Windows environment known as Dynamic Data Exchange (DDE). This link allows easy transfer of information from one program to another.
223
Creating and Editing a Report Template

Create new report template Edit the current report template Specify new report template
Figure 203
Selecting the New menu item from the Template menu will bring up the Custom Report / Database Wizard.
224
Custom Reports - Report Wizard

Select a Report Contents section from the list on the right. Select an item from the Possible Items for Report list on the left. Click the Add button. Repeat until all items and sections are added. Click OK.
Figure 204
The Report Wizard dialog box is used to build a report template with up to two sections. The header section contains general information about the sample. The All Elements section contains element specific information arranged into tables. A plus sign next to an item indicates there are sub-items available. Double-click on the plus sign to open the sub-item listing. The plus sign becomes a minus sign. Double-click on the minus sign to close the sub-item listing. Spectral graphics as well as calibration curves can be added to a custom report template. Graphics can NOT be added to a database. The Graphic section of the possible report items has two main subsections: Draw Spectrum and Graph of Each Element. Items from the Graphics section can only be added to the Header section of the Report Contents. The items from the Graph of Each Element can be added to either section of the report. The order of the graphics in the Report Contents listbox of the Report Wizard determines the position in the report for the graphics. The text items are always
225
Custom Reports - Report Wizard drawn together and cannot be interspersed with the graphics through the Report Wizard. Press the Ctrl key and click the graphics to resize or reposition the graphics.
226
Custom Reports - Drag and Drop (1)

Figure 205
227

Accessed by selecting View / Edit Box or clicking Edit Box button of the toolbar. Select an item and drag it to any cell on the spreadsheet. Use the Next button or select from the list to view other elements. The current value for the highlighted item is displayed.
Figure 206
228
Formatting Custom Reports

The Report Wizard formats automatically but you can
customize the format using the Format menu items. Highlight the cell(s) you want to format. Choose a menu item or click a format button on the toolbar. Repeat as necessary. Save the template
Figure 207
Column width and row height can be controlled form the Format Menu or by using the Mouse. Other mouse actions: select a group of cells select a row or column select multiple rows or columns select multiple, non-contiguous, single cells select multiple, non-contiguous, rows and columns select multiple, contiguous items
229
Custom Reports - Printing Set-up
Custom Reports - Printing Setup

Custom Reports - Printing Set-up
Controls how pages are printed.
Controls paper size.
Figure 208
The following Print Optionsare available: Grid Lines - lets you print grid lines (otherwise they are visible on the screen only) Black &White - prints color in black and white on a color printer
If selected, fit to Page(s) scales the document to print a document to print on a single or on the number of pages specified in Pages Wide, Page High. Scale sets the percentage to reduce or enlarge the document when printed.
230
Custom Reports - Saving the Template

Select File / Save or File / Save As
Default file name is <method name.fqt>; choose this or enter alternate file name and click OK.
Click Yes to link the template with the current method
Figure 209
For the report template name, any legal DOS name is OK. The default file name will have the same prefix as the currently loaded method. Notice that all report templates end with either FQT or SQT extension. After saving the report template the Link With Method Dialog Box will appear.
231
Printing Custom Reports - Interactively
Printing Custom Reports Interactively

Printing Custom Reports - Interactively
Load a data file.
Select FullQuant / Print Custom Report.
Figure 210
A custom report may be interactively printed at any time using a two step process. First, load the data file. Second, select FullQuant / Print Custom Report.
232
Printing Custom Reports - Printing Multiple Files [1]

Figure 211
233

Selected data files will be listed in this box.
Select files to be processed
Figure 212
Select files from the Data File listing: multiple continuous multiple discontinuous a single file can be removed from the Files Selected for Processing by double clicking on it.
Click Add to insert those names into the Files Selected for Section of the panel. Click the Process button.
234
Databases
Databases
Databases
Create new database
Edit the current database and/or create charts Specify new database
Figure 213
Selecting the New menu item from the Template menu will bring up the Custom Report / Database Wizard.
235
Database Wizard
Database Wizard
Database Wizard
Select a Database section from the list of the right.
Select an item from the Possible Items for Database list on the left. Click the Add button. Repeat until all items and sections are added. Click OK.
Figure 214
Clicking the Add button will add the selected item to the Database Content list on the right. Clicking the Remove button will remove the selected item from the Database Content list. Graphics can NOT be added to a database
236
Database - Drag and Drop

Figure 215
Accessed by selecting View / Edit Box or clicking Edit Box button of the toolbar. Select an item and drag it to any cell in row 3. Use the Next button or select from the list to view other elements. The current value for the highlighted item is displayed.
Be aware that if you are editing a database, you can only put items from the Edit Box into row 3. This row contains all the information that you want to keep for each data file. Next accesses the next element in the quantitation results. Elements can also be selected by using the element selection box.
237
Database - Formatting
Database Formatting
Database - Formatting
Figure 216
238
Database - Charts
Database Charts
Database - Charts
The Database Wizard formats automatically but you
can customize the format using the Chart Options. Save the database.
Figure 217
X-Axis lets you choose which items to chart on the X-Axis. Column B and C of the database determine the X-Axis items. The default item for Column B is Date Acquired and for Column C is Data File Name. Y-Axis lets you choose which items to chart on the Y-Axis. Only numerical values (such as mass or counts) can be used for the Y-Axis. The Print Option lets you print the current chart or print all charts in the database.
239
Global Chart Options

Figure 218
By default, all rows in database are charted. If you enter a number N (other than 0) in the Data Points from End to Chart field, then only the last N rows will be charted. This feature is useful when you have added many rows to your database, but are only interested in the last N files. You can override this value for a single chart using the Individual Charts Options dialog box. Automatic Scaling - The software will automatically choose a range which allows all of the data to be seen. The data is shown in absolute units. The range chosen can be slightly larger than the actual data range. Manual Scale - The manual scale allows you to control exactly what the scale on the Y axis will be. Normalize to Maximum - This scale allows you to chart the data as a percentage of the maximum value (set to be 100%). Set the First Data Point to - This scale allows you to chart all points as a percentage of the first row of data.
240
Global Chart Options You can draw up to four control/limits lines on a chart. These lines can be relative to the Mean or to the first value charted. You can draw the percentage lines or Standard Deviation lines
241
Database - Saving
Database Saving
Database - Saving
Select File / Save or File / Save As Default file name is <method name.fqd>; choose this or enter alternate file name and click OK.
Click Yes to link the template
with the current method
Figure 219
242
Updating the Database - Interactively
Updating the Database Interactively

Updating the Database - Interactively
Load a data file.
Select FullQuant / Update Database.
Figure 220
243
Update the Database - Multiple Files [1]

Figure 221
244

Selected data files will be listed in this box.
Select Tools, DoList...
Select FullQ -- Update Database Select files to be processed
Figure 222
245
246
Isotope Ratio Measurements

Select Edit Entire Method
QC Parameters will only be available if Intelligent Sequencing is enabled
Figure 223
248
Acquisition Modes
Acquisition Modes
Acquisition Modes
Figure 224
Spectrum mode is the most common acquisition mode for standard applications. Quant Semiquant
Time Resolved Analysis (TRA) and Time Program (more sophisticated than TRA) are used when a transient signal is measured. Electrothermal Vaporization (ETV) Laser Ablation (LA) Discrete Sampling Analysis (using ISIS) Chromatographic analysis (LC, GC, IC, CE)
Isotope Analysis mode is used when additional precision is needed for isotope ratio measurements. It is similar to spectrum mode, but with 10X higher sampling frequency.
249
Acquisition Modes Multitune mode is used when during a single acquisition more than one tuning parameters are needed to accomplish the optimum performance.
250
Acquisition Parameters for Isotopic Ratio Measurements

Longer acquisition time for less abundant isotope Usually 5 or 10 repetitions
Figure 225
251
Report Selection
Report Selection
Report Selection
Figure 226
252
Setting Parameters for Isotopic Ratios

Figure 227
253
Example of the Isotopic Ratio Report

Figure 228
254
Agilent ICP-MS ChemStation and Windows Overview
The Windows Interface

Access to disk drives and folders Folder to temporarily hold files, folders, or objects which have been deleted. Start button to open programs Task Bar
Figure 229
256
Windows Menus
Windows Menus
Windows Menus
Programs - Windows NT Explorer, WordPad, Paint, Agilent 7500 ChemStation Documents - The last 15 documents you have worked on Settings Control Panel, Printers, Taskbar
Shutdown - Select before turning off your computer
Figure 230
257
Useful Windows Tips
Useful Windows Tips

Useful Windows Tips
Add Programs to the first-level menu instead of cascading through menus. qCreate Shortcuts by dragging a document to the desktop with a right-click of the mouse button. qChange the desktop properties with a right-click of the mouse button. qUse Ctrl-Alt-Del to end a task that is not responding.
q
Figure 231
258
Maintaining the Computer System

Delete temporary files on a regular basis Use Checkdisk to check for errors on the disk Defragment the hard drive using a WinNT utility Use Virus detection software Create a Windows NT Emergency Repair disk
Figure 232
259
Windows NT Explorer - Enhanced File Management

Click on + sign to open sublevels in the left pane. Click on the item to display the contents in the right pane as folders.
Figure 233
260
Directory Structure of the Agilent ChemStation

D:
Siclnt
Icpchem
Winnt
Custrpt
Database
Icpexe
Icpsetup
Calib Chnseq Data
7500
Methods
Qcmode Rpttemp Sequence
Icpdemo.d Std-05.d Std-10.d
Figure 234
261
File Naming
File Naming
File Naming
Files have the form: <filename>. <extension> <up to 8 characters> . <up to 3 characters> Period Separator
Forbidden characters for filenames: . / \ : <space> []| + ; , ? = * < >
Figure 235
262
ChemStation File Extensions

ChemStation File extensions
.d .m .s .chs .mac .exe .txt .db .log
data "file method "file sequence file chained sequence macro file program text file database logfile
.qcc .qct .fqt .fqd .u .pa .prm
QC mode QC template full quant template database template tune file P/A file tune parameters
Figure 236
263
264
An Overview of ICP-MS Environmental Applications
Optimizing Agilent 7500 for Environmental Samples Analysis

Tuning
Match instrument dynamic range to analyte concentration range
Detune sensitivity, especially low mass Dilute samples as necessary (off-line or auto-dilute with ISIS)
Effects of Sample Matrix
Minimize
High RF power Longer sampling depth ==> longer residence time Appropriate use/selection of internal standards Appropriate selection of isotopes
Figure 237
266
Environmental Tuning
Three Steps: Initial Setup and Hardware Checkout Optimize Physical & Plasma Parameters Detune Sensitivity via Ion Lenses
Figure 238
Initial setup/hardware checkout When any maintenance is executed, it is important to verify that the instrument can meet specifications for sensitivity, precision, mass calibration, oxides and all other parameters. This will verify that the hardware is operating correctly. Physical/Plasma Parameters Since typical environmental samples can contain relatively high matrix, it is important to make tuning adjustments that improve the decomposition of the matrix, such as increasing the plasma temperature or increasing the residence time of the sample in the plasma. Detune Sensitivity via ion lenses Typical compositions of environmental samples include higher concentrations of low mass elements such as Na, K, Ca and Mg, and lower concentrations of mid and high mass elements such as Se and Hg.
267
Environmental Tuning To analyze all the elements at the same time, detuning the low mass only can be an effective technique. However, care must be taken in this process if analysis of Be is required. Tips Conditioning of the interface is recommended to improve signal stability, after cleaning the cones or extraction lenses. For conditioning, run tap water through the system for 1/2 hour during tune before finalizing tune conditions and prior to calibration and sample analysis.
268
Three Goals of Environmental Tuning

Optimize aerosol formation Maximize analyte exposure to plasma temperature Minimize matrix exposure to mass spectrometer components
Figure 239
Increasing sampling depth increases the sample residence time in the plasma. The effect is to allow more time for decomposition (atomization and ionization) of the analyte elements. Each nebulizer has optimal values for carrier gas flow rate and sample flow rate. In general, higher carrier gas flow rates create higher carrier gas pressures thereby generating finer droplets, which lead to better instrument sensitivity. However, excessive carrier gas flows cool the plasma, decreasing the sensitivity and increasing the ratios of oxides and doubly-charged ions significantly. Excessively high carrier gas flows cool the plasma which increases low mass (e.g. Li) sensitivity and noise to a non-acceptable level. Lithium signal should not exceed Yttrium signal in a well tuned system. Oxides are almost completely controlled by the interaction of four parameters, spray chamber temperature, sample depth, carrier gas flow and peri-pump flow. Since we have chosen to maximize sample depth for other reasons and spray chamber temp should normally be set to 2 C. we must control oxides with carrier gas flow and peri-pump flow. The goal here is to maximize the efficiency of the particular nebulizer being used (smallest droplet size and size distribution), without increasing either flow to the point of over-cooling the plasma. 269
Three Goals of Environmental Tuning Decreasing the negative voltage on the two extract lenses decreases the number of ions drawn into the mass analyzer. This decreases the sensitivity of the instrument. It also decreases the ion load on the rest of the mass analyzer which minimizes the need to clean the other lenses and components. It is important that the correct voltage gradient between the two lenses be maintained. As such, Ext1 should be set and then Ext2 fine tuned to give the best results. If large changes in Ext1 voltage have little to no effect on sensitivity, this is an indication that the extract lenses need to be cleaned.
270
Tuning Flow Chart
Tuning Flow Chart

Tuning Flow Chart
Tuning the Agilent 7500 ICP-MS for Environmental Applications
Initial Setup/Hardware Checkout
Initial Setup New Instrument or after Major System Maintenance Initially, all tune parameters should be set according to the recommended values on table 1 (shaded) Initial targets: Li > 8k Y > 12 k Tl > 8 k all RSDs < 10% oxides < 1% pass
FAIL
Physical/Plasma Parameters
Set RF Power 1350-1500 Watts (monitor reflected power and adjust if necessary with RF Matching Adjust Sampling Depth 8-9 mm (1)
Then... begin the process of environmental tuning
Set Carrier Gas Flow Set Peri-pump 0.08-0.1 RPS 1.15-1.2 L/min. Monitor oxides; it should not exceed 0.5% (2)
See Appendix 4
Oxides < 0.5 % Li counts > 5000 (int. time = 0.1 sec)
No
1. Decrease carrier (or blend) gas flow 2. Increase or decrease peri-pump flow (3)
Yes
Run Torch Position Autotune
Run Set_EM! " from the Tune Menu to adjust all detector parameters
pass
Check Axis/Resolution Peak widths 0.75 at 10 % +/-0.05 mass calib.: nominal mass +/- 0.05 pass
FAIL
FAIL
Detune Sensitivity via ion lenses --- target: low mass sensitivity is reduced in sensitivity by 10x
compared to mid and high mass.
. Set Ext1 and 2 at low voltage, especially Ext2, which improves stability below -35V.(4) Tune Einzel 1/3, and 2 Typical values are -60V and 14V, respectively. Increase both Omega + and QP Focus. Typical values are 6 V and 9V, respectively. Adjustments of these lenses improve signal stability DO NOT ADJUST: Any AMU settings Any Axis settings Discriminator EM voltage Last Dynode P/A factors
No
No
Achieve Goals
Achieve Goals
Figure 240
271
Recommendations on Interference Equations

Generally Use Equations Specified in EPA Method 200.8 May require slight adjustment based on measured values
Figure 241
Arsenic Since there are lots of polyatomic ions are generated around the mass, it is very difficult to apply universal equation. When the contribution of 82Kr is considered, the equation should be changed as follows: As(75) = (1.000)(75C) - (3.127)(77C) + (2.736)(82C) - (2.760)(83C) However, an unknown peak sometimes appears at mass 83. BrH is also generated at mass 82. As a result, the contribution of Kr is overcorrected, and As might show a negative result. Selenium Generally, the use of 82 rather than 77 or 78 is recommended. 77 is interfered with by 40Ar37Cl, and 78 is interfered with by 38Ar40Ar dimer. The 82 isotope needs to be corrected for the possible presence of 82Kr in the Argon gas supply using the following equation.
272
Se(82) = M(82) - 11.6/11.5 * Kr(83) = M(82) - 1.0087 * Kr(83) However, as described the above, the unknown peak might appear at mass 83, thereby a portion of the signal at mass 83 is used practically. An example is as follows: Se(82) = M(82) - 0.6 * Kr(83) The monitoring of mass 77 and 78 is also recommended just in case.
273
More Interference Corrections

Some correction factors are based on formation of doubly charged species or oxides rather than on isotope ratios and need to be updated periodically. Iron-54 Ca-44
Figure 242
Vanadium The interference correction might not be useful. Because it is almost redundant (1% NaCl gives about 1ppb ClO equivalent) and can lead to problems when high Cr is present. Iron The use of 54 rather than 56 or 57 is recommended. Since mass 54 is interfered with ArN, the concentration of HNO3 should be the same. If the concentration of HNO3 cannot be controlled, the following equation would be useful: Fe(54) = M(54) - ratio of 54/15 * M(15) In this case, a blank solution must be analyzed at first, and mass 15 and 54 should be measured. The ratio of 54/15 will be calculated, and this ratio will be entered into the equation. CaN is unlikely to give an interference at 200 ppm Ca carbonate. Calcium
274
More Interference Corrections Ca is normally included at very high concentration; therefore, there is no interference on it. However, when the mixed standard solution which contains the same concentration of Ca and Sr, the apparent Ca44 will be almost double if the system was calibrated in the absence of Sr. The same problem occurs with Ca43. In this case, the following equation is useful: Ca(44) = M(44) - ratio of Sr2+/Sr+ * M(88) Sr solution must be analyzed at first to get the ratio of Sr2+/Sr+.
275
Calibration Standards
Calibrate no higher than necessary Minimize memory effects and the detector wear typical ranges for trace elements: 0, 1, 10, 100 ppb major elements such as Na, K, Ca, Mg, Fe: 0, 100, 1000, 10,000 ppb Hg: 0, 0.1, 0.5, 1, 5 ppb Major and trace elements are available in a single solution with their concentration in 100:1 ratios, respectively Mercury supplied in a separate solution Addition of 100 ppb gold to ALL solutions required for mercury determination
Figure 243
276
Linear Range Determination

Practical Linear Range Reasonable upper range of analyte concentrations after sample dilution to avoid excessive carryover after running LRS Typically: z ~1 ppm for most elements, z 10-50 ppm for minerals, z < 500 ppb for Ag, Mo, Sb, Tl, Pb and other memory prone elements, z < 20 ppb for Hg! Much lower than actual Instrument Linear Range
Figure 244
277
Interference Check Samples

Purpose is to test effectiveness of plasma conditions and correction equations: High concentrations of Interfering Elements Trace concentrations (~20 ppb) of analyte elements Only the analyte elements need be measured
Figure 245
278
Troubleshooting Environmental Applications [1]

High Tune % RSDs Non-linear Calibrations High Analysis % RSDs Poor Agreement Between Calibration and ICV
Figure 246
High RSDs During Tune Incorrectly tuned plasma parameters such as carrier gas or blend gas flow, peri-pump speed or sample depth. Dirty cones Worn peri-pump tubing. Incorrect shoe pressure on peri-pump. Should be just tight enough to insure a smooth flow of sample (aspirate a bubble and watch its progress through the line). Non-Linear Calibrations ICP-MS is a linear technique. Pulse mode calibrations should always be linear, if not, suspect standard preparation errors or possible incompatibilities among elements in multi-element standards. Non-linearity between pulse and analog mode indicates incorrectly set P/A factors or possible worn out detector. High %RSDs During Analysis
279
Troubleshooting Environmental Applications [1] Insufficient uptake, rinse-out or stabilization time. Use Edit Average File > Tabulate to examine individual replicates for upward or downward trends. Insufficient signal counts. May be also be caused by worn peri-pump tubing or bubbles in either the sample uptake or internal standard uptake tubing. Check the connections at the ISTD addition Y and replace the peri-pump tubing.
280

Poor Analyte Recovery in Spiked Samples for Selected Analytes Carry-over or Memory Effects for Certain Elements
Figure 247
Poor recovery for selected analytes in spikes. Several conditions can cause poor recovery of certain analytes in spiked samples. Ag is especially insoluble in the presence of even trace levels of Cl, therefore the use of HCl should be avoided whenever possible. Several elements (Zn, As, Se, Cd) have relatively high first ionization potentials and may not be as effectively ionized in samples with high concentrations of easily-ionizable elements such as Na and K. Diluting the sample if possible, or selecting an alternative internal standard with a higher ionization potential may help. Possible alternative internal standards include Ge, Te, and Au. Carryover or memory interference. Several elements are prone to memory effects for various reasons. Ag, Mo and Tl tend to stick to surfaces in the sample introduction system and slowly rinse into subsequent samples. Keeping the sample introduction system (sample tubing, peri pump tubing, nebulizer, spray chamber, torch and cones) clean will help minimize carry-over. Also, rinsing between samples with relatively high acid concentration rinse blanks (ca. 5% HNO3) will help. If 281
Troubleshooting Environmental Applications [2] possible, avoid introducing samples or standards with concentrations of these elements above a few hundred ppb. Use of the Babington nebulizer should also reduce carryover of these elements. Li, when analyzed for extended periods of time or in very high concentrations tends to accumulate on the back sides of the interface cones. Cleaning the cones will usually reduce Li background and carryover. Volatile elements, or elements with volatile hydrides such as Hg and Sb can also carryover due to off-gassing from droplets on the spray chamber walls. Steps to reduce the volatility of these species are helpful.
282

Calibration Drift Over Time Poor Internal Standard Recoveries in Certain Samples
Figure 248
Calibration Drift over time. Insure that the instrument is adequately warmed up before initial calibration (warm-up, while scanning in tune for 15 minutes). Insure that laboratory temperature does not vary by more than 3 degrees C. per hour. Check cones for signs of sample deposits which may be affecting the size and shape of the cone orifices. Clean if necessary. Check peri-pump tubing for signs of excessive wear or flattening. Run SetEM. An electron multiplier which is near the end of its useful life may be changing in response over short periods of time. If running SetEM significantly changes the EM voltage from day to day, the EM should be replaced. Poor internal standard recoveries in samples.
283
Troubleshooting Environmental Applications [3] Reduction in internal standard signal is usually caused by high matrix concentration in samples (especially Na, and K). Dilute the samples. It may also be desirable to tune the instrument with a matrix matched tune solution containing appropriate levels of the matrix elements to minimize the effect of any matrix induced suppression of ionization.
284

High Relative Standard Deviations (%RSDs) in Samples Standards High %RSDs in Tune
Figure 249
High relative standard deviations (RSDs) for analyte or internal standard elements during sample analysis. Usually caused by insufficient sample uptake or stabilization time. May be also be caused by worn peri-pump tubing or bubbles in either the sample uptake or internal standard uptake tubing. Check the connections at the ISTD addition Y and replace the peri-pump tubing. Shoe pressure on the peri-pump should be just tight enough to insure a smooth flow of sample (aspirate a bubble and watch its progress through the line). High RSDs during tune. Incorrectly tuned plasma parameters such as carrier gas or blend gas flow, peri-pump speed or sample depth. Dirty cones.Worn peri-pump tubing. Incorrect shoe pressure on peri-pump. Should be just tight enough to insure a smooth flow of sample (aspirate a bubble and watch its progress through the line).
285
Troubleshooting Environmental Applications [4] Omega lens settings can also affect tune precision as can parameters which affect mass peak shape such as plate and pole bias.
286
Semiconductor Applications of ICP-MS and Advantages of Agilent 7500s System
Chemicals and Materials Used in Semiconductor Industry

HCl H2SO4 Washing Cleaning IPA
HF Etching
Si, GaAs Wafer substrate
HNO3
TMAH
SiH4, TEOS, NF3, N2 Gases
H2O2
Methanol
Photoresists - Lithography
Pure Metals - Sputter Targets
Figure 250
BPSG = boron phosphorus silicon glass used for doping. TEOS = tetra ethoxy silane (used for depositing SiO2 layers. TMAH = tetra methyl ammonium hydroxide. Multielement analysis and ultra low detection limits have made ICP-MS the technique of choice for the determination of metallic impurities in the industry.
288
Metals Analysis in the Semiconductor Industry - Customer Groups and Requirements
Metals Analysis in the Semiconductor Industry Customer Groups and Requirements

Metals Analysis in the Semiconductor Industry Customer Groups and Requirements
q
Chemical manufacturers need for QC analysis of products

s s
inorganic chemicals organic chemicals
Wafer manufacturers characterize bulk polysilicon monitor contamination control in wet stations analysis of chemicals and various mixes wafer surface characterization q Device manufacturers monitor contamination control in wet stations
q
s s
analysis of chemicals and various mixes photoresist\stripper analysis
Figure 251
289
ShieldTorch Interface
Developed by HP/Yokogawa in 1992
led to widespread use of "cool" plasmas virtually eliminates many polyatomic interferences Shield plate design assures complete discharge removal 3 orders of magnitude improvement in detection limits dramatically reduced interface background sub-ppt DLs for Na other systems must be operated at 500-600W Shield plate lasts indefinitely - never has to be removed
Prevents secondary discharge in the ICP-MS interface

Enables the determination of Fe, Ca and K at low ppt levels
Improved DLs for most other SEMI elements
Operates at higher power levels - up to 1100W
No consumables
Figure 252
The Agilent 7500 has no loss in sensitivity when switching to cool plasma - Other instruments lose up to 95% of their sensitivity for all Transition metals. Other Instruments have to run at 600W to reduce ArO - Agilent 7500 can run at 1100W, which means higher sensitivity, lower oxides, and lower matrix effects, and also analyze As, Se.
290
Figure 253
291
Normal and Cool Plasmas
Normal and Cool Plasmas

Normal and cool Plasmas
Normal Plasma
Forward Power at 1300W Sampling Depth at 7mm Carrier Gas Flow at 1.2lpm
Cool Plasma Forward Power at 900W Sam pling Depth at 13mm Carrier Gas Flow at 1.7lpm
Figure 254
Shield Plate removes potential difference between plasma and interface, so no polyatomic ions form behind the sample cone. Cool central channel of plasma gives low Ar and Ar-based ion populations. Shield Plate can be used at high powers. High temperature gives good ionization and matrix tolerance, but high population of Ar and Ar-based polyatomic species form in the plasma and behind the sample cone, due to potential difference between plasma and interface.
292
Shield Torch Cool Plasma

Poorly Grounded Shield Plate
No polyatomic ion formation No secondary discharge

Potential difference between plasma and interface gives pinch discharge. Plasma must be operated at 600W to remove polyatomics.
N o Shi el d Pl at e
Pseudo Cool Plasma achieved using alternative load coil geometry
Figure 255
293
Shield Torch Installation

The shield should cover the coil and the bonnet should cover the shield
Bonnet
C oi l
The coil should not be exposed to the torch (plasma)
Shield
The shield should not be exposed to the coil

Figure 256
294
Cool Plasma Tuning
Cool Plasma Tuning

Cool Plasma Tuning
q q q q q q
Reduce RF Power to 900W Increase blend gas to 0.5L/min Increase sampling depth to 13mm Minimize the ArO using x,y torch position Minimize the ArH using the sampling depth Optimize using the blend gas
Figure 257
295
Advantages of Cool Plasma at Higher Power (900 - 1100 W)
Advantages of Cool Plasma at Higher Power (900 1100 W)

Advantages of Cool Plasma at Higher Power (900 - 1100 W)
No loss of sensitivity compared to normal plasma conditions Li - 150 Mcps/ppm Fe 40 Mcps/ppm q Higher ionizing power - greatly expanded analyte range many analytical requirements can be performed in one run q Ability to analyze high matrix samples organics, including Photoresists H PO 3 4 Si matrices qMeet/exceed HR-ICP-MS performance with new applications ppt determination of As and V in 5% HCl low ppt determination of Cr, Mg in organics
q
Figure 258
296
Advantages of Cool Plasma at Lower Power (700-800 W)
Advantages of Cool Plasma at Lower Power (700800 W)

Advantages of Cool Plasma at Lower Power (700-800 W)
Minimal loss of sensitivity compared to "hotter" plasma conditions Li -100 Mcps/ppm Fe - 20 Mcps/ppm q Greatly improves the BEC for Ca, Fe and K Specially for the analysis of DI Water, H O , and diluted acids 2 2
q
Figure 259
297
Detection Limits Study [1]

50
Average = 10.50
40 30
StdDev = 4.74
3 si gm a
20 10 0 1 2 3 4 5 6 7 8 9
2 si gm a 1 si gm a A ver age
10
D L = 3*St dD ev bl ank
Figure 260
298

50
( X2, Y2)
40 In te n sity 30 20 10
( X1, Y1)
0 0 5 C o n ce n tra tion 10
Figure 261
299
Automatic Switching Between Normal and Cool Plasma

Chained Sequencing allows the user to run a set of samples under one set of conditions such as cool plasma, then automatically switch the conditions and rerun the same samples under hot plasma. Multitune Mode allows the user to run the same sample under multiple sets of conditions, automatically switching from one mode to another and then moving to the next sample
Figure 262
300
Intelligent Sequence Training Text
What is Intelligent Sequence?
What is Intelligent Sequence?

Intelligent Sequence is designed to dramatically improve sample throughput and reporting accuracy while decreasing the time spent by the operator and data reviewer. Intelligent Sequence automates a variety of QA/QC control procedures as well as all the EPA-mandated quality control procedures (EPA Methods 200.8, 6020 and 6020-CLP) from analysis through reporting.
Features
Intelligent sequence has several unique features. Smart Sequencing Intelligent Sequence recognizes all EPA designated QA/QC sample types and, when used with an autosampler, allows automatic, unattended analysis of batches of samples with all necessary calibrations, checks and controls. During sequencing, sample results are evaluated for pass/fail against a user-editable database of QC criteria. If a QC parameter is out of range, sequencing automatically performs a user-selectable action to attempt to remedy the problem. All sample results and QC actions are logged and a QC exception report is created. QC Reporting During sequencing, sample-type specific reports are generated and stored for all runs. A QC summary report is also generated. This report can be viewed at any time during or after the sequence. The summary report includes, in an easily reviewed format, a list of samples run and any QC failures which may have occurred. All batch or Sample Delivery Group relevant data are automatically stored together in system-generated batch directories for convenient archival and retrieval. Tune Compliance Checking A simple, graphical user interface allows user selectable tune compliance criteria to be stored with each method. Evaluating a tune sample can be automatic or manual via a simple pull-down menu item.
302
Typical Analytical Flow
Typical Analytical Flow

1) 2) 3) Select appropriate QC configuration Load ICP-MS method Edit method and QC parameters Configuration >> QC Mode Methods >> Load Methods >> Edit Entire Method
Method Information Interference Equation Acquisition Data Analysis Report Select QC report Calibration Table Select Load Mass from Current Acq. in New QC Database Set unreported elements Save the method and calibration Load the tuning method Edit method and QC parameters
Methods >> Set Unreported Elements
Y Y Y
QC Parameters
4) 5) 6) 7)
Methods >> Save Methods >> Load Methods >> Edit Entire Method
Verify QC Method
Method Information Acquisition Data Analysis Report Select QC report QC Parameters QC Tune Criteria 8) 9) Save the method and calibration Edit the sample log table Methods >> Save
Sequence >> Edit Sample Log Table
10) Simulate the sequence 11) Save the sequence 12) Run the sequence
Sequence >> Simulate Sequence Sequence >> Save Sequence >> Run
303
Using Intelligent Sequencing

QC Configuration
To use Intelligent Sequencing, the appropriate QC configuration must be selected in Configuration.
The following QC modes are provided as default. EPA2008.QCC --- intelligent functions defined by EPA Method 200.8. EPA6020.QCC --- intelligent functions defined by EPA Method 6020. EPA6020C.QCC --- intelligent functions defined by EPA Method 6020 CLP. EPAGEN.QCC --- Intelligent functions designed to meet both EPA 200.8 and 6020 requirements GENERAL.QCC --- Intelligent sequencing disabled (no expected values or failure actions defined) When selecting GENERAL.QCC, the sequencing mode is changed to the general sequencing mode. When selecting other QC modes, the sequencing mode is changed to intelligent sequencing mode. 304
Using Intelligent Sequencing For more information about sample types included in each QC mode, see Appendix of AGILENT 7500 ChemStation Intelligent Sequence Manual.
ICP-MS Method
When intelligent sequencing mode is selected, additional menus become available in the Methods menu.
Edit QC Database Enables editing of QC related items on a sample type basis such as high limit values, low limit values and error action. Edit QC Tune Criteria Enables editing of tune compliance criteria such as sensitivity, mass resolution and %RSD. Verify QC Method Checks the QC database and QC tune criteria for configuration errors. QC Information Indicates the QC mode name which was used to make the current method. Set Unreported Elements Allows the user to select the elements which are not to be reported on QC custom reports.
Default Methods Provided
305
EPA Method QC Mode (.qcc) Method (.m) Tuning Method (.m)
200.8 200_8 EPA20_8 TN200-8
6020 6020 EPA6020 TN6020
CLP 6020CLP EPACLP TNCLP
Remark
For QC Database For QC Tune Criteria
Edit Entire Method Use Edit Entire Method to make a complete method including QC parameters.
Method Information Same settings as general use. Interference Equation Same settings as general use. Acquisition Same settings as general use.
306
Using Intelligent Sequencing Data Analysis Same except Select Reports.
Select QC Report, and then Recalculate then Print
QC Parameters New menu (A) QC Database (B) QC Tune Criteria
307
Using Intelligent Sequencing (A) QC Database For information about how to read comparative expressions (definition of criteria), see Setting Up a Method of AGILENT 7500 ChemStation Intelligent Sequence Manual.
QC Database settings are saved in cal file Elements referred from cal curve
Comparative expressions defined in QC configuration
Sample type opened currently
Expected Value and Low & High Limits
Error Actions and #Allowed Failures
Click here
Off(x) is marked for the elements for which Excluded is selected as a curve fit in cal, or used for interference correction
<Error Actions supported> NextSmpl Next sample Abort Abort the run 308
Using Intelligent Sequencing Blk (Abort) NextSmpl Run the blank block then continue (Abort if all of the samples in the blank block fail). Blk (Cont.) NextSmpl Run the blank block then continue (Continue even if all of the samples in the blank block fail) Blk (Abort) SameSmpl Run the blank block and re-run same sample (Abort if all of the samples in the blank block fail). Blk (Cont.) SameSmpl Run the blank block and re-run same sample (Continue even if all of the samples in the blank block fail). Cal SameSmpl Recalibrate and re-run same sample. Cal AllSmpls Recalibrate and re-run all samples since last CCV block. NextLot Run next lot of samples Run User Macro Run the user macro which must be placed under the method currently running, and named QCUSER.MAC. <How proceed Criteria> Up to four criteria for each sample type (except ISTD).
Area for 1st step Criteria 1 Area for 1st step Criteria 2
Area for 2nd step Criteria 1 Area for 2nd step Criteria 2
309

Fail 1 step, Criteria 1
st
Error action set for 1st step Criteria 1
Pass Fail 1 step, Criteria 2

st
Check to select flag
Error action set for 1st step Criteria 2
Pass
FILTER
Fail 2 step, Criteria 1

nd
Error action set for 2nd step Criteria 1
Pass Fail 2 step, Criteria 2

nd
Check to select flag
Error action set for 2nd step Criteria 2
Pass
Next sample
Normally just one Criteria (1st step Criteria 1), or two Criteria (1st step Criteria 1 & 2nd step Criteria 1, or 1st step Criteria 1&1st step Criteria 2) is used.
<Examples>
1st step Criteria 1 Check whether the analytical concentrations of certified reference material (CRM) are 90-110% of the certified values (expected values). 1st step Criteria 1 Low limit: CRM conc >= 0.9 x CRM expected values High limit: CRM conc =< 1.1 x CRM expected values 1st step Criteria 1 & 2nd step Criteria 1 310
Using Intelligent Sequencing Check whether the analytical concentrations of CRM are 90-110% of the certified values for elements whose counts are equal or more than 1000 cps 1st step Criteria 1 Low limit: CRM cps >= 1000 High limit: none 2nd step Criteria 1 Low limit: CRM conc >= 0.9 x CRM expected values High limit: CRM conc =< 1.1 x CRM expected values 1st step Criteria 1 & 1st step Criteria 2 Check whether the analytical concentrations of certified reference material (CRM) are 85-115% of the certified values. If not, recalibrate and then analyze again. Also check whether concentrations are 90-110% of the certified values. If not, have a error flag on a report. 1st step Criteria 1 Low limit: CRM conc >= 0.85 x CRM expected values High limit: CRM conc =< 1.15 x CRM expected values 1st step Criteria 2 Low limit: CRM conc >= 0.9 x CRM expected values High limit: CRM conc =< 1.1 x CRM expected values
311
Using Intelligent Sequencing (B) QC Tune Criteria
QC Tune Criteria settings are saved in method file Masses set in data acq parameters
Set Ref for Response Ratio check *1
Fixed to 1 for Resp Ratio Low&High Limits
Set Bkg for Bkg check *2
Only Max. Bkg Count is effective
*1 *2
: Ref appears in the Mode list when Response Ratio check is enabled. : Bkg appears in the Mode list when Max Bkg Count check is enabled.
312
Using Intelligent Sequencing Notes on Setting a Method Use Auto Configuration first, when there are more Off (x) elements other than the elements for which Excluded is selected as a curve fit in the calibration table and the elements with parentheses. When Auto Configuration is used, all Off column settings are always reinitialized. In the event of a simultaneous QC failure and ISTD failure, the action on QC failure will take precedence. The error action for third failure is set in QC configuration on a sample type basis. Set equal or more number of acquired elements for #Allowed QC Failure when the Second Step is used. Otherwise, the First Step does not work as a filter, and QC check wont go to the Second Step. Expected values for Reference part (right side of comparative expressions) always refer to the values set in the First Step Criteria 1. Expected values for Measured part (left side of comparative expressions) refer to the values set in each criteria. Use Set Unreported Elements, when there are elements which are not to be reported on QC custom reports. Before Saving the Method Use Verify QC Method to check whether there is any error on settings. (Click this in Method Save Options when method is saved.)
Setting Up a Sequence
Structure of Sample Log Table Sample Log Table is arranged in subroutines or Blocks. The Sample Log Table is composed of four kinds of sheets as follows: Sequence Flow sheet Periodic Block sheet Individual Block sheet Whole List sheet
313
Periodic Block Analyzed every 10 samples
Main flow TUNE Block CALIB Block SMPL Block TERM Block
Analyzed every 8 hours (480
Individual Block CALIB Block
Whole List
Keywords which separate each block are automativcally attached
Notes on Setting Each Sheet <Periodic Block> The upper block setting has priority when there is a conflict with multiple blocks. <Individual Block>
314
Using Intelligent Sequencing Blanks which are analyzed when the error actions Blk. are taken should be set in BLANK Block. Samples which are analyzed when the sequence is aborted should be set in ERRTERM Block. When ISTD check is set, the CalBlk should be set at first except Tune since the ISTD counts from the CalBlk are used to establish the reference values. When recovery, dilution or duplication check is set, a reference sample type should be set prior to recovery, dilution or duplication sample. Before Running the Sequence Use Simulate Sequence to check whether there is any error on settings.
Running a Sequence
The methods & calibrations used, actual sample log table and sequence logs as well as all the data in one sequence are saved in this directory.
Note on Running a Sequence Insure the same QC configuration as the one used when the methods and sequence to be executed were made. After editing the sample log table (online) during sequence run, close the table immediately. The sequence is paused while the sample log table is opened.
315
Using Intelligent Sequencing If the data analysis parameters, QC Database or QC Tune Criteria in the method currently used needs to be changed instantly, load the method using Offline Data Analysis, and change it. The modified method can be saved to online using Offline Data Analysis >> Method >> Save to Online.
Sequence Reprocessing of Data

Two ways for batch reprocessing of data: A. Reprocessing Data Batch Directory B. Running a Sequence with Reprocessing Only (A) Reprocess Data Batch Directory <Files to be selected and used>
1. Select data batch directory to be reprocessed in Reprocess Data Batch Directory
icpchem\1\
data\
98k1109a.b\
001tune.d 002calb.d
Data files
050smpl.d meth1.m (copied automatically) meth1.c (copied automatically) result.s (actual sequence*) methods\ meth1.m (original) meth1.c (original)
Used for data reprocessing
calib\
The name for actual sequence is always result.s. (B) Running a Sequence with Reprocessing Only <Files to be selected and used>
316
3. Select data batch directory to be reprocessed in Start Sequence Dialog Box
icpchem\1\
data\
98k1109a.b\
001tune.d 002calb.d
Data files
050smpl.d meth1.m (copied automatically) meth1.c (copied automatically) result.s (actual sequence*) methods\ meth1.m (original) meth1.c (original)
1. Load this sequence
calib\
Used for data reprocessing
2. Insure the path for currently loaded method is the same as the one used for data reprocessing
* The name for actual sequence is always result.s.
Notes on Reprocessing Data Insure the correct method and calibration file are selected when changing parameters for reprocessing; change the copied method and calibration in the data batch directory when using Reprocess Data Batch Directory, and change the original method and calibration when running the sequence with reprocessing only. The header information updated using Data Analysis >> File >> Edit Header is not reflected when using batch reprocessing (both ways). Change the Sample Log Table of result.s if needed. However, the
317
Using Intelligent Sequencing header information to be printed out is not changed until the header information is updated using Data Analysis >> File >> Edit Header.
318
Setting Up a QC Configuration
QC configuration defines the QC sample type set which contains Sample type name Data name suffix QC report template Type category QC Item name to be used for ISTD check Error counting way Action on 3rd failure Comparative expressions Error flags for QC report The Changes in QC Configuration must be implemented with CAUTION as it affects the settings in the QC Database, QC Tune Criteria, or Sample Log Table directly.
319
Configuring QC Items
320
Setting Up a QC Configuration How to Create or Change a QC Item
Select List to load QC Item to be changed
Screen for selected QC Item is opened
Select New to make new
Select Delete to delete the QC Item currently opened CAUTION: once deleted, it cannot be recovered
321
Setting Up a QC Configuration Special Screens
Screen is completely changed
Only QC Item becomes effective
322
Setting Up a QC Configuration Notes on Setting QC Items Preservation of the original QC mode files is recommended. Once a QC Item is deleted, it will change the setting of related items in the QC Database, QC Tune Criteria, or Sample Log Table even when the same QC Item in the QC mode is restored. Also, once a Category of a QC Item is changed, it will change the setting of related items in the QC Database, QC Configuration, or Sample Log Table even when the same Category for the QC Item is restored. Basically the AGILENT 7500 ChemStation does a mass defect correction. Therefore, Adopt exact mass should be OFF if not necessary.
323
Creating a QC Report Template

Select QC Item whose category is Tune to edit QC report template for Tune sample
When Report File is not selected
Select items under an adequate place
When Report File is selected
324
Setting Up a QC Configuration Notes on Editing QC Report Template
The very right cell which contains values is recognized as the right end of the printed area
Repeated width should be the same for each area
Concentration Mean Dilution Factor Equation using the reference place
The raw concentrations (not taken into account dilution factor) are always indicated. To get the corrected concentration, set Concentration Mean and Dilution Factor as printed Items. And then set the equation which expresses Concentraion Mean multiplied by Dilution Factor using the reference place. 325
Setting Up a QC Configuration There is no function to select the printed area. When there is a column you dont want to print out, select the column, and then select Format >> Column Width >> Hide. When adding graph (spectrum) on a Tune type template, the repeat setting cannot be applied. Individual setting is required.
326
Laboratory 1: Agilent 7500 Configuration, Startup and Tuning
Reference: Agilent 7500 ChemStation Operators Manual Agilent 7500 Customer Training Class, Module 4 Agilent 7500 Customer Training Class, Appendix 2
Configuration
Configuration
1) 2) 3) 4) 5) 6) 7) Close ChemStation if open and open Configuration under Agilent 7500 Program Group Check: Offline Instrument NOT CHECKED Check: Remote Start Dont Use except for synchronization with external sampling devices Check: Sample Introduction as appropriate including peristaltic pump and autosampler Check: EM Protection select Auto setting of integration time in analog mode Check: QC Mode GENERAL.QCC Save and Exit
328
Startup and Tuning
Startup and Tuning

1) 2) Review Startup Checklist Initiate Plasma and Warm-up Instrument Position ALS in distilled water Go to Tune Select Tune >> PeriPump program for Autotune, review the values here Select Sensitivity and Start (Allow instrument to scan for 10-15 minutes to warm up the quadrupole) Place the ALS probe in position 3 (10 ppb tune solution, Li, Y, Ce, Tl) (Allow time for uptake, 1-2 min) Select Sensitivity >> Start Watch for awhile Select File >> Print, (keep this for reference as your starting point) Select Tune >> Autotune Select Torch Position, Sensitivity, Resolution/Axis and Tune Report Run Autotune (watch what happens) Compare the new tune report with the original one which you printed Load poor_s.u (This has been deliberately mis-tuned for poor sensitivity) Using the ChemStation Manual, Student Manual and Tune Flowcharts, fix this tune Load high-ox.u Try to reduce the oxides in this tune Ask the instructor to Fix the system so that it generates high %RSDs. Fix this! Save your best tune as best.u Place the internal standard solution on line
3)
4)
5)
6) 7) 8) 9)
10) Under Acq. Parms select masses 6, 140 and 209 (what are these elements and where do they come from, e.g. why would we be interested in monitoring them?) 11) Allow time for ISTD uptake and monitor the ISTD counts and %RSDs, do they make sense? 12) Discuss your results with the instructor.
329
Agilent 7500 Startup Checklist
Agilent 7500 Startup Checklist

CHILLER ARGON PERIPUMP TUBES CLAMPED INTERNAL STANDARD MIX Out for tune In for analysis TUNE SOLUTION FULL BLANK RINSE SOLUTION FULL DRAIN RESERVOIRS NOT FULL ALS RINSE PORT RESERVOIR OK SHIELD IN or OUT (application dependent) PLASMA ON
330
Shutdown Checklist
Shutdown Checklist
ALS IN RINSE SOLUTION, WAIT 1 MINUTE PLASMA OFF PERIPUMP TUBES UNCLAMPED CHILLER
331
Shutdown Checklist
(l) Poor Sensitivity
(ll) Poor Precision (high RSDs)
(III) High Oxides and/or doubly-charged ions
Check Physical Parameters: Sample Uptake rate (bubble) Nebulization (-visually) (-sodium bullet) Torch Position (x,y visually) Cone orifices Torch Position (7-8 mm)
Adjust peri-pump shoe pressure (decrease till no signal, then slowly increase just enough for stable signal) Adjust carrier gas flow (carrier + blend gas <= 1.4 - 1.5 ml/min) very slowly Fine tune Extract lenses and Omega lenses Clean or replace cones
Decrease carrier/blend gas flow Increase Sample depth Decrease peri-pump flow
Save Tune File
Sensitivity Improved?
No
Check mass axis and resolution. Peaks?
No
Verify contents of tune solution Run SetEM
Yes
Yes
Optimize Sample Depth and X-Y position
No
Sensitivity OK?
Yes
Set: Carrier Gas : 1.2 - 1.5 Peripump : .1 - .15 Ext. 1 : -150 to -180 Ext. 2 : -75 to -100 Omega Bias : -40 Omega (+) : optimize between 0 and 10 V QP Focus : optimize between -10 and 10
RSDs OK?
No
Go to (II)
Yes
Oxides/Doubly Charged OK?
No
GO to (III)
HP 4500 ICP-MS Manual Tune Troubleshooting Flowchart
Yes
Save Tune File
332
Laboratory 2: Agilent 7500 Routine Maintenance
Reference: Agilent 7500 Administration and Maintenance Manual Agilent 7500 Customer Training Class Module 5 Maintenance Log Table
General
General
1) 2) 3) 4) Remove and examine air filters Examine level and color of oil in Rough Pumps Check all fluids, belts and hoses (just kidding) Check for corrosion and wipe down cabinet as necessary with damp cloth
334
Sample Introduction
Sample Introduction
Remove: Peri-pump tubes Nebulizer Spray Chamber Torch Clean or replace as necessary (refer to maintenance manual)
335
Interface
Interface
1) 2) 3) 4) 5) 6) Remove Sampler and Skimmer Cones and Extraction Lens assembly Sonicate cones in 10% Citranox with occasional careful wiping until visibly clean (10-30 minutes) Rinse cones with water, then DI water, blow dry and set aside. Disassemble extract lens assembly, examine lenses and insulators for discoloration. Sonicate in 10% Citranox and rinse thoroughly as above. Do not sonicate the insulators unless obviously discolored as they take longer to dry. Reassemble and reinstall extraction lenses and interface cones
336
Nebulizer, Spray chamber and Torch
Nebulizer, Spray chamber and Torch

1) Babbington and Crossflow nebulizers can be sonicated in either dilute Citranox or, 5-10% nitric acid as needed. Babbington nebulizers can be unclogged (argon line) with a tiny GC syringe cleaning wire if needed. Rinse well after cleaning. GLASSWARE SHOULD NOT BE SONICATED! However, torches and spray chambers can be boiled in hot 10% Citranox and then rinsed well. This greatly improves the wetability of the spray chamber. Soaking in strong (10-50%) nitric acid solution overnight may also be necessary for extremely dirty or contaminated glassware. Remove the glassware, examine carefully and replace. Be sure all gas and spray chamber drain connections are leak free.
2)
3)
337
Re-ignite the plasma and check the tune
Re-ignite the plasma and check the tune
338
Laboratory 3: Semi-Quantitative Analysis
Reference: Agilent 7500 ChemStation Operators Manual Agilent 7500 Customer Training Class Manual, Module 08
Laboratory 3: Semi-Quantitative Analysis
Semi-Quantitative Analysis
Semi-Quantitative Analysis
1) 2) 3) From Top Level, load default.m Select Edit Entire Method Edit all method sections to create a semiquant method for unknown sample screening
Do not waste time acquiring nonsense elements such as inert gasses, air, carbon, halogens etc. Also exclude the transuranic elements. 4) 5) 6) Use 0.1 second integration for all elements Use 60 second uptake, 5 second optional rinse, and 60 second stabilization. Do not configure the use of internal standards, since we will be using this method to screen for the presence if internal standard elements in the unknown sample. Examine your tune report and estimate the semiquant response factor threshold (Minimum Peak in cps) necessary to exclude results lower than ~0.1 ppb from the report. Save the method as a unique name. Analyze a blank and a 10 ppb (or 100 ppb) multielement calibration standard with your method.
7)
8) 9)
10) Using the blank and 10 ppb (or 100 ppb) standard, enable blank subtraction and reset the semiquant response factors. 11) Analyze the unknown sample to screen for the presence of the internal standard elements, as well as the presence and approximate concentrations of other analyte elements. This information will be used to develop a quantitative method for analysis of the unknown sample(s). 12) Compare the results with the certified values. Are semiquant results subject to interferences? Can they be corrected?
340
Laboratory 4: Quantitative Analysis of Unknown Sample
Reference: Agilent 7500 ChemStation Operators Manual Agilent 7500 Customer Training Class, Module 09 HP/Agilent Standard Operating Procedure, EPA Method 200.8
Laboratory 4: Quantitative Analysis of Unknown Sample
Quantitative Analysis
Quantitative Analysis
1) Using your SemiQuant results for the Unknown sample and the EPA 200.8 SOP as guidelines, build a quantitative method for analysis of Ag, Al, As, Ba, Be, Cd, Co, Cr, Cu, Mn, Mo, Ni, Pb, Sb, Se, Tl, V and Zn. Include at least two calibration levels plus a blank for each element. If the element is likely to trigger analog mode, include a calibration point which will also be acquired in analog mode. (Why is this?) Multi-element calibration standards will be available in 1; 10; 100; 500; 1,000 ppb concentrations. Build a simple sequence to update your calibration and analyze your unknown sample at two dilutions. Compare your results with the certified values. Discuss your results with the instructor.
2)
3) 4) 5)
Hints: Always run at least 2 calibration blanks at the beginning of a sequence to insure adequate flush-out of previously run samples. Always run a blank after the high calibration standard and before any samples to detect possible memory effects. Always analyze a blank and mid-point calibration as samples at the end of a sequence and every 10 samples to verify that the system is under control.
342
Appendix 1 General Information
Professional Organizations
American 5
(800) 227-5558 http://www,acs.org Environmental Protection Agency (EPA) http://www.epa.gov 5 American Association of Clinical Chemists (AACC) (800) 892-1400 5 American Board of Clinical Chemistry, Inc.(ABCC) (202) 835-8727 5 American Society of Clinical Pathologists (ASCP) (312) 738-1336 x.158 5 Clinical Laboratory Management Association (CLMA) (610) 647-8970 5 College of American Pathologists (CAP) (800) 323-4040 5 National Committee for Clinical Laboratory Standards (NCCLS) (610) 688-0100 5 Society for Applied spectroscopy (301)694-8122 5 SEMI International Standards (650) 964-5111 5 http://www.semi.org
Chemical Society (ACS)
Figure 263
344
Journals
Journals
Journals
s s s s s s s s
Analytical Chemistry Journal of Analytical Atomic Spectrometry (JAAS) Applied Spectroscopy (free with SAS membership) Spectroscopy (free) Spectrochimica Acta, Part B Analyst American Lab (free) American Clinical Lab (free)
Figure 264
345
Selected Web Sites (1)

Agilent Technologies http://www.agilent.com

Sample Preparation (Duquesne University) http://www.sampleprep.duq.edu/sampleprep/ Eastern Analytical Symposium http://www.eas.org/ FACSS http://facss.org/info.html Pittcon http://www.pittcon.org/

NIST Standard reference Program
Figure 265
346

Spex catalog http://www.spexcsp.com/crmmain/cat_f.htm Spectron http://www.vcnet.com/spectron/ Inorganic Ventures http://www.ivstandards.com/ Michael Cheatchams Instrument pages http://www.geochemistry.syr.edu/cheatham/InstrPages.html Plasmachem-L BB http://www.geochemistry.syr.edu/cheatham/icpmsins.html US Pharmacopeia http://www.usp.org/
Figure 266
347
348
Appendix 2 Flow Chats
Manual Tune Troubleshooting Flowchart [1]

Agilent 7500 ICP-MS Manual Tune Troubleshooting Flowchart
Startup
10 minutes warm-up
Torch Position
OK?
Too Low
Sensitivity?
Yes No Sample Uptake

OK?
In Spec.
No
Yes
Precision ?
Poor
Sample Uptake
OK?
Carrier Gas Flow

OK?
Yes In Spec.
No Carrier Gas Flow
No
Yes Oxides and Doubly Charge?
Extraction 1, 2
OK?
OK?
Yes No Extraction 1, 2
Yes High
No Omega Lens
OK?
Yes Sample Depth
OK?
No Einzel 2
No
Yes
OK?
Instrument Maintenance
No
Yes
OK?
Carrier Gas Flow
Yes
No
In Spec.
OK?
Instrument Maintenance Yes No Pump Speed

OK?
Yes No Instrument Maintenance Resolution / Axis Set EM Voltage Set P/A Factor Save Tune File Print Tune Report. Ready for Analysis
Figure 267
350

(l) Poor Sensitivity (ll) Poor Precision (high RSDs) (III) High Oxides and/or doubly-charged ions
C heck Physical Parameters: Sample Uptake rate (bubble) Nebulization

(-visually) (-sodium bullet)
Adjust peri-pump shoe pressure

(decrease till no signal, then slowly increase just enough for stable signal)
Decrease carrier/blend gas flow Increase Sample depth Decrease peri-pump flow Save Tune File
Adjust carrier gas flow

(carrier + blend gas <= 1.4 1.5 ml/min) very slowly
Torch Position
(x,y visually)
Cone orifices Torch Position

(7-8 mm)
Fine tune Extract lenses and Omega lenses Clean or replace cones
Sensitivity Improved?
No
Check mass axis and resolution. Peaks? Yes
No
Verify contents of tune solution Run SetEM
Yes Optimize Sample Depth and X-Y position
No Sensitivity OK? Yes
Set: Carrier Gas : 1.2 - 1.5 Peripump : 0.1 - 0.15 Ext. 1 : -150 to -180 Ext. 2 : -75 to -100 Omega Bias : -40 Omega (+) : optimize between 0 and 10 V QP Focus : optimize between -10 and 10
RSDs OK?
No
Go to (II)
Yes
Oxides/Doubly Charged OK?
No
GO to (III)
Yes
Save Tune File
Agilent 7500 ICP-MS Manual Tune Troubleshooting Flowchart
Figure 268
351
352
Appendix 3 Dealing with Polyatomics
The Problem
The Problem
The Problem...
Bulk argon from the plasma can combine with entrained atmospheric gases and matrix constituents to form argon polyatomic ions. The resulting polyatomic ions can overlap analyte masses of interest compromising detection limits Common examples are: ArO+ interferes with 56Fe ArH+ interferes with 39K Ar+ interferes with 40Ca ArCl+ interferes with 75As
Figure 269
354
Strategy #1: (High Power) Cool Plasma Analysis

Technique first reported in 1988*: Reduction of ArH+ interference on Ca simply by modifying ICP operating conditions lower plasma power increased carrier gas flow longer sampling depth
* Jaing, Houk, and Stevens, Anal. Chem., 1988, 60, 1217
Figure 270
355
Commercialization of Cool Plasma Analysis

Developed commercially by HP/Yokogawa in 1992* featuring patented ShieldTorch Interface Cool plasma ICP-MS (using the Agilent ShieldTorch) now the method of choice for ultratrace metals analysis in the semiconductor industry Over 100 HP 4500's and Agilent 7500s performing routine cool plasma analysis in the semiconductor industry replacing GFAA, ETV-ICP-MS, HR-ICP-MS
* Sakata K et al., Spectrochim. Acta, 1994, 49B, 1027
Figure 271
356
Schematic of Agilent ShieldTorch

Load coi l Pl as m a Tor ch
Shi el d pl at e
Shield plate removes capacitive coupling of the coil to the plasma Plasma is at true ground potential Cooler central channel No re-ionization of polyatomic species Background spectrum is virtually free from plasmabased peaks.
Figure 272
357
Not All Cool Plasmas* Are the Same! [1]

The ShieldTorch interface is unique to Agilent Reduces interferences such as ArH, Ar, ArO, C2, ArC to low ppt levels, enabling sub-ppt level DLs for K, Ca, Fe etc The key feature of the ShieldTorch is that it can achieve this at 900-1000W forward power other systems can only remove interferences at 600-650W interfering peaks reappear at higher power settings operating at 650W gives rise to severe matrix effects, and reduced analyte range
* Analysis at 600-650W is often referred to as cold plasma analysis
Figure 273
358

Advantages of operation at 900 W - 1000 W (High Power Cool Plasma) minimal matrix effects - similar to normal plasma operation (1200-1300W) higher ionizing power - wider analyte range - including even Zn and B complete sample matrix decomposition - greatly reduced possibility of interface and spectrometer contamination
Figure 274
359
Fe in 31% H2O2 - 5 ppt Spike Recovery

Excellent linearity even at 5ppt using high power cool plasma DL - 0.3ppt in the H2O2 matrix No collision cell or HRICP-MS data reported to date showing Fe linearity at 5ppt
Figure 275
360
ShieldTorch Technology Eliminates Interferences Before They Form!

?
C ol l i s i on C el l
= A nal yt e
Shi el d Torch Technol ogy
Figure 276
361
Can Heavy Matrices be Analyzed?

Example Organics analysis Until now, carbon-based interferences have prevented the trace analysis of Mg and Cr in organic samples C2 interferes with Mg 24, 25, 26 ArC interferences with Cr 52, 53 high power cool plasma (900W) removes these intereferences down to single figure ppt level AND is stable in all types of undiluted organic sample, including xylene, toluene and NMP
Figure 277
362
Cr in Undiluted Methanol
Excellent linearity at ppt level demonstrates removal of ArC interference using ShieldTorch system The concentration of Cr in the sample is calculated at 7 ppt
Figure 278
363
Example of Heavy Matrix Analysis

Example Analysis of trace impurities in Metal Alloys Levels required have traditionally been 10s ppm or % in the solid, but requirements for lower level characterization are increasing 1000x dilution typically used for ICP-MS, so 1ppm in solid requires measurement of 1ppb in solution easily achieved for most elements by ICP-MS, except K, Ca, Fe robust high power cool plasma could be used
Figure 279
364
Calibration for 56Fe in 1000 ppm Pt

High power cool plasma (900W) Fe at mass 56 in matrix of 1000ppm Pt Standard Addition calibration at 50, 100, 200 and 500ppt
Figure 280
365
Calibration for 66Zn in 1000 ppm Pt

High power cool plasma (900W) Zn at mass 66 in matrix of 1000ppm Pt. Standard Addition calibration at 50, 100, 200 and 500ppt Zn cannot be measured at 600W
Figure 281
366
Determination of Se by High Power Cool Plasma

Agilent 7500 Operating Parameters ShieldTorch interface Higher forward power (1000W) Higher gas flows 1.2 Lpm carrier gas 0.8 Lpm blend gas Ar2 ionization minimized, but plasma has power to ionize Se
Figure 282
367
Spectrum of 10 ppb Se and Blank

Figure 283
368
Calibration for 80Se

Se at 0, 1, 2, 5 and 10ppb No blank subtraction No interference correction No internal standard Precision and linearity good
Figure 284
369
Detection Limits for Se by Cool Plasma

M as s 76 77 78 80 82
Bl k 121 1796 33 113 211
Bl k SD 8.91 57.43 6.04 7.63 13.48
1ppb 786 2234 375 478 873
1ppbBl k 665 438 342 365 662
3s D L ( ppt ) 40.23 393.05 52.93 62.72 61.06
Detection Limits (3 sigma, n=10) in 4% HCl Note - Integration times varied for different isotopes
Figure 285
370
Current Research Developments Using the ShieldTorch

Trace elements in organics Se isotope ratios Trace As in chloride matrices Trace analysis of "difficult" ICP-MS elements
e.g. S, Si, P
Removal of isobaric interferences (not possible by collision cells or HR-ICP-MS)

removal of Hg from Pb at mass 204 removal of Zr from Sr at mass 90
Figure 286
371
As Calibration in 10% HCl

As at 0, 100, 250, 500 and 1000ppt ShieldTorch cool plasma

ArCl removed but As not ionised measure AsO at mass 91
As DL - 40ppt (in 10% HCl)
Figure 287
372
Low Level P Calibration

P at 0, 5, 10, 20 ppb ShieldTorch cool plasma measure PO at mass 47 P DL - 30ppt
Figure 288
373
Low Level S Calibration

S at 0, 5, 10, 20 ppb ShieldTorch cool plasma measure SO at mass 48 S DL - 0.6 ppb
Figure 289
374
Low Level Si Calibration

Si at 0, 5, 10, 20 ppb ShieldTorch cool plasma measure SiO at mass 44 Si DL - 1.2 ppb
Figure 290
375
Strategy #2: Resolve the Interferences

High resolution ICP-MS can be used to separate the analyte and interferent peak Increase mass resolution and separate the analyte and interferent peaks, then make the measurement
Figure 291
376
Limitations of HR-ICP-MS
Limitations of HR-ICPMS
Limitations of HR-ICP-MS
As in optical spectrometry, there is a trade off between resolution and sensitivity

increasing resolution reduces transmission the net result is an inability to determine the analyte at trace levels.
A resolution of up to 7500 is required for some interferences
at 7500R, signal transmission is only 1% of that at unit mass resolution (300R)
Figure 292
377
Resolution vs. Sensitivity
Resolution vs. Sensitivity

Resolution vs, Sensitivity
Increased Reso
Sensitivity
Figure 293
378
Resolution
Sensitivity Reduced
Other Facts About HR-ICP-MS [1]

Abundance sensitivity (tailing) is much worse in a magnetic sector than a quadrupole if the analyte peak is adjacent to a large interferent peak, eg 39K next to 40Ar, the tail from the Ar overwhelms the K signal in these cases, increasing the resolution does not help
40Ar
Intensity
39K
Mass
Figure 294
379

Mass calibration is critical to obtaining accurate analytical results, however, it is a time consuming process for HR-ICP-MS instruments
resolution is defined by changing slit widths, and these require calibration/characterization since the peak is so narrow at high resolution, the peak maximum cannot be reproducibly located the analyser must be scanned across the whole peak, which decreases S/N significantly
Figure 295
380

High resolution instruments cost >$350k Not perceived to be appropriate for routine analysis Require a higher level of operator skill than ICPQMS
Figure 296
381
Strategy #3: Dissociate Interferences Within the Spectrometer

Utilize collision/dynamic reaction cell technology Insert a collision cell/dynamic reaction cell within the spectrometer between the main ion lens and quadrupole analyser Control gas phase chemistry within the collision cell to dissociate polyatomic ions thereby eliminating the interferences
Figure 297
382
Principle of Collision Technology

Collision Cell
Gas inlet/outlet Photon Stop
Analyser Quadrupole Multipole Ion Guide
For Analyte and Interferent ions occurring at the same nominal mass: I nterferent + Reaction Gas IR New Mass A nalyte + Reaction Gas No Reaction; Analyte at Same Mass
Figure 298
383
Selecting a Gas Phase Reagent

The ideal reagent should: have high reactivity with the interferent ion result in 100% conversion of the interferent ion into its constituent products result in a final product that is stable Unfortunately, no single gas has been found to be applicable for a complete multielement analysis Collision cell chemistries must be tailored for each individual element and sample matrix
Figure 299
384
Optimizing the Gas Phase Reagent

Often, more than one reaction gas is required to analyse a series of different elements The need to fill the collision cell with gas for the analysis and then vent the cell and refill with another gas, and remeasure the sample significantly increases analysis time Not only must the type of gas used be optimized, but the flow rate of gas through the cell must also be optimized for best S/N Few elements optimize using the same type of gas at the same flow rate. Therefore, compromise conditions must be used
Figure 300
385
Side Reactions Are Inevitable!!
Side Reactions Are Inevitable!!

Side Reactions are Inevitable!!
Side reactions i.e. unexpected reactions of the collision gas with other matrix components, have always been reported when using this technology For example, when using NH3 as a collision gas when Ni is present in the sample: Reaction Product
T T T T
Ni+ + NH3 Ni+ + Ni(NH3)+ Ni+ + Ni(NH3) 2+ Ni+ + Ni(NH3) 3+
Ni(NH3)+ Ni(NH3) 2+ Ni(NH3) 3+ Ni(NH3) 4+
Figure 301
386
Side Reactions Create New Interferences

Product Ni(NH3)+ Ni(NH3) 2+ Ni(NH3) 3+ Ni(NH3) 4+
Interferes with 75As, 77Se 92Zr, 92Mo, 94Zr, 94Mo, 95Mo, 96Zr, 96Mo, 96Ru, 98Mo, 98Ru 109Ag, 111Cd, 112Cd, 112Sn, 113Cd, 113In, 115In, 115Sn 130Ba, 132Ba 126Te, 128Te, 130Te,
Figure 302
387
Hydrocarbons Are Particularly Prone To Complex Chemistries Even at Trace Levels

Even for simple hydrocarbons: Ar+ + CH4 Ar+ + CH3+ Ar+ + CH2+ CH3+ + Ar + H + CH2+ + Ar + H2 CH+ + Ar + H3 +
Figure 303
388

Multipole Ion Optics In ICP-MS, Jonathan Batey, 25th Annual Conference of the Federation of Analytical Chemistry and Spectroscopy Societies, Paper #661. Aspirated 400ppm Ca into a collision cell device Ca could be measured at 40Ca, however, strong peaks were observed throughout the mass spectrum due to CaOH+ and other Ca molecular ions Conclusion - collisions cells were not appropriate for samples containing significant matrix components
Figure 304
389
Strategies to Overcome the Problem of Side Reactions

The collision cell quad can be scanned in concert with the analyser quad*
enables the collision cell quad to act like a notch filter can prevent side reaction ions from entering the analyser quad
* Tanner S.D., Baranov V.I., At. Spectroscopy, 20 (2) 3-4/99
Figure 305
390
Limitation of Scanning the Analyzer Quad

When the collision cell quad becomes contaminated with sample matrix, it will charge up, and be unable to follow the scan speed of the analyser quad Analyte transmission will fall dramatically Quadrupoles are difficult to clean Correct realignment is critical to achieve maximum transmission
Figure 306
391
Collision Cells Can Create Interferences
Collision Cells Can Create Interferences

Collision Cells Can Create Interferences Through...
Interferring ions combining with the reaction gas to shift to a new mass Reaction gas combining with analytes and matrix components not previously interferred with Reaction gas combining with ultra-trace contaminants in the cell The presence of any type of matrix significantly complicates data interpretation
This mass cannot always be anticipated due to ion clustering
Figure 307
392
In Summary
In Summary
In Summary...
High resolution ICP-MS can resolve the interferences, but is not easy to use, and in complex matrices, poor abundance sensitivity gives rise to severe spectral overlaps Collision cells must use different gases/gas mixtures and gas flow rates to meet all analyte requirements Collision cells not only reduce targeted interferences but create new unpredictable molecular ion clusters in every individual matrix For almost all applications, high power cool plasma has superior performance
Figure 308
393
In Summary
394

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Agilent 7500 Inductively Coupled Plasma Mass Spectrometry

Data Systems Liquid Chromatography

Agilent 7500 Inductively Coupled Plasma Mass Spectrometry

Manual Part Number H8974-90000 Printed in the USA January, 2001

Introduction: Elemental Analysis

Introduction: Elemental Analysis

Introduction: Elemental Analysis

Atomic Mass and Weight

Atomic Mass and Weight

Nucleus Electron shell or cloud Electron

Introduction: Elemental Analysis

Isotopes and Isobars

Isotopes and Isobars

Isotopes: Atomicnumber number(number (numberof of Isotopes:Atomic

Isobars: Atomicnumber numberis isdifferent, different,but but Isobars:Atomic

Introduction: Elemental Analysis

Analytical Techniques for Elemental Analysis

Analytical Techniques for Elemental Analysis

Introduction: Elemental Analysis

Elemental Analysis: FAAS

Elemental Analysis: FAAS

Introduction: Elemental Analysis

Elemental Analysis: GFAAS

Elemental Analysis: GFAAS

Introduction: Elemental Analysis

Elemental Analysis: ICP-OES

Elemental Analysis: ICP-OES

Introduction: Elemental Analysis

Elemental Analysis: ICP-MS

Elemental Analysis: ICP-MS

Introduction: Elemental Analysis

Comparison of Elemental Techniques

Comparison of Elemental Techniques

Introduction: Elemental Analysis

Graphical Comparison of Elemental Techniques

Graphical Comparison of Elemental Techniques

Introduction: Elemental Analysis

Comparison of the Complexity of Multi-elemental Techniques

Comparison of the Complexity of Multi-elemental Techniques

Introduction: Elemental Analysis

Environmental Semiconductor Nuclear Clinical/Pharmaceutical Petrochemical Geological Forensic Academia

Introduction: Elemental Analysis

Multi-elemental Analysis of Metals

Multi-elemental Analysis of Metals

GFAAS, ICP-OES & CVAA

Data Compilation & Review

Introduction: Inductively Coupled Plasma Mass Spectrometry

Introduction: Inductively Coupled Plasma Mass Spectrometry

Inorganic (elemental) analysis technique. ICP - Inductively Coupled Plasma

ppt to ppm levels isotopic information available

Introduction: Inductively Coupled Plasma Mass Spectrometry

Introduction: Inductively Coupled Plasma Mass Spectrometry

Agilent Technologies and ICP-MS

Agilent Technologies and ICP-MS

Introduction: Inductively Coupled Plasma Mass Spectrometry

Vaporization solid sample

Introduction: Inductively Coupled Plasma Mass Spectrometry

Overview of Agilent 7500 Features

Overview of Agilent 7500 Features

Introduction: Inductively Coupled Plasma Mass Spectrometry