PE Lambda 750 Technical Description and Specifications

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www.IetLtd.com Proudly serving laboratories worldwide since 1979
CALL +847.913.0777 for Refurbished & Certified Lab Equipment


PE Lambda 750
Technical Description and Specifications

All instruments will meet or achieve better than the confirmed specifications, under normal
conditions of use as described in the user manual.

Principle Double beam, double monochromator, ratio recording UV/Vis/NIR
spectrophotometer with microcomputer electronics, controlled by a
DELL PC or compatible personal computer.
Optical System All reflecting optical system (SiO2 coated) with holographic grating
monochromator with 1440 Lines/mm UV/Vis blazed at 240 nm and 360
Lines/mm NIR blazed at 1100 nm, Littrow mounting, sample thickness
compensated detector optics.
Beam Splitting
System
Chopper (46+ Hz, Cycle: Dark/Sample/Dark/Reference, Chopper
Segment Signal Correction CSSC).
Detector Photomultiplier R955 for high energy in the whole UV/Vis wavelength
range. Peltier cooled PbS detector for NIR.
Source Pre-aligned tungsten-halogen and deuterium.
Wavelength Range 190 nm - 3300 nm
UV/Vis Resolution ! 0.17 nm
NIR Resolution ! 0.20 nm
Stray Light At 200 nm (12 g/L KCl USP/DAP method)
At 220 nm (10 g/L NaI ASTM method)
At 340 nm (50 mg/L NaNO2 ASTM method)
At 370 nm (50 mg/L NaNO2 ASTM method)
At 1420 nm (H20 1-cm pathlength)
At 1690 nm (CHCl3 4-cm pathlength)
At 2365 nm (CHCl3 1-cm pathlength)
> 2 A
! 0.0001 %T
! 0.0001 %T
! 0.0001 %T
! 0.0004 %T
! 0.0015 %T
! 0.002 %T
Wavelength
Accuracy
0.15 nm UV/Vis
0.5 nm NIR
Wavelength
Reproducibility
UV/Vis (Deuterium Lamp Lines)
NIR (Deuterium Lamp Lines) !
0.1 nm
! 0.06 nm
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Photometric
Accuracy
Double Aperture Method 1 A
Double Aperture Method 0.3 A
NIST 1930D Filters 2 A
NIST 930D Filters 1 A
NIST 930D Filters 0.5 A
K2Cr2O7-Solution USP/DAP method
0.0012 A
0.0006 A
0.003 A
0.003 A
0.002 A
0.010 A
Photometric
Linearity
At 3.0 A (Addition of filters UV/Vis at
546.1 nm, 2 nm Slit, 1-sec. integration
time) (Residual from filter addition
method)
0.020 A
Photometric
Reproducibility
1 A with NIST 930D Filter at 546.1
nm Standard Deviation for 10
measurements
! 0.0008 A
Photometric Range 6 A (using reference-beam attenuation)


Photometric
Display
Unlimited
Bandpass 0.17 nm - 5.00 nm in 0.01 nm increments UV/Vis range
0.20 nm - 20.00 nm in 0.04 nm increments NIR range
Fixed resolution, constant energy or slit programming.
Photometric
Stability
After warm-up at 500 nm, 0 A, 2 nm
Slit, 2-sec. integration time, Peak to
Peak
! 0.0002 A/h
Baseline Flatness 190 nm - 3100 nm, Slit (UV/Vis) 2 nm,
Slit (NIR) Servo Mode, NIR Gain = 1,

integration time 3100-860.8 nm: 0.24
sec.,

integration time 860.8-190 nm: 0.20
sec.,

no smoothing applied
0.0015 A
Photometric Noise
RMS
0 A and 190 nm
0 A and 500 nm
2 A and 500 nm
4 A and 500 nm
3 A and 1500 nm
(2 nm Slit, 1-sec. integration time, Gain
1 NIR)
! 0.0001 A
! 0.00005 A
! 0.0002 A
! 0.002 A
! 0.003 A
Primary Sample
Compartment
200 mm x 300 mm x 220 mm (W x D x H)
Secondary Sample
Compartment
480 mm x 300 mm x 220 mm (W x D x H)
Instrument 1020 mm x 740 mm x 300 mm
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Dimension
(W x D x H)
Instrument Weight ~ 77 kg
Digital I/O RS 232 C
Light Beam 90 mm above the base plate
120 mm beam separation
3 mm - 12 mm beam height
Instrument
Requirements
Power
Temperature
Recommended Humidity
90 VAC - 250 VAC, 50/60 Hz; 400 VA
10 C - 35 C
10 - 70% relative humidity, non-condensing

www.IetLtd.com Proudly serving laboratories worldwide since 1979
CALL +847.913.0777 for Refurbished & Certified Lab Equipment

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