MPC5200CVR400B

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Freescale Semiconductor

Data Sheet: Technical Data

MPC5200BDS
Rev. 1, 1/2006

MPC5200B Data Sheet

NOTE
The information in this
document is subject to
change. For the latest data
on the MPC5200B, visit
www.mobilegt.com and
proceed to the
MPC5200B Product
Summary Page.

Table of Contents
1
2
3

Overview

The MPC5200B integrates a high performance


MPC603e series e300 core with a rich set of peripheral
functions focused on communications and systems
integration. The e300 core design is based on the
PowerPC core architecture. MPC5200B incorporates
an innovative BestComm I/O subsystem, which isolates
routine maintenance of peripheral functions from the
embedded e300 core. The MPC5200B contains a
SDRAM/DDR Memory Controller, a flexible External
Bus Interface, PCI Controller, USB, ATA, Ethernet, six

Freescale Semiconductor, Inc., 2006. All rights reserved.

Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Electrical and Thermal Characteristics . . . . . . . . . 6
3.1 DC Electrical Characteristics . . . . . . . . . . . . . 6
3.2 Oscillator and PLL Electrical
Characteristics . . . . . . . . . . . . . . . . . . . . . . . 12
3.3 AC Electrical Characteristics . . . . . . . . . . . . 14
Package Description . . . . . . . . . . . . . . . . . . . . . . 61
4.1 Package Parameters . . . . . . . . . . . . . . . . . . 61
4.2 Mechanical Dimensions. . . . . . . . . . . . . . . . 61
4.3 Pinout Listings . . . . . . . . . . . . . . . . . . . . . . . 63
System Design Information. . . . . . . . . . . . . . . . . 68
5.1 Power Up/Down Sequencing. . . . . . . . . . . . 68
5.2 System and CPU Core AVDD
Power Supply Filtering. . . . . . . . . . . . . . . . . 70
5.3 Pull-up/Pull-down Resistor Requirements . . 70
5.4 JTAG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Ordering Information . . . . . . . . . . . . . . . . . . . . . . 75
7 Document Revision History . . . . . . . . . . . . . 76

Features

Programmable Serial Controllers (PSC), I2C, SPI, CAN, J1850, Timers, and GPIOs.

Features

Key features are shown below.

MPC603e series e300 core


Superscalar architecture
760 MIPS at 400 MHz (-40 to +85 oC)

16 k Instruction cache, 16 k Data cache


Double precision FPU
Instruction and Data MMU
Standard and Critical interrupt capability
SDRAM / DDR Memory Interface
up to 133-MHz operation
SDRAM and DDR SDRAM support
256-MByte addressing range per CS, two CS available
32-bit data bus
Built-in initialization and refresh
Flexible multi-function External Bus Interface
Supports interfacing to ROM/Flash/SRAM memories or other memory mapped devices
8 programmable Chip Selects
Non multiplexed data access using 8/16/32 bit databus with up to 26-bit address
Short or Long Burst capable
Multiplexed data access using 8/16/32 bit databus with up to 25-bit address
Peripheral Component Interconnect (PCI) Controller
Version 2.2 PCI compatibility
PCI initiator and target operation
32-bit PCI Address/Data bus
33- and 66-MHz operation
PCI arbitration function
ATA Controller
Version 4 ATA compatible external interfaceIDE Disk Drive connectivity
BestComm DMA subsystem
Intelligent virtual DMA Controller
Dedicated DMA channels to control peripheral reception and transmission
Local memory (SRAM 16 kBytes)
MPC5200B Data Sheet, Rev. 1

Freescale Semiconductor

Features

6 Programmable Serial Controllers (PSC), configurable for the following:


UART or RS232 interface
CODEC interface for Soft Modem, Master/Slave CODEC Mode, I2S and AC97
Full duplex SPI mode
IrDA mode from 2400 bps to 4 Mbps
Fast Ethernet Controller (FEC)
Supports 100Mbps IEEE 802.3 MII, 10 Mbps IEEE 802.3 MII, 10 Mbps 7-wire interface
Universal Serial Bus Controller (USB)
USB Revision 1.1 Host
Open Host Controller Interface (OHCI)
Integrated USB Hub, with two ports.
Two Inter-Integrated Circuit Interfaces (I2C)
Serial Peripheral Interface (SPI)
Dual CAN 2.0 A/B Controller (MSCAN)
Motorola Scalable Controller Area Network (MSCAN) architecture
Implementation of version 2.0A/B CAN protocol
Standard and extended data frames
J1850 Byte Data Link Controller (BDLC)
J1850 Class B data communication network interface compatible and ISO compatible for low
speed (<125 kbps) serial data communications in automotive applications.
Supports 4X mode, 41.6 kbps
In-frame response (IFR) types 0, 1, 2, and 3 supported
Systems level features
Interrupt Controller supports four external interrupt request lines and 47 internal interrupt
sources
GPIO/Timer functions
Up to 56 total GPIO pins (depending on functional multiplexing selections) that support a
variety of interrupt/WakeUp capabilities.
Eight GPIO pins with timer capability supporting input capture, output compare, and pulse
width modulation (PWM) functions
Real-time Clock with one-second resolution
Systems Protection (watch dog timer, bus monitor)
Individual control of functional block clock sources
Power management: Nap, Doze, Sleep, Deep Sleep modes
Support of WakeUp from low power modes by different sources (GPIO, RTC, CAN)

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

Features

Test/Debug features
JTAG (IEEE 1149.1 test access port)
Common On-chip Processor (COP) debug port
On-board PLL and clock generation

Figure 1 shows a simplified MPC5200B block diagram.

MPC5200B Data Sheet, Rev. 1


4

Freescale Semiconductor

Freescale Semiconductor

Reset / Clock
Generation

JTAG / COP
Interface

e300 Core

603

CommBus

SDRAM / DDR
Memory Controller

SDRAM / DDR

ATA Host Controller

PCI Bus Controller

Local Plus Controller

GPIO/Timers

Interrupt Controller

System Functions

Real-Time Clock

Systems Interface Unit (SIU)

Local
Bus

Features

MSCAN
2x

J1850

USB
2x

SPI

I2C
2x

BestComm DMA
Ethernet

SRAM 16K
PSC
6x

Figure 1. Simplified Block DiagramMPC5200B

MPC5200B Data Sheet, Rev. 1

Electrical and Thermal Characteristics

Electrical and Thermal Characteristics

3.1

DC Electrical Characteristics

3.1.1

Absolute Maximum Ratings

The tables in this section describe the MPC5200B DC Electrical characteristics. Table 1 gives the absolute
maximum ratings.
Table 1. Absolute Maximum Ratings(1)
Characteristic

Sym

Min

Max

Unit

SpecID

VDD_CORE

0.3

1.8

D1.1

VDD_IO,
VDD_MEM_IO

0.3

3.6

D1.2

SYS_PLL_AVDD

0.3

2.1

D1.3

CORE_PLL_AVDD

0.3

2.1

D1.4

Input voltage (VDD_IO)

Vin

0.3

VDD_IO + 0.3

D1.5

Input voltage (VDD_MEM_IO)

Vin

0.3

VDD_MEM_IO
+ 0.3

D1.6

Input voltage overshoot

Vinos

1.0

D1.7

Input voltage undershoot

Vinus

1.0

D1.8

150

oC

D1.9

Supply voltage - e300 core and peripheral logic


Supply voltage - I/O buffers
Supply voltage - System APLL
Supply voltage - e300 APLL

Storage temperature range

Tstg

55

NOTES:
1 Absolute maximum ratings are stress ratings only, and functional operation at the maximums is not guaranteed.
Stresses beyond those listed may affect device reliability or cause permanent damage.

3.1.2

Recommended Operating Conditions

Table 2 gives the recommended operating conditions.


Table 2. Recommended Operating Conditions
Sym

Min (1)

Max (1)

Unit

SpecID

VDD_CORE

1.42

1.58

D2.1

VDD_IO

3.0

3.6

D2.2

Supply voltage - memory I/O buffers (SDR)

VDD_MEM_IOSDR

3.0

3.6

D2.3

Supply voltage - memory I/O buffers (DDR)

VDD_MEM_IODDR

2.42

2.63

D2.4

SYS_PLL_AVDD

1.42

1.58

D2.5

CORE_PLL_AVDD

1.42

1.58

D2.6

Vin

VDD_IO

D2.7

VinSDR

VDD_MEM_IOSDR

D2.8

Characteristic
Supply voltage - e300 core and peripheral
logic
Supply voltage - standard I/O buffers

Supply voltage - System APLL


Supply voltage - e300 APLL
Input voltage - standard I/O buffers
Input voltage - memory I/O buffers (SDR)

MPC5200B Data Sheet, Rev. 1


6

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 2. Recommended Operating Conditions (continued)


Sym

Min (1)

Max (1)

VinDDR

Characteristic
Input voltage - memory I/O buffers (DDR)
Ambient operating temperature range
Die junction operating temperature

(2)

TA

range(2)

Ambient operating temperature range(3)


Die junction operating temperature

range(3)

Unit

SpecID

VDD_MEM_IODDR

D2.9

+85

oC

D2.10

D2.12

-40

Tj

-40

+115

TA

-40

+105

D2.10

+125

D2.12

Tj

-40

NOTES:
1
These are recommended and tested operating conditions. Proper device operation outside these conditions is not
guaranteed.
2
Maximum e300 core operating frequency is 400 MHz.
3
Maximum e300 core operating frequency is 266 MHz.

3.1.3

DC Electrical Specifications

Table 3 gives the DC Electrical characteristics for the MPC5200B at recommended operating conditions
(see Table 2).
Table 3. DC Electrical Specifications
Characteristic

Condition

Sym

Min

Max

Unit

SpecID

Input high voltage

Input type = TTL


VDD_IO/VDD_MEM_IOSDR

VIH

2.0

D3.1

Input high voltage

Input type = TTL


VDD_MEM_IODDR

VIH

1.7

D3.2

Input high voltage

Input type = PCI


VDD_IO

VIH

2.0

D3.3

Input high voltage

Input type = SCHMITT


VDD_IO

VIH

2.0

D3.4

Input high voltage

SYS_XTAL_IN

CVIH

2.0

D3.5

Input high voltage

RTC_XTAL_IN

CVIH

2.0

D3.6

Input low voltage

Input type = TTL


VDD_IO/VDD_MEM_IOSDR

VIL

0.8

D3.7

Input low voltage

Input type = TTL


VDD_MEM_IODDR

VIL

0.7

D3.8

Input low voltage

Input type = PCI


VDD_IO

VIL

0.8

D3.9

Input low voltage

Input type = SCHMITT


VDD_IO

VIL

0.8

D3.10

Input low voltage

SYS_XTAL_IN

CVIL

0.8

D3.11

Input low voltage

RTC_XTAL_IN

CVIL

0.8

D3.12

Vin = 0 or
VDD_IO/VDD_IO_MEMSDR

IIN

+2

D3.13

Input leakage current

(depending on input type

(1)

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

Electrical and Thermal Characteristics

Table 3. DC Electrical Specifications (continued)


Characteristic

Condition

Sym

Min

Max

Unit

SpecID

Input leakage current

SYS_XTAL_IN
Vin = 0 or VDD_IO

IIN

+10

D3.14

Input leakage current

RTC_XTAL_IN
Vin = 0 or VDD_IO

IIN

+10

D3.15

Input current, pullup resistor

PULLUP
VDD_IO
Vin = 0

IINpu

40

109

D3.16

Input current, pullup resistor


- memory I/O buffers

PULLUP_MEM
VDD_IO_MEMSDR
Vin = 0

IINpu

41

111

D3.17

PULLDOWN
VDD_IO
Vin = VDD_IO

IINpd

36

106

D3.18

Output high voltage

IOH is driver dependent(2)


VDD_IO, VDD_IO_MEMSDR

VOH

2.4

D3.19

Output high voltage

IOH is driver dependent(2)


VDD_IO_MEMDDR

VOHDDR

1.7

D3.20

Output low voltage

IOL is driver dependent(2)


VDD_IO, VDD_IO_MEMSDR

VOL

0.4

D3.21

Output low voltage

IOL is driver dependent(2)


VDD_IO_MEMDDR

VOLDDR

0.4

D3.22

ICS

-1.0

1.0

mA

D3.23

Cin

15

pF

D3.24

Input current, pulldown


resistor

DC Injection Current Per


Pin(3)
Capacitance

Vin = 0V, f = 1 MHz

NOTES:
Leakage current is measured with output drivers disabled and pull-up/pull-downs inactive.
2 See Table 4 for the typical drive capability of a specific signal pin based on the type of output driver associated with that
pin as listed in Table 52.
3 All injection current is transferred to VDD_IO/VDD_IO_MEM. An external load is required to dissipate this current to
maintain the power supply within the specified voltage range.
Total injection current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this
limit can cause disruption of normal operation.
1

Table 4. Drive Capability of MPC5200B Output Pins


Driver Type

Supply Voltage

IOH

IOL

Unit

SpecID

DRV4

VDD_IO = 3.3V

mA

D3.25

DRV8

VDD_IO = 3.3V

mA

D3.26

DRV8_OD

VDD_IO = 3.3V

mA

D3.27

DRV16_MEM

VDD_IO_MEM = 3.3V

16

16

mA

D3.28

DRV16_MEM

VDD_IO_MEM = 2.5V

16

16

mA

D3.29

VDD_IO = 3.3V

16

16

mA

D3.30

PCI

MPC5200B Data Sheet, Rev. 1


8

Freescale Semiconductor

Electrical and Thermal Characteristics

3.1.4

Electrostatic Discharge
CAUTION
This device contains circuitry that protects against damage due to
high-static voltage or electrical fields. However, it is advised that normal
precautions be taken to avoid application of any voltages higher than
maximum-rated voltages. Operational reliability is enhanced if unused
inputs are tied to an appropriate logic voltage level (i.e., either GND or
VCC ). Table 7 gives package thermal characteristics for this device.
Table 5. ESD and Latch-Up Protection Characteristics

Sym

Rating

Min

Max

Unit

SpecID

VHBM

Human Body Model (HBM)JEDEC JESD22-A114-B

2000

D4.1

VMM

Machine Model (MM)JEDEC JESD22-A115

200

D4.2

VCDM

Charge Device Model (CDM)JEDEC JESD22-C101

500

D4.3

+100
-100

mA

+200
-200

mA

ILAT

ILAT

3.1.5

Latch-up Current at
positive
negative

TA=85oC

D4.4

Latch-up Current at TA=27oC


positive
negative

D4.5

Power Dissipation

Power dissipation of the MPC5200B is caused by 3 different components: the dissipation of the internal
or core digital logic (supplied by VDD_CORE), the dissipation of the analog circuitry (supplied by
SYS_PLL_AVDD and CORE_PLL_AVDD) and the dissipation of the IO logic (supplied by
VDD_IO_MEM and VDD_IO). Table 6 details typical measured core and analog power dissipation
figures for a range of operating modes. However, the dissipation due to the switching of the IO pins can
not be given in general, but must be calculated by the user for each application case using the following
formula:
P IO = P IOint +

N C VDD_IO

Eqn. 1

where N is the number of output pins switching in a group M, C is the capacitance per pin, VDD_IO is the
IO voltage swing, f is the switching frequency and PIOint is the power consumed by the unloaded IO stage.
The total power consumption of the MPC5200B processor must not exceed the value, which would cause
the maximum junction temperature to be exceeded.
P total = P core + P analog + P IO

Eqn. 2

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

Electrical and Thermal Characteristics

Table 6. Power Dissipation


Core Power Supply (VDD_CORE)
SYS_XTAL/XLB/PCI/IPB/CORE (MHz)
SpecID
Mode

Operational
Doze

33/66/33/33/264

33/132/66/132/396

Typ

Typ

727.5

1080

600

Unit

Notes

mW

(1),(2)

D5.1

mW

(1),(3)

D5.2
D5.3

Nap

225

mW

(1),(4)

Sleep

225

mW

(1),(5)

D5.4

Deep-Sleep

52.5

52.5

mW

(1),(6)

D5.5

PLL Power Supplies (SYS_PLL_AVDD, CORE_PLL_AVDD)


Mode

Typ

Unit

Notes

Typical

mW

(7)

D5.6

Unloaded I/O Power Supplies (VDD_IO, VDD_MEM_IO8)


Mode

Typ

Unit

Notes

Typical

33

mW

(9)

D5.7

NOTES:
1 Typical core power is measured at VDD_CORE = 1.5 V, Tj = 25 C
2 Operational power is measured while running an entirely cache-resident program with floating-point
multiplication instructions in parallel with a continuous PCI transaction via BestComm.
3 Doze power is measured with the e300 core in Doze mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
4 Nap power is measured with the e300 core in Nap mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
5 Sleep power is measured with the e300 core in Sleep mode, the system oscillator, System PLL and Core PLL
are active, all other system modules are inactive
6 Deep-Sleep power is measured with the e300 core in Sleep mode, the system oscillator, System PLL, Core PLL
and all other system modules are inactive
7 Typical PLL power is measured at SYS_PLL_AVDD = CORE_PLL_AVDD = 1.5 V, Tj = 25 C
8
IO power figures given in the table represent the worst case scenario. For the VDD_MEM_IO rail connected to
2.5V the IO power is expected to be lower and bounded by the worst case with VDD_MEM_IO connected to
3.3V.
9 Unloaded typical I/O power is measured in Deep-Sleep mode at VDD_IO = VDD_MEM_IO
SDR= 3.3 V, Tj = 25 C

MPC5200B Data Sheet, Rev. 1


10

Freescale Semiconductor

Electrical and Thermal Characteristics

3.1.6

Thermal Characteristics
Table 7. Thermal Resistance Data
Rating

Board Layers

Sym

Value

Unit

Notes

SpecID

RJA

30

C/W

(1),(2)

D6.1

Junction to Ambient
Natural Convection

Single layer board


(1s)

Junction to Ambient
Natural Convection

Four layer board (2s2p)

RJMA

22

C/W

(1),(3)

D6.2

Junction to Ambient (@200


ft/min)

Single layer board


(1s)

RJMA

24

C/W

(1),(3)

D6.3

Junction to Ambient (@200


ft/min)

Four layer board


(2s2p)

RJMA

19

C/W

(1),(3)

D6.4

RJB

14

C/W

(4)

D6.5
D6.6
D6.7

Junction to Board
Junction to Case
Junction to Package Top

Natural Convection

RJC

C/W

(5)

JT

C/W

(6)

NOTES:
1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting
site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and
board thermal resistance.
2 Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL
SPEC-883 Method 1012.1).
6 Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter
is written as Psi-JT.

3.1.6.1

Heat Dissipation

An estimation of the chip-junction temperature, TJ, can be obtained from the following equation:
TJ = TA +(R JA PD )

Eqn. 3

where:
TA = ambient temperature for the package (C)
R JA = junction to ambient thermal resistance (C/W)
PD = power dissipation in package (W)
The junction to ambient thermal resistance is an industry standard value, which provides a quick and easy
estimation of thermal performance. Unfortunately, there are two values in common usage: the value
determined on a single layer board, and the value obtained on a board with two planes. For packages such
as the PBGA, these values can be different by a factor of two. Which value is correct depends on the power
dissipated by other components on the board. The value obtained on a single layer board is appropriate for
the tightly packed printed circuit board. The value obtained on the board with the internal planes is usually
appropriate if the board has low power dissipation and the components are well separated.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

11

Electrical and Thermal Characteristics

Historically, the thermal resistance has frequently been expressed as the sum of a junction to case thermal
resistance and a case to ambient thermal resistance:
R JA = R JC +R CA

Eqn. 4

where:
R JA = junction to ambient thermal resistance (C/W)
R JC = junction to case thermal resistance (C/W)
R CA = case to ambient thermal resistance (C/W)
R JC is device related and cannot be influenced by the user. The user controls the thermal environment to
change the case to ambient thermal resistance, R CA. For instance, the user can change the air flow around
the device, add a heat sink, change the mounting arrangement on printed circuit board, or change the
thermal dissipation on the printed circuit board surrounding the device. This description is most useful for
ceramic packages with heat sinks where some 90% of the heat flow is through the case to the heat sink to
ambient. For most packages, a better model is required.
A more accurate thermal model can be constructed from the junction to board thermal resistance and the
junction to case thermal resistance. The junction to case covers the situation where a heat sink will be used
or where a substantial amount of heat is dissipated from the top of the package. The junction to board
thermal resistance describes the thermal performance when most of the heat is conducted to the printed
circuit board. This model can be used for either hand estimations or for a computational fluid dynamics
(CFD) thermal model.
To determine the junction temperature of the device in the application after prototypes are available, the
Thermal Characterization Parameter (JT) can be used to determine the junction temperature with a
measurement of the temperature at the top center of the package case using the following equation:
TJ = TT +( JT PD )

Eqn. 5

where:
TT = thermocouple temperature on top of package (C)
JT = thermal characterization parameter (C/W)
PD = power dissipation in package (W)
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned, so
that the thermocouple junction rests on the package. A small amount of epoxy is placed over the
thermocouple junction and over approximately one mm of wire extending from the junction. The
thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling
effects of the thermocouple wire.

3.2

Oscillator and PLL Electrical Characteristics

The MPC5200B System requires a system-level clock input SYS_XTAL. This clock input may be driven
directly from an external oscillator or with a crystal using the internal oscillator.
There is a separate oscillator for the independent Real-Time Clock (RTC) system.
MPC5200B Data Sheet, Rev. 1
12

Freescale Semiconductor

Electrical and Thermal Characteristics

The MPC5200B clock generation uses two phase locked loop (PLL) blocks.
The system PLL (SYS_PLL) takes an external reference frequency and generates the internal
system clock. The system clock frequency is determined by the external reference frequency and
the settings of the SYS_PLL configuration.
The e300 core PLL (CORE_PLL) generates a master clock for all of the CPU circuitry. The e300
core clock frequency is determined by the system clock frequency and the settings of the
CORE_PLL configuration.

3.2.1

System Oscillator Electrical Characteristics


Table 8. System Oscillator Electrical Characteristics
Characteristic

Sym

Notes

Min

Typical

Max

Unit

SpecID

SYS_XTAL frequency

fsys_xtal

15.6

33.3

35.0

MHz

O1.1

Oscillator start-up time

tup_osc

10

ms

O1.2

3.2.2

RTC Oscillator Electrical Characteristics


Table 9. RTC Oscillator Electrical Characteristics
Characteristic

RTC_XTAL frequency

3.2.3

Sym

Notes

frtc_xtal

Min

Typical

Max

Unit

SpecID

32.768

kHz

O2.1

System PLL Electrical Characteristics


Table 10. System PLL Specifications
Characteristic

Sym

Notes

Min

Typical

Max

Unit

SpecID

SYS_XTAL frequency

fsys_xtal

(1)

15.6

33.3

35.0

MHz

O3.1

SYS_XTAL cycle time

tsys_xtal

(1)

66.6

30.0

28.5

ns

O3.2

tjitter

(2)

150

ps

O3.3

250

533

800

MHz

O3.4

100

O3.5

SYS_XTAL clock input jitter


System VCO frequency
System PLL relock time

fVCOsys
tlock

(1)
(3)

NOTES:
1 The SYS_XTAL frequency and PLL Configuration bits must be chosen such that the resulting system frequency,
CPU (core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating
frequencies.
2
This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different
types of jitter can exist on the input to CORE_SYSCLK, systemic and true random jitter. True random jitter is
rejected. Systemic jitter will be passed into and through the PLL to the internal clock circuitry.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required
for the PLL lock after a stable VDD and CORE_SYSCLKare reached during the power-on reset sequence. This
specification also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

13

Electrical and Thermal Characteristics

3.2.4

e300 Core PLL Electrical Characteristics

The internal clocking of the e300 core is generated from and synchronized to the system clock by means
of a voltage-controlled core PLL.
Table 11. e300 PLL Specifications
Characteristic

Sym

Notes

Min

Typical

Max

Unit

SpecID

e300 frequency

fcore

(1)

50

550

MHz

O4.1

e300 cycle time

tcore

(1)

2.85

40.0

ns

O4.2

e300 VCO frequency

fVCOcore

(1)

400

1200

MHz

O4.3

e300 input clock frequency

fXLB_CLK

25

367

MHz

O4.4

e300 input clock cycle time

tXLB_CLK

2.73

50.0

ns

O4.5

e300 input clock jitter


e300 PLL relock time

tjitter

(2)

150

ps

O4.6

tlock

(3)

100

O4.7

NOTES:
1 The XLB_CLK frequency and e300 PLL Configuration bits must be chosen such that the resulting system
frequencies, CPU (core) frequency, and e300 PLL (VCO) frequency do not exceed their respective maximum or
minimum operating frequencies in Table 12.
2 This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different
types of jitter can exist on the input to CORE_SYSCLK, systemic and true random jitter. True random jitter is
rejected. Systemic jitter will be passed into and through the PLL to the internal clock circuitry.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required
for the PLL lock after a stable VDD and CORE_SYSCLK are reached during the power-on reset sequence. This
specification also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.

3.3

AC Electrical Characteristics

Hyperlinks to the indicated timing specification sections are provided below.

AC Operating Frequency Data

USB

Clock AC Specifications

SPI

Resets

MSCAN

External Interrupts

I2C

SDRAM

J1850

PCI

PSC

Local Plus Bus

GPIOs and Timers

ATA

IEEE 1149.1 (JTAG) AC Specifications

Ethernet

MPC5200B Data Sheet, Rev. 1


14

Freescale Semiconductor

Electrical and Thermal Characteristics

AC Test Timing Conditions:


Unless otherwise noted, all test conditions are as follows:
TA = -40 to 85 oC
Tj = -40 to 115 oC
VDD_CORE = 1.42 to 1.58 V
VDD_IO = 3.0 to 3.6 V
Input conditions:
All Inputs: tr, tf <= 1 ns
Output Loading:
All Outputs: 50 pF

3.3.1

AC Operating Frequency Data

Table 12 provides the operating frequency information for the MPC5200B.


Table 12. Clock Frequencies

3.3.2

Min

Max

Units

SpecID

e300 Processor Core

400

MHz

A1.1

SDRAM Clock

133

MHz

A1.2

XL Bus Clock

133

MHz

A1.3

IP Bus Clock

133

MHz

A1.4

PCI / Local Plus Bus Clock

66

MHz

A1.5

PLL Input Range

15.6

35

MHz

A1.6

Clock AC Specifications
t CYCLE
t DUTY

t DUTY

t FALL

t RISE
CV IH

VM

SYSCLK

VM

VM

CV IL

Figure 2. Timing DiagramSYS_XTAL_IN


Table 13. SYS_XTAL_IN Timing
Sym
t CYCLE
t RISE

Description
(1)

SYS_XTAL_IN cycle time.


SYS_XTAL_IN rise time.

Min

Max

Units

SpecID

28.6

64.1

ns

A2.1

5.0

ns

A2.2

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

15

Electrical and Thermal Characteristics

Table 13. SYS_XTAL_IN Timing (continued)


Sym

Description

t FALL

SYS_XTAL_IN fall time.


(2)

Min

Max

Units

SpecID

5.0

ns

A2.3

40.0

60.0

A2.4

t DUTY

SYS_XTAL_IN duty cycle (measured at V M ).

CV IH

SYS_XTAL_IN input voltage high

2.0

A2.5

CV IL

SYS_XTAL_IN input voltage low

0.8

A2.6

NOTES:
CAUTIONThe SYS_XTAL_IN frequency and system PLL_CFG[0-6] settings must be chosen such that the
resulting system frequencies do not exceed their respective maximum or minimum operating frequencies. See the
MPC5200B User Manual [1].
2 SYS_XTAL_IN duty cycle is measured at V .
M
1

3.3.3

Resets

The MPC5200B has three reset pins:


PORRESET - Power on Reset
HRESET - Hard Reset
SRESET - Software Reset
These signals are asynchronous I/O signals and can be asserted at any time. The input side uses a Schmitt
trigger and requires the same input characteristics as other MPC5200B inputs, as specified in the DC
Electrical Specifications section. Table 14 specifies the pulse widths of the Reset inputs.
Table 14. Reset Pulse Width
Name

Description

Min Pulse Width

Max Pulse
Width

Reference Clock

SpecID

PORRESET

Power On Reset

tVDD_stable+tup_osc+tlock

SYS_XTAL_IN

A3.1

HRESET

Hardware Reset

4 clock cycles

SYS_XTAL_IN

A3.2

SRESET

Software Reset

4 clock cycles

SYS_XTAL_IN

A3.3

NOTES:
1. For PORRESET the value of the minimum pulse width reflects the power on sequence. If PORRESET is asserted afterwards
its minimum pulse width equals the minimum given for HRESET related to the same reference clock.
2. The tVDD_stable describes the time which is needed to get all power supplies stable.
3. For tlock, refer to the Oscillator/PLL section of this specification for further details.
4. For tup_osc, refer to the Oscillator/PLL section of this specification for further details.
5. Following the deassertion of PORRESET, HRESET and SRESET remain low for 4096 reference clock cycles.
6. The deassertion of HRESET for at least the minimum pulse width forces the internal resets to be active for an additional 4096
clock cycles.

NOTE
As long as VDD is not stable the HRESET output is not stable.

MPC5200B Data Sheet, Rev. 1


16

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 15. Reset Rise / Fall Timing


Description

Min

Max

Unit

SpecID

PORRESET fall time

ms

A3.4

PORRESET rise time

ms

A3.5

HRESET fall time

ms

A3.6

HRESET rise time

ms

A3.7

SRESET fall time

ms

A3.8

SRESET rise time

ms

A3.9

NOTES:
Make sure that the PORRESET does not carry any glitches. The MPC5200B has no filter to prevent them from getting into the
chip.
HRESET and SRESET must have a monotonous rise time.
The assertion of HRESET becomes active at Power on Reset without any SYS_XTAL clock.

For additional information, see the MPC5200B User Manual [1].

3.3.3.1

Reset Configuration Word

During reset (HRESET and PORRESET) the Reset Configuration Word is latched in the related Reset
Configuration Word Register with each rising edge of the SYS_XTAL signal. If both resets (HRESET and
PORRESET) are inactive (high), the contents of this register will be locked immediately with the
SYS_XTAL clock (see Figure 3).
4096 clocks

SYS_XTAL
PORRESET
HRESET
RST_CFG_WRD
sample
sample
sample
sample
sample
sample
sample
sample

sample
sample
LOCK

Figure 3. Reset Configuration Word Locking

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

17

Electrical and Thermal Characteristics

NOTE
Beware of changing the values on the pins of the reset configuration word
after the deassertion of PORRESET. This may cause problems because it
may change the internal clock ratios and so extend the PLL locking process.

3.3.4

External Interrupts

The MPC5200B provides three different kinds of external interrupts:


Four IRQ interrupts
Eight GPIO interrupts with simple interrupt capability (not available in power-down mode)
Eight WakeUp interrupts (special GPIO pins)
The propagation of these three kinds of interrupts to the core is shown in the following graphic:
IRQ0
8 GPIOs

cint
8

Encoder

GPIO Std

CORE_CINT
CORE_INT

int

8 GPIOs

GPIO WakeUp
e300 Core

Grouper
Encoder

IRQ1
IRQ2

PIs

Main Interrupt
Controller

IRQ3

Notes:
1. PIs = Programmable Inputs
2. Grouper and Encoder functions imply programmability in software
Figure 4. External Interrupt Scheme

Due to synchronization, prioritization, and mapping of external interrupt sources, the propagation of
external interrupts to the core processor is delayed by several IP_CLK clock cycles. The following table
specifies the interrupt latencies in IP_CLK cycles. The IP_CLK frequency is programmable in the Clock
Distribution Module (see Note Table 16).
Table 16. External Interrupt Latencies
Interrupt Type
Interrupt Requests

Pin Name

Clock Cycles

Reference Clock

Core Interrupt

SpecID

IRQ0

10

IP_CLK

critical (cint)

A4.1

IRQ0

10

IP_CLK

normal (int)

A4.2

IRQ1

10

IP_CLK

normal (int)

A4.3

IRQ2

10

IP_CLK

normal (int)

A4.4

IRQ3

10

IP_CLK

normal (int)

A4.5

MPC5200B Data Sheet, Rev. 1


18

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 16. External Interrupt Latencies (continued)


Interrupt Type
Standard GPIO Interrupts

GPIO WakeUp Interrupts

Pin Name

Clock Cycles

Reference Clock

Core Interrupt

SpecID

GPIO_PSC3_4

12

IP_CLK

normal (int)

A4.6

GPIO_PSC3_5

12

IP_CLK

normal (int)

A4.7

GPIO_PSC3_8

12

IP_CLK

normal (int)

A4.8

GPIO_USB_9

12

IP_CLK

normal (int)

A4.9

GPIO_ETHI_4

12

IP_CLK

normal (int)

A4.10

GPIO_ETHI_5

12

IP_CLK

normal (int)

A4.11

GPIO_ETHI_6

12

IP_CLK

normal (int)

A4.12

GPIO_ETHI_7

12

IP_CLK

normal (int)

A4.13

GPIO_PSC1_4

12

IP_CLK

normal (int)

A4.15

GPIO_PSC2_4

12

IP_CLK

normal (int)

A4.16

GPIO_PSC3_9

12

IP_CLK

normal (int)

A4.17

GPIO_ETHI_8

12

IP_CLK

normal (int)

A4.18

GPIO_IRDA_0

12

IP_CLK

normal (int)

A4.19

DGP_IN0

12

IP_CLK

normal (int)

A4.20

DGP_IN1

12

IP_CLK

normal (int)

A4.21

NOTES:
1) The frequency of IP_CLK depends on register settings in Clock Distribution Module. See the MPC5200B User Manual [1].
2) The interrupt latency descriptions in the table above are related to non competitive, non masked but enabled external
interrupt sources. Take care of interrupt prioritization which may increase the latencies.

Since all external interrupt signals are synchronized into the internal processor bus clock domain, each of
these signals has to exceed a minimum pulse width of more than one IP_CLK cycle.
Table 17. Minimum Pulse Width for External Interrupts to be Recognized
Name
All external interrupts (IRQs, GPIOs)

Min Pulse Width

Max Pulse Width

Reference Clock

SpecID

> 1 clock cycle

IP_CLK

A4.22

NOTES:
1) The frequency of the IP_CLK depends on the register settings in Clock Distribution Module. See the MPC5200B User
Manual [1] for further information.
2) If the same interrupt occurs a second time while its interrupt service routine has not cleared the former one, the second
interrupt will not be recognized at all.

Besides synchronization, prioritization, and mapping the latency of an external interrupt to the start of its
associated interrupt service routine also depends on the following conditions: To get a minimum interrupt
service response time, it is recommended to enable the instruction cache and set up the maximum core
clock, XL bus, and IP bus frequencies (depending on board design and programming). In addition, it is
advisable to execute an interrupt handler, which has been implemented in assembly code.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

19

Electrical and Thermal Characteristics

3.3.5

SDRAM

3.3.5.1

Memory Interface Timing-Standard SDRAM Read Command


Table 18. Standard SDRAM Memory Read Timing

Sym

Description

Min

Max

Units

SpecID

MEM_CLK period

7.5

ns

A5.1

tvalid

Control Signals, Address and MBA Valid after


rising edge of MEM_CLK

tmem_clk*0.5+0.4

ns

A5.2

thold

Control Signals, Address and MBA Hold after


rising edge of MEM_CLK

tmem_clk*0.5

ns

A5.3

tmem_clk

DMvalid

DQM valid after rising edge of MEM_CLK

tmem_clk*0.25+0.4

ns

A5.4

DMhold

DQM hold after rising edge of MEM_CLK

tmem_clk*0.25-0.7

ns

A5.5

0.3

ns

A5.6

0.2

ns

A5.7

datasetup MDQ setup to rising edge of MEM_CLK


datahold

MDQ hold after rising edge of MEM_CLK

MEM_CLK
tvalid
thold

Active

Control Signals

NOP

READ

DMvalid

NOP

NOP

NOP

NOP

NOP

DMhold

DQM (Data Mask)


datasetup

datahold

MDQ (Data)
tvalid

thold

Row

MA (Address)
tvalid

Column
thold

MBA (Bank Selects)


NOTE: Control Signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN

Figure 5. Timing DiagramStandard SDRAM Memory Read Timing

3.3.5.2

Memory Interface Timing-Standard SDRAM Write Command

In Standard SDRAM, all signals are activated on the MEM_CLK from the Memory Controller and
captured on the MEM_CLK clock at the memory device.

MPC5200B Data Sheet, Rev. 1


20

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 19. Standard SDRAM Write Timing


Sym

Min

Max

Units

SpecID

MEM_CLK period

7.5

ns

A5.8

tvalid

Control Signals, Address and MBA Valid


after rising edge of MEM_CLK

tmem_clk*0.5+0.4

ns

A5.9

thold

Control Signals, Address and MBA Hold after


rising edge of MEM_CLK

tmem_clk*0.5

ns

A5.10

tmem_clk*0.25+0.4

ns

A5.11

tmem_clk*0.25-0.7

ns

A5.12

tmem_clk

Description

DMvalid

DQM valid after rising edge of MEM_CLK

DMhold

DQM hold after rising edge of Mem_clk

datavalid

MDQ valid after rising edge of MEM_CLK

tmem_clk*0.75+0.4

ns

A5.13

datahold

MDQ hold after rising edge of MEM_CLK

tmem_clk*0.75-0.7

ns

A5.14

MEM_CLK
tvalid
thold

Active

Control Signals

NOP

WRITE

NOP

NOP

NOP

NOP

NOP

DMhold

DMvalid

DQM (Data Mask)


datavalid

datahold

MDQ (Data)
tvalid

thold

Row

MA (Address)
tvalid

Column

thold

MBA (Bank Selects)


NOTE: Control Signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN

Figure 6. Timing DiagramStandard SDRAM Memory Write Timing

3.3.5.3

Memory Interface Timing-DDR SDRAM Read Command

The SDRAM Memory Controller uses a 1/4 period delayed MDQS strobe to capture the MDQ data. The
1/4 period delay value is calculated automatically by hardware.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

21

Electrical and Thermal Characteristics

Table 20. DDR SDRAM Memory Read Timing


Sym

Min

Max

Units

SpecID

MEM_CLK period

7.5

ns

A5.15

tvalid

Control Signals, Address and MBA


valid after rising edge of MEM_CLK

tmem_clk*0.5+0.4

ns

A5.16

thold

Control Signals, Address and MBA


hold after rising edge of MEM_CLK

tmem_clk*0.5

ns

A5.17

0.4

ns

A5.18

ns

A5.19

tmem_clk

Description

datasetup

Setup time relative to MDQS

datahold

Hold time relative to MDQS

MPC5200B Data Sheet, Rev. 1


22

Freescale Semiconductor

Electrical and Thermal Characteristics

MEM_CLK

MEM_CLK
tvalid

thold

Active

Control Signals

NOP

READ

NOP

NOP

NOP

NOP

NOP

MDQS (Data Strobe)


tdata_valid_min
tdata_valid_max

MDQ (Data)

Sample
position
A

tdata_sample_min
tdata_sample_max

Read Data
Sample Window

MDQS (Data Strobe)


tdata_valid_min
tdata_valid_max

MDQ (Data)
0.5 * tMEM_CLK

tdata_sample_min
tdata_sample_max

Sample
position
B

Read Data
Sample Window

tvalid

MA (Address)

thold

Row
tvalid

Column
thold

MBA (Bank Selects)

Sample position A: data are sampled on the expected edge of MEM_CLK, the MDQS signal indicate the valid data
Sample position B: data are sampled on a later edge of MEM_CLK, SDRAM controller is waiting for the vaild MDQS signal
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN

Figure 7. Timing DiagramDDR SDRAM Memory Read Timing

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

23

Electrical and Thermal Characteristics

3.3.5.4

Memory Interface Timing-DDR SDRAM Write Command


Table 21. DDR SDRAM Memory Write Timing

Sym

Description

tmem_clk
tDQSS

Min

Max

Units

SpecID

MEM_CLK period

7.5

ns

A5.20

Delay from write command to first


rising edge of MDQS

tmem_clk+0.4

ns

A5.21

ns

A5.22

ns

A5.23

datavalid

MDQ valid before rising edge of


MDQS

datahold

MDQ valid after rising edge of


MDQS

TBD
TBD

MEM_CLK

MEM_CLK

Control Signals

Write

Write

Write

Write

MDQS (Data Strobe)


tDQSS

MDQ (Data)

NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN

Figure 8. DDR SDRAM Memory Write Timing

3.3.6

PCI

The PCI interface on the MPC5200B is designed to PCI Version 2.2 and supports 33-MHz and 66-MHz
PCI operations. See the PCI Local Bus Specification [4]; the component section specifies the electrical and
timing parameters for PCI components with the intent that components connect directly together whether
on the planar or an expansion board, without any external buffers or other glue logic. Parameters apply
at the package pins, not at expansion board edge connectors.
The MPC5200B is always the source of the PCI CLK. The clock waveform must be delivered to each
33-MHz or 66-MHz PCI component in the system. Figure 9 shows the clock waveform and required
measurement points for 3.3 V signaling environments. Table 22 summarizes the clock specifications.

MPC5200B Data Sheet, Rev. 1


24

Freescale Semiconductor

Electrical and Thermal Characteristics

t cyc
t high
0.6Vcc

0.5Vcc
0.4Vcc
PCI CLK
0.3Vcc

t low
0.4Vcc, p-to-p
(minimum)

0.2Vcc
Figure 9. PCI CLK Waveform

Table 22. PCI CLK Specifications


66 MHz
Sym

33 MHz

Description

Units

Notes

SpecID

30

ns

(1),(3)

A6.1

Min

Max

Min

30

Max

tcyc

PCI CLK Cycle Time

15

thigh

PCI CLK High Time

11

ns

t low

PCI CLK Low Time

11

ns

PCI CLK Slew Rate

1.5

V/ns

A6.2
A6.3
(2)

A6.4

NOTES:
1. In general, all 66-MHz PCI components must work with any clock frequency up to 66 MHz. CLK requirements vary
depending upon whether the clock frequency is above 33 MHz.
2. Rise and fall times are specified in terms of the edge rate measured in V/ns. This slew rate must be met across the minimum
peak-to-peak portion of the clock waveform as shown in Figure 9.
3. The minimum clock period must not be violated for any single clock cycle, i.e., accounting for all system jitter.

Table 23. PCI Timing Parameters


66 MHz
Sym

33 MHz

Description

Units

Notes

SpecID

11

ns

(1),(2),(3)

A6.5

12

ns

(1),(2),(3)

A6.6

ns

(1)

A6.7

ns

(1)

A6.8

Min

Max

Min

Max

CLK to Signal Valid Delay - bused


signals

tval(ptp) CLK to Signal Valid Delay - point


to point

tval

t on

Float to Active Delay

t off

Active to Float Delay

t su

Input Setup Time to CLK - bused


signals

t su(ptp) Input Setup Time to CLK - point


to point
th

Input Hold Time from CLK

2
14

28

ns

(3),(4)

A6.9

10,12

ns

(3),(4)

A6.10

ns

(4)

A6.11

NOTES:
1. See the timing measurement conditions in the PCI Local Bus Specification [4]. It is important that all driven signal transitions
drive to their Voh or Vol level within one Tcyc.
2. Minimum times are measured at the package pin with the load circuit, and maximum times are measured with the load circuit
as shown in the PCI Local Bus Specification [4].

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

25

Electrical and Thermal Characteristics


3. REQ# and GNT# are point-to-point signals and have different input setup times than do bused signals. GNT# and REQ#
have a setup of 5 ns at 66 MHz. All other signals are bused.
4. See the timing measurement conditions in the PCI Local Bus Specification [4].

For Measurement and Test Conditions, see the PCI Local Bus Specification [4].

3.3.7

Local Plus Bus

The Local Plus Bus is the external bus interface of the MPC5200B. A maximum of eight configurable chip
selects (CS) are provided. There are two main modes of operation: non-MUXed (Legacy and Burst) and
MUXED. The reference clock is the PCI CLK. The maximum bus frequency is 66 MHz.
Definition of Acronyms and Terms:
WS = Wait State
DC = Dead Cycle
LB = Long Burst
DS = Data Size in Bytes
tPCIck = PCI clock period
tIPBIck = IPBI clock period
tPCIck

PCI CLK
tIPBIck

IPBI CLK
Figure 10. Timing DiagramIPBI and PCI clock (example ratio: 4:1)

3.3.7.1

Non-MUXed Mode
Table 24. Non-MUXed Mode Timing

Sym

Description

Min

Max

Units

t CSA

PCI CLK to CS assertion

4.6

10.6

ns

t CSN

PCI CLK to CS negation

2.9

7.0

ns

t1

CS pulse width

t2

Notes SpecID
A7.1
A7.2
(1)

(2+WS)*tPCIck

(2+WS)*tPCIck

ns

A7.3

ADDR valid before CS assertion

tIPBIck

tPCIck

ns

t3

ADDR hold after CS negation

tIPBIck

ns

t4

OE assertion before CS assertion

4.8

ns

A7.6

t5

OE negation before CS negation

2.7

ns

A7.7

t6

RW valid before CS assertion

tPCIck

ns

A7.8

t7

RW hold after CS negation

tIPBIck

ns

A7.9

t8

DATA output valid before CS assertion

tIPBIck

ns

A7.10

t9

DATA output hold after CS negation

tIPBIck

ns

A7.11

t10

DATA input setup before CS negation

8.5

ns

A7.12

A7.4
(2)

A7.5

MPC5200B Data Sheet, Rev. 1


26

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 24. Non-MUXed Mode Timing (continued)


Sym
t11
t12

Description
DATA input hold after CS negation
ACK assertion after CS assertion

Min

Max

Units

(DC+1)*tPCIck

ns

(6)

A7.13

ns

(3)

A7.14
A7.15

tPCIck

Notes SpecID

t13

ACK negation after CS negation

tPCIck

ns

(3)

t14

TS assertion before CS assertion

6.9

ns

(4)

A7.16

ns

(4)

A7.17

ns

(5)

A7.18
A7.19

t15
t16

TS pulse width
TSIZ valid before CS assertion

t17

TSIZ hold after CS negation

t18

ACK change before PCI clock

t19

ACK change after PCI clock

tPCIck
tIPBIck

tPCIck
-

tIPBIck

ns

(5)

2.0

ns

(1)

A7.20

ns

(1)

A7.21

4.4

NOTES:
1. ACK can shorten the CS pulse width.
Wait States (WS) can be programmed in the Chip Select X Register, Bit field WaitP and WaitX. It can be specified from 0 65535.
2. In Large Flash and MOST Graphics mode the shared PCI/ATA pins, used as address lines, are released at the same moment
as the CS. This can cause the address to change before CS is deasserted.
3. ACK is input and can be used to shorten the CS pulse width.
4. Only available in Large Flash and MOST Graphics mode.
5. Only available in MOST Graphics mode.
6. Deadcycles are only used, if no arbitration to an other module (ATA or PCI) of the shared local bus happens. If arbitration
happens the bus can be driven within 4 IPB clocks by an other modules.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

27

Electrical and Thermal Characteristics

PCI CLK
t1

CS[x]

t2

t3

ADDR
t5

t4

OE
t6

t7

R/W
t8

t9

DATA (wr)
t10

t11

DATA (rd)
t19
t12

ACK
t14

t13
t18

t15

TS

t17

TSIZ[1:2]
t16

Figure 11. Timing DiagramNon-MUXed Mode

3.3.7.2

Burst Mode
Table 25. Burst Mode Timing

Sym

Description

t CSA

PCI CLK to CS assertion

t CSN

PCI CLK to CS negation

t1

CS pulse width

Min

Max

Units Notes SpecID

4.6

10.6

ns
ns

A7.22

2.9

7.0

(1+WS+4LB*2*(32/DS))*

(1+WS+4LB*2*(32/DS))

tPCIck

*tPCIck

tIPBIck

tPCIck

ns

A7.25

-0.7

ns

A7.26

ns

A7.23
(1),(2)

A7.24

t2

ADDR valid before CS assertion

t3

ADDR hold after CS negation

t4

OE assertion before CS assertion

4.8

ns

A7.27

t5

OE negation before CS negation

2.7

ns

A7.28

t6

RW valid before CS assertion

tPCIck

ns

A7.29

t7

RW hold after CS negation

tPCIck

ns

A7.30

MPC5200B Data Sheet, Rev. 1


28

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 25. Burst Mode Timing (continued)


Sym

Description

Min

Max

Units Notes SpecID

t8

DATA setup before rising edge of


PCI clock

3.6

ns

A7.31

t9

DATA hold after rising edge of PCI


clock

ns

A7.32

t10

DATA hold after CS negation

(DC+1)*tPCIck

ns

t11

ACK assertion after CS assertion

(WS+1)*tPCIck

ns

t12

ACK negation before CS negation

t13

ACK pulse width

t14

CS assertion after TS assertion

t15

TS pulse width

(4)

A7.33
A7.34

7.0

ns

(3)

4LB*2*(32/DS)*tPCIck

4LB*2*(32/DS)*tPCIck

ns

(2),(3)

2.5

ns

A7.37

tPCIck

tPCIck

ns

A7.38

A7.35
A7.36

NOTES:
1. Wait States (WS) can be programmed in the Chip Select X Register, Bit field WaitP and WaitX. It can be specified from 0 65535.
2. Example:
Long Burst is used, this means the CS related BERx and SLB bits of the Chip Select Burst Control Register are set and a
burst on the internal XLB is executed. => LB = 1
Data bus width is 8 bit. => DS = 8
=> 41*2*(32/8) = 32 => ACK is asserted for 32 PCI cycles to transfer one cache line.
Wait State is set to 10. => WS = 10
1+10+32 = 43 => CS is asserted for 43 PCI cycles.
3. ACK is output and indicates the burst.
4. Deadcycles are only used, if no arbitration to an other module (ATA or PCI) of the shared local bus happens. If arbitration
happens the bus can be driven within 4 IPB clocks by an other modules.

PCI CLK
CS[x]

t1
t3

t2

ADDR
t5

t4

OE
t6

t7

R/W

t8

t10

DATA (rd)
t9
t11

t12

ACK
t14

t15

t13

TS

Figure 12. Timing DiagramBurst Mode

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

29

Electrical and Thermal Characteristics

3.3.7.3

MUXed Mode
Table 26. MUXed Mode Timing
Sym

Description

Min

Max

Units

t CSA

PCI CLK to CS assertion

4.6

10.6

ns

A7.39

t CSN

PCI CLK to CS negation

2.9

7.0

ns

A7.40

tALEA

PCI CLK to ALE assertion

3.6

ns

A7.41

t1

ALE assertion before Address, Bank,


TSIZ assertion

5.7

ns

A7.42

t2

CS assertion before Address, Bank,


TSIZ negation

-1.2

ns

A7.43

t3

CS assertion before Data wr valid

-1.2

ns

A7.44

t4

Data wr hold after CS negation

tIPBIck

ns

A7.45

t5

Data rd setup before CS negation

8.5

ns

A7.46

t6

Data rd hold after CS negation

(DC+1)*tPCIck

ns

t7

ALE pulse width

tPCIck

ns

A7.48

CS assertion after TS assertion

6.9

ns

A7.49

t8

TS pulse width

tPCIck

ns

A7.50

t9

CS pulse width

(2+WS)*tPCIck

(2+WS)*tPCIck

ns

A7.51

tTSA

Notes

(1),(3)

SpecID

A7.47

tOEA

OE assertion before CS assertion

4.7

ns

A7.52

tOEN

OE negation before CS negation

5.9

ns

A7.53

tIPBIck

ns

A7.54

tPCIck

ns

t10

RW assertion before ALE assertion

t11

RW negation after CS negation

t12

ACK assertion after CS assertion

tIPBIck

A7.55

ns

(2)

A7.56

(2)

A7.57

t13

ACK negation after CS negation

tPCIck

ns

t14

ALE negation to CS assertion

tPCIck

ns

t15

ACK change before PCI clock

2.0

ns

(2)

A7.59

ns

(2)

A7.60

t16

ACK change after PCI clock

4.4

A7.58

NOTES:S
1. ACK can shorten the CS pulse width.
Wait States (WS) can be programmed in the Chip Select X Register, Bit field WaitP and WaitX. It can be specified from 0 65535.
2. ACK is input and can be used to shorten the CS pulse width.
3. Deadcycles are only used, if no arbitration to an other module (ATA or PCI) of the shared local bus happens. If arbitration
happens the bus can be driven within 4 IPB clocks by an other modules.

MPC5200B Data Sheet, Rev. 1


30

Freescale Semiconductor

Electrical and Thermal Characteristics

PCI CLK
t2

t1

t4

AD[31,27] (wr)

Data

AD[30:28] (wr)

TSIZ[0:2] bits

Data

AD[26:25] (wr)

Bank[0:1] bits

Data

AD[24:0] (wr)

Address[7:31]

Data
t3

t5

AD[31:0] (rd)

t6

Data
t7

t14

ALE
Address latch

t8

TS
t9

CSx
OE
t10

t11

R/W
t16
t12

ACK

t15

Address tenure

t13

Data tenure

Figure 13. Timing DiagramMUXed Mode

3.3.8

ATA

The MPC5200B ATA Controller is completely software programmable. It can be programmed to operate
with ATA protocols using their respective timing, as described in the ANSI ATA-4 specification. The ATA
interface is completely asynchronous in nature. Signal relationships are based on specific fixed timing in
terms of timing units (nanoseconds).
ATA data setup and hold times, with respect to Read/Write strobes, are software programmable inside the
ATA Controller. Data setup and hold times are implemented using counters. The counters count the
number of ATA clock cycles needed to meet the ANSI ATA-4 timing specifications. For details, see the
ANSI ATA-4 specification [5] and how to program an ATA Controller and ATA drive for different ATA
protocols and their respective timing. See the MPC5200B User Manual [1].
The MPC5200B ATA Host Controller design makes data available coincidentally with the active edge of
the WRITE strobe in PIO and Multiword DMA modes.
MPC5200B Data Sheet, Rev. 1
Freescale Semiconductor

31

Electrical and Thermal Characteristics

Write data is latched by the drive at the inactive edge of the WRITE strobe. This gives ample
setup-time beyond that required by the ATA-4 specification.
Data is held unchanged until the next active edge of the WRITE strobe. This gives ample
hold-time beyond that required by the ATA-4 specification.

All ATA transfers are programmed in terms of system clock cycles (IP bus clocks) in the ATA Host
Controller timing registers. This puts constraints on the ATA protocols and their respective timing modes
in which the ATA Controller can communicate with the drive.
Faster ATA modes (i.e., UDMA 0, 1, 2) are supported when the system is running at a sufficient frequency
to provide adequate data transfer rates. Adequate data transfer rates are a function of the following:
The MPC5200B operating frequency (IP bus clock frequency)
Internal MPC5200B bus latencies
Other system load dependent variables
The ATA clock is the same frequency as the IP bus clock in MPC5200B. See the MPC5200B User Manual
[1].
NOTE
All output timing numbers are specified for nominal 50 pF loads.
Table 27. PIO Mode Timing Specifications
Sym

PIO Timing Parameter

Min/Max
(ns)

Mode 0
(ns)

Mode 1
(ns)

Mode 2
(ns)

Mode 3
(ns)

Mode 4
(ns)

SpecID

t0

Cycle Time

min

600

383

240

180

120

A8.1

t1

Address valid to DIOR/DIOW setup

min

70

50

30

30

25

A8.2

t2

DIOR/DIOW pulse width 16-bit


8-bit

min
min

165
290

125
290

100
290

80
80

70
70

A8.3

t2i

DIOR/DIOW recovery time

min

70

25

A8.4

t3

DIOW data setup

min

60

45

30

30

20

A8.5

t4

DIOW data hold

min

30

20

15

10

10

A8.6

t5

DIOR data setup

min

50

35

20

20

20

A8.7

t6

DIOR data hold

min

A8.8

t9

DIOR/DIOW to address
valid hold

min

20

15

10

10

10

A8.9

tA

IORDY setup

max

35

35

35

35

35

A8.10

tB

IORDY pulse width

max

1250

1250

1250

1250

1250

A8.11

MPC5200B Data Sheet, Rev. 1


32

Freescale Semiconductor

Electrical and Thermal Characteristics

CS[0]/CS[3]/DA[2:0]
t2

t9

t1

DIOR/DIOW

t0

t3

t4

WDATA
t5

t6

RDATA

tA

tB

IORDY

Figure 14. PIO Mode Timing


Table 28. Multiword DMA Timing Specifications
Sym

Multiword DMA Timing Parameters

Min/Max

Mode 0(ns)

Mode 1(ns)

Mode 2(ns)

SpecID

t0

Cycle Time

min

480

150

120

A8.12

tC

DMACK to DMARQ delay

max

A8.13

tD

DIOR/DIOW pulse width (16-bit)

min

215

80

70

A8.14

tE

DIOR data access

max

150

60

50

A8.15

tG

DIOR/DIOW data setup

min

100

30

20

A8.16

tF

DIOR data hold

min

A8.17

tH

DIOW data hold

min

20

15

10

A8.18

tI

DMACK to DIOR/DIOW setup

min

A8.19

tJ

DIOR/DIOW to DMACK hold

min

20

A8.20

tKr

DIOR negated pulse width

min

50

50

25

A8.21

tKw

DIOW negated pulse width

min

215

50

25

A8.22

tLr

DIOR to DMARQ delay

max

120

40

35

A8.23

tLw

DIOW to DMARQ delay

max

40

40

35

A8.24

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

33

Electrical and Thermal Characteristics

t0
DMARQ
(Drive)

tL
tC

DMACK
(Host)
tI

tD

tJ

tK

DIOR
DIOW
(Host)
tE
RDATA
(Drive)
tF
WDATA
(Host)
tG

tH

Figure 15. Multiword DMA Timing

NOTE
The direction of signal assertion is towards the top of the page, and the
direction of negation is towards the bottom of the page, irrespective of the
electrical properties of the signal.
Table 29. Ultra DMA Timing Specification

Sym

MODE 0
(ns)

MODE 1
(ns)

MODE 2
(ns)

Comment

SpecID

Min

Max

Min

Max

Min

Max

t CYC

114

75

55

Cycle time allowing for asymmetry and clock


variations from STROBE edge to STROBE edge

A8.26

t 2CYC

235

156

117

Two-cycle time allowing for clock variations, from


rising edge to next rising edge or from falling edge to
next falling edge of STROBE.

A8.27

t DS

15

10

Data setup time at recipient.

A8.28

t DH

Data hold time at recipient.

A8.29

t DVS

70

48

34

Data valid setup time at sender, to STROBE edge.

A8.30

t DVH

Data valid hold time at sender, from STROBE edge.

A8.31

t FS

230

200

170

First STROBE time for drive to first negate DSTROBE


from STOP during a data-in burst.

A8.32

t LI

150

150

150

Limited Interlock time.

A8.33

t MLI

20

20

20

Interlock time with minimum.

A8.34

MPC5200B Data Sheet, Rev. 1


34

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 29. Ultra DMA Timing Specification (continued)

Sym

MODE 0
(ns)

MODE 1
(ns)

MODE 2
(ns)

Comment

SpecID

Min

Max

Min

Max

Min

Max

t UI

Unlimited interlock time.

A8.35

t AZ

10

10

10

Maximum time allowed for output drivers to release


from being asserted or negated

A8.36

t ZAH

20

20

20

A8.37

t ZAD

Minimum delay time required for output drivers to


assert or negate from released state

t ENV

20

70

20

70

20

70

Envelope timefrom DMACK to STOP and


HDMARDY during data out burst initiation.

A8.39

t SR

50

30

20

STROBE to DMARDY time, if DMARDY is negated


before this long after STROBE edge, the recipient
receives no more than one additional data word.

A8.40

t RFS

75

60

50

Ready-to-Final STROBE timeno STROBE edges


are sent this long after negation of DMARDY.

A8.41

t RP

160

125

100

Ready-to-Pause timethe time recipient waits to


initiate pause after negating DMARDY.

A8.42

t IORDYZ

20

20

20

Pull-up time before allowing IORDY to be released.

A8.43

t ZIORDY

Minimum time drive waits before driving IORDY

A8.44

t ACK

20

20

20

Setup and hold times for DMACK, before assertion or


negation.

A8.45

t SS

50

50

50

Time from STROBE edge to negation of DMARQ or


assertion of STOP, when sender terminates a burst.

A8.46

A8.38

NOTES:
1 t UI, t MLI, t LI indicate sender-to-recipient or recipient-to-sender interlocks. That is, one agent (either sender or recipient) is
waiting for the other agent to respond with a signal before proceeding.
t UI is an unlimited interlock that has no maximum time value.
t MLI is a limited time-out that has a defined minimum.
t LI is a limited time-out that has a defined maximum.
2 All timing parameters are measured at the connector of the drive to which the parameter applies. For example, the sender
shall stop generating STROBE edges t RFS after negation of DMARDY. Both STROBE and DMARDY timing measurements
are taken at the connector of the sender. Even though the sender stops generating STROBE edges, the receiver may receive
additional STROBE edges due to propagation delays. All timing measurement switching points (low to high and high to low)
are taken at 1.5 V.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

35

Electrical and Thermal Characteristics

DMARQ
(device)
t UI
DMACK
(device)
t ACK

t ENV

t FS
t ZAD

STOP
(host)
t ACK

t ENV

t FS

HDMARDY
(host)
t ZAD

t ZIORDY
DSTROBE
(device)

t DVS

t AZ

t DVH

DD(0:15)
t ACK
DA0, DA1, DA2,
CS[0:1]1

Figure 16. Timing DiagramInitiating an Ultra DMA Data In Burst

t 2CYC
t CYC

t CYC
t 2CYC

DSTROBE
at device
tDVH

tDVS

tDVH

tDVS

tDVH

DD(0:15)
at device
DSTROBE
at host
tDH

tDS

tDH

tDS

tDH

DD(0:15)
at host

Figure 17. Timing DiagramSustained Ultra DMA Data In Burst

MPC5200B Data Sheet, Rev. 1


36

Freescale Semiconductor

Electrical and Thermal Characteristics

DMARQ
(device)
DMARQ
(host)

t RP

STOP
(host)
t SR
HDMARDY
(host)
t RFS
DSTROBE
(device)
DD[0:15]
(device)

Figure 18. Timing DiagramHost Pausing an Ultra DMA Data In Burst


DMARQ
(device)
DMACK
(host)
t LI

t MLI

t LI

t ACK

STOP
(host)
tLI

t ACK

HDMARDY
(host)
t SS

t IORDYZ

DSTROBE
(device)
t ZAH

t DVS

t AZ

t DVH
CRC

DD[0:15]

t ACK

DA0,DA1,DA2,
CS[0:1]

Figure 19. Timing DiagramDrive Terminating Ultra DMA Data In Burst

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

37

Electrical and Thermal Characteristics


DMARQ
(device)
t MLI

t LI
DMACK
(host)
t RP

t ZAH

t ACK

STOP
(host)

tACK

t AZ

HDMARDY
(host)
t RFS

t MLI

t LI

DSTROBE
(device)

t IORDYZ
t DVS
t DVH

DD[0:15]

CRC
t ACK

DA0,DA1,DA2,
CS[0:1]

Figure 20. Timing DiagramHost Terminating Ultra DMA Data In Burst


DMARQ
(device)

tUI

DMACK
(host)
tACK

tENV

STOP
(host)
tLI

tZIORDY

tUI

DDMARDY
(host)
tACK
HSTROBE
(device)
tDVS
tDVH
DD[0:15]
(host)
tACK
DA0,DA1,DA2,
CS[0:1]

Figure 21. Timing DiagramInitiating an Ultra DMA Data Out Burst


MPC5200B Data Sheet, Rev. 1
38

Freescale Semiconductor

Electrical and Thermal Characteristics


t 2CYC
t CYC

t CYC
t 2CYC

HSTROBE
(host)
t DVS

t DVH

t DVS

t DVH

t DVH

DD[0:15]
(host)
HSTROBE
(device)
t DH

t DS

t DS

t DH

t DH

DD[0:15]
(device)

Figure 22. Timing DiagramSustained Ultra DMA Data Out Burst


t RP
DMARQ
(device)
DMACK
(host)
STOP
(host)
t SR
DDMARDY
(device)
t RFS
HSTROBE

DD[0:15]
(host)

Figure 23. Timing DiagramDrive Pausing an Ultra DMA Data Out Burst

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

39

Electrical and Thermal Characteristics


DMARQ
(device)
t LI

t MLI

DMACK
(host)
t SS

t ACK

t LI

STOP
(host)
t LI

t IORDYZ

DDMARDY
(device)
tACK
HSTROBE
(host)
t DVS
DD[0:15]
(host)

t DVH
CRC
t ACK

DA0,DA1,DA2,
CS[0:1]

Figure 24. Timing DiagramHost Terminating Ultra DMA Data Out Burst
DMARQ
(device)
DMACK
(host)
t LI

t ACK

t MLI

STOP
(host)
t RP

t IORDYZ

DDMARDY
(device)
t RFS

t LI

t MLI

t ACK

HSTROBE
(host)
t DVS
DD[0:15]
(host)

t DVH
CRC
t ACK

DA0,DA1,DA2,
CS[0:1]

Figure 25. Timing DiagramDrive Terminating Ultra DMA Data Out Burst
MPC5200B Data Sheet, Rev. 1
40

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 30. Timing Specification ata_isolation


Sym

Description

Min

Max

Units

SpecID

ata_isolation setup time

IP Bus cycles

A8.48

ata_isolation hold time

19

IP Bus cycles

A8.49

DIOR

ATA_ISOLATION
1

Figure 26. Timing Diagram-ATA-ISOLATION

3.3.9

Ethernet

AC Test Timing Conditions:


Output Loading
All Outputs: 25 pF
Table 31. MII Rx Signal Timing
Sym

Description

Min

Max

Unit

SpecID

t1

RXD[3:0], RX_DV, RX_ER to RX_CLK setup

10

ns

A9.1

t2

RX_CLK to RXD[3:0], RX_DV, RX_ER hold

10

ns

A9.2

t3
t4

RX_CLK pulse width high


RX_CLK pulse width low

35%
35%

65%
65%

RX_CLK

Period(1)

A9.3

RX_CLK

Period(1)

A9.4

NOTES:
1 RX_CLK shall have a frequency of 25% of data rate of the received signal. See the IEEE 802.3 Specification [6].

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

41

Electrical and Thermal Characteristics

t3

RX_CLK (Input)
t4

RXD[3:0] (inputs)
RX_DV
RX_ER
t1

t2

Figure 27. Ethernet Timing DiagramMII Rx Signal


Table 32. MII Tx Signal Timing
Sym

Description

Min

Max

Unit

SpecID

t5

TX_CLK rising edge to TXD[3:0], TX_EN, TX_ER


invalid

ns

A9.5

t6

TX_CLK rising edge to TXD[3:0], TX_EN, TX_ER valid

25

ns

A9.6

TX_CLK pulse width high

t7

35%

TX_CLK pulse width low

t8

35%

65%
65%

TX_CLK

Period(1)

A9.7

TX_CLK

Period(1)

A9.8

NOTES:
1 The TX_CLK frequency shall be 25% of the nominal transmit frequency, e.g., a PHY operating at 100 Mb/s must
provide a TX_CLK frequency of 25 MHz and a PHY operating at 10 Mb/s must provide a TX_CLK frequency of 2.5
MHz. See the IEEE 802.3 Specification [6].

t7
TX_CLK (Input)
t5

t8

TXD[3:0] (Outputs)
TX_EN
TX_ER
t6

Figure 28. Ethernet Timing DiagramMII Tx Signal


Table 33. MII Async Signal Timing
Sym
t9

Description
CRS, COL minimum pulse width

Min

Max

Unit

SpecID

1.5

TX_CLK Period

A9.9

MPC5200B Data Sheet, Rev. 1


42

Freescale Semiconductor

Electrical and Thermal Characteristics

CRS, COL
t9
Figure 29. Ethernet Timing DiagramMII Async
Table 34. MII Serial Management Channel Signal Timing
Sym

Description

Min

Max

Unit

SpecID

t10

MDC falling edge to MDIO output delay

25

ns

A9.10

t11

MDIO (input) to MDC rising edge setup

10

ns

A9.11

t12

MDIO (input) to MDC rising edge hold

10

ns

A9.12

MDC pulse width

high(1)

160

ns

A9.13

t14

MDC pulse width

low(1)

160

ns

A9.14

t15

MDC period(2)

400

ns

A9.15

t13

NOTES:
1 MDC is generated by MPC5200B with a duty cycle of 50% except when MII_SPEED in the FEC MII_SPEED
control register is changed during operation. See the MPC5200B User Manual [1].
2
The MDC period must be set to a value of less than or equal to 2.5 MHz (to be compliant with the IEEE MII
characteristic) by programming the FEC MII_SPEED control register. See the MPC5200B User Manual [1].

t13
t14

MDC (Output)

t15
t10

MDIO (Output)

MDIO (Input)

t11

t12

Figure 30. Ethernet Timing DiagramMII Serial Management

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

43

Electrical and Thermal Characteristics

3.3.10 USB
Table 35. Timing SpecificationsUSB Output Line
Sym

Description

Min

Max

Units

SpecID

USB Bit width(1)

83.3

667

ns

A10.1

Transceiver enable time

83.3

667

ns

A10.2

Signal falling time

7.9

ns

A10.3

Signal rising time

7.9

ns

A10.4

NOTES:
1
Defined in the USB config register, (12 Mbit/s or 1.5 Mbit/s mode).

NOTE
Output timing is specified at a nominal 50 pF load.
2
USB_OE

USB_TXN
1

1
4

USB_TXP

Figure 31. Timing DiagramUSB Output Line

MPC5200B Data Sheet, Rev. 1


44

Freescale Semiconductor

Electrical and Thermal Characteristics

3.3.11 SPI
Table 36. Timing Specifications SPI Master Mode, Format 0 (CPHA = 0)
Sym
1

Description
Cycle time

Clock high or low time

Slave select to clock delay

Min

Max

Units

SpecID

1024

IP-Bus Cycle(1)

A11.1

(1)

A11.2

512

IP-Bus Cycle

15.0

ns

A11.3

Output Data valid after Slave Select (SS)

20.0

ns

A11.4

Output Data valid after SCK

20.0

ns

A11.5

Input Data setup time

20.0

ns

A11.6

Input Data hold time

20.0

ns

A11.7

Slave disable lag time

15.0

ns

A11.8

Sequential transfer delay

10

Clock falling time

7.9

ns

A11.10

11

Clock rising time

7.9

ns

A11.11

IP-Bus

Cycle(1)

A11.9

NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].

NOTE
Output timing is specified at a nominal 50 pF load.
1
10
SCK
(CLKPOL=0)
Output

2
11

SCK
(CLKPOL=1)
Output

11

10

SS
Output
5

4
MOSI
Output

6
MISO
Input
7

Figure 32. Timing Diagram SPI Master Mode, Format 0 (CPHA = 0)


MPC5200B Data Sheet, Rev. 1
Freescale Semiconductor

45

Electrical and Thermal Characteristics

Table 37. Timing Specifications SPI Slave Mode, Format 0 (CPHA = 0)


Sym

Description

Min

Max

Units

SpecID
(1)

Cycle time

1024

IP-Bus Cycle

A11.12

Clock high or low time

512

IP-Bus Cycle(1)

A11.13

Slave select to clock delay

15.0

ns

A11.14

Output Data valid after Slave Select (SS)

50.0

ns

A11.15

Output Data valid after SCK

50.0

ns

A11.16

Input Data setup time

50.0

ns

A11.17

Input Data hold time

0.0

ns

A11.18

Slave disable lag time

15.0

ns

Sequential Transfer delay

A11.19
(1)

IP-Bus Cycle

A11.20

NOTES:
1
Inter Peripheral Clock is defined in the MPC5200B User Manual [1].

NOTE
Output timing is specified at a nominal 50 pF load.
1

SCK
(CLKPOL=0)
Input

SCK
(CLKPOL=1)
Input

SS
Input
6

MOSI
Input
4

MISO
Output
Figure 33. Timing Diagram SPI Slave Mode, Format 0 (CPHA = 0)

MPC5200B Data Sheet, Rev. 1


46

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 38. Timing Specifications SPI Master Mode, Format 1 (CPHA = 1)


Sym

Description

Min

Max

Units

SpecID
(1)

A11.21

Cycle time

1024

IP-Bus Cycle

Clock high or low time

512

IP-Bus Cycle(1) A11.22

Slave select to clock delay

15.0

ns

A11.23

Output data valid

20.0

ns

A11.24

Input Data setup time

20.0

ns

A11.25

Input Data hold time

20.0

ns

A11.26

Slave disable lag time

15.0

ns

A11.27
(1)

IP-Bus Cycle

A11.28

Sequential Transfer delay

Clock falling time

7.9

ns

A11.29

10

Clock rising time

7.9

ns

A11.30

NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].

NOTE
Output timing is specified at a nominal 50 pF load.
1
9
SCK
(CLKPOL=0)
Output

2
10

SCK
(CLKPOL=1)
Output

10

SS
Output

4
MOSI
Output
5
MISO
Input
6
Figure 34. Timing Diagram SPI Master Mode, Format 1 (CPHA = 1)

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

47

Electrical and Thermal Characteristics

Table 39. Timing Specifications SPI Slave Mode, Format 1 (CPHA = 1)


Sym

Description

Min

Max

Units

SpecID
(1)

Cycle time

1024

IP-Bus Cycle

A11.31

Clock high or low time

512

IP-Bus Cycle(1)

A11.32

Slave select to clock delay

15.0

ns

A11.33

Output data valid

50.0

ns

A11.34

Input Data setup time

50.0

ns

A11.35

Input Data hold time

0.0

ns

A11.36

Slave disable lag time

15.0

ns

Sequential Transfer delay

A11.37
(1)

IP-Bus Cycle

A11.38

NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].

NOTE
Output timing is specified at a nominal 50 pF load.
1

SCK
(CLKPOL=0)
Input

SCK
(CLKPOL=1)
Input

SS
Input

MOSI
Input
4
MISO
Output
Figure 35. Timing Diagram SPI Slave Mode, Format 1 (CPHA = 1)

3.3.12 MSCAN
The CAN functions are available as RX and TX pins at normal IO pads (I2C1+GPTimer or PSC2). There
is no filter for the WakeUp dominant pulse. Any High-to-Low edge can cause WakeUp, if configured.

MPC5200B Data Sheet, Rev. 1


48

Freescale Semiconductor

Electrical and Thermal Characteristics

3.3.13 I2C
Table 40. I2C Input Timing SpecificationsSCL and SDA
Sym
1

Description
Start condition hold time

Min

Max

Units

SpecID

IP-Bus Cycle(1)

A13.1

Cycle(1)

A13.2

Clock low time

IP-Bus

Data hold time

0.0

ns

A13.3

Clock high time

IP-Bus Cycle(1)

A13.4

Data setup time

0.0

ns

A13.5
(1)

Start condition setup time (for repeated start condition


only)

IP-Bus Cycle

A13.6

Stop condition setup time

IP-Bus Cycle(1)

A13.7

NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].

Table 41. I2C Output Timing SpecificationsSCL and SDA


Sym

Description

Min

Max

Units

SpecID

1 (1)

Start condition hold time

IP-Bus Cycle(3)

A13.8

2(1)

Clock low time

10

IP-Bus Cycle(3)

A13.9

3(2)

SCL/SDA rise time

7.9

ns

A13.10

4(1)

Data hold time

5(1)

SCL/SDA fall time

7.9

6(1)

Clock high time

10

IP-Bus Cycle(3) A13.13

7(1)

Data setup time

IP-Bus Cycle(3) A13.14

8(1)

Start condition setup time (for repeated start condition


only)

20

IP-Bus Cycle(3) A13.15

9(1)

Stop condition setup time

10

IP-Bus Cycle(3) A13.16

IP-Bus

Cycle(3)

ns

A13.11
A13.12

NOTES:
1 Programming IFDR with the maximum frequency (IFDR=0x20) results in the minimum output timings listed. The
I2C interface is designed to scale the data transition time, moving it to the middle of the SCL low period. The actual
position is affected by the prescale and division values programmed in IFDR.
2
Because SCL and SDA are open-drain-type outputs, which the processor can only actively drive low, the time SCL
or SDA takes to reach a high level depends on external signal capacitance and pull-up resistor values
3 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].

NOTE
Output timing is specified at a nominal 50 pF load.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

49

Electrical and Thermal Characteristics

SCL
1

SDA
Figure 36. Timing DiagramI2C Input/Output

3.3.14 J1850
See the MPC5200B User Manual [1].

3.3.15 PSC
3.3.15.1 Codec Mode (8,16,24 and 32-bit) / I2S Mode
Table 42. Timing Specifications8,16, 24, and 32-bit CODEC / I2S Master Mode
Sym

Description

Min

Typ

Max

Units

SpecID

40.0

ns

A15.1

Bit Clock cycle time, programmed in CCS register

Clock duty cycle

50

%(1)

A15.2

Bit Clock fall time

7.9

ns

A15.3

Bit Clock rise time

7.9

ns

A15.4

FrameSync valid after clock edge

8.4

ns

A15.5

FrameSync invalid after clock edge

8.4

ns

A15.6

Output Data valid after clock edge

9.3

ns

A15.7

Input Data setup time

6.0

ns

A15.8

NOTES:
1 Bit Clock cycle time

NOTE
Output timing is specified at a nominal 50 pF load.

MPC5200B Data Sheet, Rev. 1


50

Freescale Semiconductor

Electrical and Thermal Characteristics

BitClk
(CLKPOL=0)
Output

3
2

BitClk
(CLKPOL=1)
Output

4
5

FrameSync
(SyncPol = 1)
Output
FrameSync
(SyncPol = 0)
Output

7
TxD
Output
8
RxD
Input
Figure 37. Timing Diagram 8,16, 24, and 32-bit CODEC / I2S Master Mode
Table 43. Timing Specifications 8,16, 24, and 32-bit CODEC / I2S Slave Mode
Sym
1

Description
Bit Clock cycle time

Min

Typ

Max

Units

SpecID

40.0

ns

A15.9
A15.10

Clock duty cycle

50

%(1)

FrameSync setup time

1.0

ns

A15.11

Output Data valid after clock edge

14.0

ns

A15.12

Input Data setup time

1.0

ns

A15.13

Input Data hold time

1.0

ns

A15.14

NOTES:
1
Bit Clock cycle time

NOTE
Output timing is specified at a nominal 50 pF load.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

51

Electrical and Thermal Characteristics

BitClk
(CLKPOL=0)
Input

BitClk
(CLKPOL=1)
Input
3
FrameSync
(SyncPol = 1)
Input
FrameSync
(SyncPol = 0)
Input
4
TxD
Output
5
RxD
Input
6
Figure 38. Timing Diagram 8,16, 24, and 32-bit CODEC / I2S Slave Mode

3.3.15.2 AC97 Mode


Table 44. Timing Specifications AC97 Mode
Sym

Description

Min

Typ

Max

Units

SpecID

Bit Clock cycle time

81.4

ns

A15.15

Clock pulse high time

40.7

ns

A15.16

Clock pulse low time

40.7

ns

A15.17

FrameSync valid after rising clock edge

13.0

ns

A15.18

Output Data valid after rising clock edge

14.0

ns

A15.19

Input Data setup time

1.0

ns

A15.20

Input Data hold time

1.0

ns

A15.21

NOTE
Output timing is specified at a nominal 50 pF load.

MPC5200B Data Sheet, Rev. 1


52

Freescale Semiconductor

Electrical and Thermal Characteristics

BitClk
(CLKPOL=0)
Input

FrameSync
(SyncPol = 1)
Output

Sdata_out
Output
6

Sdata_in
Input

Figure 39. Timing Diagram AC97 Mode

3.3.15.3 IrDA Mode


Table 45. Timing Specifications IrDA Transmit Line
Sym

Description

Min

Max

Units

SpecID

Pulse high time, defined in the IrDA protocol definition

0.125

10000

A15.22

Pulse low time, defined in the IrDA protocol definition

0.125

10000

A15.23

Transmitter rising time

7.9

ns

A15.24

Transmitter falling time

7.9

ns

A15.25

NOTE
Output timing is specified at a nominal 50 pF load.
3
IrDA_TX
(SIR / FIR / MIR)

4
1

Figure 40. Timing Diagram IrDA Transmit Line

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

53

Electrical and Thermal Characteristics

3.3.15.4 SPI Mode


Table 46. Timing Specifications SPI Master Mode, Format 0 (CPHA = 0)
Sym

Description

Min

Max

Units

SpecID

SCK cycle time, programable in the PSC CCS register

30.0

ns

A15.26

SCK pulse width, 50% SCK duty cycle

15.0

ns

A15.27

Slave select clock delay, programable in the PSC CCS register

30.0

ns

A15.28

Output Data valid after Slave Select (SS)

8.9

ns

A15.29

Output Data valid after SCK

8.9

ns

A15.30

Input Data setup time

6.0

ns

A15.31

Input Data hold time

1.0

ns

A15.32

Slave disable lag time

8.9

ns

A15.33

Sequential Transfer delay, programable in the PSC CTUR / CTLR


register

15.0

ns

A15.34

10

Clock falling time

7.9

ns

A15.35

11

Clock rising time

7.9

ns

A15.36

NOTE
Output timing is specified at a nominal 50 pF load.
1
10
SCK
(CLKPOL=0)
Output

2
11

SCK
(CLKPOL=1)
Output

11

10

SS
Output
5

4
MOSI
Output

6
MISO
Input
7

Figure 41. Timing Diagram SPI Master Mode, Format 0 (CPHA = 0)

MPC5200B Data Sheet, Rev. 1


54

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 47. Timing Specifications SPI Slave Mode, Format 0 (CPHA = 0)


Sym

Description

Min

Max

Units

SpecID

SCK cycle time, programable in the PSC CCS register

30.0

ns

A15.37

SCK pulse width, 50% SCK duty cycle

15.0

ns

A15.38

Slave select clock delay

1.0

ns

A15.39

Input Data setup time

1.0

ns

A15.40

Input Data hold time

1.0

ns

A15.41

Output data valid after SS

14.0

ns

A15.42

Output data valid after SCK

14.0

ns

A15.43

Slave disable lag time

0.0

ns

A15.44

Minimum Sequential Transfer delay = 2 * IP Bus clock cycle time

30.0

A15.45

NOTE
Output timing is specified at a nominal 50 pF load.
1

SCK
(CLKPOL=0)
Input

SCK
(CLKPOL=1)
Input

SS
Input
5

4
MOSI
Input
6

MISO
Output

Figure 42. Timing Diagram SPI Slave Mode, Format 0 (CPHA = 0)

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

55

Electrical and Thermal Characteristics

Table 48. Timing Specifications SPI Master Mode, Format 1 (CPHA = 1)


Sym

Description

Min

Max

Units

SpecID

SCK cycle time, programable in the PSC CCS register

30.0

ns

A15.46

SCK pulse width, 50% SCK duty cycle

15.0

ns

A15.47

Slave select clock delay, programable in the PSC CCS register

30.0

ns

A15.48

Output data valid

8.9

ns

A15.49

Input Data setup time

6.0

ns

A15.50

Input Data hold time

1.0

ns

A15.51

Slave disable lag time

8.9

ns

A15.52

Sequential Transfer delay, programable in the PSC CTUR / CTLR


register

15.0

ns

A15.53

Clock falling time

7.9

ns

A15.54

10

Clock rising time

7.9

ns

A15.55

NOTE
Output timing is specified at a nominal 50 pF load.
1
9
SCK
(CLKPOL=0)
Output

2
10

SCK
(CLKPOL=1)
Output

10

SS
Output

4
MOSI
Output
5
MISO
Input
6

Figure 43. Timing Diagram SPI Master Mode, Format 1 (CPHA = 1)

MPC5200B Data Sheet, Rev. 1


56

Freescale Semiconductor

Electrical and Thermal Characteristics

Table 49. Timing Specifications SPI Slave Mode, Format 1 (CPHA = 1)


Sym

Description

Min

Max

Units

SpecID

SCK cycle time, programable in the PSC CCS register

30.0

ns

A15.56

SCK pulse width, 50% SCK duty cycle

15.0

ns

A15.57

Slave select clock delay

0.0

ns

A15.58

Output data valid

14.0

ns

A15.59

Input Data setup time

2.0

ns

A15.60

Input Data hold time

1.0

ns

A15.61

Slave disable lag time

0.0

ns

A15.62

Minimum Sequential Transfer delay = 2 * IP-Bus clock cycle time

30.0

ns

A15.63

NOTE
Output timing is specified at a nominal 50 pF load.
1

SCK
(CLKPOL=0)
Input

SCK
(CLKPOL=1)
Input

SS
Input

MOSI
Input
4
MISO
Output
Figure 44. Timing Diagram SPI Slave Mode, Format 1 (CPHA = 1)

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

57

Electrical and Thermal Characteristics

3.3.16 GPIOs and Timers


3.3.16.1 General and Asynchronous Signals
The MPC5200B contains several sets if I/Os that do not require special setup, hold, or valid requirements.
Most of these are asynchronous to the system clock. The following numbers are provided for test and
validation purposes only, and they assume a 133 MHz internal bus frequency.
Figure 45 shows the GPIO Timing Diagram. Table 50 gives the timing specifications.
Table 50. Asynchronous Signals
Sym

Description

Min

Max

Units

SpecID

tCK

Clock Period

7.52

ns

A16.1

tIS

Input Setup

12

ns

A16.2

tIH

Input Hold

ns

A16.3

tDV

Output Valid

15.33

ns

A16.4

tDH

Output Hold

ns

A16.5

tCK
tDH

tDV
Output

valid
tIH

tIS
Input

valid

Figure 45. Timing DiagramAsynchronous Signals

MPC5200B Data Sheet, Rev. 1


58

Freescale Semiconductor

Electrical and Thermal Characteristics

3.3.17 IEEE 1149.1 (JTAG) AC Specifications


Table 51. JTAG Timing Specification
Sym

Characteristic

Min

Max

Unit

SpecID

TCK frequency of operation.

25

MHz

A17.1

TCK cycle time.

40

ns

A17.2

TCK clock pulse width measured at 1.5V.

1.08

ns

A17.3

TCK rise and fall times.

ns

A17.4

(1)

TRST setup time to tck falling edge .

10

ns

A17.5

TRST assert time.

ns

A17.6

ns

A17.7

6
7

(2)

Input data setup time .


Input data hold

time(2)

15

ns

A17.8

TCK to output data

valid(3).

30

ns

A17.9

TCK to output high

impedance(3).

30

ns

A17.10

10

TMS, TDI data setup time.

ns

A17.11

11

TMS, TDI data hold time.

ns

A17.12

12

TCK to TDO data valid.

15

ns

A17.13

13

TCK to TDO high impedance.

15

ns

A17.14

NOTES:
1 TRST is an asynchronous signal. The setup time is for test purposes only.
2 Non-test, other than TDI and TMS, signal input timing with respect to TCK.
3 Non-test, other than TDO, signal output timing with respect to TCK.

1
2
TCK

VM

VM

VM

VM = Midpoint Voltage
Numbers shown reference Table 51.

Figure 46. Timing DiagramJTAG Clock Input

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

59

Electrical and Thermal Characteristics

TCK
4
TRST
5

Numbers shown reference Table 51.

Figure 47. Timing DiagramJTAG TRST

TCK
6
DATA INPUTS

INPUT DATA VALID

8
DATA OUTPUTS

OUTPUT DATA VALID

9
DATA OUTPUTS
Numbers shown reference Table 51.

Figure 48. Timing DiagramJTAG Boundary Scan

TCK
10
TDI, TMS

11

INPUT DATA VALID

12
TDO

OUTPUT DATA VALID

13
TDO
Numbers shown reference Table 51.

Figure 49. Timing DiagramTest Access Port

MPC5200B Data Sheet, Rev. 1


60

Freescale Semiconductor

Package Description

Package Description

4.1

Package Parameters

The MPC5200B uses a 27 mm x 27 mm TE-PBGA package. The package parameters are as provided in
the following list:
Package outline: 27 mm x 27 mm
Interconnects: 272
Pitch: 1.27 mm

4.2

Mechanical Dimensions

Figure 50 provides the mechanical dimensions, top surface, side profile, and pinout for the MPC5200B,
272 TE-PBGA package.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

61

Package Description

PIN A1
INDEX

0.2

4X

A
272X

0.2 A
E

0.35 A

E2

D2

0.2

NOTES:
1. DIMENSIONS AND TOLERANCING PER ASME
Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS.
3. DIMENSION IS MEASURED AT THE MAXIMUM
SOLDER BALL DIAMETER PARALLEL TO
PRIMARY DATUM A.
4. PRIMARY DATUM A AND THE SEATING PLANE
ARE DEFINED BY THE SPHERICAL CROWNS OF
THE SOLDER BALLS.

A B C

B
TOP VIEW

DIM
A
A1
A2
A3
b
D
D1
D2
E
E1
E2
e

(D1)
19X

19X

e
Y
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A

(E1)
4X

e /2

A1
A3
A2
A
SIDE VIEW

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

b 3

272X

BOTTOM VIEW

MILLIMETERS
MIN
MAX
2.05
2.65
0.50
0.70
0.50
0.70
1.05
1.25
0.60
0.90
27.00 BSC
24.13 REF
23.30
24.70
27.00 BSC
24.13 REF
23.30
24.70
1.27 BSC

0.3

A B C

0.15

CASE 1135A01
ISSUE B
DATE 10/15/1997

Figure 50. Mechanical Dimensions and Pinout Assignments for the MPC5200B, 272 TE-PBGA

MPC5200B Data Sheet, Rev. 1


62

Freescale Semiconductor

Package Description

4.3

Pinout Listings

See details in the MPC5200B User Manual [1].


Table 52. MPC5200B Pinout Listing
Name

Alias

Type

Power Supply

Output Driver
Type

Input
Type

Pull-up/
down

SDRAM
MEM_CAS
MEM_CLK_EN

CAS

I/O

VDD_MEM_IO

DRV16_MEM

TTL

CLK_EN

I/O

VDD_MEM_IO

DRV16_MEM

TTL

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_CS
MEM_DQM[3:0]

DQM

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_MA[12:0]

MA

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_MBA[1:0]

MBA

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_MDQS[3:0]

MDQS

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_MDQ[31:0]

MDQ

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_CLK

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_CLK

I/O

VDD_MEM_IO

DRV16_MEM

TTL

I/O

VDD_MEM_IO

DRV16_MEM

TTL

I/O

VDD_MEM_IO

DRV16_MEM

TTL

MEM_RAS
MEM_WE

RAS

PCI
EXT_AD[31:0]

I/O

VDD_IO

PCI

PCI

PCI_CBE_0

I/O

VDD_IO

PCI

PCI

PCI_CBE_1

I/O

VDD_IO

PCI

PCI

PCI_CBE_2

I/O

VDD_IO

PCI

PCI

PCI_CBE_3

I/O

VDD_IO

PCI

PCI

PCI_CLOCK

I/O

VDD_IO

PCI

PCI

PCI_DEVSEL

I/O

VDD_IO

PCI

PCI

PCI_FRAME

I/O

VDD_IO

PCI

PCI

PCI_GNT

I/O

VDD_IO

DRV8

TTL

PCI_IDSEL

I/O

VDD_IO

DRV8

TTL

PCI_IRDY

I/O

VDD_IO

PCI

PCI

PCI_PAR

I/O

VDD_IO

PCI

PCI

PCI_PERR

I/O

VDD_IO

PCI

PCI

PCI_REQ

I/O

VDD_IO

DRV8

TTL

PCI_RESET

I/O

VDD_IO

PCI

PCI

PCI_SERR

I/O

VDD_IO

PCI

PCI

PCI_STOP

I/O

VDD_IO

PCI

PCI

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

63

Package Description

Table 52. MPC5200B Pinout Listing (continued)


Name

Alias

PCI_TRDY

Type

Power Supply

Output Driver
Type

Input
Type

I/O

VDD_IO

PCI

PCI

Pull-up/
down

Local Plus
LP_ACK

I/O

VDD_IO

DRV8

TTL

LP_ALE

I/O

VDD_IO

DRV8

TTL

LP_OE

I/O

VDD_IO

DRV8

TTL

LP_RW

I/O

VDD_IO

DRV8

TTL

LP_TS

I/O

VDD_IO

DRV8

TTL

LP_CS0

I/O

VDD_IO

DRV8

TTL

LP_CS1

I/O

VDD_IO

DRV8

TTL

LP_CS2

I/O

VDD_IO

DRV8

TTL

LP_CS3

I/O

VDD_IO

DRV8

TTL

LP_CS4

I/O

VDD_IO

DRV8

TTL

LP_CS5

I/O

VDD_IO

DRV8

TTL

PULLUP

ATA
ATA_DACK

I/O

VDD_IO

DRV8

TTL

ATA_DRQ

I/O

VDD_IO

DRV8

TTL

PULLDOWN

ATA_INTRQ

I/O

VDD_IO

DRV8

TTL

PULLDOWN

ATA_IOCHRDY

I/O

VDD_IO

DRV8

TTL

PULLUP

ATA_IOR

I/O

VDD_IO

DRV8

TTL

ATA_IOW

I/O

VDD_IO

DRV8

TTL

ATA_ISOLATION

I/O

VDD_IO

DRV8

TTL

Ethernet
ETH_0

TX, TX_EN

I/O

VDD_IO

DRV4

TTL

ETH_1

RTS, TXD[0]

I/O

VDD_IO

DRV4

TTL

ETH_2

USB_TXP, RTS,
TXD[1]

I/O

VDD_IO

DRV4

TTL

ETH_3

USB_PRTPWR,
TXD[2]

I/O

VDD_IO

DRV4

TTL

ETH_4

USB_SPEED,
TXD[3]

I/O

VDD_IO

DRV4

TTL

ETH_5

USB_SUPEND,
TX_ER

I/O

VDD_IO

DRV4

TTL

ETH_6

USB_OE, RTS,
MDC

I/O

VDD_IO

DRV4

TTL

ETH_7

TXN, MDIO

I/O

VDD_IO

DRV4

TTL

MPC5200B Data Sheet, Rev. 1


64

Freescale Semiconductor

Package Description

Table 52. MPC5200B Pinout Listing (continued)


Alias

Type

Power Supply

Output Driver
Type

Input
Type

ETH_8

RX_DV

I/O

VDD_IO

DRV4

TTL

ETH_9

CD, RX_CLK

I/O

VDD_IO

DRV4

Schmitt

ETH_10

CTS, COL

I/O

VDD_IO

DRV4

TTL

ETH_11

TX_CLK

I/O

VDD_IO

DRV4

Schmitt

ETH_12

RXD[0]

I/O

VDD_IO

DRV4

TTL

ETH_13

USB_RXD, CTS,
RXD[1]

I/O

VDD_IO

DRV4

TTL

ETH_14

USB_RXP,
UART_RX, RXD[2]

I/O

VDD_IO

DRV4

TTL

ETH_15

USB_RXN, RX,
RXD[3]

I/O

VDD_IO

DRV4

TTL

ETH_16

USB_OVRCNT,
CTS, RX_ER

I/O

VDD_IO

DRV4

TTL

ETH_17

CD, CRS

I/O

VDD_IO

DRV4

TTL

Name

Pull-up/
down

IRDA
PSC6_0

IRDA_RX, RxD

I/O

VDD_IO

DRV4

TTL

PSC6_1

Frame, CTS

I/O

VDD_IO

DRV4

TTL

PSC6_2

IRDA_TX, TxD

I/O

VDD_IO

DRV4

TTL

PSC6_3

IR_USB_CLK,BitC
lk, RTS

I/O

VDD_IO

DRV4

Schmitt

USB
USB_0

USB_OE

I/O

VDD_IO

DRV4

TTL

USB_1

USB_TXN

I/O

VDD_IO

DRV4

TTL

USB_2

USB_TXP

I/O

VDD_IO

DRV4

TTL

USB_3

USB_RXD

I/O

VDD_IO

DRV4

TTL

USB_4

USB_RXP

I/O

VDD_IO

DRV4

TTL

USB_5

USB_RXN

I/O

VDD_IO

DRV4

TTL

USB_6

USB_PRTPWR

I/O

VDD_IO

DRV4

TTL

USB_7

USB_SPEED

I/O

VDD_IO

DRV4

TTL

USB_8

USB_SUPEND

I/O

VDD_IO

DRV4

TTL

USB_9

USB_OVRCNT

I/O

VDD_IO

DRV4

TTL

I2C
I2C_0

SCL

I/O

VDD_IO

DRV4

Schmitt

I2C_1

SDA

I/O

VDD_IO

DRV4

Schmitt

I2C_2

SCL

I/O

VDD_IO

DRV4

Schmitt

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

65

Package Description

Table 52. MPC5200B Pinout Listing (continued)


Name
I2C_3

Alias

Type

Power Supply

Output Driver
Type

Input
Type

Pull-up/
down

SDA

I/O

VDD_IO

DRV4

Schmitt

PSC
PSC1_0

TxD, Sdata_out,
MOSI, TX

I/O

VDD_IO

DRV4

TTL

PSC1_1

RxD, Sdata_in,
MISO, TX

I/O

VDD_IO

DRV4

TTL

PSC1_2

Mclk, Sync, RTS

I/O

VDD_IO

DRV4

TTL

PSC1_3

BitClk, SCK, CTS

I/O

VDD_IO

DRV4

Schmitt

PSC1_4

Frame, SS, CD

I/O

VDD_IO

DRV4

TTL

PSC2_0

TxD, Sdata_out,
MOSI, TX

I/O

VDD_IO

DRV4

TTL

PSC2_1

RxD, Sdata_in,
MISO, TX

I/O

VDD_IO

DRV4

TTL

PSC2_2

Mclk, Sync, RTS

I/O

VDD_IO

DRV4

TTL

PSC2_3

BitClk, SCK, CTS

I/O

VDD_IO

DRV4

Schmitt

PSC2_4

Frame, SS, CD

I/O

VDD_IO

DRV4

TTL

PSC3_0

USB_OE, TxDS,
TX

I/O

VDD_IO

DRV4

TTL

PSC3_1

USB_TXN, RxD,
RX

I/O

VDD_IO

DRV4

TTL

PSC3_2

USB_TXP, BitClk,
RTS

I/O

VDD_IO

DRV4

Schmitt

PSC3_3

USB_RXD, Frame,
SS, CTS

I/O

VDD_IO

DRV4

TTL

PSC3_4

USB_RXP, CD

I/O

VDD_IO

DRV4

TTL

PSC3_5

USB_RXN

I/O

VDD_IO

DRV4

TTL

PSC3_6

USB_PRTPWR,
Mclk, MOSI

I/O

VDD_IO

DRV4

TTL

PSC3_7

USB_SPEED.
MISO

I/O

VDD_IO

DRV4

TTL

PSC3_8

USB_SUPEND,
SS

I/O

VDD_IO

DRV4

TTL

PSC3_9

USB_OVRCNT,
SCK

I/O

VDD_IO

DRV4

TTL

GPIO/TIMER
GPIO_WKUP_6

MEM_CS1

I/O

VDD_MEM_IO

DRV16_MEM

TTL

GPIO_WKUP_7

I/O

VDD_IO

DRV8

TTL

TIMER_0

I/O

VDD_IO

DRV4

TTL

PULLUP_MEM

MPC5200B Data Sheet, Rev. 1


66

Freescale Semiconductor

Package Description

Table 52. MPC5200B Pinout Listing (continued)


Name

Alias

TIMER_1

Type

Power Supply

Output Driver
Type

Input
Type

I/O

VDD_IO

DRV4

TTL

TIMER_2

MOSI

I/O

VDD_IO

DRV4

TTL

TIMER_3

MISO

I/O

VDD_IO

DRV4

TTL

TIMER_4

SS

I/O

VDD_IO

DRV4

TTL

TIMER_5

SCK

I/O

VDD_IO

DRV4

TTL

TIMER_6

I/O

VDD_IO

DRV4

TTL

TIMER_7

I/O

VDD_IO

DRV4

TTL

VDD_IO

DRV4

Schmitt
Schmitt

Pull-up/
down

Clock
SYS_XTAL_IN
SYS_XTAL_OUT
RTC_XTAL_IN
RTC_XTAL_OUT

Input

VDD_IO

Output

VDD_IO

Input

VDD_IO

Output

VDD_IO
Misc

Input

PORRESET
HRESET

I/O

VDD_IO

DRV8_OD1

SRESET

I/O

VDD_IO

DRV8_OD1

Schmitt

IRQ0

I/O

VDD_IO

DRV4

TTL

IRQ1

I/O

VDD_IO

DRV4

TTL

IRQ2

I/O

VDD_IO

DRV4

TTL

IRQ3

I/O

VDD_IO

DRV4

TTL

Test/Configuration
SYS_PLL_TPA

I/O

VDD_IO

DRV4

TTL

TEST_MODE_0

Input

VDD_IO

DRV4

TTL

TEST_MODE_1

Input

VDD_IO

DRV4

TTL

TEST_SEL_0

I/O

VDD_IO

DRV4

TTL

TEST_SEL_1

I/O

VDD_IO

DRV8

TTL

PULLUP

JTAG_TCK

TCK

Input

VDD_IO

DRV4

Schmitt

PULLUP

JTAG_TDI

TDI

Input

VDD_IO

DRV4

TTL

PULLUP

JTAG_TDO

TDO

I/O

VDD_IO

DRV8

TTL

JTAG_TMS

TMS

Input

VDD_IO

DRV4

TTL

PULLUP

JTAG_TRST

TRST

Input

VDD_IO

DRV4

TTL

PULLUP

Power and Ground


VDD_IO

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

67

System Design Information

Table 52. MPC5200B Pinout Listing (continued)


Name

Alias

Type

VDD_MEM_IO

VDD_CORE

VSS_IO/CORE

SYS_PLL_AVDD

CORE_PLL_AVDD

Power Supply

Output Driver
Type

Input
Type

Pull-up/
down

NOTES:
1 All open drain outputs of the MPC5200B are actually regular three-state output drivers with the output data tied
low and the output enable controlled. Thus, unlike a true open drain, there is a current path from the external
system to the MPC5200B I/O power rail if the external signal is driven above the MPC5200B I/O power rail voltage.

System Design Information

5.1

Power Up/Down Sequencing

Figure 51 shows situations in sequencing the I/O VDD (VDD_IO), Memory VDD (VDD_IO_MEM), PLL
VDD (PLL_AVDD), and Core VDD (VDD_CORE).

MPC5200B Data Sheet, Rev. 1


68

Freescale Semiconductor

DC Power Supply Voltage

System Design Information

3.3V

VDD_IO,
VDD_IO_MEM (SDR)

2.5V

VDD_IO_MEM (DDR)

VDD_CORE,
PLL_AVDD

1.5V

0
Time
Note:

1. VDD_CORE should not exceed VDD_IO, VDD_IO_MEM or PLL_AVDD by more


than 0.4 V at any time, including power-up.
2. It is recommended that VDD_CORE/PLL_AVDD should track
VDD_IO/VDD_IO_MEM up to 0.9 V then separate for completion of ramps.
3. Input voltage must not be greater than the supply voltage (VDD_IO)
VDD_IO_MEM, VDD_CORE, or PLL_AVDD) by more than 0.5 V at any time,
Figure 51. Supply Voltage Sequencing

The relationship between VDD_IO_MEM and VDD_IO is non-critical during power-up and power-down
sequences. Both VDD_IO_MEM (2.5 V or 3.3 V) and VDD_IO are specified relative to VDD_CORE.

5.1.1

Power Up Sequence

If VDD_IO/VDD_IO_MEM are powered up with the VDD_CORE at 0V, the sense circuits in the I/O pads
will cause all pad output drivers connected to the VDD_IO/VDD_IO_MEM to be in a high-impedance
state. There is no limit to how long after VDD_IO/VDD_IO_MEM powers up before VDD_CORE must
power up. VDD_CORE should not lead the VDD_IO, VDD_IO_MEM or PLL_AVDD by more than 0.4
V during power ramp up or there will be high current in the internal ESD protection diodes. The rise times
on the power supplies should be slower than 1 microsecond to avoid turning on the internal ESD protection
clamp diodes.
The recommended power up sequence is as follows:
Use one microsecond or slower rise time for all supplies.
VDD_CORE/PLL_AVDD and VDD_IO/VDD_IO_MEM should track up to 0.9 V and then separate for
the completion of ramps with VDD_IO/VDD_IO_MEM going to the higher external voltages. One way
to accomplish this is to use a low drop-out voltage regulator.
MPC5200B Data Sheet, Rev. 1
Freescale Semiconductor

69

System Design Information

5.1.2

Power Down Sequence

If VDD_CORE/PLL_AVDD are powered down first, then sense circuits in the I/O pads will cause all
output drivers to be in a high impedance state. There is no limit on how long after VDD_CORE and
PLL_AVDD power down before VDD_IO or VDD_IO_MEM must power down. VDD_CORE should not
lag VDD_IO, VDD_IO_MEM, or PLL_AVDD going low by more than 0.5V during power down or there
will be undesired high current in the ESD protection diodes. There are no requirements for the fall times
of the power supplies.
The recommended power down sequence is as follows:
Drop VDD_CORE/PLL_AVDD to 0V.
Drop VDD_IO/VDD_IO_MEM supplies.

5.2

System and CPU Core AVDD Power Supply Filtering

Each of the independent PLL power supplies require filtering external to the device. The following
drawing is a recommendation for the required filter circuit.

Power
Supply
source

<1

10

AVDD device pin

10 F

200-400 pF

Figure 52. Power Supply Filtering

5.3

Pull-up/Pull-down Resistor Requirements

The MPC5200B requires external pull-up or pull-down resistors on certain pins.

5.3.1

Pull-down Resistor Requirements for TEST pins

The MPC5200B requires pull-down resistors on the test pins TEST_MODE_0, TEST_MODE_1,
TEST_SEL_1.

5.3.2

Pull-up Requirements for the PCI Control Lines

If the PCI interface is NOT used (and internally disabled) the PCI control pins must be terminated as
indicated by the PCI Local Bus specification [4]. This is also required for MOST/Graphics and Large Flash
Mode.
PCI control signals always require pull-up resistors on the motherboard (not the expansion board) to
ensure that they contain stable values when no agent is actively driving the bus. This includes
MPC5200B Data Sheet, Rev. 1
70

Freescale Semiconductor

System Design Information

PCI_FRAME, PCI_TRDY, PCI_IRDY, PCI_DEVSEL, PCI_STOP, PCI_SERR, PCI_PERR, and


PCI_REQ.

5.3.3

Pull-up/Pull-down Requirements for MEM_MDQS Pins


(SDRAM)

The MEM_MDQS[3:0] signals are not used with SDR memories and require pull-up or pull-down
resistors in SDRAM mode.

5.3.4

Pull-up/Pull-down Requirements for MEM_MDQS Pins (DDR


16-bit Mode)
.

The MEM_MDQS[1:0] signals are not used in DDR 16-bit mode and require pull-down resistors.

5.4

JTAG

The MPC5200B provides the user an IEEE 1149.1 JTAG interface to facilitate board/system testing. It also
provides a Common On-Chip Processor (COP) Interface, which shares the IEEE 1149.1 JTAG port. The
COP Interface provides access to the MPC5200B's embedded Freescale (formerly Motorola) MPC603e
e300 processor. This interface provides a means for executing test routines and for performing software
development and debug functions.

5.4.1

JTAG_TRST

Boundary scan testing is enabled through the JTAG interface signals. The JTAG_TRST signal is optional
in the IEEE 1149.1 specification but is provided on all processors that implement the PowerPC
architecture. To obtain a reliable power-on reset performance, the JTAG_TRST signal must be asserted
during power-on reset.

5.4.1.1

JTAG_TRST and PORRESET

The JTAG interface can control the direction of the MPC5200B I/O pads via the boundary scan chain. The
JTAG module must be reset before the MPC5200B comes out of power-on reset; do this by asserting
JTAG_TRST before PORRESET is released.
For more details refer to the Reset and JTAG Timing Specification.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

71

System Design Information

PORRESET
required assertion of JTAG_TRST

optional assertion of JTAG_TRST

JTAG_TRST

Figure 53. PORRESET vs. JTAG_TRST

5.4.1.2

Connecting JTAG_TRST

The wiring of the JTAG_TRST depends on the existence of a board-related debug interface. (see below)
Normally this interface is implemented, using a COP (common on-chip processor) connector. The COP
allows a remote computer system (typically, a PC with dedicated hardware and debugging software) to
access and control the internal operations of the MPC5200B.

5.4.2

e300 COP/BDM Interface

There are two possibilities to connect the JTAG interface: using it with a COP connector and without a
COP connector.

5.4.2.1

Boards Interfacing the JTAG Port via a COP Connector

The MPC5200B functional pin interface and internal logic provides access to the embedded e300
processor core through the Freescale (formerly Motorola) standard COP/BDM interface. Table 53 gives
the COP/BDM interface signals. The pin order shown reflects only the COP/BDM connector order.
Table 53. COP/BDM Interface Signals
BDM
Pin #

MPC5200B
I/O Pin

BDM
Connector

Internal
Pull Up/Down

External
Pull Up/Down

I/O (1)

16

GND

15

TEST_SEL_0

ckstp_out

14

KEY

13

HRESET

hreset

10k Pull-Up

12

GND

11

SRESET

sreset

10k Pull-Up

10

N/C

JTAG_TMS

tms

100k Pull-Up

10k Pull-Up

N/C

MPC5200B Data Sheet, Rev. 1


72

Freescale Semiconductor

System Design Information

Table 53. COP/BDM Interface Signals (continued)


BDM
Pin #

MPC5200B
I/O Pin

BDM
Connector

Internal
Pull Up/Down

External
Pull Up/Down

I/O (1)

JTAG_TCK

tck

100k Pull-Up

10k Pull-Up

VDD (2)

(3)

(3)

See Note

halted

JTAG_TRST

trst

100k Pull-Up

10k Pull-Up

JTAG_TDI

tdi

100k Pull-Up

10k Pull-Up

See Note

(4)

JTAG_TDO

qack

(4)

tdo

NOTES:
1.

2.
3.
4.

With respect to the emulator tools perspective:


Input is really an output from the embedded e300 core.
Output is really an input to the core.
From the board under test, power sense for chip power.
HALTED is not available from e300 core.
Input to the e300 core to enable/disable soft-stop condition during breakpoints. MPC5200B
internally ties CORE_QACK to GND in its normal/functional mode (always asserted).

For a board with a COP (common on-chip processor) connector, which accesses the JTAG interface and
which needs to reset the JTAG module, simply wiring JTAG_TRST and PORRESET is not recommended.
To reset the MPC5200B via the COP connector, the HRESET pin of the COP should be connected to the
HRESET pin of the MPC5200B. The circuitry shown in Figure 54 allows the COP to assert HRESET or
JTAG_TRST separately, while any other board sources can drive PORRESET.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

73

System Design Information

PORRESET

PORRESET

COP Header
13
11

HRESET

8
10

11

12

13

VDD
10Kohm
10Kohm

SRESET

TRST
JTAG_TRST

Key 14
9

10Kohm

TMS

VDD
JTAG_TMS

12

6 (2)

Key

MPC5200B

VDD

7
9

HRESET
VDD

SRESET

16

COP Connector
Physical Pinout

10Kohm

10Kohm

TCK

VDD

VDD

JTAG_TCK
10Kohm

TDI

VDD
JTAG_TDI

15

16
15
1

CKSTP_OUT

TEST_SEL_0

TDO

JTAG_TDO

halted
5 (3)
NC
qack
(4)
2
NC
10

NC

NC

Figure 54. COP Connector Diagram

5.4.2.2

Boards Without COP Connector

If the JTAG interface is not used, JTAG_TRST should be tied to PORRESET, so that it is asserted when
the system reset signal (PORRESET) is asserted. This ensures that the JTAG scan chain is initialized
during power on. Figure 55 shows the connection of the JTAG interface without COP connector.

MPC5200B Data Sheet, Rev. 1


74

Freescale Semiconductor

Ordering Information

PORRESET

PORRESET

HRESET

10Kohm

SRESET

10Kohm

HRESET

MPC5200B

VDD
VDD
SRESET

JTAG_TRST
10Kohm
VDD
JTAG_TMS
10Kohm
VDD
JTAG_TCK
10Kohm
VDD
JTAG_TDI
TEST_SEL_0
JTAG_TDO

Figure 55. JTAG_TRST Wiring for Boards without COP Connector

Ordering Information
Table 54. Ordering Information
Part Number *

Speed

Ambient Temp

Qualification **

Packaging ***

MPC5200VR400B

400

0C to 70C

Commercial

RoHS & pb-free

MPC5200CVR400B

400

-40C to 85C

Industrial

RoHS & pb-free

SPC5200VVR266B

266

-40C to 105C

Automotive - AEC

RoHS & pb-free

SPC5200CBV400B

400

-40C to 85C

Automotive - AEC

Standard

SPC5200CVR400B

400

-40C to 85C

Automotive - AEC

RoHS & pb-free

* Shipped in trays. Add R2 suffix for Tape & Reel.


* * Commercial Qualified to <250PPM level. Industrial/Automotive Qualified to AEC-Q100. Automotive has Zero Defect flow.
* * * Standard is halide-free with pb solder balls.

MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

75

Document Revision History

Document Revision History

Table 55 provides a revision history for this hardware specification.


Table 55. Document Revision History
Rev. No.

Substantive Change(s)

0.1

First Preliminary release with some TBDs in spec tables (3/2005)

0.2

Updates to Ethernet, LPC, Power Down, Input Leakage, Ordering Information (7/2005)

0.3

Updates to LPC timing and Pull-up/Pull-down Requirements (8/2005)

0.4

Updates to Power dissipation (8/2005)

0.5

Applied marked-up hard copy edits and Tabasco excel edits (10/2005)

0.6

Changed the alias name for ETH_2 to USB_TXP, RTS, TXD[1] in Table 52.

0.7

Table 2:
Two rows were added at the bottom that with ranges from -40 to +105 and -40 to +125
The rows from -40 to +85 and -40 to +115 were footnoted with "Maximum e300 core operating
frequency is 400 MHz.
The rows from -40 to +115 and -40 to +125 were footnoted with "Maximum e300 core operating
frequency is 266 MHz
Table 54:
Eliminated all part numbers for 466 MHz
Eliminated all "standard" package part numbers except for the one automotive grade at 400 MHz
MPC5200CVR266B was changed to MPC5200CVR400B with the speed of 400 MHz

Table 12: 466 MHz was changed to 400 MHz; removed 2 blank pages

For more detailed information, refer to the following documentation:


1. MPC5200B User Manual MPC5200BUM
2. PowerPC Microprocessor Family: The Programming Environments for 32-bit Microprocessors,
Rev. 2: MPCFPE32B/AD
3. G2 Core Reference Manual, Rev. 0: G2CORERM/D
4. PCI Local Bus Specification, Revision 2.2, December 18, 1998
5. ANSI ATA-4 Specification
6. IEEE 802.3 Specification (ETHERNET)

MPC5200B Data Sheet, Rev. 1


76

Freescale Semiconductor

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MPC5200B Data Sheet, Rev. 1


Freescale Semiconductor

77

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+800 2666 8080
support.asia@freescale.com
For Literature Requests Only:
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Denver, Colorado 80217
1-800-441-2447 or 303-675-2140
Fax: 303-675-2150
LDCForFreescaleSemiconductor@hibbertgroup.com

MPC5200BDS
Rev. 1, 1/2006

Information in this document is provided solely to enable system and software


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