MPC5200CVR400B
MPC5200CVR400B
MPC5200CVR400B
MPC5200BDS
Rev. 1, 1/2006
NOTE
The information in this
document is subject to
change. For the latest data
on the MPC5200B, visit
www.mobilegt.com and
proceed to the
MPC5200B Product
Summary Page.
Table of Contents
1
2
3
Overview
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Electrical and Thermal Characteristics . . . . . . . . . 6
3.1 DC Electrical Characteristics . . . . . . . . . . . . . 6
3.2 Oscillator and PLL Electrical
Characteristics . . . . . . . . . . . . . . . . . . . . . . . 12
3.3 AC Electrical Characteristics . . . . . . . . . . . . 14
Package Description . . . . . . . . . . . . . . . . . . . . . . 61
4.1 Package Parameters . . . . . . . . . . . . . . . . . . 61
4.2 Mechanical Dimensions. . . . . . . . . . . . . . . . 61
4.3 Pinout Listings . . . . . . . . . . . . . . . . . . . . . . . 63
System Design Information. . . . . . . . . . . . . . . . . 68
5.1 Power Up/Down Sequencing. . . . . . . . . . . . 68
5.2 System and CPU Core AVDD
Power Supply Filtering. . . . . . . . . . . . . . . . . 70
5.3 Pull-up/Pull-down Resistor Requirements . . 70
5.4 JTAG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Ordering Information . . . . . . . . . . . . . . . . . . . . . . 75
7 Document Revision History . . . . . . . . . . . . . 76
Features
Programmable Serial Controllers (PSC), I2C, SPI, CAN, J1850, Timers, and GPIOs.
Features
Freescale Semiconductor
Features
Features
Test/Debug features
JTAG (IEEE 1149.1 test access port)
Common On-chip Processor (COP) debug port
On-board PLL and clock generation
Freescale Semiconductor
Freescale Semiconductor
Reset / Clock
Generation
JTAG / COP
Interface
e300 Core
603
CommBus
SDRAM / DDR
Memory Controller
SDRAM / DDR
GPIO/Timers
Interrupt Controller
System Functions
Real-Time Clock
Local
Bus
Features
MSCAN
2x
J1850
USB
2x
SPI
I2C
2x
BestComm DMA
Ethernet
SRAM 16K
PSC
6x
3.1
DC Electrical Characteristics
3.1.1
The tables in this section describe the MPC5200B DC Electrical characteristics. Table 1 gives the absolute
maximum ratings.
Table 1. Absolute Maximum Ratings(1)
Characteristic
Sym
Min
Max
Unit
SpecID
VDD_CORE
0.3
1.8
D1.1
VDD_IO,
VDD_MEM_IO
0.3
3.6
D1.2
SYS_PLL_AVDD
0.3
2.1
D1.3
CORE_PLL_AVDD
0.3
2.1
D1.4
Vin
0.3
VDD_IO + 0.3
D1.5
Vin
0.3
VDD_MEM_IO
+ 0.3
D1.6
Vinos
1.0
D1.7
Vinus
1.0
D1.8
150
oC
D1.9
Tstg
55
NOTES:
1 Absolute maximum ratings are stress ratings only, and functional operation at the maximums is not guaranteed.
Stresses beyond those listed may affect device reliability or cause permanent damage.
3.1.2
Min (1)
Max (1)
Unit
SpecID
VDD_CORE
1.42
1.58
D2.1
VDD_IO
3.0
3.6
D2.2
VDD_MEM_IOSDR
3.0
3.6
D2.3
VDD_MEM_IODDR
2.42
2.63
D2.4
SYS_PLL_AVDD
1.42
1.58
D2.5
CORE_PLL_AVDD
1.42
1.58
D2.6
Vin
VDD_IO
D2.7
VinSDR
VDD_MEM_IOSDR
D2.8
Characteristic
Supply voltage - e300 core and peripheral
logic
Supply voltage - standard I/O buffers
Freescale Semiconductor
Min (1)
Max (1)
VinDDR
Characteristic
Input voltage - memory I/O buffers (DDR)
Ambient operating temperature range
Die junction operating temperature
(2)
TA
range(2)
range(3)
Unit
SpecID
VDD_MEM_IODDR
D2.9
+85
oC
D2.10
D2.12
-40
Tj
-40
+115
TA
-40
+105
D2.10
+125
D2.12
Tj
-40
NOTES:
1
These are recommended and tested operating conditions. Proper device operation outside these conditions is not
guaranteed.
2
Maximum e300 core operating frequency is 400 MHz.
3
Maximum e300 core operating frequency is 266 MHz.
3.1.3
DC Electrical Specifications
Table 3 gives the DC Electrical characteristics for the MPC5200B at recommended operating conditions
(see Table 2).
Table 3. DC Electrical Specifications
Characteristic
Condition
Sym
Min
Max
Unit
SpecID
VIH
2.0
D3.1
VIH
1.7
D3.2
VIH
2.0
D3.3
VIH
2.0
D3.4
SYS_XTAL_IN
CVIH
2.0
D3.5
RTC_XTAL_IN
CVIH
2.0
D3.6
VIL
0.8
D3.7
VIL
0.7
D3.8
VIL
0.8
D3.9
VIL
0.8
D3.10
SYS_XTAL_IN
CVIL
0.8
D3.11
RTC_XTAL_IN
CVIL
0.8
D3.12
Vin = 0 or
VDD_IO/VDD_IO_MEMSDR
IIN
+2
D3.13
(1)
Condition
Sym
Min
Max
Unit
SpecID
SYS_XTAL_IN
Vin = 0 or VDD_IO
IIN
+10
D3.14
RTC_XTAL_IN
Vin = 0 or VDD_IO
IIN
+10
D3.15
PULLUP
VDD_IO
Vin = 0
IINpu
40
109
D3.16
PULLUP_MEM
VDD_IO_MEMSDR
Vin = 0
IINpu
41
111
D3.17
PULLDOWN
VDD_IO
Vin = VDD_IO
IINpd
36
106
D3.18
VOH
2.4
D3.19
VOHDDR
1.7
D3.20
VOL
0.4
D3.21
VOLDDR
0.4
D3.22
ICS
-1.0
1.0
mA
D3.23
Cin
15
pF
D3.24
NOTES:
Leakage current is measured with output drivers disabled and pull-up/pull-downs inactive.
2 See Table 4 for the typical drive capability of a specific signal pin based on the type of output driver associated with that
pin as listed in Table 52.
3 All injection current is transferred to VDD_IO/VDD_IO_MEM. An external load is required to dissipate this current to
maintain the power supply within the specified voltage range.
Total injection current for all digital input-only and all digital input/output pins must not exceed 10 mA. Exceeding this
limit can cause disruption of normal operation.
1
Supply Voltage
IOH
IOL
Unit
SpecID
DRV4
VDD_IO = 3.3V
mA
D3.25
DRV8
VDD_IO = 3.3V
mA
D3.26
DRV8_OD
VDD_IO = 3.3V
mA
D3.27
DRV16_MEM
VDD_IO_MEM = 3.3V
16
16
mA
D3.28
DRV16_MEM
VDD_IO_MEM = 2.5V
16
16
mA
D3.29
VDD_IO = 3.3V
16
16
mA
D3.30
PCI
Freescale Semiconductor
3.1.4
Electrostatic Discharge
CAUTION
This device contains circuitry that protects against damage due to
high-static voltage or electrical fields. However, it is advised that normal
precautions be taken to avoid application of any voltages higher than
maximum-rated voltages. Operational reliability is enhanced if unused
inputs are tied to an appropriate logic voltage level (i.e., either GND or
VCC ). Table 7 gives package thermal characteristics for this device.
Table 5. ESD and Latch-Up Protection Characteristics
Sym
Rating
Min
Max
Unit
SpecID
VHBM
2000
D4.1
VMM
200
D4.2
VCDM
500
D4.3
+100
-100
mA
+200
-200
mA
ILAT
ILAT
3.1.5
Latch-up Current at
positive
negative
TA=85oC
D4.4
D4.5
Power Dissipation
Power dissipation of the MPC5200B is caused by 3 different components: the dissipation of the internal
or core digital logic (supplied by VDD_CORE), the dissipation of the analog circuitry (supplied by
SYS_PLL_AVDD and CORE_PLL_AVDD) and the dissipation of the IO logic (supplied by
VDD_IO_MEM and VDD_IO). Table 6 details typical measured core and analog power dissipation
figures for a range of operating modes. However, the dissipation due to the switching of the IO pins can
not be given in general, but must be calculated by the user for each application case using the following
formula:
P IO = P IOint +
N C VDD_IO
Eqn. 1
where N is the number of output pins switching in a group M, C is the capacitance per pin, VDD_IO is the
IO voltage swing, f is the switching frequency and PIOint is the power consumed by the unloaded IO stage.
The total power consumption of the MPC5200B processor must not exceed the value, which would cause
the maximum junction temperature to be exceeded.
P total = P core + P analog + P IO
Eqn. 2
Operational
Doze
33/66/33/33/264
33/132/66/132/396
Typ
Typ
727.5
1080
600
Unit
Notes
mW
(1),(2)
D5.1
mW
(1),(3)
D5.2
D5.3
Nap
225
mW
(1),(4)
Sleep
225
mW
(1),(5)
D5.4
Deep-Sleep
52.5
52.5
mW
(1),(6)
D5.5
Typ
Unit
Notes
Typical
mW
(7)
D5.6
Typ
Unit
Notes
Typical
33
mW
(9)
D5.7
NOTES:
1 Typical core power is measured at VDD_CORE = 1.5 V, Tj = 25 C
2 Operational power is measured while running an entirely cache-resident program with floating-point
multiplication instructions in parallel with a continuous PCI transaction via BestComm.
3 Doze power is measured with the e300 core in Doze mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
4 Nap power is measured with the e300 core in Nap mode, the system oscillator, System PLL and Core PLL are
active, all other system modules are inactive
5 Sleep power is measured with the e300 core in Sleep mode, the system oscillator, System PLL and Core PLL
are active, all other system modules are inactive
6 Deep-Sleep power is measured with the e300 core in Sleep mode, the system oscillator, System PLL, Core PLL
and all other system modules are inactive
7 Typical PLL power is measured at SYS_PLL_AVDD = CORE_PLL_AVDD = 1.5 V, Tj = 25 C
8
IO power figures given in the table represent the worst case scenario. For the VDD_MEM_IO rail connected to
2.5V the IO power is expected to be lower and bounded by the worst case with VDD_MEM_IO connected to
3.3V.
9 Unloaded typical I/O power is measured in Deep-Sleep mode at VDD_IO = VDD_MEM_IO
SDR= 3.3 V, Tj = 25 C
Freescale Semiconductor
3.1.6
Thermal Characteristics
Table 7. Thermal Resistance Data
Rating
Board Layers
Sym
Value
Unit
Notes
SpecID
RJA
30
C/W
(1),(2)
D6.1
Junction to Ambient
Natural Convection
Junction to Ambient
Natural Convection
RJMA
22
C/W
(1),(3)
D6.2
RJMA
24
C/W
(1),(3)
D6.3
RJMA
19
C/W
(1),(3)
D6.4
RJB
14
C/W
(4)
D6.5
D6.6
D6.7
Junction to Board
Junction to Case
Junction to Package Top
Natural Convection
RJC
C/W
(5)
JT
C/W
(6)
NOTES:
1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting
site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and
board thermal resistance.
2 Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3
Per JEDEC JESD51-6 with the board horizontal.
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL
SPEC-883 Method 1012.1).
6 Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter
is written as Psi-JT.
3.1.6.1
Heat Dissipation
An estimation of the chip-junction temperature, TJ, can be obtained from the following equation:
TJ = TA +(R JA PD )
Eqn. 3
where:
TA = ambient temperature for the package (C)
R JA = junction to ambient thermal resistance (C/W)
PD = power dissipation in package (W)
The junction to ambient thermal resistance is an industry standard value, which provides a quick and easy
estimation of thermal performance. Unfortunately, there are two values in common usage: the value
determined on a single layer board, and the value obtained on a board with two planes. For packages such
as the PBGA, these values can be different by a factor of two. Which value is correct depends on the power
dissipated by other components on the board. The value obtained on a single layer board is appropriate for
the tightly packed printed circuit board. The value obtained on the board with the internal planes is usually
appropriate if the board has low power dissipation and the components are well separated.
11
Historically, the thermal resistance has frequently been expressed as the sum of a junction to case thermal
resistance and a case to ambient thermal resistance:
R JA = R JC +R CA
Eqn. 4
where:
R JA = junction to ambient thermal resistance (C/W)
R JC = junction to case thermal resistance (C/W)
R CA = case to ambient thermal resistance (C/W)
R JC is device related and cannot be influenced by the user. The user controls the thermal environment to
change the case to ambient thermal resistance, R CA. For instance, the user can change the air flow around
the device, add a heat sink, change the mounting arrangement on printed circuit board, or change the
thermal dissipation on the printed circuit board surrounding the device. This description is most useful for
ceramic packages with heat sinks where some 90% of the heat flow is through the case to the heat sink to
ambient. For most packages, a better model is required.
A more accurate thermal model can be constructed from the junction to board thermal resistance and the
junction to case thermal resistance. The junction to case covers the situation where a heat sink will be used
or where a substantial amount of heat is dissipated from the top of the package. The junction to board
thermal resistance describes the thermal performance when most of the heat is conducted to the printed
circuit board. This model can be used for either hand estimations or for a computational fluid dynamics
(CFD) thermal model.
To determine the junction temperature of the device in the application after prototypes are available, the
Thermal Characterization Parameter (JT) can be used to determine the junction temperature with a
measurement of the temperature at the top center of the package case using the following equation:
TJ = TT +( JT PD )
Eqn. 5
where:
TT = thermocouple temperature on top of package (C)
JT = thermal characterization parameter (C/W)
PD = power dissipation in package (W)
The thermal characterization parameter is measured per JESD51-2 specification using a 40-gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned, so
that the thermocouple junction rests on the package. A small amount of epoxy is placed over the
thermocouple junction and over approximately one mm of wire extending from the junction. The
thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling
effects of the thermocouple wire.
3.2
The MPC5200B System requires a system-level clock input SYS_XTAL. This clock input may be driven
directly from an external oscillator or with a crystal using the internal oscillator.
There is a separate oscillator for the independent Real-Time Clock (RTC) system.
MPC5200B Data Sheet, Rev. 1
12
Freescale Semiconductor
The MPC5200B clock generation uses two phase locked loop (PLL) blocks.
The system PLL (SYS_PLL) takes an external reference frequency and generates the internal
system clock. The system clock frequency is determined by the external reference frequency and
the settings of the SYS_PLL configuration.
The e300 core PLL (CORE_PLL) generates a master clock for all of the CPU circuitry. The e300
core clock frequency is determined by the system clock frequency and the settings of the
CORE_PLL configuration.
3.2.1
Sym
Notes
Min
Typical
Max
Unit
SpecID
SYS_XTAL frequency
fsys_xtal
15.6
33.3
35.0
MHz
O1.1
tup_osc
10
ms
O1.2
3.2.2
RTC_XTAL frequency
3.2.3
Sym
Notes
frtc_xtal
Min
Typical
Max
Unit
SpecID
32.768
kHz
O2.1
Sym
Notes
Min
Typical
Max
Unit
SpecID
SYS_XTAL frequency
fsys_xtal
(1)
15.6
33.3
35.0
MHz
O3.1
tsys_xtal
(1)
66.6
30.0
28.5
ns
O3.2
tjitter
(2)
150
ps
O3.3
250
533
800
MHz
O3.4
100
O3.5
fVCOsys
tlock
(1)
(3)
NOTES:
1 The SYS_XTAL frequency and PLL Configuration bits must be chosen such that the resulting system frequency,
CPU (core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating
frequencies.
2
This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different
types of jitter can exist on the input to CORE_SYSCLK, systemic and true random jitter. True random jitter is
rejected. Systemic jitter will be passed into and through the PLL to the internal clock circuitry.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required
for the PLL lock after a stable VDD and CORE_SYSCLKare reached during the power-on reset sequence. This
specification also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
13
3.2.4
The internal clocking of the e300 core is generated from and synchronized to the system clock by means
of a voltage-controlled core PLL.
Table 11. e300 PLL Specifications
Characteristic
Sym
Notes
Min
Typical
Max
Unit
SpecID
e300 frequency
fcore
(1)
50
550
MHz
O4.1
tcore
(1)
2.85
40.0
ns
O4.2
fVCOcore
(1)
400
1200
MHz
O4.3
fXLB_CLK
25
367
MHz
O4.4
tXLB_CLK
2.73
50.0
ns
O4.5
tjitter
(2)
150
ps
O4.6
tlock
(3)
100
O4.7
NOTES:
1 The XLB_CLK frequency and e300 PLL Configuration bits must be chosen such that the resulting system
frequencies, CPU (core) frequency, and e300 PLL (VCO) frequency do not exceed their respective maximum or
minimum operating frequencies in Table 12.
2 This represents total input jitter - short term and long term combined - and is guaranteed by design. Two different
types of jitter can exist on the input to CORE_SYSCLK, systemic and true random jitter. True random jitter is
rejected. Systemic jitter will be passed into and through the PLL to the internal clock circuitry.
3 Relock time is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required
for the PLL lock after a stable VDD and CORE_SYSCLK are reached during the power-on reset sequence. This
specification also applies when the PLL has been disabled and subsequently re-enabled during sleep modes.
3.3
AC Electrical Characteristics
USB
Clock AC Specifications
SPI
Resets
MSCAN
External Interrupts
I2C
SDRAM
J1850
PCI
PSC
ATA
Ethernet
Freescale Semiconductor
3.3.1
3.3.2
Min
Max
Units
SpecID
400
MHz
A1.1
SDRAM Clock
133
MHz
A1.2
XL Bus Clock
133
MHz
A1.3
IP Bus Clock
133
MHz
A1.4
66
MHz
A1.5
15.6
35
MHz
A1.6
Clock AC Specifications
t CYCLE
t DUTY
t DUTY
t FALL
t RISE
CV IH
VM
SYSCLK
VM
VM
CV IL
Description
(1)
Min
Max
Units
SpecID
28.6
64.1
ns
A2.1
5.0
ns
A2.2
15
Description
t FALL
Min
Max
Units
SpecID
5.0
ns
A2.3
40.0
60.0
A2.4
t DUTY
CV IH
2.0
A2.5
CV IL
0.8
A2.6
NOTES:
CAUTIONThe SYS_XTAL_IN frequency and system PLL_CFG[0-6] settings must be chosen such that the
resulting system frequencies do not exceed their respective maximum or minimum operating frequencies. See the
MPC5200B User Manual [1].
2 SYS_XTAL_IN duty cycle is measured at V .
M
1
3.3.3
Resets
Description
Max Pulse
Width
Reference Clock
SpecID
PORRESET
Power On Reset
tVDD_stable+tup_osc+tlock
SYS_XTAL_IN
A3.1
HRESET
Hardware Reset
4 clock cycles
SYS_XTAL_IN
A3.2
SRESET
Software Reset
4 clock cycles
SYS_XTAL_IN
A3.3
NOTES:
1. For PORRESET the value of the minimum pulse width reflects the power on sequence. If PORRESET is asserted afterwards
its minimum pulse width equals the minimum given for HRESET related to the same reference clock.
2. The tVDD_stable describes the time which is needed to get all power supplies stable.
3. For tlock, refer to the Oscillator/PLL section of this specification for further details.
4. For tup_osc, refer to the Oscillator/PLL section of this specification for further details.
5. Following the deassertion of PORRESET, HRESET and SRESET remain low for 4096 reference clock cycles.
6. The deassertion of HRESET for at least the minimum pulse width forces the internal resets to be active for an additional 4096
clock cycles.
NOTE
As long as VDD is not stable the HRESET output is not stable.
Freescale Semiconductor
Min
Max
Unit
SpecID
ms
A3.4
ms
A3.5
ms
A3.6
ms
A3.7
ms
A3.8
ms
A3.9
NOTES:
Make sure that the PORRESET does not carry any glitches. The MPC5200B has no filter to prevent them from getting into the
chip.
HRESET and SRESET must have a monotonous rise time.
The assertion of HRESET becomes active at Power on Reset without any SYS_XTAL clock.
3.3.3.1
During reset (HRESET and PORRESET) the Reset Configuration Word is latched in the related Reset
Configuration Word Register with each rising edge of the SYS_XTAL signal. If both resets (HRESET and
PORRESET) are inactive (high), the contents of this register will be locked immediately with the
SYS_XTAL clock (see Figure 3).
4096 clocks
SYS_XTAL
PORRESET
HRESET
RST_CFG_WRD
sample
sample
sample
sample
sample
sample
sample
sample
sample
sample
LOCK
17
NOTE
Beware of changing the values on the pins of the reset configuration word
after the deassertion of PORRESET. This may cause problems because it
may change the internal clock ratios and so extend the PLL locking process.
3.3.4
External Interrupts
cint
8
Encoder
GPIO Std
CORE_CINT
CORE_INT
int
8 GPIOs
GPIO WakeUp
e300 Core
Grouper
Encoder
IRQ1
IRQ2
PIs
Main Interrupt
Controller
IRQ3
Notes:
1. PIs = Programmable Inputs
2. Grouper and Encoder functions imply programmability in software
Figure 4. External Interrupt Scheme
Due to synchronization, prioritization, and mapping of external interrupt sources, the propagation of
external interrupts to the core processor is delayed by several IP_CLK clock cycles. The following table
specifies the interrupt latencies in IP_CLK cycles. The IP_CLK frequency is programmable in the Clock
Distribution Module (see Note Table 16).
Table 16. External Interrupt Latencies
Interrupt Type
Interrupt Requests
Pin Name
Clock Cycles
Reference Clock
Core Interrupt
SpecID
IRQ0
10
IP_CLK
critical (cint)
A4.1
IRQ0
10
IP_CLK
normal (int)
A4.2
IRQ1
10
IP_CLK
normal (int)
A4.3
IRQ2
10
IP_CLK
normal (int)
A4.4
IRQ3
10
IP_CLK
normal (int)
A4.5
Freescale Semiconductor
Pin Name
Clock Cycles
Reference Clock
Core Interrupt
SpecID
GPIO_PSC3_4
12
IP_CLK
normal (int)
A4.6
GPIO_PSC3_5
12
IP_CLK
normal (int)
A4.7
GPIO_PSC3_8
12
IP_CLK
normal (int)
A4.8
GPIO_USB_9
12
IP_CLK
normal (int)
A4.9
GPIO_ETHI_4
12
IP_CLK
normal (int)
A4.10
GPIO_ETHI_5
12
IP_CLK
normal (int)
A4.11
GPIO_ETHI_6
12
IP_CLK
normal (int)
A4.12
GPIO_ETHI_7
12
IP_CLK
normal (int)
A4.13
GPIO_PSC1_4
12
IP_CLK
normal (int)
A4.15
GPIO_PSC2_4
12
IP_CLK
normal (int)
A4.16
GPIO_PSC3_9
12
IP_CLK
normal (int)
A4.17
GPIO_ETHI_8
12
IP_CLK
normal (int)
A4.18
GPIO_IRDA_0
12
IP_CLK
normal (int)
A4.19
DGP_IN0
12
IP_CLK
normal (int)
A4.20
DGP_IN1
12
IP_CLK
normal (int)
A4.21
NOTES:
1) The frequency of IP_CLK depends on register settings in Clock Distribution Module. See the MPC5200B User Manual [1].
2) The interrupt latency descriptions in the table above are related to non competitive, non masked but enabled external
interrupt sources. Take care of interrupt prioritization which may increase the latencies.
Since all external interrupt signals are synchronized into the internal processor bus clock domain, each of
these signals has to exceed a minimum pulse width of more than one IP_CLK cycle.
Table 17. Minimum Pulse Width for External Interrupts to be Recognized
Name
All external interrupts (IRQs, GPIOs)
Reference Clock
SpecID
IP_CLK
A4.22
NOTES:
1) The frequency of the IP_CLK depends on the register settings in Clock Distribution Module. See the MPC5200B User
Manual [1] for further information.
2) If the same interrupt occurs a second time while its interrupt service routine has not cleared the former one, the second
interrupt will not be recognized at all.
Besides synchronization, prioritization, and mapping the latency of an external interrupt to the start of its
associated interrupt service routine also depends on the following conditions: To get a minimum interrupt
service response time, it is recommended to enable the instruction cache and set up the maximum core
clock, XL bus, and IP bus frequencies (depending on board design and programming). In addition, it is
advisable to execute an interrupt handler, which has been implemented in assembly code.
19
3.3.5
SDRAM
3.3.5.1
Sym
Description
Min
Max
Units
SpecID
MEM_CLK period
7.5
ns
A5.1
tvalid
tmem_clk*0.5+0.4
ns
A5.2
thold
tmem_clk*0.5
ns
A5.3
tmem_clk
DMvalid
tmem_clk*0.25+0.4
ns
A5.4
DMhold
tmem_clk*0.25-0.7
ns
A5.5
0.3
ns
A5.6
0.2
ns
A5.7
MEM_CLK
tvalid
thold
Active
Control Signals
NOP
READ
DMvalid
NOP
NOP
NOP
NOP
NOP
DMhold
datahold
MDQ (Data)
tvalid
thold
Row
MA (Address)
tvalid
Column
thold
3.3.5.2
In Standard SDRAM, all signals are activated on the MEM_CLK from the Memory Controller and
captured on the MEM_CLK clock at the memory device.
Freescale Semiconductor
Min
Max
Units
SpecID
MEM_CLK period
7.5
ns
A5.8
tvalid
tmem_clk*0.5+0.4
ns
A5.9
thold
tmem_clk*0.5
ns
A5.10
tmem_clk*0.25+0.4
ns
A5.11
tmem_clk*0.25-0.7
ns
A5.12
tmem_clk
Description
DMvalid
DMhold
datavalid
tmem_clk*0.75+0.4
ns
A5.13
datahold
tmem_clk*0.75-0.7
ns
A5.14
MEM_CLK
tvalid
thold
Active
Control Signals
NOP
WRITE
NOP
NOP
NOP
NOP
NOP
DMhold
DMvalid
datahold
MDQ (Data)
tvalid
thold
Row
MA (Address)
tvalid
Column
thold
3.3.5.3
The SDRAM Memory Controller uses a 1/4 period delayed MDQS strobe to capture the MDQ data. The
1/4 period delay value is calculated automatically by hardware.
21
Min
Max
Units
SpecID
MEM_CLK period
7.5
ns
A5.15
tvalid
tmem_clk*0.5+0.4
ns
A5.16
thold
tmem_clk*0.5
ns
A5.17
0.4
ns
A5.18
ns
A5.19
tmem_clk
Description
datasetup
datahold
Freescale Semiconductor
MEM_CLK
MEM_CLK
tvalid
thold
Active
Control Signals
NOP
READ
NOP
NOP
NOP
NOP
NOP
MDQ (Data)
Sample
position
A
tdata_sample_min
tdata_sample_max
Read Data
Sample Window
MDQ (Data)
0.5 * tMEM_CLK
tdata_sample_min
tdata_sample_max
Sample
position
B
Read Data
Sample Window
tvalid
MA (Address)
thold
Row
tvalid
Column
thold
Sample position A: data are sampled on the expected edge of MEM_CLK, the MDQS signal indicate the valid data
Sample position B: data are sampled on a later edge of MEM_CLK, SDRAM controller is waiting for the vaild MDQS signal
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
23
3.3.5.4
Sym
Description
tmem_clk
tDQSS
Min
Max
Units
SpecID
MEM_CLK period
7.5
ns
A5.20
tmem_clk+0.4
ns
A5.21
ns
A5.22
ns
A5.23
datavalid
datahold
TBD
TBD
MEM_CLK
MEM_CLK
Control Signals
Write
Write
Write
Write
MDQ (Data)
NOTE: Control Signals signals are composed of RAS, CAS, MEM_WE, MEM_CS, MEM_CS1 and CLK_EN
3.3.6
PCI
The PCI interface on the MPC5200B is designed to PCI Version 2.2 and supports 33-MHz and 66-MHz
PCI operations. See the PCI Local Bus Specification [4]; the component section specifies the electrical and
timing parameters for PCI components with the intent that components connect directly together whether
on the planar or an expansion board, without any external buffers or other glue logic. Parameters apply
at the package pins, not at expansion board edge connectors.
The MPC5200B is always the source of the PCI CLK. The clock waveform must be delivered to each
33-MHz or 66-MHz PCI component in the system. Figure 9 shows the clock waveform and required
measurement points for 3.3 V signaling environments. Table 22 summarizes the clock specifications.
Freescale Semiconductor
t cyc
t high
0.6Vcc
0.5Vcc
0.4Vcc
PCI CLK
0.3Vcc
t low
0.4Vcc, p-to-p
(minimum)
0.2Vcc
Figure 9. PCI CLK Waveform
33 MHz
Description
Units
Notes
SpecID
30
ns
(1),(3)
A6.1
Min
Max
Min
30
Max
tcyc
15
thigh
11
ns
t low
11
ns
1.5
V/ns
A6.2
A6.3
(2)
A6.4
NOTES:
1. In general, all 66-MHz PCI components must work with any clock frequency up to 66 MHz. CLK requirements vary
depending upon whether the clock frequency is above 33 MHz.
2. Rise and fall times are specified in terms of the edge rate measured in V/ns. This slew rate must be met across the minimum
peak-to-peak portion of the clock waveform as shown in Figure 9.
3. The minimum clock period must not be violated for any single clock cycle, i.e., accounting for all system jitter.
33 MHz
Description
Units
Notes
SpecID
11
ns
(1),(2),(3)
A6.5
12
ns
(1),(2),(3)
A6.6
ns
(1)
A6.7
ns
(1)
A6.8
Min
Max
Min
Max
tval
t on
t off
t su
2
14
28
ns
(3),(4)
A6.9
10,12
ns
(3),(4)
A6.10
ns
(4)
A6.11
NOTES:
1. See the timing measurement conditions in the PCI Local Bus Specification [4]. It is important that all driven signal transitions
drive to their Voh or Vol level within one Tcyc.
2. Minimum times are measured at the package pin with the load circuit, and maximum times are measured with the load circuit
as shown in the PCI Local Bus Specification [4].
25
For Measurement and Test Conditions, see the PCI Local Bus Specification [4].
3.3.7
The Local Plus Bus is the external bus interface of the MPC5200B. A maximum of eight configurable chip
selects (CS) are provided. There are two main modes of operation: non-MUXed (Legacy and Burst) and
MUXED. The reference clock is the PCI CLK. The maximum bus frequency is 66 MHz.
Definition of Acronyms and Terms:
WS = Wait State
DC = Dead Cycle
LB = Long Burst
DS = Data Size in Bytes
tPCIck = PCI clock period
tIPBIck = IPBI clock period
tPCIck
PCI CLK
tIPBIck
IPBI CLK
Figure 10. Timing DiagramIPBI and PCI clock (example ratio: 4:1)
3.3.7.1
Non-MUXed Mode
Table 24. Non-MUXed Mode Timing
Sym
Description
Min
Max
Units
t CSA
4.6
10.6
ns
t CSN
2.9
7.0
ns
t1
CS pulse width
t2
Notes SpecID
A7.1
A7.2
(1)
(2+WS)*tPCIck
(2+WS)*tPCIck
ns
A7.3
tIPBIck
tPCIck
ns
t3
tIPBIck
ns
t4
4.8
ns
A7.6
t5
2.7
ns
A7.7
t6
tPCIck
ns
A7.8
t7
tIPBIck
ns
A7.9
t8
tIPBIck
ns
A7.10
t9
tIPBIck
ns
A7.11
t10
8.5
ns
A7.12
A7.4
(2)
A7.5
Freescale Semiconductor
Description
DATA input hold after CS negation
ACK assertion after CS assertion
Min
Max
Units
(DC+1)*tPCIck
ns
(6)
A7.13
ns
(3)
A7.14
A7.15
tPCIck
Notes SpecID
t13
tPCIck
ns
(3)
t14
6.9
ns
(4)
A7.16
ns
(4)
A7.17
ns
(5)
A7.18
A7.19
t15
t16
TS pulse width
TSIZ valid before CS assertion
t17
t18
t19
tPCIck
tIPBIck
tPCIck
-
tIPBIck
ns
(5)
2.0
ns
(1)
A7.20
ns
(1)
A7.21
4.4
NOTES:
1. ACK can shorten the CS pulse width.
Wait States (WS) can be programmed in the Chip Select X Register, Bit field WaitP and WaitX. It can be specified from 0 65535.
2. In Large Flash and MOST Graphics mode the shared PCI/ATA pins, used as address lines, are released at the same moment
as the CS. This can cause the address to change before CS is deasserted.
3. ACK is input and can be used to shorten the CS pulse width.
4. Only available in Large Flash and MOST Graphics mode.
5. Only available in MOST Graphics mode.
6. Deadcycles are only used, if no arbitration to an other module (ATA or PCI) of the shared local bus happens. If arbitration
happens the bus can be driven within 4 IPB clocks by an other modules.
27
PCI CLK
t1
CS[x]
t2
t3
ADDR
t5
t4
OE
t6
t7
R/W
t8
t9
DATA (wr)
t10
t11
DATA (rd)
t19
t12
ACK
t14
t13
t18
t15
TS
t17
TSIZ[1:2]
t16
3.3.7.2
Burst Mode
Table 25. Burst Mode Timing
Sym
Description
t CSA
t CSN
t1
CS pulse width
Min
Max
4.6
10.6
ns
ns
A7.22
2.9
7.0
(1+WS+4LB*2*(32/DS))*
(1+WS+4LB*2*(32/DS))
tPCIck
*tPCIck
tIPBIck
tPCIck
ns
A7.25
-0.7
ns
A7.26
ns
A7.23
(1),(2)
A7.24
t2
t3
t4
4.8
ns
A7.27
t5
2.7
ns
A7.28
t6
tPCIck
ns
A7.29
t7
tPCIck
ns
A7.30
Freescale Semiconductor
Description
Min
Max
t8
3.6
ns
A7.31
t9
ns
A7.32
t10
(DC+1)*tPCIck
ns
t11
(WS+1)*tPCIck
ns
t12
t13
t14
t15
TS pulse width
(4)
A7.33
A7.34
7.0
ns
(3)
4LB*2*(32/DS)*tPCIck
4LB*2*(32/DS)*tPCIck
ns
(2),(3)
2.5
ns
A7.37
tPCIck
tPCIck
ns
A7.38
A7.35
A7.36
NOTES:
1. Wait States (WS) can be programmed in the Chip Select X Register, Bit field WaitP and WaitX. It can be specified from 0 65535.
2. Example:
Long Burst is used, this means the CS related BERx and SLB bits of the Chip Select Burst Control Register are set and a
burst on the internal XLB is executed. => LB = 1
Data bus width is 8 bit. => DS = 8
=> 41*2*(32/8) = 32 => ACK is asserted for 32 PCI cycles to transfer one cache line.
Wait State is set to 10. => WS = 10
1+10+32 = 43 => CS is asserted for 43 PCI cycles.
3. ACK is output and indicates the burst.
4. Deadcycles are only used, if no arbitration to an other module (ATA or PCI) of the shared local bus happens. If arbitration
happens the bus can be driven within 4 IPB clocks by an other modules.
PCI CLK
CS[x]
t1
t3
t2
ADDR
t5
t4
OE
t6
t7
R/W
t8
t10
DATA (rd)
t9
t11
t12
ACK
t14
t15
t13
TS
29
3.3.7.3
MUXed Mode
Table 26. MUXed Mode Timing
Sym
Description
Min
Max
Units
t CSA
4.6
10.6
ns
A7.39
t CSN
2.9
7.0
ns
A7.40
tALEA
3.6
ns
A7.41
t1
5.7
ns
A7.42
t2
-1.2
ns
A7.43
t3
-1.2
ns
A7.44
t4
tIPBIck
ns
A7.45
t5
8.5
ns
A7.46
t6
(DC+1)*tPCIck
ns
t7
tPCIck
ns
A7.48
6.9
ns
A7.49
t8
TS pulse width
tPCIck
ns
A7.50
t9
CS pulse width
(2+WS)*tPCIck
(2+WS)*tPCIck
ns
A7.51
tTSA
Notes
(1),(3)
SpecID
A7.47
tOEA
4.7
ns
A7.52
tOEN
5.9
ns
A7.53
tIPBIck
ns
A7.54
tPCIck
ns
t10
t11
t12
tIPBIck
A7.55
ns
(2)
A7.56
(2)
A7.57
t13
tPCIck
ns
t14
tPCIck
ns
t15
2.0
ns
(2)
A7.59
ns
(2)
A7.60
t16
4.4
A7.58
NOTES:S
1. ACK can shorten the CS pulse width.
Wait States (WS) can be programmed in the Chip Select X Register, Bit field WaitP and WaitX. It can be specified from 0 65535.
2. ACK is input and can be used to shorten the CS pulse width.
3. Deadcycles are only used, if no arbitration to an other module (ATA or PCI) of the shared local bus happens. If arbitration
happens the bus can be driven within 4 IPB clocks by an other modules.
Freescale Semiconductor
PCI CLK
t2
t1
t4
AD[31,27] (wr)
Data
AD[30:28] (wr)
TSIZ[0:2] bits
Data
AD[26:25] (wr)
Bank[0:1] bits
Data
AD[24:0] (wr)
Address[7:31]
Data
t3
t5
AD[31:0] (rd)
t6
Data
t7
t14
ALE
Address latch
t8
TS
t9
CSx
OE
t10
t11
R/W
t16
t12
ACK
t15
Address tenure
t13
Data tenure
3.3.8
ATA
The MPC5200B ATA Controller is completely software programmable. It can be programmed to operate
with ATA protocols using their respective timing, as described in the ANSI ATA-4 specification. The ATA
interface is completely asynchronous in nature. Signal relationships are based on specific fixed timing in
terms of timing units (nanoseconds).
ATA data setup and hold times, with respect to Read/Write strobes, are software programmable inside the
ATA Controller. Data setup and hold times are implemented using counters. The counters count the
number of ATA clock cycles needed to meet the ANSI ATA-4 timing specifications. For details, see the
ANSI ATA-4 specification [5] and how to program an ATA Controller and ATA drive for different ATA
protocols and their respective timing. See the MPC5200B User Manual [1].
The MPC5200B ATA Host Controller design makes data available coincidentally with the active edge of
the WRITE strobe in PIO and Multiword DMA modes.
MPC5200B Data Sheet, Rev. 1
Freescale Semiconductor
31
Write data is latched by the drive at the inactive edge of the WRITE strobe. This gives ample
setup-time beyond that required by the ATA-4 specification.
Data is held unchanged until the next active edge of the WRITE strobe. This gives ample
hold-time beyond that required by the ATA-4 specification.
All ATA transfers are programmed in terms of system clock cycles (IP bus clocks) in the ATA Host
Controller timing registers. This puts constraints on the ATA protocols and their respective timing modes
in which the ATA Controller can communicate with the drive.
Faster ATA modes (i.e., UDMA 0, 1, 2) are supported when the system is running at a sufficient frequency
to provide adequate data transfer rates. Adequate data transfer rates are a function of the following:
The MPC5200B operating frequency (IP bus clock frequency)
Internal MPC5200B bus latencies
Other system load dependent variables
The ATA clock is the same frequency as the IP bus clock in MPC5200B. See the MPC5200B User Manual
[1].
NOTE
All output timing numbers are specified for nominal 50 pF loads.
Table 27. PIO Mode Timing Specifications
Sym
Min/Max
(ns)
Mode 0
(ns)
Mode 1
(ns)
Mode 2
(ns)
Mode 3
(ns)
Mode 4
(ns)
SpecID
t0
Cycle Time
min
600
383
240
180
120
A8.1
t1
min
70
50
30
30
25
A8.2
t2
min
min
165
290
125
290
100
290
80
80
70
70
A8.3
t2i
min
70
25
A8.4
t3
min
60
45
30
30
20
A8.5
t4
min
30
20
15
10
10
A8.6
t5
min
50
35
20
20
20
A8.7
t6
min
A8.8
t9
DIOR/DIOW to address
valid hold
min
20
15
10
10
10
A8.9
tA
IORDY setup
max
35
35
35
35
35
A8.10
tB
max
1250
1250
1250
1250
1250
A8.11
Freescale Semiconductor
CS[0]/CS[3]/DA[2:0]
t2
t9
t1
DIOR/DIOW
t0
t3
t4
WDATA
t5
t6
RDATA
tA
tB
IORDY
Min/Max
Mode 0(ns)
Mode 1(ns)
Mode 2(ns)
SpecID
t0
Cycle Time
min
480
150
120
A8.12
tC
max
A8.13
tD
min
215
80
70
A8.14
tE
max
150
60
50
A8.15
tG
min
100
30
20
A8.16
tF
min
A8.17
tH
min
20
15
10
A8.18
tI
min
A8.19
tJ
min
20
A8.20
tKr
min
50
50
25
A8.21
tKw
min
215
50
25
A8.22
tLr
max
120
40
35
A8.23
tLw
max
40
40
35
A8.24
33
t0
DMARQ
(Drive)
tL
tC
DMACK
(Host)
tI
tD
tJ
tK
DIOR
DIOW
(Host)
tE
RDATA
(Drive)
tF
WDATA
(Host)
tG
tH
NOTE
The direction of signal assertion is towards the top of the page, and the
direction of negation is towards the bottom of the page, irrespective of the
electrical properties of the signal.
Table 29. Ultra DMA Timing Specification
Sym
MODE 0
(ns)
MODE 1
(ns)
MODE 2
(ns)
Comment
SpecID
Min
Max
Min
Max
Min
Max
t CYC
114
75
55
A8.26
t 2CYC
235
156
117
A8.27
t DS
15
10
A8.28
t DH
A8.29
t DVS
70
48
34
A8.30
t DVH
A8.31
t FS
230
200
170
A8.32
t LI
150
150
150
A8.33
t MLI
20
20
20
A8.34
Freescale Semiconductor
Sym
MODE 0
(ns)
MODE 1
(ns)
MODE 2
(ns)
Comment
SpecID
Min
Max
Min
Max
Min
Max
t UI
A8.35
t AZ
10
10
10
A8.36
t ZAH
20
20
20
A8.37
t ZAD
t ENV
20
70
20
70
20
70
A8.39
t SR
50
30
20
A8.40
t RFS
75
60
50
A8.41
t RP
160
125
100
A8.42
t IORDYZ
20
20
20
A8.43
t ZIORDY
A8.44
t ACK
20
20
20
A8.45
t SS
50
50
50
A8.46
A8.38
NOTES:
1 t UI, t MLI, t LI indicate sender-to-recipient or recipient-to-sender interlocks. That is, one agent (either sender or recipient) is
waiting for the other agent to respond with a signal before proceeding.
t UI is an unlimited interlock that has no maximum time value.
t MLI is a limited time-out that has a defined minimum.
t LI is a limited time-out that has a defined maximum.
2 All timing parameters are measured at the connector of the drive to which the parameter applies. For example, the sender
shall stop generating STROBE edges t RFS after negation of DMARDY. Both STROBE and DMARDY timing measurements
are taken at the connector of the sender. Even though the sender stops generating STROBE edges, the receiver may receive
additional STROBE edges due to propagation delays. All timing measurement switching points (low to high and high to low)
are taken at 1.5 V.
35
DMARQ
(device)
t UI
DMACK
(device)
t ACK
t ENV
t FS
t ZAD
STOP
(host)
t ACK
t ENV
t FS
HDMARDY
(host)
t ZAD
t ZIORDY
DSTROBE
(device)
t DVS
t AZ
t DVH
DD(0:15)
t ACK
DA0, DA1, DA2,
CS[0:1]1
t 2CYC
t CYC
t CYC
t 2CYC
DSTROBE
at device
tDVH
tDVS
tDVH
tDVS
tDVH
DD(0:15)
at device
DSTROBE
at host
tDH
tDS
tDH
tDS
tDH
DD(0:15)
at host
Freescale Semiconductor
DMARQ
(device)
DMARQ
(host)
t RP
STOP
(host)
t SR
HDMARDY
(host)
t RFS
DSTROBE
(device)
DD[0:15]
(device)
t MLI
t LI
t ACK
STOP
(host)
tLI
t ACK
HDMARDY
(host)
t SS
t IORDYZ
DSTROBE
(device)
t ZAH
t DVS
t AZ
t DVH
CRC
DD[0:15]
t ACK
DA0,DA1,DA2,
CS[0:1]
37
t LI
DMACK
(host)
t RP
t ZAH
t ACK
STOP
(host)
tACK
t AZ
HDMARDY
(host)
t RFS
t MLI
t LI
DSTROBE
(device)
t IORDYZ
t DVS
t DVH
DD[0:15]
CRC
t ACK
DA0,DA1,DA2,
CS[0:1]
tUI
DMACK
(host)
tACK
tENV
STOP
(host)
tLI
tZIORDY
tUI
DDMARDY
(host)
tACK
HSTROBE
(device)
tDVS
tDVH
DD[0:15]
(host)
tACK
DA0,DA1,DA2,
CS[0:1]
Freescale Semiconductor
t CYC
t 2CYC
HSTROBE
(host)
t DVS
t DVH
t DVS
t DVH
t DVH
DD[0:15]
(host)
HSTROBE
(device)
t DH
t DS
t DS
t DH
t DH
DD[0:15]
(device)
DD[0:15]
(host)
Figure 23. Timing DiagramDrive Pausing an Ultra DMA Data Out Burst
39
t MLI
DMACK
(host)
t SS
t ACK
t LI
STOP
(host)
t LI
t IORDYZ
DDMARDY
(device)
tACK
HSTROBE
(host)
t DVS
DD[0:15]
(host)
t DVH
CRC
t ACK
DA0,DA1,DA2,
CS[0:1]
Figure 24. Timing DiagramHost Terminating Ultra DMA Data Out Burst
DMARQ
(device)
DMACK
(host)
t LI
t ACK
t MLI
STOP
(host)
t RP
t IORDYZ
DDMARDY
(device)
t RFS
t LI
t MLI
t ACK
HSTROBE
(host)
t DVS
DD[0:15]
(host)
t DVH
CRC
t ACK
DA0,DA1,DA2,
CS[0:1]
Figure 25. Timing DiagramDrive Terminating Ultra DMA Data Out Burst
MPC5200B Data Sheet, Rev. 1
40
Freescale Semiconductor
Description
Min
Max
Units
SpecID
IP Bus cycles
A8.48
19
IP Bus cycles
A8.49
DIOR
ATA_ISOLATION
1
3.3.9
Ethernet
Description
Min
Max
Unit
SpecID
t1
10
ns
A9.1
t2
10
ns
A9.2
t3
t4
35%
35%
65%
65%
RX_CLK
Period(1)
A9.3
RX_CLK
Period(1)
A9.4
NOTES:
1 RX_CLK shall have a frequency of 25% of data rate of the received signal. See the IEEE 802.3 Specification [6].
41
t3
RX_CLK (Input)
t4
RXD[3:0] (inputs)
RX_DV
RX_ER
t1
t2
Description
Min
Max
Unit
SpecID
t5
ns
A9.5
t6
25
ns
A9.6
t7
35%
t8
35%
65%
65%
TX_CLK
Period(1)
A9.7
TX_CLK
Period(1)
A9.8
NOTES:
1 The TX_CLK frequency shall be 25% of the nominal transmit frequency, e.g., a PHY operating at 100 Mb/s must
provide a TX_CLK frequency of 25 MHz and a PHY operating at 10 Mb/s must provide a TX_CLK frequency of 2.5
MHz. See the IEEE 802.3 Specification [6].
t7
TX_CLK (Input)
t5
t8
TXD[3:0] (Outputs)
TX_EN
TX_ER
t6
Description
CRS, COL minimum pulse width
Min
Max
Unit
SpecID
1.5
TX_CLK Period
A9.9
Freescale Semiconductor
CRS, COL
t9
Figure 29. Ethernet Timing DiagramMII Async
Table 34. MII Serial Management Channel Signal Timing
Sym
Description
Min
Max
Unit
SpecID
t10
25
ns
A9.10
t11
10
ns
A9.11
t12
10
ns
A9.12
high(1)
160
ns
A9.13
t14
low(1)
160
ns
A9.14
t15
MDC period(2)
400
ns
A9.15
t13
NOTES:
1 MDC is generated by MPC5200B with a duty cycle of 50% except when MII_SPEED in the FEC MII_SPEED
control register is changed during operation. See the MPC5200B User Manual [1].
2
The MDC period must be set to a value of less than or equal to 2.5 MHz (to be compliant with the IEEE MII
characteristic) by programming the FEC MII_SPEED control register. See the MPC5200B User Manual [1].
t13
t14
MDC (Output)
t15
t10
MDIO (Output)
MDIO (Input)
t11
t12
43
3.3.10 USB
Table 35. Timing SpecificationsUSB Output Line
Sym
Description
Min
Max
Units
SpecID
83.3
667
ns
A10.1
83.3
667
ns
A10.2
7.9
ns
A10.3
7.9
ns
A10.4
NOTES:
1
Defined in the USB config register, (12 Mbit/s or 1.5 Mbit/s mode).
NOTE
Output timing is specified at a nominal 50 pF load.
2
USB_OE
USB_TXN
1
1
4
USB_TXP
Freescale Semiconductor
3.3.11 SPI
Table 36. Timing Specifications SPI Master Mode, Format 0 (CPHA = 0)
Sym
1
Description
Cycle time
Min
Max
Units
SpecID
1024
IP-Bus Cycle(1)
A11.1
(1)
A11.2
512
IP-Bus Cycle
15.0
ns
A11.3
20.0
ns
A11.4
20.0
ns
A11.5
20.0
ns
A11.6
20.0
ns
A11.7
15.0
ns
A11.8
10
7.9
ns
A11.10
11
7.9
ns
A11.11
IP-Bus
Cycle(1)
A11.9
NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].
NOTE
Output timing is specified at a nominal 50 pF load.
1
10
SCK
(CLKPOL=0)
Output
2
11
SCK
(CLKPOL=1)
Output
11
10
SS
Output
5
4
MOSI
Output
6
MISO
Input
7
45
Description
Min
Max
Units
SpecID
(1)
Cycle time
1024
IP-Bus Cycle
A11.12
512
IP-Bus Cycle(1)
A11.13
15.0
ns
A11.14
50.0
ns
A11.15
50.0
ns
A11.16
50.0
ns
A11.17
0.0
ns
A11.18
15.0
ns
A11.19
(1)
IP-Bus Cycle
A11.20
NOTES:
1
Inter Peripheral Clock is defined in the MPC5200B User Manual [1].
NOTE
Output timing is specified at a nominal 50 pF load.
1
SCK
(CLKPOL=0)
Input
SCK
(CLKPOL=1)
Input
SS
Input
6
MOSI
Input
4
MISO
Output
Figure 33. Timing Diagram SPI Slave Mode, Format 0 (CPHA = 0)
Freescale Semiconductor
Description
Min
Max
Units
SpecID
(1)
A11.21
Cycle time
1024
IP-Bus Cycle
512
15.0
ns
A11.23
20.0
ns
A11.24
20.0
ns
A11.25
20.0
ns
A11.26
15.0
ns
A11.27
(1)
IP-Bus Cycle
A11.28
7.9
ns
A11.29
10
7.9
ns
A11.30
NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].
NOTE
Output timing is specified at a nominal 50 pF load.
1
9
SCK
(CLKPOL=0)
Output
2
10
SCK
(CLKPOL=1)
Output
10
SS
Output
4
MOSI
Output
5
MISO
Input
6
Figure 34. Timing Diagram SPI Master Mode, Format 1 (CPHA = 1)
47
Description
Min
Max
Units
SpecID
(1)
Cycle time
1024
IP-Bus Cycle
A11.31
512
IP-Bus Cycle(1)
A11.32
15.0
ns
A11.33
50.0
ns
A11.34
50.0
ns
A11.35
0.0
ns
A11.36
15.0
ns
A11.37
(1)
IP-Bus Cycle
A11.38
NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].
NOTE
Output timing is specified at a nominal 50 pF load.
1
SCK
(CLKPOL=0)
Input
SCK
(CLKPOL=1)
Input
SS
Input
MOSI
Input
4
MISO
Output
Figure 35. Timing Diagram SPI Slave Mode, Format 1 (CPHA = 1)
3.3.12 MSCAN
The CAN functions are available as RX and TX pins at normal IO pads (I2C1+GPTimer or PSC2). There
is no filter for the WakeUp dominant pulse. Any High-to-Low edge can cause WakeUp, if configured.
Freescale Semiconductor
3.3.13 I2C
Table 40. I2C Input Timing SpecificationsSCL and SDA
Sym
1
Description
Start condition hold time
Min
Max
Units
SpecID
IP-Bus Cycle(1)
A13.1
Cycle(1)
A13.2
IP-Bus
0.0
ns
A13.3
IP-Bus Cycle(1)
A13.4
0.0
ns
A13.5
(1)
IP-Bus Cycle
A13.6
IP-Bus Cycle(1)
A13.7
NOTES:
1 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].
Description
Min
Max
Units
SpecID
1 (1)
IP-Bus Cycle(3)
A13.8
2(1)
10
IP-Bus Cycle(3)
A13.9
3(2)
7.9
ns
A13.10
4(1)
5(1)
7.9
6(1)
10
7(1)
8(1)
20
9(1)
10
IP-Bus
Cycle(3)
ns
A13.11
A13.12
NOTES:
1 Programming IFDR with the maximum frequency (IFDR=0x20) results in the minimum output timings listed. The
I2C interface is designed to scale the data transition time, moving it to the middle of the SCL low period. The actual
position is affected by the prescale and division values programmed in IFDR.
2
Because SCL and SDA are open-drain-type outputs, which the processor can only actively drive low, the time SCL
or SDA takes to reach a high level depends on external signal capacitance and pull-up resistor values
3 Inter Peripheral Clock is defined in the MPC5200B User Manual [1].
NOTE
Output timing is specified at a nominal 50 pF load.
49
SCL
1
SDA
Figure 36. Timing DiagramI2C Input/Output
3.3.14 J1850
See the MPC5200B User Manual [1].
3.3.15 PSC
3.3.15.1 Codec Mode (8,16,24 and 32-bit) / I2S Mode
Table 42. Timing Specifications8,16, 24, and 32-bit CODEC / I2S Master Mode
Sym
Description
Min
Typ
Max
Units
SpecID
40.0
ns
A15.1
50
%(1)
A15.2
7.9
ns
A15.3
7.9
ns
A15.4
8.4
ns
A15.5
8.4
ns
A15.6
9.3
ns
A15.7
6.0
ns
A15.8
NOTES:
1 Bit Clock cycle time
NOTE
Output timing is specified at a nominal 50 pF load.
Freescale Semiconductor
BitClk
(CLKPOL=0)
Output
3
2
BitClk
(CLKPOL=1)
Output
4
5
FrameSync
(SyncPol = 1)
Output
FrameSync
(SyncPol = 0)
Output
7
TxD
Output
8
RxD
Input
Figure 37. Timing Diagram 8,16, 24, and 32-bit CODEC / I2S Master Mode
Table 43. Timing Specifications 8,16, 24, and 32-bit CODEC / I2S Slave Mode
Sym
1
Description
Bit Clock cycle time
Min
Typ
Max
Units
SpecID
40.0
ns
A15.9
A15.10
50
%(1)
1.0
ns
A15.11
14.0
ns
A15.12
1.0
ns
A15.13
1.0
ns
A15.14
NOTES:
1
Bit Clock cycle time
NOTE
Output timing is specified at a nominal 50 pF load.
51
BitClk
(CLKPOL=0)
Input
BitClk
(CLKPOL=1)
Input
3
FrameSync
(SyncPol = 1)
Input
FrameSync
(SyncPol = 0)
Input
4
TxD
Output
5
RxD
Input
6
Figure 38. Timing Diagram 8,16, 24, and 32-bit CODEC / I2S Slave Mode
Description
Min
Typ
Max
Units
SpecID
81.4
ns
A15.15
40.7
ns
A15.16
40.7
ns
A15.17
13.0
ns
A15.18
14.0
ns
A15.19
1.0
ns
A15.20
1.0
ns
A15.21
NOTE
Output timing is specified at a nominal 50 pF load.
Freescale Semiconductor
BitClk
(CLKPOL=0)
Input
FrameSync
(SyncPol = 1)
Output
Sdata_out
Output
6
Sdata_in
Input
Description
Min
Max
Units
SpecID
0.125
10000
A15.22
0.125
10000
A15.23
7.9
ns
A15.24
7.9
ns
A15.25
NOTE
Output timing is specified at a nominal 50 pF load.
3
IrDA_TX
(SIR / FIR / MIR)
4
1
53
Description
Min
Max
Units
SpecID
30.0
ns
A15.26
15.0
ns
A15.27
30.0
ns
A15.28
8.9
ns
A15.29
8.9
ns
A15.30
6.0
ns
A15.31
1.0
ns
A15.32
8.9
ns
A15.33
15.0
ns
A15.34
10
7.9
ns
A15.35
11
7.9
ns
A15.36
NOTE
Output timing is specified at a nominal 50 pF load.
1
10
SCK
(CLKPOL=0)
Output
2
11
SCK
(CLKPOL=1)
Output
11
10
SS
Output
5
4
MOSI
Output
6
MISO
Input
7
Freescale Semiconductor
Description
Min
Max
Units
SpecID
30.0
ns
A15.37
15.0
ns
A15.38
1.0
ns
A15.39
1.0
ns
A15.40
1.0
ns
A15.41
14.0
ns
A15.42
14.0
ns
A15.43
0.0
ns
A15.44
30.0
A15.45
NOTE
Output timing is specified at a nominal 50 pF load.
1
SCK
(CLKPOL=0)
Input
SCK
(CLKPOL=1)
Input
SS
Input
5
4
MOSI
Input
6
MISO
Output
55
Description
Min
Max
Units
SpecID
30.0
ns
A15.46
15.0
ns
A15.47
30.0
ns
A15.48
8.9
ns
A15.49
6.0
ns
A15.50
1.0
ns
A15.51
8.9
ns
A15.52
15.0
ns
A15.53
7.9
ns
A15.54
10
7.9
ns
A15.55
NOTE
Output timing is specified at a nominal 50 pF load.
1
9
SCK
(CLKPOL=0)
Output
2
10
SCK
(CLKPOL=1)
Output
10
SS
Output
4
MOSI
Output
5
MISO
Input
6
Freescale Semiconductor
Description
Min
Max
Units
SpecID
30.0
ns
A15.56
15.0
ns
A15.57
0.0
ns
A15.58
14.0
ns
A15.59
2.0
ns
A15.60
1.0
ns
A15.61
0.0
ns
A15.62
30.0
ns
A15.63
NOTE
Output timing is specified at a nominal 50 pF load.
1
SCK
(CLKPOL=0)
Input
SCK
(CLKPOL=1)
Input
SS
Input
MOSI
Input
4
MISO
Output
Figure 44. Timing Diagram SPI Slave Mode, Format 1 (CPHA = 1)
57
Description
Min
Max
Units
SpecID
tCK
Clock Period
7.52
ns
A16.1
tIS
Input Setup
12
ns
A16.2
tIH
Input Hold
ns
A16.3
tDV
Output Valid
15.33
ns
A16.4
tDH
Output Hold
ns
A16.5
tCK
tDH
tDV
Output
valid
tIH
tIS
Input
valid
Freescale Semiconductor
Characteristic
Min
Max
Unit
SpecID
25
MHz
A17.1
40
ns
A17.2
1.08
ns
A17.3
ns
A17.4
(1)
10
ns
A17.5
ns
A17.6
ns
A17.7
6
7
(2)
time(2)
15
ns
A17.8
valid(3).
30
ns
A17.9
impedance(3).
30
ns
A17.10
10
ns
A17.11
11
ns
A17.12
12
15
ns
A17.13
13
15
ns
A17.14
NOTES:
1 TRST is an asynchronous signal. The setup time is for test purposes only.
2 Non-test, other than TDI and TMS, signal input timing with respect to TCK.
3 Non-test, other than TDO, signal output timing with respect to TCK.
1
2
TCK
VM
VM
VM
VM = Midpoint Voltage
Numbers shown reference Table 51.
59
TCK
4
TRST
5
TCK
6
DATA INPUTS
8
DATA OUTPUTS
9
DATA OUTPUTS
Numbers shown reference Table 51.
TCK
10
TDI, TMS
11
12
TDO
13
TDO
Numbers shown reference Table 51.
Freescale Semiconductor
Package Description
Package Description
4.1
Package Parameters
The MPC5200B uses a 27 mm x 27 mm TE-PBGA package. The package parameters are as provided in
the following list:
Package outline: 27 mm x 27 mm
Interconnects: 272
Pitch: 1.27 mm
4.2
Mechanical Dimensions
Figure 50 provides the mechanical dimensions, top surface, side profile, and pinout for the MPC5200B,
272 TE-PBGA package.
61
Package Description
PIN A1
INDEX
0.2
4X
A
272X
0.2 A
E
0.35 A
E2
D2
0.2
NOTES:
1. DIMENSIONS AND TOLERANCING PER ASME
Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS.
3. DIMENSION IS MEASURED AT THE MAXIMUM
SOLDER BALL DIAMETER PARALLEL TO
PRIMARY DATUM A.
4. PRIMARY DATUM A AND THE SEATING PLANE
ARE DEFINED BY THE SPHERICAL CROWNS OF
THE SOLDER BALLS.
A B C
B
TOP VIEW
DIM
A
A1
A2
A3
b
D
D1
D2
E
E1
E2
e
(D1)
19X
19X
e
Y
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
(E1)
4X
e /2
A1
A3
A2
A
SIDE VIEW
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
b 3
272X
BOTTOM VIEW
MILLIMETERS
MIN
MAX
2.05
2.65
0.50
0.70
0.50
0.70
1.05
1.25
0.60
0.90
27.00 BSC
24.13 REF
23.30
24.70
27.00 BSC
24.13 REF
23.30
24.70
1.27 BSC
0.3
A B C
0.15
CASE 1135A01
ISSUE B
DATE 10/15/1997
Figure 50. Mechanical Dimensions and Pinout Assignments for the MPC5200B, 272 TE-PBGA
Freescale Semiconductor
Package Description
4.3
Pinout Listings
Alias
Type
Power Supply
Output Driver
Type
Input
Type
Pull-up/
down
SDRAM
MEM_CAS
MEM_CLK_EN
CAS
I/O
VDD_MEM_IO
DRV16_MEM
TTL
CLK_EN
I/O
VDD_MEM_IO
DRV16_MEM
TTL
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_CS
MEM_DQM[3:0]
DQM
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_MA[12:0]
MA
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_MBA[1:0]
MBA
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_MDQS[3:0]
MDQS
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_MDQ[31:0]
MDQ
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_CLK
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_CLK
I/O
VDD_MEM_IO
DRV16_MEM
TTL
I/O
VDD_MEM_IO
DRV16_MEM
TTL
I/O
VDD_MEM_IO
DRV16_MEM
TTL
MEM_RAS
MEM_WE
RAS
PCI
EXT_AD[31:0]
I/O
VDD_IO
PCI
PCI
PCI_CBE_0
I/O
VDD_IO
PCI
PCI
PCI_CBE_1
I/O
VDD_IO
PCI
PCI
PCI_CBE_2
I/O
VDD_IO
PCI
PCI
PCI_CBE_3
I/O
VDD_IO
PCI
PCI
PCI_CLOCK
I/O
VDD_IO
PCI
PCI
PCI_DEVSEL
I/O
VDD_IO
PCI
PCI
PCI_FRAME
I/O
VDD_IO
PCI
PCI
PCI_GNT
I/O
VDD_IO
DRV8
TTL
PCI_IDSEL
I/O
VDD_IO
DRV8
TTL
PCI_IRDY
I/O
VDD_IO
PCI
PCI
PCI_PAR
I/O
VDD_IO
PCI
PCI
PCI_PERR
I/O
VDD_IO
PCI
PCI
PCI_REQ
I/O
VDD_IO
DRV8
TTL
PCI_RESET
I/O
VDD_IO
PCI
PCI
PCI_SERR
I/O
VDD_IO
PCI
PCI
PCI_STOP
I/O
VDD_IO
PCI
PCI
63
Package Description
Alias
PCI_TRDY
Type
Power Supply
Output Driver
Type
Input
Type
I/O
VDD_IO
PCI
PCI
Pull-up/
down
Local Plus
LP_ACK
I/O
VDD_IO
DRV8
TTL
LP_ALE
I/O
VDD_IO
DRV8
TTL
LP_OE
I/O
VDD_IO
DRV8
TTL
LP_RW
I/O
VDD_IO
DRV8
TTL
LP_TS
I/O
VDD_IO
DRV8
TTL
LP_CS0
I/O
VDD_IO
DRV8
TTL
LP_CS1
I/O
VDD_IO
DRV8
TTL
LP_CS2
I/O
VDD_IO
DRV8
TTL
LP_CS3
I/O
VDD_IO
DRV8
TTL
LP_CS4
I/O
VDD_IO
DRV8
TTL
LP_CS5
I/O
VDD_IO
DRV8
TTL
PULLUP
ATA
ATA_DACK
I/O
VDD_IO
DRV8
TTL
ATA_DRQ
I/O
VDD_IO
DRV8
TTL
PULLDOWN
ATA_INTRQ
I/O
VDD_IO
DRV8
TTL
PULLDOWN
ATA_IOCHRDY
I/O
VDD_IO
DRV8
TTL
PULLUP
ATA_IOR
I/O
VDD_IO
DRV8
TTL
ATA_IOW
I/O
VDD_IO
DRV8
TTL
ATA_ISOLATION
I/O
VDD_IO
DRV8
TTL
Ethernet
ETH_0
TX, TX_EN
I/O
VDD_IO
DRV4
TTL
ETH_1
RTS, TXD[0]
I/O
VDD_IO
DRV4
TTL
ETH_2
USB_TXP, RTS,
TXD[1]
I/O
VDD_IO
DRV4
TTL
ETH_3
USB_PRTPWR,
TXD[2]
I/O
VDD_IO
DRV4
TTL
ETH_4
USB_SPEED,
TXD[3]
I/O
VDD_IO
DRV4
TTL
ETH_5
USB_SUPEND,
TX_ER
I/O
VDD_IO
DRV4
TTL
ETH_6
USB_OE, RTS,
MDC
I/O
VDD_IO
DRV4
TTL
ETH_7
TXN, MDIO
I/O
VDD_IO
DRV4
TTL
Freescale Semiconductor
Package Description
Type
Power Supply
Output Driver
Type
Input
Type
ETH_8
RX_DV
I/O
VDD_IO
DRV4
TTL
ETH_9
CD, RX_CLK
I/O
VDD_IO
DRV4
Schmitt
ETH_10
CTS, COL
I/O
VDD_IO
DRV4
TTL
ETH_11
TX_CLK
I/O
VDD_IO
DRV4
Schmitt
ETH_12
RXD[0]
I/O
VDD_IO
DRV4
TTL
ETH_13
USB_RXD, CTS,
RXD[1]
I/O
VDD_IO
DRV4
TTL
ETH_14
USB_RXP,
UART_RX, RXD[2]
I/O
VDD_IO
DRV4
TTL
ETH_15
USB_RXN, RX,
RXD[3]
I/O
VDD_IO
DRV4
TTL
ETH_16
USB_OVRCNT,
CTS, RX_ER
I/O
VDD_IO
DRV4
TTL
ETH_17
CD, CRS
I/O
VDD_IO
DRV4
TTL
Name
Pull-up/
down
IRDA
PSC6_0
IRDA_RX, RxD
I/O
VDD_IO
DRV4
TTL
PSC6_1
Frame, CTS
I/O
VDD_IO
DRV4
TTL
PSC6_2
IRDA_TX, TxD
I/O
VDD_IO
DRV4
TTL
PSC6_3
IR_USB_CLK,BitC
lk, RTS
I/O
VDD_IO
DRV4
Schmitt
USB
USB_0
USB_OE
I/O
VDD_IO
DRV4
TTL
USB_1
USB_TXN
I/O
VDD_IO
DRV4
TTL
USB_2
USB_TXP
I/O
VDD_IO
DRV4
TTL
USB_3
USB_RXD
I/O
VDD_IO
DRV4
TTL
USB_4
USB_RXP
I/O
VDD_IO
DRV4
TTL
USB_5
USB_RXN
I/O
VDD_IO
DRV4
TTL
USB_6
USB_PRTPWR
I/O
VDD_IO
DRV4
TTL
USB_7
USB_SPEED
I/O
VDD_IO
DRV4
TTL
USB_8
USB_SUPEND
I/O
VDD_IO
DRV4
TTL
USB_9
USB_OVRCNT
I/O
VDD_IO
DRV4
TTL
I2C
I2C_0
SCL
I/O
VDD_IO
DRV4
Schmitt
I2C_1
SDA
I/O
VDD_IO
DRV4
Schmitt
I2C_2
SCL
I/O
VDD_IO
DRV4
Schmitt
65
Package Description
Alias
Type
Power Supply
Output Driver
Type
Input
Type
Pull-up/
down
SDA
I/O
VDD_IO
DRV4
Schmitt
PSC
PSC1_0
TxD, Sdata_out,
MOSI, TX
I/O
VDD_IO
DRV4
TTL
PSC1_1
RxD, Sdata_in,
MISO, TX
I/O
VDD_IO
DRV4
TTL
PSC1_2
I/O
VDD_IO
DRV4
TTL
PSC1_3
I/O
VDD_IO
DRV4
Schmitt
PSC1_4
Frame, SS, CD
I/O
VDD_IO
DRV4
TTL
PSC2_0
TxD, Sdata_out,
MOSI, TX
I/O
VDD_IO
DRV4
TTL
PSC2_1
RxD, Sdata_in,
MISO, TX
I/O
VDD_IO
DRV4
TTL
PSC2_2
I/O
VDD_IO
DRV4
TTL
PSC2_3
I/O
VDD_IO
DRV4
Schmitt
PSC2_4
Frame, SS, CD
I/O
VDD_IO
DRV4
TTL
PSC3_0
USB_OE, TxDS,
TX
I/O
VDD_IO
DRV4
TTL
PSC3_1
USB_TXN, RxD,
RX
I/O
VDD_IO
DRV4
TTL
PSC3_2
USB_TXP, BitClk,
RTS
I/O
VDD_IO
DRV4
Schmitt
PSC3_3
USB_RXD, Frame,
SS, CTS
I/O
VDD_IO
DRV4
TTL
PSC3_4
USB_RXP, CD
I/O
VDD_IO
DRV4
TTL
PSC3_5
USB_RXN
I/O
VDD_IO
DRV4
TTL
PSC3_6
USB_PRTPWR,
Mclk, MOSI
I/O
VDD_IO
DRV4
TTL
PSC3_7
USB_SPEED.
MISO
I/O
VDD_IO
DRV4
TTL
PSC3_8
USB_SUPEND,
SS
I/O
VDD_IO
DRV4
TTL
PSC3_9
USB_OVRCNT,
SCK
I/O
VDD_IO
DRV4
TTL
GPIO/TIMER
GPIO_WKUP_6
MEM_CS1
I/O
VDD_MEM_IO
DRV16_MEM
TTL
GPIO_WKUP_7
I/O
VDD_IO
DRV8
TTL
TIMER_0
I/O
VDD_IO
DRV4
TTL
PULLUP_MEM
Freescale Semiconductor
Package Description
Alias
TIMER_1
Type
Power Supply
Output Driver
Type
Input
Type
I/O
VDD_IO
DRV4
TTL
TIMER_2
MOSI
I/O
VDD_IO
DRV4
TTL
TIMER_3
MISO
I/O
VDD_IO
DRV4
TTL
TIMER_4
SS
I/O
VDD_IO
DRV4
TTL
TIMER_5
SCK
I/O
VDD_IO
DRV4
TTL
TIMER_6
I/O
VDD_IO
DRV4
TTL
TIMER_7
I/O
VDD_IO
DRV4
TTL
VDD_IO
DRV4
Schmitt
Schmitt
Pull-up/
down
Clock
SYS_XTAL_IN
SYS_XTAL_OUT
RTC_XTAL_IN
RTC_XTAL_OUT
Input
VDD_IO
Output
VDD_IO
Input
VDD_IO
Output
VDD_IO
Misc
Input
PORRESET
HRESET
I/O
VDD_IO
DRV8_OD1
SRESET
I/O
VDD_IO
DRV8_OD1
Schmitt
IRQ0
I/O
VDD_IO
DRV4
TTL
IRQ1
I/O
VDD_IO
DRV4
TTL
IRQ2
I/O
VDD_IO
DRV4
TTL
IRQ3
I/O
VDD_IO
DRV4
TTL
Test/Configuration
SYS_PLL_TPA
I/O
VDD_IO
DRV4
TTL
TEST_MODE_0
Input
VDD_IO
DRV4
TTL
TEST_MODE_1
Input
VDD_IO
DRV4
TTL
TEST_SEL_0
I/O
VDD_IO
DRV4
TTL
TEST_SEL_1
I/O
VDD_IO
DRV8
TTL
PULLUP
JTAG_TCK
TCK
Input
VDD_IO
DRV4
Schmitt
PULLUP
JTAG_TDI
TDI
Input
VDD_IO
DRV4
TTL
PULLUP
JTAG_TDO
TDO
I/O
VDD_IO
DRV8
TTL
JTAG_TMS
TMS
Input
VDD_IO
DRV4
TTL
PULLUP
JTAG_TRST
TRST
Input
VDD_IO
DRV4
TTL
PULLUP
67
Alias
Type
VDD_MEM_IO
VDD_CORE
VSS_IO/CORE
SYS_PLL_AVDD
CORE_PLL_AVDD
Power Supply
Output Driver
Type
Input
Type
Pull-up/
down
NOTES:
1 All open drain outputs of the MPC5200B are actually regular three-state output drivers with the output data tied
low and the output enable controlled. Thus, unlike a true open drain, there is a current path from the external
system to the MPC5200B I/O power rail if the external signal is driven above the MPC5200B I/O power rail voltage.
5.1
Figure 51 shows situations in sequencing the I/O VDD (VDD_IO), Memory VDD (VDD_IO_MEM), PLL
VDD (PLL_AVDD), and Core VDD (VDD_CORE).
Freescale Semiconductor
3.3V
VDD_IO,
VDD_IO_MEM (SDR)
2.5V
VDD_IO_MEM (DDR)
VDD_CORE,
PLL_AVDD
1.5V
0
Time
Note:
The relationship between VDD_IO_MEM and VDD_IO is non-critical during power-up and power-down
sequences. Both VDD_IO_MEM (2.5 V or 3.3 V) and VDD_IO are specified relative to VDD_CORE.
5.1.1
Power Up Sequence
If VDD_IO/VDD_IO_MEM are powered up with the VDD_CORE at 0V, the sense circuits in the I/O pads
will cause all pad output drivers connected to the VDD_IO/VDD_IO_MEM to be in a high-impedance
state. There is no limit to how long after VDD_IO/VDD_IO_MEM powers up before VDD_CORE must
power up. VDD_CORE should not lead the VDD_IO, VDD_IO_MEM or PLL_AVDD by more than 0.4
V during power ramp up or there will be high current in the internal ESD protection diodes. The rise times
on the power supplies should be slower than 1 microsecond to avoid turning on the internal ESD protection
clamp diodes.
The recommended power up sequence is as follows:
Use one microsecond or slower rise time for all supplies.
VDD_CORE/PLL_AVDD and VDD_IO/VDD_IO_MEM should track up to 0.9 V and then separate for
the completion of ramps with VDD_IO/VDD_IO_MEM going to the higher external voltages. One way
to accomplish this is to use a low drop-out voltage regulator.
MPC5200B Data Sheet, Rev. 1
Freescale Semiconductor
69
5.1.2
If VDD_CORE/PLL_AVDD are powered down first, then sense circuits in the I/O pads will cause all
output drivers to be in a high impedance state. There is no limit on how long after VDD_CORE and
PLL_AVDD power down before VDD_IO or VDD_IO_MEM must power down. VDD_CORE should not
lag VDD_IO, VDD_IO_MEM, or PLL_AVDD going low by more than 0.5V during power down or there
will be undesired high current in the ESD protection diodes. There are no requirements for the fall times
of the power supplies.
The recommended power down sequence is as follows:
Drop VDD_CORE/PLL_AVDD to 0V.
Drop VDD_IO/VDD_IO_MEM supplies.
5.2
Each of the independent PLL power supplies require filtering external to the device. The following
drawing is a recommendation for the required filter circuit.
Power
Supply
source
<1
10
10 F
200-400 pF
5.3
5.3.1
The MPC5200B requires pull-down resistors on the test pins TEST_MODE_0, TEST_MODE_1,
TEST_SEL_1.
5.3.2
If the PCI interface is NOT used (and internally disabled) the PCI control pins must be terminated as
indicated by the PCI Local Bus specification [4]. This is also required for MOST/Graphics and Large Flash
Mode.
PCI control signals always require pull-up resistors on the motherboard (not the expansion board) to
ensure that they contain stable values when no agent is actively driving the bus. This includes
MPC5200B Data Sheet, Rev. 1
70
Freescale Semiconductor
5.3.3
The MEM_MDQS[3:0] signals are not used with SDR memories and require pull-up or pull-down
resistors in SDRAM mode.
5.3.4
The MEM_MDQS[1:0] signals are not used in DDR 16-bit mode and require pull-down resistors.
5.4
JTAG
The MPC5200B provides the user an IEEE 1149.1 JTAG interface to facilitate board/system testing. It also
provides a Common On-Chip Processor (COP) Interface, which shares the IEEE 1149.1 JTAG port. The
COP Interface provides access to the MPC5200B's embedded Freescale (formerly Motorola) MPC603e
e300 processor. This interface provides a means for executing test routines and for performing software
development and debug functions.
5.4.1
JTAG_TRST
Boundary scan testing is enabled through the JTAG interface signals. The JTAG_TRST signal is optional
in the IEEE 1149.1 specification but is provided on all processors that implement the PowerPC
architecture. To obtain a reliable power-on reset performance, the JTAG_TRST signal must be asserted
during power-on reset.
5.4.1.1
The JTAG interface can control the direction of the MPC5200B I/O pads via the boundary scan chain. The
JTAG module must be reset before the MPC5200B comes out of power-on reset; do this by asserting
JTAG_TRST before PORRESET is released.
For more details refer to the Reset and JTAG Timing Specification.
71
PORRESET
required assertion of JTAG_TRST
JTAG_TRST
5.4.1.2
Connecting JTAG_TRST
The wiring of the JTAG_TRST depends on the existence of a board-related debug interface. (see below)
Normally this interface is implemented, using a COP (common on-chip processor) connector. The COP
allows a remote computer system (typically, a PC with dedicated hardware and debugging software) to
access and control the internal operations of the MPC5200B.
5.4.2
There are two possibilities to connect the JTAG interface: using it with a COP connector and without a
COP connector.
5.4.2.1
The MPC5200B functional pin interface and internal logic provides access to the embedded e300
processor core through the Freescale (formerly Motorola) standard COP/BDM interface. Table 53 gives
the COP/BDM interface signals. The pin order shown reflects only the COP/BDM connector order.
Table 53. COP/BDM Interface Signals
BDM
Pin #
MPC5200B
I/O Pin
BDM
Connector
Internal
Pull Up/Down
External
Pull Up/Down
I/O (1)
16
GND
15
TEST_SEL_0
ckstp_out
14
KEY
13
HRESET
hreset
10k Pull-Up
12
GND
11
SRESET
sreset
10k Pull-Up
10
N/C
JTAG_TMS
tms
100k Pull-Up
10k Pull-Up
N/C
Freescale Semiconductor
MPC5200B
I/O Pin
BDM
Connector
Internal
Pull Up/Down
External
Pull Up/Down
I/O (1)
JTAG_TCK
tck
100k Pull-Up
10k Pull-Up
VDD (2)
(3)
(3)
See Note
halted
JTAG_TRST
trst
100k Pull-Up
10k Pull-Up
JTAG_TDI
tdi
100k Pull-Up
10k Pull-Up
See Note
(4)
JTAG_TDO
qack
(4)
tdo
NOTES:
1.
2.
3.
4.
For a board with a COP (common on-chip processor) connector, which accesses the JTAG interface and
which needs to reset the JTAG module, simply wiring JTAG_TRST and PORRESET is not recommended.
To reset the MPC5200B via the COP connector, the HRESET pin of the COP should be connected to the
HRESET pin of the MPC5200B. The circuitry shown in Figure 54 allows the COP to assert HRESET or
JTAG_TRST separately, while any other board sources can drive PORRESET.
73
PORRESET
PORRESET
COP Header
13
11
HRESET
8
10
11
12
13
VDD
10Kohm
10Kohm
SRESET
TRST
JTAG_TRST
Key 14
9
10Kohm
TMS
VDD
JTAG_TMS
12
6 (2)
Key
MPC5200B
VDD
7
9
HRESET
VDD
SRESET
16
COP Connector
Physical Pinout
10Kohm
10Kohm
TCK
VDD
VDD
JTAG_TCK
10Kohm
TDI
VDD
JTAG_TDI
15
16
15
1
CKSTP_OUT
TEST_SEL_0
TDO
JTAG_TDO
halted
5 (3)
NC
qack
(4)
2
NC
10
NC
NC
5.4.2.2
If the JTAG interface is not used, JTAG_TRST should be tied to PORRESET, so that it is asserted when
the system reset signal (PORRESET) is asserted. This ensures that the JTAG scan chain is initialized
during power on. Figure 55 shows the connection of the JTAG interface without COP connector.
Freescale Semiconductor
Ordering Information
PORRESET
PORRESET
HRESET
10Kohm
SRESET
10Kohm
HRESET
MPC5200B
VDD
VDD
SRESET
JTAG_TRST
10Kohm
VDD
JTAG_TMS
10Kohm
VDD
JTAG_TCK
10Kohm
VDD
JTAG_TDI
TEST_SEL_0
JTAG_TDO
Ordering Information
Table 54. Ordering Information
Part Number *
Speed
Ambient Temp
Qualification **
Packaging ***
MPC5200VR400B
400
0C to 70C
Commercial
MPC5200CVR400B
400
-40C to 85C
Industrial
SPC5200VVR266B
266
-40C to 105C
Automotive - AEC
SPC5200CBV400B
400
-40C to 85C
Automotive - AEC
Standard
SPC5200CVR400B
400
-40C to 85C
Automotive - AEC
75
Substantive Change(s)
0.1
0.2
Updates to Ethernet, LPC, Power Down, Input Leakage, Ordering Information (7/2005)
0.3
0.4
0.5
Applied marked-up hard copy edits and Tabasco excel edits (10/2005)
0.6
Changed the alias name for ETH_2 to USB_TXP, RTS, TXD[1] in Table 52.
0.7
Table 2:
Two rows were added at the bottom that with ranges from -40 to +105 and -40 to +125
The rows from -40 to +85 and -40 to +115 were footnoted with "Maximum e300 core operating
frequency is 400 MHz.
The rows from -40 to +115 and -40 to +125 were footnoted with "Maximum e300 core operating
frequency is 266 MHz
Table 54:
Eliminated all part numbers for 466 MHz
Eliminated all "standard" package part numbers except for the one automotive grade at 400 MHz
MPC5200CVR266B was changed to MPC5200CVR400B with the speed of 400 MHz
Table 12: 466 MHz was changed to 400 MHz; removed 2 blank pages
Freescale Semiconductor
77
MPC5200BDS
Rev. 1, 1/2006