TI 950 Operational Reference Guide PDF
TI 950 Operational Reference Guide PDF
TI 950 Operational Reference Guide PDF
Calibrations
Tip-to-Optic Calibration
- The Tip-To-Optic calibration updates the offset between the optic focal point and the tip
indentation location. This should be performed whenever the transducer has been removed.
Operational procedure
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9.
The open-loop load function window will open. If using a standard indentation/scratch transducer, do
not change anything; just click the Cal Air Indent button. If you are using the nanoDMA transducer,
the peak force should be changed to 1200 N; then click the Cal Air Indent button.
Allow the calibration to run. Verify that the displacement of the air indent is around 3-4 m. You can
check if your calibration looks normal by comparing the result to the user manual. Accept the
calibration and close the calibration windows.
If you plan to do scratch testing, click the Calibrate button under the Scratch Axis heading on the
System Calibration sub tab. The open-loop scratch load function will open and the system will
automatically change the mode to Scratch. Do not change anything on this window; just click the Cal
Air Scratch button. When the calibration has finished, accept the calibration.
If you plan to do nanoDMA testing, make sure that the lock-in amplifier is powered on and click the
Calibrate button under the nanoDMA heading on the System Calibration sub tab. The system will
change to nanoDMA mode. The nanoDMA calibration window will open. Use the default settings by
clicking Test button. The test will take approximately 10-15 minutes to perform. When complete, click
on the plot and move the blue indicator bars to the beginning and end of the plot. With the entire plot
selected, click the Calibrate button. If the result fits well, the calibration is finished, if it does not fit
well, confirm that the blue range bars are pulled to opposite sides or consult the user manual for more
information on how to reset the starting values.
If the transducer has not been removed since the last H-pattern (tip-optic offset calibration) has been
performed, the system is now ready to test. If the transducer or tip has been recently installed, you will
need to perform the H-pattern (tip-optic offset calibration). You will perform this on the polycarbonate
or aluminum sample. This calibration is in the Calibration tab Stage Calibration sub tab. Use the
on-screen directions for completing this procedure or follow the procedure given in the user manual.
Optically locate and focus on the sample to be tested and define the sample boundary. Either perform a
Quick Approach OR go to the Imaging tab and approach the sample. Testing can now be performed
by optically locating an area of interest and clicking the Perform Test button from the load function
window OR by scanning the surface and clicking Perform Test from either the imaging panel or load
function panel.
Remember, while you are imaging the surface, when you click Perform Test, the currently open load
function for the Mode (as defined at the top of the software) will be performed. Make sure you are in
the correct testing mode for the type of test you plan to perform.
The workspace can be saved to retain sample boundaries, method setups, and preference changes.
When you are done testing, make sure the probe is withdrawn from the sample surface.
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DO
Perform the Z-Axis Calibration (air indent) daily or whenever the transducer is removed and reinstalled. A
satisfactory Z-Axis Calibration indicates everything is installed and working correctly before approaching a
surface.
If you are testing a sample with height variation, ALWAYS define the highest portion of the sample as a
boundary. The system needs to know where the highest portion of the sample is in order to avoid this
portion during automatic stage moves.
Perform an H-pattern each time the transducer and/or tip have been removed and reinstalled.
If you remove your transducer or scanner from the system always store them in the supplied storage cases
(with the pink foam). Store these components in an air conditioned room where they will not be dropped or
subjected to excessive vibration. The transducer should not be stored with a tip still attached.
Securely mount the samples using a stiff glue, vacuum, or magnets.
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Perform your load functions as quickly as possible while still allowing the creep to alleviate to a quasistatic unloading point. The drift is measured immediately before the test and assumed constant during the
test. For short tests (30 seconds or less) this is typically very accurate, however the longer the test the less
accurate this assumption will be.
DO NOT
Attempt to perform a test on a sample without having completed a Z-Axis Calibration (air indent). If
something is not connected or installed correctly you may damage the system.
Install taller samples on the left side. If the taller samples are on the left side the transducer housing can
contact the sample while focusing on a short sample to the right and break the piezo tube.
Attempt to approach a surface using quick approach or perform a test if a H-pattern has not been completed
since the current transducer and tip have been installed.
Store your transducer in the plastic case (with the pink foam) with a tip installed. Always remove the tip
from the transducer for storage.
Use double sided tape to mount samples. There will be compliance issues that affect the displacement
results.
Leave your nanoindentation probe in-contact with the sample surface for extended periods of time while
unattended.
Perform tests that are several minutes long unless you have a reason to do so. The drift rate will not be
constant and will not be properly accounted for.
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Why did my quick approach fail? (either takes over 5 minutes to approach or crashes into the sample)
- The Tip-To-Optic calibration needs to be performed before a quick approach if the transducer has
been moved or the tip changed. If the Tip-To-Optic calibration has been completed, check that the
optical focus is actually on the top surface and not focused through a transparent sample or on a
false optic reflection pattern.
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