Keysight Technologies

Network Analyzer Basics

Training Deliverable
 Abstract
This presentation covers the principles of
measuring high-frequency electrical networks
with network analyzers. You will learn what
kinds of measurements are made with network
analyzers, and how they allow you to charac-
terize both linear and nonlinear behavior of
your devices. The session starts with RF
fundamentals such as transmission lines and
the Smith chart, leading to the concepts of
reflection, transmission and S-parameters.
The next section covers the major components
in a network analyzer, including the advantages
and limitations of different hardware approaches.
Error modeling, accuracy enhancement, and
various calibration techniques will then be pre-
sented. Finally, some typical swept-frequency
and swept-power measurements commonly
performed on filters and amplifiers will be
covered. An appendix is also included with
information on advanced topics, with pointers
to more information.

2
 Network Analysis
is Not....
This module is not about computer networks!
When the name “network analyzer” was coined
many years ago, there were no such things as
computer networks. Back then, networks
always referred to electrical networks. Today,
when we refer to the things that network
analyzers measure, we speak mostly about
devices and components.

What Types of Devices

Are Tested?
Here are some examples of the types of
devices that you can test with network
analyzers. They include both passive and
active devices (and some that have attributes
of both). Many of these devices need to be
characterized for both linear and nonlinear
behavior. It is not possible to completely
characterize all of these devices with just
one piece of test equipment.

The next slide shows a model covering the wide

range of measurements necessary for com-
plete linear and nonlinear characterization
of devices. This model requires a variety of
stimulus and response tools. It takes a large
range of test equipment to accomplish all of
the measurements shown on this chart. Some
instruments are optimized for one test only
(like bit-error rate), while others, like network
analyzers, are much more general purpose in
nature. Network analyzers can measure both
linear and nonlinear behavior of devices,
although the measurement techniques are
different (frequency versus power sweeps for
example). This module focuses on swept-
frequency and swept-power measurements
made with network analyzers

3
 Device Test
Measurement Model
Here is a key to many of the
abbreviations used at right:

Response
84000 8400 series high-volume RFIC tester
Ded. Testers Dedicated (usually one-box) testers
VSA Vector signal analyzer

SA Spectrum analyzer
VNA Vector signal analyzer

TG/SA Tracking generator/spectrum analyzer

SNA Scalar network analyzer

NF Mtr. Noise-figure meter

Imped. An. Impedance analyzer (LCR meter)
Power Mtr. Power meter
Det./Scope Diode detector/oscilloscope

Measurement
ACP Adjacent channel power
AM-PM AM to PM conversion
BER Bit-error rate
Compr’n Gain compression
Constell. Constellation diagram
EVM Error-vector magnitude
Eye Eye diagram
GD Group delay
Harm. Dist. Harmonic distortion
NF Noise figure
Regrowth Spectral regrowth

Rtn Ls Return loss

VSWR Voltage standing wave ratio

4
 Lightwave Analogy
to RF Energy
One of the most fundamental concepts of
high-frequency network analysis involves
incident, reflected and transmitted waves
traveling along transmission lines. It is helpful
to think of traveling waves along a transmission
line in terms of a lightwave analogy. We can
imagine incident light striking some optical
component like a clear lens. Some of the light
is reflected off the surface of the lens, but most
of the light continues on through the lens. If
the lens were made of some lossy material,
then a portion of the light could be absorbed
within the lens. If the lens had mirrored surfac-
es, then most of the light would be reflected
and little or none would be transmitted
through the lens. This concept is valid for RF
signals as well, except the electromagnetic
energy is in the RF range instead of the optical
range, and our components and circuits are
electrical devices and networks instead of
lenses and mirrors.

Network analysis is concerned with the accu-

rate measurement of the ratios of the reflected
signal to the incident signal, and the transmit-
ted signal to the incident signal.

5
 Why Do We Need to
–
Test Components?
–
Components are tested for a variety of reasons.
-- Many components are used as “building
-- blocks” in more complicated RF systems.
– For example, in most transceivers there are
amplifiers to boost LO power to mixers, and
filters to remove signal harmonics. Often, R&D
engineers need to measure these components
to verify their simulation models and their
actual hardware prototypes. For component
production, a manufacturer must measure
the performance of their products so they
can provide accurate specifications. This is
essential so prospective customers will know
how a particular component will behave in
their application.

When used in communications systems to pass

signals, designers want to ensure the compo-
nent or circuit is not causing excessive signal
distortion. This can be in the form of linear dis-
tortion where flat magnitude and linear phase
shift versus frequency is not maintained over
the bandwidth of interest, or in the form of
nonlinear effects like intermodulation distortion.

Often it is most important to measure how

reflective a component is, to ensure that it
absorbs energy efficiently. Measuring
antenna match is a good example.

6
 The Need for Both
Magnitude and Phase
In many situations, magnitude-only data is
sufficient for out needs. For example, we may
only care about the gain of an amplifier or the
stop-band rejection of a filter. However, as we
will explore throughout this paper, measuring
phase is a critical element of network analysis.

Complete characterization of devices and

networks involves measurement of phase
as well as magnitude. This is necessary for
developing circuit models for simulation and to
design matching circuits based on conjugate-
matching techniques. Time-domain charac-
terization requires magnitude and phase
information to perform the inverse-Fourier
transform. Finally, for best measurement
accuracy, phase data is required to perform
vector error correction.

–
Agenda
--
-- In this section we will review reflection and
-- transmission measurements. We will see that
– transmission lines are needed to convey RF
-- and microwave energy from one point to
--
-- another with minimal loss, that transmission
-- lines have a characteristic impedance, and that
– a termination at the end of a transmission line
-- must match the characteristic impedance of
-- the line to prevent loss of energy due to
-- reflections. We will see how the Smith chart
-- simplifies the process of converting reflection
– data to the complex impedance of the termina-
–
tion. For transmission measurements, we will
discuss not only simple gain and loss but dis-
tortion introduced by linear devices. We will
introduce S-parameters and explain why they
are used instead of h-, y-, or z-parameters at
RF and microwave frequencies.

7
 Transmission Line Basics
The need for efficient transfer of RF power is
one of the main reasons behind the use of
– transmission lines. At low frequencies where
– the wavelength of the signals are much larger
– than the length of the circuit conductors, a
simple wire is very useful for carrying power.
Current travels down the wire easily, and
voltage and current are the same no matter
where we measure along the wire.

At high frequencies however, the wavelength

– of signals of interest are comparable to or
– much smaller than the length of conductors.
– In this case, power transmission can best be
thought of in terms of traveling waves.
– Of critical importance is that a lossless transmis-
sion line takes on a characteristic impedance
(Zo). In fact, an infinitely long transmission line
appears to be a resistive load! When the trans-
mission line is terminated in its characteristic
impedance, maximum power is transferred to
the load. When the termination is not Zo, the
portion of the signal which is not absorbed by
the load is reflected back toward the source.
This creates a condition where the envelope
voltage along the transmission line varies with
position. We will examine the incident and
reflected waves on transmission lines with
different load conditions in following slides

8
 Transmission Line Z0
–
– RF transmission lines can be made in a variety
of transmission media. Common examples are
–
coaxial, waveguide, twisted pair, coplanar,
stripline and microstrip. RF circuit design on
printed-circuit boards (PCB) often use coplanar
or microstrip transmission lines. The funda-
mental parameter of a transmission line is its
characteristic impedance Zo. Zo describes the
relationship between the voltage and current
traveling waves, and is a function of the various
dimensions of the transmission line and the
dielectric constant (εt ) of the non-conducting
material in the transmission line. For most RF
systems, Zo is either 50 or 75 ohms.

For low-power situations (cable TV, for exam-

ple) coaxial transmission lines are optimized
for low loss, which works out to about 75 ohms
(for coaxial transmission lines with air dielec-
tric). For RF and microwave communication
and radar applications, where high power is often
encountered, coaxial transmission lines are
designed to have a characteristic impedance
of 50 ohms, a compromise between maximum
power handling (occurring at 30 ohms) and
minimum loss.

9
 Power Transfer
Efficiency
Before we begin our discussion about trans-
mission lines, let us look at the condition for
maximum power transfer into a load, given a
source impedance of Rs. The graph above
shows that the matched condition (RL = RS)
results in the maximum power dissipated in
the load resistor. This condition is true whether
the stimulus is a DC voltage source or an
RF sinusoid.

For maximum transfer of energy into a

transmission line from a source or from a
transmission line to a load (the next stage of
an amplifier, an antenna, etc.), the impedance
of the source and load should match the char-
acteristic impedance of the transmission line.
In general, then, Zo is the target for input and
output impedances of devices and networks.

When the source impedance is not purely

resistive, the maximum power transfer occurs
when the load impedance is equal to the com-
plex conjugate of the source impedance. This
condition is met by reversing the sign of the
imaginary part of the impedance. For example,
if RS = 0.6 + j0.3, then the complex
conjugate RS* = 0.6 - j0.3.

Sometimes the source impedance is adjusted

to be the complex conjugate of the load
impedance. For example, when matching to an
antenna, the load impedance is determined by
the characteristics of the antenna. A designer
has to optimize the output match of the RF
amplifier over the frequency range of the
antenna so that maximum RF power is
transmitted through the antenna.

10
 Transmission Line
Terminated With Z 0
Let’s review what happens when transmission
lines are terminated in various impedances,
starting with a Zo load. Since a transmission
line terminated in its characteristic impedance
results in maximum transfer of power to the
load, there is no reflected signal. This result
is the same as if the transmission line was
infinitely long. If we were to look at the enve-
lope of the RF signal versus distance along
the transmission line, it would be constant (no
standing-wave pattern). This is because there
is energy flowing in one direction only.

11
 Transmission Line Terminated
with Short, Open
Next, let’s terminate our line in a short circuit.
Since purely reactive elements cannot dissi-
pate any power, and there is nowhere else for
the energy to go, a reflected wave is launched
back down the line toward the source. For
Ohm’s law to be satisfied (no voltage across
the short), this reflected wave must be equal in
voltage magnitude to the incident wave, and
be 180° out of phase with it. This satisfies the
condition that the total voltage must equal zero
at the plane of the short circuit. Our reflected
and incident voltage (and current) waves will
be identical in magnitude but traveling in the
opposite direction.

Now let us leave our line open. This time,

Ohm’s law tells us that the open can support
no current. Therefore, our reflected current
wave must be 180° out of phase with respect
to the incident wave (the voltage wave will be
in phase with the incident wave). This guaran-
tees that current at the open will be zero.
Again, our reflected and incident current (and
voltage) waves will be identical in magnitude,
but traveling in the opposite direction. For both
the short and open cases, a standing-wave
pattern will be set up on the transmission line.
The valleys will be at zero and the peaks at
twice the incident voltage level. The peaks and
valleys of the short and open will be shifted in
position along the line with respect to each
other, in order to satisfy Ohm’s law as
described above.

12
 Transmission Line
Terminated with 25 Ω
Finally, let’s terminate our line with a 25 Ω
resistor (an impedance between the full reflec-
tion of an open or short circuit and the perfect
termination of a 50 Ω load). Some (but not all)
of our incident energy will be absorbed in the
load, and some will be reflected back towards
the source. We will find that our reflected volt-
age wave will have an amplitude 1/3 that of
the incident wave, and that the two waves will
be 180o out of phase at the load. The phase
relationship between the incident and reflected
waves will change as a function of distance
along the transmission line from the load. The
valleys of the standing-wave pattern will no
longer be zero, and the peak will be less than
that of the short/open case.

The significance of standing waves should not

go unnoticed. Ohm’s law tells us the complex
relationship between the incident and reflected
signals at the load. Assuming a 50-ohm
source, the voltage across a 25-ohm load
resistor will be two thirds of the voltage across
a 50-ohm load. Hence, the voltage of the
reflected signal is one third the voltage of the
incident signal and is 180° out of phase with it.
However, as we move away from the load
toward the source, we find that the phase
between the incident and reflected signals
changes! The vector sum of the two signals
therefore also changes along the line, produc-
ing the standing wave pattern. The apparent
impedance also changes along the line
because the relative amplitude and phase of
the incident and reflected waves at any given
point uniquely determine the measured imped-
ance. For example, if we made a measurement
one quarter wavelength away from the 25-ohm
load, the results would indicate a 100-ohm
load. The standing wave pattern repeats
every half wavelength, as does the apparent
impedance.

13
 High-Frequency
Device Characterization
Now that we fully understand the relationship
of electromagnetic waves, we must also
recognize the terms used to describe them.
Common network analyzer terminology has
the incident wave measured with the R (for
reference) receiver. The reflected wave is mea-
sured with the A receiver and the transmitted
wave is measured with the B receiver. With
amplitude and phase information of these
three waves, we can quantify the reflection
and transmission characteristics of our device
under test (DUT). Some of the common mea-
sured terms are scalar in nature (the phase
part is ignored or not measured), while others
are vector (both magnitude and phase are mea-
sured). For example, return loss is a scalar
measurement of reflection, while impedance
results from a vector reflection measurement.
Some, like group delay, are purely phase-
related measurements.

Ratioed reflection is often shown as A/R and

ratioed transmission is often shown as B/R,
relating to the measurement receivers used
in the network analyzer

14
 Reflection Parameters
Let’s now examine reflection measurements.
The first term for reflected waves is reflection
coefficient gamma (ΓΓ). Reflection coefficient is
the ratio of the reflected signal voltage to the
incident signal voltage. It can be calculated
as shown above by knowing the impedances
of the transmission line and the load. The
magnitude portion of gamma is called rho (ρ).
A transmission line terminated in Zo will have
all energy transferred to the load; hence
Vrefl = 0 and ρ = 0. When ZL is not equal to Zo,
some energy is reflected and ρ is greater than
zero. When ZL is a short or open circuit, all
energy is reflected and ρ = 1. The range of
possible values for ρ is therefore zero to one.

Since it is often very convenient to show

reflection on a logarithmic display, the second
way to convey reflection is return loss. Return
loss is expressed in terms of dB, and is a scalar
quantity. The definition for return loss includes
a negative sign so that the return loss value is
always a positive number (when measuring
reflection on a network analyzer with a log
magnitude format, ignoring the minus sign
gives the results in terms of return loss).
Return loss can be thought of as the number
of dB that the reflected signal is below the
incident signal. Return loss varies between
infinity for a Zo impedance and 0 dB for an
open or short circuit.

As we have already seen, two waves traveling in

opposite directions on the same transmission
line cause a “standing wave”. This condition
can be measured in terms of the voltage-
standing-wave ratio (VSWR or SWR for short).
VSWR is defined as the maximum value of the
RF envelope over the minimum value of the
envelope. This value can be computed as
(1 +ρ)/(1–ρ). VSWR can take ??????

15
 impedance graphically? Since there is a one-to-
one correspondence between complex reflec-
tion coefficient and impedance, we can map
one plane onto the other. If we try to map the
polar plane onto the rectilinear impedance
plane, we find that we have problems. First of
all, the rectilinear plane does not have values
to infinity. Second, circles of constant reflec-
tion coefficient are concentric on the polar
plane but not on the rectilinear plane, making
it difficult to make judgments regarding two
different impedances. Finally, phase angles
plot as radii on the polar plane but plot as
arcs on the rectilinear plane, making it difficult
to pinpoint.

The proper solution was first used in the

1930’s, when Phillip H. Smith mapped the
impedance plane onto the polar plane, creating
the chart that bears his name (the venerable
Smith chart). Since unity at zero degrees
on the polar plane represents infinite imped-
ance, both plus and minus infinite reactances,
as well as infinite resistance can be plotted.
On the Smith chart, the vertical lines on
Smith Chart Review the rectilinear plane that indicate values of
constant resistance map to circles, and the
Our network analyzer gives us complex reflec- horizontal lines that indicate values of constant
tion coefficient. However, we often want to reactance map to arcs. Zo maps to the exact
know the impedance of the DUT. The previous center of the chart.
slide shows the relationship between reflection
coefficient and impedance, and we could man- In general, Smith charts are normalized to Zo;
ually perform the complex math to find the that is, the impedance values are divided by
impedance. Although programmable calcula- Zo. The chart is then independent of the char-
tors and computers take the drudgery out acteristic impedance of the system in question.
of doing the math, a single number does not Actual impedance values are derived by multi-
always give us the complete picture. In addi- plying the indicated value by Zo. For example,
tion, impedance almost certainly changes with in a 50-ohm system, a normalized value of
frequency, so even if we did all the math, we 0.3 - j0.15 becomes 15 - j7.5 ohms; in a
would end up with a table of numbers that 75-ohm system, 22.5 - j11.25 ohms.
may be difficult to interpret.
Fortunately, we no longer have to go through
A simple, graphical method solves this prob- the exercise ourselves. Out network analyzer
lem. Let’s first plot reflection coefficient using can display the Smith chart, plot measured
a polar display. For positive resistance, the data on it, and provide adjustable markers that
absolute magnitude of varies from zero show the calculated impedance at the marked
(perfect load) to unity (full reflection) at some point in several marker formats.
angle. So we have a unit circle, which marks
the boundary of the polar plane shown on the
slide. An open would plot at 1 < 0o; a short at
1 < 180o; a perfect load at the center, and so
on. How do we get from the polar data to

16
 Transmission Parameters
Transmission coefficient _ is defined as the
transmitted voltage divided by the incident
voltage. If |Vtrans| > |Vinc|, the DUT has gain,
and if |Vtrans| < |Vinc|, the DUT exhibits attenua-
tion or insertion loss. When insertion loss
is expressed in dB, a negative sign is added
in the definition so that the loss value is
expressed as a positive number. The phase
portion of the transmission coefficient is called
insertion phase. There is more to transmission
than simple gain or loss. In communications
systems, signals are time varying —they occupy
a given bandwidth and are made up of multiple
frequency components. It is important then
to know to what extent the DUT alters the
makeup of the signal, thereby causing signal
distortion. While we often think of distortion as
only the result of nonlinear networks, we will
see shortly that linear networks can also cause
signal distortion.

17
 Linear Versus
Nonlinear Behavior
–
Before we explore linear signal distortion, lets
– review the differences between linear and non-
linear behavior. Devices that behave linearly
only impose magnitude and phase changes on
input signals. Any sinusoid appearing at the
input will also appear at the output at the same
frequency. No new signals are created. When
a single sinusoid is passed through a linear
– network, we don’t consider amplitude and
phase changes as distortion. However, when a
– complex, time-varying signal is passed through
a linear network, the amplitude and phase
shifts can dramatically distort the time-
domain waveform.

Non-linear devices can shift input signals in

frequency (a mixer for example) and/or create
new signals in the form of harmonics or inter-
modulation products. Many components that
behave linearly under most signal conditions
can exhibit nonlinear behavior if driven with
a large enough input signal. This is true for
both passive devices like filters and even
connectors, and active devices like amplifiers

Criteria for Distortionless

Transmission
Now lets examine how linear networks can
cause signal distortion. There are three criteria
that must be satisfied for linear distortionless
transmission. First, the amplitude (magnitude)
response of the device or system must be flat
over the bandwidth of interest. This means all
frequencies within the bandwidth will be atten-
uated identically. Second, the phase response
must be linear over the bandwidth of interest.
And last, the device must exhibit a “minimum-
phase response”, which means that at 0 Hz (DC),
there is 0° phase shift (0o ± n*180° is okay if
we don’t mind an inverted signal).

How can magnitude and phase distortion occur?

The following two examples will illustrate
how both magnitude and phase responses
can introduce linear signal distortion.

18
 Magnitude Variation
with Frequency
Here is an example of a square wave (consist-
ing of three sinusoids) applied to a bandpass
filter. The filter imposes a non-uniform ampli-
tude change to each frequency component.
Even though no phase changes are introduced,
the frequency components no longer sum to a
square wave at the output. The square wave is
now severely distorted, having become more
sinusoidal in nature.

Phase Variation
with Frequency
Let’s apply the same square wave to another
filter. Here, the third harmonic undergoes a
180° phase shift, but the other components
are not phase shifted. All the amplitudes of the
three spectral components remain the same
(filters which only affect the phase of signals
are called allpass filters). The output is again
distorted, appearing very impulsive this time.

19
 Deviation From Linear Phase
Now that we know insertion phase versus fre-
quency is a very important characteristic of a
component, let’s see how we would measure
it. Looking at insertion phase directly is usually
not very useful. This is because the phase has a
negative slope with respect to frequency due to
the electrical length of the device (the longer
the device, the greater the slope). Since it is
only the deviation from linear phase which
causes distortion, it is desirable to remove the
linear portion of the phase response. This can
be accomplished by using the electrical delay
feature of the network analyzer to cancel the
electrical length of the DUT. This results in a
high-resolution display of phase distortion
(deviation from linear phase).

Group Delay
Another useful measure of phase distortion is
group delay. Group delay is a measure of the
transit time of a signal through the device
under test, versus frequency. Group delay is
calculated by differentiating the insertion phase
response of the DUT versus frequency. Another
way to say this is that group delay is a measure
of the slope of the transmission phase response.
The linear portion of the phase response is
converted to a constant value (representing the
– average signal-transit time) and deviations from
– linear phase are transformed into deviations
– from constant group delay. The variations in
group delay cause signal distortion, just as
deviations from linear phase cause distortion.
Group delay is just another way to look at
linear phase distortion.

When specifying or measuring group delay,

it is important to quantify the aperture in which
the measurement is made. The aperture is
defined as the frequency delta used in the
differentiation process (the denominator in
the group-delay formula). As we widen the
aperture, trace noise is reduced but less
group-delay resolution is available (we are
essentially averaging the phase response over
a wider window). As we make the aperture
more narrow, trace noise increases but we
have more measurement resolution.

20
 Why Measure Group Delay?
Why are both deviation from linear phase and
group delay commonly measured? Depending
on the device, both may be important.
Specifying a maximum peak-to-peak value
of phase ripple is not sufficient to completely
characterize a device since the slope of the
phase ripple is dependent on the number of
ripples which occur over a frequency range of
interest. Group delay takes this into account
since it is the differentiated phase response.
Group delay is often a more easily interpreted
indication of phase distortion.

The plot above shows that the same value

of peak-to-peak phase ripple can result in
substantially different group delay responses.
The response on the right with the larger
group-delay variation would cause more
signal distortion.

Characterizing
Unknown Devices
In order to completely characterize an
unknown linear two-port device, we must
make measurements under various conditions
and compute a set of parameters. These
parameters can be used to completely
describe the electrical behavior of our device
(or network), even under source and load
conditions other than when we made our mea-
surements. For low-frequency characterization
of devices, the three most commonly measured
parameters are the H, Y and Z-parameters.
All of these parameters require measuring
the total voltage or current as a function of
frequency at the input or output nodes (ports)
of the device. Furthermore, we have to apply
either open or short circuits as part of the
measurement. Extending measurements of
these parameters to high frequencies is not
very practical.

21
 Why Use S-Parameters?
At high frequencies, it is very hard to measure
– total voltage and current at the device ports.
-- One cannot simply connect a voltmeter or
-- current probe and get accurate measurements
– due to the impedance of the probes themselves
– and the difficulty of placing the probes at the
– desired positions. In addition, active devices
– may oscillate or self-destruct with the connec-
tion of shorts and opens.

Clearly, some other way of characterizing

high-frequency networks is needed that
doesn’t have these drawbacks. That is why
scattering or S-parameters were developed.
S-parameters have many advantages over the
previously mentioned H, Y or Z-parameters.
They relate to familiar measurements such as
gain, loss, and reflection coefficient. They are
defined in terms of voltage traveling waves,
which are relatively easy to measure.
S-parameters don’t require connection of
undesirable loads to the device under test. The
measured S-parameters of multiple devices
can be cascaded to predict overall system per-
formance. If desired, H, Y, or Z-parameters
can be derived from S-parameters. And very
important for RF design, S-parameters are
easily imported and used for circuit simulations
in electronic-design automation (EDA) tools
like the Keysight Technologies, Inc. Advanced
Design System (ADS). S-parameters are
the shared language between simulation
and measurement.

An N-port device has N2 S-parameters. So, a

two-port device has four S-parameters. The
numbering convention for S-parameters is that
the first number following the “S” is the port
where the signal emerges, and the second
number is the port where the signal is applied.
So, S21 is a measure of the signal coming out
port 2 relative to the RF stimulus entering port
1. When the numbers are the same (e.g., S11),
it indicates a reflection measurement, as the
input and output ports are the same. The
incident terms (a1, a2) and output terms
(b1, b2) represent voltage traveling waves.

22
 Measuring S-Parameters
S11 and S21 are determined by measuring the
magnitude and phase of the incident, reflected
and transmitted voltage signals when the out-
put is terminated in a perfect Zo (a load that
equals the characteristic impedance of the test
system). This condition guarantees that a2 is
zero, since there is no reflection from an ideal
load. S11 is equivalent to the input complex
reflection coefficient or impedance of the DUT,
and S21 is the forward complex transmission
coefficient. Likewise, by placing the source at
port 2 and terminating port 1 in a perfect load
(making a1 zero), S22 and S12 measurements
can be made. S22 is equivalent to the output
complex reflection coefficient or output imped-
ance of the DUT, and S12 is the reverse
complex transmission coefficient.

The accuracy of S-parameter measurements

depends greatly on how good a termination
we apply to the load port (the port not being
stimulated). Anything other than a perfect load
will result in a1 or a2 not being zero (which
violates the definition for S-parameters). When
the DUT is connected to the test ports of a
network analyzer and we don’t account for
imperfect test-port match, we have not done
a very good job satisfying the condition of a
perfect termination. For this reason, two-port
error correction, which corrects for source and
load match, is very important for accurate
S-parameter measurements (two-port correc-
tion is covered in the calibration section).

23
 Equating S-Parameters with
Common Measurement Terms
S-parameters are essentially the same param-
eters as some of the terms we have mentioned
before, such as input match and insertion loss.
It is important to separate the fundamental defi-
nition of S-parameters and the format in which
they are often displayed. S-parameters are
inherently complex, linear quantities. They
are expressed as real-and-imaginary or
magnitude-and-phase pairs. However, it isn’t
always very useful to view them as linear pairs.
Often we want to look only at the magnitude
of the S-parameter (for example, when looking
at insertion loss or input match), and often,
a logarithmic display is most useful. A log-
magnitude format lets us see far more dynamic
range than a linear format.

Criteria for Distortionless

Transmission
– We have just seen how linear networks can
cause distortion. Devices which behave nonlin-
– early also introduce distortion. The example above
shows an amplifier that is overdriven, causing
the signal at the output to “clip” due to satura-
tion in the amplifier. Because the output signal
is no longer a pure sinusoid, harmonics are
present at integer multiples of the input frequency.

Passive devices can also exhibit nonlinear

behavior at high power levels. A common
example is an L-C filter that uses inductors
made with magnetic cores. Magnetic materials
often display hysteresis effects, which are
highly nonlinear. Another example are the
connectors used in the antenna path of a
cellular-phone base station. The metal-to-metal
contacts (especially if water and corrosion salts
are present) combined with the high-power
transmitted signals can cause a diode effect to
occur, producing very low-level intermodulation
products. Although the level of the intermodu-
lation products is usually quite small, they
can be significant compared to the low signal
strength of the received signals, causing
interference problems.

24
 Measuring Nonlinear Behavior
– So far, we’ve focused most of our attention on
-- linear swept-frequency characterization, which
-- is needed for both passive and active devices.
– We already know that nonlinear behavior is
-- important to quantify, as it can cause severe
signal distortion. The most common nonlinear
-- measurements are gain compression and
AM-to-PM conversion (usually measured with
network analyzers and power sweeps), and
harmonic and intermodulation distortion (usually
measured with spectrum analyzers and signal
sources). We will cover swept-power measure-
ments using a network analyzer in more detail
in the typical-measurements section of this
presentation. The slide shows how intermodu-
lation distortion is typically measured using
two signal sources and a spectrum analyzer
as a receiver.

25
 What is the Differnce
Between Network and
Spectrum Analyzers?
Now that we have seen some of the measure-
ments that are commonly done with network
and spectrum analyzers, it might be helpful to
review the main differences between these
instruments. Although they often both contain
tuned receivers operating over similar frequency
ranges, they are optimized for very different
– – measurement applications.
– – Network analyzers are used to measure compo-
– –
– nents, devices, circuits, and sub-assemblies.
– They contain both a source and multiple
receivers, and generally display ratioed ampli-
tude and phase information (frequency or
power sweeps). A network analyzer is always
looking at a known signal (in terms of frequency),
since it is a stimulus/response system. With
network analyzers, it is harder to get an (accu-
rate) trace on the display, but very easy to
interpret the results. With vector-error correc-
tion, network analyzers provide much higher
measurement accuracy than spectrum analyzers.

Spectrum analyzers are most often used to

measure signal characteristics such as carrier
level, sidebands, harmonics, phase noise, etc.,
on unknown signals. They are most commonly
configured as a single-channel receiver, with-
out a source. Because of the flexibility needed
to analyze signals, spectrum analyzers general-
ly have a much wider range of IF bandwidths
available than most network analyzers. Spectrum
analyzers are often used with external sources
for nonlinear stimulus/response testing. When
combined with a tracking generator, spectrum
analyzers can be used for scalar component
testing (magnitude versus frequency, but no
phase measurements). With spectrum analyz-
ers, it is easy to get a trace on the display, but
interpreting the results can be much more
difficult than with a network analyzer.

26
– Agenda
–
– In this next section, we will look at the main
parts of a network analyzer.
–
–

Generalized Network
Analyzer Block Diagram
Here is a generalized block diagram of a
network analyzer, showing the major signal-
processing sections. In order to measure the
incident, reflected and transmitted signal,
four sections are required:
– Source for stimulus
– Signal-separation devices
– Receivers that downconvert and
detect the signals
– Processor/display for calculating
and reviewing the results

We will briefly examine each of these sections.

More detailed information about the signal
separation devices and receiver section are in
the appendix.

27
 Source
The signal source supplies the
stimulus for our stimulus-response test sys-
tem. We can either sweep the frequency of the
source or sweep its power level. Traditionally,
network analyzers used a separate source.
These sources were either based on open-loop
voltage-controlled oscillators (VCOs) which were
cheaper, or more expensive synthesized
sweepers which provided higher performance,
especially for measuring narrowband devices.
Excessive phase noise on open-loop VCOs
degrades measurement accuracy considerably
when measuring narrowband components over
small frequency spans. Most network analyzers
that Keysight sells today have integrated, syn-
thesized sources, providing excellent frequency
resolution and stability.

28
 Signal Separation
The next major area we will cover is the signal
separation block. The hardware used for this
function is generally called the “test set”. The
test set can be a separate box or integrated
within the network analyzer. There are two
functions that our signal-separation hardware
must provide. The first is to measure a portion
– of the incident signal to provide a reference for
– ratioing. This can be done with splitters or direc-
tional couplers. Splitters are usually resistive.
They are non-directional devices (more on
directionality later) and can be very broadband.
The trade-off is that they usually have 6 dB or
more of loss in each arm. Directional couplers
have very low insertion loss (through the main
arm) and good isolation and directivity. They
are generally used in microwave network ana-
lyzers, but their inherent high-pass response
makes them unusable below 40 MHz or so.

The second function of the signal-splitting

hardware is to separate the incident (forward)
and reflected (reverse) traveling waves at the
input of our DUT. Again, couplers are ideal in that
they are directional, have low loss, and high
reverse isolation. However, due to the difficulty
of making truly broadband couplers, bridges
are often used instead. Bridges work down to
DC, but have more loss, resulting in less signal
power delivered to the DUT. See the appendix
for a more complete description of how a
directional bridge works.

29
 Directivity
Unfortunately, real signal-separation devices
are never perfect. For example, let’s take a closer
look at the actual performance of a 3-port
directional coupler.

Ideally, a signal traveling in the coupler’s

reverse direction will not appear at all at the
coupled port. In reality, however, some energy
does leak through to the coupled arm, as a
result of finite isolation.

One of the most important parameter for cou-

plers is their directivity. Directivity is a measure
of a coupler’s ability to separate signals flowing
in opposite directions within the coupler. It can
be thought of as the dynamic range available
for reflection measurements. Directivity can be
defined as:

Directivity (dB) = Isolation (dB) - Forward

Coupling Factor (dB) - Loss (through-arm) (dB)

The appendix contains a slide showing how

adding attenuation to the ports of a coupler
can affect the effective directivity of a system
(such as a network analyzer) that uses a
directional coupler.

As we will see in the next slide, finite directivity

adds error to our measured results.

Interaction of Directivity
with the DUT (Without
Error Correction)
Directivity error is the main reason we see a
large ripple pattern in many measurements of
return loss. At the peaks of the ripple, directivi-
ty is adding in phase with the reflection from
the DUT. In some cases, directivity will cancel
the DUT’s reflection, resulting in a sharp dip in
the response.

30
 Detector Types
The next portion of the network analyzer we’ll
look at is the signal-detection block. There are
two basic ways of providing signal detection in
network analyzers. Diode detectors convert the
RF signal level to a proportional DC level. If the
stimulus signal is amplitude modulated, the
diode strips the RF carrier from the modulation
(this is called AC detection). Diode detection is
inherently scalar, as phase information of the
RF carrier is lost.

The tuned receiver uses a local oscillator (LO)

to mix the RF down to a lower “intermediate”
frequency (IF). The LO is either locked to the
RF or the IF signal so that the receivers in the
network analyzer are always tuned to the RF
signal present at the input. The IF signal is
bandpass filtered, which narrows the receiver
bandwidth and greatly improves sensitivity
and dynamic range. Modern analyzers use
an analog-to-digital converter (ADC) and
digital-signal processing (DSP) to extract
magnitude and phase information from the
IF signal. The tuned-receiver approach is
used in vector network analyzers and
spectrum analyzers.

31
 Broadband Diode Detection
The two main advantages of diode detectors
are that they provide broadband frequency
coverage ( < 10 MHz on the low end to
> 26.5 GHz at the high end) and they are
– inexpensive compared to a tuned receiver.
– Diode detectors provide medium sensitivity
– and dynamic range: they can measure signals
– to –60 dBm or so and have a dynamic range
– around 60 to 75 dB, depending on the detector
type. Their broadband nature limits their sensi-
tivity and makes them sensitive to source
harmonics and other spurious signals. Dynamic
range is improved in measurements by
increasing input power.

AC detection eliminates the DC drift of the

diode as an error source, resulting in more
accurate measurements. This scheme also
reduces noise and other unwanted signals.
The major benefit of DC detection is that there
is no modulation of the RF signal, which can
have adverse effects on the measurement of
some devices. Examples include amplifiers with
AGC or large DC gain, and narrowband filters.

One application where broadband diode

detectors are very useful is measuring frequency-
translating devices, particularly those with
internal LOs.

32
 Narrowband Detection –
Tuned Receiver
Tuned receivers provide the best sensitivity
and dynamic range, and also provide harmonic
– and spurious-signal rejection. The narrow IF
– filter produces a considerably lower noise floor,
– resulting in a significant sensitivity improvement.
– For example, a microwave vector network
– analyzer (using a tuned receiver) might have
a 3 kHz IF bandwidth, where a scalar analyzer’s
diode detector noise bandwidth might be
26.5 GHz. Measurement dynamic range is
improved with tuned receivers by increasing
input power, by decreasing IF bandwidth, or
by averaging. The latter two techniques provide
a trade off between noise floor and measure-
ment speed. Averaging reduces the noise floor
of the network analyzer (as opposed to just
reducing the noise excursions as happens
when averaging spectrum analyzer data)
because we are averaging complex data.
Without phase information, averaging does
not improve analyzer sensitivity.

The same narrowband nature of tuned receivers

that produces increased dynamic range also
eliminates harmonic and spurious responses.
As was mentioned earlier, the RF signal is
downconverted and filtered before it is mea-
sured. The harmonics associated with the
source are also downconverted, but they
appear at frequencies outside the IF bandwidth
and are therefore removed by filtering.

33
 Comparision of
Receiver Techniques
Dynamic range is generally defined as the
maximum power the receiver can accurately
measure minus the receiver noise floor. There
are many applications requiring large dynamic
range. One of the most common is measuring
filter stopband performance. As you can see
here, at least 80 dB dynamic range is needed
to properly characterize the rejection character-
istics of this filter. The plots show a typical
narrowband filter measured on an 8757 scalar
network analyzer and on an 8510 vector
network analyzer. Notice that the filter exhibits
90 dB of rejection but the scalar analyzer is
unable to measure it because of its higher
noise floor.

In the case where the scalar network analyzer

was used with broadband diode detection, a
harmonic from the source created a “false”
response. For example, at some point on a
broadband sweep, the second harmonic of the
source might fall within the passband of the
filter. If this occurs, the detector will register
a response, even though the stopband of the
filter is severely attenuating the frequency of
the fundamental. This response from the
second harmonic would show on the display
at the frequency of the fundamental. On the
tuned receiver, a false signal such as this
would be filtered away and would not appear
on the display. Note that source subharmonics
and spurious outputs can also cause false
display responses.

34
 Dynamic Range and Accuracy
This plot shows the effect that interfering sig-
nals (sinusoids or noise) have on measurement
accuracy. The magnitude error is calculated
as 20*log [1 ± interfering-signal] and the phase
error is calculated as arc-tangent [interfering-
signal], where the interfering signal is
expressed in linear terms. Note that a 0 dB
interfering signal results in (plus) 6 dB error
when it adds in phase with the desired signal,
and (negative) infinite error when it cancels the
desired signal.

To get low measurement uncertainty, more

dynamic range is needed than the device
exhibits. For example, to get less than 0.1 dB
magnitude error and less than 0.6 degree
phase error, our noise floor needs to be more
than 39 dB below our measured power levels
(note that there are other sources of error
besides noise that may limit measurement
accuracy). To achieve that level of accuracy
while measuring 80 dB of rejection would
require 119 dB of dynamic range. One way
to achieve this level is to average test data
using a tuned-receiver based network analyzer.

35
 S-parameter test sets allow both forward and
reverse measurements on the DUT, which are
needed to characterize all four S-parameters.
RF power can come out of either test port one
or two, and either test port can be connected
to a receiver. S-parameter test sets also allow
full two-port (12-term) error correction,
which is the most accurate form available.
S-parameter network analyzers provide more
performance than T/R-based analyzers, but
cost more due to extra RF components in the
test set.

There are two different types of transfer

switches that can be used in an S-parameter
test set: solid-state and mechanical. Solid-
state switches have the advantage of infinite
lifetimes (assuming they are not damaged by
too much power from the DUT). However, they
are more lossy so they reduce the maximum
output power of the network analyzer.
Mechanical switches have very low loss and
therefore allow higher output powers. Their
main disadvantage is that eventually they wear
out (after 5 million cycles or so). When using a
T/R Versus S-Parameter network analyzer with mechanical switches,
Test Sets measurements are generally done in single-
sweep mode, so the transfer switch is not
There are two basic types of test sets that are continuously switching.
used with network analyzers. For transmission/
reflection (T/R) test sets, the RF power always S-parameter test sets can have either a
comes out of test port one and test port two is 3-receiver (shown on slide) or 4-receiver
always connected to a receiver in the analyzer. architecture. The 8753 series and standard
To measure reverse transmission or output 8720 series analyzers have a 3-receiver
reflection of the DUT, we must disconnect it, architecture. Option 400 adds a fourth receiver
turn it around, and re-connect it to the analyzer. to 8720 series analyzers, to allow true TRL
T/R-based network analyzers offer only calibration. The 8510C family and the PNA
response and one-port calibrations, so mea- Series uses a 4-receiver architecture. More
surement accuracy is not as good as that detailed information of the two architecture
which can be achieved with S-parameter test is available in the appendix.
sets. However, T/R-based analyzers are more
economical. For the 8712, 8753 and 8720
families, Keysight uses the ET suffix to denote
a T/R analyzer, and the ES suffix to denote an
S-parameter analyzer.

36
 Processor/Display
The last major block of hardware in the
network analyzer is the display/processor
section. This is where the reflection and trans-
mission data is formatted in ways that make
it easy to interpret the measurement results.
Most network analyzers have similar features
such as linear and logarithmic sweeps, linear
and log formats, polar plots, Smith charts, etc.
Other common features are trace markers,
limit lines, and pass/fail testing. Many of
– Keysight’s network analyzers have specialized
– measurement features tailored to a particular
– market or application. One example is the
– E5100A/B, which has features specific to
crystal-resonator manufacturers.
–

Internal Measurement
Automation
All of Keysight’s network analyzers offer some
form of internal measurement automation.
The most simple form is recall states. This
is an easy way to set up the analyzer to a
pre-configured measurement state, with all
of the necessary instrument parameters.

More powerful automation can be achieved

with test sequencing or Instrument BASIC
(IBASIC). Test sequencing is available on the
8753/8720 families and provides keystroke
recording and some advanced functions.
IBASIC is available on the 8712ET/ES series and
provides the user with sophisticated programs
and custom user interfaces and measurement
personalities.

The most powerful automation can be achieved

with the PNA Series. Since these analyzers use
Windows 2000, any PC-compatible program-
ming language can be used to create an
executable program. Popular programming
languages such as Visual Basic, Visual C++,
Keysight VEE, LabView or even Keysight BASIC
for Windows can be used. The ENA series
features Visual Basic Applications (VBA) as its
automation language. VBA makes it easy to
automate measurements and create intuitive
Graphical User Interfaces (GUIs).

37
 Keysight’s Series of RF
Vector Analyzers
Shown here is a summary of Keysight’s RF
families of vector network analyzers.

Keysight’s Series of Microwave

Vector Analyzers
Shown here is a summary of Keysight’s micro-
wave families of vector network analyzers.

38
 Spectrum Analyzer/Tracking
Generator
If the main difference between spectrum and
network analyzers is a source, why don’t we
add a tracking generator (a source that tracks
the tuned frequency of the spectrum analyzer)
to our spectrum analyzer . . . then is it a network
analyzer? Well, sort of.

A spectrum analyzer with a tracking generator

can make swept scalar-magnitude measure-
ments, but it is still a single-channel receiver.
– Therefore it cannot make ratioed or phase
– measurements. Also, the only error correction
– available is normalization (and possibly open-
– short averaging). The amplitude accuracy with
– a spectrum analyzer is roughly an order of
magnitude worse than on a scalar network
analyzer (dB vs. tenths of dB). Finally, a spec-
trum analyzer with a tracking generator costs
more than a scalar network analyzer with simi-
lar frequency range, but it may be a small
incremental cost to add a tracking generator
if the spectrum analyzer is already needed
for other spectrum-related measurements.

Agenda
–
– In this next section, we will talk about the need
– for error correction and how it is accomplished.
– Why do we even need error-correction and
calibration? It is impossible to make perfect
–
hardware which obviously would not need any
form of error correction. Even making the hard-
ware good enough to eliminate the need for error
correction for most devices would be extremely
expensive. The best balance is to make the
– hardware as good as practically possible,
– balancing performance and cost. Error correction
is then a very useful tool to improve measure-
ment accuracy.

39
 Calibration Topics
–
– We will explain the sources of measurement
– error, how it can be corrected with calibration,
-- and give accuracy examples using different
calibration types.
--
--
--
--
–
–

Measurement
– Error Modeling
–
– Let’s look at the three basic sources of mea-
– surement error: systematic, random and drift.

– Systematic errors are due to imperfections in

– the analyzer and test setup. They are repeat-
able (and therefore predictable), and are
assumed to be time invariant. Systematic
errors are characterized during the calibration
process and mathematically removed during
measurements.

Random errors are unpredictable since they

vary with time in a random fashion. Therefore,
they cannot be removed by calibration. The
main contributors to random error are instru-
ment noise (source phase noise, sampler noise,
IF noise).

Drift errors are due to the instrument or test-

system performance changing after a calibration
has been done. Drift is primarily caused by
temperature variation and it can be removed by
further calibration(s). The timeframe over which
a calibration remains accurate is dependent on
the rate of drift that the test system undergoes
in the user’s test environment. Providing a sta-
ble ambient temperature usually goes a long
way towards minimizing drift.

40
 Systematic
Measurement Errors
Shown here are the major systematic errors
associated with network measurements. The
errors relating to signal leakage are directivity
and crosstalk. Errors related to signal reflec-
tions are source and load match. The final
class of errors are related to frequency
response of the receivers, and are called
reflection and transmission tracking. The full
– two-port error model includes all six of these
– terms for the forward direction and the same
six (with different data) in the reverse direction,
for a total of twelve error terms. This is why we
often refer to two-port calibration as twelve-
term error correction

41
 Types of Error
–
-- Correction
--
-- The two main types of error correction that can
be done are response (normalization) correc-
– tions and vector corrections. Response calibra-
-- tion is simple to perform, but only corrects for
-- a few of the twelve possible systematic error
terms (the tracking terms). Response calibra-
--
tion is essentially a normalized measurement
where a reference trace is stored in memory,
and subsequent measurement data is divided by
this memory trace. A more advanced form of
response calibration is open/short averaging
for reflection measurements using broadband
diode detectors. In this case, two traces are
averaged together to derive the reference trace.

Vector-error correction requires an analyzer

that can measure both magnitude and phase.
It also requires measurements of more calibra-
tion standards. Vector-error correction can
account for all the major sources of systematic
error and can give very accurate measurements.

Note that a response calibration can be per-

formed on a vector network analyzer, in which
case we store a complex (vector) reference
trace in memory, so that we can display
normalized magnitude or phase data. This is
not the same as vector-error correction how-
ever (and not as accurate), because we are
not measuring and removing the individual
systematic errors, all of which are complex
or vector quantities.

42
 What is Vector-Error
Correction?
–
-- Vector-error correction is the process of
-- characterizing systematic error terms by
– measuring known calibration standards, and
-- then removing the effects of these errors
-- from subsequent measurements.
–
-- One-port calibration is used for reflection
-- measurements and can measure and remove
three systematic error terms (directivity, source
– match, and reflection tracking). Full two-port
-- calibration can be used for both reflection and
-- transmission measurements, and all twelve
-- systematic error terms are measured and
removed. Two-port calibration usually requires
twelve measurements on four known standards
(short-open-load-through or SOLT). Some
standards are measured multiple times (e.g.,
the through standard is usually measured four
times). The standards themselves are defined
in a cal-kit definition file, which is stored in the
network analyzer. Keysight network analyzers
contain all of the cal-kit definitions for our
standard calibration kits. In order to make
accurate measurements, the cal-kit definition
MUST MATCH THE ACTUAL CALIBRATION
KIT USED! If userbuilt calibration standards
are used (during fixtured measurements for
example), then the user must characterize
the calibration standards and enter the infor-
mation into a user cal-kit file. Sources of more
information about this topic can be found in
the appendix.

43
 Reflection: One-Port Model
Taking the simplest case of a one-port reflec-
tion measurement, we have three systematic
errors and one equation to solve in order to
calculate the actual reflection coefficient from
the measured value. In order to do this, we
must first calculate the individual error terms
contained in this equation. We do this by
creating three more equations with three
unknowns each, and solving them simultane-
ously. The three equations come from measur-
ing three known calibration standards, for
example, a short, an open, and a Zo load.
– Solving the equations will yield the systematic
– error terms and allow us to derive the actual
-- reflection S-parameter of the device from our
-- measurements.

When measuring reflection two-port devices, a

one-port calibration assumes a good termina-
tion at port two of the device. If this condition
is met (by connecting a load calibration stan-
dard for example), the one-port calibration is
quite accurate. If port two of the device is con-
nected to the network analyzer and the reverse
isolation of the DUT is low (for example, filter
passbands or cables), the assumption of a good
load termination is not valid. In these cases,
two-port error correction provides more accu-
rate measurements. An example of a two-port
device where load match is not important is an
amplifier. The reverse isolation of the amplifier
allows one-port calibration to be used effectively.
An example of the measurement error that can
occur when measuring a two-port filter using
a one-port calibration will be shown shortly.

44
 Before and After
One-Port Calibration
Shown here is a plot of reflection with and
without one-port calibration. Without error
correction, we see the classic ripple pattern
caused by the systematic errors interfering
with the measured signal. The error-corrected
trace is much smoother and better represents
the device’s actual reflection performance.

45
 Two-Port Error Correction
Two-port error correction is the most accurate
form of error correction since it accounts for all
of the major sources of systematic error. The
error model for a two-port device is shown
above. Shown below are the equations to
derive the actual device S-parameters from the
measured S-parameters, once the systematic
error terms have been characterized. Notice
that each actual S-parameter is a function of
all four measured S-parameters. The network
– analyzer must make a forward and reverse
sweep to update any one S-parameter. Luckily,
– you don’t need to know these equations to
use network analyzers!!!
–

S11m – ED S22m – ED' S21m – EX S12m – EX'

( ) (1 + ES' ) – EL ( )( )
ERT ERT' ETT ETT'
S11a =
S11m – ED S22m – ED' S21m – EX S12m – EX'
(1 + ES) (1 + ES' ) – EL' EL( )( )
ERT ERT' ETT ETT'

S21m – EX S22m – ED'

( ) (1 + (ES' – EL))
ETT ERT'
S21a =
S11m – ED S22m – ED' S21m – EX S12m – EX'
(1 + ES) (1 + ES' ) – EL' EL( )( )
ERT ERT' ETT ETT'

S12m – EX' S11m – ED

( ) (1 + (ES – EL'))
ETT' ERT
S12a =
S11m – ED S22m – ED' S21m – EX S12m – EX'
(1 + ES) (1 + ES' ) – EL' EL( )( )
ERT ERT' ETT ETT'

S22m – ED' S11m – ED S21m – EX S12m – EX'

( ) (1 + ES ) – EL' ( )( )
ERT' ERT ETT ETT'
S22a =
S11m – ED S22m – ED' S21m – EX S12m – EX'
(1 + ES) (1 + ES' ) – EL' EL( )( )
ERT ERT' ETT ETT'

46
 Crosstalk: Signal Leakage
Between Test Ports
During Transmission
When performing a two-port calibration, the
user has the option of omitting the part of the
calibration that characterizes crosstalk or
isolation. The definition of crosstalk is the
signal leakage between test ports when no
device is present. Crosstalk can be a problem
with high-isolation devices (e.g., switch in open
position) and high dynamic range devices
(some filter stopbands). The isolation calibra-
tion adds noise to the error model since we
usually are measuring near the noise floor of
the system. For this reason, one should only
perform the isolation calibration if it is really
needed. If the isolation portion of the calibra-
tion is done, trace averaging should be used
to ensure that the system crosstalk is not
obscured by noise. In some network analyzers,
crosstalk can be minimized by using the alter-
nate sweep mode instead of the chop mode
(the chop mode makes measurements on both
the reflection (A) and transmission (B) receivers
at each frequency point, whereas the alternate
mode turns off the reflection receiver during
the transmission measurement).

The best way to perform an isolation calibration

is by placing the devices that will be measured
on each test port of the network analyzer, with
terminations on the other two device ports.
Using this technique, the network analyzer
sees the same impedance versus frequency
during the isolation calibration as it will during
subsequent measurements of the DUT. If this
method is impractical (in test fixtures, or if only
one DUT is available, for example), than plac-
ing a terminated DUT on the source port and a
termination on the load port of the network
analyzer is the next best alternative (the DUT
and termination must be swapped for the
reverse measurement). If no DUT is available or
if the DUT will be tuned (which will change its
port matches), then terminations should be
placed on each network analyzer test port for
the isolation calibration.

47
 Errors and Calibration
Standards
A network analyzer can be used for uncorrected
measurements, or with any one of a number of
– calibration choices, including response calibra-
–
– tions and one- or two-port vector calibrations. A
summary of these calibrations is shown above.
– We will explore the measurement uncertainties
–
– associated with the various calibration types
– –
in this section.
– –
–

–
–

Calibration Summary
This summary shows which error terms are
accounted for when using analyzers with
– T/R test sets (models ending with ET) and
– S-parameter test sets (models ending with ES).
– Notice that load match is the key error term
than cannot be removed with a T/R-based
–
network analyzer.

The following examples show how measure-

ment uncertainty can be estimated when
– measuring two-port devices with a T/R-based
– network analyzer. We will also show how
2-port error correction provides the least
– measurement uncertainty.
–

48
 signal reflecting from the DUT (0.158). To
be consistent with the next example, we will
also include the effect of the directivity error
signal (0.010). As a worst case analysis, we will
add this signal to the error signal resulting
from the load match. The combined error sig-
nal is then 0.100 + 0.010 = 0.110. When we
add and subtract this error signal from the
desired 0.158, we see the measured return
loss of the 16-dB filter may appear to be
anywhere from 11.4 dB to 26.4 dB, allowing
too much margin for error. In production
testing, these errors could easily cause filters
which met specification to fail, while filters that
actually did not meet specification might pass.
In tuning applications, filters could be mis-
tuned as operators try to compensate for
the measurement error.

When measuring an amplifier with good

isolation between output and input (i.e., where
the isolation is much greater than the gain),
there is much less measurement uncertainty.
This is because the reflection caused by the
load match is severely attenuated by the prod-
Reflection Example Using uct of the amplifier’s isolation and gain. To
improve measurement uncertainty for a filter,
a One-Port Cal
the output of the filter must be disconnected
Here is an example of how much measurement from the analyzer and terminated with a
uncertainty we might encounter when measur- high-quality load, or a high-quality attenuator
ing the input match of a filter after a one-port can be inserted between the filter and port two
calibration. In this example, our filter has a of the network analyzer. Both techniques
return loss of 16 dB, and 1 dB of insertion loss. improve the analyzer’s effective load match.
Let’s say the raw (uncorrected) load match of
our network analyzer is specified to be 18 dB
(generally, typical performance is significantly
better than the specified performance). The
reflection from the test port connected to the
filter’s output is attenuated by twice the filter
loss, which is only 2 dB total in this case. This
value is not adequate to sufficiently suppress
the effects of this error signal, which illustrates
why low-loss devices are difficult to measure
accurately. To determine the measurement
uncertainty of this example, it is necessary to
convert all dB values into linear values. Next,
we must add and subtract the undesired
reflection signal resulting from the load match
(with a reflection coefficient of 0.100) with the

49
 Using a One-Port + Attenuator
Let’s see how much improvement we get by
adding an attenuator between the output of
the filter and our network analyzer. If we
inserted a perfect 10 dB attenuator between
port two of the network analyzer and the filter
used in the previous example, we would expect
the effective load match of our test system to
improve by twice the value of the attenuator
(since the error signal travels through the
attenuator twice), which in this example, would
be 20 dB. However, we must take into account
the reflection introduced by the attenuator itself.
For this example, we will assume the attenuator
has a SWR of 1.05. Now, our effective load match
is only 28.6 dB (–20*log[10exp(–32.3/20) +
10exp(–38/20)]), which is only about a 10 dB
improvement. This value is the combination
of a 32.3 dB match from the attenuator
(SWR = 1.05) and the 38 dB effective match of
the network analyzer with the 10 dB attenuator.
Our worst-case uncertainty is now reduced to
+2.5 dB, –1.9 dB, instead of the +10.4 dB,
–4.6 dB we had without the 10 dB attenuator.
While not as good as what could be achieved
with two-port calibration, this level of accuracy
may be sufficient for manufacturing applications.
To minimize measurement uncertainty, it is
important to use the best quality (lowest
reflection) attenuators that your budget
will allow.

50
 Transmission Example
Using Response Cal
Let’s do an example transmission measurement
using only response calibration. Response
calibrations offer simplicity, but with some
compromise in measurement accuracy. In mak-
ing a filter transmission measurement using
only response calibration, the first step is to
make a through connection between the
two test port cables (with no DUT in place).
For this example, some typical test port speci-
fications will be used. The ripple caused by this
amount of mismatch is calculated as ±0.22 dB,
and is now present in the reference data. Since
we don’t know the relative phase of this error
signal once it passes through the DUT, it must
be added to the uncertainty when the DUT is
measured (see next slide) in order to compute
the worst-case overall measurement uncertainty.

51
 Filter Measurement
with Response Cal
Now let’s look at the measurement uncertainty
when the DUT is inserted. We will use the
same loss and mismatch specifications for the
DUT and analyzer as before. We have three
main error signals due to reflections between
the ports of the analyzer and the DUT. Higher-
order reflections are present as well, but they
don’t add any significant error since they are
small compared to the three main terms. In
this example, we will normalize the error terms
to the desired signal that passes through the
DUT once. The desired signal is therefore rep-
resented as 1, and error terms only show the
additional transmission loss due to traveling
more than once through the DUT. One of the
signals passes through the DUT two extra
times, so it is attenuated by twice the loss
of the DUT. The worst case is when all of the
reflected error signals add together in-phase
(.020 + .020 + .032 = .072). In that case, we
get a measurement uncertainty of +0.60 dB,
–0.65 dB. The total measurement uncertainty,
which must include the 0.22 dB of error incor-
porated into our calibration measurement, is
about ± 0.85 dB.

Measuring Amplifiers
with a Response Cal
Now let’s look at an example of measuring an
amplifier that has port matches of 16 dB. The
match of our test ports remains the same as
our previous transmission response example.
We see that the middle error term is no longer
present, due to the reverse isolation of the
amplifier. This fact has reduced our measure-
ment uncertainty to about ± 0.45 dB. Our total
measurement error now has been reduced to
about ± 0.67 dB, versus the ± 0.85 dB we had
when measuring the filter.

52
 Filter Measurements
Using the Enhanced
Response Calibration
A feature contained in many of Keysight’s
T/R-based network analyzers is the enhanced
response calibration. This calibration greatly
reduces all the error terms involving a reflec-
tion from the source match. It requires the
measurement of short, open, load, and through
standards for transmission measurements.
Essentially, it combines a one-port cal and a
response cal to correct source match during
transmission measurements. Recall that a
standard response calibration cannot correct
for the source and load match error terms.

Continuing with our filter example, we see the

enhanced response calibration has improved
the effective source match during transmission
measurements to around 35 dB, instead of the
14 dB we used previously. This greatly reduces
the calibration error (± 0.02 dB instead of
± 0.22 dB), as well as the two measurement
error terms that involve interaction with the
effective source match. Our total measurement
error is now ± 0.24 dB, instead of the previously
calculated ± 0.85 dB.

Using the Enhanced Response

Calibration Plus an Attenuator
We can further improve transmission mea-
surements by using the enhanced response
calibration and by inserting a high-quality
attenuator between the output port of the
device and test port two of the network analyzer.
In this example, we will use a 10 dB attenuator
with a SWR of 1.05 (as we did with the reflec-
tion example). This makes the effective load
match of the analyzer 28.7 dB, about a 10 dB
improvement. Our calibration error is minus-
cule (±.01 dB), and our total measurement
uncertainty has been reduced to ±0.09 dB.
This is very close to what can be achieved with
two-port error correction. As we have seen,
adding a high-quality attenuator to port two
of a T/R network analyzer can significantly
improve measurement accuracy, with only
a modest loss in dynamic range.

53
 Calibrating Measurement
Uncertainty After a
Two-Port Calibration
Here is an example of calculating measurement
error after a two-port calibration has been
done. Keysight provides values on network
analyzer data sheets for effective directivity,
source and load match, tracking, and isolation,
usually for several different calibration kits. The
errors when measuring our example filter have
been greatly reduced (±0.5 dB reflection error,
±0.05 dB transmission error). Phase errors
would be similarly small.

Note that this is a worst-case analysis, since

we assume that all of the errors would add
in-phase. For many narrowband measure-
ments, the error terms will not all align with
one another. A less conservative approach to
calculating measurement uncertainty would be
to use a root-sum-squares (RSS) method. The
best technique for estimating measurement
uncertainty is to use a statistical approach
(which requires knowing or estimating the
probability-distribution function of the error
terms) and calculating the ± 3σ (sigma) limits.

The terms used in the equations are forward

terms only and are defined as:

ED = directivity error
ES = source match
EL = load match
ERT = reflection tracking
ETT = transmission tracking
EI = crosstalk (transmission isolation)
a = actual
m = measured

54
 Comparison of
Measurement Examples
Here is a summary of the measurement
uncertainties we have discussed so
far for different types of calibration.

55
 Response Versus
Two-Port Calibration
Let’s look at some actual measurements done on
a bandpass filter with different levels of error
correction. The uncorrected trace shows
considerable loss and ripple. In fact, the pass-
band response varies about ± 1 dB around the
filter’s center frequency. Is the filter really this
bad? No. What we are actually measuring is
the sum of the filter’s response and that of
our test system.

Performing a normalization prior to the mea-

surement of the filter removes the frequency
response of the system (transmission tracking
error) from the measurement. The loss that
was removed was most likely caused by
the test cables. After normalization, the fre-
quency response of the filter still contains
ripple caused by an interaction between the
system’s source and load match. This ripple
even goes above the 0 dB reference line, indi-
cating gain! However, we know that a passive
device cannot amplify signals. This apparent
anomaly is due to mismatch error.

The measurement shown after a two-port

calibration is the most accurate of the three
measurements shown. Using vector-error
correction, the filter’s passband response
shows variation of about ± 0.1 dB around its
center frequency. This increased level of
measurement flatness will ensure minimum
amplitude distortion, increase confidence in
the filter’s design, and ultimately increase
manufacturing yields due to lower test-
failure rates.

56
 ECal: Electronic Calibration
(85060/90 Series)
Although the previous slides have all shown
mechanical calibration standards, Keysight offers
a solid-state calibration solution which makes
two, three, and four-port calibration fast, easy,
and less prone to operator errors. A variety of
calibration modules are available with different
connector types and frequency ranges. You can
configure a single module with different connec-
tor types or choose all the same type. The cali-
bration modules are solid-state devices with
programmable, repeatable impedance states.
These states are characterized at the Keysight
factory using a network analyzer calibrated
with coaxial, airline-TRL standards (the best
calibration available), making the ECal modules
transfer standards (rather than direct standards).

For the microwave calibration modules, the

various impedance states are achieved by PIN-
diode switches which shunt the transmission
line to ground. The number of diodes and their
location vary depending upon the module’s
frequency range. A multitude of reflection
coefficients can be generated by applying
various combinations of the shunts. With no
shunts, the network acts as a low loss trans-
mission line. High isolation between the ports
is obtained by driving several of the PIN shunts
simultaneously. Four different states are used
to compute the error terms at each frequency
point. Four states are used because this gives
the best trade-off between high accuracy and
the time required for the calibration. With four
reflection states, we have four equations but
only three unknowns. To achieve the best
accuracy from this over-determined set of
equations, a least-squares-fit algorithm is
used. Adding more impedance states at
each frequency point would further improve
accuracy but at the expense of more
calibration time.

The RF module uses the more traditional

short, open, and load terminations, and a
through transmission line.

For more information about these products,

please order Keysight literature number
5963-3743E.

57
 Adapter Considerations
Whenever possible, reflection calibrations
should be done with a cal kit that matches
the connector type of the DUT. If adapters
need to be used to mate the calibrated test
system to the DUT, the effect of these adapters
on measurement accuracy can be very large.
This error is often ignored, which may or may
not be acceptable. As the slide shows, the
adapter causes an error signal which can add
or subtract with the desired reflection signal
from the DUT. Worst-case effective directivity
(in dB) is now:

–20 log (Corrected-coupler-directivity + ρadapters)

If the adapter has a SWR of say 1.5 (the

less-expensive variety), the effective directivity
of the coupler drops to around 14 dB worst
case, even if the coupler itself had infinite
directivity! In other words, with a perfect
Zo load (ρL= 0) on the output of the adapter;
the reflected signal appearing at the coupled
port would only be 14 dB less than the reflec-
tion from a short or open circuit. Stacking
adapters compounds the problem, as is illus-
trated above. Consequently, it is very important
to use quality adapters (or preferably, no
adapters at all) in your measurement system,
so system directivity is not excessively degraded.
While error-correction can mitigate the effect
of adapters on the test port, our system is
more susceptible to drift with degraded raw
(uncorrected) directivity.

58
 Calibrating Non-Insertable
Devices
–
– When performing a through calibration, often the
test ports mate directly. For example, two
– cables with the appropriate connectors can be
– 7) joined without a through adapter, resulting in a
zero-length through path. An insertable device
– is one that can be substituted for a zero-length
– through. This device has the same connector
– type on each port but of the opposite sex, or
the same sexless connector on each port,
either of which makes connection to the test
– ports quite simple. A noninsertable device is
– one that can not be substituted for a zero-
– length through. It has the same type and sex
– connectors on each port or a different type of
connector on each port, such as 7/16 at one
end and SMA on the other end.

There are several calibration choices available

for noninsertable devices. One choice is to use
an uncharacterized through adapter. While not
recommended, this might be acceptable at low
frequencies where the electrical length of the
adapter is relatively small. In general, it is pref-
erable to use a characterized through adapter
(where the electrical length and loss are speci-
fied), which requires modifying the calibration-
kit definition. A high-quality through adapter
(with good match) should be used since reflec-
tions from the adapter cannot be removed. The
other two choices (swapping equal adapters
and adapter removal) will be discussed next.

59
 Swap Equal Adapters Method
The swap-equal-adapters method is very
useful for devices with the same connector
type and sex (female SMA on both ends for
example). It requires the use of two precision
matched adapters that are equal in perfor-
mance but have connectors of different sexes.
For example, for measuring a device with
female SMA connectors on both ends using
APC-7 mm test cables, the adapters could
be 7-mm-to-male-3.5-mm and 7-mm-to-
female-3.5-mm. To be equal, the adapters
must have the same match, characteristic
impedance, insertion loss, and electrical delay.
Many of Keysight’s calibration kits include
matched adapters for this purpose.

The first step in the swap-equal-adapters

method is to perform the transmission portion
of a two-port calibration with the adapter
needed to make the through connection.
This adapter is then removed and the second
adapter is used in its place during the reflec-
tion portion of the calibration, which is per-
formed on both test ports. This swap changes
the sex of one of the test ports so that the DUT
can be inserted and measured (with the sec-
ond adapter still in place) after the calibration
procedure is finished. The errors remaining
after calibration are equal to the difference
between the two adapters. The technique
provides a high level of accuracy, but not
as high as the more complicated adapter-
removal technique.

60
 Adapter Removal Calibration
–
– Adapter-removal calibration provides the most
– complete and accurate calibration procedure
– for noninsertable devices. It is available in the
– 8753, 8720, and 8510 series of network
analyzers. This method uses a through adapter
that has the same connectors as the non-
insertable DUT (this adapter is sometimes
referred to as the calibration adapter). The
electrical length of the adapter must be speci-
fied within one-quarter wavelength at each
calibration frequency. Type N, 3.5-mm, and
2.4-mm calibration kits for the 8510 contain
adapters specified for this purpose. For other
adapters, the user can simply enter the
electrical length.

Two full two-port calibrations are needed for

an adapter-removal calibration. In the first
calibration, the through adapter is placed on
test port two, and the results are saved into a
calibration set. In the second calibration, the
adapter is moved to test port one and the
resulting data is saved into a second calibra-
tion set. Two different calibration kits may be
used during this process to accommodate
devices with different connector types. To
complete the adapter-removal calibration,
the network analyzer uses the two sets of
calibration data to generate a new set of error
coefficients that completely eliminate the
effects of the calibration adapter. At this point,
the adapter can be removed and measure-
ments can be made directly on the DUT.

61
 Thru-Reflect-Line
(TRL) Calibration
–
– When performing a two-port calibration, we have
– some choices based on the type of calibration
– standards we want to use. So far, we have only
discussed coaxial calibration techniques. Let’s
– briefly look at TRL (throughreflect-line), a cali-
bration technique that is especially useful for
– microwave, noncoaxial environments such as
fixture, wafer probing, or waveguide. It is the
second-most common type of two-port cali-
bration, after SOLT. TRL solves for the same
12 error terms as the more common SOLT cali-
bration, but uses a slightly different error model.

The main advantage of TRL is that the calibra-

tion standards are relatively easy to make and
define at microwave frequencies. This is a big
benefit since is difficult to build good, nonco-
axial, open and load standards at microwave
frequencies. TRL uses a transmission line of
known length and impedance as one standard.
The only restriction is that the line needs to be
significantly longer in electrical length than the
through line, which typically is of zero length.
TRL also requires a high-reflection standard
(usually, a short or open) whose impedance
does not have to be well characterized, but it
must be electrically the same for both test ports.

For RF applications, the lengths of the trans-

mission lines needed to cover down to low
frequencies become impractical (too long). It
is also difficult to make good TRL standards
on printed-circuit boards, due to dielectric,
line-dimension, and board-thickness varia-
tions. And, the typical TRL fixture tends to be
more complicated and expensive, due do the
need to accommodate throughs of two differ-
ent physical lengths.

There are two variations of TRL. True TRL

calibration requires a 4-receiver network ana-
lyzer. The version for three-receiver analyzers
is called TRL* (“TRL-star”). Other variations
of this type of calibration (that share a common
error model) are Line-Reflect-Line (LRL),
Line-Reflect-Match (LRM), Thru-Reflect-Match
(TRM), plus many others.

62
 Agenda
–
– This section will cover some typical measure-
– ments. We will look at swept-frequency testing
– of filters and swept-power testing of amplifiers.
–

63
 Frequency Sweep –
Filter Test
Shown above are the frequency responses
of a filter. On the left and bottom we see the
transmission response in log magnitude for-
mat, and on the right we see the reflection
response (return loss).

The most commonly measured filter character-

istics are insertion loss and bandwidth, shown
on the lower plot with an expanded vertical
scale. Another common parameter we might
measure is out-of-band rejection. This is a mea-
sure of how well a filter passes signals within
its bandwidth while simultaneously rejecting all
other signals outside of that same bandwidth.
The ability of a test system to measure out-of-
band rejection is directly dependent on its
system dynamic-range specification.

The return loss plot is very typical, showing

high reflection (near 0 dB) in the stopbands,
and reasonable match in the passband. Most
passive filters work in this manner. A special
class of filters exist that are absorptive in both
the passband and stopband. These filters exhibit
a good match over a broad frequency range.

For very narrowband devices, such as crystal

filters, the network analyzer must sweep slow
enough to allow the filter to respond properly.
If the default sweep speed is too fast for the
device, significant measurement errors can
occur. This can also happen with devices that
are electrically very long. The large time delay
of the device can result in the receiver being
tuned to frequencies that are higher than those
coming out of the device, which also can cause
significant measurement errors.

64
 Optimize Filter Measurements
With Swept-List Mode
Many network analyzers have the ability to
define a sweep consisting of several individual
segments (called swept-list mode in the 8753
and 8720 series, and segment sweep in the
PNA Series). These segments can have their
own stop and start frequency, number of data
points, IF bandwidth, and power level. Using a
segmented sweep, the sweep can be optimized
for speed and dynamic range. Data resolution
can be made high where needed (more data
points) and low where not needed (less data
points); frequency ranges can be skipped
where data is not needed at all; the IF band-
width can be large when high dynamic range
is not necessary (in filter passbands, for exam-
ple), which decreases the sweep time, and
small when high dynamic range is required
(in filter stopbands, for example); the power
level can be decreased in the passband and
increased in the stopband for DUTs that
contain a filter followed by an amplifier (for
example, a cellular-telephone base-station
receive filter/LNA combination). The slide
shows an example of a filter/amplifier combi-
nation where the sweep time and dynamic
range using a segmented sweep are consider-
ably better compared to using a linear sweep,
where the IF bandwidth and power level are fixed.

65
 Power Sweeps – Compression
Many network analyzers have the ability to do
power sweeps as well as frequency sweeps.
Power sweeps help characterize the nonlinear
performance of an amplifier. Shown above is a
plot of an amplifier’s output power versus input
power at a single frequency. Amplifier gain at
any particular power level is the slope of this
curve. Notice that the amplifier has a linear
region of operation where gain is constant and
independent of power level. The gain in this
region is commonly referred to as “small-signal
gain”. At some point as the input power is
increased, the amplifier gain appears to
decrease, and the amplifier is said to be in
compression. Under this nonlinear condition,
the amplifier output is no longer sinusoidal —
some of the output power is present in
harmonics, rather than occurring only at the
fundamental frequency. As input power is
increased even more, the amplifier becomes
saturated, and output power remains constant.
At this point, the amplifier gain is essentially
zero, since further increases in input power
result in no change in output power. In some
cases (such as with TWT amplifiers), output
power actually decreases with further increas-
es in input power after saturation, which
means the amplifier has negative gain.

Saturated output power can be read directly

from the above plot. In order to measure the
saturated output power of an amplifier, the
network analyzer must be able to provide a
power sweep with sufficient output power to
drive the amplifier from its linear region into
saturation. A preamp at the input of the amplifi-
er under test may be necessary to achieve this.

66
 Power Sweep –
Gain Compression
The most common measurement of amplifier
compression is the 1-dB-compression point,
defined here as the input power1 which results
in a 1-dB decrease in amplifier gain (referenced
to the amplifier’s small-signal gain). The easi-
est way to measure the 1-dB-compression
point is to directly display normalized gain
(B/R) from a power sweep. The flat part of the
trace is the linear, small-signal region, and the
curved part on the right side corresponds
to compression caused by higher input power.
As shown above, the 1-dB-compression point
of the amplifier-under-test is 12.3 dBm, at a
CW frequency of 902.7 MHz.

It is often helpful to also know the output power

corresponding to the 1-dB-compression point.
Using the dualchannel feature found on most
modern network analyzers, absolute power and
normalized gain can be displayed simultane-
ously. Display markers can read out both the
output power and the input power where
1-dB-compression occurs. Alternatively, the
gain of the amplifier at the 1-dB-compression
point can simply be added to the 1-dB-
compression power to compute the corre-
sponding output power. As seen above, the
output power at the 1-dB-compression point
is 12.3 dBm + 31.0 dB = 43.3 dBm.

It should be noted that the power-sweep range

needs to be large enough to ensure that the
amplifier under test is driven from its linear
region into compression. Modern network
analyzers typically provide power sweeps with
15 to 25 dB of range, which is more than
adequate for most amplifiers. It is also very
important to sufficiently attenuate the output
of high-power amplifiers to prevent damage
to the network analyzer’s receiver.

1. The 1-dB-compression point is sometimes

defined as the output power resulting in a
1-dB decrease in amplifier gain (as opposed
to the input power).

67
 phase distortion causes analog signal
degradation, or increased bit-error rates (BER)
in digital systems. Examples of common modu-
– lation types that use phase modulation are FM,
QPSK, and 16QAM. While it is easy to measure
– the BER of a digital communication system,
this measurement alone does not provide any
insight into the underlying phenomena which
cause bit errors. AM-to-PM conversion is one
of the fundamental contributors to BER, and
therefore it is important to quantify this
parameter in communication systems.

The I/Q diagram shown above shows how

AM-to-PM conversion can cause bit errors.
Let’s say the desirable state change is from the
small solid vector to the large solid vector.
With AM-PM conversion, the large vector may
actually end up as shown with the dotted line.
This is due to phase shift that results from a
change in power level. For a 64QAM signal as
shown (only one quadrant is drawn), we see
that the noise circles that surround each state
would actually overlap, which means that
statistically, some bit errors would occur.
AM to PM Conversion
AM-to-PM conversion is usually defined as the
Another common measurement which helps change in output phase for a 1-dB increment
characterize the nonlinear behavior of amplifiers in the input power to an amplifier, expressed in
is AM-to-PM conversion, which is a measure degrees-per-dB (o/dB). An ideal amplifier
of the amount of undesired phase deviation (the would have no interaction between its phase
PM) which is induced by amplitude variations response and the level of the input signal. To
inherent in the system (the AM). In a communi- measure AM to PM conversion, we can use the
cations system, this unwanted PM is caused by power sweep capability of the network analyzer.
unintentional amplitude variations such as As the slide shows, a power sweep is equivalent
power supply ripple, thermal drift, or multipath to a quarter cycle of sinusoidal modulation.
fading, or by intentional amplitude change that
is a result of the type of modulation used, such
as the case with QAM or burst modulation.

AM-to-PM conversion is a particularly critical

parameter in systems where phase (angular)
modulation is employed, because undesired

68
 Measuring AM to PM
Conversion
AM-PM conversion can be measured by per-
forming a power sweep with a vector network
analyzer, using the same transmission setup
– that we used for gain compression. The dis-
played data is formatted as the phase of
– S21 (transmission) versus power. AM-PM
– conversion can be computed by choosing a
small amplitude increment (typically 1 dB)
centered at a particular RF power level, and
noting the resultant change in phase. The
easiest way to read out the amplitude and
phase deltas is to use trace markers. Dividing
the phase change by the amplitude change
yields AM-PM conversion. The plot above
shows AM-PM conversion of 0.86o/dB, cen-
tered at an input power of –4.5 dBm and an
output power of 16.0 dBm. Had we chosen to
measure AM-PM conversion at a higher power
level, we would have seen a much larger value
(around 7o/dB).

– Agenda
–
– The appendix is intended to provide more
– detail on selected topics, such as time domain
– and balanced measurements, and to give
-- pointers to reference material which covers
some of these topics in more detail.

--
--

69
 Time-Domain
Reflectometry (TDR)
Time-domain reflectometry (TDR) is a very
useful tool that allows us to measure imped-
ance versus distance. One good application
for TDR is fixture design and the design of
corresponding in-fixture calibration standards.
We can distinguish between capacitive and
inductive transitions, and see non-Zo transmis-
sion lines. TDR can help us determine the
magnitude and position of reflections from
transitions within the fixture, and we can
measure the quality of the calibration stan-
dards. As long as we have enough spatial
resolution, we can see the reflections of the
connector launches independently from the
reflections of the calibration standards. It is
very easy to determine which transition is
which, as the designer can place a probe
on a transition and look for a large spike
on the TDR trace.

With time-domain gating, we can isolate

various sections of the fixture and see the
effects in the frequency domain. For example,
we can choose to look at just the connector
launches (without interference from the
reflections of the calibration standards), or
just the calibration standards by themselves.

Another application for TDR is fault-location for

coaxial cables in cellular and CATV installations.
We can use TDR in these cases to precisely
determine the location of cable faults such as
crimps, poor connections, shorts, opens —
anything that causes a portion of the incident
signal to be reflected.

70
 the integral of an impulse, if we integrate the
– frequency-response data of our DUT, we will
– have frequency-domain data corresponding to
– the step response in the time domain. Now, we
simply perform an inverse-Fourier transform to
get from the frequency domain to the time
domain, and voilá, we have the step response .
Note that we could also perform the inverse-
Fourier transform first, and then integrate
the time-domain data. The result would be
the same. The actual math used in the network
analyzer is somewhat more complicated than
described above, in order to take care of other
effects (one example is extrapolating a value
for the DC term, since the analyzer doesn’t
measure all the way down to 0 Hz).

To get more resolution in the time domain (to

separate transitions), we need a faster effective
rise time for our step response. This translates
to a sharper (narrower) effective impulse,
which means a broader input-frequency range
TDR Basics Using a must be applied to our DUT. In other words,
Network Analyzer the higher the stop frequency, the smaller the
distance that can be resolved. For this reason,
TDR measurements using a vector network it is generally necessary to make microwave
analyzer start with a broadband sweep in the measurements on the fixture to get sufficient
frequency domain. The inverse-Fourier resolution to analyze the various transitions.
transform is used to transform frequency- Providing sufficient spacing between transi-
domain data to the time domain. The figure tions may eliminate the need for microwave
on the left of the slide shows a simplified characterization, but can result in very large
conceptual model of how a network analyzer fixtures. The plot above of a fixtured-load
derives time-domain traces. For step-response standard shows the extra resolution obtained
TDR, we want to end up at the lower left-hand with a 20 GHz sweep versus only a 6 GHz sweep.
plot. The network analyzer gathers data in the
frequency domain (upper right) from a broad-
band sweep (note: all the data is collected from
a reflection measurement). In effect, we are
stimulating the DUT with a flat frequency input,
which is equivalent to an impulse in the time
domain. The output response of our DUT is
therefore the frequency response of its impulse
response. Since a step in the time domain is

71
 Time-Domain Gating
–
– Gating can be used in conjunction with
– time-domain measurements to separate and
– remove undesirable reflections from those of
interest. For example, gating can isolate the
reflections of a DUT in a fixture from those
of the fixture itself. This is a form of error
correction. For time-domain gating to work
effectively, the time domain responses need
to be well-separated in time (and therefore
distance). The gate itself looks like a filter in
time, and has a finite transition range between
passing and rejecting a reflection (similar to
the skirts of a filter in the frequency domain).

The plots above show the performance of an

in-fixture thru standard (without normalization).
We see about a 7 dB improvement in the
measurement of return loss at 947 MHz using
time-domain gating - in this case, the through
standard is quite good, having a return loss of
45 dB. The gating effectively removes the
effects of the SMA connectors at either end
of the test fixture.

Ten Steps for Performing TDR

Here is a summary of how to perform TDR
measurements. Without such a checklist, it
is easy to overlook some of the more subtle
steps, resulting in confusing or misleading
measurements. A one-port calibration is all that
is needed when characterizing connectors and
– the open, short and load standards. A two-port
– calibration is needed to characterize the reflec-
– tion or line impedance of the thru standard.
–
–

72
 TIme-Domain Transmission
Time-domain transmission (TDT) is a similar
tool which uses the transmission response
instead of the reflection response. It is useful
in analyzing signal timing in devices such as
SAW filters. Gating is also useful in TDT
applications. In the above example, a designer
could look at the frequency response of the
main surface wave without the effect of the
leakage and triple-travel error signals.

Time-Domain Filter Tuning

–
Many communications systems use coupled-
cavity-resonator bandpass filters, since they
– can handle high power levels and provide high
rejection and sharp skirts. These filters are
-- typically tuned to achieve the desired frequency
-- response, which can be a tedious and time-
consuming job. The difficulty of tuning these
filters quickly and accurately often limits
– manufacturers from increasing their production
volumes and reducing manufacturing costs.

Tuning these filters using the time domain

response of S11 or S22 is vastly easier and
faster. It is possible to tune each resonator
and coupling aperture individually, since
time-domain measurements can distinguish
the individual responses of each filter element.
Such clear identification of responses is
extremely difficult (or impossible) in the
frequency domain.

This technique requires a vector network

analyzer with sufficient sweep and processing
speed to allow real-time tuning while the
time-domain transform is applied. Keysight’s
8753, 8720, and PNA Series analyzers are
all well suited for this application.

73
 Filter Reflection in
Time Domain
– The slide shows the reflection a response of a
well-tuned filter in both the frequency and time
– domains. The nulls in the time-domain response
– occur when the resonators are exactly tuned.
The peaks between the nulls relate to the
coupling factors of the filter’s apertures. To set
up the measurement for time-domain tuning,
the frequency sweep MUST be centered at the
desired center frequency of the bandpass filter.
This is critical, since the tuning method will
tune the filter to exactly that center frequency.
The frequency span should be set to approxi-
mately two to five times the expected bandwidth.

Tuning Resonator #3

– This slide shows that resonator #3 is mistuned,

since the null for that cavity is missing. Tuning
can be made even easier by overlaying the
– desired time-domain response in a memory
trace, making it easy to see where the resona-
– tor nulls and peaks should occur. The memory
trace can either be obtained from a “golden”
– filter or from a circuit simulation of the desired
filter response.

More information about this application can

be obtained from the following source:

“Simplified Filter Tuning Using Time Domain”,

Application Note, 5968-5328E (6/99)

74
 Frequency-Translating Devices
Measuring frequency-translating devices
requires a network analyzer that has frequency-
offset capability. This means the network
analyzer’s source can be tuned independently
from its receivers. The 8753 and 8720 series
of network analyzers provided this function. The
slide shows two ways to measure a frequency-
translating device. In the upper left corner, a
device with limited dynamic range, such as a
mixer, can be measured as shown, by putting
the output of the mixer directly into the refer-
ence input of the network analyzer (instead of
into port 2 as is normally done). This configu-
ration allows measurements of up to 30 dB of
dynamic range, which is generally sufficient to
measure the conversion loss of a mixer.

The drawing on the right half of the slide

shows a more complicated setup involving a
reference mixer. The reference mixer is needed
to establish phase-lock of the source, and can
be used as a phase reference for measure-
ments of insertion phase or group delay. This
setup utilizes the full dynamic range of the
network analyzer, and is particularly useful
for measuring mixer/filter combinations.

75
 High-Power Amplifiers
More information about measuring
high-power amplifiers can be obtained
from the following sources:

“Using a Network Analyzer to Characterize

High-Power Devices,” Application Note,
5966-3319E (4/98)

“Measurement Solutions for Test

Base-Station Amplifiers”, 1996 Device Test
Seminar handout, 5964-9803E (4/96)

“Modern Solutions for Testing RF

Communications Amplifiers”,
1995 Device Test Seminar handout,
5963-5191 E (12/94)

“Amplifier Measurements using the 8753

Network Analyzer”, Application Note,
5956-4361 (5/88)

“Testing Amplifiers and Active Devices with the

8720 Network Analyzer”, Application Note,
5091-1942E (8/91)

“85108 Series Network Analyzer Systems

for Isothermal, High-Power, and Pulsed
Applications”, Application Note,
5091-8965E (‘94)

“85118 Series High Power Amplifier

Test System”, Application Note,
5963-9930E (5/95)

76
 High-Dynamic Range
Measurements
Extended dynamic range filter measurements
can be achieved by either bypassing or revers-
ing the coupler at test port 2 (for forward
transmission measurements). By reversing the
port 2 coupler, the transmitted signal travels to
the “B” receiver via the main arm of the cou-
pler, instead of the coupled arm. This increases
the effective sensitivity of the analyzer by
around 12 dB. To take advantage of this
increased sensitivity, the power level must be
decreased in the passband, to prevent the
receiver from compressing. This is easily done
using a segmented sweep, where the power is
set high in the stopbands (+10 dBm typically),
and low in the passband (-6 dBm typically).
The IF bandwidth can be widened for the
passband segment to speed up the overall
sweep. When the port 2 coupler is reversed,
2-port error correction can still be used, but
the available power at port 2 is 12 dB lower
than the normal configuration.

Direct access to the receivers (which also

extends dynamic range) can be achieved on
PNA Series analyzers (either standard or with
option 014), or by ordering Options 014 or
H85 on the 8753, or Options 012 or 085 on
the 8720 series. Keysight also offers a special
option (H16) for the 8753 that adds a switch
that can reverse the port-two coupler. The
coupler can be switched to the usual configu-
ration for normal operation.

77
 Multiport Device Test
High-volume tuning and testing of multiport
devices (devices with more than two ports) can
be greatly simplified by using a multiport test
set between the DUT and the network analyzer.
A single connection to each port of the DUT
allows complete testing of all transmission
paths and port reflection characteristics. Keysight
multiport test systems eliminate time-consuming
reconnections to the DUT, keeping production
costs down and throughput up. By reducing
the number of RF connections, the risk of mis-
connections is lowered, operator fatigue is
reduced, and the wear on cables, fixtures,
connectors, and the DUT is minimized.

Keysight offers a variety of multiport test

systems, both standard and custom. Some, like
the 8753 H39, which is targeted to duplexer
manufacturers, have built-in multiport test
sets. Custom test sets can be created in 50
and 75 ohms with a variety of connector types
and switching configurations, to exactly suit a
user’s application.

More information about measuring

multiport devices can be obtained from
the following source:

“Improve Test Throughput for Duplexers and

Other Multiport Devices”, 1996 Device Test
Seminar handout, 5964-9803E (4/96)

“Novel Techniques Simplify Calibration of New

Multiport Device Test System”, proceedings of
the 1999 European Microwave Conference.

78
 E5091A Test Set For
ENA Series Analyzers
The Keysight E5091A multiport test set
combined with the 4-port ENA Series network
analyzer is a complete solution for multiport
device measurements. The multiport test
set is available in 7- and 9-port configurations.
The system is tailored for testing antena-switch
modules for mobile handsets, particularly
those modules with balanced ports, although
it can be used in a wide range of multiport
measurement applications. The system is
well-suited for both manufacturing and R&D.
It has exceptionally fast measurement speed,
and various features that facilitate test automa-
tion. The N4431A 4-port ECal module is avail-
able for efficient multiport calibration. Easy to
use operation of the multiport system minimizes
measurement setup time.

9-Port PNA Series

–
Solution for High-Volume
–
Manufacturing of LTCC/SAW
– Front-ENd Modules
--
-- Keysight has test sets that are specifically meant
-- to work with the PNA Series of network analyz-
ers, for the ultimate in measurement accuracy,
– speed, and convenience. Both solid-state and
– mechanical switching is available. The test sets
are controlled by a Visual Basic program that
runs internally in the network analyzer to coor-
dinate the test set and VNA. The VB program
also provides additional measurement capabili-
ty beyond the native firmware of the network
analyzer. The solution shown on the slide is
targeted towards high-volume manufacturing
of front-end modules for cellular telephones
and other wireless appliances.

79
 87050E/87075C Standard
Multiport Test Sets
Keysight offers a line of standard multiport test
sets that are designed to work with the 8712E
series of network analyzers to provide a
complete, low-cost multiport test system.
The 87075C features specified performance to
1.3 GHz with 6 or 12 test ports (75 ohm), and
– the 87050E features specified performance to
2.2 GHz with 4, 8, or 12 test ports (50 ohm).
–
These test sets contain solid-state switches
– for fast, repeatable, and reliable switching
– between measurement paths.
– New calibration techniques can dramatically
reduce the time needed to calibrate the test
system. Test Set Cal is a mechanical-standards
based calibration that eliminates redundant
connections of reflection standards and mini-
mizes the number of through standards need-
ed to test all possible measurement paths.
SelfCal is an internally automated calibration
technique that uses solid-state switches to
measure calibration standards located inside
the test set. SelfCal executes automatically in
just a few seconds (at a user-defined interval),
restoring the measurement accuracy of the
Test Set Cal. This effectively eliminates
test-system drift, and greatly increase the
interval between Test Set Cals. With SelfCal,
a Test Set Cal needs to be performed only
about once per month, unlike other test sys-
tems that typically require calibration once or
twice a day. This combination can easily reduce
overall calibration times by a factor of twenty
or more, increasing the amount of time a test
station can be used to measure components.

For more information about these multiport

test systems, please order Keysight literature
number 5968-4763E (50 ohm), or
5968-4766E (75 ohm).

80
 Test Set Cal Eliminates
Redundant Connections
of Calibration Standards
This slide shows the decrease in the number
of connections needed to fully calibrate the
multiport test systems using Test Set Cal.

In-Fixture Measurements
More information about in-fixture
measurements can be obtained from
the following sources:

“In-Fixture Measurements Using Vector

Network Analyzers”, Application Note,
5968-5329E (5/99)

“Designing and Calibrating RF Fixtures for

Surface-Mount Devices”, 1996 Device Test
Seminar handout, 5964-9803E (4/96)
–
– “Accurate Measurements of Packaged RF
–
Devices”, 1995 Device Test Seminar handout,
5963-5191 E (12/94)

“Specifying calibration standards for the

8510 network analyzer”, Application Note,
08510-90352 (1/88)

“Applying the 8510 TRL calibration for

non-coaxial measurements”, Application Note,
5091-3645E (2/92)

81
 Characterizing Crystal
Resonators/Filters
More information about measuring crystal
resonators and filters can be obtained from
the following sources:

“Crystal Resonators Measuring Functions of

E5100A/B Network Analyzer”, Application Note,
(5965-4972E)

“E5100A/B Network Analyzer”,

Technical Overview, 5963-3991E

What are Balanced Devices?

Let’s briefly review how balanced devices work.
Ideally, a balanced device only responds to or
generates differential-mode signals, which are
defined as two signals that are 180° out of
phase with one another. These devices do not
respond to or generate in-phase signals, which
are called common-mode signals. In the top
example of a balanced-to-single-ended ampli-
fier, we see that the amplifier is responding the
differential input, but there is no output when
common-mode or in-phase signals are present
at the input of the amplifier. The lower example
shows a fully balanced amplifier, which is both
differential inputs and outputs. Again, the
amplifier only responds to the differential input
signals, and does not produce an output in
response to the common-mode input.

One of the main reasons that balanced circuits

are desirable is because external signals that
are radiated from an RF emitter show up at the
terminals of the device as common mode, and
are therefore rejected by the device. These
interfering signals may be from other RF cir-
cuitry or from the harmonics of digital clocks
or data. Balanced circuits also reject noise on
the electrical ground, since the noise appears
in phase to both input terminals, making it a
common-mode signal.

82
 What About
Non-Ideal Devices?
We just discussed ideal balanced circuits. Real
world devices on the other hand, don’t com-
pletely reject common mode noise or generate
only differential signals. The example on the
top shows that a balanced device will produce
a small amount of common mode signal that
rides on top of the differential signal output.
This common mode signal is the result of dif-
ferential to common mode conversion, and it is
a source of electromagnetic interference. The
bottom example shows what can happen when
a common-mode signal is present at the input
to the device. Common to differential mode
conversion results in a differential signal at the
output of the device, which will interfere with
the desired differential output, which is not
shown on the slide for simplicity. This mode
conversion makes a circuit susceptible to elec-
tromagnetic interference.

So What?
–
Now that you see how these balanced circuits
–
operate, you can begin to understand why
– characterizing this behavior is very important
– to RF and digital designers. They need to
characterize the differential to differential
– mode, which represents the desired mode of
-- operation, as well as the undesired mode con-
versions. Another challenge is that differential
-- devices and circuits often have input and
-- output impedances other than 50 ohms.
Characterizing these devices with a standard
-- two-port network analyzer is difficult. And
finally, there are other differential parameters
that are also not measured with standard two-
port network analyzers, such as commonmode
rejection ratio or conjugate matching.

83
 Keysight Solution for
–
--
Balanced Measurements
--
Keysight’s solutions for balanced measure-
-- ments address the challenges that wireless and
digital designers face when characterizing
-- differential devices. The ENA series is the
best choice for wireless and general RF
– applications, as it offers a superior value for
-- 4-port single-ended and balanced measure-
-- ments. Data can be presented as mixed-mode
S-parameters, which allows designers to
clearly see the desired and undesired
-- modes of operation.

-- For microwave or signal integrity applications,

the N1947/48/51A physical-layer test systems
are the best choice. These systems include
software (N1930A) that offers many features
specifically for digital designers. Keysight’s
physical-layer test systems provide you with a
signal-integrity “expert in a box” that displays
data in ways that make sense to digital-design
and signal-integrity engineers. You can easily
analyze your device-under-test in the time or
frequency domain with exceptional accuracy.
Use eye diagrams to evaluate eye closure
and deterministic jitter due to your device’s
performance. Easily extract RLCG parameters
to accurately verify transmission line designs.
You can also perform “what if” analysis to
test the limits of your design. Perform
skew analysis to help understand mode con-
versions and their impact on your system’s
electromagnetic-interference performance.
Gate out unwanted responses in the time
domain, giving you a clear picture of your
device’s performance versus frequency.
Optimize signal quality by experimenting
with different compensation networks and
their effect on eye diagrams.

84
 – Agenda
–
–
– This next section goes into more detail
– about the inside workings of vector
-- network analyzers.

--
--

Traditional Scalar
Analyzer
The following slides give more detailed
information about scalar network analyzers,
signal separation devices, and the receiver
section within a vector network analyzer.

Here is a picture of a traditional scalar system

– consisting of a processor/display unit (8757D)
– and a stand-alone source (83750B series).
This type of system requires external splitters,
couplers, detectors, and bridges. While not as
common as they used to be, scalar systems
such as this are good for low-cost microwave
scalar applications.

The configuration shown for reflection provides

the best measurement accuracy (assuming the
termination is a high-quality Zo load), especially
for low-loss, bidirectional devices (i.e., devices
that have low loss in both the forward and
reverse directions). Alternately, the transmis-
sion detector can be connected to port two of
the DUT, allowing both reflection and transmis-
sion measurements with a single setup. The
drawback to this approach is that the detector
match (which is considerably worse than a
good load) will cause mismatch errors during
reflection measurements.

85
 Directional Coupler Directivity
One of the most important parameter for cou-
plers is their directivity. Directivity is a measure
of a coupler’s ability to separate signals flowing
in opposite directions within the coupler. It can
be thought of as the dynamic range available
for reflection measurements. Directivity can be
defined as:

Directivity (dB) = Isolation (dB) - Forward

Coupling Factor (dB) - Loss (through-arm) (dB)

(Note: this definition deviates somewhat from

the traditional definition of directivity for a
dual directional coupler, which is simply the
forward-coupling factor divided by the
reverse-coupling factor).

In the upper example in the above slide, our

coupler exhibits a directivity of 30 dB. This
means that during a reflection measurement,
the directivity error signal is 30 dB below the
desired signal (when measuring a device with
full reflection or ρ = 1). The better the match of
the device under test, the more measurement
error the directivity error term will cause.

The slide also shows the effect of adding attenu-

ators to the various ports of the coupler. The
middle example shows that adding attenuation
to the test port of a network analyzer reduces
the raw (uncorrected) directivity by twice the
value of the attenuator. While vector-error
correction can correct for this, the stability of
the calibration will be greatly reduced due to
the degraded raw performance.

The lower example shows that adding an

attenuator to the source side of the coupler
has no effect on directivity. This makes sense
since directivity is not a function of input-
power level.

Adding an attenuator to the coupled port

(not shown) affects both the isolation and
forward-coupling factor by the same amount,
so directivity is also unaffected.

86
 One Method of Measuring
Coupler Directivity
This is one method of measuring directivity in
couplers (or in a network analyzer) that doesn’t
require forward and reverse measurements.
First we place a short at the output port of the
main arm (the coupler is in the reverse direc-
tion). We normalize our power measurement to
this value, giving a 0 dB reference. This step
accounts for the coupling factor and loss. Next,
we place a (perfect) load at the coupler’s main
port. Now, the only signal we measure at the
coupled port is due to leakage. Since we have
already normalized the measurement, the
measured value is the coupler’s directivity.

Directional Bridge
Another device used for measuring reflected
– signals is the directional bridge. Its operation
is similar to the simple Wheatstone bridge. If
– all four arms are equal in resistance (50 Ω
– connected to the test port) a voltage null is
measured (the bridge is balanced). If the
– test-port load is not 50 Ω, then the voltage
across the bridge is proportional to the
mismatch presented by the DUT’s input.
The bridge is unbalanced in this case. If we
measure both magnitude and phase across
the bridge, we can measure the complex
impedance at the test port.

A bridge’s equivalent directivity is the ratio (or

difference in dB) between maximum balance
(measuring a perfect Zo load) and minimum
balance (measuring a short or open). The
effect of bridge directivity on measurement
uncertainty is exactly the same as we
discussed for couplers.

87
 NA Hardware: Front Ends,
Mixers Versus Samplers
Tuned receivers can be implemented with
mixer- or sampler-based front ends. It is often
cheaper and easier to make wideband front
ends using samplers instead of mixers,
especially for microwave frequency coverage.
Samplers are used with many of Keysight’s
network analyzers, such as the 8753 series
of RF analyzers, and the 8720 series of
microwave network analyzers. The PNA
Series uses mixers.

The sampler uses diodes to sample very

short time slices of the incoming RF signal.
Conceptually, the sampler can be thought of as
a mixer with an internal pulse generator driven
by the LO signal. The pulse generator creates a
broadband frequency spectrum (often referred
to as a “comb”) composed of harmonics of the
LO. The RF signal mixes with one of the spec-
tral lines (or “comb tooth”) to produce the
desired IF. Compared to a mixerbased network
analyzer, the LO in a sampler-based front end
covers a much smaller frequency range, and a
broadband mixer is no longer needed. The
tradeoff is that the phase-lock algorithms for
locking to the various comb teeth are more
complex and time consuming.

Sampler-based front ends also have somewhat

less dynamic range than those based on mixers
and fundamental LOs. This is due to the fact
that additional noise is converted into the IF
from all of the comb teeth. Network analyzers
with narrowband detection based on samplers
still have far greater dynamic range than
analyzers that use diode detection.

88
 Mixers Versus Samplers:
Time Domain
Let’s look at the difference between samplers
and mixers in the time domain first. Samplers
use very narrow pulses to sample the RF
input, compared to fundamental or third-order
mixing. The narrow pulse is what makes a
harmonic-rich LO in the frequency domain.
This narrow pulse also gives more time-domain
resolution, making it easier to follow the peaks
and valleys of the noise. The result is that there
is more noise on the IF signal.

In contrast, the mixer’s LO is on for roughly half

of the RF cycle, assuming a single-balanced
mixer, which is typically the case for RF front
ends. This longer period provides much more
noise averaging. The result is less noise on
the IF signal.

Mixers Versus Samplers:

Frequency Domain
Now let’s use a frequency-domain approach
to explain why there is more noise conversion
using samplers.

As was mentioned earlier, there are many

harmonics of the LO in the frequency domain
when using a sampler. Any noise present one
IF away from every comb tooth, on either side,
will be down-converted and detected in the IF.
Since there are so many more harmonics,much
more noise conversion takes place compared
to using mixers, where noise is converted only
around the fundamental and third harmonic
of the LO. The noise multiplication effect from
all of the sampler LO harmonics result in the
sampler having a worse noise figure than the
mixer. Typically, the difference is around 20 to
30 dB, depending on the frequencies involved.

Both the time domain and frequency domain

approaches are valid ways at looking at the
down-conversion process. They are just two
different ways of explaining the same
phenomenon.

89
 Threee Versus Four-
Receiver Analyzers
As already discussed there are two main types
of test sets, transmission/reflection and
S-parameter test sets. The S-parameter test
set has two basic test set architectures: one
employing three receivers (either samplers
or mixers) and one employing four receivers.
The three-receiver architecture is simpler and
less expensive, but the calibration choices are
not as good. This type of network analyzer can
do TRL* and LRM* calibrations, but not true
– – TRL or LRM.
– –
– – Four-receiver analyzers employ a second
-- -- reference receiver, so forward and reverse
-- -- sweeps each have their own reference receiver.
-- This eliminates any nonsymmetrical effects of
the transfer switch. Four-receiver analyzers are
more expensive, but provide better accuracy
for noncoaxial measurements. With a four-
receiver architecture, true TRL calibrations
can be performed.

90
 Why Are Four Receivers
Better Than Three?

– Just what is the difference between TRL and

TRL*? TRL* assumes the source and load
– match of a test port are equal (i.e., there is
port-impedance symmetry between forward
– and reverse measurements). This is only a fair
-- assumption for a three-receiver network ana-
lyzer. TRL* requires ten measurements to
-- quantify eight unknowns. True TRL calibration
– requires four receivers (two reference receivers
-- plus one each for reflection and transmission)
-- and fourteen measurements to quantify ten
– unknowns. TRL and TRL* use identical calibra-
– tion standards. The isolation portion of a TRL
-- calibration is the same as for SOLT.
--
In noncoaxial applications, TRL achieves better
source match and load match correction than
TRL*, resulting in less measurement error.
For coaxial applications, SOLT calibration is
almost always the preferred method. Keysight
can provide coaxial calibration kits all the way
up to 110 GHz, with a variety of connector
types. While not commonly done, coaxial TRL
calibration can be more accurate than SOLT
calibration, but only if very-high quality coaxial
transmission lines (such as beadless airlines )
are used.

Option 400 for the 8720 series adds a fourth

sampler, allowing these analyzers to do a full
TRL calibration. The PNA Series feature four
measurement receivers in the standard product.

91
 Challenge Quiz

92
 Answers to Challenge Quiz
The correct answers to the challenge quiz are:
1. E
2. C
3. A
4. B
5. C
6. A
7. D
8. B
9. E

Web Sources
For additional information regarding
Keysight Network Analyzers, visit:
www.keysight.com/find/na

For Keysight “Back To Basics” eSeminar,

series information, visit:
www.keysight.com/find/backtobasics

93
94 | Keysight | Network Analyzer Basics - Training Deliverable

myKeysight For more information on Keysight

Technologies’ products, applications or
www.keysight.com/find/mykeysight
services, please contact your local Keysight
A personalized view into the information most relevant to you.
office. The complete list is available at:
www.axiestandard.org www.keysight.com/find/contactus
AdvancedTCA® Extensions for Instrumentation and Test (AXIe) is an
open standard that extends the AdvancedTCA for general purpose and Americas
semiconductor test. Keysight is a founding member of the AXIe consortium. Canada (877) 894 4414
ATCA®, AdvancedTCA®, and the ATCA logo are registered US trademarks of Brazil 55 11 3351 7010
the PCI Industrial Computer Manufacturers Group. Mexico 001 800 254 2440
United States (800) 829 4444
www.lxistandard.org
LAN eXtensions for Instruments puts the power of Ethernet and the Asia Pacific
Web inside your test systems. Keysight is a founding member of the LXI Australia 1 800 629 485
consortium. China 800 810 0189
Hong Kong 800 938 693
www.pxisa.org India 1 800 112 929
Japan 0120 (421) 345
PCI eXtensions for Instrumentation (PXI) modular instrumentation delivers a
Korea 080 769 0800
rugged, PC-based high-performance measurement and automation system.
Malaysia 1 800 888 848
Singapore 1 800 375 8100
Three-Year Warranty
Taiwan 0800 047 866
www.keysight.com/find/ThreeYearWarranty Other AP Countries (65) 6375 8100
Keysight’s commitment to superior product quality and lower total cost
of ownership. The only test and measurement company with three-year Europe & Middle East
warranty standard on all instruments, worldwide. Austria 0800 001122
Belgium 0800 58580
Keysight Assurance Plans Finland 0800 523252
www.keysight.com/find/AssurancePlans France 0805 980333
Up to five years of protection and no budgetary surprises to ensure your Germany 0800 6270999
instruments are operating to specification so you can rely on accurate Ireland 1800 832700
measurements. Israel 1 809 343051
Italy 800 599100
www.keysight.com/go/quality Luxembourg +32 800 58580
Keysight Technologies, Inc. Netherlands 0800 0233200
DEKRA Certified ISO 9001:2008 Russia 8800 5009286
Quality Management System Spain 800 000154
Sweden 0200 882255
Keysight Channel Partners Switzerland 0800 805353
www.keysight.com/find/channelpartners Opt. 1 (DE)
Get the best of both worlds: Keysight’s measurement expertise and product Opt. 2 (FR)
breadth, combined with channel partner convenience. Opt. 3 (IT)
United Kingdom 0800 0260637

For other unlisted countries:

www.keysight.com/find/contactus
(BP-09-23-14)

This information is subject to change without notice.

© Keysight Technologies, 2004 - 2014
Published in USA, July 31, 2014
5965-7917E
www.keysight.com