Fabrication, Structure, and Transport Properties of Nanowires
Fabrication, Structure, and Transport Properties of Nanowires
I. Introduction 168
II. Fabrication and Structural Characteristics of Nanowires 168
A. Template-Assisted Synthesis 169
B. Laser-Assisted Synthesis 181
C. Other Synthesis Methods 184
III. Theoretical Modeling of Nanowire Band Structures 185
A. Band Structures of One-Dimensional Systems 185
B. The Semimetal–Semiconductor Transition in
Semimetallic Nanowires 188
IV. Transport Properties 191
A. Semiclassical Model 192
B. Temperature-Dependent Resistivity of Nanowires 193
V. Summary 198
References 199
I. Introduction
A. TEMPLATE-ASSISTED SYNTHESIS
with a packing density on the order of 109 to 1011/cm2 (Diggle et al., 1969;
O’Sullivan and Wood, 1970; AlMawlawi et al., 1991; Zhang et al., 1999).
The film thickness (or pore length) (< 1 µm to > 50 µm) can be controlled
by the duration of the anodization process. With their synthetic flexibility,
ordered pore structure, high pore density, and high mechanical strength, an-
odic alumina systems have gained great popularity as a template material for
nanowire fabrication. In addition, with recent improvements on the degree
of pore ordering, anodic alumina has stimulated much interest for other de-
vice applications (Govyadinov and Zakhvitcevich, 1998; Davydov et al., 1999;
Li et al., 1999; Masuda et al., 1999; Li et al., 2000; Kouklin et al., 2000) because
it provides a highly ordered two-dimensional nanopattern, readily and inex-
pensively, on a large scale compared to conventional lithographic approaches.
In the processing of anodic alumina films (Keller et al., 1953; Masuda
et al., 1997; Li et al., 1998a; Zhang et al., 1999), a thin aluminum sheet is first
mechanically and electrochemically polished to produce a smooth surface.
It is then anodized in an acidic solution at a constant voltage and tempera-
ture. The anodization voltage V determines the interpore distance D by the
empirical relation D (nm) = −1.7 + 2.81·V (volts) (Li et al., 1998a). Differ-
ent electrolytes are usually used for different anodization voltage ranges:
20 wt% sulfuric acid (H2SO4) for less than 20 V, 4 wt% oxalic acid (H2C2O4)
for 30–65 V, and 3.5 wt% phosphoric acid (H3PO4) for 70 V or more. The
as-prepared anodic alumina film has open pores on the top surface of the
substrate and is capped by a barrier layer on the other side (see Fig. 1).
Therefore, the sample has to be etched by an acidic solution to remove the
barrier layer for suitable applications (Li et al., 1998a; Jessensky et al., 1998).
Figures 2(a) and (b) show scanning electron microscopy (SEM) images of
the top surfaces of porous alumina templates anodized in 4 wt% oxalic acid
and 20 wt% sulfuric acid, respectively. The pore ordering and uniformity of
these materials have been optimized by a two-step anodization technique
(Li et al., 1998b; Lin et al., 2000).
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FIG. 2. SEM images of the top surfaces of porous anodic alumina templates anodized in (a)
4 wt% H2C2O4 and (b) 20 wt% H2SO4. The average pore diameters in (a) and (b) are 44 nm
and 18 nm, respectively.
FIG. 3. (a) SEM image of the particle track-etched polycarbonate membrane, with a pore
diameter of 1 µm (Martin, 1994). (b) SEM image of 2-µm pores in a single-crystal mica film
prepared by particle track-etching (Sun et al., 2000a).
Recently, single-crystalline mica films have also been used for the fabrication
of track-etched pores (Sun et al., 1999a). Polymer membranes have the disad-
vantage that they are relatively soft, so the definition of the pore morphology
is not straightforward, and their internal pore surfaces can be quite rough.
Also, they are fairly limited in working temperatures for sample fabrication
and characterization compared to mica films, which are chemically stable
up to 770 K. Figures 3(a) and (b) show the SEM images of etched tracks in
polycarbonate membranes (Martin, 1994) and mica films (Sun et al., 2000),
respectively. The track-etched pores in the polymeric membranes are ap-
proximately cylindrical. Due to anisotropic etching rates, the pores in mica
films have a diamond-shaped cross section with a tapered pore wall along
the ion track (Sun et al., 1999a).
Nanochannel glass (NCG) has also been proposed for the template-
assisted synthesis of nanowires (Tonucci et al., 1992; Huber et al., 1994). It
contains a regular hexagonal array of capillaries similar to the pore structure
in anodic alumina. It is prepared by arranging two dissimilar glasses in a pre-
determined configuration. For example, Fig. 4(a) shows the use of cylindrical
rods of an acid-etchable glass as the cores in a hexagonally packed matrix
of inert glass tubes. The array of this core-tube assembly is then drawn at
high temperatures to reduce the cross-sectional area. By repeating the draw-
ing process, the channel diameters can be made as small as 33 nm, with a
packing density of 3 × 1010 pores/cm2 (Tonucci et al., 1992). Finally, the core
glass rods are etched away by an acid, yielding an array of cylindrical pores.
Figure 4(b) shows a SEM micrograph of an NCG with 33-nm channels ar-
ranged in a hexagonal close packing (Tonucci et al., 1992).
A number of other porous materials may be used as the host matrices
for nanowire fabrication. A mesoporous molecular sieve termed MCM-41
(Beck et al., 1992) possesses hexagonally packed pores with very small
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FIG. 4. (a) Schematic diagram illustrating the fabrication process for nanochannel glass
array (Tonucci et al., 1992). (b) SEM image of a glass array with 33-nm channels after acid
etching (Tonucci et al., 1992).
1. Pressure Injection
In the pressure injection method, the nanowires are formed by inject-
ing the desired material in its liquid form into the pores of the template.
This technique has been used to fabricate a number of metallic and
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FIG. 5. Schematic of the experimental setup for the pressure injection of materials into the
nanochannels of a porous template.
semiconducting nanowires (Huber et al., 1994; Zhang et al., 1998a; Lin et al.,
2000b). Before the injection process, the template is first cleaned to remove
any particles or substances that may prevent the pores from being filled.
The template is then placed with the solid material in a high-pressure cham-
ber. The chamber is evacuated at a temperature slightly below the melting
point of the solid material for a few hours to degas the template. It is then
brought to a temperature above the melting point of the solid, so that the
porous template is immersed in a liquid melt. Next, the chamber is discon-
nected from the vacuum system and filled with an inert gas such as argon.
The high pressure within the chamber forces the liquid melt into the pores
of the template. Following this pressure injection process, the chamber is
slowly cooled to solidify the impregnated material within the nanochan-
nels of the template before releasing the inert gas. By carefully controlling
the cooling rate for nanowire solidification, it is possible to fabricate essen-
tially single-crystalline wires (Zhang et al., 1999). Figure 5 shows a schematic
diagram of the experimental setup for the pressure injection process. The
detailed pressure injection procedures are described by Huber et al. (1994)
and Zhang et al. (1998a).
In the pressure injection process, a greater pressure is needed to overcome
the surface tension for the liquid melt to enter pores of a smaller diameter.
The relation between the pore diameter dw and the required pressure P is
given by the Washburn equation (Adamson, 1982),
where γ is the surface tension of the liquid and θ is the contact angle between
the liquid and the template. For most liquid metals and semiconductors of
interest, the surface tension ranges from 100 to 600 dyne/cm. Assuming
the least favorable case of a nonwetting interface (θ = 180◦ ) and a medium
surface tension of 400 dyne/cm, filling channels 40 nm in diameter would
require a pressure of about 400 bar. To reduce the pressure required or to
maximize the filling factor, additives may be used to decrease the surface
tension or the contact angle. For example, it was found that the introduction
of a small quantity of copper atoms into the bismuth melt could facilitate the
injection of liquid bismuth into porous anodic alumina (Zhang et al., 1999).
For the pressure injection approach, the templates employed have to
be chemically stable and structurally robust under the high pressures and
temperatures involved. Anodic alumina and nanochannel glass can be used
as template materials for this nanowire synthesis approach. Metallic
(e.g. Bi, In, Sn and Al) and semiconducting (Se, Te, GaSb and Bi2Te3)
nanowires have been pressure injected into anodic alumina templates
(Huber et al., 1994; Zhang et al., 1998a; Lin et al., 2000b). The following
describes some of the important properties of bismuth nanowires fabricated
by the pressure injection method.
Figure 6(a) shows a SEM image of bismuth nanowires embedded in an
anodic alumina template after pressure injection. The pore diameter of the
template was about 42 nm, and the maximum pressure and temperature ap-
plied for the injection process were about 310 bar and 325◦ C, respectively.
A small amount of copper was introduced into liquid bismuth to enhance
its injection; the copper atoms should be segregated from bismuth during
solidification because they have zero solubility in solid bismuth. Upon solid-
ification, the copper flakes were brought to the top surface of Bi due to their
FIG. 6. (a) SEM image of the bottom surface of an anodic alumina template filled with
bismuth. The pore diameter is 42 nm. (b) TEM micrograph of the cross section of a 65-nm
bismuth nanowire array (Zhang et al., 1999).
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FIG. 7. (a) A HRTEM image of a 40-nm freestanding bismuth nanowire, showing lattice
fringes. The amorphous surface layer is bismuth oxide formed upon air exposure of bismuth
nanowire. (b) SAED pattern of a single Bi nanowire (Zhang et al., 1999).
lower density, leaving pure bismuth nanowires within the pore channels.
Figure 6(b) shows a TEM image of the cross section of a 65-nm Bi nanowire
array, illustrating a high pore-filling factor (Zhang et al., 1999). Because
Bi has a higher electron density than anodic alumina, it is shown in dark
contrast in the TEM image. Figure 7(a) shows a high-resolution transmis-
sion electron microscopy (HRTEM) image of a 40-nm freestanding bismuth
nanowire, which was obtained by dissolving the anodic alumina template in
a special acid solution that did not attack the bismuth nanowires. The free-
standing wire was found to have a nearly uniform diameter (within 10%)
along its length. The lattice fringes in Fig. 7(a) indicated a highly crystalline
structure, as confirmed by the selected-area electron diffraction (SAED)
pattern shown in Fig. 7(b). It was found that the alumina matrix protected
the bismuth nanowires against oxidation, whereas freestanding wires were
gradually oxidized upon exposure to air. The amorphous surface layer in
Fig. 7(a) is the bismuth oxide developed when the nanowire was exposed to
air prior to imaging.
Figure 8 shows X-ray diffraction (XRD) patterns of bismuth nanowire
arrays (Lin et al., 2000b). It illustrates that the crystal structure of bismuth
nanowires is the same as that of bulk bismuth and that no copper phases
were present. The nanowires have a preferred wire orientation dependent
on their diameters. The major orientations of the 95-nm and 40-nm bis-
muth nanowire arrays were normal to the (202) and (012) lattice planes,
respectively, indicating that most (> 80%) of the nanowires were oriented
along the [101̄1] and [011̄2] directions for dw ≥ 60 nm and dw ≤ 50 nm, re-
spectively (Zhang et al., 1999; Lin et al., 2000b). The existence of more
than one dominant orientation in the 52-nm Bi nanowires (Fig. 8(b)) was
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2. Electrochemical Deposition
Electrochemical deposition has attracted increasing attention as a tech-
nique for nanowire fabrication. Traditionally, electrochemistry has been
used to grow thin films on conducting surfaces. Because electrochemical
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FIG. 9. (a) TEM image of a single Co(10 nm)/Cu(10 nm) multilayered nanowire. (b) A
selected region of the sample at high magnification. (Piraux et al., 1994.)
3. Vapor Deposition
Vapor deposition methods include physical vapor deposition (PVD)
(Heremans et al., 2000) and chemical vapor deposition (CVD) (Cheng et al.,
2000) or metallorganic chemical vapor deposition (MOCVD) (Berry et al.,
1996). Vapor deposition and electrochemical deposition are capable of
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form carbon nanotubes within the porous template. Using anodic alumina
as the matrix, a highly ordered two-dimensional array of carbon nanotubes
has been achieved. Such well-aligned nanotube array has stimulated much
interest with its great potential for applications such as cold-cathode flat-
panel displays.
B. LASER-ASSISTED SYNTHESIS
FIG. 10. Schematic illustrating the growth of silicon nanowires by the VLS mechanism.
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FIG. 11. Schematic of the laser ablation apparatus for the production of nanowires (Morales
and Lieber, 1998).
nanowires generated are collected at the cold finger (Morales and Lieber,
1998; Lieber 1998). The growth of nanowires is affected by the reaction tem-
perature and the catalyst material used (Morales and Lieber, 1998; Lieber,
1998; Duan and Lieber, 2000). It is believed that the nanowire growth oc-
curs only when the catalyst cluster remains a liquid (Morales and Lieber,
1998). The wire growth ceases as the catalyst cluster is solidified when it
is carried away from the hot zone of the furnace by the gas flow. All the
nanowires are found to terminate at one end with catalyst clusters of diam-
eters that are 1.5 to 2 times that of the wires. The nanowires range from
3 nm to tens of nanometers in diameter, with lengths up to tens of microm-
eters (Morales and Lieber, 1998; Duan and Lieber, 2000). Using the laser
ablation technique, Lieber and coworkers have prepared a wide range of
semiconducting nanowires, including group IV elements (Si and Ge), III–V
compounds (GaAs, GaP, InAs, and InP), II–VI compounds (ZnS, ZnSe, CdS,
and CdSe), and binary SiGe alloys (Morales and Lieber, 1998; Duan et al.,
2000; Duan and Lieber, 2000). Lee and coworkers also fabricated Si and
Ge nanowires using a similar laser ablation apparatus (Zhang et al., 1998b,
2000a).
Figure 12 shows TEM images of silicon nanowires fabricated by Morales
and Lieber (1998). The nanowires are produced by laser ablating a Si0.9Fe0.1
target. In Fig. 12(a), the darker spheres with a diameter larger than the
nanowires are the solidified FeSi2 catalyst clusters that terminate at one
end of the nanowires. Electron diffraction pattern indicates that the sil-
icon nanowires are single-crystalline and grow along the [111] direction
( Fig. 12(b)) (Morales and Lieber, 1998). The TEM image in Fig. 12(b) shows
the silicon nanowire to be uniform in diameter, with a crystalline core that
is surrounded by an oxide layer, which may have resulted from the presence
of residual oxygen (Morales and Lieber, 1998; Duan et al., 2000). Wang et al.
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FIG. 12. (a) TEM images of Si nanowires produced after laser ablating a Si0.9Fe0.1 target.
The dark spheres with a slightly larger diameter than the wires are solidified catalyst clusters
(Morales and Lieber, 1998). (b) Diffraction contrast TEM image of a Si nanowire. The crystalline
Si core appears darker than the amorphous oxide surface layer. The inset shows the convergent
beam electron diffraction pattern recorded perpendicular to the wire axis (Morales and Lieber,
1998).
(1998a,b) found that these oxides played a more important role than metals
in assisting the nanowire growth. SiOx was discovered to be an effective cat-
alyst that significantly increased the yield of silicon nanowires (Zhang et al.,
1998b; Wang et al., 1998a, b). Similar yield enhancement was also found in the
synthesis of germanium nanowires by laser ablating a germanium powder
mixed with GeO2 (Zhang et al., 2000a). It was observed that targets com-
posed of equal molar ratios of Ge:GeO2 and Si:SiO2 in the absence of metal
catalysts gave the maximum yields for germanium and silicon nanowires,
respectively (Zhang et al., 2000a; Wang et al., 1998a,b). Based on these ob-
servations and other TEM studies (Zhang et al., 2000a; Wang et al., 1998a;
Lee et al., 1999), an oxide-enhanced nanowire growth mechanism different
from the classical VLS mechanism was proposed (Wang et al., 1998a). It was
postulated that the nanowire growth was catalyzed by the GemO or SimO
layer (m > 1) on the nanowire tips, which might be in or near their molten
states (Lee et al., 1999). Because the oxide-assisted laser ablation method
did not require any metal catalysts, the resulting nanowires could achieve
a high purity. The germanium and silicon nanowires produced from these
catalyst-free targets were noted to grow generally along the [112] crystal
direction (Lee et al., 1999).
Although laser ablation methods have been used to fabricate large quan-
tities of single-crystalline semiconducting nanowires with high aspect ratios,
the wires obtained are randomly oriented with a variety of morphologies
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Recently, the VLS growth method has been extended beyond the gas-
phase reaction to synthesis of Si nanowires in Si-containing solvent (Holmes
et al., 2000). In this case 2.5-nm Au nanocrystals were dispersed in supercrit-
ical hexane with a silicon precursor (e.g., diphenylsilane) under a pressure of
200–270 bar at 500◦ C, at which temperature the diphenylsilane decomposes
to Si atoms. The Au nanocrystals serve as seeds for the Si nanowire growth,
because they form an alloy with Si, which is in equilibrium with pure Si. It
is suggested that the Si atoms would dissolve in the Au crystals until the sat-
uration point is reached; then they are expelled from the particle to form a
nanowire with a diameter similar to the catalyst particle. This method has an
advantage over the laser-ablated Si nanowire in that the nanowire diameter
can be well controlled by the Au particle size, whereas liquid metal droplets
produced by the laser ablation process tend to exhibit a much broader size
distribution. With this approach, highly crystalline Si nanowires with diame-
ters ranging from 4 nm to 5 nm have been produced by Holmes et al. (2000).
The crystal orientation of these Si nanowires can be controlled by the reac-
tion pressure.
In addition to the fabrication methods discussed here, special techniques
have been developed to prepare a variety of one-dimensional systems for
investigating interesting quantum phenomena. For example, quantized con-
ductance (in units of G 0 = 2e2/ h, where h is the Planck constant) has been
observed through thin metallic nanowires with scanning tunneling micro-
scopy (Pascual et al., 1993, 1995; Brandbyge et al., 1995) and mechanically
controlled break junctions (Muller et al., 1992, 1996). These techniques use
the same basic principle of pressing two metals together and pulling them out
to form a nanometer-sized wire between the two contacts. One-dimensional
silicon nanostructures have also been fabricated on a silicon-on-insulator
(SOI) substrate by a combination of lithography and orientation-dependent
etching (Namatsu et al., 1997). Other approaches include forming nanowires
by vapor deposition on cleaved superlattice planes (Arakawa et al., 1996) or
by shadow deposition on stepped lattice planes (Sugawara et al., 1997). These
fabrication techniques usually require unique experimental configurations
or complicated processing and produce nanowires with a very low yield or
at a very high cost. Therefore, although the resulting nanostructures may be
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first calculation carried out by Zhang et al. (1998c, 2000b), the quantized en-
ergy levels were evaluated by using a cyclotron effective mass approximation
for the in-plane effective mass. An improved model was subsequently devel-
oped by Sun et al. (1999b) based on a square wire cross-section approxima-
tion, which allowed an analytical expression to be obtained for the wave func-
tions. However, these two approximations were valid only for less anisotropic
carriers, producing significant discrepancies for highly anisotropic systems
(αx x /α yy
1 or αx x /α yy 1). Thus, a numerical approach was developed
recently to more accurately determine ε nm and mzz (Lin et al., 2000c).
For a simple case where αx x = α yy , the wave function of Eq. (5) has the
analytical solution
u nm (r) ∼ Jn (χnm r )ein θ , (8)
where Jn is the nth Bessel function and χnm is determined by the mth root of
Jn (x · dw /2) = 0. The subband energy εnm corresponding to the wavefunction
u nm (r) is given by
h̄ 2
εnm = αx x χnm
2
. (9)
2
For the general case where αx x = α yy , there are no analytical solutions, and
the only possible approach to determine the quantized subband energy εnm
from Eq. (5) is through numerical methods (Lin et al., 2000c). In this instance,
a mesh consisting of M concentric circles and N sectors is created within the
wire cross section, as shown in Fig. 13. The differential equation of Eq. (5) is
then transformed to a set of difference equations based on the grid points on
FIG. 13. Schematic of the grid points used to transform the differential equation into a
difference equation. The mesh in the circular wire cross section consists of M concentric circles
and N sectors. In this figure, M = 5 and N = 12 (Lin et al., 2000c).
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FIG. 14. Calculated subband energies in units of ε0 = 2αx xh̄ 2 /dw2 as a function of the
in-plane mass anisotropy α yy /αx x . The subband energies of nanowires of various diameters
can then be derived from this figure.
the mesh, which can be solved readily with the aid of computers. By refining
the mesh, εnm can be obtained with great accuracy (within 0.1%). Figure 14
shows the calculated subband energies in units of 2αx xh̄ 2 /dw2 as a function of
the mass anisotropy α yy /αx x .
The density of states (DOS) of electrons in nanowires is derived from
Eq. (7) as
√
2m zz
g(E) = (E − εnm )−1/2 . (10)
πh̄ n,m
Figure 15 shows the calculated DOS for electrons in a 40-nm bismuth nano-
wire compared to that of bulk bismuth. The DOS in nanowires is a super-
position of one-dimensional transport channels, each located at a quantized
subband energy εnm . We note that the DOS in nanowires has sharp peaks at
the subband edges, whereas that in a bulk material is a smooth monotonic
function of energy. The enhanced DOS at the subband edges of nanowires
has important implications for many applications, such as in optics (Black
et al., 2000) and thermoelectrics (Hicks and Dresselhaus, 1993).
For semimetals in bulk form, such as bismuth, the conduction band over-
laps in energy with the valence band, and the electronic properties are
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FIG. 15. Calculated effective densities of states for 40-nm bismuth nanowires (solid curve)
and bulk bismuth (dashed curve). The zero energy refers to the band edge of bulk bismuth.
The nonparabolic effects of the electron carriers are considered in these calculations.
governed by both the electrons and holes. In nanowires, the quantum con-
finement effects cause the band edge of the electrons to move up in energy
(see Fig. 16), whereas the valence band edge decreases in energy. The band-
edge energies of electrons and holes shift in opposite directions in bismuth
nanowires, decreasing the energy overlap between the conduction band and
the valence band (Fig. 16). As the wire diameter continues to decrease, the
energy overlap eventually vanishes (Fig. 16(b)), producing a band gap be-
tween the lowest conduction subband and the highest valence subband. This
semimetal-to-semiconductor transition will occur at a critical wire diame-
ter dc, which depends on the band overlap energy, the electron and hole
effective masses, and the crystal orientation along the wire axis for the ma-
terial of interest. The critical wire diameters for two group V semimetals,
bismuth and antimony, are predicted to be about 50 nm and 10 nm (Lin
et al., 2000c; Heremans et al., 2001), respectively. This quantum confinement–
induced semimetal–semiconductor transition is one of the unique properties
of nanowires made of semimetallic materials. Such a transition dramatically
alters the electronic properties of nanowires, providing us with new possi-
bilities for manipulating the band structures of materials.
Due to the semimetal–semiconductor transition, the carrier concentra-
tion N(T ) of nanowires made of semimetallic materials is highly dependent
on the wire diameter and temperature and must satisfy the condition dw ≤ dc
to exhibit semiconducting behavior. As an example, Fig. 17 shows the cal-
culated total carrier densities for various bismuth nanowires oriented along
the [011̄2] growth direction as a function of temperature (Lin et al., 2000c).
Three different types of temperature dependence for the carrier density
are predicted for bismuth nanowires, depending on the wire diameters. For
10-nm bismuth nanowires, which are in the semiconducting regime, the car-
rier density increases exponentially with temperature. For 80-nm bismuth
nanowires, which remain in the semimetallic regime for all temperatures,
the carrier density is similar in temperature dependence to bulk bismuth.
FIG. 17. Calculated total carrier density (electrons and holes) as a function of temperature
for bulk 3D bismuth and bismuth nanowires of different diameters oriented along the [011̄2]
direction.
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The lower carrier density of the 80-nm nanowires compared to bulk bismuth
is due to the smaller band overlap in the former. For the 40-nm bismuth
nanowires, the carrier density has a temperature dependence similar to bulk
bismuth at high temperatures, but it drops rapidly with decreasing tempera-
ture at low temperatures. Because the carrier density is highly dependent on
wire diameter, the transport properties of bismuth nanowires are expected
to be highly sensitive to wire diameter, as will be shown experimentally in
the section “temperature-dependent resistivity of nanowires.”
A. SEMICLASSICAL MODEL
where D is given by
1/2
8e 2m ∗ k B T
D= 2 2 = µ, (18)
π dw h̄ 2
in which µ is the carrier mobility along the nanowire and
∞
x j dx
Fj = (19)
0 exp(x − ς ∗ ) + 1
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FIG. 18. SEM image of a 70-nm bismuth nanowire with four electrodes attached to the
nanowire. The circle on the large left electrode is a reference point used to find the nanowire
and to attach electrodes to it by a lithographic process (Cronin et al., 1999).
via a four-point setup (Cronin et al., 1999, 2000), which could provide more
physical information on the properties of nanowires than the normalized
resistance of a nanowire array. Figure 18 shows an SEM image of a four-
point electrode patterned on a 70-nm Bi nanowire (Cronin et al., 1999). The
circular dot in Fig. 18 represents one of the prepatterned grid points used
to locate the nanowires on the substrate. In this case, nanoelectrodes were
patterned by electron-beam lithography on top of a single nanowire on a
substrate coated with a thin insulating layer (Cronin et al., 1999, 2000). The
electrodes consisted of a gold layer (∼ 1000 Å thick) and a thin adhesive
layer, and their processing followed a standard lift-off method. We note that
most nanowires would undergo surface oxidation upon removal from the
template. The surface oxide layer on the nanowires imposes a serious prob-
lem in making nanoelectrical contacts; efforts are currently being devoted
to tackling this challenge.
Figure 19(a) shows the temperature dependence of resistance R(T) for
bismuth nanowire arrays (dw = 7 − 200 nm) synthesized by vapor deposition
and measured by Heremans et al. (2000). Hong et al. (1999) reported simi-
lar resistance measurements on bismuth wires of larger diameters (200 nm to
2 µm) prepared by electrochemical deposition (Fig. 19(b)). These two studies
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FIG. 19. (a) Measured temperature dependence of resistance for bismuth nanowire arrays
of various wire diameters dw (Heremans et al., 2000). (b) R(T )/R(290 K ) for bismuth wires of
larger dw measured by Hong et al. (1999). (c) Calculated R(T )/R(300 K ) of 36-nm and 70-nm
bismuth nanowires (Lin et al., 2000b). The dashed curve refers to a 70-nm polycrystalline wire
with increased boundary scattering.
FIG. 20. (a) Measured R(T )/R(270 K ) for 40-nm bismuth nanowires prepared with alloys
of different Te doping levels. (b) The calculated temperature dependence of µ−1
avg for 40-nm
undoped and Te-doped bismuth nanowires of different Nd . The dashed and solid lines are
fitting curves corresponding to undoped and Te-doped Bi nanowires, respectively.
FIG. 21. (a) Temperature dependence of the resistance measured for various antimony
nanowires, normalized to the resistance at 300 K. (b) Calculated R(T )/R(300 K ) for 10-nm
and 48-nm antimony nanowires.
V. Summary
ACKNOWLEDGMENTS
The authors acknowledge helpful discussions with Dr. Z. Zhang, Dr. G. Dressel-
haus, Dr. J. Heremans, O. Rabin, M. R. Black, and S. B. Cronin. They are grateful to
the NSF, the U.S. Navy, the MURI program, and DARPA for financial support.
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