Optics Review

The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
REVIEW OF OPTICS
Notes prepared for EE 6310
by
Professor Cyrus D. Cantrell
August–December 2003

c C. D. Cantrell (06/2003)
The University of Texas at Dallas Erik Jonsson School
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OPTICS AND PHOTONICS MARKETS
• Aerospace
Sensors, displays, targeting, and communications
• Industrial
Welding, machining & writing
Imaging and lithography
• Medical
Surgery, photodynamic therapy, ...
Monitoring
Telemedicine (requires broadband communications)
• Business and entertainment
Imaging and projection (increasingly digital, but requires analog optics)
Information storage and retrieval (DVDs, ...)
• Telecommunications

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PROFESSIONAL SOCIETIES AND CORPORATIONS
• Optical Society of America (OSA)

Oldest optics/photonics society in North America
Covers all fields of optics, from human vision to optical physics
Peer-reviewed journals include Journal of the Optical Society of Amer-
ica, Applied Optics, Optics Letters, Journal of Lightwave Technology
(co-sponsored with IEEE-LEOS), Journal of Optical Networking, Optics
Express
• IEEE Lasers and Electro-Optics Society (IEEE-LEOS)
Journal of Quantum Electronics, Photonics Technology Letters, Journal
of Special Topics in Quantum Electronics
Co-sponsors the Optical Fiber Communication Conference (OFC) and
the Conference on Lasers and Electro-Optics (CLEO) with OSA
• SPIE
Not-for-profit corporation
Organizes many conferences and publishes proceedings
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OUTLINE OF OPTICS REVIEW (1)
• Ray optics
Snell’s laws of reflection and refraction at dielectric interfaces
Total internal reflection
When can one use ray optics instead of wave optics?
Applications of ray optics will include slab and fiber waveguides
• Plane electromagnetic waves
Polarization
Refractive index
Phase-velocity dispersion
• Reflection coefficients of plane waves at dielectric interfaces
Fresnel’s formulas
Brewster’s angle
Applications will include polarizing prisms

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OUTLINE OF OPTICS REVIEW (2)
• Imaging
Refraction at spherical surfaces; thin lenses
Numerical aperture
• Interference
2-slit interference (Young’s fringes)
Multiple-slit interference
Interferometers
Applications will include modulators, multiplexers and demultiplexers
• Diffraction
Single slit
Multiple slits and diffraction gratings
Applications will include pulse compression

Frequency
(Hertz) 102 103 104 105 106 107 108 109 1010 1011 1012 1013 1014 1015
ELF VF VLF LF MF HF VHF UHF SHF EHF
Power and telephone Radio Microwave Infrared Visible

Rotating generators Radios and televisions Radar Lasers light
Musical instruments Electronic tubes Microwave antennas Guided missiles
Voice microphones Integrated circuits Magnetrons Rangefinders
Twisted Pair
Optical
Fiber
Coaxial Cable
AM Radio FM Radio Terrestrial

and TV and Satellite
Transmission
Wavelength 106 105 104 103 102 101 100 10-1 10-2 10-3 10-4 10-5 10-6
in space
(meters)
ELF = Extremely low frequency MF = Medium frequency UHF = Ultrahigh frequency
VF = Voice frequency HF = High frequency SHF = Superhigh frequency
VLF = Very low frequency VHF = Very high frequency EHF = Extremely high frequency
LF = Low frequency
Electromagnetic Spectrum for Telecommunications

William Stallings, Data and Computer Communications, 6th Edition
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PHASE VELOCITY
• The phase velocity of a monochromatic wave is the ratio of its angular

frequency to its propagation constant
For example, E(t) = cos (ωt − βz)
is a monochromatic wave
The angular frequency is
ω = 2πf
where f is the frequency in Hz
The propagation constant is
2π
β=
λ
where λ is the wavelength in the medium (not in vacuum)
The phase velocity is
ω
v = = λf
β

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INDEX OF REFRACTION
• The index of refraction of a medium is the ratio of the velocity of light

in vacuum (c) to the phase velocity in the medium (v):
c √
n = = µr r
v
The refractive index n is a function of wavelength λ (or frequency f )
because the phase velocity v depends on λ
The dependence of n on λ gives rise to phase-velocity dispersion
Normal dispersion: If λ1 > λ2, then v1 > v2 and therefore
n(λ1) < n(λ2)
A way to remember this: “Red cars go faster” ··
Anomalous dispersion: If λ1 > λ2, then v1 < v2 and therefore

n(λ1) > n(λ2)
Usually anomalous dispersion occurs only very close to the frequency of a
transition between energy levels in the medium, or as a result of dipolar
relaxation (as in water)

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REFRACTIVE INDEX OF WATER
• For water, “normal” dispersion,

f1 < f2 ⇒ n(f1) < n(f2),
holds in the visible spectrum (400–700 nm, or 4.3 × 1014–7.5 × 1014 Hz), but
is not the rule in much of the rest of the electromagnetic spectrum
Anomalous dispersion between ∼ 1010 Hz and ∼ 1013 Hz is due to dipolar
relaxation (Debye relaxation)

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PHASE-VELOCITY DISPERSION
• In imaging systems, phase-velocity dispersion causes light of different colors

to be focused at different points
The refractive index n is a function of wavelength λ (or frequency f )
because the phase velocity v depends on λ
One measure of phase-velocity dispersion is

dn n 1 1
= −
dω β vg v
which contains both the group velocity
−1
dβ dω
vg = =
dω dβ
and the phase velocity
ω
v=
β

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SNELL’S LAWS
• The normal to a dielectric interface and the incident ray define the plane
of incidence
The incident (i), reflected (r) and refracted (transmitted) (t) rays are all
in the plane of incidence
Snell’s law of reflection:
θr = θi
Snell’s law of refraction:
n2 sin θt = n1 sin θi
sin θi n2 v1
= =
sin θt n1 v2

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ANGLES FOR SNELL’S LAWS
θi θr
n1
n2 n 2 > n1
θt

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TOTAL INTERNAL REFLECTION
• Occurs when a ray passes from a more dense medium into a less dense
medium (n2 < n1)
From Snell’s law of refraction,
n1
sin θt =sin θi > sin θi
n2
When sin θt = 1, θt = 90◦ ⇒ refracted ray goes along the interface
When this happens, θi is equal to the critical angle θc, where
n2
sin θc =
n1
For rays such that θi > θc, there is no refracted ray
◦ All energy is reflected ⇒ total internal reflection
Main application: Guided waves in dielectric slabs and fibers

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WHEN CAN ONE USE RAY OPTICS?
• One can use ray optics instead of wave optics:

Except near the edge of a shadow (get diffraction rings)
When λ is small compared to the sizes of all apertures
When interference and diffraction are negligible:
◦ When λ w where w = slit width, facet width, or grating period
At low bit rates
At the start of most lens designs, but perhaps not in the final stages

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IMAGING ANALYSIS USING RAY OPTICS (1)
• Lenses are used for collimation and to focus light into fibers and waveguides
For a thin lens with spherical surfaces (radii of curvature R1 and R2), the
focal length is
1 1 1
= (n − 1) +
f R1 R2
where n is the refractive index of the lens material
The distances do and di of an object and the image formed by a thin lens
are given by the equation
1 1 1
+ =
do di f
◦ Linear magnification:
di 1
M= =
do (do/f ) − 1
◦ Angular magnification:
1 tan αi/2
=
M tan αo/2

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IMAGING ANALYSIS USING RAY OPTICS (2)
• Numerical aperture of an optical system

Defined as
NA = n sin θ
where θ is the system’s maximum acceptance half-angle and n is the
refractive index of the outside material
sin θ
1
θ
If n = 1, then 0 ≤ NA ≤ 1
◦ 0 means that no light gets into the system
◦ 1 means that all of the light propagating towards the system gets in
◦ Power into system ∝ (NA)2

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WAVE OPTICS
• Experimental basis: Interference experiments of Young, diffraction and

interference experiments of Fresnel
• Theoretical basis: Maxwell’s equations
• Important wave phenomena in optics:
Polarization
Interference
Diffraction
Guided waves
◦ Can also be understood semi-quantitatively using ray optics

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MAXWELL’S EQUATIONS
∇·B=0 ∇·D=ρ
∂B ∂D
∇×E=− ∇×H=J+
∂t ∂t
• From the first line, the normal components of D and B are continuous across
a dielectric interface
• From the second line, the tangential components of E and H are continuous
across a dielectric interface

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PLANE-WAVE SOLUTIONS OF MAXWELL’S EQUATIONS
• Assumptions:
Homogeneous, isotropic, lossless, dielectric medium
Plane wave propagating in the +z direction
• Fields:
E = x̂E1 + ŷE2e ej(ωt−βz)
jψ
(E1, E2 real)
1 j(ωt−βz) 1
H= −x̂E2e + ŷE1 e
jψ
= ẑ × E
η η
The ratio of the magnitudes of E and H is the characteristic impedance

of the medium, µ
η=

Phase velocity: 1 ω
v=√ =
µ β
Time-averaged Poynting vector:
2 2

1 ∗ 1 E1 + E2
S = Re [E × H] = ẑ
2 2 η
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POLARIZATION IN COMMUNICATION SYSTEMS
• Many components and devices are polarization-sensitive

Ordinary (round) fiber scrambles the polarization of light passing through
Even a flat glass plate is polarization-sensitive!
◦ Different polarizations have different reflectivities at oblique incidence
Different modes in an optical waveguide usually have different polariza-
tions
◦ Different polarizations have different group velocities in a fiber
Leads to polarization-mode dispersion and bandwidth limitations
◦ Gain in a semiconductor optical amplifier is polarization-dependent
Raman gain is polarization-dependent

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POLARIZATION (1)
• The polarization of a plane wave is determined by the value of the relative

phase angle, ψ, and the ratio E1/E2, where
Ex = E1 cos(ωt − βz), Ey = E2 cos(ωt − βz + ψ)
• Plane polarization:
ψ=0
Real components of E:
Ex = E1 cos(ωt − βz), Ey = E2 cos(ωt − βz)
The E vector makes an angle
φ = tan−1(E2/E1)
with the x axis
• Note that the word “plane” has been used with 2 different meanings on this
slide!

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PLANE OF POLARIZATION
Y
E
X
Pla
Pol ne o
ari f
zat
ion
• The direction of the electric field and the direction of propagation

determine the plane of polarization

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SNAPSHOT OF PLANE-POLARIZED PLANE WAVE
0 Z
5
10
15
1
0 X
-1
-1 0 1
Y
• Red curve: Tip of the E vector Blue curve: Tip of the H vector
The plane of polarization is the x − z plane

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POLARIZATION (2)
• Circular polarization:
π
ψ=± , E2 = E1
2
Ex = E1 cos(ωt − βz), Ey = ∓E1 sin(ωt − βz)
For fixed z, the E vector describes a circle in the x − y plane
◦ ψ = π2 (− sign on Ey ): Right circular polarization
◦ ψ = − π2 (+ sign on Ey ): Left circular polarization
◦ The terms “right” and “left” circular polarization are confusing, because
a right-circularly-polarized wave actually describes a left-handed screw
as the wave propagates in z
For right-circularly-polarized light, the tip of the E vector rotates
clockwise in the x − y plane, from the point of view of someone
looking toward the source (in the −z direction)

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SNAPSHOT OF CIRCULARLY-POLARIZED PLANE WAVE
• Red lines: E vectors Blue lines: H vectors

The light is left-circularly-polarized
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POLARIZATION (3)
• Elliptical polarization:
π
E2 = E1, or E2 = E1 ±
and ψ = and ψ = 0
2
Ex = E1 cos(ωt − βz), Ey = E2 cos(ωt − βz + ψ)
For fixed z, the E vector describes an ellipse in the x − y plane
◦ Eliminating ζ = ωt − βz from the equations for Ex and Ey results in
2 2
Ex Ey Ex Ey
+ − 2 cos ψ = sin2 ψ
E1 E2 E1 E2
which is the equation of an ellipse that makes an angle θ with the x
axis, where
2E1E2 cos ψ
tan 2θ =
E12 − E22

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POLARIZATION (4)
• For a plane wave, there are always 2 orthogonal states of polarization

Simplest case: Orthogonal linear polarizations described by unit coordi-
nate vectors x̂ and ŷ
◦ Orthogonality: x̂ · ŷ = 0
◦ Normalization: x̂ · x̂ = 1 = ŷ · ŷ
◦ Example of orthogonally polarized fields:
E1 = x̂E1ej(ωt−βz) E2 = ŷE2ejψ ej(ωt−βz)
The important point: Waves with orthogonal polarizations do
not interfere with one another
• Example: In a “single-mode” fiber, there are really two modes, one for each
of the two orthogonal polarizations
These modes don’t have the same group velocity
The difference in group velocities leads to polarization-mode dispersion,
pulse spreading, and bandwidth limitations

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POLARIZATION (5)
• Orthogonal states of polarization in general

The polarization state of the elliptically polarized field
jψ
j(ωt−βz)
E = x̂E1 + ŷE2e e (E1, E2 real)
is described by the complex unit vector
1
ê1 = 2 2
x̂E1 + ŷE2ejψ
E1 + E2
The orthogonal polarization is described by the complex unit vector
∗ 1 −jψ

ê2 = ẑ × ê1 = 2 2
−x̂E2e + ŷE1
E1 + E2
◦ Orthogonality: ê∗1 · ê2 = 0 = ê∗2 · ê1
◦ Normalization: ê∗1 · ê1 = 1 = ê∗2 · ê2
◦ If ψ ∈ (0, π), then ê1 describes a right elliptical polarization state, and
ê2 describes a left elliptical polarization state

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POLARIZATION (6)
• Example of orthogonal states of circular polarization

A right-circularly-polarized wave is described by the unit vector
1
êR = √ (x̂ + j ŷ)
2
The orthogonal polarization is left-circularly-polarized and is described
by the complex unit vector
1 j
êL = √ (j x̂ + ŷ) = √ (x̂ − j ŷ)
2 2

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REFLECTION AT NORMAL INCIDENCE (1)
• Goal: Understand how to calculate the reflection coefficient at the interface

between two dielectrics in terms of the indexes of refraction
• For normal incidence (θi = 0◦), the reflection coefficient of a plane wave is
independent of the wave’s polarization
A reflected wave propagates back into the medium in which the incident
wave propagates
The E and H fields of the reflected and transmitted waves can be found
by either of two methods:
◦ Brute-force analysis of the boundary conditions (physics method)
◦ Impedance analysis borrowed from transmission-line theory (EE method)

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• Boundary conditions at a dielectric interface:

Continuity of the normal components of D and B
Continuity of the tangential components of E and H
• Fields:
In medium 1, E = Ei + Er
In medium 2, E = Et
• For a plane wave at normal incidence (θi = 0◦), all of the fields are parallel
(tangential) to the interface
The transmission-line approach is easy to justify and apply
The transmission-line equations are really just integral forms of Maxwell’s
equations
Ei,x is analogous to V1,+, Hi,y = Ei,x/η is analogous to I1,+ = V1,+/Z0,
η is analogous to Z0, Er,x is analogous to V1,−, etc.

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Er,x
V1,–
V1,+ V2,+ Ei,x Et,x
Z1 Z2
η1 η2
• Boundary conditions:
V and I are continuous at the transmission-line interface
Ex and Hy are continuous at the dielectric interface
• Voltage reflection coefficient:
Z2 − Z1
ρ=
Z2 + Z1
• Electric-field reflection coefficient:
η 2 − η1 n 2 − n 1
1 1
n2 − n1
ρ= = 1 1 =−
η2 + η1 n2 + n1
n2 + n1
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• Power (and intensity) reflection coefficient:

2
2 n2 − n1
ρ =
n2 + n1
• Power (and intensity) transmission coefficient:
2
n2 − n1 4n1n2
1−ρ =1−2
=
n2 + n1 (n2 + n1)2
Example: Glass-air interface (n1 = 1.0, n2 = 1.5)
ρ2 = 0.04

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REFLECTION AT OBLIQUE INCIDENCE (1)
• For all angles of incidence except 0◦ (normal incidence), the reflection coef-
ficient of a plane wave depends on the wave’s polarization
The useful orthogonal states of polarization for this situation are called
TE and TM
◦ In TE (or ⊥) polarization, the E field is perpendicular to the plane of
incidence
The plane of incidence is the plane defined by the direction of the
incident field and the normal to the dielectric surface
◦ In TM (or ) polarization, the E field is in the plane of incidence

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REFLECTION AT OBLIQUE INCIDENCE (2)
• Impedance analysis
Apply to the tangential components of E and H
◦ The tangential components are continuous at a dielectric interface, like
V and I in a transmission line
In the medium from which the wave is incident,
Ei,x Er,x
Z1, = =− = η1 cos θ
Hi,x Hr,x
Ei,y Er,y
Z2,⊥ = − = = η1 sec θ
Hi,y Hr,y
(the plane of incidence is the x − z plane)
Reflection coefficient for TM wave (for example):
Z2, − Z1, η2 cos θt − η1 cos θi
ρ = =
Z2, + Z1, η2 cos θt + η1 cos θi

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FRESNEL FORMULAS
• The normal to a dielectric interface and the incident ray define the plane
of incidence
E components that are in (parallel to) the plane of incidence do not
interfere with field components that are perpendicular to the plane of
incidence
Transmission and reflection coefficients:
2n1 cos θi 2 sin θt cos θi
τ = =
n2 cos θi + n1 cos θt sin(θi + θt) cos(θi − θt)
2n1 cos θi 2 sin θt cos θi
τ⊥ = =
n1 cos θi + n2 cos θt sin(θi + θt)
n2 cos θi − n1 cos θt tan(θi − θt)
ρ = − =−
n2 cos θi + n1 cos θt tan(θi + θt)
n1 cos θi − n2 cos θt sin(θi − θt)
ρ⊥ = =−
n1 cos θi + n2 cos θt sin(θi + θt)

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BREWSTER’S ANGLE (1)
• When θi + θt = π/2, the E component in the plane of incidence is not

reflected (ρ = 0)
A more usable formula for Brewster’s angle:
nt
tan θB =
ni
At Brewster’s angle, the reflected light is fully polarized perpendicular to
the plane of incidence
◦ Polaroid sunglasses and camera filters
◦ End faces on lasers

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BREWSTER’S ANGLE (2)
θB θr
n1
n2
θt

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POLARIZERS AND ANALYZERS
• A polarizer prepares a specific state of polarization

• An analyzer blocks a specific state of polarization and transmits the
orthogonal polarization
• Materials and techniques for making polarizers and analyzers:
Polarization-selective absorption
◦ Some materials are dichroic
One of two states of polarization is absorbed more than the other
Example: Polaroid (as in sunglasses)
Brewster’s-angle polarizers and analyzers
◦ Problem: Brewster’s angle is wavelength-dependent
Polarizing prisms
◦ Best rejection ratio for the blocked polarization state
Wire-grid polarizers and analyzers
◦ Used in the far infrared (where there are few birefringent materials)

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DICHROIC POLARIZERS
B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), Fig. 6-6.1

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BREWSTER’S-ANGLE POLARIZERS

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POLARIZING PRISMS
(a) Wollaston prism (b) Rochon prism (c) Sénarmont prism

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OPTICAL POWER
• The optical power per unit area incident on a surface is

|S · n̂| = |n̂ · (E × H)|
where S is the Poynting vector and n̂ is the unit normal to the surface
For a plane wave propagating in the +z direction,
1 1
S = E × (ẑ × E) = (E · E)ẑ
η η
since ẑ · E = 0
The (optical) intensity is defined as
I = |S| (units are W/m2)
◦ For a plane wave,
1
I = (E · E)
η

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INTERFERENCE (1)
• Interference is the name given to the following optical phenomenon:

If light from a source is split into two beams of intensities I1 and I2, and the
beams are then recombined, the optical intensity in the superposition region
varies from a maximum that is greater than I1 + I2 to a minimum that may
be zero.
Electric field in superposition region:
E = E1 + E2
◦ E1 and E2 may interfere constructively or destructively
The interference is manifested by differences between the total inten-
sity and the sum of the intensities of the two beams
◦ Total intensity (not time-averaged, hence no factor of 12 ):
1 1
I = E · E = (E1 · E1 + E2 · E2 + 2E1 · E2)
η η
◦ Intensity after time averaging over a few optical cycles:
2
I = I 1 + I 2 + E1 · E2
η
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INTERFERENCE (2)
• Intensity after time averaging over a few optical cycles:

I = I 1 + I 2 + J12
J12 = (2/η)E1 · E2 is the interference term
For plane waves propagating in the +z direction:
E1 = ê1E1 cos(ωt − βz) E2 = ê2E2 cos(ωt − βz + δ)
where δ is the phase difference between the two beams
Resulting time average:
E1 · E2 = (ê1 · ê2)E1E2 cos(ωt − βz)[cos(ωt − βz) cos δ − sin(ωt − βz) sin δ]
1
= (ê1 · ê2)E1E2 cos δ
2
Interference term:
1
J12 = (ê1 · ê2)E1E2 cos δ
η

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INTERFERENCE (3)
• Interference of two plane waves:

1 2
I = (E1 + E22) + J12
2η
Interference term:
1
J12 = (ê1 · ê2)E1E2 cos δ
η
Orthogonally polarized waves (ê1 · ê2 = 0) do not interfere
The interference term takes on its maximum value when the waves are in
phase, δ = 0(⇒ cos δ = 1), and its minimum value when the waves are
out of phase, δ = π(⇒ cos δ = −1)
1
I max = (E1 + E2)2
2η
1
I min = (E1 − E2)2
2η

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INTERFEROMETERS (1)
• Wavefront-splitting
Young’s 2-slit interference experiment
• Amplitude-splitting
Michelson interferometer
Mach-Zehnder interferometer
Fabry-Pérot interferometer

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YOUNG’S 2-SLIT INTERFERENCE EXPERIMENT (1)
http://www.matter.org.uk/schools/Content/Interference/laserinterference.html
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X
P
r2
x
s/2 r1
Z
–s/2 D

s 2 s 2
r1 = x+ + D2 + y 2, r2 = x− + D2 + y 2
2 2
⇒ r12 − r22 = 2sx
But r12 − r22 = (r1 − r2)(r1 + r2) ≈ (r1 − r2)2D
sx
⇒ r1 − r2 ≈
D

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• The difference of distances from the two slits to the observation point P is
sx
r 1 − r2 ≈
D
where x = position on screen
s = spacing between slits
D = distance from slits to observation screen
• Phase difference between waves arriving at P from the two slits:
2πn 2πns
δ= (r1 − r2) ≈ x = κx
λ0 λ0 D
This implies intereference fringes that are equally spaced in x
Use general formula for I, setting E1 = E2 and ê1 = ê2 since waves from
two slits have same amplitude and polarization
Result: Intensity I ∝ 1 + cos(κx)

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INTERFERENCE OF LIGHT FROM N SLITS
• Let δ be the phase difference between waves arriving from adjacent slits
2π
δ = s sin θ
λ
where θ is the angle that the waves make with the normal to the screen
• Intensity at P is

2
2
jδ sin(N δ/2)
I(P ) ∝ e + e2jδ + · · · + e(N −1)jδ =
sin 12 δ
This implies very sharp maxima when δ = 2mπ, i.e., when
s sin θ = mλ
The same analysis applies to simple diffraction gratings

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GRATING FUNCTION
sin (N δ/2 ) 2
gN (δ) =
2
( )
sin( 12 δ)
2000
1500
N = 41
2
gN (δ)
1000
500
0
0 2 4 6 8
δ
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INTERFEROMETERS (2)
• Optical waveguide Mach-Zehnder interferometer

A phase shifter (usually electro-optic) is incorporated into one of the arms
of the interferometer
The output of the interferometer is a maximum when the phase difference
δ between the beams arriving from the two arms is an integral multiple
of 2π
Phase shifter

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INTERFEROMETERS (3)
• Optical waveguide Mach-Zehnder interferometer

The output of the interferometer is a maximum when the phase difference
δ between the beams arriving from the two arms is an integral multiple
of 2π
Output power / Input power
1.00
insertion loss
0.75
0.50
0.25
0.00
0.0 2.5 5.0 7.5 10.0 12.5 15.0
δ (radians)

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INTERFEROMETERS (4)
• The Fabry-Pérot interferometer is formed by two parallel, flat

reflecting surfaces
The reflectivity at one or both surfaces may be just the Fresnel reflectivity
at a dielectric interface, or may be enhanced with coatings
The transmission and reflection coefficients of the interferometer can be
found by either of two methods:
◦ Brute-force summation of multiple reflections (physics method)
◦ Impedance analysis borrowed from transmission-line theory (EE method)
Application: Longitudinal modes in semiconductor lasers
L L
Z1 Z2 Z3 η1 η2 η3

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INTERFEROMETERS (5)
• Impedance analysis of the Fabry-Pérot interferometer

Use formula for the reflection coefficient for waves traveling from section 1
to section 2 for sinusoidal (single-frequency) waves on transmission lines:
Z L − η1
ρ=
ZL + η1
where the complex input impedance at the end of section 1 is

η3 cos(k2L) + jη2 sin(k2L)
Z L = η2
η2 cos(k2L) + jη3 sin(k2L)
L L
Z1 Z2 Z3 η1 η2 η3

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INTERFEROMETERS (6)
• Reflection coefficient at the entrance face of a dielectric layer (section 2)

positioned between sections 1 and 3:
ZL − η1 η2(η3 − η1) cos(k2L) + j(η22 − η1η3) sin(k2L)
ρ= =
ZL + η1 η2(η3 + η1) cos(k2L) + j(η22 + η1η3) sin(k2L)
There are 2 important special cases for normal incidence:
Anti-reflection coating
◦ The optical equivalent of a quarter-wavelength matching section in a
transmission line
π λ
k2 L = ⇒ L =
2 4
◦ Fabry-Pérot interferometer
η3 = η1
(same media in the entrance and exit sections)

PhoTEC
ANTI-REFLECTION COATING
π
• Substitute k2L = ⇒ cos(k2L) = 0
2
into the formula for the reflection coefficient,
ZL − η1 η2(η3 − η1) cos(k2L) + j(η22 − η1η3) sin(k2L)
ρ= = ,
Z L + η1 η2(η3 + η1) cos(k2L) + j(η22 + η1η3) sin(k2L)
to get
η22 − η1η3 n1n3 − n22
ρ= 2 =
η2 + η1η3 n1n3 + n22
The reflection coefficient is zero if η22 = η1η3, i.e. if
√
n2 = n1 n3
◦ This works only at one wavelength because L = 14 λ
√
◦ It may not be possible to find a material such that n2 = n1n3
◦ Example: The power (and intensity) reflection coefficient √ of a quarter-
wave MgF2 coating (n2 = 1.38) on glass (n3 ≈ 1.50, 1.50 ≈ 1.22)
is ρ2 = 0.01, versus ρ2 = 0.04 for uncoated glass in air (n1 = 1.00)

PhoTEC
INTERFEROMETERS (7)
• Fabry-Pérot interferometer
Entrance and exit media are the same (n3 = n1)
Electric-field reflection coefficient in the entrance medium:
(η22 − η12) sin(k2L)
ρ=j
2η1η2 cos(k2L) + j(η22 + η12) sin(k2L)
Power (and intensity) reflection coefficient in the entrance medium:
(η22 − η12)2 sin2(k2L) (ρ12ρ23)2 sin2(k2L)
|ρ| = 2 2
2
=1
4η1 η2 + (η2 − η1 ) sin (k2L) 4 (1 + ρ12ρ23)2 + (ρ12ρ23)2 sin2(k2L)
2 2 2 2
Power (and intensity) transmission coefficient into the exit medium:

1 2
2 4η12η22 4 (1 + ρ12 ρ23 )
1−|ρ| = 2 2 =1
4η1 η2 + (η2 − η1 ) sin (k2L) 4 (1 + ρ12ρ23)2 + (ρ12ρ23)2 sin2(k2L)
2 2 2 2
where
n1 − n2
ρ12 = , ρ23 = −ρ12
n1 + n2

PhoTEC
INTERFEROMETERS (8)
The transmission of the interferometer is a maximum when the phase
change k2L of a beam traversing the plate is an integral multiple of π
This example applies to GaAs and related compound semiconductors
1.0
Transmission
0.8
0.6
0.4
n1 = 1.0, n2 = 3.5
0.2
0.0 2.5 5.0 7.5 10.0 12.5 15.0
k2 L (radians)

PhoTEC
LONGITUDINAL MODES
Transmission is a maximum when
2n2π λ
k2L = mπ ⇒ L = mπ ⇒ 2L = m
λ n2
i.e., when the round-trip distance in the interferometer is an
integral multiple of the wavelength in the medium
This is the condition for constructive interference of a wave that has just
entered the interferometer with a wave that has traversed the interferom-
eter once
The mth longitudinal mode has a wavelength λm and a frequency fm
2n2L c
λm = ⇒ fm = m
m 2n2L
Frequency spacing between adjacent longitudinal modes:
c
∆f =
2n2L

PhoTEC
DIFFRACTION (1)
• Diffraction is the name given to the deviation of light from rectilinear

propagation
A property of all waves
Usually most evident at the edges of shadows
Vital for a quantitative understanding of free-space optical beam
propagation
◦ Light exiting into air from a waveguide diffracts strongly
• Diffractive effects are already included in guided modes, so don’t need to
treat diffraction separately for light inside a waveguide
• Important special cases
Diffraction by a circular aperture — Airy disk
Diffraction by a rectangular aperture
Optics of Gaussian beams

PhoTEC
DIFFRACTION (2)
• The details of diffraction patterns depend on the Fresnel number

a2
N=
λd
a is the radius of the aperture (we’re assuming a circular aperture here...)
d is the distance to the observation point, or the focal length of a lens, if
one is used; λ is the wavelength
Large Fresnel numbers (N 1): Fresnel regime
◦ Wavefront curvature is an essential part of the physics
◦ Crudely, Fresnel diffraction by an aperture or obstacle results in a
shadow with lots of bright and dark fringes
Small Fresnel numbers (N 1): Fraunhofer regime
◦ Plane-wave limit
◦ The diffraction pattern is the Fourier transform of the aperture
◦ The focal plane of an ideal lens is in the Frauhofer regime —
a lens is a Fourier transformer (see Jack Gaskill’s book)

PhoTEC
FRESNEL DIFFRACTION EXPERIMENT

PhoTEC
OBLONG APERTURE AND GEOMETRICAL SHADOW

PhoTEC
FRESNEL DIFFRACTION BY AN OBLONG APERTURE

PhoTEC
FRESNEL DIFFRACTION BY A CIRCULAR OBSTACLE
Notice the “Poisson bright spot” in the center of the geometrical shadow!

PhoTEC
FRAUNHOFER DIFFRACTION BY AN OBLONG APERTURE
Note that the diffraction pattern is widest in the direction in which the
aperture is narrowest

PhoTEC
FRAUNHOFER DIFFRACTION
• Plane-wave limit
• Criterion for destructive interference:
s sin θ ≈ mλ
For small angles (θ 1), and for the first minimum,
λ
θ≈
s
• Fraunhofer diffraction by a slit of width s:
Intensity
θ
s
s sin θ (πs sin θ)/λ

– 7.5 – 5 – 2.5 2.5 5 7.5

PhoTEC
DIFFRACTION GRATINGS (PHYSICS 2 APPROACH)
• The grating shown below consists of a repeating pattern of opaque screen +

aperture, with period a
• The path difference for parallel rays through adjacent apertures is
∆L = a sin θ1 − a sin θ2
• Constructive interference occurs when ∆L = mλ (where m = integer)
θ2
θ1
a sin θ2
a
a sin θ1

PhoTEC
ORDERS OF DIFFRACTION
• Constructive interference occurs when ∆L = mλ

• The integer |m| is called the order of diffraction
The zero order (m = 0) corresponds to transmission straight through the
grating
The wavelength interval ∆λFSR between successive orders of diffraction
that exactly overlap (have the same θ1 and θ2), such that
λm = a sin θ1 − a sin θ2 = λm+1 + ∆λFSR,
is called the free spectral range of the grating:
λm+1 λ
∆λFSR = ≈
m m

COORDINATES FOR THE DIFFRACTION INTEGRAL
–k2
q
k1
s
r ρ r1
s
r

PhoTEC
DIFFRACTION GRATINGS (1)
• Fraunhofer diffraction by a screen:

E(r1) = C τ (ρ) eiq·ρ dS
S
where q := k1 − k2, k1 := k r̂, k2 := k ŝ (see preceding slide), τ is the
transmission function of the screen, ρ is the position vector in the screen,
and C is a constant
For our simple diffraction-grating model, τ = 0 in the opaque regions,
and τ = 1 in the transparent regions
Fraunhofer diffraction by a screen with N identical apertures (a grating!):
◦ Aperture An is displaced from aperture A1 by a vector an = (n − 1)a
◦ Amplitude of diffracted field is
N
E(r1) = C τ (ρ) eiq·ρ dS = eiq·an eiq·ρ dS
S n=1 A1

PhoTEC
DIFFRACTION GRATINGS (2)
• Amplitude of field diffracted by a screen with N identical, periodically

arranged apertures:
N
E(r1) = eiq·an × eiq·ρ dS
n=1 A1
multiple-beam interference pattern diffraction pattern of one aperture
1
0.9 P. Krizan (10/2001)
0.8
0.7
Intensity = |E|2
0.6
0.5
0.4
0.3
0.2
0.1
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
x
PhoTEC
BRAGG REFLECTION
• Plane-wave limit
• Bragg’s law for constructive interference of plane waves reflected from a
refractive-index grating:
2Λ sin θ = mλ/n̄
Λ is the grating period, m is an integer, and n̄ is the mean refractive index
of the medium
Λ sin θ

PhoTEC
GENERAL REFERENCES ON OPTICS AND

OPTICAL COMMUNICATION SYSTEMS
• Govind P. Agrawal, Fiber-Optic Communication Systems, Second Edition

(Wiley, 1997)
• Eugene Hecht, Optics, 4th Edition (Addison-Wesley, 2002)
• Jack D. Gaskill, Linear Systems, Fourier Transforms, and Optics (Wiley,
1978)
• M. Born and E. Wolf, Principles of Optics, Seventh Edition (Cambridge,
1999)
• Thomas E. Stern and Krishna Bala, Multiwavelength Optical Networks:
A Layered Approach (Addison-Wesley, 1999)
• Rajiv Ramaswami and Kumar N. Sivarajan, Optical Networks: A Practical
Perspective (Morgan Kaufmann, 1998)


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The University of Texas at Dallas Erik Jonsson School of

Engineering & Computer Science

Notes prepared for EE 6310

Professor Cyrus D. Cantrell

OPTICS AND PHOTONICS MARKETS

PROFESSIONAL SOCIETIES AND CORPORATIONS

• Optical Society of America (OSA)

OUTLINE OF OPTICS REVIEW (1)

OUTLINE OF OPTICS REVIEW (2)

Power and telephone Radio Microwave Infrared Visible

AM Radio FM Radio Terrestrial

Electromagnetic Spectrum for Telecommunications

• The phase velocity of a monochromatic wave is the ratio of its angular

• The index of refraction of a medium is the ratio of the velocity of light

Anomalous dispersion: If λ1 > λ2, then v1 < v2 and therefore

REFRACTIVE INDEX OF WATER

• For water, “normal” dispersion,

• In imaging systems, phase-velocity dispersion causes light of diﬀerent colors

ANGLES FOR SNELL’S LAWS

TOTAL INTERNAL REFLECTION

WHEN CAN ONE USE RAY OPTICS?

• One can use ray optics instead of wave optics:

IMAGING ANALYSIS USING RAY OPTICS (1)

IMAGING ANALYSIS USING RAY OPTICS (2)

• Numerical aperture of an optical system

• Experimental basis: Interference experiments of Young, diﬀraction and

PLANE-WAVE SOLUTIONS OF MAXWELL’S EQUATIONS

POLARIZATION IN COMMUNICATION SYSTEMS

• Many components and devices are polarization-sensitive

• The polarization of a plane wave is determined by the value of the relative

• The direction of the electric ﬁeld and the direction of propagation

SNAPSHOT OF PLANE-POLARIZED PLANE WAVE

SNAPSHOT OF CIRCULARLY-POLARIZED PLANE WAVE

• Red lines: E vectors Blue lines: H vectors

• For a plane wave, there are always 2 orthogonal states of polarization

• Orthogonal states of polarization in general

• Example of orthogonal states of circular polarization

REFLECTION AT NORMAL INCIDENCE (1)

• Goal: Understand how to calculate the reﬂection coeﬃcient at the interface

REFLECTION AT NORMAL INCIDENCE (2)

• Boundary conditions at a dielectric interface:

REFLECTION AT NORMAL INCIDENCE (3)

REFLECTION AT NORMAL INCIDENCE (4)

• Power (and intensity) reﬂection coeﬃcient:

REFLECTION AT OBLIQUE INCIDENCE (1)

REFLECTION AT OBLIQUE INCIDENCE (2)

BREWSTER’S ANGLE (1)

• When θi + θt = π/2, the E component in the plane of incidence is not

BREWSTER’S ANGLE (2)

POLARIZERS AND ANALYZERS

• A polarizer prepares a speciﬁc state of polarization

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), Fig. 6-6.1

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), Fig. 6-6.2

(a) Wollaston prism (b) Rochon prism (c) Sénarmont prism

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, 1991), Fig. 6-6.3

• The optical power per unit area incident on a surface is

• Interference is the name given to the following optical phenomenon:

• Intensity after time averaging over a few optical cycles:

• Interference of two plane waves: