Irg4Pc50Udpbf: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Ultrafast Copack Igbt
Irg4Pc50Udpbf: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Ultrafast Copack Igbt
Irg4Pc50Udpbf: Insulated Gate Bipolar Transistor With Ultrafast Soft Recovery Diode Ultrafast Copack Igbt
IRG4PC50UDPbF
INSULATED GATE BIPOLAR TRANSISTOR WITH UltraFast CoPack IGBT
ULTRAFAST SOFT RECOVERY DIODE
Features C
• UltraFast: Optimized for high operating
frequencies 8-40 kHz in hard switching, >200 VCES = 600V
kHz in resonant mode
• Generation 4 IGBT design provides tighter VCE(on) typ. = 1.65V
parameter distribution and higher efficiency than G
Generation 3
• IGBT co-packaged with HEXFREDTM ultrafast, @VGE = 15V, IC = 27A
E
ultra-soft-recovery anti-parallel diodes for use in
bridge configurations
n-ch an nel
• Industry standard TO-247AC package
• Lead-Free
Benefits
• Generation 4 IGBT's offer highest efficiencies
available
• IGBT's optimized for specific application conditions
• HEXFRED diodes optimized for performance with
IGBT's . Minimized recovery characteristics require
less/no snubbing
• Designed to be a "drop-in" replacement for
equivalent industry-standard Generation 3 IR IGBT's TO-247AC
Thermal Resistance
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IRG4PC50UDPbF
40
D u ty c ycl e: 5 0%
T J = 1 25 °C
T sin k = 90 °C
Ga te d rive a s spe cifi ed
30 Tu rn -on lo sses inclu de
effe cts o f reve rse re cov ery
Loa d C urre nt (A)
P o w e r D issipa tion = 4 0 W
6 0 % o f rate d
20 v o lta g e
10
0 A
0.1 1 10 100
1000 1000
I C , C o lle ctor-to-E m itter Cu rre n t (A )
100
100
TJ = 1 5 0°C
T J = 1 5 0 °C
10
T J = 2 5 °C
T J = 2 5 °C 10
VGE = 15V VC C = 1 0 V
2 0 µ s P U L S E W ID T H A 5 µ s P U LS E W ID TH A
0.1 1
0 1 10 4 6 8 10 12
VC E , C o lle c to r-to -E m itte r V o lta g e (V ) VG E , G a te -to -E m itte r V o lta g e (V )
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IRG4PC50UDPbF
60
V G E = 15 V 2.5
V G E = 1 5V
50
IC = 5 4 A
40
2.0
30
IC = 2 7 A
20
1.5
IC = 14 A
10
0 1.0 A
25 50 75 100 125 150 -60 -40 -20 0 20 40 60 80 100 120 140 160
T C , C ase Tem perature (°C) T J , Ju n c tio n Te m p e ra tu re (°C )
Fig. 4 - Maximum Collector Current vs. Case Fig. 5 - Typical Collector-to-Emitter Voltage
Temperature vs. Junction Temperature
1
T h e rm a l R e s p o n s e (Z thJC )
D = 0 .5 0
0 .2 0
0 .1
0 .1 0
PD M
0 .0 5 t
1
S IN G L E P U L S E t2
0 .0 2 (T H E R M A L R E S P O N S E )
N ote s :
0 .0 1 1 . D u ty f ac t or D = t / t2
1
2 . P e a k TJ = P D M x Z th J C + T C
0 .0 1
0 .0 0 0 0 1 0 .0 0 0 1 0 .0 0 1 0 .0 1 0 .1 1 10
t 1 , R e c ta n g u la r P u ls e D ura tio n (s e c )
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IRG4PC50UDPbF
8000 20
V GE = 0V , f = 1M Hz VC E = 400V
C ie s = C ge + C gc , C ce SH O R TED I C = 27A
6000
C ie s
12
4000
8
C oes
2000 C res 4
A 0
A
0
0 40 80 120 160 200
1 10 100
3.0 10
VCC = 480V
VGE = 15V
TJ = 2 5 °C I C = 54A
Total Switching Losses (mJ)
T ota l S w itching Loss es (m J)
IC = 27A
2.5
I C = 27A
2.0 1
I C = 14A
1.5
RG = 5.0 Ω
VG E = 15V
1.0 A VC C = 480V A
0.1
0 10 20 30 40 50 60 -60 -40 -20 0 20 40 60 80 100 120 140 160
Fig. 9 - Typical Switching Losses vs. Gate Fig. 10 - Typical Switching Losses vs.
Resistance Junction Temperature
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IRG4PC50UDPbF
8.0 1000
RG = 5 .0 Ω VGGE E= 2 0V
TJ = 1 5 0 °C T J = 125 °C
V CC = 480V
V GE = 15V
6.0
100 S A FE O P E R A TIN G A R E A
4.0
10
2.0
0.0 A 1
0 10 20 30 40 50 60 1 10 100 1000
I C , C o lle c to r-to-E m itte r C u rre n t (A ) V C E , Collecto r-to-E m itter V oltage (V )
100
In s ta n ta n e o u s F o rw a rd C u rre n t - I F (A )
TJ = 1 50 °C
TJ = 1 25 °C
10 TJ = 25 °C
1
0.6 1.0 1.4 1.8 2.2 2.6
F o rw a rd V o lta g e D ro p - V F M (V )
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IRG4PC50UDPbF
140 100
VR = 2 0 0 V
VR = 2 0 0 V
TJ = 125°C T J = 1 2 5 °C
TJ = 25°C T J = 2 5 °C
120
100
I F = 5 0A
I IR R M - (A )
t rr - (ns)
I F = 2 5A
80 I F = 50A 10
I F = 25A
I F = 10 A
IF = 10A
60
40
20 1
100 1000 100 1000
di f /dt - (A/µs) d i f /d t - (A /µ s)
Fig. 14 - Typical Reverse Recovery vs. dif/dt Fig. 15 - Typical Recovery Current vs. dif/dt
1500 10000
VR = 2 0 0 V VR = 2 0 0 V
T J = 1 2 5 °C T J = 1 2 5 °C
T J = 2 5 °C T J = 2 5 °C
1200
d i(rec)M /d t - (A /µs)
Q R R - (n C )
900
I F = 5 0A I F = 10 A
1000
600
I F = 2 5A
I F = 25 A
300
I F = 1 0A I F = 5 0A
0 100
100 1000 100 1000
d i f /d t - (A /µ s ) di f /dt - (A /µs)
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di(rec)M/dt vs. dif/dt
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IRG4PC50UDPbF
90% Vge
+Vge
Same ty pe
device as Vce
D .U.T.
9 0 % Ic
10% Vce
Ic Ic
430µF 5 % Ic
80%
of Vce D .U .T.
td (o ff) tf
t1 + 5 µ S
Eoff =
∫ V c e ic d t
t1
trr
G A T E V O L T A G E D .U .T .
Ic
trr
Q rr =
∫ tx
id d t
1 0 % +V g
+Vg
tx
1 0 % Irr
10% Vcc
V cc
D UT VO LTAG E
Vce
AN D CU RRE NT V pk
Irr
1 0 % Ic
Vcc Ip k
9 0 % Ic
Ic
D IO D E R E C O V E R Y
W A V E FO R M S
5% Vce
td (o n ) tr
t2
t1
∫
E o n = V ce ie d t
E re c =
∫
t4
V d id d t
t3
t1 t2 D IO D E R E V E R S E
REC OVERY ENER GY
t3 t4
Fig. 18c - Test Waveforms for Circuit of Fig. 18a, Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr Defining Erec, trr, Qrr, Irr
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IRG4PC50UDPbF
V g G A T E S IG N A L
D E V IC E U N D E R T E S T
C U R R E N T D .U .T .
V O L T A G E IN D .U .T .
C U R R E N T IN D 1
t0 t1 t2
L D.U.T. 480V
RL=
4 X IC @25°C
1000V Vc*
0 - 480V
50V
6000µ F
100 V
Figure 19. Clamped Inductive Load Test Figure 20. Pulsed Collector Current
Circuit Test Circuit
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IRG4PC50UDPbF
Notes:
Q Repetitive rating: VGE = 20V; pulse width limited by maximum junction temperature
(figure 20)
R VCC = 80%(VCES), VGE = 20V, L = 10µH, RG = 5.0Ω (figure 19)
S Pulse width ≤ 80µs; duty factor ≤ 0.1%.
T Pulse width 5.0µs, single shot.
TO-247AC Package Outline
Dimensions are shown in millimeters (inches)
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 04/04
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/