Mismatch Analysis
Mismatch Analysis
Abstract—This paper presents an analysis on capacitor capacitor array avoiding the non-binary- weighted capacitor
mismatch and parasitic capacitors effect of the improved [4]. However, the parasitic capacitors on each side of the
segmented-capacitor array to alleviate the limitation of coupling capacitor and the mismatching of binary
mismatching performance and avoid a non-binary-weighted
weighted-capacitor network have great influence on the
coupling capacitor. Both the matching of binary-weighted
capacitor network and parasitic capacitors on both sides of the attainable resolution which has not yet been analyzed in
coupling capacitor have great influence on the resolution of precise theory. This paper gives a precise analysis on the
ADC system. The relationship among the mismatching of influence which can be provided for circuit designers to
binary-weighted-capacitor network and the parasitic choose process, layout, circuit structure, and capacitor size
capacitors and the attainable resolution of ADC is analyzed by in their design of SAR ADC.
giving precise theoretical demonstration. Therefore, a
theoretical basis is provided for designers to choose process, II. IMPROVED SEGMENTED-CAPACITOR ARRAY SAR ADC
layout, circuit structure, and capacitor size in their design of
The successive approximation ADC usually consists of
SAR ADC.
a sample and hold stage, a digital-to-analog converter
(DAC), a comparator and a successive approximation
register, and it basically implements a binary search
Keywords-Successive Approximation Register (SAR) ADC, algorithm. The principle schematic of the improved
System-on-chip(SOC), Charge Redistribution, Capacitor segmented-capacitor array SAR ADC is shown in Fig.1.
Segmentation. The capacitor array is divided into two parts. In the MSB
part, we add a dummy capacitor C0 parallel with M binary
weighted capacitors. The LSB part only contains L
I. INTRODUCTION capacitors (M=L=n/2, n is the resolution). The coupling
For the comprehensive advantages of SAR ADC in capacitor now is using the unit capacitor C0 . The capacitor
accuracy, speed, power and cost, the increasing equation is as follows:
sophistication of System-on-chip architecture comes an Cmsb = 2M C0 , Cc = C0 (1)
increasing need for SAR ADC. In particular, the CR
(charge-Redistribution) SAR (Successive Approximation L
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282
M
1 2N
CMSB i{∑ i bi iVref (1 + ε i )} δ< (17)
C0 (1 + ε 0 ) i=1 2 2 2N
− 2N − 1
VxLSB = ⋅
CLSB + CPL + C0 (1 + ε 0 ) (C + CPR ) ⋅ C0 (1 + ε 0 )
CMSB + CPR + LSB When the N is becoming larger, the expression can be
CLSB + CPL + C0 (1 + ε 0 )
M M written as (18). In the structure of our improved
1 1 1 1
= × K ` × ∑ i bi iVref + n/2 × K ` × ∑ i bi iε i iVref − segmented-capacitor array, the resolution N is equivalent to
2n/2 i =0 2 2 i =0 2
n/2. Therefore, the limitation of mismatch of capacitors to
CPL M
1 M
1 implementing high resolution has been greatly alleviated.
n/2 n/2
× K `{∑ i bi iVref + ∑ i bi iεi iVref } +
2 C0 ⋅ (2 C0 + CPL ) i =0 2 i=0 2
2N 1
C0 ⋅ ε 0 M
1 M
1 δ< ≈ (18)
× K ` (∑ i bi iVref + ∑ i bi iεi iVref )
2N
(10) 2 − 2N − 1 2N
n/2
2 C0 + CPL i=0 2 i=0 2
E (4) and E (5) is obviously negligible because they are
Therefore, the whole voltage Vx is obtained by adding proportion to result of multiplying relative error and
these contributions from the MSB and LSB capacitor array mismatching ratio, and exponentially inverse proportion to
together, n. E (2) and E (3) is proportion to the reference voltage, so
the total residual voltage is shown. E (2) is the result of the
n−1 parasitic capacitor on the left side of coupling capacitor. E
1
Vx = K`(−Vin + ∑ i bi ⋅Vref ) + E(1) + E(2) + E(3) + E(4) + E(5) (11) (3) is the result of the mismatch of the coupling capacitor.
i=0 2
2n/2C0ε0 − CPL M
1 1
E(2) + E(3) = n/2 n/2
2 C0 ⋅ (2 C0 + CPL )
× K`
∑
i=0 2
b iV
i i ref
2
LSB (19)
Error voltages are shown as follow:
Assume the worst case that all the bits are assigned to 1
M
1 1 M
1 so that the maximum error caused by E(2) and E(3) is
E (1) = K ∑ i bi iVref + n/2 × K ` ∑ i bi iε i iVref
`
(12) required to meet an inequality as (20). Meanwhile, the
i =0 2 2 i =0 2
parasitic capacitors on the right hand of coupling capacitor
have no effect on the linearity.
CPL M
1
E (2) = n /2 n /2
2 C0 ⋅ (2 C0 + CPL )
× K `
∑
i =0 2
b iVref
i i (13) (2 n / 2 − 1) C 0 ε 0 − C P L
C0
(20)
2K `
C0 ⋅ ε 0 M
1 IV. Conclusions
E (3) = n /2
× K ` ∑ i bi iVref (14)
2 C0 + CPL i =0 2 An improved segmented-capacitor array SAR ADC
architecture has been analyzed which can be used to
implement higher resolution. We took a precise analysis on
C0 ⋅ ε 0 M
1
E (4) = n /2
× K ' ∑ i bi iε i iVref (15) the mismatching between binary-weighted capacitors and
2 C0 + CPL i =0 2 the parasitic capacitors on both sides of the coupling
capacitor. The parasitic capacitors on the right hand of the
CPL M
1 coupling capacitor have no effect on the linearity. The
E (5) = n /2 n /2
2 C0 ⋅ (2 C0 + CPL )
× K `
∑
i =0 2
b iε i iVref
i i (16) parasitic capacitors on the left hand have certain effect on
the linearity of the ADC system. This paper presents a
precise and useful analysis on the relationship among the
B. Error Analysis attainable resolution and several usual factors such as:
`
The coefficient K has no effect on the linearity and capacitor mismatching, parasitic capacitors which is very
can be considered as 1 approximately as the resolution useful for circuit designers to choose process, layout, circuit
increased. The resolution of the ADC is mainly determined structure, and capacitor size in the design of SAR ADC.
by exact ratios of any two capacitors in the array according REFERENCES
to E (1) in (12) showing that the mismatching requirement is
alleviated only for n/2 bits. Some researches have been done [1] Michael D. Scott, Bernhard E. Boser and Kristofer S. J. Pister, “An
Ultra Low-Energy for smart dust,” IEEE J. Solid-State Circuits,
to verify that the maximum capacitor mismatch tolerance δ vol.38, no.7, pp.1123-1129, July.2003.
totally determine the resolution N of the ADC [5]. In [2] J.L. Mcceary and P.R. Gray, “All-MOS charge redistribution
nowadays technology, the maximum capacitor mismatch analog-to-digital conversion techniques PartⅠand Part II,” IEEE J.
tolerance δ is limited to about 0.1%. The relationship Solid-State Circuits, Vol. SC-10, No.6, pp.60-68, December, 1975.
between mismatching tolerance of capacitor network and [3] Culurcielllo E, Andreou A, “An 8-bit, 1mW successive
attainable resolution of ADC has already been analyzed by approximation ADC in SOI CMOS,” Proceedings of IEEE
International Symposium on Circuit and System(ISCAS 03).
reference [6]. May.2003, pp.301-304.
282
283
[4] T. Sun, D.M. Li, “Overview of successive approximation analog-
to-digital converters,” Microelectronics, Vol.37, No.4, pp. 527-528,
Aug. 2007.
[5] Z.J. Lin, H.G. Yang, L.G. Zhong, “Modeling of capacitor th array
mismatch effect in embedded CMOS CR SAR ADC,” 6 Int Conf
ASIC Proceeding (ICASIC2005), IEEE press, Oct.2005, pp.979-982.
doi: 10.1109/ICASIC.2005.1611492.
[6] W.T. Zhou, C.C. Lee, “Analysis of capacitor mismatch effect in SAR
A/D converter,” Microelectronics, Vol.37, No.2, pp. 200-204, Apr.
2007.
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