Semiconductor Notes
Semiconductor Notes
SolidState Physics
SEMICONDUCTOR
Syllabus:-Classification of Solids, Fermi-Dirac statestics, concept of Fermi level & its variation with
temperature, impurity & applied voltage.
Intrinsic & extrinsic carrier concentrations, carrier drift, mobility, resistivity & Hall effect, carrier
diffusion, Einstien’s relations, current density & continuity equation.
Energy Band diagrams of p-n junction-formation of depletion region, derivation of depletion layer width.
Formation of Energy Bands in Solids:-
When an atom is isolated, its constituent electrons occupy distinct & discrete energy levels. So atoms
of one & the same material, if isolated, will give the same energy structure i.e. same shell electrons will
have exactly the same energy, in all isolated atoms of same element.
Energy Energy
M Nenergy band
E4 -N shell
L E3 -M shell Menergy band
K
As shown in figure, electron revolving in an orbit corresponds to one energy level, like a K-shell electron
belongs to the lowest(1st ) level, L-shell electron to 2nd level, etc.
But when atom is not isolated the surroundings of atom affect the electron energies. When a solid is
formed, lacks & lacks of atoms of same kind (or sometimes molecules of same kind) come together, they
are packed very closely. Now for any atom, it has electrons of neighboring atoms in the surrounding &
also positively charged nuclei of neighboring atoms. Due to this, electrostatic farces acting on electrons
in the atom change their energies slightly. But to revolving electron cloud in the surrounding, the change
in energies is not one & the same for all atom-electrons, at all times.
Therefore now say, a K-shell electron in all atoms of the solid will not have a single energy value, but it
can have any value from a range of slightly different energies. So collectively for an atom in a solid, an
Energy
Energy
Energy
C.B
C.B C.B
Forbidden Forbidden
gap gap
V.B
V.B
V.B
Conductor
Semiconductor Insulator
Conductor
The C.B. overlapping V.B. means that here some valence electrons themselves are free without acquiring
any excess energy. So at the valence energy itself i.e. being in V.B., these electrons can cause
conduction, so belong to C.B. also. But few valence electrons may acquire excess energy & with higher
energy they can occupy higher levels in C.B.
So at room temperature, a large amount of free electrons are available for conduction of heat or electricity
through solid & hence these solids are termed as conductors.
Insulators
The term itself indicates that these solids do not allow conduction of heat or electricity through their
body. This must be due to absence of free electrons. i.e. no electrons are occupying energies in C.B.
Si Si Si E
An electron C.B
with each
impurity atom
Ed Donor Level
Si P Si
Si Si Si V.B
Intrinsic semiconductor (say Si) is doped with pentavalent impurity e.g. P, As, Sb, Bi. Each impurity
atom forms covalent bonds with surrounding four silicon atoms with the help of four of its five electrons.
The fifth electron is superfluous and is loosely bound to the impurity atom. Hence it can be easily excited
from the valence band to the conduction band by application of electric field or increase in thermal
energy.So ‘one free electron’ per impurity atom will be in excess to the normal electron-ho le
concentration. Here electrons are called majority charge carriers & holes as minority carriers.
If the density of the donor level electrons is nD, the carrier densities in n- type semiconductors is
ne = ni + nD and nh = ni.
p-type semiconductor:
E
Si Si Si C.B
A hole with
each impurity
atom
Si P Si
Ea Acceptor Level
V.B
Si Si Si
Intrinsic semiconductor (say Si) when doped with trivalent impurity. E.g. B, Al, Ga, In, Ti Each impurity
atom forming covalent bonds with neighboring silicon atoms one bond is left incomplete and gives rise
to a hole as shown in fig, i.e. creates one ‘hole in a bond’. So we get one hole per impurity atom in
excess, along with the normal electron-hole concentration in semiconductor. Here holes are called
majority charge carriers & electrons as minority carriers.
If the density of the acceptor level holes is nA, the carrier densities in p- type semiconductors is
nh = ni + nA and ne = ni.
Direct and Indirect Band Gap of Semiconductors
The energy of a free electron is given by
𝑝2
𝐸=
2𝑚
where p is the momentum and m is the mass of an electron. The energy-momentum relation of an electron
is parabolic in nature as shown in figure-a. The energy momentum relationship of semiconductor is
shown in figure-b. The upper parabolain the conduction band indicates free electrons and the lower
parabola in the valence band represent the free holes. The spacing between these two parabolas at p=0
is the bandgapEg.
Following figure shows Fermi level position in conductor & intrinsic semiconductor,
E Conductor E Semiconductor
C.B.
C.B.
Ef
Ef
V.B. V.B.
In case of conductor & intrinsic semiconductor, position of Fermi level is unaffected with
increasing temperature.
In extrinsic semiconductors, it is not the same case.
C.B.
C.B.
Ef
Ea
Acceptor Level Donar Level
Ed
Ef
V.B. V.B.
1
f(E)=
1 e( E EF ) / kT
whereEF- Fermi level of the solid
T- absolute temperature
k - Boltzmann constant
f(E) - probability that an energy state with energy E being occupied by an
electron in solid at temperature To K
Let’s see how this Fermi function gives consistent results according to definition of Fermi level.
Case 1:At T=0o K, for all energy levels with E EF
1 1 1
f(E)= ( E EF ) / 0
1 e 1 e 1 1
1
f(E)= 1
1 0
This implies that any energy states below EFare completely occupied for all solids at 0o K
Case 2:At T = 0o K for all energy levels with E>EF
1 1 1
f(E)=
1 e ( E EF ) / 0
1 e
1
for T 0 0 K
kT
kT for T = 0 0 K
Ef
Ef
kT
kT
1.0 f(E)
At temperature 0 0 K At some higher temperature T0 K
To show that Fermi level lies at center of forbidden gap in intrinsic semiconductors : (Using Fermi
function concept qualitatively )
N N
N=
1 e( Ec EF ) / kT 1 e( Ev EF ) / kT
1 1
1= ( Ec EF ) / kT
( Ev EF ) / kT
1 e 1 e
Ec E F E EF
For convenience, let’s substitute x& v y
kT kT
1 1
So, 1=
1 e 1 e y
x
1 e 1 e =1 e 1 e
x y y x
1 e x e y e x y=2 e x e y
1 e x e y e x y=2 e x e y
Ec E F E v E F
e x y=1 x y 0 i.e. 0
kT kT
Ec Ev 2 E F 0
Ec Ev E g
EF
2 2
This expression indicates that fermi level lies at midpoint between C.B. & V. B i.e at center of forbidden
gap for intrinsic semiconductor.,
Corollary – above expression suggests that if Eg is energy band gap then
Eg
E c E F E F E v
2
Probability of occupation of level E ci.e the probability of having valence electrons excited to C.B. will
be given by Fermi function as
1 1
f(Ec )= ( Ec EF ) / kT
1 e 1 e
Eg / 2 kT
E
E
o
Conduction Band Conduction Band
Ed
Ef
Ef
Ea
100 200 300 400 500 T0 K 100 200 300 400 500 T0 K
Qualitative variation of Fermi level with increasing temperature in p -type & n- type semiconductors
Eg
Drift velocity & Mobility of Carriers : Mobility means ability to move. Denoted by letter ‘’, When
electric field is applied across a solid & a current has to flow, the free electrons in solid move in a
particular direction to cause the current. Electron inside a solid cannot speed up in a particular direction
easily due to surrounding atoms & other electron coming in its path. But its motion is a drifting motion
in a direction opposite to that of applied electric field (i.e. it drifts from lower potential side to higher
potential side). Drift velocity is the net average speed the charge carrier is attaining when it moves under
the applied electric field. It is denoted by ‘v d ’
Mobility ( ) of an electron is defined as the acquired drift velocity ‘ v d ’ per unit electric field
vd 2
(m /V-sec)
E
CURRENT DENSITY (J) [under action of applied electric field i.e. drift current density ]:-
I
It is the ‘current per unit cross-sectional area’ flowing through solid i.e. J =E
A
Where ‘I’ is total current passing through solid,‘A’ is its cross-sectional area, is conductivity of the
material, and E is the applied electric field.
Conductivity ():- Current as a flow of charges can be logically defined as
I n e vd A With n -concentration of electrons
e -charge on electron
vd -drift velocity of electrons
A -cross-sectional area of conductor
So current ‘I’ means ‘n.e’ charge flowing through area ‘A’ with velocity ‘v d ’
Hence J n e vd
Current:- In a semiconductor, mainly there are two types of currents that flow across the junctio n: Drift
Current & Diffusion Current.
Drift Current is because of the net motion of carriers in one direction due to some applied electric field.
Here the applied field’s strength & direction decide the current’s value & direction.
Diffusion current is constituted by motion of carriers occurring due to ‘carrier concentration gradient’
present in the lattice at given temperature & time. This current will flow from region with higher
concentration gradient to lower concentration gradient region
Further current is constituted by not only motion of free electrons but also by effective motion of holes.
So the net current in semiconductor is always sum of current due to flow of electrons & current due to
flow of holes.
As shown in figure, consider a rectangular plate of a p-type semiconductor of width 'w' and thickness 'd'.
When a potential difference is applied along its length 'l', current ' I ' starts flowing through it in x-
direction. The current 'I' is given by
𝐼 = 𝑛ℎ 𝑒𝑣𝑑 𝐴 -----------------(1)
where nh density of holes,
vd drift velocity of holes,
and, A cross-sectional area of the specimen = w x d.
The current density 'J' is given by
𝐼
𝐽 = = 𝑛ℎ 𝑒𝑣𝑑 --------------------(2)Type equation here.
𝐴
The figure shows schematically how can one observe Hall effect. As shown, the charge carriers (holes
in p-type semiconductor) experience force due to applied magnetic field in downward direction. So
holes will accumulate at down face of the semiconductor. This gives rise to potential difference VH
between lower face and upper face. VH is known as Hall voltage. If‘d’ is the thickness of the
semiconductor plate, the Hall electric field developed will be with intensity
VH
EH ---------------------------------(3)
d
In equilibrium condition, the force due to the this electric field must be balancing the force due to applied
magnetic field.
Combining equations (5) and (6), the Hall voltage VH can be written as,
𝐼𝐵𝑑 𝐽𝐵𝑑
𝑉𝐻 = = ----------------------(7)
𝑛ℎ 𝑒𝐴 𝑛ℎ 𝑒
An important parameter of Hall effect is Hall coefficient. Hall coefficient is defined as the Hall electric
field generated per unit current density per unit magnetic induction and written as
EH VH / d V JBd 1
RH H [using equation (7)]
BJ BJ BJd en h BJd
1
RH -------------------(8)
en h
1
RH for a p-type semiconductor,
nhe
1
and RH for a n-type semiconductor (Here ne is the charge carrier
nee
density).
Hall coefficient RH decreases sharply with increase in temperature in case of a semiconductor, as the
temperature in case of conductors as carrier concentration does not vary with temperature. The unit of
x-direction and Hall electric filed EH. The angle made by E with the applied electric field Ex is called the
𝐸
𝜃𝐻 = 𝑡𝑎𝑛 −1 ( 𝐸𝐻 ) = 𝑡𝑎𝑛 −1 (𝑅𝐻 𝜎𝐵 ) = 𝑡𝑎𝑛−1 (𝜇𝐻 𝐵 )
𝑥
where, 𝜇𝐻 = 𝜎𝑅𝐻
SEMICONDUCTOR DEVICES
The semiconductors are used to build circuit devices like diode, transistor which have successfully &
economically replaced old time bulky devices like vacuum diode valve, vacuum triode valve.
Semiconductor devices are very compact in size & due to mass production their price is also very low
as compared to vacuum valves.
PN – Junction diode:-
A single-semiconductor crystal is doped with p-type impurity on one side & with n-type impurity on
other side. When these two doped regions meet each other in the crystal, pn-junction is formed. The
device formed is called pn-junction diode (due to its working similar to vacuum diode valve).
On p-type side, holes are majority carriers whereas on n-side electrons are majority carriers. When at
the junction, both regions meet these majority carriers diffuse to the other side & recombine with each
other. The recombination process continues, till diffusion of carriers occur across the junction. But this
doesn’t continue indefinitely. The e-h pair recombination at junction develops immobile charges on
both side of junction in form of impurity ions. Trivalent impurity atom gains an extra electron whereas
Junction
P N
Anode Cathode
In terms of energy diagram, this situation can be viewed as if free electrons on n-side are having lower
energies as compared to the p-side free electrons’ energies i.e. C.B. on p-side should be at higher energies
than C.B. on n-side
eV0
C.B.
C.B.
EF EF
V.B.
V.B.
Initially as it is a single semiconductor crystal, both sides are having their energy bands same level. But
once pn-junction is formed, development of barrier potential lifts the P-side energy bands to higher
energy values. More precisely, the shifting of energy bands occurs in order to match Fermi levels of two
sides (on p-side Fermi level is always below midpoint of forbidden gap, whereas on-side Fermi level is
always above the midpoint).
The energy lift gained by p-side is numerically equal to eVo (in electron –volts) with e-electronic charge
&Vo – the barrier potential.
Breakdown mechanism of diode:-In reverse biasing semiconductor diode exhibits negligibly small
reverse saturation current. If the reverse bias voltage is increased gradually a point is reached where the
Avalanche Breakdown: This type of breakdown occurs when a high reverse voltage is applied to a
lightly doped junction diode. When we increase applied reverse bias, the electron gets accelerated to
very high speeds. This highly energetic electron in its path of motion when strikes any valence electron,
it can knock out that valence electron & these two electrons again get accelerated. Further these
secondary electrons can knock out two more valence electrons & further these tertiary electrons can
knock out 4 more valence electrons. This multiplication goes on rapidly and within a very short time,
free electrons in large number, moving with high speed, are generated inside diode. This is known as
avalanche multiplication. This causes sudden and large increase in reverse current. Such large current
flowing through crystal produces excessive heat in diode and diode burns out.
Zener Breakdown: This breakdown occurred in a heavily doped p-n junction. The depletion region is
very narrow and requires a relatively low reverse biased voltage for breakdown. Electrons can tunnel
through the narrow depletion layer even at a small reverse bias voltage causing a sudden large reverse
current from n to p side. This is called Zener effect. The Zener Breakdown is observed in the Zener
diodes having breakdown voltage less than 5V or between 5 to 8 volts.
**Note : The semiconductor devices LED, Zener diode & Solar cell can be referred from Textbooks of
Technical Prakashan or Applied Physics-I by Dr.Swati Bawra.