Thermal Conductivity Measurements On Challenging Samples by The 3 Omega Method
Thermal Conductivity Measurements On Challenging Samples by The 3 Omega Method
Thermal Conductivity Measurements On Challenging Samples by The 3 Omega Method
9, 2010
DOI: 10.1007/s11664-010-1265-6
Ó 2010 TMS
The 3 omega method is the best established method for measuring the thermal
properties of thin films (>100 nm) and nanowires. Theoretically, the method
could be applied to many more types of samples, leading to new knowledge,
but to date little effort has been made to extend its applicability. An enabling
set of technologies has been tested at the Fraunhofer-IPM. The technologies
developed encompass a new design of microheater, the measurement of bulk
samples with a prefabricated microheater on adhesive tapes and polymer
sheets, the measurement of tiny bulk samples glued to the underside of
polymer sheets, a fully automated experimental setup, and a new numerical
tool adapted to the new type of heater. The new design of microheater and
software were validated using float glass as a reference material. A micro-
heater on adhesive tape was used to measure accurately the thermal prop-
erties of sintered thermoelectric materials. The thermal conductivity of a very
small melt-spun nanocomposite sample glued to the underside of a Kaptonä
sheet was measured. The potential of the new design of microheater to mea-
sure very thin (nm) films is discussed.
1621
1622 Jacquot, Vollmer, Bayer, Jaegle, Ebling, and Böttner
Fig. 1. Exploded assembly drawing of the spiral-like microheater on its substrate, design of the microheater, and cross-sectional view of the finite
elements (meshing) used to calculate the heat transfer beneath the microheater. The four pads are the connections for current leads (I+,I) and
voltage leads (V+,V). The hatched area of the exploded view is the plane of the cross-sectional view of the meshing.
spiral-like heater is simulated by the heat transfer Seebeck coefficient is also possible with this mea-
below concentric rings instead of modeling the surement system.12 For room-temperature mea-
spiral-like heater as a disk. Since a ring has an axis surements, the Fraunhofer-IPM uses a sample
of symmetry and since the asymmetry of the spiral- holder with Peltier elements for temperature regu-
like heater is negligible, this symmetry can be used lation. In this case the temperature does not change
to calculate the three-dimensional (3D) heat trans- by more than 1 mK and stabilizes very quickly.*
fer using a two-dimensional (2D) mesh (Fig. 1), and Measurements are made in vacuum. This is impor-
the numerical simulation of Jacquot et al.7 can be tant when the measurement is done on membranes
easily extended. The method will be designated the or at high temperatures. The numerical tool that
concentric 3 omega method. The concentric method comes with the measurement system is an improved
is tested on float glass and then used to measure the version of the Windows-based software developed by
thermal conductivity of melt-spun spark plasma Jacquot et al.7 The material properties used in the
sintered (SPS) (Bi,Sb)2Te3. Since there is a demand numerical simulation are listed in Table I.
for measurement systems and methods for mea-
suring small samples, the Fraunhofer-IPM CONCENTRIC METHOD
extended the on-membrane method introduced by
Validation
Jacquot et al.8 by using an alternating current (AC)
instead of a direct current (DC) in the microheater. A bolometer with the shape shown in Fig. 1 was
Preliminary results of measurements on Kaptonä fabricated by photolithography on a sample made of
sheet, Polyamide films, and melt-spun (Bi,Sb)2Te3-2 float glass. The diameter of the spiral-like heater,
mol% PbTe nanocomposite are presented.9,10 the strip width, and strip separation were 920 lm,
20 lm, and 40 lm, respectively. The temperature
amplitude (a) and phase (b) were measured with a
EXPERIMENTAL PROCEDURES
power per unit area of 7521 W m2 and plotted as a
The measurement system used for this work function of the inverse square root of frequency
is a further development of a previously presented (Fig. 2). The agreement between experiment and
system.11 Validation was carried out by measur- the simulation done with the meshing shown in
ing the thermal conductivity of quartz glass Fig. 1 is very good over the whole frequency range
(1.31 W m1 K1) from Schott Lithotec (Lithosilä). for both amplitude and phase. Hence, it can be
The system can perform highly automated mea-
surements. The instrumentation is used together *The temperature controller is a Thorlab TED350. Depending on
with a cryostat from Cryovac, thus enabling mea- the temperature sensor used, temperature stability is better than
surements between 70 K and 700 K. The sample 1 mK over 24 h, and measurement resolution of 0.001°C and
holder for the cryostat was developed at the temperature accuracy of ±0.1°C are achievable (see technical
Fraunhofer-IPM. Measurement of the cross-plane data of the TED350 available online).
Thermal Conductivity Measurements on Challenging Samples by the 3 Omega Method 1623
Table I. Thermophysical properties at room temperature of materials used in the numerical simulations
Thickness Density Thermal Conductivity Heat Capacity
(lm) (kg m23) (W m21 K21) (J kg21 K21)
Sample
(1)
(3)
(2)
(4)
ON-MEMBRANE METHOD
curve S) were measured at a power per unit area of Preliminarily results are presented for the first
3451 W m2 to obtain a comparison between the measurements of thermal conductivity of a flake
experiment and simulation of the properties of the (1.5 mm 9 2 mm 9 0.04 mm) of (Bi,Sb)2Te3-
adhesive film (glue underneath Kapton tape), since 2 mol%PbTe made by melt-spinning.9,10 A micro-
the thermal properties of Kapton and silicon are heater in the form of a metallic strip 5 mm long and of
known (Table I). Then, the adhesive tape was stuck width 10 lm has been microfabricated by photoli-
to the sintered sample, and the temperature thography on a Kapton sheet 50 lm thick (Fig. 4).
amplitude (Fig. 3a, curve T) and phase (Fig. 3b, The nanocomposite was glued with a polyamide
curve T) were measured again. We emphasize that spray to the underside of the Kapton sheet. The sheet
just crude polishing of the sample is required. It is was glued with silver paint onto a frame made of
not necessary to microfabricate the microheater on aluminum with an opening of 4 mm 9 2 mm. The
the sample surface. When the frequency is lower distance between the voltage (1 mm) wires connected
than 0.4 Hz, the difference between curves S and T to the microheater was chosen to be significantly
is large, especially for temperature amplitude. The smaller than the length of the flake. The real part of
additional temperature rise of curve T compared the amplitude and the phase shift were measured at a
with curve S is a function of the thermal properties heating power per unit length of 2 W m1 and are
of the sintered material. Using the 3 omega method, shown in Fig. 5a and b. A Kapton sheet, a Kapton
a thermal conductivity of 1 W m1 K1 has been sheet with a 10-lm- to 20-lm-thick polyamide film,
measured, which is in very good agreement with a and a Kapton sheet with a 1.1-lm-thick (Bi,Sb)2Te3
result obtained by the laser-flash method by film sputtered on the underside have also been mea-
Netzsch (1.03 W m1 K1). The 3 omega method sured (Fig. 5). The material underneath reduces the
may offer the additional advantage of being able to temperature rise at low frequency (4 Hz). At higher
measure the anisotropy of the thermal conductivity frequency, the thermal wavelength is smaller than
Thermal Conductivity Measurements on Challenging Samples by the 3 Omega Method 1625
Fig. 5. (a) Amplitude and (b) phase measured at room temperature and calculated (c and d) with the data of Table I in the case of the
microheater on a membrane. The materials underneath the membrane are listed in the insert to (a).
the thickness of the Kapton sheet, so the thermal Below 0.1 Hz the thermal wavelength is compa-
wave is not affected by the material underneath. The rable to the size of the opening. There is heat flow
1.1-lm sputtered film cannot be measured accurately along the length of the membrane that is not taken
with the experimental configuration used here into account in the numerical simulation. Heat loss
because of the large difference in thickness between by radiation could also decrease the temperature
the Kapton sheet (50 lm) and the sputtered layer amplitude, since the amplitude measured at low
(1.1 lm). This conclusion is also valid for the poly- frequency is rather high. Obviously, better experi-
amide film. Since the thickness of the flake of nano- mental conditions can be found for this pioneering
composite is comparable to the thickness of the experiment.
Kapton sheet, it decreases the temperature ampli-
tude significantly enough to be measured with good
DISCUSSION OF THE MEASUREMENT
accuracy. Numerical simulations have been per-
OF NANOMETER-THICK FILMS
formed to obtain greater insight into these experi-
mental results (Fig. 5c and d). There is good The effect of the width of a microheater in the
semiquantitative agreement between experiment form of a strip on the measurement accuracy of thin
and simulation for frequencies down to 0.1 Hz. The films can be illustrated by the effect of a change in
thermal conductivity obtained (1.8 W m1 K1) is microheater width on the real part of the complex
just slightly lower than that measured on SPS temperature rise ðDTÞ~ arising from the substrate (1)
material of the same composition.10 and from the film (2)1,11,15:
1626 Jacquot, Vollmer, Bayer, Jaegle, Ebling, and Böttner
Pl 1 1 k the form of sintered materials or tiny flakes. Pho-
~
ReðDTÞ ¼ lnð4pf Þ þ ln þ 0:92 ; (1)
pk 2 2 qcp b2 tolithography is no longer needed by the end-user,
and there is no longer any need for electrical insu-
lation directly on measured materials even if the
materials are electrically conducting. This should
Pl e increase interest in the 3 omega method and enable
ReðDT~F Þ ¼ ; (2)
2b kF measurement of thermal properties from low to
moderate temperatures and at lower cost. Micro-
where Pl is the heating power per unit length, k is heaters in the form of rings and the numerical tool
the thermal conductivity of the substrate, f is the presented herein may enable measurement of
frequency of the current in the microheater, 2b is extremely thin films or very small samples in the
the strip width, q and cp are the density and heat very near future.
capacity of the substrate, e is the film thickness, and
kF is the cross-plane thermal conductivity of the
ACKNOWLEDGEMENTS
film.
The temperature rises in the substrate and film This work was supported by the German Federal
are functions of the strip width and increase Ministry of Education and Research (BMBF) within
when the strip width decreases. Nevertheless, the the Joint Project VEKTRA and by the Fraunhofer-
increase of temperature in the substrate is a loga- Gesellschaft, Grant Number: WISA 815 020.
rithmic function of the width, whereas the temper-
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