ZETIUM

Ultimate edition
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The Ultimate edition of the Zetium spectrometer is

a complete, dedicated tool for research environments
as well as in industrial applications where ultimate
performance is key. It is designed for the analysis of
any type of sample and unknown material.
To meet customer’s expectations, spectrometers can be
optimized to your budget and performance requirements.

ELEMENTAL INNOVATION ELEMENTAL INTELLIGENCE ELEMENTAL TECHNOLOGY ELEMENTAL SUPPORT

Continuous development, improved Advanced analytical software for advanced 60 years of experience and heritage - Transparent and reliable support in your
customer experience analytical hardware the ideal starting point neighborhood
Scientifically-sound, benefits-driven innovations A quantum step for our renowned SuperQ software gives The Ultimate edition of the Zetium spectrometer From service to expertise, training to laboratory analysis
implemented in the Ultimate edition of the access to new technology combinations and analytical represents the next generation of a remarkably the Ultimate edition of the Zetium spectrometer is
Zetium spectrometer make it the most powerful possibilities. Starring the Virtual Analyst, it enhances the successful series of WDXRF platforms, including the supported from every angle. With a worldwide network of
multipurpose tool for the analysis of a wide range user experience in setting up and operating the system. Axios, the MagiX and the PW2400. Proven technology experienced engineers coupled with the industry’s largest
of materials, from liquids to layered materials. has been refined and brought forward onto the Zetium pool of application scientists, Malvern Panalytical is always
platform, infusing a level of heritage and prestige. on hand to help you meet your analytical requirements.
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TOWARDS NEW HORIZONS

The Ultimate edition of the Zetium XRF spectrometer delivers unrivalled analytical performance, speed and
robustness through the seamless amalgamation of Malvern Panalytical’s core and innovative technologies.

Outstanding accuracy across the Save time and money Accurate results even without standards Superior characterization of
entire periodic table Advanced sample handling and completely integrated In addition to a comprehensive set of standards multilayered materials
Ultra-light element performance results from solutions maximize return on investment by minimizing and dedicated software support, the Omnian The Virtual Analyst expert software will guide you to
the combination of a 50 µm X-ray tube window, time spent on manual operations. For optimized standardless analysis package can be used for the the best choice of measurement and analysis settings
dedicated multilayer and curved crystals and process control, fully automated systems can be analysis of unknown compositions. Moreover it can using the Stratos software package for your multilayer
high-yield collimators. Transition row and heavy configured to include complementary technologies be used to perform fast screening analysis without measurements. By automating the complexity of
elements are rapidly analysed using the combination such as optical emission (OES) and X-ray diffraction the need for dedicated reference materials. the analysis steps, you are enabled to meet your
of Hi-Per scint and duplex detectors. (XRD) all coordinated by a LIMS system. specifications for single and multilayer coatings on
 rom major concentrations to trace
F metallic substrates. Typical applications of the Stratos
In-house expertise with Virtual Analyst Combined technologies, unlimited benefits elements in different industries software are: the analysis of single layer and multilayer
The Virtual Analyst, delivered with our latest version of A single platform combines sequential and simultaneous Always meet your analytical requirements with turn-key surfaces and coatings, such as deposited metals,
SuperQ analytical software, ensures that specialist-level analysis. SumXcore, the innovative combination of WD- solutions. Application templates and software packages processed semiconductor wafers and others.
expertise is available to you 24/7, for the development of and EDXRF technologies, offers a fast and powerful are available for the analysis of different materials,
new applications. Virtual Analyst is not just another wizard, screening tool for XRF analysis. The entire spectrum whether you need accurate and precise analysis of traces
it actively calculates the ideal measurement conditions, can also be rapidly collected during routine analyis with the Pro-Trace software, or the analysis of production
taking into account the configuration of the spectrometer, facilitating rapid detection of contaminants during samples in the metals industry with NiFeCo and Cu-base.
sample and preparation information, the required process control. The ED core features a small spot
analytical range, detection limits and required precision. mapping SDD detector, adding a compositional mapping
functionality for fast and accurate analysis of inclusions.
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SMALL SPOT ANALYSIS WITH MAPPING:

CLUES TO THE EARLY SOLAR SYSTEM
Compositional mapping of a chondritic
sample
Carbonaceous chondrites are a subcategory of
chondrites, and are among the rarest types of meteorites.
Their geochemical signature is very characteristic. In
fact, their non-volatile chemical composition is the
most primitive of any rock in the solar system, very
similar to the composition of the Sun (and therefore
the overall solar system). Because they are the oldest
bodies of the solar system, carbonaceous chondrites
are used as geochemical reference in dating studies.

In this study the distribution of a variety of elements was

mapped in a chondritic meteorite sample (type CV3), with
calcium-aluminium rich inclusions (CAIs). The analysis was
Small spot elemental analysis and
carried out with the Zetium small spot mapping function,
mapping by XRF
which combines the ED core with the innovative sample
Adding practical small spot mapping functionality
translation mechanics of the sample introduction turret.
to a full-function WDXRF, without compromising
its performance, adds new and realistic analytical
The meteorite sample was mounted in a special sample
possibilities for a variety of laboratories. Moreover,
holder, designed to accommodate a variety of irregular-
compared to other elemental mapping techniques, like
shaped samples. A 5 mm x 7.5 mm area of the sample
scanning electron microscopy or electron microprobe
surface was mapped, using a total of 600 spots with
analysis that involve quite complex sample pre-
a spot size of 500 microns. Each spot was measured
treatments, XRF requires little or no sample preparation.
for 60 seconds, giving a total measurement time of 10
Now available to users of varying experience, element
hours. Images showing the distribution and relative
mapping becomes a straightforward task, indispensable
concentration of 15 elements with the analysed area
in scientific research and process troubleshooting.
clearly show the compositional differences between
the host sample matrix and the Ca-Al rich inclusions.

ED CORE AND SMALL SPOT ANALYSIS

WITH MAPPING

•  ast, multi-element data acquisition

F
• Individual inclusion analysis and
element distribution mapping, revealing
compositional trends and heterogeneities
• Standardless Omnian quantification and/
or material-specific calibrations
WHY CHOOSE SERVICE & SUPPORT
MALVERN PANALYTICAL? Malvern Panalytical provides the global training,
service and support you need to continuously drive
your analytical processes at the highest level. We
We are global leaders in materials
help you increase the return on your investment with
characterization, creating superior, customer- us, and ensure that as your laboratory and analytical
focused solutions and services which needs grow, we are there to support you.

of this information and we shall not be liable for errors contained herein or for damages in connection with the use of this material. Malvern Panalytical reserves the right to change the content in this material at any time without notice.
supply tangible economic impact through

Disclaimer: Although diligent care has been used to ensure that the information in this material is accurate, nothing herein can be construed to imply any representation or warranty as to the accuracy, correctness or completeness
Our worldwide team of specialists adds value to your
chemical, physical and structural analysis. business processes by ensuring applications expertise,
rapid response and maximum instrument uptime.
Our aim is to help you develop better
quality products and get them to • Local and remote support

market faster. Our solutions support • Full and flexible range of support agreements

excellence in research, and help maximize • Compliance and validation support

• Onsite or classroom-based training courses
productivity and process efficiency.
• e-Learning training courses and web seminars
Malvern Panalytical is part of Spectris, the • Sample and application consultancy
productivity-enhancing instrumentation

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