EED32K003314 EMC Report
EED32K003314 EMC Report
EED32K003314 EMC Report
: EED32K003314 Page 1 of 27
Prepared for:
Shenzhen Yimi Life Technology Co.,Ltd
305, Building A, Tengbo Industrial Park, Changshangjiang Street,
Longbei Village, Pingshan District, Shenzhen, 518118, China
Prepared by:
Centre Testing International Group Co., Ltd.
Hongwei Industrial Zone, Bao’an 70 District,
Shenzhen, Guangdong, China
TEL: +86-755-3368 3668
FAX: +86-755-3368 3385
Modification Record
No. Last Report No. Modification Description
1 EED32K003314 Initial report
Report No. : EED32K003314 Page 3 of 27
TABLE OF CONTENTS
1. GENERAL INFORMATION.........................................................................................................4
2. COMPLIANCE SUMMARY.........................................................................................................4
3. MEASUREMENT UNCERTAINTY............................................................................................ 7
4. PRODUCT INFORMATION AND TEST SETUP.....................................................................7
4.1 PRODUCT INFORMATION.................................................................................................. 7
4.2 TEST SETUP CONFIGURATION........................................................................................8
4.3 SUPPORT EQUIPMENT....................................................................................................... 8
5. FACILITIES AND ACCREDITATIONS..................................................................................... 8
5.1 TEST FACLITY....................................................................................................................... 8
5.2 TEST EQUIPMENT LIST...................................................................................................... 9
5.3 LABORATORY ACCREDITATIONS AND LISTINGS...................................................10
6. RADIATION DISTURBANCE...................................................................................................11
6.1 LIMITS.................................................................................................................................... 11
6.2 BLOCK DIAGRAM OF TEST SETUP.............................................................................. 11
6.3 TEST PROCEDURE............................................................................................................ 11
6.4 GRAPHS AND DATA.......................................................................................................... 12
7. IMMUNITY TEST........................................................................................................................ 14
7.1 ELECTROSTATIC DISCHARGE...................................................................................... 16
7.1.1 TEST SPECIFICATION................................................................................................16
7.1.2 BLOCK DIAGRAM OF TEST SETUP........................................................................ 16
7.1.3 TEST PROCEDURE.....................................................................................................16
7.1.4 RESULTS & PERFORMANCE................................................................................... 17
7.2 RADIO FREQUENCY ELECTROMAGNETIC FIELDS................................................. 18
7.2.1 TEST SPECIFICATION................................................................................................18
7.2.2 BLOCK DIAGRAM OF TEST SETUP........................................................................18
7.2.3 TEST PROCEDURE.....................................................................................................19
7.2.4 RESULT & PERFORMANCE......................................................................................19
7.3 POWER-FREQUENCY MAGNETIC FIELDS..................................................................21
7.3.1 TEST SPECIFICATION................................................................................................21
7.3.2 BLOCK DIAGRAM OF TEST SETUP........................................................................21
7.3.3 TEST PROCEDURE.....................................................................................................21
7.3.4 RESULTS & PERFORMANCE................................................................................... 21
APPENDIX 1 PHOTOGRAPHS OF TEST SETUP................................................................... 22
APPENDIX 2 PHOTOGRAPHS OF PRODUCT........................................................................24
(Note: N/A means not applicable)
Report No. : EED32K003314 Page 4 of 27
1. GENERAL INFORMATION
Applicant: Shenzhen Yimi Life Technology Co.,Ltd
305,Building A,Tengbo Industrial Park, Changshangjiang Street,
Longbei Village, Pingshan District, Shenzhen, 518118, China
Village, Pingshan District, Shenzhen, 518118, China
Manufacturer: Shenzhen Yimi Life Technology Co.,Ltd
305,Building A,Tengbo Industrial Park, Changshangjiang Street,
Longbei Village, Pingshan District, Shenzhen, 518118, China
Product: pulse oximeter
Trade mark: N/A
Model/Type reference: YM101, YM102, YM103, YM201, YM301
Serial number: N/A
Report number: EED32K003314
State of Sample(s): Normal
Sample Received Date: Dec. 13, 2018
Sample tested Date: Dec. 13, 2018 to Feb. 20, 2019
The tested sample(s) and the sample information are provided by the client.
2. COMPLIANCE SUMMARY
IEC 60601-1-2:2014 & EN 60601-1-2:2015
Clause Requirement + Test Result - Remark Verdict
3. MEASUREMENT UNCERTAINTY
Where relevant, the following measurement uncertainty levels have been estimated
for tests performed on the Product as specified in CISPR 16-4-2. This uncertainty
represents an expanded uncertainty expressed at approximately the 95% confidence level
using a coverage factor of k=2.
Test item Value (dB)
Continuous disturbance 3.1
Radiation disturbance 4.9
Temperature (ºC):15 to 40
Operating conditions: Humidity (non-condensing):15% to 95%
Atmospheric pressure (kPa):70 to 106
Temperature (ºC):-20 to 60
Storage/transportation
Humidity (non-condensing):10% to 95%
Conditions:
Atmospheric pressure (kPa):50 to 107.4
Notes:
1. All the equipment/cables were placed in the worst-case configuration to maximize the emission during
the test.
2. Grounding was established in accordance with the manufacturer’s requirements and conditions for the
intended use.
VCCI
Centre Testing International Group Co., Ltd.
Mains Ports Conducted Interference Measurement VCCI Registration No. is C-20007.
Telecommunication Ports Conducted Disturbance Measurement VCCI Registration No. is
T-20008.
3m Alternate
Radiated Emission from 30MHz to 1GHz VCCI Registration No. is R-20006.
Radiated Emission from 1GHz to 6GHz VCCI Registration No. is G-20021.
10m Alternate
Radiated Emission from 30MHz to 1GHz VCCI Registration No. is R-20005.
Radiated Emission from 1GHz to 6GHz VCCI Registration No. is G-10758.
6. RADIATION DISTURBANCE
6.1 LIMITS
Limits for Group 1 class B Equipment
Quasi-peak limits at 3m
Frequency (MHz)
dB(μV/m)
30-230 40
230-1000 47
NOTE: The lower limit shall apply at the transition frequencies.
a. The Product was placed on the non-conductive turntable 0.8m above the ground at a
chamber.
b. Set the spectrum analyzer/receiver in Peak detector, Max Hold mode, and 120 kHz RBW.
Record the maximum field strength of all the pre-scan process in the full band when the
antenna is varied between 1~4 m in both horizontal and vertical, and the turntable is rotated
from 0 to 360 degrees.
c. For each frequency whose maximum record was higher or close to limit, measure its QP
value: vary the antenna’s height and rotate the turntable from 0 to 360 degrees to find the
height and degree where Product radiated the maximum emission, then set the test
frequency analyzer/receiver to QP Detector and specified bandwidth with Maximum Hold
Mode, and record the maximum value.
Report No. : EED32K003314 Page 12 of 27
7. IMMUNITY TEST
Immunity Performance Criteria
Required by IEC 60601-1-2:2014
During the immunity tests, the EUT was operated under conditions specified by clause 4.1
of this report.
The particular performance criterion for the immunity tests are specified by manufacturer,
with reference to the exampls in Annex I of IEC 60601-1-2:2014.
The equipment or system shall be able to provide the essential performance and remain
safe. The following degradations associated with essential performance and safety shall
not be allowed:
– malfunction;
– non-operation when operation is required;
– unwanted operation when no operation is required;
– deviation from normal operation that poses an unacceptable RISK to the PATIENT or
OPERATOR;
– component failures;
– change in programmable parameters;
– reset to factory defaults (MANUFACTURER’s presets);
– change of operating mode;
– a FALSE POSITIVE ALARM CONDITION;
– a FALSE NEGATIVE ALARM CONDITION (failure to alarm);
– cessation or interruption of any intended operation, even if accompanied by an ALARM
SIGNAL;
– initiation of any unintended operation, including unintended or uncontrolled motion,
even if accompanied by an ALARM SIGNAL;
– error of a displayed numerical value sufficiently large to affect diagnosis or treatment;
– noise on a waveform in which the noise would interfere with diagnosis, treatment or
monitoring;
– artefact or distortion in an image in which the artefact would interfere with diagnosis,
treatment or monitoring;
– failure of automatic diagnosis or treatment ME EQUIPMENT or ME SYSTEM to
diagnose or treat, even if accompanied by an ALARM SIGNAL.
For equipment and systems with multiple functions, the criteria apply to each function,
parameter and channel.
The equipment and systems may exhibit degradation of performance (e.g. deviation from
manufacturer’s specifications) that does not affect essential performance or safety.
Report No. : EED32K003314 Page 15 of 27
Min. No. of
Discharge Voltage Discharge per Meet the Immunity
Discharge Position
Method (±kV) polarity Performance Criteria
(Each Point)
Conductive Surfaces 8 10
Contact
Indirect Discharge VCP 8 10
Discharge
EUT Operated as intended, no
Indirect Discharge HCP 8 10 degradation of function
Below 1GHz:
Above 1GHz:
Report No. : EED32K003314 Page 19 of 27
Figure 1
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View of Product-1
View of Product-2
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View of Product-3
View of Product-4
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View of Product-5
View of Product-6
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View of Product-7