Numericals Part-3 Modified
Numericals Part-3 Modified
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Q. Si – device, @ 300oK
ni = 1010/cm3,
then @ x = x2,
Find hole concentration?
Energy
EC
Ei
EF
EG/3 EV
O X1 L/3 2L/3 L X
Q. If Si doped with boron with 1016/cm3 & ionize then if it is exposed to light such
that EHP’s are generated throughout volume of bar out the rate 1020/cm3/sec. If
the recombination life time is 100 sec intrinsic carrier is 1010/cm3, then
approximate product of steady state electron & hole concentrations d to light
exposure is ?
(a) 1032/ cm6
(b) 2 1020/cm6
(c) 2 1032/cm6
(d) 1020/cm6
Q. If P-type is of long direct band gap semiconductor, The equilibrium hole density
1017/cm3 & ni = 1010/cm3. Electron & hole diffusion lengths are 2 m & 1 m
respectively. The left side of bar (X = 0) is uniformly illuminated with a laser having
photon energy greater than band gap of the semiconductor. Excess electron-hole
pairs are generated only at x = 0 because of the laser. The steady state electron
density at x = 0 is 1014/cm3 due to laser illumination. Under these conditions, by
ignoring electric field, the closest approximation of the steady state electron
density at x = 2m is __________?
Q. An n-type silicon sample is uniformly illuminated with light which
generates 1020 electron hole pairs cm3 per second. The minority
carrier lifetime in the sample is 1 s. In the steady state, the hole
concentration in the sample is approximately 10x, where x is integer.
The value of x is _________.
Note: Examiner forget to mention that 10x/cm3
Q. At T = 300 K, the band gap and the intrinsic carrier concentration of GaAs are
1.42eV and 106cm3, respectively. In order to generate electron hole pairs in GaAs,
which one of the wavelength (c) ranges of incident radiation, is most suitable?
(Given that: Planck’s constant is 6.62 1034 j-s, velocity of light is 3 1010 cm/s
and charge of electron is 1.6 1019C)
(a) 0.42 m < c < 0.87 m
(b) 0.87 m < c < 1.42 m
(c) 1.42 m < c < 1.62 m
(d) 1.62 m < c < 6.62 m
Q. A thin P-type silicon sample is uniformly illuminated with light which
generates excess carriers. The recombination rate is directly
proportional to
(a) The minority carrier mobility
(b) The minority carrier recombination lifetime
(c) The majority carrier concentration
(d) The excess minority carrier concentration
Q. Under low level injection assumption, the injection minority carrier
current for an extrinsic semiconductor is essentially the
(a) Diffusion current
(b) Drift current
(c) Recombination current
(d) Induced current