Iso 12181-1-2011
Iso 12181-1-2011
Iso 12181-1-2011
STANDARD 12181-1
First edition
2011-04-01
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Reference number
ISO 12181-1:2011(E)
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Contents Page
Foreword ............................................................................................................................................................iv
Introduction.........................................................................................................................................................v
1 Scope ......................................................................................................................................................1
2 Normative references............................................................................................................................1
3 Terms and definitions ...........................................................................................................................1
3.1 General terms ........................................................................................................................................1
3.2 Terms relating to profiles .....................................................................................................................2
3.3 Terms relating to the reference circle .................................................................................................3
3.4 Terms relating to the circumference ...................................................................................................4
3.5 Terms relating to the filter function.....................................................................................................4
3.6 Terms relating to parameters...............................................................................................................5
Annex A (informative) Mathematical definition of roundness tolerances of nominal integral
features...................................................................................................................................................7
Annex B (informative) Synoptic tables of terms, abbreviated terms and parameters.................................9
Annex C (informative) Relationship to the GPS matrix model .....................................................................11
Bibliography......................................................................................................................................................13
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ISO 12181-1:2011(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
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adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 12181-1 was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product
specifications and verification.
This first edition of ISO 12181-1 cancels and replaces ISO/TS 12181-1:2003, which has been technically
revised.
ISO 12181 consists of the following parts, under the general title Geometrical product specifications (GPS) —
Roundness:
iv
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ISO 12181-1:2011(E)
Introduction
This part of ISO 12181 is a geometrical product specification (GPS) standard and is to be regarded as a
general GPS standard (see ISO/TR 14638). It influences chain link 2 of the chain of standards on form of a
surface (independent of a datum).
The ISO/GPS Masterplan given in ISO/TR 14638 gives an overview of the ISO/GPS system of which this
document is a part. The fundamental rules of ISO/GPS given in ISO 8015 apply to this document and the
default decision rules given in ISO 14253-1 apply to specifications made in accordance with this document,
unless otherwise indicated.
For more detailed information on the relationship of this part of ISO 12181 to other standards and the GPS
matrix model, see Annex C.
This part of ISO 12181 defines terms and concepts necessary for defining the specification operators
according to ISO 17450-2 for roundness of integral features.
Extracting data always involves applying a certain filtering process. An additional filtering of the extracted data
might or might not be applied. This additional filter can be a mean line filter (Gaussian, spline, wavelet, etc.) or
a non-linear filter (e.g. morphological filter). The type of filtering influences the actual specification operator
and, consequently, the actual definition of roundness. Therefore, the type of filtering needs to be stated
unambiguously.
This part of ISO 12181 is not intended to disallow any means of measuring roundness.
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1 Scope
This part of ISO 12181 defines the terms and concepts related to the roundness of individual integral features
and covers complete roundness profiles only.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO 14660-1:1999, Geometrical Product Specifications (GPS) — Geometrical features — Part 1: General
terms and definitions
ISO 14660-2:1999, Geometrical Product Specifications (GPS) — Geometrical features — Part 2: Extracted
median line of a cylinder and a cone, extracted median surface, local size of an extracted feature
ISO 17450-1:— 1 ), Geometrical product specifications (GPS) — General concepts — Part 1: Model for
geometrical specification and verification
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3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 14660-1, ISO 14660-2 and
ISO 17450-1 and the following apply.
3.1.1
roundness
property of a circle
3.1.2
roundness axis
axis of a feature associated to an integral feature
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3.1.3
roundness plane
plane perpendicular to the roundness axis within the full extent of the feature
3.2.1
extracted circumferential line
〈roundness〉 digital representation of the intersection of the real surface and the roundness plane
NOTE The extraction conventions for roundness are given in ISO 12181-2. This extracted circumferential line is an
extracted integral feature as defined in ISO 14660-1.
3.2.2
roundness profile
extracted circumferential line intentionally modified by a filter
NOTE This is the profile to which the concepts and parameters of this part of ISO 12181 can be applied.
3.2.3
local roundness deviation
minimum distance from a point on a roundness profile to the reference circle
NOTE 2 The deviation is negative if from the reference circle the point lies in the direction of the material.
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Key
1 reference circle
a Positive local deviation.
b Negative local deviation.
2
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Key
1 reference circle
a Negative local deviation.
b Positive local deviation.
3.3.1
reference circle
associated circle fitting the roundness profile in accordance with specified conventions, to which the deviations
from roundness and the roundness parameters are referred
3.3.1.1
minimum zone reference circles
two concentric circles enclosing the roundness profile and having the least radial separation
NOTE The abbreviated term MZ is used to refer to minimum zone reference elements.
3.3.1.1.1
outer minimum zone reference circle
outer circle of the minimum zone reference circles
3.3.1.1.2
inner minimum zone reference circle
inner circle of the minimum zone reference circles
3.3.1.1.3
mean minimum zone reference circle
arithmetic mean circle of the minimum zone reference circles
3.3.1.2
least squares reference circle
circle such that the sum of the squares of the local roundness deviations is a minimum
NOTE The abbreviated term LS is used to refer to least squares reference elements and the letter G (for Gaussian)
is used as a prefix for parameters based on least squares reference elements.
3.3.1.3
minimum circumscribed reference circle
smallest possible circle that can be fitted around the roundness profile
NOTE The abbreviated term MC is used to refer to minimum circumscribed reference elements.
3
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3.3.1.4
maximum inscribed reference circle
largest possible circle that can be fitted within the roundness profile
NOTE 1 Cases exist where the maximum inscribed reference circle is not unique.
NOTE 2 The abbreviated term MI is used to refer to maximum inscribed reference elements.
3.3.2
associated derived centre
centre of the reference circle(s)
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3.4.1
undulations per revolution
UPR
number of sinusoidal undulations contained in the roundness profile
3.4.2
circumferential wavelength
circumference of the reference circle divided by the UPR
3.5.1 General
NOTE 1 If not otherwise specified, the details of the filter characteristics are as given in ISO 12181-2.
NOTE 2 Only the phase correct mean line filter is defined (see ISO 11562). Consequently, the terms in this subclause
relate only to this type of filter. Other filter methods are currently being investigated by ISO. It is intended to incorporate
these new filters in a future edition of this part of ISO 12181.
3.5.2
wave filter
filter operating on a closed profile, transmitting a range of sinusoidal undulations for which the ratio of output
to input amplitude is defined, while attenuating (i.e. reducing) the ratio for undulations lying outside the range
at either or both ends
3.5.3
undulation cut-off
cut-off wavelength of the filter applied to the extracted circumferential line
NOTE These are usually defined in terms of undulations per revolution, UPR.
3.5.4
transmission band for roundness profiles
band of sinusoidal profile undulations which are transmitted by greater than a specified percentage by the filter,
defined by the values of the upper and lower undulation cut-off
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ISO 12181-1:2011(E)
3.6.1.1
peak-to-valley roundness deviation
value of the largest positive local roundness deviation added to the absolute value of the largest negative local
roundness deviation
NOTE 1 The peak-to-valley roundness deviation is defined for all reference circles.
NOTE 2 The peak-to-valley roundness deviation is the only parameter that is defined for minimum zone, maximum
inscribed and minimum circumscribed reference circles.
NOTE 3 The modifier GT is used in specifications to indicate that a form tolerance applies to the peak-to-valley
deviation relative to the least squares reference element.
3.6.1.2
peak-to-reference roundness deviation
value of the largest positive local roundness deviation from the least squares reference circle
NOTE 1 The peak-to-reference roundness deviation is only defined for least squares reference circles.
NOTE 2 The modifier GP is used in specifications to indicate that a form tolerance applies to the peak-to-reference
deviation relative to the least squares reference element.
3.6.1.3
reference-to-valley roundness deviation
absolute value of the largest negative local roundness deviation from the least squares reference circle
NOTE 1 The reference-to-valley roundness deviation is only defined for least squares reference circles.
NOTE 2 The modifier GV is used in specifications to indicate that a form tolerance applies to the reference-to-valley
deviation relative to the least squares reference element.
3.6.1.4
root-mean-square roundness deviation
ΔRrms
square root of the sum of the squares of the local roundness deviations from the least squares reference circle
NOTE 1 The root-mean-square roundness deviation is only defined for least squares reference circles.
NOTE 2 The modifier GQ is used in specifications to indicate that a form tolerance applies to the root-mean-square
deviation relative to the least squares reference element.
2π
1
∫ ΔR l
2
ΔRrms = dθ
2π
0
where
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3.6.2.1
dynamic content
〈Fourier transform〉 harmonic components (sinewaves) of which the extracted circumferential line is made up
NOTE 1 Dynamic content is expressed as an amplitude and a phase for each UPR number.
NOTE 2 The amplitude for one or more UPR numbers or the sum of the amplitudes of a number of UPR numbers can
be specified.
NOTE 3 The parameters defined in 3.6.1 can be specified, including only a specific range of UPR numbers.
NOTE 4 The dynamic content can be used for all reference circles.
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Annex A
(informative)
A roundness tolerance
G zone (see Figure A.1) for a given cross-section of a nominal integral feature consists of
a set of points, Pi , subject to the following conditions:
G G G
A j = L + c j Nˆ A coordinate system of arbitrary origin and Gorientation, points A j are on a line
(roundness axis) which is defined by a point, L, a direction, Nˆ , and a scalar distance
cj .
G G G G
( A′j − A j ) ⋅ Nˆ = 0 Point AG ′j is on a roundness plane that contains point A j and whose normal is Nˆ .
Point A′j is the centre of a reference circle.
G G G G
( Pi − A′j ) ⋅ Nˆ = 0 Points Pi are on a roundness plane that contains point A′j and whose normal is Nˆ .
G G G
r j1 u Pi − A′j u r j 2 Points Pi are further restricted to being between two G concentric circles (an annular
region) of radius, rj1 and rj 2, which are centred on A′j.
t = r j 2 − r j1 , r j 2 > r j1 For each roundness plane, the difference in radius between the concentric circles
equals the roundness tolerance, t.
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Figure A.1 — Roundness tolerance zone of a nominal integral feature
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Annex B
(informative)
The indications of form requirements are based on combinations of symbols and modifiers that uniquely
describe the specification operator in a brief form on a drawing. However, there is a need to be able to
describe specification and verification operators, e.g. in measurement reports and other technical
documentation where it is impractical to rely on drawing symbols. This annex provides textual equivalents for
the terms and parameters defined in ISO 12180-1, this part of ISO 12181, ISO 12780-1 and ISO 12781-1,
which are recommended for use in those situations.
Abbreviated
Term Defined in
term
LSCI Least squares reference circle ISO 12181-1:2011, 3.3.1.2
LSCY Least squares reference cylinder ISO 12180-1:2011, 3.3.1.2
LSLI Least squares reference line ISO 12780-1:2011, 3.3.1.2
LSPL Least squares reference plane ISO 12781-1:2011, 3.3.1.2
LCD Local cylindricity deviation ISO 12180-1:2011, 3.2.3
LFD Local flatness deviation ISO 12781-1:2011, 3.2.3
LRD Local roundness deviation ISO 12181-1:2011, 3.2.3
LSD Local straightness deviation ISO 12780-1:2011, 3.2.3
MICI Maximum inscribed reference circle ISO 12181-1:2011, 3.3.1.4
MICY Maximum inscribed reference cylinder ISO 12180-1:2011, 3.3.1.4
MCCI Minimum circumscribed reference circle ISO 12181-1:2011, 3.3.1.3
MCCY Minimum circumscribed reference cylinder ISO 12180-1:2011, 3.3.1.3
MZCI Minimum zone reference circles ISO 12181-1:2011, 3.3.1.1
MZCY Minimum zone reference cylinders ISO 12180-1:2011, 3.3.1.1
MZLI Minimum zone reference lines ISO 12780-1:2011, 3.3.1.1
MZPL Minimum zone reference planes ISO 12781-1:2011, 3.3.1.1
UPR Undulations per revolution ISO 12181-1:2011, 3.4.1
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Abbreviated
Parameter Defined in
term
CYLrr Cylinder radii peak-to-valley ISO 12180-1:2011, 3.5.2.7
CYLtt Cylinder taper (LSCY) ISO 12180-1:2011, 3.5.2.5
CYLat Cylinder taper angle ISO 12180-1:2011, 3.5.2.8
STRsg Generatrix straightness deviation ISO 12180-1:2011, 3.5.2.3
STRlc Local generatrix straightness deviation ISO 12180-1:2011, 3.5.2.2
CYLp Peak-to-reference cylindricity deviation (LSCY)a ISO 12180-1:2011, 3.5.1.2
FLTp Peak-to-reference flatness deviation (LSPL)a ISO 12781-1:2011, 3.4.2
RONp Peak-to-reference roundness deviation (LSCI)a ISO 12181-1:2011, 3.6.1.2
STRp Peak-to-reference straightness deviation (LSLI)a ISO 12780-1:2011, 3.5.2
CYLt Peak-to-valley cylindricity deviation (MZCY, LSCY, MICY, MCCY)a ISO 12180-1:2011, 3.5.1.1
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Annex C
(informative)
C.1 General
For full details about the GPS matrix model, see ISO/TR 14638.
The ISO/GPS Masterplan given in ISO/TR 14638 gives an overview of the ISO/GPS system of which this
document is a part. The fundamental rules of ISO/GPS given in ISO 8015 apply to this document and the
default decision rules given in ISO 14253-1 apply to specifications made in accordance with this document,
unless otherwise indicated.
C.2 Information about this part of ISO 12181 and its use
This part of ISO 12181 defines terms and concepts necessary for defining the specification operators
according to ISO 17450-2 for roundness of integral features.
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Bibliography
[1] ISO 1101, Geometrical Product Specifications (GPS) — Geometrical tolerancing — Tolerances of form,
orientation, location and run-out
[2] ISO 8015, Geometrical product specifications (GPS) — Fundamentals — Concepts, principles and
rules
[3] ISO 11562, Geometrical Product Specifications (GPS) — Surface texture: Profile method —
Metrological characteristics of phase correct filters
[4] ISO 12180-1:2011, Geometrical product specifications (GPS) — Cylindricity — Part 1: Vocabulary and
parameters of cylindrical form
[5] ISO 12181-2, Geometrical product specifications (GPS) — Roundness — Part 2: Specification
operators
[6] ISO 12780-1:2011, Geometrical product specifications (GPS) — Straightness — Part 1: Vocabulary and
parameters of straightness
[7] ISO 12781-1:2011, Geometrical product specifications (GPS) — Flatness — Part 1: Vocabulary and
parameters of flatness
[8] ISO 14253-1, Geometrical Product Specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 1: Decision rules for proving conformance or non-conformance with
specifications
[10] ISO 17450-2, Geometrical product specifications (GPS) — General concepts — Part 2: Basic tenets,
specifications, operators and uncertainties
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