MAX1452
MAX1452
MAX1452
Electrical Characteristics
(VDD = VDDF = +5V, VSS = 0V, TA = +25°C, unless otherwise noted.)
MAX1452 toc02
ODAC = 6250hex
OTCDAC = 0
FSODAC = 4000hex
2.5 2.5 FSOTCDAC = 8000hex
PGA INDEX = 0
IRO = 2
DNL (mV)
0 0
-2.5 -2.5
-5.0 -5.0
0 10k 20k 30k 40k 50k 60k 70k -50 -40 -30 -20 -10 0 10 20 30 40 50
DAC CODE INPUT VOLTAGE [INP - INM] (mV)
OUTPUT NOISE
MAX1452 toc03
OUT
10mV/div
400µs/div
C = 4.7µF, RLOAD = 1kΩ
Pin Description
PIN
NAME FUNCTION
SSOP/TSSOP TQFN-EP
1 1 ISRC Bridge Drive Current Mode Setting
High ESD and Scan Path Output Signal. May need a 0.1µF capacitor, in
2 2 OUT
noisy environments. OUT may be parallel connected to DIO.
3 3 VSS Negative Supply Voltage
4 4 INM Bridge Negative Input. Can be swapped to INP by configuration register.
5 5 BDR Bridge Drive
6 6 INP Bridge Positive Input. Can be swapped to INM by configuration register.
7 7 VDD Positive Supply Voltage. Connect a 0.1µF capacitor from VDD to VSS.
8, 9, 13, 16, 20, 22, No Connection. Not internally connected; leave unconnected (TQFN
— N.C.
23, 24 package only).
8 10 TEST Internally Connected. Connect to VSS.
Detailed Description The single pin, serial Digital Input-Output (DIO) communi-
The MAX1452 provides amplification, calibration, and cation architecture and the ability to timeshare its activity
temperature compensation to enable an overall perfor- with the sensor’s output signal enables output sensing
mance approaching the inherent repeatability of the sen- and calibration programming on a single line by paral-
sor. The fully analog signal-path introduces no quantiza- lel connecting OUT and DIO. The MAX1452 provides a
tion noise in the output signal while enabling digitally con- Secure-Lock feature that allows the customer to prevent
trolled trimming with the integrated 16-bit DACs. Offset modification of sensor coefficients and the 52-byte user
and span can be calibrated to within ±0.02% of span. definable EEPROM data after the sensor has been
calibrated. The Secure-Lock feature also provides a hard-
The MAX1452 architecture includes a programmable ware override to enable factory rework and recalibration
sensor excitation, a 16-step programmable-gain ampli- by assertion of logic high on the UNLOCK pin.
fier (PGA), a 768-byte (6144 bits) internal EEPROM,
four 16-bit DACs, an uncommitted op amp, and an on- The MAX1452 allows complete calibration and sensor
chip temperature sensor. The MAX1452 also provides a verification to be performed at a single test station. Once
unique temperature compensation strategy for offset TC calibration coefficients have been stored in the MAX1452,
and FSOTC that was developed to provide a remarkable the customer can choose to retest in order to verify per-
degree of flexibility while minimizing testing costs. formance as part of a regular QA audit or to generate final
test data on individual sensors.
The customer can select from one to 114 temperature
points to compensate their sensor. This allows the The MAX1452’s low current consumption and the integrat-
latitude to compensate a sensor with a simple first order ed uncommitted op amp enables a 4–20mA output signal
linear correction or match an unusual temperature curve. format in a sensor that is completely powered from a 2-wire
Programming up to 114 independent 16-bit EEPROM current loop. Frequency response can be user-adjusted
locations corrects performance in 1.5°C temperature to values lower than the 3.2kHz bandwidth by using the
increments over a range of -40°C to +125°C. For sensors uncommitted op amp and simple passive components.
that exhibit a characteristic temperature performance, The MAX1452 (Figure 1) provides an analog amplification
a select number of calibration points can be used with path for the sensor signal. It also uses an analog architec-
a number of preset values that define the temperature ture for first-order temperature correction. A digitally con-
curve. In cases where the sensor is at a different tempera- trolled analog path is then used for nonlinear temperature
ture than the MAX1452, the MAX1452 uses the sensor correction. Calibration and correction is achieved by vary-
bridge itself to provide additional temperature correction. ing the offset and gain of a programmable-gain-amplifier
(PGA) and by varying the sensor bridge excitation current
Offset Correction
VDD
Initial offset correction is accomplished at the input stage
of the signal gain amplifiers by a coarse offset setting.
VDD BIAS Final offset correction occurs through the use of a tem-
GENERATOR perature indexed lookup table with 176 16-bit entries.
IRO MAX1452
DAC CLK1M The on-chip temperature sensor provides a unique 16-bit
OSCILLATOR
TEST offset trim value from the table with an indexing resolu-
INP tion of approximately 1.5°C from -40°C to +125°C. Every
∑ PGA OUT millisecond, the on-chip temperature sensor provides
INM indexing into the offset lookup table in EEPROM and
the resulting value transferred to the offset DAC register.
CURRENT ANAMUX
ISRC
SOURCE The resulting voltage is fed into a summing junction at
the PGA output, compensating the sensor offset with a
BDR A=1 FSOTC
resolution of ±76μV (±0.0019% FSO). If the offset TC
16 BIT DAC - FSO (176) POINT
TEMP
DAC is set to zero then the maximum temperature error
16 BIT DAC - OFFSET (176)
SENSOR
16 BIT DAC - OFFSET TC
176
is equivalent to one degree of temperature drift of the
16 BIT DAC - FSO TC
8-BIT ADC TEMPERATURE sensor, given the Offset DAC has corrected the sensor
LOOK UP at every 1.5°C. The temperature indexing boundaries
POINTS FOR
VDDF INTERNAL OFFSET AND
are outside of the specified Absolute Maximum Ratings.
DIO EEPROM SPAN. The minimum indexing value is 00hex corresponding to
UNLOCK 6144 BITS
approximately -69°C. All temperatures below this value
416 BITS
output the coefficient value at index 00hex. The maximum
FOR USER VDD
BDR OP-AMP indexing value is AFhex, which is the highest lookup table
AMP+
AMPOUT entry. All temperatures higher than approximately 184°C
AMP-
output the highest lookup table index value. No indexing
VSS wraparound errors are produced.
FSO Correction
Figure 1. Functional Diagram
Two functional blocks control the FSO gain calibration.
or voltage. The PGA utilizes a switched capacitor CMOS First, a coarse gain is set by digitally selecting the gain
technology, with an input-referred offset trimming range of of the PGA. Second, FSO DAC sets the sensor bridge
more than ±150mV with an approximate 3μV resolution current or voltage with the digital input obtained from a
(16 bits). The PGA provides gain values from 39V/V to temperature-indexed reference to the FSO lookup table
234V/V in 16 steps. in EEPROM. FSO correction occurs through the use of a
The MAX1452 uses four 16-bit DACs with calibration temperature indexed lookup table with 176 16-bit entries.
coefficients stored by the user in an internal 768 x 8 The on-chip temperature sensor provides a unique FSO
EEPROM (6144 bits). This memory contains the following trim from the table with an indexing resolution approach-
information, as 16-bit wide words: ing one 16-bit value at every 1.5°C from -40°C to +125°C.
The temperature indexing boundaries are outside of the
● Configuration Register specified Absolute Maximum Ratings. The minimum
● Offset Calibration Coefficient Table indexing value is 00hex corresponding to approximately
● Offset Temperature Coefficient Register -69°C. All temperatures below this value output the coef-
ficient value at index 00hex. The maximum indexing
● FSO (Full-Span Output) Calibration Table value is AFhex, which is the highest lookup table entry.
● FSO Temperature Error Correction Coefficient Register All temperatures higher than approximately 184°C output
● 52 bytes (416 bits) uncommitted for customer pro- the highest lookup table index value. No indexing wrap-
gramming of manufacturing data (e.g., serial number around errors are produced.
and date)
Linear and Nonlinear For high-accuracy applications (errors less than 0.25%),
Temperature Compensation the first-order offset and FSO TC error should be com-
Writing 16-bit calibration coefficients into the offset TC pensated with the offset TC and FSOTC DACs, and the
and FSOTC registers compensates first-order tempera- residual higher order terms with the lookup table. The
ture errors. The piezoresistive sensor is powered by a offset and FSO compensation DACs provide unique
current source resulting in a temperature-dependent compensation values for approximately 1.5°C of tem-
bridge voltage due to the sensor’s temperature resistance perature change as the temperature indexes the address
coefficient (TCR). The reference inputs of the offset TC pointer through the coefficient lookup table. Changing the
DAC and FSOTC DAC are connected to the bridge volt- offset does not effect the FSO, however changing the
age. The DAC output voltages track the bridge voltage as FSO affects the offset due to nature of the bridge. The
it varies with temperature, and by varying the offset TC temperature is measured on both the MAX1452 die and
and FSOTC digital code a portion of the bridge voltage, at the bridge sensor. It is recommended to compensate
which is temperature dependent, is used to compensate the first-order temperature errors using the bridge sensor
the first-order temperature errors. temperature.
The internal feedback resistors (RISRC and RSTC) for Typical Ratiometric Operating Circuit
FSO temperature compensation are optimized to 75kΩ
Ratiometric output configuration provides an output that is
for silicon piezoresistive sensors. However, since the
proportional to the power supply voltage. This output can
required feedback resistor values are sensor dependent,
then be applied to a ratiometric ADC to produce a digital
external resistors may also be used. The internal resistors
value independent of supply voltage. Ratiometricity is an
selection bit in the configuration register selects between
important consideration for battery-operated instruments
internal and external feedback resistors.
and some industrial applications.
To calculate the required offset TC and FSOTC compen-
The MAX1452 provides a high-performance ratiometric
sation coefficients, two test-temperatures are needed.
output with a minimum number of external components
After taking at least two measurements at each tempera-
(Figure 2). These external components include the fol-
ture, calibration software (in a host computer) calculates
lowing:
the correction coefficients and writes them to the internal
EEPROM. ● One supply bypass capacitor.
With coefficients ranging from 0000hex to FFFFhex and a ● One optional output EMI suppression capacitor.
+5V reference, each DAC has a resolution of 76μV. Two ● Two optional resistors, RISRC and RSTC, for special
of the DACs (offset TC and FSOTC) utilize the sensor sensor bridge types.
bridge voltage as a reference. Since the sensor bridge
voltage is approximately set to +2.5V the FSOTC and
offset TC exhibit a step size of less than 38μV.
+5V VDD
7
VDD
5 9
BDR VDDF
6
INP OUT 2
OUT
MAX1452
16
FSOTC
SENSOR 4
INM RSTC
1
ISRC
0.1µF 0.1µF
TEST VSS RISRC
8 3
GND
G 2N4392
1
IN VPWR
S D
+12V TO +40V
MAX15006B
8
OUT
GND
7 30Ω 5
5 VDD
9
BDR VDDF
6
INP OUT 2
OUT
MAX1452
16
FSOTC
SENSOR 4
INM RSTC
1
ISRC
1.0µF 2.2µF 0.1µF 0.1µF
TEST VSS RISRC
8 3
GND
2N4392 VIN+
G D 100Ω +12V TO +40V
S
1
IN
Z1
MAX15006B
8
OUT
GND
7 5
30Ω
VDD
5 9
BDR VDDF
6 16
INP FSOTC
1.0µF
MAX1452 RSTC
1
ISRC 2.2µF 0.1µF
4
SENSOR INM
RISRC 4.99MΩ
499kΩ
2
OUT 0.1µF
13
AMPOUT 2N2222A
14 4.99kΩ
AMP-
15 0.1µF
AMP+
100kΩ 47Ω
VIN-
● Registers CONFIG, OTCDAC, and FSOTCDAC are page. Each page can be individually erased. The memory
refreshed from EEPROM. structure is arranged as shown in Table 1. The lookup
● Registers ODAC and FSODAC are refreshed from the tables for ODAC and FSODAC are also shown, with the
temperature indexed EEPROM locations. respective temp-index pointer. Note that the ODAC table
occupies a continuous segment, from address 000hex to
Calibration Operation, Registers Updated by Serial address 15Fhex, whereas the FSODAC table is divided
Communications in two parts, from 200hex to 2FFhex, and from 1A0hex to
● The MAX1452 has not had the Secure-Lock byte set 1FFhex. With the exception of the general-purpose user
(CL[7:0] = 00hex) or UNLOCK is high. bytes, all values are 16-bit wide words formed by two
● Power is applied to the device. adjacent byte locations (high byte and low byte).
● The power-on-reset functions have completed. The MAX1452 compensates for sensor offset, FSO, and
temperature errors by loading the internal calibration
● The registers can then be loaded from the serial digital
registers with the compensation values. These compen-
interface by use of serial commands. See the section
sation values can be loaded to registers directly through
on Serial Interface Command Format.
the serial digital interface during calibration or loaded
Internal EEPROM automatically from EEPROM at power-on. In this way the
The internal EEPROM is organized as a 768 by 8-bit device can be tested and configured during calibration
memory. It is divided into 12 pages, with 64 bytes per and test and the appropriate compensation values stored
in internal EEPROM. The device auto-loads the registers is stored as two 8-bit quantities. The configuration register,
from EEPROM and be ready for use without further con- FSOTCDAC and OTCDAC registers are loaded from the
figuration after each power-up. The EEPROM is config- pre-assigned locations in the EEPROM.
ured as an 8-bit wide array so each of the 16-bit registers
The ODAC and FSODAC are loaded from the EEPROM and the DIO pin to be configured by Secure-Lock or the
lookup tables using an index pointer that is a function of UNLOCK pin.
temperature. An ADC converts the integrated temperature
sensor output to an 8-bit value every 1ms. This digitized Reinitialization Sequence
value is then transferred into the temp-index register. The MAX1452 allows for relearning the baud rate. The
reinitialization sequence is one byte transmission of
The typical transfer function for the temp-index is as fol-
FFhex, as follows:
lows:
11111111011111111111111111
temp-index = 0.6879 Temperature (°C) + 44.0
When a serial reinitialization sequence is received, the
where temp-index is truncated to an 8-bit integer value.
receive logic resets itself to its power-up state and waits
Typical values for the temp-index register are given in
for the initialization sequence. The initialization sequence
Table 6.
must follow the reinitialization sequence in order to re-
Note that the EEPROM is byte wide and the registers that establish the baud rate.
are loaded from EEPROM are 16 bits wide. Thus each
index value points to two bytes in the EEPROM. Serial Interface Command Format
Maxim programs all EEPROM locations to FFhex with the All communication commands into the MAX1452 follow a
exception of the oscillator frequency setting and Secure- defined format utilizing an interface register set (IRS). The
Lock byte. OSC[2:0] is in the Configuration Register (Table IRS is an 8-bit command that contains both an interface
3). These bits should be maintained at the factory preset register set data (IRSD) nibble (4-bit) and an interface
values. Programming 00hex in the Secure-Lock byte register set address (IRSA) nibble (4-bit). All internal cali-
(CL[7:0] = 00hex), configures the DIO as an asynchronous bration registers and EEPROM locations are accessed for
serial input for calibration and test purposes. read and write through this interface register set. The IRS
byte command is structured as follows:
Communication Protocol IRS[7:0] = IRSD[3:0], IRSA[3:0]
The DIO serial interface is used for asynchronous serial
Where:
data communications between the MAX1452 and a host
calibration test system or computer. The MAX1452 auto- ● IRSA[3:0] is the 4-bit interface register set address
matically detects the baud rate of the host computer when and indicates which register receives the data nibble
the host transmits the initialization sequence. Baud rates IRSD[3:0].
between 4800bps and 38,400bps can be detected and ● IRSA[0] is the first bit on the serial interface after the
used regardless of the internal oscillator frequency setting. start bit.
Data format is always 1 start bit, 8 data bits, 1 stop bit and
● IRSD[3:0] is the 4-bit interface register set data.
no parity. Communications are only allowed when Secure-
Lock is disabled (i.e., CL[7:0] = 00hex) or the UNLOCK ● IRSD[0] is the fifth bit received on the serial interface
pin is held high. after the start bit.
The IRS address decoding is shown in Table 10.
Initialization Sequence
Sending the initialization sequence shown below enables Special Command Sequences
the MAX1452 to establish the baud rate that initializes the A special command register to internal logic (CRIL[3:0])
serial port. The initialization sequence is one byte trans- causes execution of special command sequences within
mission of 01hex, as follows: the MAX1452. These command sequences are listed as
1111111101000000011111111 CRIL command codes as shown in Table 11.
The first start bit 0 initiates the baud rate synchronization Write Examples
sequence. The 8 data bits 01hex (LSB first) follow this A 16-bit write to any of the internal calibration registers is
and then the stop bit, which is indicated above as a 1, performed as follows:
terminates the baud rate synchronization sequence. This
1) Write the 16 data bits to DHR[15:0] using four byte
initialization sequence on DIO should occur after a period
accesses into the interface register set.
of 1ms after stable power is applied to the device. This
allows time for the power-on-reset function to complete 2) Write the address of the target internal calibration reg-
ister to ICRA[3:0].
THREE-STATE THREE-STATE
NEED WEAK NEED WEAK
DRIVEN BY TESTER PULLUP DRIVEN BY MAX1452 PULLUP
STOP-BIT
START-BIT
LSB
MSB
STOP-BIT
MSB
Figure 5. DIO Output Data Format
3) Write the load internal calibration register (LdICR) com- Serial Digital Output
mand to CRIL[3:0]. When a RdIRS command is written to CRIL[3:0], DIO
When a LdICR command is issued to the CRIL register, is configured as a digital output and the contents of the
the calibration register loaded depends on the address in register designated by IRSP[3:0] are sent out as a byte
the internal calibration register address (ICRA). Table 12 framed by a start bit and a stop bit.
specifies which calibration register is decoded. Once the tester finishes sending the RdIRS command,
Erasing and Writing the EEPROM it must three-state its connection to DIO to allow the
MAX1452 to drive the DIO line. The MAX1452 three-
The internal EEPROM needs to be erased (bytes set
states DIO high for 1 byte time and then drive with the
to FFhex) prior to programming the desired contents.
start bit in the next bit period followed by the data byte and
Remember to save the 3 MSBs of byte 161 hex (high byte
stop bit. The sequence is shown in Figure 5.
of the configuration register) and restore it when program-
ming its contents to prevent modification of the trimmed The data returned on a RdIRS command depends on the
oscillator frequency. address in IRSP. Table 13 defines what is returned for the
various addresses.
The internal EEPROM can be entirely erased with the
ERASE command, or partially erased with the PageErase Multiplexed Analog Output
command (see Table 11, CRIL command). It is necessary When a RdAlg command is written to CRIL[3:0] the ana-
to wait 6ms after issuing the ERASE or PageErase com- log signal designated by ALOC[3:0] is asserted on the
mand. OUT pin. The duration of the analog signal is determined
After the EEPROM bytes have been erased (value of by ATIM[3:0] after which the pin reverts to three-state.
every byte = FFhex), the user can program its contents, While the analog signal is asserted in the OUT pin, DIO
following the procedure below: is simultaneously three-stated, enabling a parallel wiring
1) Write the 8 data bits to DHR[7:0] using two byte of DIO and OUT. When DIO and OUT are connected in
accesses into the interface register set. parallel, the host computer or calibration system must
three-state its connection to DIO after asserting the stop
2) Write the address of the target internal EEPROM loca- bit. Do not load the OUT line when reading internal
tion to IEEA[9:0] using three byte accesses into the signals, such as BDR, FSOTC...etc.
interface register set.
The analog output sequence with DIO and OUT is shown
3) Write the EEPROM write command (EEPW) to in Figure 6.
CRIL[3:0].
The duration of the analog signal is controlled by ATIM[3:0]
as given in Table 14.
DIO 11111 0 1 0 0 11 0 1 0 11 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 11
START-BIT
LSB
MSB
STOP-BIT
HIGH IMPEDANCE
OUT VALID OUT
The analog signal driven onto the OUT pin is determined ● Calibrate the output offset and FSO of the transducer
by the value in the ALOC register. The signals are speci- using the ODAC and FSODAC, respectively.
fied in Table 15. ● Store calibration data in the test computer or MAX1452
Test System Configuration EEPROM user memory.
The MAX1452 is designed to support an automated Set next test temperature:
production test system with integrated calibration and ● Calibrate offset and FSO using the ODAC and
temperature compensation. Figure 7 shows the imple- FSODAC, respectively.
mentation concept for a low-cost test system capable of
● Store calibration data in the test computer or MAX1452
testing many transducer modules connected in parallel.
EEPROM user memory.
The MAX1452 allows for a high degree of flexibility in
system calibration design. This is achieved by use of ● Calculate the correction coefficients.
single-wire digital communication and three-state output ● Download correction coefficients to EEPROM.
nodes. Depending upon specific calibration requirements ● Perform a final test.
one may connect all the OUTs in parallel or connect DIO
and OUT on each individual module. Sensor Calibration and
Compensation Example
Sensor Compensation Overview
The MAX1452 temperature compensation design corrects
Compensation requires an examination of the sensor per- both sensor and IC temperature errors. This enables the
formance over the operating pressure and temperature MAX1452 to provide temperature compensation approach-
range. Use a minimum of two test pressures (e.g., zero ing the inherent repeatability of the sensor. An example of
and full-span) and two temperatures. More test pressures the MAX1452’s capabilities is shown in Figure 8.
and temperatures result in greater accuracy. A typical
compensation procedure can be summarized as follows: A repeatable piezoresistive sensor with an initial offset of
16.4mV and a span of 55.8mV was converted into a com-
Set reference temperature (e.g., +25°C): pensated transducer (utilizing the piezoresistive sensor
● Initialize each transducer by loading their respective with the MAX1452) with an offset of 0.5000V and a span
registers with default coefficients (e.g., based on mean of 4.0000V. Nonlinear sensor offset and FSO temperature
values of offset, FSO and bridge resistance) to prevent errors, which were on the order of 20% to 30% FSO, were
overload of the MAX1452. reduced to under ±0.1% FSO. The following graphs show
● Set the initial bridge voltage (with the FSODAC) to the output of the uncompensated sensor and the output of
half of the supply voltage. Measure the bridge voltage the compensated transducer. Six temperature points were
using the BDR or OUT pins, or calculate based on used to obtain this result.
measurements.
DIO[1:N]
DIGITAL
MULTIPLEXER DIO1 DIO2 DION
MAX1452
MAX1452
MAX1452
DATA DATA
VOUT
DVM
TEST OVEN
ERROR (% FSO)
60
VOUT (mV)
10.0
40
0.0
6 -10.0
0 -20.0
0 20 40 60 80 100 -50 0 50 100 150
PRESSURE (kPs) TEMPERATURE (ºC)
COMPENSATED TRANSDUCER
COMPENSATED TRANSDUCER ERROR TA = +25ºC
0.15 5.0
FSO OFFSET
0.1 4.0
ERROR (% FSO)
0.05
VOUT (V)
3.0
0
-0.05 2.0
-0.1 1.0
-0.15 0
-50 0 50 100 150 0 20 40 60 80 100
TEMPERATURE (ºC) PRESSURE (kPs)
Table 2. Registers
REGISTER DESCRIPTION
CONFIG Configuration Register
ODAC Offset DAC Register
OTCDAC Offset Temperature Coefficient DAC Register
FSODAC Full Span Output DAC Register
FSOTCDAC Full Span Output Temperature Coefficient DAC Register
EEPROM
(LOOKUP PLUS CONFIGURATION DATA)
VDD
EEPROM ADDRESS USAGE
VDD 000H + 001H OFFSET DAC LOOKUP TABLE
(176 x 16-BITS)
:
16-BIT
FSO 15EH + 15FH
DAC 160H + 161H CONFIGURATION REGISTER SHADOW VDD
162H + 163H RESERVED
ISRC VSS
164H + 165H OFFSET TC REGISTER SHADOW VSS
166H + 167H RESERVED
168H + 169H FSOTC REGISTER SHADOW TEST
VDD
16AH + 16BH CONTROL LOCATION REGISTER
16-BIT
OFFSET 16CH + 16DH USER STORAGE (52 BYTES)
CLK1M
DAC :
RISRC RSTC
75kΩ 75kΩ 19EH + 19FH
VSS VDDF
1A0H + 1A1H FSO DAC LOOKUP TABLE
VSS : (176 x 16-BITS)
2FEH + 2FFH
VDD
8-BIT
BANDGAP LOOKUP
±1 TEMP ADDRESS
FSOTC 16-BIT
SENSOR ∑∆
BDR FSOTC UNLOCK
DAC DIGITAL
INTERFACE
VSS DIO
INP PHASE VSS FSOTC REGISTER
REVERSAL
MUX PGA BANDWIDTH
3kHz 10%
INM
Pin Configurations
FSOTC
TOP VIEW
AMP+
N.C.
N.C.
N.C.
N.C.
+ 24 23 22 21 20 19
ISRC 1 16 FSOTC
ISRC 1 18 AMP-
OUT 2 15 AMP+ +
VSS 3 14 AMP- OUT 2 17 AMPOUT
7 8 9 10 11 12
SSOP/TSSOP
VDD
N.C.
N.C.
TEST
VDDF
UNLOCK
TQFN
Revision History
REVISION REVISION PAGES
DESCRIPTION
NUMBER DATE CHANGED
Added TQFN and TSSOP package information, changed packages to lead free,
changed all occurrences of ASIC to MAX1452, changed VDDF RC filter values,
1–7, 9, 10, 12,
2 4/09 recommended a more suitable voltage reference for non-ratiometric application
18, 22, 24
circuits, corrected MAX1452 input range, and added typical EEPROM current
requirements to EC table, and added gain nonlinearity graph.
For pricing, delivery, and ordering information, please contact Maxim Direct at 1-888-629-4642, or visit Maxim Integrated’s website at www.maximintegrated.com.
Maxim Integrated cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim Integrated product. No circuit patent licenses
are implied. Maxim Integrated reserves the right to change the circuitry and specifications without notice at any time. The parametric values (min and max limits)
shown in the Electrical Characteristics table are guaranteed. Other parametric values quoted in this data sheet are provided for guidance.
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