General Purpose NPN Transistor Array Applications: FN483.6 Data Sheet December 15, 2011
General Purpose NPN Transistor Array Applications: FN483.6 Data Sheet December 15, 2011
Applications
Power Applications from DC to 120MHz General-Purpose Use in Signal Processing Systems Operating in the DC to 190MHz Range Temperature Compensated Amplifiers See Application Note, AN5296 Application of the CA3018 Integrated-Circuit Transistor Array for Suggested Applications
Pinout
CA3086 (PDIP, SOIC) TOP VIEW
1 2 3 4 5 6 7 Q3 Q2 Q4 Q5 Q1 14 13 SUBSTRATE 12 11 10 9 8
Ordering Information
PART NUMBER (BRAND) CA3086 CA3086M96 (3086) TEMP. RANGE (oC) -55 to 125 -55 to 125 PACKAGE 14 Ld PDIP 14 Ld SOIC Tape and Reel PKG. DWG. # E14.3 M14.15
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 321-724-7143 | Copyright Intersil Americas Inc. 2003, 2011. All Rights Reserved. Intersil (and design) is a registered trademark of Intersil Americas Inc. All other trademarks mentioned are the property of their respective owners.
CA-3086
Absolute Maximum Ratings
The following ratings apply for each transistor in the device: Collector-to-Emitter Voltage, VCEO . . . . . . . . . . . . . . . . . . . . .15V Collector-to-Base Voltage, VCBO . . . . . . . . . . . . . . . . . . . . . . .20V Collector-to-Substrate Voltage, VCIO (Note 1) . . . . . . . . . . . . .20V Emitter-to-Base Voltage, VEBO . . . . . . . . . . . . . . . . . . . . . . . . .5V Collector Current, IC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50mA
Thermal Information
Thermal Resistance (Typical, Note 2) JA (oC/W) JC (oC/W) PDIP Package . . . . . . . . . . . . . . . . . . . 110 N/A SOIC Package . . . . . . . . . . . . . . . . . . . 130 N/A Maximum Power Dissipation (Any one transistor) . . . . . . . . .300mW Maximum Junction Temperature (Plastic Package) . . . . . . . .150oC Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300oC (SOIC - Lead Tips Only)
Operating Conditions
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
CAUTION: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES: 1. The collector of each transistor in the CA3086 is isolated from the substrate by an integral diode. The substrate (Terminal 13) must be connected to the most negative point in the external circuit to maintain isolation between transistors and to provide for normal transistor action. To avoid undesirable coupling between transistors, the substrate (Terminal 13) should be maintained at either DC or signal (AC) ground. A suitable bypass capacitor can be used to establish a signal ground. 2. JA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
PARAMETER
TA = 25oC, For Equipment Design SYMBOL V(BR)CBO V(BR)CEO V(BR)ClO V(BR)EBO ICBO ICEO hFE TEST CONDITIONS lC = 10A, IE = 0 IC = 1mA, IB = 0 IC = 10A, ICI = 0 IE = 10A, IC = 0 VCB = 10V, IE = 0, VCE = 10V, IB = 0, VCE = 3V, IC = 1mA MIN 20 15 20 5 40 TYP 60 24 60 7 0.002 (Figure 2) 100 MAX 100 5 UNITS V V V V nA A
Collector-to-Base Breakdown Voltage Collector-to-Emitter Breakdown Voltage Collector-to-Substrate Breakdown Voltage Emitter-to-Base Breakdown Voltage Collector-Cutoff Current (Figure 1) Collector-Cutoff Current (Figure 2) DC Forward-Current Transfer Ratio (Figure 3)
Electrical Specifications
PARAMETER
TA = 25oC, Typical Values Intended Only for Design Guidance SYMBOL hFE VCE = 3V TEST CONDITIONS IC = 10mA IC = 10A VBE VCE = 3V IE = 1 mA IE = 10mA TYPICAL VALUES 100 54 0.715 0.800 -1.9 0.23 3.25 V V mV/oC V dB UNITS
VBE Temperature Coefficient (Figure 5) Collector-to-Emitter Saturation Voltage Noise Figure (Low Frequency)
CA-3086
Electrical Specifications
PARAMETER Low-Frequency, Small-Signal EquivalentCircuit Characteristics: Forward Current-Transfer Ratio (Figure 6) Short-Circuit Input Impedance (Figure 6) Open-Circuit Output Impedance (Figure 6) Open-Circuit Reverse-Voltage Transfer Ratio (Figure 6) Admittance Characteristics: Forward Transfer Admittance (Figure 7) Input Admittance (Figure 8) Output Admittance (Figure 9) Reverse Transfer Admittance (Figure 10) Gain-Bandwidth Product (Figure 11) Emitter-to-Base Capacitance Collector-to-Base Capacitance Collector-to-Substrate Capacitance yFE yIE yOE yRE fT CEBO CCBO CClO VCE = 3V, IC = 3mA VEB = 3V, IE = 0 VCB = 3V, IC = 0 VC l = 3V, IC = 0 hFE hIE hOE hRE f = 1MHz,VCE = 3V, lC = 1mA 31 - j1.5 0.3 + j0.04 0.001 + j0.03 See Figure 10 550 0.6 0.58 2.8 mS mS mS MHz pF pF pF TA = 25oC, Typical Values Intended Only for Design Guidance (Continued) SYMBOL TEST CONDITIONS f = 1kHz,VCE = 3V, IC = 1mA 100 3.5 15.6 1.8 X 10-4 k S TYPICAL VALUES UNITS
25
50
75
100
125
TEMPERATURE (oC)
25
50 75 TEMPERATURE (oC)
100
125
(Continued)
0.8 hFE BASE-TO-EMITTER VOLTAGE (V) VCE = 3V TA = 25oC
0.7
VBE
0.6
0.5
0.4 0.01
0.1
1.0
10
FIGURE 3. hFE vs IE
FIGURE 4. VBE vs IE
100
0.9 0.8 0.7 0.6 0.5 0.4 -75 -50 -25 0 25 50 75 100 125 TEMPERATURE (oC) IE = 3mA IE = 1mA IE = 0.5mA
10
AT 1mA
hOE
1.0
hFE
40 30 20 10 0 -10 -20
6 5 4 3
gFE
bIE
2 1 0 gIE
bFE
0.1
10 FREQUENCY (MHz)
100
0.1
10 FREQUENCY (MHz)
100
(Continued)
REVERSE TRANSFER CONDUCTANCE (gRE) AND SUSCEPTANCE (bRE) (mS) COMMON EMITTER CIRCUIT, BASE INPUT TA = 25oC, VCE = 3V, IC = 1mA gRE IS SMALL AT FREQUENCIES LESS THAN 500MHz bRE
bOE
gOE
10 FREQUENCY (MHz)
100
VCE = 3V GAIN BANDWIDTH PRODUCT (MHz) 1000 900 800 700 600 500 400 300 200 100 0 0 1
TA = 25oC
10
FIGURE 11. fT vs IC
MILLIMETERS MIN 0.39 2.93 0.356 1.15 0.204 18.66 0.13 7.62 6.10 MAX 5.33 4.95 0.558 1.77 0.355 19.68 8.25 7.11 NOTES 4 4 8 5 5 6 5 6 7 4 9 Rev. 0 12/93
MIN 0.015 0.115 0.014 0.045 0.008 0.735 0.005 0.300 0.240
eB
NOTES: 1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Symbols are defined in the MO Series Symbol List in Section 2.2 of Publication No. 95. 4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3. 5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm). 6. E and eA are measured with the leads constrained to be perpendicular to datum -C- . 7. eB and eC are measured at the lead tips with the leads unconstrained. eC must be zero or greater. 8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm). 9. N is the maximum number of terminal positions. 10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 1.14mm).
E1 e eA eB L N
2.93
MILLIMETERS MIN 1.35 0.10 0.33 0.19 8.55 3.80 MAX 1.75 0.25 0.51 0.25 8.75 4.00 NOTES 9 3 4 5 6 7 8o Rev. 0 12/93
A1 B C D E
e
B 0.25(0.010) M C A M B S
A1 0.10(0.004) C
e H h L N
NOTES: 1. Symbols are defined in the MO Series Symbol List in Section 2.2 of Publication Number 95. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension D does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. Dimension E does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. 6. L is the length of terminal for soldering to a substrate. 7. N is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width B, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch). 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact.
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