Testing MiCOM P543

Bias Characteristic

Ian Young

August 2006
 Current Differential Principle

End A End B

IF
IA IB
Relay A Relay B
Communication Link

IA + IB = 0 Healthy
IA + IB 0 (= IF) Fault

3 > Testing P543 August 2006 3

 Current Differential Characteristic

IA IB

k 2
Differential current as
bi
Idiff = g e
nta
IA + IB c e
Trip r
Pe
b ia s k1
en ta ge No trip
Perc
Is1
Is2
Bias Current
Ibias = (IA + IB )
4 > Testing P543 August 2006 4
 Test results from testing bias characteristic

Operating Characteristic Diagram

Idiff [In]

6.0

5.0

4.0

3.0

2.0

1.0

0.0
1.0 2.0 3.0 4.0 5.0 6.0
Ibias [In]

5 > Testing P543 August 2006 5

 Waveforms from injection

I/A

10

End A 0
-0.050 -0.040 -0.030 -0.020 -0.010 0.000 0.010
t/s

-10

IA IB IC IM

I/A

10

End B 0
-0.05 -0.04 -0.03 -0.02 -0.01 0.00 0.01
t/s

-10

IA IB IC IM

6 > Testing P543 August 2006 6

 Current Measurement and
Filtering - 1

i(t)
i2 i3

i1 i4
t

i5 i8
i6 i7

2 N-1
I=
N
n=1

i n exp j n t N No. of samples
= per cycle

7 > Testing P543 August 2006 7

 Current Measurement and
Filtering - 2

N-1

Is = 2 sinn t.in
N n=1

N-1
Ic = 2 io iN
N 2
+ +
2 n=1
cosn t.in

I = Is + j I c

8 > Testing P543 August 2006 8

 Current Measurement
by Fourier as fault is applied

i(t)

i8
i1 i2 i3 i4 i5 i6 i7 t

i(t)
i8
i7
i1 i2 i3 i4 i5 i6 t

9 > Testing P543 August 2006 9

 50Hz Fourier current measurement
for applied currents

Sample End A End B Bias Diff

1 0.86 0.1 0.48 0.76

2 2.41 0.75 1.58 1.66

3 3.52 1.16 2.34 2.36

4 3.72 1.24 2.48 2.48

5 4.27 1.39 2.83 2.88

6 5.97 1.93 3.95 4.04

7 7.27 2.41 4.84 4.86

8 7.5 2.5 5 5

10 > Testing P543 August 2006 10

 Locus of Fourier Measurement

11 > Testing P543 August 2006 11

 Current Differential Characteristic

IA IB

k 2
Differential current as
bi
Idiff = g e
CTntasaturation
IA + IB c e area
Trip r
Pe
b ia s k1
en ta ge No trip
Perc
Is1
Is2
Bias Current
Ibias = (IA + IB )
12 > Testing P543 August 2006 12
 Bias test currents

Bias test currents actually represent a fault

No saturation present

IA IB

7.5A 2.5A

5A

13 > Testing P543 August 2006 13

 Typical conditions for CT saturation

Large offset waveform

Dependant upon fault level and X/R ratio

IA IB

14 > Testing P543 August 2006 14

 Operation with saturated CTs
unsaturated end

i4 i5
i3 i6
i(t)
i2 i7

i1 i8
t

15 > Testing P543 August 2006 15

 Operation with saturated CTs
saturated end

i4 i5 i6 i7 i8
i(t)
i1
i2
t
i3

16 > Testing P543 August 2006 16

 50Hz Fourier current measurement
for applied currents

Sample End A End B Bias Diff

1 0.66 0.66 0.66 0

2 2.75 2.75 2.75 0

3 5.88 5.88 5.88 0

4 8.66 5.8828 7.27 4.5

5 9.85 5.8851 7.86 7.7

6 9.47 5.8864 7.67 8.76

7 9 5.8867 7.44 8.66

8 9 5.8867 7.44 8.66

17 > Testing P543 August 2006 17

 Locus of Fourier Measurement

18 > Testing P543 August 2006 18

 Testing options

Test with saturated CT currents

Difficult to setup and evaluate results
Ramp test
Good results
Careful with thermal limitations
Pulse test with prefault
Set prefault to Is2

19 > Testing P543 August 2006 19

 Waveforms from injection with prefault

I/A
10

End A 0
-0.11 -0.10 -0.09 -0.08 -0.07 -0.06 -0.05 -0.04 -0.03 -0.02 -0.01 -0.00 0.01
t/s

-10

I/A IA IB IC IM
10

0
-0.11 -0.10 -0.09 -0.08 -0.07 -0.06 -0.05 -0.04 -0.03 -0.02 -0.01 -0.00 0.01
t/s
End B
-10

IA IB IC IM

20 > Testing P543 August 2006 20

 Locus of Fourier Measurement
During relay trip

21 > Testing P543 August 2006 21

 Bias tests with prefault

Operating Characteristic Diagram

Idiff [In]

6.0

5.0

4.0

3.0

2.0

1.0

0.0
1.0 2.0 3.0 4.0 5.0 6.0
Ibias [In]

22 > Testing P543 August 2006 22