Atomic Force Microscopy (Afm)

SEMINAR
ON
ATOMIC FORCE
MICROSCOPY(AFM)
BY
Amulya Bihari Pattnaik
Roll no- 25617 Regd no- 0601105133
Metallurgical & Material Engg
CONTENTS
 INTRODUCTION.
 PRINCIPLE OF ATOMIC FORCE
MICROSCOPE(AFM).
 COMPONENTS OF AFM.
 INTERATOMIC FORCE VS DISTANCE CURVE.
 MODES OF AFM.
 ADVANTAGES OF AFM.
 APPLICATION OF AFM.
 CONCLUSION.
 REFERENCES.
INTRODUCTION
Atomic force microscopy(AFM) is a powerful tool allowing a
variety of surfaces to be imaged and characterized at atomic level. It
was invented by Gerd Binning and Heinrich Rohrer at IBM Zurich
in 1986 for which they were awarded nobel prize. AFM is the most
widely used subset of Scanning probe microscope(SPM ), which can
be used in ambient conditions with minimum sample preparation.
Atomic force microscope is able to measure three dimensional
topography information from the angstrom level to the micron
scale with unprecedented resolution. AFMs require neither a
vacuum environment nor any special sample preparation, and they
can be used in either in ambient and liquid environment. AFMs
have significantly impacted the field of material science, chemistry ,
biology, physics and the specialized field of semiconductors.
PRINCIPLE OF AFM
AFM is based on the principle that when a tip,
which is integrated at the end of a spring
cantilever, is brought with in the inter atomic
separations of a surface, inter atomic potentials
will be developed between the atoms of the tip
and the atoms of surface. As the tip travels
across the surface, the inter atomic potentials
will force the cantilever to deflect with the
contours of the surface. Therefore by
measuring the deflection of the cantilever, the
topographical features of the surface can be
mapped out.
Diagram showing operation principle of
AFM
COMPONENTS OF AFM
 Piezocrystals:
 Piezo crystals are ceramic materials that expand or contract in
the presence of voltage gradient.
 They develop an electrical potential in response to mechanical
pressure resulting in movement in x, y, z direction possible.
 Probe:
 It represents a micro machined cantilever with a sharp tip at
one end which is brought into interaction with the sample
surface.
 Each probe has different specifications and shape. V-shaped
cantilevers are more popular.
 100 to 200 μm in length (l), 10 to 40 μm in width (w), 0.3 to
2μm in thickness (t).
Contd...
 Position sensitive photo detector(PSPD):
 It detects the deflection of the cantilever beam
by the help of a laser beam focused at the back
side of the cantilever.
 Computers:
 High speed PC’s to drive the system and to
process, display and analyze the data
produced.
Set up of AFM
INTERATOMIC FORCE VS DISTANCE CURVE
Contd…
The force that is commonly associated with
atomic force microscopy is an inter atomic
force called the van der Waals force
 Two distance regimes are labeled in the force ~
distance curve
1. Contact regime.
2. Noncontact regime.
MODES OF AFM
There are three modes of AFM:
 Contact-Mode
 Non-Contact Mode
 Intermittent Contact Mode

Contd...
Contact Mode: (repulsive mode)
 Probe-surface separation(< 0.5nm).
 AFM tip makes soft physical contact with the
sample.
 The scanner gently traces the tip across the
sample(or the sample under the tip), the contact

force causes the cantilever to bend in order to
accommodate changes in topography.
 The slope of the vander waals curve is very
steep in the repulsive or contact regime.

Contd…
Advantages of contact AFM:
 High scan speeds.
 Atomic resolution is possible.
 Easier scanning of rough sample.
Disadvantages of contact AFM:

 At times forces can damage or deform soft
samples.
IMAGES GENERATED USING
CONTACT MODE AFM.
A 5NM SCAN ATOMIC SCALE IMAGE AN IMAGE OF BOVINE BONE
SHOWING SURFACE ATOMS ON FRESHLY
CLEAVED MICA OBTAINED IN THE WET CELL
Contd…
Non-Contact Mode:(attractive mode)
 Probe-surface separation 0.1-10nm.
 Here the AFM cantilever vibrated near the surface of a
sample.
 The force between the sample and tip is very low. This low
force is advantageous for studying soft or elastic samples.
Advantages:
 Low force is exerted on the sample surface and no damage
is caused to soft sample.
Disadvantages:
 Lower resolution
 Needs ultra high vacuum(UHV) to have best imaging.
Contd…
Intermittent – Contact Mode:
 Probe- surface separation 0.5-2nm.
 Imaging is similar to contact mode.
 Here the probe lightly “taps” on the sample surface
during scanning.
Advantages:
 Higher resolution.
 It is less likely to damage the sample than contact AFM
because it eliminates lateral forces(friction or drag)
between the tip and the sample.
Disadvantages:
 Scan speed is slower as compared to contact mode.
AFM IMAGES ACQUIRED IN THE
TAPPINGMODE.
A 2 MICRO METER SCAN OF NORMAL AND SICKLED
FIBRILLAR COLLAGEN. HUMAN RED BLOOD CELLS.
Atomic Force Microscope(AFM)
Advantages of AFM
 Highest resolution available: AFMs lateral resolution
allows imaging and measurements of features on the
order of a few nanometers.
 Quantitative 3-D surface maps: It can generate the 3-D
topography of a sample.
 Operation in liquid: AFMs can characterize contact
lenses in their native liquid environment.
 Non-destructive: Whether in air or in liquid, the AFM
characterizes the sample without damage.
 Material property characterization: The AFM combines
several techniques in single instrument and measures
various properties like surface topography, adhesion,
viscoelasticity, hardness, friction etc. with nanometer
resolution.
Applications of AFM
 Imaging of DNA.
 In manufacturing of contact lenses.
 In cosmetic research and product development
(structure and tribiological properties of
surface hair).
 Imaging of DNA-protein interactions.
 Imaging of bacteria in liquid media
immobilized on gelatin coated mica surfaces.
CONCLUSION
Typically, when we think of microscopes, we think of
optical or electron microscopes. Such microscopes create
a magnified image of an object by focusing
electromagnetic radiation, such as photons or electrons,
on its surface. Optical and electron microscopes can
easily generate two dimensional magnified images of an
object‘s surface, with a magnification as great as 1000X
for an optical microscope, and as large as 100,000X for an
electron microscope. With the AFM, it is possible to
image an object‘ s surface topography with extremely
high magnifications, up to 1,000,000X. Further, the
magnification of an AFM is made in three dimensions,
the horizontal X-Y plane and the vertical Z dimension.
REFERENCES
 G. Binning, C. F. Quate, Ch. Gerber. Atomic
force microscope. Phys. Rev. Lett. 56 (9), (1986)
930.
 Park Scientific Instruments. A practical guide
to scanning probe microscopy. (1997).
 N. Yao, Z. L. Wang. Handbook of Microscopy
for Nanotechnology.(2005).
 Veeco. Scanning Probe Microscopy Training
Notebook. Version 3.0.(2000).
 http://www.research.ibm.com.
THANK U

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SEMINAR

 Intermittent Contact Mode

 AFM tip makes soft physical contact with the

sample(or the sample under the tip), the contact

steep in the repulsive or contact regime.

 Atomic resolution is possible.

 Easier scanning of rough sample.

Disadvantages of contact AFM:

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