YOU’RE INVITED TO our newest tech event!
Join MMTC at our NEWEST Re:Making Michigan Innovation Expo focused on Accelerating Technology Adoption and Digital Transformation! This dynamic event, which brings together manufacturers, industry leaders, students, and technology providers, explores the transformative power of automation, robotics, AI, IoT, and smart manufacturing solutions and is designed to address next steps of how to successfully implement Industry 4.0 technologies in your manufacturing operations. Through hands-on tech demos, expert-led presentations, and stories directly from manufacturers, attendees will gain actionable insights on how to implement cutting-edge technologies to drive efficiency, reduce costs, and enhance product quality. Future-proof your operations and stay ahead in the digital era.
Agenda
Welcome
Chuck Werner, MMTC & Dean Louay Chamra, Oakland University
Opening Remarks
Congresswoman Haley Stevens
Leveraging AI for Competitive Advantage
Josh Johnston, MMTC
Keynote Presentation - Building a Strong Foundation: A Framework for AI and Data Strategy in Manufacturing
Pugal Janakiraman, Global Manufacturing CTO - Snowflake
Explore the fundamentals of creating an effective AI framework and data strategy tailored to the unique challenges and opportunities in manufacturing.
Lunch
Panel Discussion
Unlocking AI’s Potential in Manufacturing
Panel includes: Greta Cutulenco, CEO - Acerta; Pugal Janakiraman, Global CTO of Manufacturing – Snowflake; Kevin Kerwin, CEO - Detect-It & Dr. Guangzhi Qu, Professor and Chair of CSE - Oakland University
Better understand the value and misconceptions of AI in manufacturing. Discussions will cover the challenges manufacturers face in adopting AI, and how to build the necessary capabilities to leverage it effectively.
3D Printer Raffle
Technology Expo & Networking
LUNCH WILL BE PROVIDED. DON'T MISS THE CHANCE TO TAKE INDUSTRY 4.0 TECHNOLOGY HOME WITH YOU! All registered attendees will be entered into a raffle for a chance to win a 3D printer! This is a no-cost event.