Metrologi Industri

dan
Penjaminan Mutu

Oleh :
Berry Yuliandra, M.T.
Control Charts for Attributes
 For variables that are categorical
 Good/bad, yes/no,
acceptable/unacceptable
 Measurement is typically counting
defectives
 Charts may measure
 Percent defective (p-chart)
 Number of defects (c-chart)
2
Control Limits for p-Charts
Population will be a binomial distribution, but
applying the Central Limit Theorem allows us
to assume a normal distribution for the sample
statistics

UCLp = p + zsp^ p(1 - p)

sp^ = n
LCLp = p - zsp^
where p = mean fraction defective in the sample
z = number of standard deviations
sp^ = standard deviation of the sampling distribution
n = sample size 3
p-Chart for Data Entry
Sample Number Fraction Sample Number Fraction
Number of Errors Defective Number of Errors Defective
1 6 .06 11 6 .06
2 5 .05 12 1 .01
3 0 .00 13 8 .08
4 1 .01 14 7 .07
5 4 .04 15 5 .05
6 2 .02 16 4 .04
7 5 .05 17 11 .11
8 3 .03 18 3 .03
9 3 .03 19 0 .00
10 2 .02 20 4 .04
Total = 80
80 (.04)(1 - .04)
p= = .04
(100)(20) sp^ = = .02
100 4
p-Chart for Data Entry
UCLp = p + zsp^ = .04 + 3(.02) = .10
LCLp = p - zsp^ = .04 - 3(.02) = 0
.11 –
.10 – UCLp = 0.10
.09 –
Fraction defective

.08 –
.07 –
.06 –
.05 –
.04 – p = 0.04
.03 –
.02 –
.01 – LCLp = 0.00
| | | | | | | | | |
.00 –
2 4 6 8 10 12 14 16 18 20
5
Sample number
p-Chart for Data Entry
UCLp = p + zsp^ = .04 + 3(.02) = .10
Possible assignable
LCLp = p - zsp^ = .04 - 3(.02) =causes
0 present
.11 –
.10 – UCLp = 0.10
.09 –
Fraction defective

.08 –
.07 –
.06 –
.05 –
.04 – p = 0.04
.03 –
.02 –
.01 – LCLp = 0.00
| | | | | | | | | |
.00 –
2 4 6 8 10 12 14 16 18 20
6
Sample number
Control Limits for c-Charts
Population will be a Poisson distribution, but
applying the Central Limit Theorem allows us
to assume a normal distribution for the sample
statistics

UCLc = c + 3 c LCLc = c - 3 c

where c = mean number defective in the sample

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c-Chart for Cab Company
c = 54 complaints/9 days = 6 complaints/day

UCLc = c + 3 c 14 – UCLc = 13.35

=6+3 6

Number defective
12 –
= 13.35 10 –
8 –
6 – c= 6
LCLc = c - 3 c 4 –
=6-3 6 2 – LCLc = 0
=0 0 – | | | | | | | | |
1 2 3 4 5 6 7 8 9
Day
8
Managerial Issues and
Control Charts
Three major management decisions:

 Select points in the processes that

need SPC
 Determine the appropriate charting
technique
 Set clear policies and procedures

9
Which Control Chart to Use
Variables Data
 Using an x-chart and R-chart:
 Observations are variables
 Collect 20 - 25 samples of n = 4, or n = 5,
or more, each from a stable process and
compute the mean for the x-chart and
range for the R-chart
 Track samples of n observations each

10
Which Control Chart to Use
Attribute Data
 Using the p-chart:
 Observations are attributes that can be
categorized in two states
 We deal with fraction, proportion, or
percent defectives
 Have several samples, each with many
observations

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Which Control Chart to Use
Attribute Data
 Using a c-Chart:
 Observations are attributes whose
defects per unit of output can be counted
 The number counted is a small part of
the possible occurrences
 Defects such as number of blemishes on
a desk, number of typos in a page of
text, flaws in a bolt of cloth

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Patterns in Control Charts
Upper control limit

Target

Lower control limit

Normal behavior. Process is “in
control.”
Figure S6.7
13
Patterns in Control Charts
Upper control limit

Target

Lower control limit

One plot out above (or below).
Investigate for cause. Process is
“out of control.”
Figure S6.7
14
Patterns in Control Charts
Upper control limit

Target

Lower control limit

Trends in either direction, 5 plots.
Investigate for cause of
progressive change.
Figure S6.7
15
Patterns in Control Charts

Upper control limit

Target

Lower control limit

Two plots very near lower (or
upper) control. Investigate for
cause.
Figure S6.7
16
Patterns in Control Charts

Upper control limit

Target

Lower control limit

Run of 5 above (or below) central
line. Investigate for cause.
Figure S6.7
17
Patterns in Control Charts
Upper control limit

Target

Lower control limit

Erratic behavior. Investigate.

Figure S6.7
18
Process Capability
 The natural variation of a process should
be small enough to produce products that
meet the standards required
 A process in statistical control does not
necessarily meet the design specifications
 Process capability is a measure of the
relationship between the natural variation
of the process and the design
specifications

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Process Capability Ratio
Upper Specification - Lower Specification
Cp =
6s

 A capable process must have a Cp of at

least 1.0
 Does not look at how well the process is
centered in the specification range
 Often a target value of Cp = 1.33 is used
to allow for off-center processes
 Six Sigma quality requires a Cp = 2.0 20
Process Capability Ratio
Insurance claims process
Process mean x = 210.0 minutes
Process standard deviation s = .516 minutes
Design specification = 210 ± 3 minutes

Upper Specification - Lower Specification

Cp = 6s

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Process Capability Ratio
Insurance claims process
Process mean x = 210.0 minutes
Process standard deviation s = .516 minutes
Design specification = 210 ± 3 minutes

Upper Specification - Lower Specification

Cp = 6s

213 - 207
= 6(.516) = 1.938

22
Process Capability Ratio

Insurance claims process

Process mean x = 210.0 minutes
Process standard deviation s = .516 minutes
Design specification = 210 ± 3 minutes

Upper Specification - Lower Specification

Cp = 6s

213 - 207
= 6(.516) = 1.938 Process is
capable
23
 Process Capability Index

Upper Lower
Cpk = minimum of Specification
, -x x - Specification
Limit Limit
3s 3s

 A capable process must have a Cpk of at least

1.0
 A capable process is not necessarily in the
center of the specification, but it falls within the
specification limit at both extremes
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Process Capability Index
New Cutting Machine
New process mean x = .250 inches
Process standard deviation s = .0005 inches
Upper Specification Limit = .251 inches
Lower Specification Limit = .249 inches

25
Process Capability Index
New Cutting Machine
New process mean x = .250 inches
Process standard deviation s = .0005 inches
Upper Specification Limit = .251 inches
Lower Specification Limit = .249 inches

(.251) - .250
Cpk = minimum of ,
(3).0005

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Process Capability Index
New Cutting Machine
New process mean x = .250 inches
Process standard deviation s = .0005 inches
Upper Specification Limit = .251 inches
Lower Specification Limit = .249 inches

(.251) - .250 .250 - (.249)

Cpk = minimum of ,
(3).0005 (3).0005

Both calculations result in

New machine is
.001
Cpk = = 0.67 NOT capable
.0015
27
Interpreting Cpk

Cpk = negative number

Cpk = zero

Cpk = between 0 and 1

Cpk = 1

Cpk > 1
Figure S6.8
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