VLSI Design Unit 2
VLSI Design Unit 2
VLSI Design Unit 2
Logic symbol and truth table of the inverter. Voltage transfer characteristic (VTC) of the ideal inverter
The smaller input voltage value satisfying this condition is called the input low voltage VIL, and the
larger input voltage satisfying this condition is called the input high voltage VIH.
As the input voltage is further increased, the output voltage continues to drop and reaches a value
of VOL (output low voltage) when the input voltage is equal to VOH. The inverter threshold voltage
Vth, which is considered as the transition voltage, is defined as the point where Vin = Vout, on the
VTC. Thus, a total of five critical voltages, VOL, VOH, VIL,VIH, and Vth, characterize the DC input-output
voltage behavior of the inverter circuit.
With increasing input voltage, the drain current of the driver also
increases, and the output voltage VOUT, starts to drop. Eventually, for input
voltages larger than Vout+VT0, the driver transistor enters the linear
operation region. At larger input voltages, the transistor
remains in linear mode, as the output voltage continues to decrease.
When the input voltage Vin is low, i.e., smaller than the threshold voltage of the
driver MOSFET, the driver transistor is cut-off. Since the drain current of the driver
transistor is equal to the load current, IR= ID = 0. It follows that the output voltage of
the inverter under these conditions is:
Calculation of VOL
To calculate the output low voltage VOL, we assume that the input voltage is equal
to VOH i.e., Vin = VOH = VDD. Since Vin – VT0 > Vout in this case, the driver transistor
operates in the linear region. Also note that the load current IR is
Eq. 1
This equation yields a simple quadratic in VOL, which is solved to find the value of
the output low voltage
Eq. 3
Note that of the two possible solutions of Eq. 3, we must choose the one that is
physically correct, i.e., the value of the output low voltage must be between 0 and
VDD. The solution of Eq. 3 is given below. It can be seen that the product (knRL) is
one of the important design parameters that determine the value of VOL.
Eq. 4
Eq. 5
To satisfy the derivative condition, differentiate both side of Eq. 5 with respect to
Vin, which results in the following equation:
Eq. 6
Eq. 7
Solving Eq. 7 for VIL, we obtain
Eq. 8
The value of the output voltage when the input is equal to VIL can also be found by
substituting Eq.8 into Eq. 5, as follows:
Eq. 9
Eq. 10
Differentiating both sides of Eq. 10 with respect to Vin, we obtain
Eq. 11
Next, we can substitute dVout /dVin = - 1 into Eq. 11, since the slope of the VTC is equal
to (-1) also at Vin = VIH.
Eq. 13
Thus, we obtain two algebraic equations, Eq. 10 and Eq. 13, for two unknowns, VIH
and Vout, To determine the unknown variables, we substitute Eq. 13 into the current
equation given by Eq. 10 above.
Eq. 14
The positive solution of this second-order equation gives the output voltage Vout
when the input is equal to VIH.
Eq. 15
VLSI Design (EC-302) 15
Finally, VIH can be found by substituting Eq. 15 into Eq. 13, as follows.
Notice that the noise margin NML found here is quite low, and it may eventually lead to misinterpretation of
input signal levels. For better noise immunity, the noise margin for "low" signals should be at least about 25%
of the power supply voltage VDD , i.e., about 1.25 V.
VLSI Design (EC-302) 18
Inverters with n-Type MOSFET Load
Enhancement-Load nMOS Inverter
(a) Inverter circuit with saturated enhancement-type nMOS load. (b) Inverter with linear enhancement-type load.
“Both types of inverter circuits suffer from relatively high stand-by (DC) power
dissipation; hence, enhancement-load nMOS inverters are not used in any large-
scale digital applications.”
(a) Inverter circuit with depletion-type nMOS load. (b) Simplified equivalent circuit consisting of a nonlinear load resistor
and a nonideal switch controlled by the input.
VLSI Design (EC-302) 21
The immediate advantages of implementing this circuit configuration are:
(i) sharp VTC transition and better noise margins,
(ii) single power supply, and
(iii) smaller overall layout area.
(iv) reduced standby leakage current
The gate and the source nodes of the load transistor are connected, hence, VGS,load
= 0 always. Since the threshold voltage of the depletion type load is negative, the
condition VGS,Ioad > VT,load is satisfied, and the load device always has a conducting
channel regardless of the input and output voltage levels. Both the driver transistor
and the load transistor are built on the same p-type substrate, which is connected
to the ground. Consequently, the load device is subject to the substrate-bias effect,
so that its threshold voltage is a function of its source-to substrate voltage, VSB,load =
Vout.
Eq. 1
Eq. 2
For larger output voltage levels, i.e., for VOut > VDD + VT,load, the depletion-type load
transistor operates in the linear region. The load current in this case is
Eq. 3
Eq. 4
The only valid solution in the linear region is VOH = VDD.
Calculation of VOL
To calculate the output low voltage VOL, we assume that the input voltage Vin of the
inverter is equal to VOH = VDD. Note that in this case, the driver transistor operates
in the linear region while the depletion-type load is in saturation.
Eq. 5
The actual value of the output low voltage can be found by solving the two
equations 6 and 1 using numerical iterations. The iterative method converges
rapidly because the actual value of VOL is relatively small.
Calculation of VIL
By definition, the slope of the VTC is equal to (-1), i.e., dVout/dvin = -1 when the
input voltage is Vin, =VIL. Note that in this case, the driver transistor operates in
saturation while the load transistor operates in the linear region. Applying KCL for
the output node, we obtain the following current equation:
Eq. 7
Eq. 8
In general, we can assume that the term (dVT,Ioad/dVin) is negligible with respect to
the others. Substituting VIL for Vin, and letting dVout/dVin = -1, we obtain VIL as a
function of the output voltage Vout.
Eq. 9
To account for the substrate-bias effect on VT,LOad this equation must be solved
together with eq, 1 and eq. 9 using successive iterations.
Eq. 11
Now, substitute dVout/dVin = -1 in to Eq. 11, and solve for Vin = VIH.
Eq. 12
Eq. 13
The actual values of VIH and the corresponding output voltage Vout are determined
by solving Eq. 13 together with the current equation 10 and with the threshold
voltage expression 1, using numerical iterations. A relatively accurate first-order
estimate for VIH can be obtained by assuming that the output voltage in this case is
approximately equal to VOL.
(a) CMOS inverter circuit. (b) Simplified view of the CMOS inverter, consisting of two complementary nonideal switches.
Eq. a
Eq. b
The drain to source voltage of PMOS transistor is also equal to zero, and the output
voltage VOH is equal to the power supply voltage.
Eq. 2
When the input voltage exceeds (VDD + VT0,P), the pMOS transistor is turned off. In
this case, the nMOS transistor is operating in the linear region, but its drain to-
source voltage is equal to zero because condition Eq. 1 is satisfied. Consequently,
the output voltage of the circuit is
Eq. 3
Eq. 6
Using equations (a) and (b), this expression can be rewritten as
Eq. 7
To satisfy the derivative condition at VIL, we differentiate both sides of Eq. 7 with
respect to Vin.
Eq. 8
Eq. 9
The critical voltage VIL can now be found as a function of the output voltage Vout, as
follows:
Eq. 10
where kR is defined as
This equation must be solved together with the KCL eq. 7 to obtain the numerical
value of VIL and the corresponding output voltage, Vout.
Eq. 11
Using eq. (a) and (b), this expression can be rewritten as
Eq. 12
Now, differentiate both sides of Eq. 12 with respect to Vin.
Eq. 13
The critical voltage VIH can now be found as a function of Vout, as follows:
Eq. 15
Again, this equation must be solved simultaneously with the KCL equation 12 to obtain the
numerical values of VIH and Vout.
Calculation of Vth
The inverter threshold voltage is defined as Vth = Vin = Vout. For Vin = Vout, both transistors
are expected to be in saturation mode; hence, we can write the following KCL equation.
Eq. 16
Eq. 17
The correct solution for Vin for this equation is
Eq. 18
Eq. 19
Eq. 24
Note that the ratio kR is defined as
Eq. 25
assuming that the gate oxide thickness tox, and hence, the gate oxide capacitance
Cox have the same value for both nMOS and pMOS transistors. The unity-ratio
condition (Eq. 24) for the ideal symmetric inverter requires that
Hence,
Eq. 27
In (Eq. 26) for electron and hole mobilities are typical values, and that exact µn and
µp values will vary with surface doping concentration of the substrate and the tub.
Note that the sum of VIL and VIH is always equal to VDD in a symmetric inverter.
Eq. 30
The noise margins NML and NMH for this symmetric CMOS inverter are now
calculated
This means that correct inverter operation will be sustained if at least one of the
transistors remains in conduction, for any given input voltage.
• Csb,n and CSb,p have no effect on the transient behavior of the circuit since the
source-to-substrate voltages of both transistors are always equal to zero.
• The capacitances Cgs,n and Cgs,p are also not included because they are connected
between the input node and the ground (or the power supply).
Eq. 2
The average propagation delay tp of the inverter characterizes the average time
required for the input signal to propagate through the inverter.
Eq. 4
The rise time trise is defined here as the time required for the output voltage to rise
from the V10% level to V90% level.
The fall time tfall is defined here as the time required for the output voltage to drop
from the V90% level to V10% level. The voltage levels V10% and V90% are defined as
Eq. 5
Eq. 6
Thus, the output rise and fall times are found from Fig. as follows.
Eq. 7
Note that other delay definitions using 20% and 80% voltage levels have also been used.
VLSI Design (EC-302) 54
Calculation of Delay Times
Average Capacitance Current Method
estimating the average capacitance current during charge down and charge
up, respectively. If the capacitance current during an output transition is
approximated by a constant average current Iavg, the delay times are found as
Eq. 8
Eq. 9
the average current during high-to-low transition can be calculated by using
the current values at the beginning and the end of the transition.
Eq. 10
Eq. 15
Eq. 16
Eq. 18
The solution of (Eq. 14) in the time interval between t1' and t1 can be found as
Eq. 19
Eq. 20
Finally the propagation delay time for high to low output transition can be found by combining eq. 17 and 21
Eq. 22
For VOH = VDD and VOL = 0, as is the case for the CMOS inverter eq. 22 becomes
Eq. 23
Integrating this simple expression yields the time during which the nMOS transistor operates in saturation
Typical input and output voltage waveforms and the capacitor current waveform during switching of the CMOS inverter.
VLSI Design (EC-302) 69
Eq. 2
Eq. 3
Eq. 4
Noting that f=1/T, this expression can also be written as
Eq. 5
The direct-path power dissipation is proportional to the switching activity, similar to the capacitive
power dissipation. tsc represents the time both devices are conducting.
I is determined by the saturation current of the devices and is hence directly proportional to the
peak
sizes of the transistors. The peak current is also a strong function of the ratio between input and
output slopes.
The total power consumption of the CMOS inverter is now expressed as the sum of its three components:
In typical CMOS circuits, the capacitive dissipation is by far the dominant factor. The direct-path consumption
can be kept within bounds by careful design, and should hence not be an issue. Leakage is ignorable at present,
but this might change in the not too distant future.
where P*av is the average switching power dissipation at the maximum operating frequency and Tp is the
average propagation delay,
The PDP presents a measure of energy, as is apparent from the units (Wsec = Joule). Assuming that the gate is
switched at its maximum possible rate of fmax = 1/(2tp), and ignoring the contributions of the static and direct-
path currents to the power consumption, we find
The PDP stands for the average energy consumed per switching event (this is, for a 0→1, or a 1→0
transition). Remember that earlier we had defined Eav as the average energy per switching cycle (or per energy-
consuming event). As each inverter cycle contains a 0→1, and a 1→0 transition, Eav hence is twice the PDP .
Energy-Delay Product
A more relevant metric should combine a measure of performance and energy. The energy-delay product (EDP)
does exactly that
Eq. 1
Eq. 3
The optimum supply voltage can be obtained by taking the derivative of Eq. 3 with respect to VDD, and equating
the result to 0.
Eq. 4