Scribd
Upload
26 views2 pages

SPC Notes and Formulas

Statistical Process Control (SPC) is a statistical method used to monitor and improve process quality by identifying variations. It includes control charts for different types of data, such as X and R charts for small samples, and p-charts for defective proportions. Process capability indices like Cp and Cpk are also calculated to assess process performance against specifications.

Uploaded by

psychic_jason0071319
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
26 views2 pages

SPC Notes and Formulas

Statistical Process Control (SPC) is a statistical method used to monitor and improve process quality by identifying variations. It includes control charts for different types of data, such as X and R charts for small samples, and p-charts for defective proportions. Process capability indices like Cp and Cpk are also calculated to assess process performance against specifications.

Uploaded by

psychic_jason0071319
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 2

Statistical Process Control (SPC) Notes & Formulas

1. Definition

Statistical Process Control (SPC) is a method of monitoring, controlling, and improving a process through statistical

analysis. It detects variations to maintain consistent quality.

2. Types of Variation

- Common Cause Variation: Natural, inherent in the process.

- Special Cause Variation: Due to identifiable external factors.

3. Control Charts

Control charts monitor process behavior over time with:

- Center Line (CL): Process average

- UCL: Upper Control Limit

- LCL: Lower Control Limit

4. X and R Chart (for small sample sizes 10)

X Chart:

CL = X (avg. of sample means)

UCL = X + A2 R

LCL = X - A2 R

R Chart:

CL = R (avg. of ranges)

UCL = D4 R

LCL = D3 R

5. X and S Chart (for sample size > 10)

S Chart:

CL = S

UCL = B4 S

LCL = B3 S
Statistical Process Control (SPC) Notes & Formulas

X Chart:

UCL = X + A3 S

LCL = X - A3 S

6. p-Chart (Proportion Defective)

CL = p = (p_i) / k

UCL = p + 3[p(1 - p)/n]

LCL = p - 3[p(1 - p)/n]

7. np-Chart (Number Defective)

CL = np = n p

UCL = np + 3[np(1 - p)]

LCL = np - 3[np(1 - p)]

8. c-Chart (Count of Defects)

CL = c

UCL = c + 3c

LCL = c - 3c

9. u-Chart (Defects per Unit)

CL = u = c_i / n_i

UCL = u + 3(u / n)

LCL = u - 3(u / n)

10. Process Capability Indices

Cp = (USL - LSL) / (6)

Cpk = min[(USL - ) / (3), ( - LSL) / (3)]

You might also like

pFad - Phonifier reborn

Pfad - The Proxy pFad of © 2024 Garber Painting. All rights reserved.

Note: This service is not intended for secure transactions such as banking, social media, email, or purchasing. Use at your own risk. We assume no liability whatsoever for broken pages.


Alternative Proxies:

Alternative Proxy

pFad Proxy

pFad v3 Proxy

pFad v4 Proxy