Fundamental of Electronics (9051)

Experiment No. 6

EXPERIMENT No.6
1.0 Title :
To test electronic components like capacitor, Inductor, diode, zener diode, Light emitting diode, Bipolar junction transistor, scr, diac, triac using analog and digital multimeter.

2.0

Prior concept:
Capacitor : Capacitor is the electronic component, which has the ability to store electric Charge. It consists of two metal plates separated by insulating material such as mica, ceramic, paper, glass, backellite etc. Inductor : An Inductor is a single winding of conducting wire on a isulating or magnetic core such as air, iron, ferrite etc. Inductance is the property of electronic circuit which opposes changes in current through it. Changes in the current flowing through inductor produces changes in the magnetic field which induces m.f. in the coil. PN junction diode : When a P type semiconductor is suitably joined to N type semiconductor, the contact surface is called PN junction. Most of the Semiconductor devices contains one or more PN junctions. Zener diode : A properly doped crystal diode which has sharp break down voltage is known as zener diode. Silicon Control Rectifier (SCR) : It is four layer, 3 terminal PNPN semiconductor device. The three terminals are Anode (A), Cathode (K), and Gate (G). The extreme P-layer forms the anode while the extreme n layer forms cathode. The P layer next to cathode acts as gate. SCR is also known as thyristor. DIAC : It is PNPN structured four layer, two terminal semiconductor device. MT1 and MT2 are the two main terminals of device. There is no control terminal in this device. The doping level at the two ends of the device is same, which leads to identical VI characteristics in both 1st and 3rd quadrant. It is a bi-directional device. TRIAC: It is a gate controlled semiconductor device. It has three terminals MT1, MT2 Gate. It is four layer, bi-directional semiconductor device. and the

3.0

New concepts:
Proposition 1: Method to find out value of capacitor When the capacitor value is indicated by one or higher value, then its unit will be always picofarad. When ceramic capacitor value is printed in 3 digits then 3rd digit shows the equal number of zeroes E.g. 101 = 100 pf 102 =1000 pf When capacitor value begins with decimal point then its unit will be always microfarad (f).

Maharashtra State Board of Technical Education

- 36 -

Fundamental of Electronics (9051)

Experiment No. 6

Proposition 2: Analog Multimeter connections for testing In Analog Multimeter the positive terminal of the internal battery is connected to the common (-ve) and negative terminal of this internal battery is connected to 10 K , 1M , volt, amp ranges etc. Hence for diode and transistor testing, always insert red probe in common (-ve) to get positive volt and insert black to 10k or 1M of internal battery. Proposition 3: Digital Mulitmeter connections for testing In this multimeter separate diode test range is provided. For this insert black probe in common negative (-ve) and red probe in a given range. Proposition 4: To test Non-Electrolytic (Non Polar) Capacitor

Capacitor is connected by two Probes of multimeter and 1 M resistance range of analog multimeter or very high resistance range of digital multimeter If there is no deflection then capacitor is ok. If finite (some) resistance is detected then capacitor is leaky /faulty. If 0 reading is detected then capacitor is short / faulty. To test Electrolytic Capacitor

Capacitor is connected by two probes of multimeter and 1M resistance range of analog multimeter or very high resistance range of digital multimeter. If there is full (fast) action from to 0, It remains on 0 line for maximum 20 sec and then it starts discharging slowly towards . Hence the capacitor is ok. If there is slow action from to 0 then it shows capacitor is old or dry or faulty. If there is no deflection then it shows capacitor is open / defective. Proposition 5: Multimeter probes are connected to terminals of Inductor and 10k range is selected. If the meter shows low resistance then inductor is OK otherwise faulty.

Maharashtra State Board of Technical Education

- 37 -

Fundamental of Electronics (9051)

Experiment No. 6

Proposition 6 : Diode Testing

PN junction diode and Zener diode. One 1 M range of analog multimeter or diode range in digital multimeter is selected. The polarities are connected as shown in table 1 and result is verified. Reading A+ KLow Resistance Low Resistance O A- K+ High resistance low Resistance O Remark Diode OK Defective Short Open

Table 1

Light Emitting diode

The 1 M range of analog multimeter or diode range in digital multimeter is selected. The polarities are connected as shown in table 2 and result is verified. Reading A+ KLow Resistance Low Resistance O A K+ High resistance low Resistance O LED OK (LED IS ON) Defective Short Open
Table 2

Remark

Maharashtra State Board of Technical Education

- 38 -

Fundamental of Electronics (9051)

Experiment No. 6

Proposition 7 : Transistor Testing

NPN Test : If red probe (+) is fixed at base and black probe (-) is first connected to emitter and then to collector and multimeter shows low resistance then the transistor is NPN. PNP test :If black (-) probe is fixed at the base and Red (+) probe is first connected to emitter, then to collector and multimeter shows low resistance then the transistor is PNP. Transistor OK Test For Mulimeter M1, if base is (+), emitter (-) then meter shows low resistance and if base is (-), emitter is (+) then meter shows high resistance. Similarly for Multimeter M2, if base is (+), collector (-) then meter shows low resistance and if base is (-), collector is (+) then meter shows high resistance. If M1 and M2 shows low resistance and high resistance respectively then transistor is OK otherwise it is faulty. Proposition 8 : Testing of SCR

Use the Analog multimeter in 1 M range and digital multimeter in Diode range. For Mulimeter M1, if A + K - then it shows high resistance and if A- K+ it also shows high resistance. For Multimeter M2, if G + K- then it shows low resistance and if G- K+ it shows high resistance. So if M1 shows high resistance in both cases and M2 shows low resistance and high resistance respectively then SCR is ok otherwise faulty. Proposition 9: Testing of DIAC

Use the Analog multimeter in 1 M range and digital multimeter in diode range. Connect the meter to diac such that MT1+ MT2- then it also shows high resistance. If MT2+ MT1- , it also shows high resistance so diac is ok otherwise faulty.

Maharashtra State Board of Technical Education

- 39 -

Fundamental of Electronics (9051)

Experiment No. 6

Proposition 10: Testing of TRIAC

Connect the Multimeter M1 to triac such that MT1+ MT2- then it shows high resistance and if MT2+ MT1- then it also shows high resistance. Connect the Multimeter M2 to triac such that G+ MT1- then its shows low resistance and if MT1+ Gthen it shows low resistance. Hence if M1 shows high resistance, in both cases and M2 shows low resistance in both cases then Triac is ok otherwise faulty.

4.0

Learning Objectives
Intellectual skills : To identify and discriminate the components on the basis of types and ranges. To identify the different terminals of components and their polarities.

Motor Skill : Ability to draw the symbols for different electronic components. Ability to list the components according to their ratings, specifications, referring data manual. Ability to measure the values of components according to printed value, by numerals, by characters. Ability to choose correct polarity probe of the multimeter while testing components.

5.0

Equipment :
Analog Multimeter, Digital Multimeter Zener Diode, LED, BJT, Capacitor, Inductor, DIAC, TRIAC, SCR.

6.0

Diagram

Maharashtra State Board of Technical Education

- 40 -

Fundamental of Electronics (9051)

Experiment No. 6

7.0

Stepwise procedure :
To test capacitor 1. Connect two probes of multimeter to the two terminals of capacitor 2. Select 1 M range of Analog multimeter or very high resistance range of digital multimeter. 3. Observe the deflection of niddle of Analog multimeter or reading of digital multimeter. To test Inductor 1. Connect two probes of multimeter to two terminals of inductor 2. Select 10 k range 3. Observe deflection / reading. To test PN Junction diode, Zener diode, LED 1. Connect two probes of multimeter to two terminals of diode. 2. Select 1 M range of multimeter. 3. Observe deflection / reading and verify the table 1 for PN junction and Zener diode and table 2 for LED. Transistor Testing : Testing for type (NPN/PNP) 1. Connect red probe (+) at base and black probe (-) first to collector and then to emitter respectively then observe deflection / reading and verify. 2 Now connect black probe (-) at base and red probe (+) at collector and then emitter respectively and observe deflection / reading and verify. Transistor OK Test : 1. Connect Red probe (+) to base and black probe (-) to emitter and observe the deflection / reading. 2. Interchange the probe and again observe the deflection/ reading. 3. Now connect Red probe (+) to base and black probe (-) to collector and observe deflection/ reading. 4. Interchange the connection and observe deflection / reading. To test SCR 1. Select 1 M range of multimeter 2. Connect probe (+) to Anode and probe (-) to cathode and observe the resistance. 3. Interchange the probes and observe the resistance. 4. Now connect probe (+) to gate and probe (-) to cathode and observe resistance. 5. Interchange the probe and observe the resistance (refer diagram) 6. Verify the observations as per proposition 1. To Test DIAC 1. Select 1 M range of multimeter. 2. Connect probe (+) of multimeter to MT1 and probe (-) to MT2 and observe resistance. 3. Now interchange connections and observe resistance. 4. Verify the observations as per proposition 2.

Maharashtra State Board of Technical Education

- 41 -

Fundamental of Electronics (9051)

Experiment No. 6

To Test TRIAC 1. Select 1 M range of multimeter. 2. Connect probe (+) to MT1 and probe (-) to MT2 and observe resistance. 3. Interchange the connections and observe resistance. 4. Now connect probe (+) to Gate and probe (-) to MT1 and observe resistance. 5. Interchange connections and observe resistance. 6. Verify the observations as per proposition 3.

8.0 Conclusion
1. When multimeter shows low resistance then inductor is . ( ok, faulty, open) 2. When anode is given positive voltage and cathode is given negative voltage of multimeter the Light emitting diode emittes / not emittes light. 3. If M1 and M2 shows low resistance and high resistance then transistor is OK/ faulty. 4. SCR is ok, if meter shows ..(high/low) resistance for A+ K- and A- K+ and shows ..(high/low) resistance for G+ K- and .(high/low ) resistance for G- K+ . 5. If meter shows high resistance when it is connected such that MT1+ MT2- and MT1- MT2+ then Diac is ( ok / faulty) 6. If meter M1 show ...(high/low ) resistance when connected as MT1+ MT2- and MT1- MT2+ and meter M2 shows.(high/low ) resistance when connected as G+ MT1- and GMT1+ then Triac is ok. Student to write the conclusion on the basis of deflection in multimeter to test electrolytic and non electrolytic capacitor under the guidance of teacher.

9.0 Questions :
Write answers to Q ----- Q ---- Q ---- Q -- Q -- (The question numbers to be alloted by teacher) 1. If zero ohm is not adjusted on shorting the two terminals of multimeter, what does it indicate. 2. State the dielectric materials that are used between the plates of capacitor. 3. How to differentiate dielectric and insulating materials. 4. Define the term leakage inductance. 5. Draw the symbol for iron core, ferrite core and air core inductor. 6. State the care that shall be taken while checking Diode or transistor with analog multimeter. 7. list any three applications of zener diode. 8. Describe the method of testing light emitting diode. 9. 1N 4148 a. In the above printed value of diode, what is the significance of first digit 1. 10. Find the value of the following capacitors.

11. i)

102

ii) 3K3

iii) .1

12. SCR is always turned ON by gate current. Explain why ?

Fundamental of Electronics (9051)

Experiment No. 6

13. Write four differences between PN junction diode and SCR with respect to construction, symbol, working and application. 14. Why SCR can not be used as bi-directional device? Give reason. 15. Describe the method for testing of DIAC. 16. List any two applications of DIAC. 17. What are the different operating modes of triac? 18. Draw the symbol of DIAC, TRIAC and SCR. 19. Normal way to turn on DIAC is by . a. Gate current b. Gate voltage c. Break over voltage 20. Why is DIAC used to trigger TRIAC?
(Space for answer)

Maharashtra State Board of Technical Education

- 43 -

Fundamental of Electronics (9051)

Experiment No. 6

.. Signature of teacher
Maharashtra State Board of Technical Education - 44 -