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X-Ray Diffractometer

The document discusses an x-ray diffractometer, including its working principle based on Bragg's law, components like the x-ray tube and detector, advantages like rapid analysis and non-destructive testing, limitations such as only being able to analyze crystalline materials, and applications like determining crystalline structure and identifying phases.

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10 views17 pages

X-Ray Diffractometer

The document discusses an x-ray diffractometer, including its working principle based on Bragg's law, components like the x-ray tube and detector, advantages like rapid analysis and non-destructive testing, limitations such as only being able to analyze crystalline materials, and applications like determining crystalline structure and identifying phases.

Uploaded by

ananyo sabuj
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PPTX, PDF, TXT or read online on Scribd
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X-RAY

DIFFRACTOMETER
A JOURNEY TO LEARN THE
CRYSTALLOGRAPHIC VIEW OF MATERIALS

Presented by
2008051
2008052
2008053
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INTRODUCTION
Definition: X-Ray Diffractometer is a high-precision non-destructive analytical
instrument which is used to analyze physical properties such as phase composition,
crystal structure and orientation of powder, solid and liquid samples.

X-ray is a high energy electromagnetic radiation.

In 1895, Wilhelm Rontgen (accidentally) discover an image cast from his cathode ray
generator, projected far beyond the possible range of the cathode rays.
INTRODUCTION
In 1912, Max Von Laue, showed that if a beam of X-rays passed
through a crystal, diffraction would take place and a pattern would be
formed on a photographic plate placed at a right angle to the direction
of the rays.

X-ray diffractometer is used to determine the positions of atoms in a


crystal with an accuracy in the order of 10-4 nm. Again, quantitative
phase analysis is done by x-ray diffractometer.

Generally, the working principle of x-ray diffractiometer is based on


Bragg’s law.
WORKING PRINCIPLE
Working Principle

X-rays are a type of electromagnetic radiation, when a monochromatic x-


ray scatters from a substance with a structure on this scale, it causes
interferences. This interference creates a pattern of lower and higher
intensities due to constructive and destructive interference (Bragg’s law).
Working Principle
IF THERE IS A CRYSTALLINE
SUBSTANCE THEN A THREE-
DIMENSIONAL PATTERN IS
CREATED LIKE THE SPACINGS OF
PLANES IN THE CRYSTAL LATTICE,
THIS PROCESS IS CALLED
CONSTRUCTIVE INTERFERENCE.
BY COLLECTING ALL THE
DIFFRACTED X-RAYS ONE CAN
ANALYZE THE SAMPLES’
STRUCTURE. THE WAY THE X-RAY
REVEALS THE ATOMIC
STRUCTURE OF THE CRYSTALS IS
Working Principle

We have fixed wavelength


of incident X-RAY. Using
the Bragg’s law, by
changing the value of
incident angle
we can calculate the value
of inter-planar distance(d).
Hence we can also
determine the other
properties of the sample.
COMPONENTS
COMPONENTS
1.X-ray tube: It is the source from which the X-ray is
emitted and it consists of a cathode ray tube with a heating
tungsten filament. This produces the electrons which
accelerate on to the sample surface by applying a voltage.
The bombardment of the electrons on the samples is
controlled by the filaments which affect the X-ray output
intensity.

2.Sample holder: it is the basement on which the sample to


be characterized is placed and it can be rotated in the
direction of the X-ray tube and the detector. The adjustments
are made as per the reflection and emission of the X-rays
from the sample.

3.X-ray detector: The X-ray detector is used to record and


process the X-ray signal received from the sample. The
signals received are converted into count rate which is
obtained as the output on the monitor or printer.
ADVANTAGES
ADVANTAGES

 Phase Identification : It can identify FCC,BCC, HCP and other


structures.

 Rapid Analysis : It can analysis a huge amount of sample together.

 Wide Applicability : Various types of materials can be analyzed.

 Non Destructive Test : Can test a sample without destroying it.


ADVANTAGES

 Automation : It is a semi automated machine, so most of the work is done by the


machine.

 Versatility : Various type of sample can be tested by changing wavelength,


incident angle etc.

 Economical Advantage : It can test a huge amount of sample with a very small
cost.
LIMITATIONS
Limitations

 Applicability : It can not identify the amorphous materials.

 Skilled operator : High skilled operator is needed to operate this


machine.

 Health hazardous : Operators might face potential radiation exposure.

 Large working area : It is a bulk technique process.

 High cost : The initial set up cost is high.


APPLICATIONS
Applications

 Crystalline structure determine


 Phase Identification
 Size of nanomaterials
 Defects in materials
 Semiconductors

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