33N25 FairchildSemiconductor
33N25 FairchildSemiconductor
33N25 FairchildSemiconductor
September 2005
TM
UniFET
FDB33N25
250V N-Channel MOSFET
Features Description
• 33A, 250V, RDS(on) = 0.094Ω @VGS = 10 V These N-Channel enhancement mode power field effect transis-
• Low gate charge ( typical 36.8 nC) tors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
• Low Crss ( typical 39 pF)
• Fast switching This advanced technology has been especially tailored to mini-
• 100% avalanche tested mize on-state resistance, provide superior switching perfor-
mance, and withstand high energy pulse in the avalanche and
• Improved dv/dt capability
commutation mode. These devices are well suited for high effi-
cient switched mode power supplies and active power factor
correction.
D
D {
z
G{ z
{
S
G S
Thermal Characteristics
Symbol Parameter Min. Max. Unit
RθJC Thermal Resistance, Junction-to-Case -- 0.53 °C/W
RθJA* Thermal Resistance, Junction-to-Ambient* -- 40 °C/W
RθJA Thermal Resistance, Junction-to-Ambient -- 62.5 °C/W
* When mounted on the minimum pad size recommended (PCB Mount)
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 1.35mH, IAS = 33A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 33A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
2 www.fairchildsemi.com
FDB33N25 Rev A
2 VGS 2
10 Top : 15.0 V 10
10.0 V
8.0 V
7.0 V
6.5 V
ID, Drain Current [A]
6.0 V
1
10
1
10 o
150 C
o
25 C
o
-55 C
0 ※ Notes : ※ Notes :
10 1. 250µ s Pulse Test 1. VDS = 40V
2. TC = 25 ℃ 2. 250µ s Pulse Test
0
-1 0 1 10
10 10 10 2 4 6 8 10 12
VDS, Drain-Source Voltage [V] VGS, Gate-Source Voltage [V]
0.25
2
10
Drain-Source On-Resistance
0.20
IDR, Reverse Drain Current [A]
VGS = 10V
RDS(ON) [Ω ],
0.15
℃
1
0.10 10
150
VGS = 20V 25℃
0.05
※ Note : T = 25℃
J
※ Notes :
1. VGS = 0V
0.00 2. 250µ s Pulse Test
0 20 40 60 80 100
0
10
ID, Drain Current [A] 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
12
4000
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd VDS = 50V
Crss = Cgd 10
VDS = 125V
VGS, Gate-Source Voltage [V]
Ciss
6
2000
4
※ Note ;
1000 1. VGS = 0 V
Crss 2. f = 1 MHz
2
※ Note : I = 33A
D
0 0
10
-1 0
10 10
1 0 10 20 30 40
3 www.fairchildsemi.com
FDB33N25 Rev A
1.2 3.0
Drain-Source Breakdown Voltage
2.5
Drain-Source On-Resistance
BVDSS, (Normalized)
1.1
RDS(ON), (Normalized)
2.0
1.0 1.5
※ Notes :
1.0
0.9
1. VGS = 0 V
2. ID = 250 µA
0.5
※ Notes :
1. VGS = 10 V
2. ID = 16.5 A
0.8
-100 -50 0 50 100 150 200 0.0
-100 -50 0 50 100 150 200
o
TJ, Junction Temperature [ C] TJ, Junction Temperature [ C]
o
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
40
10 µs
2
10
100 µs
30
ID, Drain Current [A]
1 ms
ID, Drain Current [A]
10 ms
10
1
100 ms
Operation in This Area DC
20
is Limited by R DS(on)
0
10
※ Notes : 10
o
1. TC = 25 C
o
2. TJ = 150 C
3. Single Pulse
-1
10 0
0 1 2
10 10 10 25 50 75 100 125 150
D = 0.5
Zθ JC(t), Thermal Response
-1 0.2
10
PDM
0.1
t1
0.05 t2
0.02
※ N otes :
10
-2
0.01
1. Z θ JC(t) = 0.53 ℃/W M ax.
single pulse 2. D uty F actor, D =t 1 /t 2
3. T JM - T C = P D M * Z θ JC(t)
-5 -4 -3 -2 -1 0 1
10 10 10 10 10 10 10
4 www.fairchildsemi.com
FDB33N25 Rev A
VGS
Same Type
50KΩ
as DUT Qg
12V 200nF
300nF 10V
VDS
VGS Qgs Qgd
DUT
3mA
Charge
RL VDS
VDS 90%
VGS VDD
RG
10%
VGS
10V DUT
td(on) tr td(off)
tf
t on t off
L BVDSS
1
VDS EAS = ---- L IAS2 --------------------
2 BVDSS - VDD
BVDSS
ID
IAS
RG
VDD ID (t)
5 www.fairchildsemi.com
FDB33N25 Rev A
DUT +
VDS
I SD
L
Driver
RG
Same Type
as DUT VDD
IRM
VSD VDD
Body Diode
Forward Voltage Drop
6 www.fairchildsemi.com
FDB33N25 Rev A
D2-PAK
7 www.fairchildsemi.com
FDB33N25 Rev A
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PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
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the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life
failure to perform when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can be effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Advance Information Formative or This datasheet contains the design specifications for
In Design product development. Specifications may change in
any manner without notice.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Rev. I16