FQPF 8 N 60 CF
FQPF 8 N 60 CF
FQPF 8 N 60 CF
February 2006
TM
FRFET
FQPF8N60CF
600V N-Channel MOSFET
Features Description
• 6.26A, 600V, RDS(on) = 1.5Ω @VGS = 10 V These N-Channel enhancement mode power field effect
• Low gate charge ( typical 28 nC) transistors are produced using Fairchild’s proprietary, planar
• Low Crss ( typical 12 pF) stripe, DMOS technology.
• Fast switching This advanced technology has been especially tailored to
• 100% avalanche tested minimize on-state resistance, provide superior switching
• Improved dv/dt capability performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies, active power factor
correction, electronic lamp ballast based on half bridge
topology.
GD S
TO-220F
FQPF Series
S
Thermal Characteristics
Symbol Parameter FQPF8N60CF Units
RθJC Thermal Resistance, Junction-to-Case 2.6 °C/W
RθJA Thermal Resistance, Junction-to-Ambient 62.5 °C/W
2 www.fairchildsemi.com
FQPF8N60CF Rev. A
FQPF8N60CF 600V N-Channel MOSFET
Typical Performance Characteristics
VGS
Top : 15.0 V
10.0 V
1 8.0 V
10 7.0 V 10
1
6.5 V
6.0 V
o
150 C
Bottom : 5.0 V
o
0
10 25 C
o
10
0 -55 C
※ Notes : ※ Notes :
10
-1
1. 250µs Pulse Test 1. VDS = 40V
2. TC = 25℃ 2. 250µs Pulse Test
-1
10
-1 0 1 2 4 6 8 10
10 10 10
VDS, Drain-Source Voltage [V] VGS, Gate-Source Voltage [V]
3.5
1
10
3.0
Drain-Source On-Resistance
VGS = 10V
2.5
RDS(ON) [Ω ],
2.0
0
10
1.5
VGS = 20V
1.0 ※ Notes :
150℃ 25℃ 1. VGS = 0V
※ Note : TJ = 25℃ 2. 250µs Pulse Test
0.5 10
-1
2000 12
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
1800 Crss = Cgd
10 VDS = 120V
1600
VGS, Gate-Source Voltage [V]
800
4
600 ※ Notes ;
1. VGS = 0 V
Crss 2. f = 1 MHz
400 2
* Note : ID = 6.26A
200
0
0 0 5 10 15 20 25 30
-1 0 1
10 10 10
QG, Total Gate Charge [nC]
VDS, Drain-Source Voltage [V]
3 www.fairchildsemi.com
FQPF8N60CF Rev. A
FQPF8N60CF 600V N-Channel MOSFET
Typical Performance Characteristics (Continued)
1.2
3.0
Drain-Source Breakdown Voltage
2.5
Drain-Source On-Resistance
1.1
BVDSS, (Normalized)
RDS(ON), (Normalized)
2.0
1.0
1.5
1.0
0.9 * Notes :
1. VGS = 0 V
* Notes :
2. ID = 250 킕 0.5 1. VGS = 10 V
2. ID = 3.13 A
0.8
-100 -50 0 50 100 150 200 0.0
-100 -50 0 50 100 150 200
o
TJ, Junction Temperature [ C] TJ, Junction Temperature [ C]
o
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
2 8
10
Operation in This Area
is Limited by R DS(on)
10 µs
10
1 100 µs 6
1ms
ID, Drain Current [A]
ID, Drain Current [A]
10ms
0 100ms
10 4
DC
-1
10 * Notes : 2
o
1. TC = 25 C
o
2. TJ = 150 C
3. Single Pulse
-2
10
0
10 10
1
10
2 3
10 0
25 50 75 100 125 150
VDS, Drain-SourceVoltage[V] o
TC, Case Temperature [ C]
0
D=0.5
10
Z? JC(t), Thermal Response
0.2
0.1
0.05
-1
10 PDM
0.02
t1
0.01 t2
* Notes :
1. Z? JC(t) = 2.6 ? /W Max.
-2 single pulse 2. Duty Factor, D=t1/t2
10
3. TJM - TC = PDM * Z? JC(t)
-5 -4 -3 -2 -1 0 1
10 10 10 10 10 10 10
4 www.fairchildsemi.com
FQPF8N60CF Rev. A
FQPF8N60CF 600V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
5 www.fairchildsemi.com
FQPF8N60CF Rev. A
FQPF8N60CF 600V N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
6 www.fairchildsemi.com
FQPF8N60CF Rev. A
FQPF8N60CF 600V N-Channel MOSFET
Mechanical Dimensions
TO-220F
3.30 ±0.10
6.68 ±0.20
15.87 ±0.20
15.80 ±0.20
(1.00x45°)
MAX1.47
9.75 ±0.30
0.80 ±0.10
(3
0°
)
#1
0.35 ±0.10 +0.10
0.50 –0.05 2.76 ±0.20
2.54TYP 2.54TYP
[2.54 ±0.20] [2.54 ±0.20]
4.70 ±0.20
9.40 ±0.20
Dimensions in Millimeters
7 www.fairchildsemi.com
FQPF8N60CF Rev. A
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
ACEx™ FAST® ISOPLANAR™ PowerEdge™ SuperFET™
ActiveArray™ FASTr™ LittleFET™ PowerSaver™ SuperSOT™-3
Bottomless™ FPS™ MICROCOUPLER™ PowerTrench® SuperSOT™-6
Build it Now™ FRFET™ MicroFET™ QFET® SuperSOT™-8
CoolFET™ GlobalOptoisolator™ MicroPak™ QS™ SyncFET™
CROSSVOLT™ GTO™ MICROWIRE™ QT Optoelectronics™ TCM™
DOME™ HiSeC™ MSX™ Quiet Series™ TinyLogic®
EcoSPARK™ I2C™ MSXPro™ RapidConfigure™ TINYOPTO™
E2CMOS™ i-Lo™ OCX™ RapidConnect™ TruTranslation™
EnSigna™ ImpliedDisconnect™ OCXPro™ μSerDes™ UHC™
FACT™ IntelliMAX™ OPTOLOGIC® ScalarPump™ UniFET™
FACT Quiet Series™ OPTOPLANAR™ SILENT SWITCHER® UltraFET®
Across the board. Around the world.™ PACMAN™ SMART START™ VCX™
The Power Franchise® POP™ SPM™ Wire™
Programmable Active Droop™ Power247™ Stealth™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE
SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS,
SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
As used herein:
1. Life support devices or systems are devices or systems 2. A critical component is any component of a life support
which, (a) are intended for surgical implant into the body, device or system whose failure to perform can be
or (b) support or sustain life, or (c) whose failure to perform reasonably expected to cause the failure of the life support
when properly used in accordance with instructions for use device or system, or to affect its safety or effectiveness.
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Rev. I19