Energies 465019
Energies 465019
Energies 465019
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4 authors, including:
Mostafa Elshahed
Cairo University
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9 mh_metwally@yahoo.com
10 3 Electrical power and Machines department, Faculty of Engineering, Cairo University, Giza, Egypt;
11 eng.m.elshahed@gmail.com
12 * Correspondence: eng_ahmed_sayed2010@yahoo.com
29 Keywords: Availability; maintainability; reliability; failure rate; repair rate; probability density
30 function (PDF)
31
32 1. Introduction
33 The solar-PV systems have emerged as one of the most contributed renewable sources of
34 electricity in the world. They contributed by approximately 303 GW in total worldwide installed
35 capacity by the end of 2016. The increased growth rate of these systems grabbed the attention for
36 investors, owners, and stakeholders to the financial investment which may be affected by the
37 unexpected failures due to the extended downtime periods. Thus, more concern efforts are required
38 to exert to ensure that a PV system generates energy as predicted. Reliability, availability, and
39 maintainability (RAM) assessment is performed for the grid-connected solar-PV system planning in
40 order to ensure an accurate prediction of photovoltaic energy production [1-2].
41 RAM are three important measures for estimating the effectiveness of system production. RAM
42 analysis has many multifaceted objectives in operations and safety issues. It aims to identify critical
43 items which have the greatest impact for improving the overall system reliability. Thus, this analysis
44 not only provides predict the behavior of such systems over time, but also devises appropriately
45 timed maintenance plans. Hence, RAM analysis of renewable energy sources represents a serious
46 challenge in the worldwide development and economy [3].
47 RAM analysis represents the crucial issue for the PV system planning and long-term operation.
48 However, it is limited due to the unavailability of robust data or even due to the complex nature of
49 these systems. Therefore, a major part of the existing literature is focused only on reliability
50 assessment of the system vulnerable subsystems, such as the inverter [4], PV module (PVM) [5-9],
51 and balance of systems (BOS) [5] considering the failure information only. Although, the solar-PV
52 system is considered as a non-reparable system, but the repair interval (period of detection and
53 replacement of the faulty part) will, of course, affect the system operation and couldn’t be ignored.
54 Much fewer studies, discuss the reliability evaluation of the whole system by using oversimplified
55 assumptions. These assumptions may lead to controversial observations between simulated and real
56 results as stated in more detail in [8]. So, the first scope of this paper is collecting huge amounts of
57 field reliability data, failure rate, and repair rate in order to solve the problem of lacking robust
58 reliability data. These data cover various large scale system configurations, and meteorological
59 conditions (i.e. stress factors) are analyzed and represented by their confidence median values.
60 RAM analysis of large scale grid-connected solar-PV systems is carried out using several
61 reliability methods. Among them, as seen in early reliability work, reliability block diagram (RBD)
62 and fault tree analysis (FTA) [11-13]. In FTA, the physical layout is interpreted into a logical diagram
63 whereby each block represents a system component. Each block is described only by the failure rate.
64 The reliability of the overall system is determined using the failure rates for each subassembly, and
65 thus every failure is very important. Commonly, failure rates are assumed constant. More recent
66 work introduces dynamic FTAs with failure rates described by time-dependent probability density
67 functions [14]. However, this approach does not rely on actual field values or the best probability
68 density functions of each subassembly.
69 In this paper, a technique for RAM analysis of grid-connected PV system is presented using an
70 exponential distribution based on RBD method. The required input data are obtained from
71 literature-based failure rates (see Table 1) of various subsystems considering the presence of a
72 battery storage subsystem. In reliability and availability analysis, the collection of the appropriate
73 data represents an important step. For more reliable and accurate results, collections of failure and
74 repair rates data which have a high quality are usually necessary for system reliability and
75 availability analysis. Therefore, one of the main concerns in this paper is to collect a huge amount of
76 reliability data for each subassembly from various systems in order to find an accurate value for
77 failure rate and repair rate of each subassembly. These data have been collected from several reliable
78 researches which used these data for estimating the reliability of grid-connected solar PV systems.
79 The median value is computed after collecting these data. The median failure or repair rate is the
80 middle value in the sorted list of the collected data. So, usage of the median will reduce the
81 uncertainties arisen from the unexpected values introduced by assumptions.
82 In order to validate the quality of the collected data, the obtained median values of the failure
83 rates of some subassemblies are compared with the failure rates of the same subassemblies that
84 obtained from real field data in ref. [2]. The results show that the obtained median values are very
85 close to the real field data.
86 In order to overcome the problems, that mentioned before, which have been faced the last
87 literature in study the reliability of grid-connected PV systems, this paper gives a complete detailed
88 RAM analysis for the all subassemblies of grid-connected solar PV systems with grid has low
89 reliability considering the failure information and repair interval (period of detection and
90 replacement of the faulty part). In addition, this paper aims also to define the criticality of each
91 subassembly of the grid-connected PV systems from the reliability point of view. The scope of this
92 paper is also extended to determining the best probability density function for the failure rate of
93 each subassembly of the solar-PV system.
94 The rest of the paper is organized as follows. Section 2 demonstrates the various configurations
95 of the solar-PV systems. Section 3 introduces reliability modeling formulation. Section 4 proposes
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96 the RAM analysis. The best probability density function (PDF) is presented in Section 5. Section 6,
97 finally, provides the conclusions of this paper.
116 Figure 1. Energy storage requirements for various layouts of solar-PV systems.
117 On the other hand, where remote loads are difficult to reach electricity from the traditional
118 sources (utility grid); the off-grid solar-PV systems are the best choice to cover these distinct
119 situations. In this case, the load instantaneous power balance constraint plays a very important role
120 in the presence of the energy storage system or not. Accordingly, there are two main types of loads;
121 the first type is the non-deferrable loads which required instantaneous power balance for their
122 proper operation. Therefore, energy storage is required in off-grid solar-PV systems that fed
123 non-deferrable loads. The second load type is deferrable loads which refer to a load type at which its
124 energy requirements can be postponed to another nearby time. The energy storage isn’t preferred
125 with the off-grid solar-PV systems that fed deferrable loads. The common example of deferrable
126 loads is a water irrigation pumping systems [1]. Generally, off-grid systems supplying deferrable
127 loads do not require electric energy storage; however, storage tanks may be used for utilizing the
128 surplus power for water storage in irrigation water pumping systems.
129 Based on the previous discussion about the various layouts of the solar-PV systems, Figure 2
130 demonstrates these layouts. The DC-DC converter acts as a charge controller in layouts without
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131 battery storage, whereas it acts also as Maximum Power Point Tracker (MPPT) in layouts with
132 battery storage. The Automatic Static Transfer Switch (ASTS) is used in Grid-connected systems that
133 are connected to a low reliability grid for securing immediate proper islanding of the solar-PV
134 system through its sensing, and switching control logics. In the island mode, the grid is disconnected
135 due to either an outage, or a sever power quality problem. In this case, the non-essential load is
136 isolated from the solar-PV system, while the energy required by the essential, and critical loads is
137 produced from the solar-PV. The power balance is the island mode is secured by the battery energy
138 storage. This paper will focus only on the large scale grid-connected solar-PV system with grid has
139 low reliability.
146 Cumulative Distribution Function (CDF), denoted F(t), is called failure probability or
147 unreliability. It interprets the probability of the system’s success which can be given by:
F(t ) 1 R(t ) P(T t ). (2)
148 The probability Density Function (PDF), denoted f(t), indicates the distribution of the failure
149 over the entire time range. Equations (1) and (2) can be expressed with the density function f(t) as:
t
F (t ) f ( t )dt. (4)
150 The mean time to failure (MTTF) for the subassembly, which expresses the expected life for the
151 subassembly, represents the most common method for specifying reliability of non-repairable items.
152 It can be calculated by:
153 The solar-PV systems are complex and contain a large number of subassemblies that may be
154 connected in series, in parallel or even a combination of series and parallel. When the
155 subassemblies connected in series, the overall system will be interrupted in case of failure of one
156 subassembly. On the other hand, all subassemblies must fail in order to interrupt the overall system
157 in the parallel system.
158 According to Boolean techniques, the reliability performance for a non-repairable system
159 contains an independent series n subassemblies can be calculated by:
n
RSubAssem bly ,Tot exp m i i t , (7)
i 1
162 Where, mi is the total number of the subassembly i, and λi is the failure rate of subassembly i.
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163 If the system contains x series units with M parallel subassemblies, the system reliability can be
164 obtained using:
M
RSystem 1 1 R x . (8)
183
(a)
(b)
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(c)
(d)
184
185 Figure 2. Various layouts of solar-PV systems: (a) grid-connected solar PV system with reliable grid;
186 (b) off-grid PV systems with deferrable loads; (c) grid-connected solar PV system with low reliability
187 grid; (d) off-grid PV systems with non-deferrable loads.
Subassemblies Subassemblies
189 The layout of the PV system varies according to the architectural design. It can be a
190 single-inverter system or a string-inverter system or a multi-inverter system. A single-inverter
191 system is used when all the strings are connected to a central inverter. A string-inverter system is
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192 used when each string has its own inverter. A multi-inverter system is used when the PV field is
193 divided into groups of strings connected to an inverter.
194 Generally, a typical three-phase PV inverter includes IGBT Power modules, cooling fans,
195 control software and DC link capacitors implemented on Printed Circuit Boards (PCBs) in addition
196 to AC & DC contactors. In order to obtain layouts simplification, these subassemblies are not
197 considered in the PV inverter, the reliability data will be collected for the whole inverter regardless
198 of the layout type (single-inverter system or a string-inverter system or a multi-inverter system).
199 Although, these layouts have a significant impact on the reliability assessment, the proposed
200 simplification will ensure collecting more than one option and obtaining more accurate results.
201 In PV module, solar cells are connected together in series and the number of cells is usually
202 governed by the specified voltage of the module. The typical number of the series cells in the PV
203 module is 36 cells, but some modules exist with 48 cells. The PV module subsystem consists of
204 various subassemblies as shown in Figure 3. Due to the limited reliability data of these
205 subassemblies, the dealing with this subsystem will be considered as a whole subsystem in this
206 study. This means that the reliability data will be considered for the entire PV module subsystem.
207 The encapsulation of the PV module subjected to three main failures well known as
208 Discoloration and Delamination (D&D), moisture ingress and module broken glass. In order to
209 obtain a clear view of the reliability of the PV module, the PV module failure rate data only without
210 the encapsulate failures was collected. A complete reliability analysis of failures of a PV module
211 encapsulation using a Markov process is presented in [9].
n
Tot i . (9)
i 1
n n i
Tot i . (10)
i 1 i 1 i
225 3.4. Failure and Repair Rates for Various Subassemblies of solar-PV Systems
226 Obtaining accurate failure and repair rates represents the important stage in RAM analysis. It is
227 represented as the main challenge in this analysis. Therefore, the largest amounts of reliability data,
228 failure and repair rates, are collected from the literature. Various technologies and layouts are
229 considered in the obtained data. In addition, the collected data are characterized by different scan
230 times. The median value of the sorted data of each subassembly is then calculated. It noted that the
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231 use of the median values instead of the average values statistically decreases the uncertainties of the
232 collected data per subassembly. Table 1 summarizes the collected data, failure and repair rates, for
233 each subassembly of the generic solar-PV system.
234 Table 1. Failure and repair rates for various subassemblies of solar-PV systems.
240 In order to evaluate the RAM results of each subassembly, seven large scale grid connected
241 solar-PV systems are designed. The nominal power of these systems ranging from 100 kW to 2500
242 kW. Of course, the total number of subassemblies increases with the PV system intended power
243 output. The resulting number of subassemblies for each system is listed in Table 2. Based on the data
244 given in tables 1 and 2 and the RBD method, the failure rate and repair rate of each subassembly of
245 the seven studied solar-PV systems are listed in Table 3 and Table 4 respectively.
268 Table 5. Subassemblies reliability for the PV systems for a period of one year of operations [in %].
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269 Table 6. Subassemblies reliability for the PV systems for a period of 20 years of operations [in %].
(a) (b)
271 Figure 5. Impact of operational failure of various solar PV systems (a) for a period of one year of
272 operations and (b) for a period of 20 years of operations
273 The total component availability of PV systems was estimated (See Table 7) using Equation 11.
274 As shown in Tables 7 that, the availability of the subassembly decreased as the PV power output
275 increased.
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i (11)
Ai .
i i
276 It is also clear from Table 7 that, the storage system has a higher availability among the all
277 subassemblies. Whereas, the inverter subsystem records the lower availability among the five
278 subsystems.
280 From a reliability point of view, reliability of the system is the probability of success of that
281 system to perform its required function without any failures, under given conditions and for a stated
282 period of time. Hence, the reliability of each subsystem and the reliability of the total solar-PV
283 system are presented in Figure 6. Based on Figure 6, the MTTF of each subsystem is calculated and
284 listed in Table 8. As shown in Figure 6, the reliability of the PV array subsystem is 0.7956 and 0.5036
285 after 10 and 30 years respectively. Meanwhile, the calculated MTTR is 43.73 years. This is due to that
286 the aging characteristics of the PV module take the same aging characteristics of semiconductors
287 when the PV module failure rates did not include the encapsulate failures which reduce the lifetime
288 of PV modules to the current values declared by manufacturers.
289 Some studies consider the PV Inverter (INV) to be just a subassembly among other BOS
290 subassemblies [33]. Whereas the main concern of the current studies is quite limited to reliability
291 estimations of INV and reliability improvements of current INV [34-38]. Thus, this study separates
292 the BOS subsystem and the INV subsystem. The reliability of the INV subsystem is 0.7858 and 0.2996
293 after 2 and 10 years respectively. While the reliability of the BOS subsystem is 0.5942 and 0.2098 after
294 10 and 30 years respectively. By applying (5) it results that the MTTF of PVI and BOS subsystems are
295 8.3 and 19.21 years respectively. The main reason behind the lower MTTF of the INV subsystem is
296 may due to either the complexity of the inverter, or because the inverter contains electronic
297 components which significantly affected by various stress factors. Therefore, the lifetime of the INV
298 in the solar-PV systems is very low in comparison with the predicted average lifetime of the solar-PV
299 system which is in the range 20-25 years.
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301 Table 8. The expected lifetime for various subsystems of solar-PV system [year].
327 Table 9. Summary of PDFs failure rates for the subassemblies of the solar-PV system.
337 Table 10. Comparison between the proposed technique and some other related techniques.
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339 Table 11. Comparison between the reliability results when applying RAM analysis using RBD
340 method in the proposed technique and the FTA method that discussed in [22].
342
343 6. Conclusions
344 RAM analysis for seven practical layouts of the grid-connected solar-PV conversion systems are
345 studied in detail, and a novel approach was conducted in order to estimate the best probability
346 density function (PDF) for the failure rate of each subassembly of these systems. The results show
347 that the best PDF for some subassemblies, such as PV module, connector, and charge controller is
348 exponential PDF. Whereas the best PDF for the subassemblies, such as DC-DC converter, bypass
349 diode, AC switch, AC CB, and differential CB is Weibull PDF. The best PDF for the rest of the
350 subassemblies of the solar-PV system is lognormal PDF. In reliability analysis, the expected lifetime
351 of the PV modules without the encapsulation failures records 43.73 years. Whereas the expected
352 lifetime of the converter, BOS, inverter, and storage system are 30.77, 19.21, 8.3, and 10.31 years
353 respectively.
354 Nomenclature
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355 Appendix A
356 Data for PV module (230 W):
357 Short circuit current of module=8.24 A, open circuit voltage of module=37.2 V, Module current
358 at MPP=7.60 A, Module voltage at MPP=30.2 V.
359 Data for Inverter (100 KW):
360 Maximum DC current of the inverter=235 A, the maximum voltage of the inverter=1000 V, the
361 minimum voltage of the inverter at MPP=450 V, and the maximum voltage of the inverter at
362 MPP=820 V.
363 Data for batteries:
364 The batteries used in this study came from the Rolls-Surrette factory. All PV systems used an
365 identical battery model, Ah and voltage, 12 CS 11P, 475 Ah and 12 V, respectively.
366 Data for DC-DC boost converter:
367 D = 0.531 − 0.493, L = 8.31 mH, C = 255 µf, and Fs=10 KHz.
368 Appendix B
369 The following Table will give the method which used to design/selected each subassembly in
370 large scale grid-connected solar-PV system. For instance, we will describe that for a 200 kW PV
371 system.
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