RL5602S - Epprom
RL5602S - Epprom
RL5602S - Epprom
IRL5602S
HEXFET® Power MOSFET
l Advanced Process Technology
D
l Dynamic dv/dt Rating VDSS = -20V
l 175°C Operating Temperature
l P-Channel
RDS(on) = 0.042W
l Fast Switching G
l Fully Avalanche Rated
ID = -24A
S
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced
processing techniques to achieve extremely low on-resistance per silicon area.
This benefit, combined with the fast switching speed and ruggedized device
design that HEXFET Power MOSFETs are well known for, provides the
designer with an extremely efficient and reliable device for use in a wide variety
of applications.
Thermal Resistance
Parameter Typ. Max. Units
RqJC Junction-to-Case ––– 2.0
°C/W
RqJA Junction-to-Ambient ( PCB Mounted,steady-state)** ––– 40
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IRL5602S
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -20 ––– ––– V VGS = 0V, ID = -250µA
DV(BR)DSS/DTJ Breakdown Voltage Temp. Coefficient ––– -0.013 ––– V/°C Reference to 25°C, ID = -1mA
––– ––– 0.042 VGS = -4.5V, ID = -12A
RDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.062 W VGS = -2.7V, ID = -10A
––– ––– 0.075 VGS = -2.5V, ID = -10A
VGS(th) Gate Threshold Voltage -0.7 ––– -1.0 V VDS = VGS, ID = -250µA
gfs Forward Transconductance 12 ––– ––– S VDS = -15V, ID = -12A
––– ––– -25 VDS = -20V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
––– ––– -250 VDS = -16V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 500 VGS = -8.0V
IGSS nA
Gate-to-Source Reverse Leakage ––– ––– -500 VGS = 8.0V
Qg Total Gate Charge ––– ––– 44 ID = -12A
Qgs Gate-to-Source Charge ––– ––– 8.7 nC VDS = -16V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 19 VGS = -4.5V, See Fig. 6 and 13
td(on) Turn-On Delay Time ––– 9.7 ––– VDD = -10 V
tr Rise Time ––– 73 ––– ID = -12A
ns
td(off) Turn-Off Delay Time ––– 53 ––– RG = 6.0W, VGS = 4.5V
tf Fall Time ––– 84 ––– RD = 0.8W, See Fig. 10
Between lead,
LS Internal Source Inductance ––– 7.5 ––– nH
and center of die contact
Ciss Input Capacitance ––– 1460 ––– VGS = 0V
Coss Output Capacitance ––– 790 ––– pF VDS = -15V
Crss Reverse Transfer Capacitance ––– 370 ––– ƒ = 1.0MHz, See Fig. 5
VSD Diode Forward Voltage ––– ––– -1.4 V TJ = 25°C, IS = -12A, VGS = 0V
trr Reverse Recovery Time ––– 58 88 ns TJ = 25°C, IF = -12A
Qrr Reverse RecoveryCharge ––– 54 81 nC di/dt = -100A/µs
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Notes:
Repetitive rating; pulse width limited by ISD £ -12A, di/dt £ 120A/µs, VDD £ V(BR)DSS,
max. junction temperature. ( See fig. 11 ) TJ £ 175°C
Starting TJ = 25°C, L = 3.0mH Pulse width £ 300µs; duty cycle £ 2%.
RG = 25W, IAS = -14A. (See Figure 12)
** When mounted on FR-4 board using minimum recommended footprint.
For recommended footprint and soldering techniques refer to application note #AN-994.
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IRL5602S
100 VGS
100
VGS
TOP -15V TOP -15V
-12V -12V
-10V
-I D , Drain-to-Source Current (A)
10 10
-2.0V
-2.0V
100 3.5
ID = -24A
RDS(on) , Drain-to-Source On Resistance
TJ = 25 ° C
-I D , Drain-to-Source Current (A)
3.0
TJ = 175 ° C
2.5
(Normalized)
2.0
10
1.5
1.0
0.5
V DS = -15V
20µs PULSE WIDTH VGS = -4.5V
1 0.0
2.0 3.0 4.0 5.0 6.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
-VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( °C)
2800 15
VGS = 0V, f = 1MHz ID = -12A
Ciss = Cgs + Cgd , Cds SHORTED
Crss = Cgd
2000
Ciss
9
1600
1200 Coss
6
800
Crss 3
400
FOR TEST CIRCUIT
SEE FIGURE 13
0 0
1 10 100 0 10 20 30 40 50 60 70
-VDS , Drain-to-Source Voltage (V) QG , Total Gate Charge (nC)
100 1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
-ISD , Reverse Drain Current (A)
10 100
TJ = 175 ° C 100us
TJ = 25 ° C 1ms
1 10
10ms
TC = 25 ° C
TJ = 175 ° C
V GS = 0 V Single Pulse
0.1 1
0.0 0.4 0.8 1.2 1.6 1 10 100
-VSD ,Source-to-Drain Voltage (V) -VDS , Drain-to-Source Voltage (V)
25
RD
VDS
20 VGS
D.U.T.
RG
-ID , Drain Current (A)
-
+ VDD
15
-4.5V
Pulse Width £ 1 µs
Duty Factor £ 0.1 %
10
5
td(on) tr t d(off) tf
VGS
0 10%
25 50 75 100 125 150 175
TC , Case Temperature ( ° C)
90%
Fig 9. Maximum Drain Current Vs. VDS
Case Temperature
10
Thermal Response (Z thJC )
1 D = 0.50
0.20
0.10
0.05 PDM
0.1 0.02 SINGLE PULSE
0.01 t1
(THERMAL RESPONSE)
t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
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IRL5602S
L
1000
ID
400
15V
0
I AS 25 50 75 100 125 150 175
Starting TJ , Junction Temperature ( °C)
tp
V(BR)DSS
50KΩ
QG 12V .2µF
.3µF
-4.5V -
QGS QGD D.U.T. +VDS
VGS
VG
-3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
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IRL5602S
Peak Diode Recovery dv/dt Test Circuit
+
- +
-
RG · dv/dt controlled by RG +
· ISD controlled by Duty Factor "D" VDD
-
· D.U.T. - Device Under Test
VGS
[VGS=10V ] ***
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
[VDD]
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5% [ISD ]
8.89 (.350)
1.40 (.055) 1.39 (.055) REF.
3X
1.14 (.045) 0.93 (.037) 0.55 (.022) 1.14 (.045)
3X 0.46 (.018)
0.69 (.027)
5.08 (.200) 0.25 (.010) M B A M MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
30.40 (1.197)
NOTES : MAX.
1. COMFORMS TO EIA-418. 26.40 (1.039) 4
2. CONTROLLING DIMENSION: MILLIMETER. 24.40 (.961)
3. DIMENSION MEASURED @ HUB.
3
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936
http://www.irf.com/ Data and specifications subject to change without notice. 5/99
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