FLASH and EEPROM Memories For Data Storage
FLASH and EEPROM Memories For Data Storage
FLASH and EEPROM Memories For Data Storage
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Memory Classes
Main Memory
• Invariably comprises solid state semiconductor devices
• Interfaces directly with the three bus of the system.
• Operates consistently with the processor speed.
• Characterised by relatively high cost per bit of storage.
• Volatile memory will loses stored data when the power is
removed.
Secondry Memory
• Invariably electromechanical devices - CDs, tapes etc
• Interfaces to system busses via e.g disc controllers.
• Data are transfer to main memory before being stored in
non-volatile secondry memory.
• Characterised by very low cost per bit of storage. 2
Types of Main Memory
• Random Access Memory (RAM) is a read/write
memory
• Read - the processor retrieve data from RAM
• Write - the processor save data in RAM
• RAM Type ;
• volatile - stored data lost when power removed.
• Non-volatile - Provided electrical power is
maintained the data, once stored, remains stored
indefinitely unless overwritten.
• Static RAM
• Dynamic RAM - data stored lost unless it is read
on a regular basis ( typically once per ms )
• Read Only Memory (ROM)
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RAM Architecture
8k x 8 RAM Chip
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ROM
– Non-volatile memory which can only be read by the
processor.
– Special programming facilities are required to store
data in ROM.
– ROM is often used for program storage in systems
without secondary memory.
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Memory Architecture
• Total number of memory cells per chip
– number of locations x number of bits per location
– (8192 x 8 = 65536 in the example)
• Memory cells are organised as a square matrix
– ( 256 rows x 256 columns in the example )
• A row of the matrix is selected by one output of the row
decoder. The row decoder accepts n address bits and
decodes them into 2n outputs.
– ( n = 8 selects 1 of 256 rows in the example )
• A row of the matrix can be considered to comprise a
number of locations
– ( a row comprises 32 locations in the example ) 6
Memory Architecture
• The column decoder selects a location in a row of the
matrix.
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Memory Operation
• Once the memory device receives address information ( 13
binary digits on inputs A0 - A12 in the example ) the decoding
logic selects the addressed location.
• The addressed location is interfaced to the external data bus via
back-to-back tri-state buffers.
• The memory device’s data bus input buffers are enabled when
the device receives an asserted WR/ signal and data on the
external bus gets written to the addressed memory location.
• The memory device’s data bus output buffers are enabled when
the device receives an asserted RD/ signal and data at the
addressed memory location is placed on the external bus for an
external device to read.
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Truth Table for Memory Device Control
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Example of Memory System Design
• A certain 8085A based microcomputer system has the
following memory specifications :
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Example of Memory System Design
• The memory map is a pictorial representation of
where the memory blocks are located in the total
address space of the processor
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Example of Memory System Design
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Example of Memory System Design
• The coloured addresses in
the diagram are decoded
internally by the devices.
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Example of Memory System Design
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Memory Decoding Systems
Exhaustive Decoding
• When all the address lines of the processor (either by the
internal device decoders or external memory decoders) are
used to specify the address of a memory location,
exhaustive decoding is said to be used.
• The preceding example uses exhaustive decoding for all
memory devices.
Partial Decoding
• If one or more of the processors address lines are not
used by either the external memory decoders or internal
device decoders to specify an address then partial decoding
is said to be used.
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• It is only possible to interface the full compliment of
memory to a microprocessor if exhaustive decoding is
used for all the memory devices.
• If one address line is not used to specify a memory
location then the location will respond to 2 different
processor addresses.
• If two address line are not used to specify a memory
location then the location will respond to 4 different
processor addresses.
• If three address line are not used to specify a memory
location then the location will respond to 8 different
processor addresses. etc.
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Memory Read Cycles
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Memory Read Cycle - Sequence
• Memory device receives valid address from processor.
Internal decoding logic selects addressed location.
• Memory CS/ control line asserted. Usually supplied from
external decoding logic fed by higher order processor
address lines.
• Memory OE/ control line asserted. Usually driven by
processor RD/ control line.
• Memory device enables its output data bus buffers and
data at the addressed location is placed on the data bus for
the processor to read.
• Processor de-asserts its CS/ and/or RD/ control lines
causing the memory device to tri-state its data bus drivers.
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Memory Read Cycle - Timing Constraints
• For a device to read the contents of a memory location
without error certain timing constraints must be adhered
to.
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Memory Read Cycle - Timing Constraints
• tRC read cycle min - this represents the minimum time to
carry out a successful read operation (assuming all
other constraints are met)
• tACS chip select access max - this represents the maximum
time it takes the memory device from CS/ being
asserted to valid data appearing on the data bus.
(assuming all other constraints are met)
• tAA address access max - this represents the maximum
time it takes the memory device from it receiving valid
address to valid data appearing on the data bus.
(assuming all other constraints are met)
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Memory Read Cycle - Timing Constraints
• tRDHA read data hold after address min - this represents
the minimum time the memory device will keep
valid data on the data bus after a change of
address. (assuming cs/ and oe/ remain asserted)
• tRDHC read data hold after chip select min - this
represents the minimum time the memory device
will keep valid data on the data bus after being
deselected. (assuming valid address and oe/ remain
asserted)
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• tOE output enable access max -this represents the
maximum time it takes the memory device to
place valid data on the data bus after oe/ is
asserted. (assuming other constraints are met)
• tOHZ output enable to output Hi-z max -this
represents the maximum time it takes the
memory device to tri-state its output buffers
after oe/ is de-asserted.
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Memory Write Cycles
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Memory Write Cycle - Sequence
• The processor specifies the memory location at which the
data is to be stored. Internal memory decoding logic
selects the desired location.
• External decoding logic asserts the cs/ input to the
memory device.
• The processor asserts the wr/ control input of the
memory device. This enables its tri-state input buffers.
• The processor places the data to be stored onto the data
input lines of the memory device.
• The processor de-asserts the wr/ control line. The rising
edge of wr/ latches the data into the specified location
and also tri-states the device’s input buffers. 26
Memory Read Cycle - Timing Constraints
• tWC write cycle min -this represents the minimum time
to carry out a successful write operation (assuming
all other constraints are met)
• tCW chip select to end of write min - this represents the
minimum time that the chip select signal must
remain asserted. (assume other constraints are met)
• tAS address set-up time min - this represents the
minimum time valid address must be present on
tdevice’s address lines before wr/ is asserted.
• tMWE write enable min - this represents the minimum
time wr/ must be asserted. 27
Memory Read Cycle - Timing Constraints
• tAW address valid to end of write min - this represents
the minimum time the address must remain valid
before wr/ is de-asserted. (assuming all other
constraints are met
• tWDS write data set-up time min - this represents the
minimum time data must be valid before the rising
edge of wr/.
• tWDHE write data hold-time min - This represents the
minimum time data must remain valid after the
rising edge of wr/.
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